JPH07105595B2 - Method of forming insulating layer - Google Patents
Method of forming insulating layerInfo
- Publication number
- JPH07105595B2 JPH07105595B2 JP16202090A JP16202090A JPH07105595B2 JP H07105595 B2 JPH07105595 B2 JP H07105595B2 JP 16202090 A JP16202090 A JP 16202090A JP 16202090 A JP16202090 A JP 16202090A JP H07105595 B2 JPH07105595 B2 JP H07105595B2
- Authority
- JP
- Japan
- Prior art keywords
- exposure
- insulating layer
- heating
- coating
- drying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Production Of Multi-Layered Print Wiring Board (AREA)
- Manufacturing Of Printed Wiring (AREA)
Description
【発明の詳細な説明】 〔概要〕 感光性ポリイミドを塗布,乾燥および露光,現像を繰り
返すことで所定の膜厚の絶縁層を形成する絶縁層の形成
方法に関し、 多層基板の製造に際して、熱によるダメージを極力軽減
させることを目的とし、 基板の積層面に感光性ポリイミドを塗布する塗布工程
と、塗布された塗布面を乾燥する乾燥工程と、該乾燥工
程によって乾燥された該塗布面に露光マスクを重ねるこ
とで露光し,露光後現像行う露光,現像工程と、該露
光,現像後、該感光性ポリイミドを硬化させるベーク工
程より低い温度によって該塗布面を加熱する中間加熱工
程とを複数回繰り返すことで複数の膜を積層し、積層さ
れた該膜を該ベーク工程によって加熱することで該積層
面に所定厚の絶縁層を形成するようにしたものである。DETAILED DESCRIPTION OF THE INVENTION [Outline] An insulating layer forming method of forming an insulating layer having a predetermined film thickness by repeatedly applying, drying, exposing and developing a photosensitive polyimide. For the purpose of reducing the damage as much as possible, a coating step of coating a photosensitive polyimide on the laminated surface of the substrate, a drying step of drying the coated surface, and an exposure mask on the coated surface dried by the drying step. The exposure and development steps of performing exposure by superimposing and then developing after exposure, and the intermediate heating step of heating the coated surface at a temperature lower than the baking step of curing the photosensitive polyimide after the exposure and development are repeated a plurality of times. Thus, a plurality of films are laminated, and the laminated films are heated in the baking step to form an insulating layer having a predetermined thickness on the laminated surface.
〔産業上の利用分野〕 本発明は感光性ポリイミドを塗布,乾燥および露光,現
像を繰り返すことで所定の膜厚の絶縁層を形成する絶縁
層の形成方法に関する。TECHNICAL FIELD The present invention relates to a method for forming an insulating layer in which a photosensitive polyimide is applied, dried, exposed, and developed repeatedly to form an insulating layer having a predetermined thickness.
最近、電子機器に用いられるプリント基板は多層化さ
れ、半導体素子などの電子部品の高密度実装化が図られ
るようになった。Recently, printed boards used in electronic devices have been multi-layered, and high-density mounting of electronic components such as semiconductor elements has been achieved.
このようなプリント基板の多層化では、基板の積層面に
導電層と、絶縁層とを交互に積層することで形成され
る。Such a multilayer printed circuit board is formed by alternately laminating a conductive layer and an insulating layer on the laminated surface of the substrate.
また、このような絶縁層は、導電層に於けるインピーダ
ンスなどの電気特性を所定の値に維持させるため、所定
の厚みに形成する必要が生じる。Further, such an insulating layer needs to be formed to have a predetermined thickness in order to maintain electrical characteristics such as impedance in the conductive layer at a predetermined value.
したがって、このような多層化に於いては、絶縁層の厚
みが所定の値になるように製造されることが要求され
る。Therefore, in such multi-layering, it is required to manufacture the insulating layer so that the thickness of the insulating layer has a predetermined value.
従来は、第4図の(a)〜(g)の従来の製造工程図に
示すように製造されていた。Conventionally, it was manufactured as shown in the conventional manufacturing process diagram of FIGS. 4 (a) to (g).
第4図の(a)に示すように、セラミック材などから成
る基板1の導電層3が形成された積層面1Aにエステル化
結合形またはイオン結合形の感光性ポリイミド4を滴下
し、例えば、スピンコートによって(b)に示すよう
に、積層面1Aに感光性ポリイミド4を所定の厚みになる
ように塗布する。As shown in FIG. 4A, a photosensitive polyimide 4 of an esterification bond type or an ionic bond type is dropped onto the laminated surface 1A of the substrate 1 made of a ceramic material or the like on which the conductive layer 3 is formed. As shown in (b), the photosensitive polyimide 4 is applied to the laminated surface 1A by spin coating so as to have a predetermined thickness.
このように塗布した基板1を約80℃の温度で、1.5H加熱
する(この場合の加熱時間は基板1の熱容量によって増
減される)乾燥後は、(c)に示すように、露光マスク
5を重ね、光Lを照射させることで露光を行い、この露
光により光Lの照射された個所は溶解し難くなる。The substrate 1 thus coated is heated at a temperature of about 80 ° C. for 1.5 hours (the heating time in this case is increased or decreased depending on the heat capacity of the substrate 1), and then, as shown in FIG. Are exposed to each other by irradiating with the light L, and the portion irradiated with the light L becomes difficult to be dissolved by this exposure.
従って、露光後、NMP溶媒によって現像することで光の
照射されなかった個所がNMP溶媒によって溶解され、
(d)に示すように、導電層3を覆う膜2Aに貫通穴2Cが
形成される。Therefore, after the exposure, by developing with an NMP solvent, the portions not irradiated with light are dissolved by the NMP solvent,
As shown in (d), a through hole 2C is formed in the film 2A covering the conductive layer 3.
次に、ベーク工程によって加熱することで、膜2Aを硬化
させる。Next, the film 2A is cured by heating in the baking process.
このようなベーク工程による加熱は、通常、第5図のベ
ーク工程の加熱温度グラフに示すように、始めに約200
℃の加熱を約1.5H行うの低温加熱と、最後に、約350
〜400℃を約1.5H行うの高温加熱とが行われ、膜2Aを
硬化させ、厚みt1に形成することが行われる。As shown in the heating temperature graph of the baking process of FIG.
Low temperature heating of about 1.5H, and finally about 350H
The film 2A is heated to a high temperature of about 400 ° C. for about 1.5 H to cure the film 2A and form the film with a thickness t1.
このように形成された膜2Aには、更に、(e)に示すよ
うに、感光性ポリイミド4を滴下し、(f)にし召すよ
うに膜2Aが形成された積層面1Aに、前述と同様に感光性
ポリイミド4を塗布し、乾燥後、露光,現像し、更に、
ベーク工程により、(g)に示すように、膜2Aの上層に
厚みt1の膜2Bを積層することで厚みtの絶縁層2の形成
を行う。On the film 2A thus formed, further, as shown in (e), the photosensitive polyimide 4 is dropped, and the laminated surface 1A on which the film 2A is formed is used as in (f). Photosensitive polyimide 4 is applied to, dried, exposed and developed.
By the baking step, as shown in (g), the insulating layer 2 having the thickness t is formed by laminating the film 2B having the thickness t1 on the upper layer of the film 2A.
このような塗布された感光性ポリイミド4を露光,現像
により所定個所を除去することは、塗膜が厚くなると露
光,現像による除去が困難となり、従って、露光,現像
による除去が可能な塗膜の厚みには限界がある。It is difficult to remove a predetermined portion of the coated photosensitive polyimide 4 by exposure and development, and it becomes difficult to remove it by exposure and development when the coating becomes thicker. There is a limit to the thickness.
そこで、通常では、露光,現像を確実に行うよう塗膜の
厚みとしては約20μmにすることが行われている。Therefore, the thickness of the coating film is usually set to about 20 μm so as to ensure the exposure and development.
しかし、実際には、ベーク工程による硬化によって、塗
膜の厚みが収縮され、膜2Aに形成された時の厚みt1は半
減することになる。However, in reality, the thickness of the coating film is contracted by the curing in the baking step, and the thickness t1 when formed on the film 2A is halved.
そこで、第6図の従来の製造フローチャート図に示すよ
うに、基板1の積層面1Aに感光性ポリイミド4を塗布す
る塗布工程A、塗布された感光性ポリイミド4を乾燥す
る乾燥工程B、乾燥した塗膜に露光マスク5を重ねるこ
とで露光し、NMP溶媒によって現像する露光,現像工程
Cおよび所定の温度によって加熱を行うベーク工程Eを
n回繰り返すことで、t1×nにより所定の厚みtとなる
絶縁層2を形成することが行われていた。Therefore, as shown in the conventional manufacturing flowchart of FIG. 6, a coating step A for coating the photosensitive polyimide 4 on the laminated surface 1A of the substrate 1, a drying step B for drying the coated photosensitive polyimide 4, and a drying step. By exposing the coating film by overlapping the exposure mask 5 and developing with an NMP solvent, the developing step C and the baking step E of heating at a predetermined temperature are repeated n times to obtain a predetermined thickness t by t1 × n. The insulating layer 2 is formed.
このような塗布工程A、乾燥工程B、露光,現像工程C
およびベーク工程Eを繰り返し行うことで所定の厚みt
となる絶縁層2を形成することでは、導電層3と絶縁層
2とを複数積層する多層基板の製造を行う場合は、基板
1および下層に対して、ベーク工程Eによる高温加熱が
繰り返し加えられることになる。Such coating process A, drying process B, exposure and development process C
By repeating the baking process E and the predetermined thickness t
By forming the insulating layer 2 as described above, in the case of manufacturing a multilayer substrate in which a plurality of conductive layers 3 and insulating layers 2 are laminated, high temperature heating by the baking step E is repeatedly applied to the substrate 1 and the lower layer. It will be.
したがって、基板1および下層の導電層3と絶縁層2と
が熱によるストレスを受けることになり、熱によるスト
レスにより剥離,断線,劣化などの障害が発生する問題
を有していた。Therefore, the substrate 1 and the lower conductive layer 3 and the insulating layer 2 are stressed by heat, which causes a problem such as peeling, disconnection, and deterioration due to heat stress.
そこで、本発明では、多層基板の製造に際して、熱によ
るダメージを極力軽減させることを目的とする。Therefore, an object of the present invention is to reduce heat damage as much as possible when manufacturing a multilayer substrate.
第1図は本発明の原理説明図である。 FIG. 1 is an explanatory view of the principle of the present invention.
第1図に示すように、基板1の積層面1Aに感光性ポリイ
ミド4を塗布する塗布工程Aと、塗布された塗布面を乾
燥する乾燥工程Bと、該乾燥工程Bによって乾燥された
該塗布面に露光マスク5を重ねることで露光し,露光後
現像行う露光,現像工程Cと、該露光,現像後、該感光
性ポリイミド4を硬化させるベーク工程Eより低い温度
によって該塗布面を加熱する中間加熱工程Dとを複数
(n)回繰り返すことで複数の膜を積層し、積層された
該膜を該ベーク工程Eによって加熱することで該積層面
1Aに所定厚tの絶縁層2を形成するようにしたものであ
る。As shown in FIG. 1, a coating step A for coating the photosensitive polyimide 4 on the laminated surface 1A of the substrate 1, a drying step B for drying the coated surface, and a coating step dried by the drying step B. The coating surface is heated at a lower temperature than the exposure and development step C in which the exposure mask 5 is overlapped on the surface and the post-exposure development is performed, and the baking step E in which the photosensitive polyimide 4 is cured after the exposure and development. By repeating the intermediate heating step D a plurality of times (n) times, a plurality of films are laminated, and the laminated films are heated in the baking step E to form a laminated surface.
The insulating layer 2 having a predetermined thickness t is formed on 1A.
このように形成することによって前述の課題は解決され
る。By forming in this way, the above-mentioned subject is solved.
即ち、塗布工程Aと、該乾燥工程Bと、露光,現像工程
Cと、中間加熱工程Dとを複数回繰り返すことで複数の
膜を積層し、最後に高い温度によって加熱を行うベーク
工程Eにより、所定の厚みtの絶縁層2を形成するよう
にしたものである。That is, the coating step A, the drying step B, the exposure and development step C, and the intermediate heating step D are repeated a plurality of times to stack a plurality of films, and finally, a baking step E in which heating is performed at a high temperature is performed. The insulating layer 2 having a predetermined thickness t is formed.
この場合、繰り返して加熱される温度は、ベーク工程E
より低い温度によって加熱されるため、熱によるストレ
スを減少させることができる。In this case, the temperature of repeated heating is the baking step E.
Since it is heated by the lower temperature, heat stress can be reduced.
したがって、多層基板の製造に際して、従来のような熱
によるストレスにより既に積層された絶縁層2を剥離さ
せたり、または、導電層3を断線させるようなことがな
くなり、品質の向上が図れる。Therefore, in manufacturing a multilayer substrate, the insulating layer 2 which has already been laminated or the conductive layer 3 is not broken due to stress due to heat as in the related art, and the conductive layer 3 is not broken, so that the quality can be improved.
以下本発明を第2図および第3図を参考に詳細に説明す
る。第2図は本発明による一実施例の製造フローチャー
ト図,第3図は本発明の中間加熱工程の加熱温度グラフ
である。全図を通じて、同一符号は同一対象物を示す。The present invention will be described in detail below with reference to FIGS. 2 and 3. FIG. 2 is a manufacturing flow chart of one embodiment of the present invention, and FIG. 3 is a heating temperature graph of the intermediate heating step of the present invention. Throughout the drawings, the same reference numerals denote the same objects.
第2図に示すように、基板1の積層面1Aに感光性ポリイ
ミド4を塗布する塗布工程A後、塗布した塗布面を約80
℃の温度で1.5H乾燥する乾燥工程Bを行い、乾燥後は、
露光マスク5を重ねることで露光を行い、NMP溶媒によ
って現像することで光の照射されなかった個所をNMP溶
媒によって溶解する露光,現像工程Cにより導電層3を
覆う膜2Aを形成し、更に、膜2Aを半硬化させるよう中間
加熱工程Dによる加熱を行う。As shown in FIG. 2, after the coating step A in which the photosensitive polyimide 4 is coated on the laminated surface 1A of the substrate 1, the coated surface is about 80
Drying step B for drying for 1.5 hours at a temperature of ℃ is performed, and after drying,
Exposure is carried out by overlapping the exposure mask 5, and development by an NMP solvent is carried out to dissolve a portion not irradiated with light by an NMP solvent, and a film 2A for covering the conductive layer 3 is formed by a developing step C. Heating is performed by the intermediate heating step D so as to semi-cure the film 2A.
このような塗布工程Aと、乾燥工程Bと、露光,現像工
程Cと、中間加熱工程Dとをn回繰り返し、複数の膜2A
を積層したものをベーク工程Eによる加熱によって、そ
れぞれの積層された膜2Aを硬化させ、所定の厚みtの絶
縁層2を形成するようにしたものである。The coating step A, the drying step B, the exposure / development step C, and the intermediate heating step D are repeated n times to obtain a plurality of films 2A.
The laminated film 2A is heated in the baking step E to cure each laminated film 2A to form the insulating layer 2 having a predetermined thickness t.
また、この場合の中間加熱工程Dによる加熱は第3図に
示したように、約200℃を1.5H加えるようにしたもので
あり、感光性ポリイミド4に含まれるNMP溶媒の沸点は1
80℃であるため、このように約200℃の加熱によりNMP溶
媒を蒸発させることでポリイミド基を半閉環状態にする
ことが行え、感光性ポリイミド4を半硬化させることが
できる。In addition, the heating in the intermediate heating step D in this case is performed by adding 1.5H at about 200 ° C. as shown in FIG. 3, and the boiling point of the NMP solvent contained in the photosensitive polyimide 4 is 1
Since the temperature is 80 ° C., the polyimide group can be semi-closed by evaporating the NMP solvent by heating at about 200 ° C. in this way, and the photosensitive polyimide 4 can be semi-cured.
このような半硬化させると露光,現像工程Cによって溶
解されることがないので、更に、上層に膜2Aを積層させ
ることを容易に行える。When semi-cured as described above, it is not dissolved in the exposure and development step C, so that the film 2A can be easily laminated on the upper layer.
したがって、従来のような膜2Aを完全に硬化させるよう
ベーク工程Eによる350〜400℃の高温の加熱を行うこと
なく、低い200℃の温度の加熱により複数の膜2Aの積層
することができ、基板1および下層の絶縁層2と導電層
3と於ける熱ストレスを減少させることが行える。Therefore, it is possible to stack a plurality of films 2A by heating at a low temperature of 200 ° C. without heating at a high temperature of 350 to 400 ° C. by the baking step E so as to completely cure the film 2A as in the conventional case. It is possible to reduce the thermal stress in the substrate 1, the lower insulating layer 2 and the conductive layer 3.
以上説明したように、本発明によれば、感光性ポリイミ
ドの塗布、乾燥、露光,現像および加熱を繰り返すこと
で複数の膜を積層することが低い温度の加熱によって行
える。As described above, according to the present invention, it is possible to stack a plurality of films by heating at a low temperature by repeating the application, drying, exposure, development and heating of the photosensitive polyimide.
したがって、従来のような多層基板の製造に際して、熱
ストレスによって生じる剥離、断線などの障害を防ぐこ
とができ、品質の向上が図れ、実用的効果は大である。Therefore, when manufacturing a conventional multilayer substrate, it is possible to prevent problems such as peeling and disconnection caused by thermal stress, improve quality, and bring great practical effects.
第1図は本発明の原理説明図, 第2図は本発明による一実施例の製造フローチャート
図, 第3図は本発明の中間加熱工程の加熱温度グラフ, 第4図の(a)〜(g)は従来の製造工程図, 第5図はベーク工程の加熱温度グラフ, 第6図は従来の製造フローチャート図を示す。 図において、 Aは塗布工程,Bは乾燥工程,Cは露光,現像工程,Dは中間
加熱工程,Eはベーク工程,1は基板,2は絶縁層,1Aは積層
面を示す。FIG. 1 is a diagram explaining the principle of the present invention, FIG. 2 is a manufacturing flow chart of one embodiment according to the present invention, FIG. 3 is a heating temperature graph of an intermediate heating step of the present invention, and FIG. g) is a conventional manufacturing process diagram, FIG. 5 is a heating temperature graph of the baking process, and FIG. 6 is a conventional manufacturing flowchart. In the figure, A is a coating process, B is a drying process, C is an exposure and development process, D is an intermediate heating process, E is a baking process, 1 is a substrate, 2 is an insulating layer, and 1A is a laminated surface.
Claims (1)
ミドを塗布する塗布工程(A)と、塗布された塗布面を
乾燥する乾燥工程(B)と、該乾燥工程(B)によって
乾燥された該塗布面に露光マスクを重ねることで露光
し,露光後現像行う露光,現像工程(C)と、該露光,
現像後、該感光性ポリイミド(4)を硬化させるベーク
工程(E)より低い温度によって該塗布面を加熱する中
間加熱工程(D)とを複数(n)回繰り返すことで複数
の膜を積層し、積層された該膜を該ベーク工程(E)に
よって加熱することで該積層面(1A)に所定厚(t)の
絶縁層(2)を形成することを特徴とする絶縁層の形成
方法。1. A coating step (A) for coating a photosensitive polyimide on a laminated surface (1A) of a substrate (1), a drying step (B) for drying the coated coating surface, and a drying step (B). Exposure by superimposing an exposure mask on the coated surface dried by, and developing after the exposure, the developing step (C), the exposure,
After development, an intermediate heating step (D) of heating the coated surface at a lower temperature than a baking step (E) of curing the photosensitive polyimide (4) is repeated a plurality of times (n) times to laminate a plurality of films. A method for forming an insulating layer, comprising forming the insulating layer (2) having a predetermined thickness (t) on the laminated surface (1A) by heating the laminated film in the baking step (E).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16202090A JPH07105595B2 (en) | 1990-06-20 | 1990-06-20 | Method of forming insulating layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16202090A JPH07105595B2 (en) | 1990-06-20 | 1990-06-20 | Method of forming insulating layer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0453297A JPH0453297A (en) | 1992-02-20 |
| JPH07105595B2 true JPH07105595B2 (en) | 1995-11-13 |
Family
ID=15746538
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16202090A Expired - Fee Related JPH07105595B2 (en) | 1990-06-20 | 1990-06-20 | Method of forming insulating layer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07105595B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4506809B2 (en) * | 2004-08-20 | 2010-07-21 | セイコーエプソン株式会社 | MULTILAYER STRUCTURE FORMING METHOD, WIRING BOARD AND ELECTRONIC DEVICE MANUFACTURING METHOD |
| JP4096962B2 (en) | 2004-08-20 | 2008-06-04 | セイコーエプソン株式会社 | MULTILAYER STRUCTURE FORMING METHOD, WIRING BOARD AND ELECTRONIC DEVICE MANUFACTURING METHOD |
| CN115016229B (en) * | 2022-06-13 | 2023-04-11 | 明士(北京)新材料开发有限公司 | Preparation method of photoresist low-temperature cured thick film |
-
1990
- 1990-06-20 JP JP16202090A patent/JPH07105595B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0453297A (en) | 1992-02-20 |
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