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JPH063786B2 - Method for manufacturing solid electrolytic capacitor - Google Patents
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JPH063786B2 - Method for manufacturing solid electrolytic capacitor - Google Patents

Method for manufacturing solid electrolytic capacitor

Info

Publication number
JPH063786B2
JPH063786B2 JP26457188A JP26457188A JPH063786B2 JP H063786 B2 JPH063786 B2 JP H063786B2 JP 26457188 A JP26457188 A JP 26457188A JP 26457188 A JP26457188 A JP 26457188A JP H063786 B2 JPH063786 B2 JP H063786B2
Authority
JP
Japan
Prior art keywords
solid electrolytic
capacitor
electrolytic capacitor
capacitor element
organic semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP26457188A
Other languages
Japanese (ja)
Other versions
JPH01205412A (en
Inventor
博文 井上
信一 丹羽
徹也 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP26457188A priority Critical patent/JPH063786B2/en
Publication of JPH01205412A publication Critical patent/JPH01205412A/en
Publication of JPH063786B2 publication Critical patent/JPH063786B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/004Details
    • H01G9/022Electrolytes; Absorbents
    • H01G9/025Solid electrolytes
    • H01G9/028Organic semiconducting electrolytes, e.g. TCNQ

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は、TCNQ塩からなる有機半導体を固体電解質
とする固体電解コンデンサの製造方法に関する。
TECHNICAL FIELD The present invention relates to a method for producing a solid electrolytic capacitor using an organic semiconductor composed of a TCNQ salt as a solid electrolyte.

(ロ)従来の技術 固体電解コンデンサの固体電解質としてTCNQ塩から
なる有機半導体を用い得ることは既に知られている。こ
の場合、固体電解質は酸化皮膜を有するアルミニウムな
どの皮膜形成性金属に直接付着されるものであるが、異
なる形態として、陽極箔と陰極箔とをセパレータ紙を挟
んで巻取ってコンデンサ素子を構成し、この素子中のセ
パレータ紙に上記の固体電解質を含浸することも特願昭
56−116861号(特公昭62−52939号(H
01G9/02))の発明として既に提案されている。
尚TCNQとは7,7,8,8,テトラシアノキノジメタンを意
味する。
(B) Conventional Technology It is already known that an organic semiconductor composed of a TCNQ salt can be used as a solid electrolyte of a solid electrolytic capacitor. In this case, the solid electrolyte is directly attached to a film-forming metal such as aluminum having an oxide film, but as a different form, the anode foil and the cathode foil are wound with separator paper sandwiched between them to form a capacitor element. However, it is also possible to impregnate the separator paper in this element with the solid electrolyte described above in Japanese Patent Application No. 56-116861 (Japanese Patent Publication No. 62-52939).
01G9 / 02)) has already been proposed as an invention.
Incidentally, TCNQ means 7,7,8,8, tetracyanoquinodimethane.

このような従来の技術においては、有機半導体の粉末を
適度に加圧して良熱伝導性のアルミケースに詰め、これ
を250−300℃にて融解液化し、コンデンサ素子を
予熱後浸漬して含浸し、アルミケースごと素子を冷却固
化し、樹脂封口、電圧処理(エージング)等の工程を経
て完成させている。
In such a conventional technique, an organic semiconductor powder is appropriately pressed and packed in an aluminum case having good thermal conductivity, which is melted and liquefied at 250 to 300 ° C., and the capacitor element is preheated and dipped for impregnation. Then, the element is cooled and solidified together with the aluminum case, and completed through steps such as resin sealing and voltage treatment (aging).

ところでコンデンサ素子の陽極は誘電体である酸化皮膜
が形成せれているが、素子予熱及び含浸時の熱的衝撃又
は素子運搬及び含浸時の機械的衝撃によって酸化皮膜が
傷つけられる。そのため有機半導体を含浸後又は樹脂封
口後酸化皮膜を修復し、漏れ電流値を小さくする目的で
100℃前後の高温で電圧処理(エージング)を行なっ
ている。
By the way, although the oxide film which is a dielectric is formed on the anode of the capacitor element, the oxide film is damaged by thermal shock during element preheating and impregnation or mechanical shock during element transportation and impregnation. Therefore, after impregnation with the organic semiconductor or after sealing the resin, the oxide film is repaired, and voltage treatment (aging) is performed at a high temperature of about 100 ° C. for the purpose of reducing the leakage current value.

しかしながら有機半導体から成る固体電解質は、一般の
電解コンデンサに使用されている電解液に比べ、酸化皮
膜の修復性が弱いという欠点があり、このため漏れ電流
値が大きく歩留りが低いという問題がある。
However, the solid electrolyte made of an organic semiconductor has a drawback that the repairability of an oxide film is weaker than that of an electrolytic solution used in a general electrolytic capacitor, and thus has a problem that the leakage current value is large and the yield is low.

(ハ)発明が解決しようとする課題 本発明は、TCNQ塩から成る有機半導体を固体電解質
に用いた固体電解コンデンサにおける上記問題点、即ち
固体電解質の酸化皮膜の修復性が弱く、漏れ電流値が大
きく歩留りが低いという問題が解決するものであり、ま
た、アルミニウム、タンタル、ニオブ等の弁作用を有す
る金属粉末を加圧成形し、或は焼結してなるコンデンサ
陽極素子に、TCNQ塩からなる有機半導体を固体電解
質に用いた固体電解コンデンサにおける前述と同様の酸
化皮膜の修復性、漏れ電流、歩留りの問題を解決するも
のである。
(C) Problems to be Solved by the Invention The present invention has the above-mentioned problems in a solid electrolytic capacitor using an organic semiconductor composed of a TCNQ salt as a solid electrolyte, that is, the repairability of the oxide film of the solid electrolyte is weak and the leakage current value is It is a solution to the problem of a large low yield, and a capacitor anode element formed by pressure-molding or sintering a metal powder having a valve action such as aluminum, tantalum, niobium, etc. is made of TCNQ salt. It is intended to solve the same problems of oxide film repairability, leakage current, and yield as those described above in a solid electrolytic capacitor using an organic semiconductor as a solid electrolyte.

(ニ)課題を解決するための手段 本発明は、皮膜形成性金属に陽極酸化皮膜を形成してな
るコンデンサ素子に、或はアルミニウム、タンタル、ニ
オブ等の弁作用を有する金属粉末を加圧成形したり、ま
たは焼結してなるコンデンサ陽極素子に、融解液化した
有機半導体を含浸し、冷却固化した後に、素子の内部に
純水を含浸させ、次に素子の水分を乾燥させる固体電解
コンデンサの製造方法である。
(D) Means for Solving the Problem The present invention is to press-mold a capacitor element formed by forming an anodized film on a film-forming metal, or a metal powder having a valve action such as aluminum, tantalum, and niobium. Of a solid electrolytic capacitor in which the anode element of a capacitor formed by sintering or sintering is impregnated with a melted and liquefied organic semiconductor, cooled and solidified, pure water is then impregnated inside the element, and then the moisture of the element is dried. It is a manufacturing method.

(ホ)作用 TCNQ塩を含浸した素子内部に純水を含浸後乾燥させ
ることにより、酸化皮膜の欠損部に入りこんだ有機半導
体は絶縁体化しやすくなり、電圧処理(エージング)で
の酸化皮膜の修復性が著しく向上する。
(E) Function By impregnating pure water into the element that has been impregnated with TCNQ salt and then drying it, the organic semiconductor that has entered the defective portion of the oxide film becomes easier to become an insulator, and the oxide film is restored by voltage treatment (aging). Significantly improved.

(ヘ)実施例 以下本発明を実施例に沿って説明する。本発明の実施例
として、陽極用アルミニウム箔(陽極箔)と陰極用アル
ミニウム箔(陰極箔)とを厚さ50μのマニラ紙をセパ
レータ紙として巻取った巻取り素子(コンデンサ素子)
に、固体電解質として、N−(n−プロピル)−キノリ
ニウム、N−(n−ブチル)−イソキノリニウム、N−
(n−アミル)−イソキノリニウム、N−(イソアミ
ル)−イソキノリニウムの各TCNQ塩を用いた場合の
製造過程を説明する。
(F) Examples Hereinafter, the present invention will be described with reference to Examples. As an example of the present invention, a winding element (capacitor element) in which an aluminum foil for an anode (anode foil) and an aluminum foil for a cathode (cathode foil) are wound as a separator paper using a manila paper having a thickness of 50 μm.
In addition, as a solid electrolyte, N- (n-propyl) -quinolinium, N- (n-butyl) -isoquinolinium, N-
The production process using each TCNQ salt of (n-amyl) -isoquinolinium and N- (isoamyl) -isoquinolinium will be described.

まず上記巻き取り素子の陽極箔の切り口を、化成液を用
いて陽極化成電圧とほぼ同じ電圧を印加して化成する。
一方、有底円筒状のアルミニウムケース内に上記TCN
Q塩の粉末を適量入れ、TCNQ塩の融点以上、好まし
くは280〜300℃に保持された鉄板上に上記ケース
を加熱保持する。尚、斯るケースは最終的にコンデンサ
の外囲器となるものである。上記TCNQ塩の融点は2
10〜230℃であり、従って上記加熱によりケース内
のTCNQ塩は融解液化する。続く工程では直ちにこの
状態でケースごと急冷し、TCNQ塩を固化させる。斯
る工程により巻き取り素子に液状のTCNQ塩が含浸さ
れ、その後の急冷却によりTCNQ塩は再結晶化して、
2〜30Ωcm(25℃)の高い電導度を示す固体電解を
形成する。
First, the cut end of the anode foil of the winding element is formed by applying a voltage substantially the same as the anodizing voltage using a forming solution.
On the other hand, the TCN is placed in a cylindrical aluminum case with a bottom.
An appropriate amount of powder of Q salt is put, and the above case is heated and held on an iron plate kept at a melting point of TCNQ salt or higher, preferably 280 to 300 ° C. In addition, such a case finally becomes an envelope of the capacitor. The melting point of the above TCNQ salt is 2
The temperature is 10 to 230 ° C. Therefore, the TCNQ salt in the case is melted and liquefied by the above heating. In the subsequent step, the case is immediately cooled in this state to solidify the TCNQ salt. By such a step, the winding element is impregnated with the liquid TCNQ salt, and the TCNQ salt is recrystallized by the subsequent rapid cooling,
A solid electrolysis showing a high conductivity of 2 to 30 Ωcm (25 ° C) is formed.

続く工程では、前述TCNQ塩含浸済み素子を純水中に
浸漬し、減圧下で素子内部まで純水を含浸させる。さら
に次の工程で、85〜105℃にて1時間〜8時間、コ
ンデンサ素子の水分を乾燥させる。上記乾燥時間はコン
デンサ素子外径にほぼ比例する。最後に、上記ケースの
開口部を樹脂又はゴムにて封口する。そして、125℃
にて1時間、ほぼコンデンサの定格電圧を印加(エージ
ング)して、固体電解コンデンサが完了する。以下に本
発明の実施例と従来例との特性比較データを記載する。
In the subsequent step, the TCNQ salt-impregnated element is immersed in pure water, and the inside of the element is impregnated with pure water under reduced pressure. Further, in the next step, the moisture of the capacitor element is dried at 85 to 105 ° C. for 1 to 8 hours. The drying time is almost proportional to the outer diameter of the capacitor element. Finally, the opening of the case is sealed with resin or rubber. And 125 ° C
At about 1 hour, the rated voltage of the capacitor is applied (aged) to complete the solid electrolytic capacitor. The characteristic comparison data between the example of the present invention and the conventional example will be described below.

実施例1〜4は純水をコンデンサ素子内の含浸後、85
℃で3.5〜4.5時間、コンデンサ素子の水分を乾燥
させ、エポキシ樹脂で封口したものであり、従来例1〜
4はTCNQ塩含浸後、純水含浸をすることなくエポキ
シ樹脂で封口したものである。
In Examples 1 to 4, after impregnating pure water into the capacitor element,
The capacitor element is dried at 3.5 ° C. for 3.5 to 4.5 hours and sealed with an epoxy resin.
No. 4 is a resin which has been sealed with epoxy resin after impregnating with TCNQ salt and without impregnating with pure water.

第2表は、同一のTCNQ塩を使用した同一定格電圧、
容量の固体電解コンデンサの実施例と従来とを比較した
ものである。
Table 2 shows the same rated voltage using the same TCNQ salt,
It is a comparison between an example of a solid electrolytic capacitor having a capacitance and a conventional one.

Cap.:120Hzにおける静電容量 tanδ:120Hzにおける誘電正接 L.C.:漏れ電流値(定格電圧印加30秒後) ESR :100KHzにおける等価直列抵抗 第2表において、実施例(2′)、従来例(2′)は、実施例
(2)、従来例(2)と同一のTCNQ塩である。第2表の各
数値は10個の平均値を示すが、L.C.値については
規格内の良品10個の平均値を示し、L.C.の歩留り
は試料各100個中の歩留りを示す。
Cap. : Capacitance at 120 Hz tan δ: dielectric loss tangent at 120 Hz L. C. : Leakage current value (30 seconds after rated voltage application) ESR: Equivalent series resistance at 100KHz In Table 2, Example (2 ') and Conventional Example (2') are
(2) The same TCNQ salt as the conventional example (2). Each numerical value in Table 2 shows an average value of 10 values. C. Regarding the value, the average value of 10 non-defective products within the standard is shown. C. The yield of (1) indicates the yield of 100 samples each.

なお各機種のL.C.規格は、 25V、3.3μF…0.83μA/30sec.以下 10V、220μF…44μA/30sec.以下 35V、4.7μF…3.3μA/30sec.以下 16V、15μF…2.4μA/30sec.以下 となっている。In addition, L. C. The standard is 25V, 3.3μF… 0.83μA / 30sec. Or less 10V, 220μF… 44μA / 30sec. Or less 35V, 4.7μF… 3.3μA / 30sec. Or less 16V, 15μF… 2.4μA / 30sec. Or less.

第2表からあきらかなように、実施例は従来例と比較し
て、L.C.の歩留りにおいて著しい差があり、純水を
含浸した効果がはっきりあらわれている。
As is clear from Table 2, the example is compared with the conventional example in L.S. C. There is a significant difference in the yield of the product, and the effect of impregnating pure water is clearly visible.

尚、本発明はコンデンサ素子として陽極箔と陰極箔とを
セパレータ紙を介して巻回した巻取り素子を使用した場
合に限られるものではなく、コンデンサ素子として弁作
用を有する金属粉末を加圧成形し焼結した焼結素子を使
用した場合にも適用されるものである。
Note that the present invention is not limited to the case where a winding element obtained by winding an anode foil and a cathode foil with separator paper as a capacitor element is used, and a metal powder having a valve action is pressure-molded as a capacitor element. It is also applied when using a sintered element that has been sintered.

次に焼結素子に本発明を実施する例について説明する。
アルミニウム微粉末(粒径約10〜40μ)に陽極用ア
ルミリード線を植立させて焼結してなるコンデンサ素子
を化成液を用いて誘電体となる酸化皮膜層を電気科学的
に形成させる。該コンデンサ素子に固体電解質として前
述の実施例と同様の4種類のTCNQ塩を用いる場合の
製造過程を説明する。
Next, an example in which the present invention is applied to a sintered element will be described.
A capacitor element formed by implanting an aluminum lead wire for an anode in fine aluminum powder (particle size: about 10 to 40 μm) and sintering is used to electrochemically form an oxide film layer serving as a dielectric by using a chemical conversion liquid. A manufacturing process in the case where the same four types of TCNQ salts as those in the above-mentioned embodiment are used as the solid electrolyte in the capacitor element will be described.

まず、焼結してなるアルミニウムコンデンサ素子をアジ
ピン酸アンモニウムからなる化成液を用いて陽極酸化す
る。化成電圧はおよそ100V〜200V(D.C.)
で本実施例では定格電圧25V、定格静電容量1μFの
素子を使用したので、化成電圧190Vである。
First, the sintered aluminum capacitor element is anodized using a chemical conversion solution containing ammonium adipate. The formation voltage is about 100V to 200V (DC).
In this embodiment, since the element having the rated voltage of 25V and the rated electrostatic capacity of 1 μF is used, the formation voltage is 190V.

一方、有底円筒状のアルミニウムケース内に上記TCN
Q塩の粉末を適量入れ、TCNQの融点以上、好ましく
は280℃〜300℃に保持された鉄板上に上記ケース
を加熱保持する。上記TCNQ塩の融点は210℃〜2
30℃であり、従って上記加熱によりケース内のTCN
Q塩は融解液化する。
On the other hand, the TCN is placed in a cylindrical aluminum case with a bottom.
An appropriate amount of Q salt powder is put, and the above case is heated and held on an iron plate kept at a melting point of TCNQ or higher, preferably 280 ° C to 300 ° C. The melting point of the above TCNQ salt is 210 ° C to 2 ° C.
The temperature is 30 ° C, so the above heating causes TCN in the case.
The Q salt melts and liquefies.

続く工程では、ケース内の液化TCNQ塩中にあらかじ
め予熱されているコンデンサ素子を浸漬し、TCNQ塩
を含浸させる。次の工程では直ちにコンデンサ素子をケ
ースから抜きとり、エアーにて急冷し、TCNQ塩を固
化する。斯る工程により、コンデンサ素子内部に液状の
TCNQ塩が含浸され、その後の急冷却によりTCNQ
塩は再結晶化して、2〜30Ω、cm(25℃)の高い電
導度を示す固体電解質を形成する。
In the subsequent step, the preheated capacitor element is immersed in the liquefied TCNQ salt in the case and impregnated with the TCNQ salt. In the next step, the capacitor element is immediately taken out of the case and rapidly cooled with air to solidify the TCNQ salt. By such a process, liquid TCNQ salt is impregnated inside the capacitor element, and TCNQ salt is then cooled by rapid cooling.
The salt recrystallizes to form a solid electrolyte exhibiting a high conductivity of 2-30 Ω, cm (25 ° C).

続く工程では、前述TCNQ塩含浸済み素子を純水中に
浸漬し、約20mmHgの減圧下で素子内部まで純水を含
浸させる。
In the subsequent step, the TCNQ salt-impregnated element is immersed in pure water, and the pure water is impregnated into the element under a reduced pressure of about 20 mmHg.

更に次の工程で、85℃〜105℃にて1時間〜8時
間、該コンデンサの水分を乾燥させる。上記乾燥時間は
コンデンサ素子の体積にほぼ比例し、本実施例では、8
5℃×5時間乾燥させる。尚、本実施例の素子寸法は直
径2.8mm、長さ3.5mmである。
Further, in the next step, the water content of the capacitor is dried at 85 ° C. to 105 ° C. for 1 hour to 8 hours. The drying time is almost proportional to the volume of the capacitor element, and in this embodiment, it is 8
Dry at 5 ° C for 5 hours. The device dimensions of this embodiment are 2.8 mm in diameter and 3.5 mm in length.

続く工程で、銀ペイント導電層、はんだ層を形成し、陰
極用リード線を導出し、陽極用リード線をコンデンサ素
子に植立しているアルミリードと溶接する。最後にエポ
キシ樹脂にて外装し、125℃にて1時間、ほぼコンデ
ンサの定格電圧を印加(エージング)して、目的とする
固体電解コンデンサが完成する。
In a subsequent step, a silver paint conductive layer and a solder layer are formed, a lead wire for a cathode is led out, and a lead wire for an anode is welded to an aluminum lead which is erected in a capacitor element. Finally, the package is covered with epoxy resin, and the rated voltage of the capacitor is applied (aged) at 125 ° C. for 1 hour to complete the intended solid electrolytic capacitor.

次に、本発明の実施例と従来例との特性比較データを第
3表及び第4表に示す。
Next, Tables 3 and 4 show characteristic comparison data between the examples of the present invention and the conventional example.

なお、第4表における初期特性は20℃における値であ
り、また、L.Cは漏れ電流値(定格電圧(25V)印
加30秒後の値であり規格内(0.5μA/30sec
以下)の良品10個の平均値を示し、L.C.歩留りは
試料各100個中の歩留りを示す。第4表のその他の項
目は各10個の平均値を示す。
The initial characteristics in Table 4 are values at 20 ° C. C is a leakage current value (a value 30 seconds after the rated voltage (25 V) is applied and within the standard (0.5 μA / 30 sec)
Below, the average value of 10 non-defective products is shown. C. The yield indicates the yield of 100 samples each. The other items in Table 4 show average values of 10 pieces each.

第1図はこの実施例を示す断面図であり、(1)はコンデ
ンサ素子、(2)はアルミ陽極リード、(3)は陽極リード
線、(4)は陰極リード線、(5)は有機半導体、(6)は銀ペ
イント導電層、(7)は半田層、(8)はエポキシ樹脂であ
る。
FIG. 1 is a sectional view showing this embodiment. (1) is a capacitor element, (2) is an aluminum anode lead, (3) is an anode lead wire, (4) is a cathode lead wire, and (5) is an organic lead wire. A semiconductor, (6) is a silver paint conductive layer, (7) is a solder layer, and (8) is an epoxy resin.

(ト)発明の効果 以上説明したように本発明によれば有機半導体を電解質
に用いた固体電解コンデンサにおいて、水を含浸させ、
次にこれを乾燥させるという簡単な工程で、漏れ電流ち
を小さくし、歩留りを大幅に向上させることが出来、斯
種固体電解コンデンサの実用化に寄与することが大であ
る。
(G) Effect of the Invention As described above, according to the present invention, in a solid electrolytic capacitor using an organic semiconductor as an electrolyte, water is impregnated,
Then, by a simple process of drying this, the leakage current can be reduced and the yield can be greatly improved, which greatly contributes to the practical application of such a solid electrolytic capacitor.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の焼結形固体電解コンデンサの実施例を
示す断面図である。 (1)…コンデンサ素子、(2)…アルミ陽極リード、(3)…
陽極リード線、(4)…陰極リード線,(5)…有機半導体、
(6)…銀ペイント導電層、(7)…はんだ層、(8)…エポキ
シ樹脂。
FIG. 1 is a sectional view showing an embodiment of a sintered solid electrolytic capacitor of the present invention. (1) ... Capacitor element, (2) ... Aluminum anode lead, (3) ...
Anode lead wire, (4) ... Cathode lead wire, (5) ... Organic semiconductor,
(6) ... Silver paint conductive layer, (7) ... Solder layer, (8) ... Epoxy resin.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】皮膜形成性金属に陽極酸化皮膜を形成して
なるコンデンサ素子に、融解液化した有機半導体を含浸
し、冷却固化した固体電解コンデンサの製造方法におい
て、 前記有機半導体を含浸し、冷却固化した前記コンデンサ
素子の内部に純水を含浸させる工程と、該コンデンサ素
子の水分を乾燥させる工程とを含むことを特徴とする固
体電解コンデンサの製造方法。
1. A method for producing a solid electrolytic capacitor, wherein a capacitor element formed by forming an anodized film on a film-forming metal is impregnated with a molten and liquefied organic semiconductor, and cooled and solidified. A method for manufacturing a solid electrolytic capacitor, comprising: a step of impregnating pure water into the solidified capacitor element; and a step of drying water in the capacitor element.
【請求項2】前記有機半導体は、N−(アルキル)−キ
ノリニウム(又はイソキノリニウム)のTCNQ塩であ
ることを特徴とする特許請求の範囲第1項記載の固体電
解コンデンサの製造方法。
2. The method for producing a solid electrolytic capacitor according to claim 1, wherein the organic semiconductor is a TCNQ salt of N- (alkyl) -quinolinium (or isoquinolinium).
【請求項3】前記コンデンサ素子は陽極箔と陰極箔とを
セパレータ紙を介して巻回した巻取り素子であることを
特徴とする特許請求の範囲第1項又は第2項記載の固体
電解コンデンサの製造方法。
3. The solid electrolytic capacitor according to claim 1 or 2, wherein the capacitor element is a winding element formed by winding an anode foil and a cathode foil with separator paper interposed therebetween. Manufacturing method.
【請求項4】前記コンデンサ素子はアルミニウム、タン
タル、ニオブ等の弁作用を有する金属粉末を加圧成形
し、或は焼結してなるコンデンサ素子であることを特徴
とする特許請求の範囲第1項又は第2項記載の固体電解
コンデンサの製造方法。
4. The capacitor element is a capacitor element formed by pressure-molding or sintering a metal powder having a valve action such as aluminum, tantalum and niobium. Item 2. A method for producing a solid electrolytic capacitor as described in Item 2 or Item 2.
JP26457188A 1987-10-21 1988-10-20 Method for manufacturing solid electrolytic capacitor Expired - Lifetime JPH063786B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26457188A JPH063786B2 (en) 1987-10-21 1988-10-20 Method for manufacturing solid electrolytic capacitor

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP62-267270 1987-10-21
JP26727087 1987-10-21
JP26457188A JPH063786B2 (en) 1987-10-21 1988-10-20 Method for manufacturing solid electrolytic capacitor

Publications (2)

Publication Number Publication Date
JPH01205412A JPH01205412A (en) 1989-08-17
JPH063786B2 true JPH063786B2 (en) 1994-01-12

Family

ID=26546571

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26457188A Expired - Lifetime JPH063786B2 (en) 1987-10-21 1988-10-20 Method for manufacturing solid electrolytic capacitor

Country Status (1)

Country Link
JP (1) JPH063786B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6165623A (en) 1996-11-07 2000-12-26 Cabot Corporation Niobium powders and niobium electrolytic capacitors
US6051044A (en) 1998-05-04 2000-04-18 Cabot Corporation Nitrided niobium powders and niobium electrolytic capacitors
JP2001148328A (en) * 1999-11-19 2001-05-29 Nec Corp Manufacturing method for solid electrolytic capacitor

Also Published As

Publication number Publication date
JPH01205412A (en) 1989-08-17

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