JPH0676657B2 - Sputtering device - Google Patents
Sputtering deviceInfo
- Publication number
- JPH0676657B2 JPH0676657B2 JP61267252A JP26725286A JPH0676657B2 JP H0676657 B2 JPH0676657 B2 JP H0676657B2 JP 61267252 A JP61267252 A JP 61267252A JP 26725286 A JP26725286 A JP 26725286A JP H0676657 B2 JPH0676657 B2 JP H0676657B2
- Authority
- JP
- Japan
- Prior art keywords
- sputtering
- thin film
- substrate
- target
- adhesion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004544 sputter deposition Methods 0.000 title claims description 39
- 239000010409 thin film Substances 0.000 claims description 30
- 239000000758 substrate Substances 0.000 claims description 24
- 238000010438 heat treatment Methods 0.000 claims description 18
- 230000003068 static effect Effects 0.000 claims 1
- 239000010408 film Substances 0.000 description 21
- 238000000151 deposition Methods 0.000 description 9
- 230000008021 deposition Effects 0.000 description 9
- 230000002159 abnormal effect Effects 0.000 description 6
- 230000003449 preventive effect Effects 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000012634 fragment Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000002401 inhibitory effect Effects 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 238000005488 sandblasting Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000009751 slip forming Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- MAKDTFFYCIMFQP-UHFFFAOYSA-N titanium tungsten Chemical compound [Ti].[W] MAKDTFFYCIMFQP-UHFFFAOYSA-N 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、真空中で薄膜を形成するスパッタリング装置
に関し、特に薄膜形成室が常に真空保持されるロードロ
ックタイプの連続型スパッタリング装置に使用して効果
の著しいものである。Description: TECHNICAL FIELD The present invention relates to a sputtering apparatus for forming a thin film in a vacuum, and particularly for use in a load lock type continuous sputtering apparatus in which a thin film forming chamber is always kept in vacuum. The effect is remarkable.
(従来の技術) スパッタリング装置では、ターゲットから飛来するスパ
ッタ原子が薄膜形成室内部の壁や治具に付着し、それが
剥がれ落ちて、ターゲット上で異常放電を生じ、あるい
は基板上に異物を付着するという不具合を発生する。(Prior art) In a sputtering device, sputtered atoms flying from the target adhere to the walls and jigs inside the thin film formation chamber and peel off to cause abnormal discharge on the target or foreign matter on the substrate. It causes the problem of doing.
基板の交換の都度、薄膜形成室を大気に開放するバッチ
型のスパッタ装置であれば、開放の都度、内部の壁面や
治具への膜の付着状況や膜の剥がれ具合いを点検し、膜
片の除去等の必要な措置をとることが出来るため、ター
ゲット上の異常放電あるいは基板への異物の付着を未然
に防止することが出来る。If the batch type sputtering device opens the thin film forming chamber to the atmosphere every time the substrate is replaced, the state of film adhesion to the inner wall surface and jigs and the degree of film peeling are checked every time the substrate is opened, and the film strip is removed. It is possible to prevent abnormal discharge on the target or foreign matter from adhering to the substrate in advance because necessary measures such as removal of impurities can be taken.
しかしロードロックタイプの連続型装置では、薄膜形成
室が常に真空保持されているため、内部の点検や付着物
の除去といった作業が出来ない。この為、長期間装置を
稼働した場合には、薄膜形成室の内部で膜が付着し続
け、やがて剥がれを生じ、ターゲット上の異常放電、基
板上への異物の付着を起こし、やがてそれはターゲット
とアース間のショート、放電停止といった事態にも発展
する。However, in the load lock type continuous apparatus, since the thin film forming chamber is always kept in vacuum, it is not possible to inspect the inside or remove deposits. Therefore, when the device is operated for a long period of time, the film continues to adhere inside the thin film forming chamber and eventually peels off, causing abnormal discharge on the target and foreign matter on the substrate, which eventually becomes It also develops into situations such as short-circuiting between grounds and stop of discharge.
連続装置における上記の事故を防止するために、サイド
スパッタリングという手法が用いられている。これはタ
ーゲットと基板を垂直に保持し、薄膜形成室内の壁面や
治具から膜が剥がれ落ちても、ターゲットや基板の表面
に接触せずに落下するようにし、不具合の発生を防止す
るものである。In order to prevent the above-mentioned accidents in continuous equipment, a method called side sputtering is used. This is to prevent the occurrence of defects by holding the target and the substrate vertically so that even if the film peels off from the wall surface or jig in the thin film formation chamber, it will fall without contacting the surface of the target and the substrate. is there.
この手法によれば上述の事故は相当防ぐことが出来る
が、これだけでは壁面や治具から膜片が剥がれるのを防
止することは出来ない。アルミニウムのように、付着力
が強く比較的剥がれ難い材料のスパッタリングを行なう
場合にはこの手法は有効であるが、モリブデンやタング
ステンなどの膜のように、膜内内部応力が大きくて反り
易く、壁面や治具に付着したときに非常に剥がれを起こ
し易い材料では、この手法だけでは対応は不十分であっ
て、異常放電,放電停止の事故を起こし易い。According to this method, the above-mentioned accident can be prevented considerably, but this alone cannot prevent the film piece from peeling off from the wall surface or the jig. This method is effective when sputtering a material that has strong adhesion and is relatively hard to peel off, such as aluminum, but like a film of molybdenum, tungsten, etc., the internal stress in the film is large and it tends to warp With materials that are extremely susceptible to peeling when attached to a jig or jig, this method alone is not sufficient, and accidents such as abnormal discharge and discharge stop are likely to occur.
これらの膜片が剥がれ落ちて真空室内に散乱した際の破
片,塵埃を除去する手間はかなり大きく、それらがOリ
ング等のシール面に付着してリークを発生するなど、さ
まざまな問題を生じている。It takes a lot of time and effort to remove debris and dust when these film pieces are peeled off and scattered in the vacuum chamber, and they cause various problems such as sticking to the sealing surface such as the O-ring and causing a leak. There is.
第2図は、この問題を解決しようとして工夫された、従
来(例えば、特開昭60-26659号「スパッタリング装
置」)の薄膜形成室の概略の構成図である。FIG. 2 is a schematic configuration diagram of a conventional thin film forming chamber (for example, Japanese Patent Laid-Open No. 60-26659 “Sputtering Device”) devised to solve this problem.
ヒーター巻線18を巻回した防着板5は、ターゲット4及
びカソード3を取り囲むように設けられていて、薄膜
は、防着板5の内面と、窓9の開口を通して基板7とそ
の周辺の比較的狭い領域だけに形成されるようになって
いる。スパッタリング中はヒーター18に通電して防着板
5を加熱し、防着板に薄膜が強力に付着して剥がれが生
じ難くなるよう配慮されている。スパッタリング終了時
は加熱しない。The deposition preventive plate 5 around which the heater winding 18 is wound is provided so as to surround the target 4 and the cathode 3, and the thin film passes through the inner surface of the deposition preventive plate 5 and the opening of the window 9 to cover the substrate 7 and its periphery. It is designed to be formed only in a relatively narrow area. During the sputtering, the heater 18 is energized to heat the deposition-inhibiting plate 5, and the thin film is strongly adhered to the deposition-inhibiting plate to prevent peeling. Do not heat at the end of sputtering.
さらにターゲット4の極く近傍には、仕切り板10を取り
付けてあり、この仕切り板で仕切られた溜め用のふとこ
ろ部分11を防着板内に設けて、防着板5の内面から剥が
れた破片を、ここに溜めるようにしている。Further, a partition plate 10 is attached in the immediate vicinity of the target 4, and a pocket portion 11 for storage, which is partitioned by this partition plate, is provided inside the deposition-inhibitory plate, so that the fragments separated from the inner surface of the deposition-inhibitory plate 5 are provided. Are stored here.
上記の対策の結果、膜片の剥がれは少なくなり、破片が
ターゲットに触れて異常放電を起こし放電停止に至ると
いった事態が減少し、また真空室内の破片の散乱も少な
くなっている。As a result of the above measures, the peeling of the film pieces is reduced, the situation in which the fragments touch the target and cause an abnormal discharge to stop the discharge, and the scattering of the fragments in the vacuum chamber is also reduced.
この従来の防着板5は、ターゲットと同じ材質の金属も
しくはステンレス鋼で作られている。The conventional deposition preventive plate 5 is made of the same metal as the target or stainless steel.
しかしこの従来の構成でも、スパッタ中と非スパッタ中
とでは防着板の温度変化が大きく且つその繰り返しが多
いために、付着膜中に潜む内部応力の上に温度変化に基
ずく応力が加わって、膜片の剥がれを生じ易くなるとい
う欠点が残されている。そして防着板5の溜め用のふと
ころ部分11に破片が大量に溜ると、ターゲットとショー
トを生じやすくなり、そのための異常放電や放電停止と
いう事故の発生がある。However, even with this conventional structure, the temperature of the deposition-inhibition plate changes greatly during spattering and non-sputtering, and the repetitions are frequent, so that stress due to temperature change is added to the internal stress hidden in the adhered film. However, there is still a drawback that the film pieces are easily peeled off. If a large amount of debris accumulates in the retaining portion 11 of the deposition preventive plate 5, short-circuiting with the target is likely to occur, which may cause an accident such as abnormal discharge or discharge stoppage.
(発明の目的) 本発明は、上記問題を解決し、付着した膜の剥がれ落ち
が殆どないようにしたスパッタリング装置の提供を目的
とする。(Object of the Invention) It is an object of the present invention to solve the above problems and provide a sputtering apparatus in which an adhered film hardly peels off.
(問題点を解決するための手段) 本発明では上記の目的を達成するために、ターゲットの
基板と対向しない側面に沿って防着板を設け、防着板は
ターゲットの側端から出て基板に向かって開くテーパー
部を有し、薄膜形成室の下壁部に向かうテーパー部を有
する防着板と基板との間には空間部を有し、空間部の下
方にスパッタリングにより各面から剥がれた薄膜を収納
する溜めを設け、スパッタリングによって薄膜の付着す
る各面にこの各面を加熱する加熱装置を取り付け、加熱
装置には該加熱装置に電力を印加する加熱電源と該加熱
装置に印加する電力を切り換えるスイッチとを接続し、
スイッチをスパッタリング中はオフにし非スパッタリン
グ中はオンにするようにしたものである。(Means for Solving Problems) In the present invention, in order to achieve the above-mentioned object, an adhesion-preventing plate is provided along a side surface of the target which does not face the substrate, and the adhesion-preventing plate is projected from a side edge of the target. Has a taper portion that opens toward the bottom and a taper portion that faces the lower wall of the thin film forming chamber.There is a space between the substrate and the space below the space, and the space is separated from each surface by sputtering. A reservoir for accommodating the thin film is provided, and a heating device for heating each surface is attached to each surface on which the thin film is attached by sputtering. The heating device applies a power to the heating device and a heating power source for applying the electric power to the heating device. Connect with a switch that switches power,
The switch is turned off during sputtering and turned on during non-sputtering.
(作用) スパッタリング中は薄膜の付着する各面は自ずから高温
になるが、非スパッタリング中は温度が低下する。非ス
パッタリング中は温度が低下するが、スイッチがオンに
なり、加熱電源から電力が加熱装置に印加される。その
ため、加熱装置により、薄膜の付着する各面が加熱さ
れ、付着面の温度低下が防止され、付着面の温度を高温
のまゝ一定に保つ。スパッタリング中はオフになり非ス
パッタリング中はオンになるスイッチと加熱電源を加熱
装置に接続することにより、スパッタ中と非スパッタ中
の面の温度変化を無くすることできるので、付着膜中の
温度変化による応力が発生するのを防ぎ、薄膜の反りに
よる剥がれを防止するのである。(Function) Each surface to which the thin film is attached naturally has a high temperature during the sputtering, but the temperature decreases during the non-sputtering. Although the temperature drops during non-sputtering, the switch turns on and power is applied to the heating device from the heating power supply. Therefore, the heating device heats each surface on which the thin film adheres, the temperature of the adhesion surface is prevented from lowering, and the temperature of the adhesion surface is kept at a high temperature. By connecting a switch that turns off during sputtering and turns on during non-sputtering and a heating power supply to the heating device, it is possible to eliminate temperature changes on the surface during sputtering and during non-sputtering. This prevents the stress from being generated and prevents the thin film from peeling due to warpage.
(実施例) 次にこの発明の実施例を図を用いて詳細に説明する。(Example) Next, the Example of this invention is described in detail using drawing.
第1図は本発明の実施例の薄膜形成室の概要構成図であ
る。排気系、ガス導入系、ロードロック室、搬送系の図
は省略してある。FIG. 1 is a schematic configuration diagram of a thin film forming chamber according to an embodiment of the present invention. Illustrations of the exhaust system, the gas introduction system, the load lock chamber, and the transfer system are omitted.
図にて、1は薄膜形成室で、室内を真空に排気し、電源
2を用いてカソード3とアースの間に電圧を印加する
と、カソード上に取り付けられたターゲット4と、アー
ス電位の防着板5及び基板保持具6の囲む空間にプラズ
マが発生し、ターゲットが陽イオンで衝撃されてスパッ
タリングが行なわれ、対向配置された基板7上に薄膜が
形成される。この実施例では成膜中基板は静止してい
る。In the figure, reference numeral 1 is a thin film forming chamber, and when the chamber is evacuated to a vacuum and a voltage is applied between the cathode 3 and the ground by using a power source 2, the target 4 mounted on the cathode and the ground potential are protected. Plasma is generated in the space surrounded by the plate 5 and the substrate holder 6, and the target is bombarded with cations to perform sputtering, so that a thin film is formed on the substrate 7 facing the target. In this example, the substrate is stationary during deposition.
特徴は、スパッタリング中に薄膜が付着する各面、例え
ば障壁面13,防着板5の内面等を加熱すべく設けられた
ヒーター14,8にある。The feature is the heaters 14 and 8 provided to heat the surfaces to which the thin film is attached during sputtering, such as the barrier surface 13 and the inner surface of the deposition-inhibitory plate 5.
この防着板5はターゲット4の基板7に対向しない側面
に沿って設けられており、ターゲット4の側端から出て
基板4に向かって開くテーパー部5Aを有しており、アル
ミニウムで作られていて、膜の付着する表面はアルミナ
の細粒でサンドブラストされている。その面のすぐ内面
にヒーター8が内蔵されている。The deposition preventive plate 5 is provided along the side surface of the target 4 that does not face the substrate 7, has a taper portion 5A that extends from the side edge of the target 4 and opens toward the substrate 4, and is made of aluminum. The surface to which the film is attached is sandblasted with fine particles of alumina. The heater 8 is built in just inside the surface.
障壁面13の表面もこれと同材質、同加工のものであり、
裏面にヒーター14が密着している。The surface of the barrier surface 13 is also made of the same material and processed as above,
The heater 14 is in close contact with the back surface.
スパッタリング中はこれら障壁面13や防着板5の表面に
膜が付着して高温になる。スパッタリングが終ると同時
に温度低下が始まるが、このときヒーター13,8をONにし
て、もしくはスパッタリング中以上の高電力を印加し
て、温度低下を防止するのである(ヒーター電源とスイ
ッチは図示を略している)。即ち前述のように、温度変
化を抑えて付着膜内に応力が発生するのを防止剥離を防
ぐのである。During the sputtering, a film adheres to the barrier surface 13 and the surface of the deposition preventive plate 5, and the temperature becomes high. The temperature starts to drop at the same time as the sputtering ends.At this time, the heaters 13 and 8 are turned on, or high power more than during the sputtering is applied to prevent the temperature drop (heater power supply and switch are not shown). ing). That is, as described above, the temperature change is suppressed to prevent the stress from being generated in the attached film, and the peeling is prevented.
各面がアルミニウム製であるため薄膜の付着力は強力
で、剥がれを生じ難い。またアルミナブラストされた表
面の鋭い凹凸によって薄膜の付着力が高められているの
で、剥がれは格段に減少する。Since each surface is made of aluminum, the adhesion of the thin film is strong and peeling is less likely to occur. Further, since the adhesive force of the thin film is enhanced by the sharp unevenness of the alumina-blasted surface, the peeling is remarkably reduced.
万一付着膜が剥がれた場合のために、防着板5にはター
ゲットの側端から出て基板に向かって開くテーパー部5A
が形成されているため、このテーパー部5Aの表面から滑
り落ちた膜片が、従来のようにターゲット4近傍の防着
板5内ではなく、この防着板5と基板7との間の空間部
20の下方に設けられた溜め12に堆積する。これで膜片が
ターゲットに触れて不都合を起こすようなことはなくな
る。In the unlikely event that the adhered film is peeled off, the adhesion prevention plate 5 has a taper portion 5A that extends from the side edge of the target and opens toward the substrate.
Since the film is formed, the film piece slipped off from the surface of the taper portion 5A is not in the adhesion-preventing plate 5 near the target 4 as in the conventional case, but in the space between the adhesion-preventing plate 5 and the substrate 7. Department
It accumulates in a reservoir 12 provided below 20. This will prevent the film piece from touching the target and causing inconvenience.
以上によって、モリブデン、タングステン、チタンタン
グステン等の剥がれ易い金属をスパッタする場合も、連
続スパッタリング装置は長時間連続して薄膜形成を行な
うことが可能となることが実験によって確認されてい
る。From the above, it has been confirmed by experiments that the continuous sputtering apparatus can continuously form a thin film for a long time even when sputtering a metal such as molybdenum, tungsten, or titanium-tungsten which is easily peeled off.
なお、本発明は勿論第2図のそのままの構成でも実施で
きる。ただしこの場合ヒーター18は、従来とは反対に、
非スパッタリング中にONされ、もしくはスパッタリング
中以上の高電力が印加されて加熱が行なわれるものであ
る。It should be noted that the present invention can of course be implemented with the same configuration as shown in FIG. However, in this case, the heater 18 is contrary to the conventional one,
Heating is performed by turning on during non-sputtering, or by applying high power more than during sputtering.
なおまた、各表面の材質は、アルミニウムのほか、アル
ミニウム合金が好成績を示した。そしてサンドブラスト
に用いる砂粒は鋭い角を持つアルミナの細粒が好結果を
もたらした。In addition, as the material of each surface, aluminum and aluminum alloys showed good results. And the sand grains used for sandblasting were fine particles of alumina with sharp corners, which gave good results.
(発明の効果) 本発明は以上説明したような構成と作用を有しているの
で、剥がれを起こし易い金属のスパッタリングの場合
も、周囲の付着面から付着膜が剥がれることが殆どな
く、連続型スパッタリング装置に組み込んで長時間連続
して薄膜形成を行なうことが出来る。(Advantages of the Invention) Since the present invention has the configuration and the operation as described above, even in the case of sputtering of a metal that easily peels off, the adhesion film hardly peels off from the surrounding adhesion surface, and the continuous type A thin film can be continuously formed by incorporating it in a sputtering device for a long time.
第1図は、本発明の薄膜形成室の概略の構成図。 第2図は、従来の同様の図。 1……薄膜形成室、2……電源、 3……カソード、4……ターゲット、 5……防着板、6……基板保持具、 7……基板、8,14,18……ヒーター、 9……窓、10……仕切り板、 11……溜め用のふところ部分、 12……溜め、13……障壁面。 FIG. 1 is a schematic configuration diagram of a thin film forming chamber of the present invention. FIG. 2 is a similar view to the conventional one. 1 ... Thin film forming chamber, 2 ... Power supply, 3 ... Cathode, 4 ... Target, 5 ... Bonding plate, 6 ... Substrate holder, 7 ... Substrate, 8, 14, 18 ... Heater, 9 ... Window, 10 ... Partition plate, 11 ... Reservoir side, 12 ... Reservoir, 13 ... Barrier surface.
Claims (1)
る基板及びターゲットの平面が、鉛直に保持され、かつ
該基板及びターゲットが1対1で互いに静止対向した状
態で薄膜形成を行うスパッタリング装置において、前記
ターゲットの基板と対向しない側面に沿って防着板を設
け、前記防着板は前記ターゲットの側端から出て前記基
板に向かって開くテーパー部を有し、前記薄膜形成室の
下壁部に向かうテーパー部を有する防着板と基板との間
には空間部を有し、該空間部の下方にスパッタリングに
より各面から剥がれた薄膜を収納する溜めを設け、スパ
ッタリングによって薄膜の付着する各面に該各面を加熱
する加熱装置を取り付け、前記加熱装置には該加熱装置
に電力を印加する加熱電源と該加熱装置に印加する電力
を切り換えるスイッチとを接続し、前記スイッチをスパ
ッタリング中はオフにし非スパッタリング中はオンにす
ることを特徴とするスパッタリング装置。1. A sputtering method in which the flat surfaces of a substrate and a target placed in a thin film forming chamber evacuated to a vacuum are held vertically, and the thin film is formed in a state where the substrate and the target are in a static one-to-one relationship with each other. In the apparatus, an adhesion-preventing plate is provided along a side surface of the target that does not face the substrate, the adhesion-preventing plate has a taper portion that extends from a side end of the target and opens toward the substrate, and There is a space between the substrate and the adhesion-preventing plate having a taper portion toward the lower wall, and a reservoir for accommodating the thin film peeled from each surface by sputtering is provided below the space, and the thin film A heating device for heating each surface is attached to each surface to be attached, and a heating power source for applying electric power to the heating device and a switch for switching electric power applied to the heating device are attached to the heating device. Connecting the switch, a sputtering apparatus, characterized in that during sputtering the switch is in a non-sputtering during the on and off.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61267252A JPH0676657B2 (en) | 1986-11-10 | 1986-11-10 | Sputtering device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61267252A JPH0676657B2 (en) | 1986-11-10 | 1986-11-10 | Sputtering device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63121659A JPS63121659A (en) | 1988-05-25 |
| JPH0676657B2 true JPH0676657B2 (en) | 1994-09-28 |
Family
ID=17442248
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61267252A Expired - Lifetime JPH0676657B2 (en) | 1986-11-10 | 1986-11-10 | Sputtering device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0676657B2 (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01152271A (en) * | 1987-12-09 | 1989-06-14 | Toshiba Corp | Sputtering device |
| JPH083145B2 (en) * | 1989-06-08 | 1996-01-17 | 富士通株式会社 | Semiconductor manufacturing equipment |
| US5200232A (en) † | 1990-12-11 | 1993-04-06 | Lam Research Corporation | Reaction chamber design and method to minimize particle generation in chemical vapor deposition reactors |
| US5518593A (en) * | 1994-04-29 | 1996-05-21 | Applied Komatsu Technology, Inc. | Shield configuration for vacuum chamber |
| JP4717186B2 (en) * | 2000-07-25 | 2011-07-06 | 株式会社アルバック | Sputtering equipment |
| JP4720625B2 (en) * | 2006-06-05 | 2011-07-13 | パナソニック株式会社 | Sputtering equipment |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS605896A (en) * | 1983-06-24 | 1985-01-12 | Hosono Metarikon Kogyosho:Kk | Treatment of aluminum and its alloy as substrate |
| JPS6026659A (en) * | 1983-07-25 | 1985-02-09 | Anelva Corp | Sputtering device |
-
1986
- 1986-11-10 JP JP61267252A patent/JPH0676657B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63121659A (en) | 1988-05-25 |
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