JPH0634211B2 - CAD device with test data editing function - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Outline] A CAD device with a test data editing function, wherein when a pin (Pi) of an integrated circuit is designated and test data (TDi) is input, a designated arbitrary pin ( When the test data (TDn) corresponding to Pn) includes a repeated portion of the single pattern data (UD), the single pattern data (UD) is repeated using the repeat means (3), and the repeated data is obtained. By making the graphic display on the display means (2), the efficiency of test data editing is improved,
Enables easy input check of test data.

[Industrial application field]

The present invention relates to a CAD (Computer Aided Design) device with a test data editing function, and more particularly to a gate array,
When designing a logic IC (integrated circuit) or a logic LSI (large-scale integrated circuit) such as a standard cell, a pin for an external terminal of the logic IC or the logic LSI is designated and data of a test pattern corresponding to the pin is input. CA with the function to edit test data for logical simulation
D device.

[Prior art and problems to be solved by the invention]

When editing test data for logic simulation using a CAD device, more broadly a CAD system,
As a normally used procedure, an operator first inputs data indicating an external terminal pin of an IC or LSI from a keyboard, and then inputs data of a test pattern corresponding to the pin. The pin data is an external terminal name, for example, VCC (power supply), CLK (clock), D (data), B (bus), and the attribute thereof, that is, I (for signal input) or O (for signal output). Is specified in combination with. On the other hand, in the test pattern data, the data of the signal actually input is input to the pin having the attribute for signal input, and the expected value data to be output is input to the pin having the attribute of signal output. , Defined by the combination of timing data and pattern data. Although the test data described in accordance with the predetermined rules is called "text", each data input from the keyboard based on this text system is displayed in the CRT (cathode ray tube) display as it is. That is, it is displayed in the state of the language form at the time of key input.

FIG. 5 shows a display example of test data as an example of the conventional type, and FIG. 6 shows waveforms representing the display contents of FIG. In FIG. 5, DSP represents a display screen,
, V0, B1, ..., D0, D1 ... Are external terminal names, I and O are attributes, and 20H, 30H, 50L, ... Are test pattern data. For example, the data corresponding to the terminal B1 for the bidirectional signal has a rising (H) at 50 (ns), a falling (L) at 70 (ns),
At the time of 80 (ns), it rises (H) and changes in the same way thereafter,
The last represents a signal that changes such as falling (L) at the time of 140 (ns).

As is clear from the display example shown in FIG. 5, according to the conventional test data editing mode, the test data corresponding to the external pin is displayed in the language mode. It is difficult to immediately and accurately recognize that the displayed contents shown in the figure represent the waveform shown in FIG. 6, and therefore, when the operator inputs the test data once displayed, the operator can check the input later. Has a problem in that the work becomes extremely complicated and may cause an input error by the operator in some cases, which inevitably reduces the efficiency of editing the test data as a whole.

Further, when inputting test data by designating an arbitrary pin, this test data is a repeated portion of the single pattern data, for example, 0 to 120 (ns) in the data of the external pin B2 in the example of FIG. , Or a portion of the data of the external pin D3 between 60 and 140 (ns), the data is defined for each pattern according to the conventional test data editing mode. Because
It is necessary to repeat key input operations. This is
It further hinders the efficiency of test data editing,
In addition, the display form is a language form, which causes an input error by the operator, which is extremely inconvenient.

The present invention was created in view of the above-mentioned problems in the conventional technology, and improves the efficiency of test data editing, minimizes input errors by the operator, and enables easy input check of test data. It is intended to provide a CAD device with an editing function.

[Means for solving problems]

FIG. 1 shows a CAD with a test data editing function according to the present invention.
A principle block diagram of the device is shown.

In FIG. 1, reference numeral 1 is a data input means for inputting data PDi indicating an external terminal pin Pi of the integrated circuit and test data TDi corresponding to the pin. Reference numeral 2 is a display means having a function of displaying the data PDi of the pin input from the data input means 1 and displaying the test data TDi corresponding to the pin in graphic form. Therefore, the input test data is displayed in the form of a waveform instead of the language.

3 is a repeat means, which responds to the command signal RP from the data input means 1 when the test data TDn corresponding to this pin Pn includes a repeated portion of the single pattern data UD when an arbitrary pin Pn is designated. Then, it has a function of repeating the above-mentioned single pattern data UD. Four
Is a display control means for causing the display means 2 to repeatedly display the above-mentioned single pattern data UD based on a command from the repeat means 3.

Therefore, the apparatus of the present invention is configured as a whole to use the repeat function for the test data including the repeated portion of the single pattern data and to graphically display the input test data or the repeated data.

[Action]

In the CAD device with the test data editing function according to the present invention, when the arbitrary pin Pn corresponding to the test data TDn including the repeated portion of the single pattern data UD is designated, the repeat unit 3 receives the command from the data input unit 1. The single pattern data UD described above is repeated in response to the signal RP. The display control means 4 repeatedly displays the above-mentioned single pattern data UD on the display means 2 graphically based on the command from the repeat means 3. As described above, the apparatus of the present invention operates the repeat function as necessary. It eliminates waste of test data input, which enables efficient test data editing, and improves the recognition of data by displaying the input test data or repeated data graphically, which allows the operator It minimizes input errors and enables easy input check of test data.

〔Example〕

FIG. 2 shows a schematic system configuration of a CAD device with a test data editing function as an embodiment of the present invention.
In the figure, reference numeral 20 denotes a system bus including a data bus, a control bus, etc., and the keyboard 2 is connected via this bus 20.
1, a display 22, a memory 23, an MPU (microprocessor unit) 24, and a mouse 25 are connected to each other.

The keyboard 21 includes ordinary keys such as ten keys and alphabet keys, as well as change (delete), delete (delete), and insert (insert) of data displayed on the screen of the display unit 22.
Equipped with function keys to move, etc.,
Further, a repeat key, which is a feature of the present invention, is provided. The keyboard 21 is for inputting data indicating an IC or LSI external terminal pin and data of a test pattern corresponding to the pin,
It corresponds to the data input means 1 shown in FIG. The data designating the pin is a pin name such as VCC (power supply) or C
LK (clock), D (data), B (bus), etc. and their attributes, that is, I (for signal input) or O (for signal output)
It is defined by a combination of the designation and, and in the actual input operation, the data is input by operating the ten keys and alphabets. On the other hand, for the test pattern data, the direction key is used to set the timing, and the numeric keypad and the alphabet keys are used to input the test pattern. For example, 20 (ns)
When inputting the positive pulse data at the time point, first, the right direction key is operated 20 times, and then the “1” key is operated.

The display unit 22 is for displaying each data input from the keyboard 21, and displays the data designating the pin, that is, the pin name and its attribute as usual, and the test pattern data in the waveform display form. To display a graphic. In this case, regarding the test data of the pin having the attribute for signal output, the state of the language form at the time of key input, that is, "H" or "L" is displayed together with the waveform display. The display 22 corresponds to the display means 2 shown in FIG. The memory 23 is for storing each data input from the keyboard 21 in addition to the program representing the processing performed by the MPU 24.

The MPU 24 executes a predetermined process based on the program stored in the memory 23, and its basic function is as follows.
Each data input from the keyboard 21 is temporarily stored in the memory 23 and displayed graphically on the display 22. As another function, when an arbitrary pin is designated from the keyboard 21, the MPU 24 is based on the repeat command from the keyboard 21 when the test pattern data corresponding to this arbitrary pin includes the repeated portion of the single pattern data. It has a function of repeating the above-mentioned single pattern data. Further, the MPU 24 has a function of repeatedly displaying the single pattern data on the display 22 in a graphic manner. In actual processing, the operator repeatedly uses the keyboard 21 to repeatedly display the single pattern data.
It is executed by further operating the repeat key, specifying a single pattern, specifying the number of times of repetition, and specifying the timing. The MPU 24 corresponds to the repeat means 3 and the display control means 4 shown in FIG.

The mouse 25 is for designating a position on the screen of the display 22 based on a manual operation.

FIG. 3 shows a flow chart for explaining the test data editing by the CAD device of FIG.

First, in step 301, the name of the test data to be edited is defined, and in step 302, the number N of pins of the IC or LSI and the initial setting of the variable n are performed. Next Step 303
In, the pin names such as VCC, CLK, D, and B and the attributes for instructing signal input (I) or signal output (O) are defined. Steps 301 to 303 are executed by an input operation from the keyboard 21. The variable n assigned to the pin name Pn does not follow the pin arrangement order, but follows the pin data input order defined by the operator. In the next step 304, the test data name, pin name and their attributes input from the keyboard 21 are displayed on the display 22.

In step 305, the test data TDn (TD in this case) corresponding to the designated pin Pn (P1 in this case)
It is determined whether 1) includes a repeated portion of a single pattern (YES) or not (NO). This judgment is made by the operator prior to the test data input operation. If the judgment is NO, the process proceeds to step 306. At step 306, the input operation of the test data TD1 is performed, and at step 307, the test data TD1 is displayed graphically on the display 22. Steps 306 and 307
Are effectively executed concurrently. Therefore, the operator can confirm the test data input by himself / herself on the screen of the display unit 22 in the form of a waveform, so that the degree of recognition of the data is increased, thereby reducing the input error and checking the input of the test data. Easy to do.

In the next step 308, the data displayed on the screen of the display 22, that is, the test data name, the pin name, the attribute and the test data are stored in the memory 23.
At 9, test data for logic simulation is created. Steps 308 and 309 are executed by the MPU 24. In the next step 310, it is determined whether the value of the variable n is equal to the value of the number of pins N (YES) or not (NO). If the determination is YES, the flow ends and the determination is N.
If O, go to step 311. In step 311, the value of n is incremented (n = 2 in this case), and the process returns to step 303.

On the other hand, when the determination is YES in step 305, that is, when the operator determines that the test data TD _n includes the repeated portion of the single pattern, the operator operates the repeat key of the keyboard 21. As a result, a repeat command is issued (step 321).
In the next step 322, the operator specifies the single pattern described above. The operator inputs the number of repetitions in the next step 323, that is, information on how many times a single pattern is repeated, and in the next step
At 324, the temporal information, or timing, at which the repeating portion of this single pattern appears is entered. Steps 322 to 324 are executed by an input operation from the keyboard 21. In step 325, the MPU 24 executes repeat processing. In the next step 326, data other than the above-mentioned repeated portion is included in the test data TDn (YE
It is determined whether or not (S) or not (NO). This determination is made based on the operator's determination. If the determination is NO, the process jumps to step 307, and if the determination is YES, the process proceeds to step 327. In step 327,
Input operation of data other than the repeated part is performed. After this, the process proceeds to step 307.

As described above, by activating the repeat function as necessary, it is possible to eliminate waste of test data input, thereby improving the efficiency of test data editing. In addition, since the input data or the repeated data is displayed graphically, it is possible to easily check the input of the test data and further contribute to the reduction of data input errors.

FIG. 4 shows an example of test data display by the display 22 of the apparatus shown in FIG. As described above, regarding the test data of the pins having the attribute for signal output, that is, D15, D14, ..., The waveform display and the state "H" or "L" of the language form at the time of key input are displayed. . This allows the operator to immediately and accurately recognize the timing relationship with the test data of other pins, as well as confirming the entered key. Further, as illustrated in the test data corresponding to the external pin D12 in FIG.
Efficiency of test data editing by operating the above-described repeat function on the repeated portion A in which a single pattern (one “H” level pattern and one “L” level pattern) is repeated 5 times. Could be realized.

〔The invention's effect〕

As described above, according to the present invention, it is possible to improve the efficiency of test data editing, minimize input errors by the operator, and easily perform test data input check.

[Brief description of drawings]

FIG. 1 is a block diagram showing the principle of a CAD device with a test data editing function according to the present invention, FIG. 2 is a system configuration diagram showing an embodiment of the present invention, and FIG. 3 is a block diagram showing the test data editing by the CAD device of FIG. FIG. 4 is a flow chart for explaining, FIG. 4 is a diagram showing an example of test data display by the display 22 of the apparatus, FIG. 5 is a diagram showing an example of conventional test data display, and FIG. FIG. 7 is a waveform diagram showing the display contents of the figure. (Explanation of Signs) 1 ... Data input means, 2 ... Display means, 3 ... Repeat means, 4 ... Display control means, Pi, Pn ... Pins, TDi, TDn ... Test data, PDi, PDn ... Pin instructing data, RP ... Command signal, UD ... Single pattern data.

Claims (1)

[Claims] 1. A means (1) for inputting data (PDi) designating an external terminal pin (Pi) of an integrated circuit and test data (TDi) corresponding to the pin, and data of the input pin. (PDi) and a means (2) for graphically displaying the test data (TDi), and when an arbitrary pin (Pn) is designated, the pin (Pn) is designated.
In the case where the test data (TDn) corresponding to (1) includes the repeated portion of the single pattern data (UD), the single pattern data (UD) is transmitted in response to the command signal (RP) from the data input means (1). A repeater means (3), and a display control means (4) for repeatedly displaying the single pattern data (UD) on the display means (2) based on a command from the repeat means (3). CAD device with test data editing function.