JPH067086B2 - Electronic equipment testing equipment - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a testing device for electronic equipment.

[0002]

2. Description of the Related Art FIG. 4 shows a conventional temperature testing apparatus for electronic equipment. In this conventional example, the electronic device under test 1 is conveyed by a conveyor 8 to a test tank 13 such as an aging tank. The test tank 13 is controlled at an appropriate test temperature, and the electronic device under test 1 is
After being kept within 3 for a predetermined time, it is discharged and the deterioration of the performance is evaluated.

[0003]

However, in the above-mentioned conventional example, since the test tank 13 for performing the temperature cycle test or the environmental test on the electronic device under test 1 is required, the whole apparatus is large-scaled. In addition, in the case of testing many kinds of products under different test conditions, it has a drawback of lacking flexibility.

The present invention has been made to solve the above drawbacks, and an object of the present invention is to provide a test apparatus for electronic equipment which is compact and has high flexibility in test conditions.

[0005]

According to the present invention, as described above, the above object is achieved by a pallet 2 on which an electronic device under test 1 is placed, as shown in FIG. And a shelter 3 that covers the electronic device under test 1 in a hermetically sealed manner, and holds the interior of the shelter 3 in a test atmosphere to perform a predetermined test. To be done.

Further, an airtight packing 4 is provided at a contact portion between the pallet 2 and the shelter 3, and an exhaust port 5 is provided in the shelter 3 so that air in the shelter 3 is exhausted through the exhaust port 5. Aspirate and put shelter 3 on pallet 2
It can be adsorbed on top of the shelter 3
It is also possible to provide a gas supply port 6 to the test space and introduce a test atmosphere gas from the gas supply port 6 to make the test space 7 in the shelter 3 a test atmosphere.

Further, as a test line using such a test apparatus for electronic equipment, as shown in FIG. 3, it has a conveyor 8 for carrying the pallet 2 carrying the electronic equipment under test 1 and a shelter carrying device 9. , The shelter transfer device 9
Is a shelter 3 on the pallet 2 at the start of the test.
And a shelter attaching / detaching device 10 for detaching the shelter 3 from the pallet 2 at the end of the test, a hanger conveyor 11 that orbits an orbit including at least the attachment / detachment position of the shelter 3 as a route, and the hanger conveyor 11 is attached to the hanger conveyor 11. A chuck 12 for holding the shelter 3 may be provided.

[0008]

In the present invention, the electronic device under test 1 placed on the pallet 2 is covered hermetically by the shelter 3,
A relatively small test space 7 is formed by being shielded from the outside air. It is relatively easy to maintain a constant atmosphere in a space that covers the single unit of the electronic device under test 1, and does not require a large-scale device as in the conventional example.

Further, since it becomes possible to construct various different environments for each shelter 3, the flexibility of the test is improved.

[0010]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT A preferred embodiment of the present invention will now be described in detail with reference to the accompanying drawings. FIG. 1 shows a test apparatus according to the present invention.
Shown in. In this embodiment, the electronic device under test 1 is carried on the test line by the conveyor 8 while being placed on the pallet 2.

The test line is provided with a power distribution bar 14, and the current collection bar 1 formed on the back surface of the pallet 2 is described.
5, the wiring inside the pallet 2 (not shown), and the service outlet 16 supply power to the electronic device under test 1.

Further, in the central portion of the upper surface of the pallet 2,
When performing a temperature test, a heat insulating material 17 is laid so that the temperature condition of the test space 7 is unlikely to change.
The electronic device under test 1 is placed on the top. Further, an airtight packing 4 is fitted on the peripheral portion of the upper surface of the pallet 2, and a shelter 3 is attached via the airtight packing 4.

The shelter 3 has a mounting flange 18 at the lower edge.
It is a bowl-shaped member having preferably a heat insulating material, and if it is necessary to confirm the appearance of the electronic device under test 1, it should be formed of a transparent body or provided with a peep window. Is possible. The shelter 3 is attached to the airtight packing 4 of the pallet 2 by the mounting flange 18.
It is mounted in a state of being pressed against, and in the mounted state, an airtight test space 7 is formed inside.

Mounting the shelter 3 on the pallet 2
This can be done by bolting the mounting flange 18, but in this embodiment, atmospheric pressure is used in consideration of automation of mounting work and the like. Reference numeral 5 denotes an exhaust port used when the pallet 2 is mounted, which is connected to an intake pump 20 via an exhaust valve 19, and after the shelter 3 is placed on the pallet 2, the intake pump 20 is used. When the test space 7 is inhaled to a negative pressure, the shelter 3 moves to the pallet
It sticks to the top and the mounting work is completed.

A temperature adjusting device 21 and an external communication device 22 are arranged in the test space 7 formed as described above. The temperature adjusting device 21 is provided to keep the temperature atmosphere in the test space 7 constant, and the external communication device 22 outputs the output state of the electronic device under test 1 to a measuring device or the like outside the shelter 3, It is provided to monitor the electronic device under test 1 from the outside. Signals can be exchanged between the external communication device 22 and the outside of the shelter 3 by, for example, forming internal wiring inside the pallet 2.
It is also possible to use an optical communication unit.

Further, the shelter 3 is provided with an air supply port 6 in order to create a prescribed test atmosphere in the test space 7. The air supply port 6 is provided with an air supply device 24 via an air supply valve 23.
The test atmosphere gas is sent from the air supply device 24 into the test space 7 into the shelter 3 to change the inside of the shelter 3 to a predetermined test atmosphere.

A test line using such a test apparatus is shown in FIGS. This test line includes a conveyor 8 that conveys the pallet 2 in the direction of arrow A in the figure, and an air supply device 2
4 and a shelter transfer device 9 installed on the transfer path of the conveyor 8.

The air supply device 24 has a head portion 25 that moves forward and backward toward the shelter 3 on the test line. After the air supply nozzle of the head portion 25 is connected to the air supply port 6 of the shelter 3, The air supply valve 23 on the side of the shelter 3 is opened to deliver a predetermined atmosphere gas into the shelter 3.

In the embodiment shown in FIG. 2, the head portion 25 of the air supply device 24 is formed integrally with the head portion of the air supply pump 20. The embodiment of FIG. 2 shows a case where the high temperature test and the low temperature test are performed over time. First, after the shelter 3 is mounted on the electronic device under test 1, the intake pump 20 is attached to the exhaust port 5. Is connected to draw a negative pressure in the shelter 3. This is the mounting stage. Since the shelter 3 is adsorbed on the pallet 2, the shelter 3 can be completely prevented from being displaced due to vibration or the like during movement on the conveyor 8.

After that, the head portion 25 of the air supply device 24 is connected to the air supply port 6, hot air is sent into the shelter 3, and at the same time, the test space 7 is sucked by the suction pump 20, and the test space is tested. The inside of 7 is raised to a test temperature of, for example, about 40 ° C. If the test temperature is higher than the ambient temperature, or
When the test time is long and there is a risk of temperature drop, the temperature control device 21 is used together. This is the high temperature test stage.

When the high temperature test is completed, the exhaust valve 19 of the exhaust port 5 is opened to release the hot air in the test space 7, and the air supply valve 23 sends cold air. The air blowing from the air supply valve 23 is performed until the inside of the test space 7 reaches a predetermined low temperature state, and then the test is performed by setting the inside of the shelter 3 to a negative pressure. This is the low temperature test stage.

When all the tests are completed as described above, air is sent from the air supply port 6 into the shelter 3 to release the negative pressure state, and the shelter attaching / detaching device 10 described later removes the shelter 3. .

In the above example, the high-temperature test and the low-temperature test are performed one cycle at a time, but a so-called cycle test in which the high-temperature test and the low-temperature test are repeated for a plurality of cycles can be performed in the same procedure.

Further, the temperature test can be easily handled by providing the heater 26 in the air supply device 24 and controlling the heater 26 to be turned ON / OFF by a control device (not shown). Further, in a dust test or the like, a gas containing dust may be supplied from the air supply device 24.

On the other hand, as shown in FIG. 3, the shelter conveying device 9 is rotated above the conveyor 8 in a circulation path including a track traveling parallel to the conveyor 8 in the direction opposite to the conveying direction of the conveyor 8. Driven hanger conveyor 11
And a shelter attaching / detaching device 10 arranged near the starting point position and the ending point position of the parallel traveling track with the conveyor 8. The hanger conveyor 11 is the shelter 3 described above.
Is provided with a plurality of chucks 12 for holding, and an unused shelter 3 is held by the chucks 12 and conveyed to a starting point position. On the other hand, the shelter attaching / detaching device 10 has a vacuum body 27.

Therefore, in this embodiment, when the electronic device under test 1 is placed on the pallet 2 and conveyed on the test line, first, the shelter 3 on the hanger conveyor 11 of the shelter conveying device 9 is moved to the shelter attaching / detaching device 10. Be delivered to. This operation is performed after the upper surface of the shelter 3 on the hanger conveyor 11 is sucked by the vacuum body 27,
This is performed by releasing the chuck 12. Then
The vacuum body 27 is driven downward to mount the shelter 3 until the flange is pressed against the airtight packing 4 on the pallet 2. In FIG. 3, 28 is a guide rod that guides the movement of the vacuum body 27, and the vacuum body 27 is driven up and down by a drive device (not shown).

After that, the electronic device under test 1 is tested in the shelter 3 according to the procedure described above, and the negative pressure in the test space 7 is released from the shelter 3 which has reached the end point position after the test is completed. After that, the shelter attaching / detaching device 10 arranged near the end point position removes the same. This operation is performed by sucking the shelter 3 by the vacuum body 27, and the used shelter 3 is conveyed to the starting point position while being held by the chuck 12. The chuck 12 has an inversion structure portion, and the shelter 3 held by the chuck 12 is inverted to remove the pallet 2 from the pallet 2 as shown in FIG. From, the transfer to the starting point position is performed.

[0028]

As is apparent from the above description, according to the present invention, it is possible to change the test condition for each electronic device under test to perform the test, so that the versatility and flexibility are improved. You can

[Brief description of drawings]

FIG. 1 is a diagram showing an embodiment of the present invention.

FIG. 2 is a diagram showing an operation of the present invention.

FIG. 3 is a diagram showing a test line of an electronic device according to the present invention.

FIG. 4 is a diagram showing a conventional example.

[Explanation of symbols]

 1 electronic device under test 2 pallet 3 shelter 4 airtight packing 5 exhaust port 6 air supply port 7 test space 8 conveyor 9 shelter transfer device 10 shelter attachment / detachment device 11 hanger conveyor 12 chuck

Claims (4)

[Claims] 1. A pallet for mounting an electronic device under test (1)
(2) and a shelter (3) detachably mounted on the pallet (2) and hermetically covering the electronic device under test (1), and a test atmosphere is provided in the shelter (3). A testing device for electronic equipment that is held in place and performs a predetermined test. 2. An airtight packing (4) is provided at a contact portion between the pallet (2) and the shelter (3), and an exhaust port (5) is provided at the shelter (3). The air in (3) is sucked through the exhaust port (5) to adsorb the shelter (3) onto the pallet (2).
The electronic device testing device described. 3. The air inlet (6) is provided in the shelter (3), and a test atmosphere gas is introduced from the air inlet (6) to open a test space (7) in the shelter (3). A test atmosphere is set.
Alternatively, the electronic device test apparatus according to the item 2. 4. A pallet (2) on which an electronic device under test (1) is placed.
A shelter carrier (9) for transporting the shelter (8) and a shelter carrier (9), wherein the shelter carrier (9) places the shelter (3) according to claim 3 on the pallet (2) at the start of a test. A shelter attachment / detachment device (10) that is attached and removes the shelter (3) from the pallet (2) at the end of the test; and a hanger conveyor (11) that orbits a circular orbit including at least the attachment / detachment position of the shelter (3) as a path. A test line for electronic equipment, comprising a chuck (12) attached to the hanger conveyor (11) and holding the shelter (3).