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JPH067619B2 - Jig for semiconductor surface treatment - Google Patents
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JPH067619B2 - Jig for semiconductor surface treatment - Google Patents

Jig for semiconductor surface treatment

Info

Publication number
JPH067619B2
JPH067619B2 JP58251611A JP25161183A JPH067619B2 JP H067619 B2 JPH067619 B2 JP H067619B2 JP 58251611 A JP58251611 A JP 58251611A JP 25161183 A JP25161183 A JP 25161183A JP H067619 B2 JPH067619 B2 JP H067619B2
Authority
JP
Japan
Prior art keywords
semiconductor
jig
flat plate
semiconductor laser
surface treatment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58251611A
Other languages
Japanese (ja)
Other versions
JPS60140779A (en
Inventor
裕一 清水
優 和田
国雄 伊藤
文子 田尻
雅博 粂
健 浜田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP58251611A priority Critical patent/JPH067619B2/en
Publication of JPS60140779A publication Critical patent/JPS60140779A/en
Publication of JPH067619B2 publication Critical patent/JPH067619B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/40Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/40Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • H01S5/4031Edge-emitting structures
    • H01S5/4043Edge-emitting structures with vertically stacked active layers
    • H01S5/405Two-dimensional arrays

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は半導体表面処理用治具に関する。TECHNICAL FIELD The present invention relates to a semiconductor surface treatment jig.

従来例の構成とその問題点 半導体素子の製造工程においては、半導体の表面を選択
的に処理しなければならないことがある。例えば(GaA
l)As系の半導体レーザーでは、光が出射する端面の
劣化を防ぐため、その端面を誘電体膜で被覆する処理が
行なわれる。この被膜処理に当つては第1図に示すよう
に半導体レーザーウエハー(1)をバー状に分割し、スパ
ツタリング法あるいはEB蒸着法によつてAl2O3やSiO2
で被膜する方法が用いられるが、この被膜処理はバー状
の半導体レーザーウエハー(1)の光が出射する端面(1a)
にのみ行なわれ、これらに隣接する正電極面(1b)および
負電極面(1c)に被膜がかからないようにしなければなら
ない。このため従来は、第2図に示すようにバー状の半
導体レーザーウエハー(1)を両側の電極面が互いに重畳
するように束ねて、光が出射する一方の端面(1a)だけが
露出するように治具(13)に装着し、スパツタリング装置
やEB蒸着装置に収容し被膜処理を行なつていた。この場
合被膜する端面(1a)だけを露出させて、電極面(1b)(1c)
が露出しないようにするためには、電極面(1b)(1c)の巾
を揃えて完全に重なり合うようにする必要があるが、現
在の半導体レーザーウエハーの分割技術ではレーザーウ
エハー(1)のバーの横巾を一定にして電極面(1b)(1c)を
完全に重なり合うようにすることができないため、被膜
が電極面(1b)(1c)にまで付着し、被膜面が不均一となつ
て半導体レーザーウエハー(1)の特性を劣化していた。
Configuration of Conventional Example and Problems Thereof In a manufacturing process of a semiconductor element, a surface of a semiconductor may have to be selectively treated. For example (GaA
l) In an As-based semiconductor laser, in order to prevent deterioration of the end face from which light is emitted, the end face is covered with a dielectric film. In this coating treatment, the semiconductor laser wafer (1) is divided into bars as shown in FIG. 1, and Al 2 O 3 and SiO 2 are formed by a sputtering method or an EB vapor deposition method.
The coating method is used, but this coating process is the end face (1a) from which the light of the bar-shaped semiconductor laser wafer (1) is emitted.
Must be applied only to the positive electrode surface (1b) and the negative electrode surface (1c) adjacent to them. Therefore, conventionally, as shown in FIG. 2, the bar-shaped semiconductor laser wafers (1) are bundled so that the electrode surfaces on both sides overlap each other so that only one end surface (1a) from which light is emitted is exposed. It was mounted on a jig (13) and housed in a spattering device or an EB vapor deposition device for film treatment. In this case, only the end surface (1a) to be coated is exposed, and the electrode surface (1b) (1c)
It is necessary to make the widths of the electrode surfaces (1b) and (1c) uniform so that they will not be exposed, but the current semiconductor laser wafer division technology uses the laser wafer (1) bar. Since it is not possible to make the electrode surfaces (1b) (1c) completely overlap by making the width of the electrodes uniform, the film adheres to the electrode surfaces (1b) (1c) and the film surface becomes uneven. The characteristics of the semiconductor laser wafer (1) were deteriorated.

発明の目的 本発明は、前記した欠点を解消し、バー状の半導体レー
ザーウエハーの光を出射する端面だけを露出し、電極面
を全く露出しないように保持する半導体表面処理用治具
を提供しようとするものである。
An object of the present invention is to solve the above-mentioned drawbacks and to provide a semiconductor surface treatment jig for exposing only the light emitting end surface of a bar-shaped semiconductor laser wafer and holding the electrode surface so as not to expose it at all. It is what

発明の構成 本発明の半導体表面処理用治具は、平板と、この平板上
で半導体の側面に接し半導体と交互に並置する複数の直
方体固体部材と、交互に並置した半導体と直方体固体部
材とを挾持する固定治具とで構成したものであつて、平
板上に光を射出する一方の端面を下向きにした半導体と
直方体固体部材とを交互に並置して固定治具で挾持し、
固定治具を平板から離して上下反転したときに半導体の
前記一方の端面だけが上側に露出するようにして前記目
的を達成できるようにしたものである。
Structure of the invention The semiconductor surface treatment jig of the present invention comprises a flat plate, a plurality of rectangular parallelepiped solid members which are in contact with the side surface of the semiconductor on the flat plate and are juxtaposed alternately with the semiconductor, and the juxtaposed semiconductors and the rectangular parallelepiped solid members. It is composed of a fixing jig that is held, and a semiconductor and a rectangular solid member whose one end face that emits light on the flat plate faces downward are alternately juxtaposed and held by the holding jig.
When the fixing jig is separated from the flat plate and turned upside down, only the one end face of the semiconductor is exposed to the upper side, so that the above object can be achieved.

実施例の説明 以下本発明の実施例を図面に基いて説明する。第3図に
おいて(1)はバー状の半導体レーザーウエハー、(2)は単
結晶GaAsウエハーをへき開加工した直方体固体部材であ
つて、固定治具(3)の基板(4)上に交互に隣接並置されて
いる。(5)は基板(4)上の一端に固着した固定部、(6)は
基板(4)上を摺動して固定部(5)側に接近離間し基板(4)
上に並置された半導体レーザーウエハー(1)と直方体部
材(2)とを固定部(5)との間に押圧固定する可動部、(7)
は基板(4)上の他端に固着したねじ取付部(7)′に貫通螺
合し、板ばね(8)を介して可動部(6)に連結され、可動部
(6)を移動せしめるねじである。前記半導体レーザーウ
エハー(1)は、電極を構成する両側面がそれぞれ隣接の
直方体固定部材(2)の側面に接して露出せず、光を射出
する一方の端面(1a)だけが直方体固体部材(2)および固
定部(5)、可動部(6)の表面と面一に上側に露出してい
る。半導体レーザーウエハー(1)を光を射出する一方の
端面(1a)だけが露出するようにするには、第4図に示す
ように平板(9)上に被膜を施す端面(1a)を下側にした半
導体レーザーウエハー(1)と直方体固定部材(2)とを並置
し、第5図に示すように上側から固体治具(3)を装着し
平板(9)から離して上下反転するか、あるいは固定部(5)
と可動部(6)とを上側にしてその間に半導体レーザーウ
エハー(1)と直方体固定部材(2)とを配置し、平板(9)を
重ねて上下反転し、挾持操作を行なつた上で平板(9)か
らはずしもう一度固定治具(3)を反転すればよい。なお
前記実施例では直方体固体部材(2)をへき開した単結晶G
aAsウエハーとしたが、精密加工したセラミツクウエハ
ーを用いてもよい。
Description of Embodiments Embodiments of the present invention will be described below with reference to the drawings. In FIG. 3, (1) is a bar-shaped semiconductor laser wafer, and (2) is a rectangular solid member obtained by cleaving a single crystal GaAs wafer, which are alternately adjacent to each other on the substrate (4) of the fixing jig (3). They are juxtaposed. (5) is a fixed part fixed to one end on the substrate (4), and (6) is slid on the substrate (4) to approach and separate to the fixed part (5) side.
A movable part for pressing and fixing the semiconductor laser wafers (1) and the rectangular parallelepiped members (2) juxtaposed on each other between the fixed part (5), (7)
Is threadedly engaged with a screw mounting portion (7) 'fixed to the other end of the board (4), and is connected to the movable portion (6) through a leaf spring (8).
It is a screw that moves (6). In the semiconductor laser wafer (1), both side surfaces constituting the electrodes are not exposed by contacting the side surfaces of the adjacent rectangular parallelepiped fixing members (2), and only one end surface (1a) that emits light is a rectangular solid solid member ( 2), the fixed part (5) and the movable part (6) are flush with the surface and exposed to the upper side. In order to expose only one end face (1a) of the semiconductor laser wafer (1) which emits light, the end face (1a) to be coated on the flat plate (9) is placed on the lower side as shown in FIG. The semiconductor laser wafer (1) and the rectangular parallelepiped fixing member (2) are placed side by side, and the solid jig (3) is attached from the upper side as shown in FIG. Or fixed part (5)
And the movable part (6) and the semiconductor laser wafer (1) and the rectangular parallelepiped fixing member (2) are arranged between them, and the flat plates (9) are piled up and turned upside down, and then the holding operation is performed. Remove from the flat plate (9) and invert the fixing jig (3) again. In the above example, a single crystal G obtained by cleaving the rectangular solid member (2) was used.
Although an aAs wafer is used, a precision-processed ceramic wafer may be used.

以上の構成において、半導体レーザーウエハー(1)は、
形状寸法が揃つていなくても、光を出射する端面だけを
露出せしめて保持されるので、この露出端面だけに保護
膜を均一正確に形成することができる。
In the above configuration, the semiconductor laser wafer (1),
Even if the shapes and sizes are not uniform, only the end face that emits light is exposed and held, so that the protective film can be uniformly and accurately formed only on this exposed end face.

発明の効果 本発明の半導体処理用治具によれば、半導体を被膜の施
される端面が下側になるようにして複数の直方体固体部
材と交互に平板上に並置し、固定治具により挾持するの
で、固定治具を平板から離して上下反転することによ
り、半導体は被膜を施す端面だけが、直方体固体部材間
で上側に露出しこの露出する端面だけを正確均一に被膜
することができ、被膜が両側の電極面に及ぶおそれがな
く、半導体の特性を向上させることができる。また直方
体固体部材も、半導体の被膜される端面と面一に露出す
る表面だけが、半導体の端面と共に被膜されることにな
るが、半導体と接する側面は被膜を免れるので、反覆使
用が可能である。
Advantageous Effects of Invention According to the semiconductor processing jig of the present invention, a semiconductor is placed side by side with a plurality of rectangular parallelepiped solid members alternately on a flat plate so that the end surface on which the coating is applied is on the lower side, and held by a fixing jig. Since the fixing jig is separated from the flat plate and turned upside down, only the end surface of the semiconductor to be coated is exposed to the upper side between the rectangular solid members and only the exposed end surface can be accurately and uniformly coated. There is no possibility that the coating film will reach the electrode surfaces on both sides, and the characteristics of the semiconductor can be improved. Also, in the case of a rectangular parallelepiped solid member, only the surface exposed flush with the end surface of the semiconductor to be coated is coated with the end surface of the semiconductor, but the side surface in contact with the semiconductor is free from the coating, so that it can be used again. .

【図面の簡単な説明】[Brief description of drawings]

第1図はバー状半導体レーザーウエハーの斜視図、第2
図は従来例の斜視図、第3図は本発明の実施例を示す要
部斜視図、第4図および第5図は動作状態を示す側面図
である。 (1)…半導体、(2)…直方体固体部材、(3)…固定治具、
(7)…ねじ、(9)…平板
FIG. 1 is a perspective view of a bar-shaped semiconductor laser wafer, and FIG.
FIG. 3 is a perspective view of a conventional example, FIG. 3 is a perspective view of essential parts showing an embodiment of the present invention, and FIGS. 4 and 5 are side views showing an operating state. (1) ... semiconductor, (2) ... rectangular solid member, (3) ... fixing jig,
(7) ... screw, (9) ... flat plate

───────────────────────────────────────────────────── フロントページの続き (72)発明者 田尻 文子 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 粂 雅博 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 浜田 健 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Fumiko Tajiri 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. 72) Inventor Ken Hamada 1006 Kadoma, Kadoma-shi, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】平板と、バー状にへき開した1個以上の半
導体ウエハのへき開面に垂直な側面に接するように前記
バー状半導体ウエハと交互に前記平板上に並置された2
個以上の直方体固体部材と、前記バー状半導体ウエハと
前記直方体固体部材を挾持する固定治具からなる半導体
表面処理用治具。
1. A flat plate and two or more semiconductor wafers cleaved in a bar shape are arranged side by side on the flat plate alternately so as to be in contact with the side surface of the semiconductor wafer which is perpendicular to the cleavage plane.
A semiconductor surface treatment jig comprising at least one rectangular solid member, a fixing jig for holding the bar-shaped semiconductor wafer, and the rectangular solid member.
JP58251611A 1983-12-27 1983-12-27 Jig for semiconductor surface treatment Expired - Lifetime JPH067619B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58251611A JPH067619B2 (en) 1983-12-27 1983-12-27 Jig for semiconductor surface treatment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58251611A JPH067619B2 (en) 1983-12-27 1983-12-27 Jig for semiconductor surface treatment

Publications (2)

Publication Number Publication Date
JPS60140779A JPS60140779A (en) 1985-07-25
JPH067619B2 true JPH067619B2 (en) 1994-01-26

Family

ID=17225387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58251611A Expired - Lifetime JPH067619B2 (en) 1983-12-27 1983-12-27 Jig for semiconductor surface treatment

Country Status (1)

Country Link
JP (1) JPH067619B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63308992A (en) * 1987-06-11 1988-12-16 Nec Corp Manufacture of optical semiconductor element
JP2736173B2 (en) * 1990-12-18 1998-04-02 シャープ株式会社 Method for manufacturing semiconductor laser device
JP2009164499A (en) 2008-01-10 2009-07-23 Mitsubishi Electric Corp End face processing jig and method of manufacturing semiconductor laser device using the same
CN112045605A (en) * 2020-10-03 2020-12-08 海南师范大学 A clamping fixture for semiconductor laser bar coating with the same length and different cavity lengths

Also Published As

Publication number Publication date
JPS60140779A (en) 1985-07-25

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