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JPH0667634B2 - Thermal head resistor trimming method - Google Patents
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JPH0667634B2 - Thermal head resistor trimming method - Google Patents

Thermal head resistor trimming method

Info

Publication number
JPH0667634B2
JPH0667634B2 JP62010529A JP1052987A JPH0667634B2 JP H0667634 B2 JPH0667634 B2 JP H0667634B2 JP 62010529 A JP62010529 A JP 62010529A JP 1052987 A JP1052987 A JP 1052987A JP H0667634 B2 JPH0667634 B2 JP H0667634B2
Authority
JP
Japan
Prior art keywords
resistance value
pulse
resistor
resistor element
thermal head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62010529A
Other languages
Japanese (ja)
Other versions
JPS63178059A (en
Inventor
和生 中谷
光博 生駒
忍 中田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62010529A priority Critical patent/JPH0667634B2/en
Publication of JPS63178059A publication Critical patent/JPS63178059A/en
Publication of JPH0667634B2 publication Critical patent/JPH0667634B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/315Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
    • B41J2/32Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
    • B41J2/35Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads providing current or voltage to the thermal head

Landscapes

  • Electronic Switches (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、熱転写式プリンタや、ファクシミリに使用さ
れるサーマルヘッドの抵抗体トリミング方法に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for trimming a resistor of a thermal head used in a thermal transfer printer or a facsimile.

従来の技術 従来、熱転写式プリンタや、ファクシミリに使用される
サーマルヘッドの構造は第3図a,bに示すように、絶縁
基板1の上に金,銀,銅等の電気良導体材料を用いて、
成膜技術により構成された共通電極2と、個別電極3が
形成され、その上に抵抗体層4と耐摩耗層5が構成され
る。その結果、共通電極2と個別電極3に挾まれた複数
個の抵抗体要素6が形成される。
2. Description of the Related Art Conventionally, the structure of a thermal head used in a thermal transfer printer or a facsimile uses an electrically conductive material such as gold, silver or copper on an insulating substrate 1 as shown in FIGS. ,
The common electrode 2 and the individual electrode 3 formed by the film forming technique are formed, and the resistor layer 4 and the abrasion resistant layer 5 are formed thereon. As a result, a plurality of resistor elements 6 sandwiched between the common electrode 2 and the individual electrode 3 are formed.

このようなサーマルヘッドの抵抗体要素は、酸化ルテニ
ウム等の粉末をペースト状にして、スクリーン印刷技術
等を用いて、塗布した後、焼成することにより形成する
のが一般的であり、製造コストや信頼性の点からも、こ
のような方法が主流となりつつある。
The resistor element of such a thermal head is generally formed by forming powder of ruthenium oxide or the like into a paste, applying the paste using screen printing technology, etc., and then firing the paste. In terms of reliability, such a method is becoming mainstream.

しかしながら、印刷によって抵抗体要素を形成すること
は、抵抗体要素を構成している酸化ルテニウム等の粉末
の不均一性や、印刷機械の精度の限界から、形成された
複数個の抵抗体要素各々の物性や形状が不均一となり、
これらが、抵抗体要素の抵抗値にバラツキが生じる原因
となって、ヘッド全体の構成要素の抵抗値のバラツキは
は、平均抵抗値の±20%以上あるのが現状である。
However, forming the resistor element by printing means that each of the plurality of resistor elements formed is not uniform because of the non-uniformity of the powder such as ruthenium oxide forming the resistor element and the limit of the accuracy of the printing machine. The physical properties and shape of the
These cause variations in the resistance value of the resistor element, and the variation in the resistance value of the constituent elements of the entire head is currently ± 20% or more of the average resistance value.

そこで、印刷によって生じた抵抗体要素の抵抗値のバラ
ツキを補正する方法(トリミング方法)が種々考えられ
ている。例えばレーザー加工等により、抵抗体要素の形
状を変化させて抵抗値を補正する方法や、抵抗体要素に
通常の使用時より過負荷のパルス電圧を印加して抵抗値
を変化させる方法がある。これらのうち、抵抗体要素の
大きさにより、比較的容易に行なえるものとして、過負
荷のパルス電圧を印加する方法が最近特に多く見られ
る。
Therefore, various methods (trimming methods) for correcting variations in the resistance value of the resistor elements caused by printing have been considered. For example, there is a method of changing the shape of the resistor element by laser processing or the like to correct the resistance value, or a method of applying a pulse voltage to the resistor element that is more overloaded than in normal use to change the resistance value. Among these methods, a method of applying an overload pulse voltage has recently been particularly popular as a method that can be relatively easily performed depending on the size of the resistor element.

発明が解決しようとする問題点 しかし、このような従来のパルス電圧を加えるトリミン
グ方法には、次のような問題点があった。すなわち、各
抵抗体要素の抵抗値のバラツキを押さえるために、従来
は、各抵抗値を上げるか、下げるかの一方向に補正する
方法をとっていた。
Problems to be Solved by the Invention However, such a conventional trimming method for applying a pulse voltage has the following problems. That is, in order to suppress the variation in the resistance value of each resistor element, conventionally, a method of unidirectionally correcting each resistance value is used.

しかし、前述の様に印刷、焼成によって製作した抵抗体
要素の抵抗値バラツキは、平均抵抗値の±20%程度も存
在するため、従来のような一方向の補正を行なうと、そ
の補正量が大きくなり、その結果、トリミングに要する
時間が長くなっていた。また、抵抗値を大きく変化させ
ることによって抵抗体材料の組織が劣化し、寿命が短く
なるなどの問題点があった。
However, as described above, the resistance value variation of the resistor element manufactured by printing and firing is about ± 20% of the average resistance value, so if the conventional one-way correction is performed, the correction amount will be As a result, the time required for trimming was increased. Further, there is a problem that the structure of the resistor material is deteriorated and the life is shortened by largely changing the resistance value.

そこで本発明は、かかる従来の欠点を改良し、トリミン
グに要する時間の短い、かつ、抵抗体の寿命は長く保ち
得るサーマルヘッドの抵抗体トリミング方法を提供する
ものである。
Therefore, the present invention provides a method of trimming a resistor for a thermal head, in which the conventional drawbacks are improved and the time required for trimming is short and the life of the resistor is long.

問題点を解決するための手段 前記問題点を解決するための本発明の技術的手段は、各
抵抗体要素の抵抗値を測定し、その平均抵抗値より高い
抵抗体要素には、パルス時間幅の短い電気的パルス列
を、低い抵抗体要素には、パルス時間幅の長い電気的パ
ルス列をそれぞれ加えて、抵抗値を変化させ、各抵抗体
要素の抵抗値をパルス印加前の平均抵抗値に補正するこ
とを特徴とする。
Means for Solving the Problems The technical means of the present invention for solving the problems is to measure the resistance value of each resistor element, and for the resistor element higher than the average resistance value, the pulse time width Short electrical pulse trains with low resistance elements are added with electrical pulse trains with long pulse time widths to change the resistance value, and the resistance value of each resistor element is corrected to the average resistance value before pulse application. It is characterized by doing.

作用 この技術的手段による作用は次のようになる。すなわ
ち、抵抗体要素に印加するパルス時間幅の大小によって
抵抗値が増減する現象を利用して、各抵抗値をパルス印
加前の平均抵抗値に補正しようとするものである。
Action The action of this technical means is as follows. That is, the phenomenon that the resistance value increases or decreases depending on the magnitude of the pulse time width applied to the resistor element is used to correct each resistance value to the average resistance value before the pulse application.

実施例 本発明の一実施例を図面にもとづいて以下に説明する。
第1図は、本発明のサーマルヘッドの抵抗体トリミング
方法を用いた装置の構成図であり、サーマルヘッドは基
板上に形成された個別電極7、共通電極8と複数の抵抗
体要素9より成り、各個別電極7にそれぞれスイッチ10
を設け、それを介してパルス発生回路11と共通電極8が
直列に接続されている。パルス発生回路11は二種類のパ
ルス波形(パルス時間幅T,T′:T<T′)を発生させる
回路であり、スイッチ12の切換えによって、選択でき
る。また、各抵抗体要素の抵抗値を測定できるように、
スイッチ14を介して抵抗計13が並列に接続されている。
Embodiment An embodiment of the present invention will be described below with reference to the drawings.
FIG. 1 is a configuration diagram of an apparatus using a resistor trimming method for a thermal head according to the present invention. The thermal head includes individual electrodes 7, a common electrode 8 and a plurality of resistor elements 9 formed on a substrate. , Switch 10 for each individual electrode 7
Is provided, and the pulse generating circuit 11 and the common electrode 8 are connected in series through the same. The pulse generating circuit 11 is a circuit for generating two types of pulse waveforms (pulse time width T, T ': T <T'), and can be selected by switching the switch 12. Also, so that the resistance value of each resistor element can be measured,
The resistance meter 13 is connected in parallel via the switch 14.

第2図は、抵抗体要素に印加するパルス時間幅を換えた
時の抵抗値変化率の時間変化を示したものであり、パル
ス時間幅がTの小さい時には、抵抗値変化率はパルス印
加時間と共に徐々に低下し、パルス時間幅がT′の大き
い時には、抵抗値変化率は徐々に上昇していく。この現
象を利用し、第1図の装置を用いて、抵抗体要素へのパ
ルス印加方法を詳しく述べると次のようになる。まず、
スイッチ14をONし、スイッチ10の切換えによって各抵抗
体要素9の抵抗値を測定し、パルス印加前の平均抵抗値
を求める。その中で平均抵抗値より高い抵抗体要素9に
対応するスイッチ10をONし、パルス発生回路11内のスイ
ッチをパルス時間幅T(小)側に接続する。スイッチ14
をOFFにした後、パルス時間幅Tのパルス列を回路に流
して、スイッチ10がONになっている抵抗体要素9にパル
ス列をある定まった時間印加する。その後再びスイッチ
14をONして、抵抗計13によって抵抗体要素9の抵抗値を
測定し、今だ平均抵抗値に達していない抵抗体要素9に
のみ同上のパルス印加を行ない平均抵抗値より高かった
抵抗値をすべて平均抵抗値にまで低下させる。
FIG. 2 shows the time change of the resistance value change rate when the pulse time width applied to the resistor element is changed. When the pulse time width T is small, the resistance value change rate is the pulse application time. Along with this, when the pulse time width T'is large, the resistance value change rate gradually increases. Utilizing this phenomenon, the pulse applying method to the resistor element will be described in detail using the apparatus of FIG. 1 as follows. First,
The switch 14 is turned on, the resistance value of each resistor element 9 is measured by switching the switch 10, and the average resistance value before pulse application is obtained. Among them, the switch 10 corresponding to the resistor element 9 having a resistance value higher than the average resistance value is turned on, and the switch in the pulse generation circuit 11 is connected to the pulse time width T (small) side. Switch 14
After turning off, a pulse train having a pulse time width T is passed through the circuit, and the pulse train is applied to the resistor element 9 whose switch 10 is on for a certain period of time. Then switch again
Turn on 14 and measure the resistance value of the resistor element 9 with the ohmmeter 13, and apply the same pulse to only the resistor element 9 that has not reached the average resistance value, and the resistance value higher than the average resistance value. To the average resistance value.

次に、平均抵抗値より低い抵抗体要素9に対応するスイ
ッチ10をONし、パルス発生回路11内のスイッチをパルス
時間幅T′(大)側に接続し、同上の方法でパルス印
加、抵抗値測定を行ない、すべて平均抵抗値にまで上昇
させる。
Next, the switch 10 corresponding to the resistor element 9 having a resistance value lower than the average resistance value is turned on, the switch in the pulse generation circuit 11 is connected to the pulse time width T '(large) side, and pulse application and resistance are performed by the same method. Measure the values and increase all to the average resistance value.

以上のように行なえば、各抵抗体要素9の抵抗値をすべ
てパルス印加前の平均抵抗値に補正することができる。
By carrying out the above process, all the resistance values of the resistor elements 9 can be corrected to the average resistance value before the pulse application.

本発明の方法を用いれば、従来、印刷、焼成で製作した
サーマルヘッドの抵抗値のバラツキの補正量を少なくす
ることができるため時間的にも早く、かつ、抵抗体の内
部構造の変化も少なくなり寿命が短かくなるようなこと
はない。また、本実施例においては、二種類のパルス列
で説明したが、それ以上のパルス列を利用するものや、
それらを同時に印加す回路構成などは、すべて本発明に
含まれるものである。
By using the method of the present invention, it is possible to reduce the correction amount of the variation in the resistance value of the thermal head conventionally manufactured by printing and firing, so that it is quick in terms of time and the change in the internal structure of the resistor is small. It never becomes shorter. Further, in the present embodiment, two types of pulse trains have been described, but those using more pulse trains,
The circuit configuration and the like for applying them at the same time are all included in the present invention.

発明の効果 従来の抵抗値変化時間の約半分で済むようになり、トリ
ミング時間を短かくでき、かつ、信頼性も十分保ち得る
サーマルンヘッドを提供できる。
Advantageous Effects of the Invention It is possible to provide a thermal head in which the time required for changing the resistance value can be reduced to about half, the trimming time can be shortened, and the reliability can be sufficiently maintained.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明のサーマルヘッドの抵抗体トリミング方
法を用いた装置の構成図、第2図は同トリミング方法に
用いたパルス幅と抵抗値変化率の変化の関係図、第3図
はサーマルヘッドの抵抗体要素付近を示した概略図であ
る。 7……個別電極、8……共通電極、9……抵抗体要素、
10,12,14……スイッチ、11……パルス発生回路。
FIG. 1 is a block diagram of an apparatus using a resistor trimming method for a thermal head according to the present invention, FIG. 2 is a relationship diagram of changes in pulse width and resistance value change rate used in the trimming method, and FIG. 3 is thermal. FIG. 3 is a schematic diagram showing the vicinity of a resistor element of the head. 7 ... Individual electrode, 8 ... Common electrode, 9 ... Resistor element,
10,12,14 …… Switch, 11 …… Pulse generation circuit.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】複数の抵抗体要素等より成るサーマルヘッ
ドの各抵抗体要素の抵抗値の平均抵抗値より高い抵抗体
要素には印加時間幅の短い電気的パルス列を、低い抵抗
体要素には印加時間幅の長い電気的パルス列をそれぞれ
加えて抵抗値を変化させ、前記平均抵抗値に補正するこ
とを特徴とするサーマルヘッドの抵抗体トリミング方
法。
1. A thermal head comprising a plurality of resistor elements, etc., wherein an electric pulse train having a short application time width is applied to a resistor element having a resistance value higher than an average resistance value of the resistor elements, and a resistor element having a low application time width is applied to a resistor element having a low resistance value. A method of trimming a resistor of a thermal head, characterized in that a resistance value is changed by adding an electric pulse train having a long application time width, and the average resistance value is corrected.
JP62010529A 1987-01-20 1987-01-20 Thermal head resistor trimming method Expired - Lifetime JPH0667634B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62010529A JPH0667634B2 (en) 1987-01-20 1987-01-20 Thermal head resistor trimming method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62010529A JPH0667634B2 (en) 1987-01-20 1987-01-20 Thermal head resistor trimming method

Publications (2)

Publication Number Publication Date
JPS63178059A JPS63178059A (en) 1988-07-22
JPH0667634B2 true JPH0667634B2 (en) 1994-08-31

Family

ID=11752779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62010529A Expired - Lifetime JPH0667634B2 (en) 1987-01-20 1987-01-20 Thermal head resistor trimming method

Country Status (1)

Country Link
JP (1) JPH0667634B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5153220B2 (en) * 2007-06-14 2013-02-27 古河電池株式会社 Lead acid battery

Also Published As

Publication number Publication date
JPS63178059A (en) 1988-07-22

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