JPH0634212B2 - CAD device with test data editing function - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Outline] A CAD device with a test data editing function, wherein when a pin (Pi) of an integrated circuit is designated and test data (TDi) is input, a designated arbitrary pin ( If the test data (TDn) corresponding to Pn) is the same as or similar to any of the test data (TD _{1 to} TD _n-1 ) already defined in the storage means (3), the copy means (4). To copy the defined test data (TD _{1 to} TD _n-1 ) and display the copied data graphically on the display means (2) to improve the efficiency of test data editing and Enables easy data input check.

[Industrial application field]

The present invention relates to a CAD (Computer Aided Design) device with a test data editing function, and more particularly to a gate array,
When designing a logic IC (integrated circuit) or a logic LSI (large-scale integrated circuit) such as a standard cell, a pin for an external terminal of the logic IC or the logic LSI is designated and data of a test pattern corresponding to the pin is input. CA with the function to edit test data for logical simulation
D device.

[Prior art and problems to be solved by the invention]

When editing test data for logic simulation using a CAD device, more broadly a CAD system,
As a normally used procedure, an operator first inputs data indicating an external terminal pin of an IC or LSI from a keyboard, and then inputs data of a test pattern corresponding to the pin. The pin data is an external terminal name, for example, VCC (power supply), CLK (clock), D (data), B (bus), and the attribute thereof, that is, I (for signal input) or O (for signal output). Is specified in combination with. On the other hand, in the test pattern data, the data of the signal actually input is input to the pin having the attribute for signal input, and the expected value data to be output is input to the pin having the attribute of signal output. , Defined by the combination of timing data and pattern data. Although the test data described in accordance with the predetermined rules is called "text", each data input from the keyboard based on this text system is displayed in the CRT (cathode ray tube) display as it is. That is, it is displayed in the state of the language form at the time of key input.

FIG. 5 shows a display example of test data as an example of the conventional type, and FIG. 6 shows waveforms representing the display contents of FIG. In FIG. 5, DSP represents a display screen,
, V0, B1, ..., D0, D1 ... Are external terminal names, I and O are attributes, and 20H, 30H, 50L, ... Are test pattern data. For example, the data corresponding to the terminal B1 for the bidirectional signal has a rising (H) at 50 (ns), a falling (L) at 70 (ns),
At the time of 80 (ns), it rises (H) and changes in the same way thereafter,
The last represents a signal that changes such as falling (L) at the time of 140 (ns).

As is clear from the display example shown in FIG. 5, according to the conventional test data editing mode, the test data corresponding to the external pin is displayed in the language mode. It is difficult to immediately and accurately recognize that the displayed contents shown in the figure represent the waveform shown in FIG. 6, and therefore, when the operator inputs the test data once displayed, the operator can check the input later. Has a problem in that the work becomes extremely complicated and may cause an input error by the operator in some cases, which inevitably reduces the efficiency of editing the test data as a whole.

Also, the same data as the test data already displayed,
For example, in the example of FIG. 5, D is applied to the data of the external pin D1.
D for data of 3 or data of external pin D0
4 or when inputting data similar to the test data already displayed, for example, the data of B2 with respect to the data of the external pin B0 in the example of FIG. 5, According to the conventional test data editing mode, the test pattern data is defined for each pin, so that it is necessary to repeat the same input operation with text. This is not preferable because it further hinders the efficiency of editing the test data.

The present invention was created in view of the above-mentioned problems in the conventional technology, and improves the efficiency of test data editing, minimizes input errors by the operator, and enables easy input check of test data. It is intended to provide a CAD device with an editing function.

[Means for solving problems]

FIG. 1 shows a CAD with a test data editing function according to the present invention.
A principle block diagram of the device is shown.

In FIG. 1, reference numeral 1 is a data input means for inputting data PDi indicating an external terminal pin Pi of the integrated circuit and test data PDi corresponding to the pin. Reference numeral 2 is a display means having a function of displaying the data PDi of the pin input from the data input means 1 and displaying the test data TDi corresponding to the pin in graphic form. Therefore, the input test data is displayed in the form of a waveform instead of the language. A storage unit 3 stores the input pin data PDi and the test data TDi corresponding to the pin.

Reference numeral 4 denotes a copy means, and when any pin Pn is designated, the test data TDn corresponding to this pin Pn is defined in the storage means 3 as any one of the test data TD ₁ to TD ₁ .
In response to a command signal CP from the data input unit 1 has the ability to copy predefined test data _{TD 1} ~TD n-1 described above in the case you are same or similar to the TD _n-1 . Reference numeral 5 denotes a display control means, which is defined test data TD _{1 to} TD copied by the copy means 4.
_The display means 2 displays _n-1 as test data corresponding to the designated arbitrary pin Pn.

Therefore, the device of the present invention as a whole uses the copy function for the same or similar test data,
It is configured to graphically display the input test data or the copied test data.

[Action]

In the CAD device with the test data editing function according to the present invention, any pin corresponding to the test data TDn that is the same as or similar to any of the test data TD _{1 to} TD _n-1 already defined in the storage means 3. When Pn is designated, the copy means 4 outputs the command signal C from the data input means 1.
In response to P, the above-defined test data TD _{1 to} T
Copy D _n-1 . This copied test data T
The display control means 5 graphically displays D _{1 to} TD _{n−1 on the} display means 2 as test data corresponding to the above-mentioned designated arbitrary pin Pn.

As described above, the device of the present invention eliminates waste of test data input by operating the copy function as necessary,
This enables efficient test data editing and improves the recognition of data by displaying the input test data or the copied test data graphically, which minimizes operator input errors and reduces It enables easy input check of data.

〔Example〕

FIG. 2 shows a schematic system configuration of a CAD device with a test data editing function as an embodiment of the present invention.
In the figure, reference numeral 20 denotes a system bus including a data bus, a control bus, etc., and the keyboard 2 is connected via this bus 20.
1, a display 22, a memory 23, an MPU (microprocessor unit) 24, and a mouse 25 are connected to each other.

The keyboard 21 is used to change (change), delete (delte), insert (insert) or move the data displayed on the screen of the display 22 in addition to ordinary keys such as ten keys and alphabets.
A function key for performing (move) and the like is provided, and further, a copy key that is a feature of the present invention is provided.
The keyboard 21 is for inputting data indicating an external terminal pin of an IC or LSI and data of a test pattern corresponding to this pin, and corresponds to the data input means 1 shown in FIG. . The data designating a pin is a pin name, for example, VCC (power), CLK (clock), D (data), B (bus), etc., and their attributes,
That is, it is defined by a combination of designation of I (for signal input) or O (for signal output), and data is input by operating the ten-keys and alphabet keys during actual input operation. On the other hand, for the test pattern data, the timing is set using the direction keys, and the test pattern data is input using the ten keys and the alphabet keys. For example, 20
When inputting positive pulse data at the time of (ns),
First, operate the right direction key 20 times, then “1”
You can operate the key.

The display unit 22 is for displaying each data input from the keyboard 21, and displays the data designating the pin, that is, the pin name and its attribute as usual, and the test pattern data in the waveform display form. To display a graphic. In this case, regarding the test data of the pin having the attribute for signal output, along with the waveform display, the state of the language form at the time of key input, that is, "H" or "L"
Is displayed. The display 22 corresponds to the display means 2 shown in FIG. The memory 23 is for storing each data input from the keyboard 21 in addition to the program representing the processing performed by the MPU 24, and corresponds to the storage means 3 in FIG.

The MPU 24 executes a predetermined process based on the program stored in the memory 23, and its basic function is as follows.
Each data input from the keyboard 21 is temporarily stored in the memory 23 and displayed graphically on the display 22. As another function, when the MPU 24 designates an arbitrary pin from the keyboard 21, the test pattern data corresponding to this arbitrary pin is the same as or similar to any test pattern data already defined in the memory 23. When it is present, it has a function of copying the above defined test pattern data based on a copy command from the keyboard 21. Further, as another function, the MPU 24 has a function of displaying the copied test pattern data on the display 22 as the test pattern data corresponding to the specified arbitrary pin. Further, as another function, in the MPU 24, the test pattern data displayed on the display unit 22 as the test pattern data corresponding to the above-mentioned arbitrary pin is not the same as the test pattern data originally corresponding to the arbitrary pin. In this case, it has a function of correcting the test pattern data displayed on the display unit 22 based on a correction command from the keyboard 21. This MPU2
Reference numeral 4 corresponds to the copy means 4 and the display control means 5 shown in FIG.

The mouse 25 is for designating a position on the screen of the display 22 based on a manual operation.

FIG. 3 shows a flow chart for explaining the test data editing by the CAD device of FIG.

First, in step 301, the name of the test data to be edited is defined, and in step 302, the number N of pins of the IC or LSI and the initial setting of the variable n are performed. Next Step 303
In, the pin names such as VCC, CLK, D, and B and the attributes for instructing signal input (I) or signal output (O) are defined. Steps 301 to 303 are executed by an input operation from the keyboard 21. The variable n assigned to the pin name Pn does not follow the pin arrangement order, but follows the pin data input order defined by the operator. In the next step 304, the test data name, pin name and their attributes input from the keyboard 21 are displayed on the display 22.

In step 305, the test data TDn (in this case, T
Whether D ₁ ) is the same as or similar (YES) or not (NO) to the already defined TD ₁ to TD _n-1 (in this case, the test data is not yet defined). Is done. This judgment is made by the operator on the display 22.
Although it is performed while monitoring the screen of No. 3, if the determination is NO, the process proceeds to step 306. At step 306, an input operation of the test data TD ₁ is performed, and at step 307, the test data TD ₁ is graphically displayed on the display 22. Steps 306 and 307 are effectively performed concurrently. Therefore, the operator can confirm the test data input by himself / herself on the screen of the display unit 22 in the form of a waveform, so that the degree of recognition of the data is increased, thereby reducing the input error and checking the input of the test data. Easy to do.

In the next step 308, the data displayed on the screen of the display 22, that is, the test data name, the pin name, the attribute and the test data are stored in the memory 23.
At 9, test data for logic simulation is created. Steps 308 and 309 are executed by the MPU 24. In the next step 310, it is determined whether the value of the variable n is equal to the value of the number of pins N (YES) or not (NO). If the determination is YES, the flow ends and the determination is N.
If O, go to step 311. In step 311, the value of n is incremented (n = 2 in this case), and the process returns to step 303.

On the other hand, when the determination is YES in step 305, that is, the test data TDn has already defined TD ₁ to TD.
_{When the} operator determines that it is the same as or similar to _n-1 , the operator operates the copy key of the keyboard 21. As a result, a copy command is issued (step 321). In the next step 322, the operator determines the pins P ₁ -P ₁ for which the test pattern has already been defined.
Specify the pin to copy from _n-1 . Further, in the next step 323, the operator designates the pin to be copied, that is, the pin Pn currently designated. Step
322 and 323 are executed by an input operation from the keyboard 21. In step 324, the copy process is executed by the MPU 24. In this case, the MPU 24, in response to the copy command from the keyboard 21, reads the test pattern data corresponding to the pins P _{1 to} P _n-1 to be copied from the memory 23,
The read data is graphically displayed on the display 22 as data corresponding to the designated pin Pn (step 325).

In the next step 326, the test data TDn originally corresponding to the designated pin Pn is changed to the test data T displayed on the display 22 as the data corresponding to the pin Pn.
It is determined whether it is the same as D _{1 to} TD _n1 (YES) or not (NO). This judgment is made by the operator while monitoring the screen of the display 22 as in step 305, but if the judgment is YES, step 308
If the determination is NO, the process proceeds to step 327. In step 327, the MPU 24 performs the correction process of the test data TD _{1 to} TD _n−1 corresponding to the currently displayed pin Pn based on the correction command from the keyboard 21. The above-mentioned correction command is issued based on a key input operation performed by the operator while monitoring the screen of the display 22. After this correction processing is executed, the process proceeds to step 308.

As described above, by activating the copy function as necessary, waste of test data input can be eliminated, and thus the efficiency of test data editing can be improved. Further, since the input test data is displayed graphically, it is possible to easily check the input of the test data.

FIG. 4 shows an example of test data display by the display 22 of the apparatus shown in FIG. As described above, regarding the test data of the pins having the attribute for signal output, that is, D15, D14, ..., The waveform display and the state "H" or "L" of the language form at the time of key input are displayed. . As a result, the operator can immediately and accurately recognize the temporal relationship with the test data of other pins, as well as confirming the entered key.

In the present embodiment, the case where the test data is sequentially edited from the state where the screen of the display 22 is not displayed has been described, but the present invention is not limited to this, and as is clear from the gist of the present invention, It is also possible to specify, for example, an arbitrary pin while the test data is already defined, copy the test data of the arbitrary pin, and display the copied data in a graphic form as data corresponding to another pin. is there.

〔The invention's effect〕

As described above, according to the present invention, it is possible to improve the efficiency of test data editing, minimize input errors by the operator, and easily perform test data input check.

[Brief description of drawings]

FIG. 1 is a block diagram showing the principle of a CAD device with a test data editing function according to the present invention, FIG. 2 is a system configuration diagram showing an embodiment of the present invention, and FIG. 3 is a block diagram showing the test data editing by the CAD device of FIG. FIG. 4 is a flow chart for explaining, FIG. 4 is a diagram showing an example of test data display by the display 22 of the apparatus, FIG. 5 is a diagram showing an example of conventional test data display, and FIG. FIG. 7 is a waveform diagram showing the display contents of the figure. (Explanation of Signs) 1 ... Data input means, 2 ... Display means, 3 ... Storage means, 4 ... Copy means, 5 ... Display control means, Pi, Pn ... Pins, PDi, PDn ... Pin instructing data, TDi, TDn ... Test data, CP ... Command signal.

Claims (2)

[Claims] 1. A means (1) for inputting data (PDi) designating an external terminal pin (Pi) of an integrated circuit and test data (TDi) corresponding to the pin, and data of the input pin. A means (2) for displaying (PDi) and a graphic display of test data (TDi), a means (3) for storing the input data (PDi, TDi), and an arbitrary pin (Pn) are designated. When the pin (Pn)
Already defined in any of the test data to the corresponding test data (TDn) is the storage means ₍₃₎ (TD 1 ~TD
_n-1 ), the defined test data (TD _{1 to} TD _n-1 ) is copied in response to the command signal (CP) from the data input means (1) when the same or similar. Means (4) and display control for displaying the copied test data (TD _{1 to} TD _n-1 ) on the display means (2) as test data corresponding to the designated arbitrary pin (P _n ). Means (5)
And a CAD device with a test data editing function. 2. The display control means (5) includes test data (TD _{1 to} TD) displayed on the display means (2) as test data corresponding to the arbitrary pin (Pn).
_n-1 ) is not the same as the test data (TDn) corresponding to the arbitrary pin (Pn), the test data (TD ₁
~ TD _n-1 ) in accordance with a command from said data input means (1) for modifying the apparatus.