JPH0669918B2 - Rare earth gallium perovskite single crystal and method for producing the same - Google Patents
Rare earth gallium perovskite single crystal and method for producing the sameInfo
- Publication number
- JPH0669918B2 JPH0669918B2 JP21786189A JP21786189A JPH0669918B2 JP H0669918 B2 JPH0669918 B2 JP H0669918B2 JP 21786189 A JP21786189 A JP 21786189A JP 21786189 A JP21786189 A JP 21786189A JP H0669918 B2 JPH0669918 B2 JP H0669918B2
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- rare earth
- perovskite single
- mol
- same
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明はレアアース・ガリウム・ペロブスカイト単結
晶、特には偏析係数が1.00に近く、双晶も起き難いので
超電導基板材料として有用とされるレアアース・ガリウ
ム・ペロブスカイト単結晶およびその製造方法に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention relates to a rare earth gallium perovskite single crystal, particularly a rare earth / gallium perovskite single crystal which is useful as a superconducting substrate material because a segregation coefficient is close to 1.00 and twins are unlikely to occur. The present invention relates to a gallium perovskite single crystal and a method for manufacturing the same.
(従来の技術) レアアース・ガリウム・ペロブスカイト単結晶は超電導
用基板材料などに用いられているが、これらの用途に使
用されるレアアース・ガリウム・ペロブスカイト単結晶
には高い品質、すなわち一定かつ一様な格子定数と無欠
陥であることが要求される。(Prior Art) Rare earth gallium perovskite single crystals are used for superconducting substrate materials, etc., but rare earth gallium perovskite single crystals used for these applications have high quality, that is, uniform and uniform. Lattice constant and defect-free are required.
しかして、このレアアース・ガリウム・ペロブスカイト
単結晶のような複合化合物単結晶の製造は通常化学量論
的の組成の融液から単結晶を育成する方法が採られてい
るが、この単結晶製造には高い品質の確保と同時に結晶
に関するクラック発生の防止が課題となっている。すな
わち、単結晶の大直径化および長尺化はそれと共に単結
晶インゴット内における組成や特性値の不均一が大きく
なり、単結晶インゴットが基板への加工工程のみなら
ず、薄膜形成工程においても不利を伴うことになる。In order to produce a single compound crystal such as a rare earth gallium perovskite single crystal, a method of growing a single crystal from a melt having a stoichiometric composition is usually adopted. In addition to ensuring high quality, the problem is to prevent cracks from occurring in crystals. In other words, increasing the diameter and length of the single crystal causes a large nonuniformity of the composition and characteristic values in the single crystal ingot, and the single crystal ingot is not only disadvantageous not only in the substrate processing step but also in the thin film forming step. Will be accompanied.
(発明が解決しようとする課題) しかし、上記した公知の方法で作られた単結晶はその偏
析係数が1.00から大きく外れるようになるために融液と
単結晶の組成が一致せず、また単結晶が安定に成長しな
いので長いものを引き上げることができず、双晶が起き
易いという欠点があり、これにはまたこのようにして得
た単結晶から切り出したウエーハを基板として用いた各
デバイスは特性値が一定しないという不利もある。(Problems to be solved by the invention) However, since the segregation coefficient of the single crystal produced by the above-described known method largely deviates from 1.00, the composition of the melt and the single crystal do not match, and Since crystals do not grow stably, long ones cannot be pulled up, and twins are likely to occur, which also means that each device using a wafer cut from the single crystal thus obtained as a substrate There is also the disadvantage that the characteristic values are not constant.
(課題を解決するための手段) 本発明はこのような不利を解決したレアアース・ガリウ
ム・ペロブスカイト単結晶およびその製造方法に関する
もので、これはRe2O3(ここにReはレアアース元素を示
す)xモル%,Ga2O3yモル%よりなる組成において、x,y
が50.00<x≦52.00、48,00≦y<50.00からなることを
特徴とするレアアース・ガリウム・ペロブスカイト単結
晶、およびRe2O3xモル%からなる組成において、xが5
0.00<x≦52.00よりなるコングルエント組成よりなるR
e2O3とGa2O3との混合融液からレアアース・ガリウム・
ペロブスカイト単結晶を成長させることを特徴とするレ
アアース・ガリウム・ペロブスカイト単結晶の製造方法
に関するものである。(Means for Solving the Problems) The present invention relates to a rare earth gallium perovskite single crystal and a method for producing the same, in which such disadvantages are solved, and it is Re 2 O 3 (where Re represents a rare earth element). x, y in the composition consisting of x mol% and Ga 2 O 3 y mol%
Is 50.00 <x ≦ 52.00 and 48,00 ≦ y <50.00, and x is 5 in a composition consisting of Re 2 O 3 x mol% and a rare earth gallium perovskite single crystal.
R consisting of congruent composition with 0.00 <x ≤ 52.00
From the mixed melt of e 2 O 3 and Ga 2 O 3 , rare earth gallium
The present invention relates to a method for producing a rare earth gallium perovskite single crystal, which comprises growing a perovskite single crystal.
すなわち、本発明者らは前記したような不利を伴わない
レアアース・ガリウム・ペロブスカイト単結晶およびそ
の製造方法について種々検討した結果、チョクラルスキ
ー法による単結晶引上げ時に使用される融液をコングル
エント組成のRe2O3xモル%のxが50.00<x≦52.00で残
余が実質的にGa2O3であるものとしてこれからレアアー
ス・ガリウム・ペロブスカイト単結晶を成長させると、
得られる単結晶のRe2O3xモル%のxを50.00<x≦52.00
モル%含有するものになるということを確認すると共
に、このものは偏析係数がほぼ1.00を示すし、単結晶の
組成も各部分で一定となるのでクラック率が小さく、双
晶も少ないものになるということを見出して本発明を完
成させた。That is, as a result of various studies on the rare earth gallium perovskite single crystal and the method for producing the same without the above disadvantages, the present inventors have found that the melt used in pulling the single crystal by the Czochralski method has a congruent composition. When a rare earth gallium perovskite single crystal is grown from this assuming that Re 2 O 3 x mol% x is 50.00 <x ≦ 52.00 and the balance is substantially Ga 2 O 3 .
X of Re 2 O 3 x mol% of the obtained single crystal is 50.00 <x ≦ 52.00
It was confirmed that the content was mol% and that the segregation coefficient of this product was approximately 1.00 and the composition of the single crystal was constant in each part, so the crack rate was small and twins were also small. The present invention was completed by finding out that.
以下にこれをさらに詳述する。This will be described in more detail below.
(作用) 本発明のレアアース・ガリウム・ペロブスカイト単結晶
はRe2O3xモル%,Ga2O3yモル%からなる組成において、
x,yが50.00<x≦52.00,48.00≦y<50.00からなるもの
であり、これはRe2O3xモル%とした組成において、xが
50.00<x≦52.00よりなるコングルエント組成物よりな
るRe2O3とGa2O3との混合融液から成長させることによっ
て作られるが、このレアアース元素(Re)としてはLa、
Pr、Ndが適切なものとされる。また、ここに使用される
Re2O3、Ga2O3はできるだけ高純度のものとすることがよ
く、したがってこれらはいずれも好ましくは99.99%以
上のものとすることがよいが、これらの配合比は上記し
たようにそのコングルエントの組成のRe2O3xモル%のx
を50.00<x≦52.00とし、残余が実質的にGa2O3となる
ものとする必要がある。これらはそれぞれを秤量後るつ
ぼ内に収納して溶融されるが、このるつぼはこれらの溶
融温度が1,600℃以上とされるのでイリジウム製のもの
とすればよい。このものの溶融は常法にしたがって高周
波誘導加熱によって行なえばよく、したがってこれには
例えば7kHz、10kwの高周波を用いてこれらを1,700〜1,8
00℃に加熱して溶融させればよい。(Function) The rare earth gallium perovskite single crystal of the present invention has a composition of Re 2 O 3 x mol% and Ga 2 O 3 y mol%.
x, y is 50.00 <x ≦ 52.00, 48.00 ≦ y <50.00, which means that x is Re 2 O 3 x mol% and x is
It is produced by growing from a mixed melt of Re 2 O 3 and Ga 2 O 3 having a congruent composition of 50.00 <x ≦ 52.00. The rare earth element (Re) is La,
Pr and Nd are appropriate. Also used here
Re 2 O 3 and Ga 2 O 3 are preferably as high in purity as possible, and therefore, it is preferable that all of them are 99.99% or more. Congruent composition Re 2 O 3 x mol% x
Should be 50.00 <x ≦ 52.00, and the balance should be substantially Ga 2 O 3 . Each of these is weighed and then stored in a crucible to be melted. Since the melting temperature of these crucibles is 1,600 ° C. or higher, they may be made of iridium. This material may be melted by high-frequency induction heating according to a conventional method. Therefore, for this, for example, a high frequency of 7 kHz, 10 kw is used to melt these at 1,700 to 1,8
It may be heated to 00 ° C to melt.
目的とする単結晶の製造はこの溶融物からのチョクラル
スキー法による単結晶引上げによって行なえばよいが、
この場合の雰囲気に酸素を1〜5%またはCO2を25〜100
%含有する窒素ガス、アルゴンガス雰囲気とすればよ
い。また、この単結晶引上げに使用される種子結晶は目
的とする単結晶と同質の式、例えば式ReGaO3で示される
ものとすればよいが、これはガーネット単結晶型結晶体
の単結晶としてもよく、この場合の単結晶の引上げ速度
は1〜20mm/時とすればよい。The target single crystal may be produced by pulling a single crystal from the melt by the Czochralski method,
The atmosphere in this case is 1 to 5% oxygen or 25 to 100 CO 2 .
% Nitrogen gas or argon gas atmosphere may be used. Further, the seed crystal used for pulling this single crystal may be of the same quality as the intended single crystal, for example, the one represented by the formula ReGaO 3 , but this is also a single crystal of the garnet single crystal type crystal body. Of course, the pulling rate of the single crystal in this case may be 1 to 20 mm / hour.
なお、この単結晶の引上げは他の単結晶の引上げと同様
の方法で行なうことができ、引上げ終了後に単結晶を融
体から引離し、冷却すれば目的とする単結晶を得ること
ができる。The pulling of this single crystal can be performed in the same manner as the pulling of other single crystals, and after the pulling is completed, the single crystal is separated from the melt and cooled to obtain the desired single crystal.
このようにして得られた本発明の式ReGaO3で示される単
結晶のRe2O3xモル%の組成において、xを50.00<x≦5
2.00とすることを特徴とするもので、このものはクラッ
ク発生率が小さく、双晶も極端に少なく、偏析係数も略
々1であるということから、Ba−Y−Cu−O系の超電導
用酸化物質を薄膜成長させるための基板単結晶として有
用とされる。In the composition of Re 2 O 3 x mol% of the single crystal represented by the formula ReGaO 3 of the present invention thus obtained, x is 50.00 <x ≦ 5
2.00, which has a small crack occurrence rate, extremely few twins, and a segregation coefficient of about 1, so it is for superconductivity of Ba-Y-Cu-O system. It is useful as a substrate single crystal for growing a thin film of an oxide substance.
(実施例) つぎに本発明の実施例,比較例をあげる。(Example) Next, the Example of this invention and a comparative example are given.
実施例1 外径50mm、高さ50mmのイリジウムるつぼ中に、La2O325
5.8g(50.50モル%)、Ga2O3144.2g(49.50モル%)を
秤取して仕込み、酸素ガスを1〜5%含有する窒素ガス
雰囲気ガス中で高周波誘導で1,715℃に加熱して溶融さ
せ、この融液に5mm角のLaGaO3種子結晶を浸漬し、これ
を20rpmの回転下に1〜10mm/時の速度で引上げて単結晶
引上げを行なったところ、200gの透明な結晶が得られ
た。Example 1 La 2 O 3 25 was placed in an iridium crucible having an outer diameter of 50 mm and a height of 50 mm.
5.8 g (50.50 mol%) and Ga 2 O 3 144.2 g (49.50 mol%) were weighed and charged, and heated to 1,715 ° C. by high frequency induction in a nitrogen gas atmosphere gas containing 1 to 5% oxygen gas. When melted, 5 mm square LaGaO 3 seed crystals were immersed in this melt, and when this was pulled at a rate of 1 to 10 mm / hour under rotation of 20 rpm to perform single crystal pulling, 200 g of transparent crystals were obtained. Was given.
つぎにこの結晶の下部および結晶引上げ後のるつぼ中の
融液から試料各1gをとり、La2O3についての定量分析を
行なったところ、第1表に示した結果が得られたので、
このものは式La1.01Ga0.99O3の結晶構造をもつものであ
ることが確認されたが、その定量分析結果にもとずいて
Laの偏析係数を算出したところ、1.00であった。Next, 1 g of each sample was taken from the melt in the lower part of the crystal and in the crucible after pulling the crystal, and quantitative analysis for La 2 O 3 was carried out, and the results shown in Table 1 were obtained.
This was confirmed to have the crystal structure of the formula La 1.01 Ga 0.99 O 3 , but based on the quantitative analysis results,
The segregation coefficient of La was calculated and found to be 1.00.
また、この結晶についてはこの結晶上部および結晶下部
から厚さ1mmのウエーハを切り出し、熱リン酸でエッチ
ング後、格子定数精密測定装置APL2(理学電機社製商品
名)を用い、ボンド法でその格子定数を測定したとこ
ろ、これはいずれもa=5.502Å、b=5.491Å、c=7.
773ű0.002Åの範囲の値を示した。For this crystal, a wafer with a thickness of 1 mm was cut out from the upper and lower parts of the crystal, etched with hot phosphoric acid, and the lattice constant precision measurement device APL2 (trade name of Rigaku Denki Co., Ltd.) was used. When constants were measured, they were a = 5.502Å, b = 5.491Å, c = 7.
The value in the range of 773Å ± 0.002Å was shown.
なお、このものは同一条件で結晶を10回引上げたとこ
ろ、引上げ後、冷却中または加工切断中にクラックを起
したものはなく、この結晶上部および下部から切り出し
た厚さ1mmのウエーハを熱リン酸でエッチング後、双晶
を観察したが、このものの本来の結晶方位と異なる双晶
部分の面積はいずれも1cm2当り10%以下であった。When the crystal was pulled 10 times under the same conditions, no cracks occurred during cooling or during work cutting after pulling, and 1 mm thick wafers cut from the top and bottom of the crystal were hot-phosphorized. After etching with acid, twins were observed, and the area of twins different from the original crystal orientation was 10% or less per cm 2 .
比較例1〜2 上記した実施例1おけるLa2O3、Ga2O3の配合量を第2表
に示した量としたほかは実施例1と同様に処理したとこ
ろ、この場合にも透明な単結晶が得られ、これらについ
てのLa2O3(重量%)、偏析係数については第3表に示
したとおりの結果が得られ、これらのクラック率、双晶
数については第4表に示したとおりの結果が得られた。 Comparative Examples 1 and 2 The same treatment as in Example 1 was carried out except that the amounts of La 2 O 3 and Ga 2 O 3 in Example 1 were changed to those shown in Table 2. The following single crystals were obtained. The La 2 O 3 (wt%) and segregation coefficient of these single crystals were obtained as shown in Table 3, and the crack rate and twin number thereof were shown in Table 4. The results were as shown.
Claims (3)
す)xモル%、Ga2O3yモル%よりなる組成において、x,
yが50.00<x≦52.00,48.00≦y<50.00からなることを
特徴とするレアアース・ガリウム・ペロブスカイト単結
晶。1. A composition comprising Re 2 O 3 (wherein Re represents a rare earth element) x mol% and Ga 2 O 3 y mol%, x,
A rare earth gallium perovskite single crystal characterized in that y is 50.00 <x ≦ 52.00, 48.00 ≦ y <50.00.
れた少なくとも1種のものである請求項1に記載のレア
アース・ガリウム・ペロブスカイト単結晶。2. The rare earth gallium perovskite single crystal according to claim 1, wherein the rare earth element is at least one selected from La, Pr and Nd.
ル%よりなる組成において、xが50.00<x≦52.00であ
るコングルエイト組成よりなるRe2O3とGa2O3との混合融
液からレアアース・ガリウム・ペロブスカイト単結晶を
成長させることを特徴とするレアアース・ガリウム・ペ
ロブスカイト単結晶の製造方法。 3. A mixture of Re 2 O 3 and Ga 2 O 3 having a composition of Re 2 O 3 (Re represents a rare earth element) x mol% and a congruate composition in which x is 50.00 <x ≦ 52.00. A method for producing a rare earth gallium perovskite single crystal, which comprises growing a rare earth gallium perovskite single crystal from a melt.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21786189A JPH0669918B2 (en) | 1989-08-24 | 1989-08-24 | Rare earth gallium perovskite single crystal and method for producing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21786189A JPH0669918B2 (en) | 1989-08-24 | 1989-08-24 | Rare earth gallium perovskite single crystal and method for producing the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0380194A JPH0380194A (en) | 1991-04-04 |
| JPH0669918B2 true JPH0669918B2 (en) | 1994-09-07 |
Family
ID=16710915
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21786189A Expired - Lifetime JPH0669918B2 (en) | 1989-08-24 | 1989-08-24 | Rare earth gallium perovskite single crystal and method for producing the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0669918B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100432431B1 (en) * | 2001-11-13 | 2004-05-22 | 엘지이노텍 주식회사 | Both directions indraft type centrigugal fan and cooling apparatus for computer using the centrigugal fan |
-
1989
- 1989-08-24 JP JP21786189A patent/JPH0669918B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0380194A (en) | 1991-04-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| RU2108418C1 (en) | Method for growing single crystals of lanthanum-gallium silicate | |
| US6302956B1 (en) | Langasite wafer and method of producing same | |
| EP1867761A1 (en) | Gallate single crystal, process for producing the same, piezoelectric device for high-temperature use and piezoelectric sensor for high-temperature use | |
| JPH0669918B2 (en) | Rare earth gallium perovskite single crystal and method for producing the same | |
| Menovsky et al. | Crystal growth and characterization of MT2Si2 ternary intermetallics (M= U, RE and T= 3d, 4d, 5d transition metals) | |
| EP0179851B1 (en) | A method of synthesizing thin, single crystal layers of silver thiogallate (aggas2) | |
| Plaskett et al. | The Preparation and Properties of Large, Solution Grown GaP Crystals | |
| EP0477387A1 (en) | Process for producing single crystal of oxide | |
| JP4147573B2 (en) | Garnet single crystal substrate and manufacturing method thereof | |
| JP3152322B2 (en) | Twinless (Nd, La) GaO3 single crystal and method for producing the same | |
| JPH07115996B2 (en) | Neodymium gallium garnet single crystal and method for producing the same | |
| JPS61201700A (en) | High resistance GaAs crystal and its manufacturing method | |
| EP0018111B1 (en) | Method of producing ferrite single crystals | |
| JP2929006B1 (en) | Manufacturing method of high quality crystal sheet material | |
| JPH06125148A (en) | Low-resistance semiconductor crystal substrate and manufacture thereof | |
| JPH07206577A (en) | Method for growing rare earth gallium perovskite single crystal | |
| JPS58155719A (en) | Manufacture of single crystal body | |
| JPS59152285A (en) | Preparation of single crystal | |
| JPH0294608A (en) | Oxide garnet single crystal | |
| JP2823741B2 (en) | Method for producing bismuth germanate single crystal | |
| JPS6065511A (en) | Manufacture of single crystal of magnetic oxide | |
| JP2511457B2 (en) | Semiconductor crystal substrate | |
| JP2003238295A (en) | Garnet single crystal substrate and method of producing the same | |
| RU2156327C2 (en) | Method of preparing charge for growing lanthanum-gallium silicate monocrystals | |
| Narayanan et al. | Growth of BiCaSrCu-oxide superconducting film on NdGaO3 substrates |