JPH0738324B2 - Resistor - Google Patents
ResistorInfo
- Publication number
- JPH0738324B2 JPH0738324B2 JP63126441A JP12644188A JPH0738324B2 JP H0738324 B2 JPH0738324 B2 JP H0738324B2 JP 63126441 A JP63126441 A JP 63126441A JP 12644188 A JP12644188 A JP 12644188A JP H0738324 B2 JPH0738324 B2 JP H0738324B2
- Authority
- JP
- Japan
- Prior art keywords
- boride
- resistor
- glaze
- silicon
- powder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 claims description 40
- 239000002245 particle Substances 0.000 claims description 24
- 239000011521 glass Substances 0.000 claims description 23
- 239000010703 silicon Substances 0.000 claims description 11
- 230000003647 oxidation Effects 0.000 claims description 8
- 238000007254 oxidation reaction Methods 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 239000002243 precursor Substances 0.000 claims description 6
- QYEXBYZXHDUPRC-UHFFFAOYSA-N B#[Ti]#B Chemical compound B#[Ti]#B QYEXBYZXHDUPRC-UHFFFAOYSA-N 0.000 claims 1
- XTDAIYZKROTZLD-UHFFFAOYSA-N boranylidynetantalum Chemical compound [Ta]#B XTDAIYZKROTZLD-UHFFFAOYSA-N 0.000 claims 1
- 229910052758 niobium Inorganic materials 0.000 claims 1
- 239000010955 niobium Substances 0.000 claims 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims 1
- 239000000843 powder Substances 0.000 description 24
- 239000012298 atmosphere Substances 0.000 description 21
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 16
- 238000010304 firing Methods 0.000 description 16
- 230000001590 oxidative effect Effects 0.000 description 8
- 239000000463 material Substances 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 239000005388 borosilicate glass Substances 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- 239000011863 silicon-based powder Substances 0.000 description 6
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 5
- 229910052810 boron oxide Inorganic materials 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000007935 neutral effect Effects 0.000 description 4
- 229910052814 silicon oxide Inorganic materials 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 3
- 239000010953 base metal Substances 0.000 description 3
- 238000000227 grinding Methods 0.000 description 3
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 3
- 229910052726 zirconium Inorganic materials 0.000 description 3
- 229910001928 zirconium oxide Inorganic materials 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 238000000498 ball milling Methods 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000004898 kneading Methods 0.000 description 2
- 238000010299 mechanically pulverizing process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 238000010298 pulverizing process Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000002194 synthesizing effect Effects 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- 229910052845 zircon Inorganic materials 0.000 description 2
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 2
- RUMACXVDVNRZJZ-UHFFFAOYSA-N 2-methylpropyl 2-methylprop-2-enoate Chemical compound CC(C)COC(=O)C(C)=C RUMACXVDVNRZJZ-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- WGLPBDUCMAPZCE-UHFFFAOYSA-N Trioxochromium Chemical compound O=[Cr](=O)=O WGLPBDUCMAPZCE-UHFFFAOYSA-N 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- XHCLAFWTIXFWPH-UHFFFAOYSA-N [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] XHCLAFWTIXFWPH-UHFFFAOYSA-N 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229910000423 chromium oxide Inorganic materials 0.000 description 1
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- PPNAOCWZXJOHFK-UHFFFAOYSA-N manganese(2+);oxygen(2-) Chemical group [O-2].[Mn+2] PPNAOCWZXJOHFK-UHFFFAOYSA-N 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000011812 mixed powder Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 description 1
- 229910000484 niobium oxide Inorganic materials 0.000 description 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- SWELZOZIOHGSPA-UHFFFAOYSA-N palladium silver Chemical compound [Pd].[Ag] SWELZOZIOHGSPA-UHFFFAOYSA-N 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910001925 ruthenium oxide Inorganic materials 0.000 description 1
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 1
- 239000011856 silicon-based particle Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229910001936 tantalum oxide Inorganic materials 0.000 description 1
- 229940116411 terpineol Drugs 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
- 229910001935 vanadium oxide Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Landscapes
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Non-Adjustable Resistors (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明はグレーズ抵抗体にかかり、中性雰囲気、あるい
は還元雰囲気中の非酸化性雰囲気中で焼成され、卑金属
電極、特に銅厚膜混成集積回路(HIC)基板上等で、銅
電極とともに構成される抵抗器に関するものである。Description: TECHNICAL FIELD The present invention relates to a glaze resistor, which is fired in a non-oxidizing atmosphere such as a neutral atmosphere or a reducing atmosphere to obtain a base metal electrode, particularly a copper thick film hybrid integrated circuit ( HIC) on a substrate or the like, and a resistor configured with a copper electrode.
従来の技術 従来、電極を形成したアルミナ基板上に設ける抵抗材料
として、RuO2−ガラスから構成されるRuO2グレーズ抵抗
体がひろく実用に供されている。 2. Description of the Related Art Conventionally, a RuO 2 glaze resistor composed of RuO 2 -glass has been widely put into practical use as a resistance material provided on an alumina substrate on which electrodes are formed.
このグレーズ抵抗体は、焼結アルミナ基板上の銀あるい
は銀とパラジウムからなる電極を空気中で焼付けたうえ
で、RuO2とガラスを樹脂バインダと溶剤からなるビヒク
ル中に分散させたペーストをアルミナ基板上の前記電極
に接続するように印刷し、空気中700〜900℃の温度で焼
成して形成される。これら厚膜技術に関しては、プラナ
ー、フィリップス著「シック・フィルム・サーキット」
ロンドン・バターワース社(Pianer、Phillips「Thick
Film Circuits」、LONDON BUTTERWORTHS社)に論じられ
ている。In this glaze resistor, an electrode made of silver or silver and palladium on a sintered alumina substrate is baked in air, and then a paste of RuO 2 and glass dispersed in a vehicle made of a resin binder and a solvent is used as an alumina substrate. It is formed by printing so as to be connected to the above electrode and firing in air at a temperature of 700 to 900 ° C. About these thick film technologies, Planer, Phillips "Sick Film Circuit"
London Butterworth (Pianer, Phillips "Thick
Film Circuits ", LONDON BUTTERWORTHS).
一方、銀−パラジウム電極等の貴金属以外の卑金属電極
上、例えばW,Mo,Cu上にRuO2−ガラス系グレーズ抵抗体
を空気中で形成することを考えた場合、電極材料の酸化
現象が生じ、電極上へのグレーズ抵抗体の形成は不可能
である。On the other hand, when considering forming a RuO 2 -glass-based glaze resistor in air on a base metal electrode other than a noble metal such as a silver-palladium electrode, for example, W, Mo, Cu, an oxidation phenomenon of the electrode material occurs. It is impossible to form a glaze resistor on the electrodes.
そのため、卑金属電極を用いてグレーズ抵抗体を形成す
るためにはグレーズ抵抗体を還元雰囲気中、または中性
雰囲気中で焼成する必要がある。Therefore, in order to form the glaze resistor using the base metal electrode, it is necessary to fire the glaze resistor in a reducing atmosphere or a neutral atmosphere.
しかし、RuO2系グレーズ抵抗材料はその性質上還元雰囲
気中で焼成された場合、 RuO2+H2→Ru+H2O の反応が容易に起り、抵抗体としての特性が得られな
い。However, when the RuO 2 -based glaze resistance material is fired in a reducing atmosphere due to its nature, the reaction of RuO 2 + H 2 → Ru + H 2 O easily occurs, and the characteristics as a resistor cannot be obtained.
一方、硼化物−ガラス系グレーズ抵抗材料は硼化物の性
質上、雰囲気が還元雰囲気,中性雰囲気を問わず化学変
化を受けることがない。したがって、硼化物−ガラス系
グレーズ抵抗体は還元雰囲気中や、中性雰囲気中でも焼
成が可能なものである。On the other hand, the boride-glass type glaze resistance material does not undergo a chemical change regardless of the reducing atmosphere or the neutral atmosphere due to the nature of boride. Therefore, the boride-glass type glaze resistor can be fired in a reducing atmosphere or a neutral atmosphere.
この硼化物を用いて抵抗体を形成する技術としては、ド
ナフゥー他著「ナイトロジェン ファイアブル レジス
ター」プロシィーディング オブ1987 ECC(Donahue et
al「Nitrogen-Fireable Resistor」Proceeding of 198
7 Electronic Conponents Conference)に論じられてい
る。As a technique for forming a resistor using this boride, "Nitogen Fireable Register" Proceeding of 1987 ECC (Donahue et al.
al "Nitrogen-Fireable Resistor" Proceeding of 198
7 Electronic Conponents Conference).
発明が解決しようとする問題 しかしながら硼化物−ガラス系グレーズ抵抗体の抵抗材
料を構成する硼化物粉体が、事前に合成し機械的粉砕を
行なって作成しているため、粒径1μm以下にすること
が難しい。たとえば、硼化チタン粉の粉砕(粉砕機:ア
トライタ,超硬ボール湿式)による粒度調整の場合、粉
砕だけをみれば、強力な粉砕を行えば、ほぼ全粒子を1
μm以下にすることも可能である。しかし、TiB2の場合
は粉砕による不純物の混入が大きく、粒径0.79μmまで
粉砕すると超硬ボールが35%も混入したという例もあ
る。さらには、TiB2の場合、粉砕による酸化も大きく、
6%近くにまで達する。このように硼化物の粉砕による
粒度調整は問題も多い。Problems to be Solved by the Invention However, since the boride powder that constitutes the resistance material of the boride-glass-based glaze resistor is prepared by synthesizing in advance and performing mechanical pulverization, the particle size is set to 1 μm or less. Difficult to do. For example, in the case of adjusting the particle size by crushing titanium boride powder (crusher: attritor, super hard ball wet type), if only crushing is performed, if powerful crushing is performed, almost all particles will be 1
It is also possible to set the thickness to μm or less. However, in the case of TiB 2 , there is a large amount of impurities mixed by crushing, and in some cases, 35% of carbide balls were mixed when crushed to a particle size of 0.79 μm. Furthermore, in the case of TiB 2 , oxidation due to grinding is also large,
It reaches close to 6%. As described above, there are many problems in adjusting the particle size by grinding the boride.
一方、グレーズ抵抗体材料に用いる導電粒子は負荷特性
の観点からできるだけ微粉状態で使用する方が好まし
い。例えば、酸化ルテニウム系抵抗材料に用いられてい
るRuO2粉体のような、数百Åオーダーの粒径が望まし
い。しかし、上記のような理由で、サブ・ミクロン・オ
ーダー以下の硼化物を得ることは通常の粉砕方法では、
不可能である。このように粒度調整が困難な硼化物を微
小な導電粒子を必要とする厚膜グレーズ抵抗体の導電粒
子として用いるために、機械的な粒度調整を回避する必
要がある。On the other hand, the conductive particles used for the glaze resistor material are preferably used in the finest powder state as much as possible from the viewpoint of load characteristics. For example, a particle size on the order of several hundred Å is desirable, such as RuO 2 powder used for a ruthenium oxide-based resistance material. However, for the reasons described above, obtaining a boride on the order of sub-micron order or less is not possible with a usual pulverization method.
It is impossible. Since the boride whose particle size is difficult to adjust is used as the conductive particles of the thick film glaze resistor which requires fine conductive particles, it is necessary to avoid mechanical particle size adjustment.
本発明は上記問題点に鑑み、硼化物−ガラス系グレーズ
抵抗器において、抵抗体ペースト中に硼化物を含むので
はなく、非酸化性雰囲気中における焼成工程で、ホウケ
イ酸ガラス中に含まれるTiO2,ZrO2,V2O5,Nb2O5,Ta2
O5,Cr2O3,MoO3,WO3,MnO2の内少なくとも一種の酸化
物と酸化ホウ素をシリコンや一酸化シリコン、あるいは
一酸化シリコンの高次酸化状態前駆体を用いて還元し、
微小なÅオーダーの硼化物を得ることにより形成したグ
レーズ抵抗器である。In view of the above problems, the present invention, in the boride-glass-based glaze resistor, does not include the boride in the resistor paste, in the firing step in a non-oxidizing atmosphere, TiO contained in the borosilicate glass 2 , ZrO 2 , V 2 O 5 , Nb 2 O 5 , Ta 2
At least one oxide of O 5 , Cr 2 O 3 , MoO 3 , WO 3 , and MnO 2 and boron oxide are reduced by using silicon, silicon monoxide, or a higher oxidation state precursor of silicon monoxide,
It is a glaze resistor formed by obtaining minute Å-order boride.
課題を解決するための手段 上記課題を解決するために本発明の抵抗器は、非酸化性
雰囲気中における焼成工程で、ホウケイ酸ガラス中に含
まれる前記酸化物と酸化ホウ素をシリコンや一酸化シリ
コンを用いて還元し、微小なÅオーダーの硼化物を含む
抵抗器であり、シート抵抗10kΩ/□以上で低TCR、なら
びに、高範囲のシート抵抗体が同時焼成可能となり、ま
た、ブレンド可能なペーストが作成できる。Means for Solving the Problems In order to solve the above problems, the resistor of the present invention is a firing step in a non-oxidizing atmosphere, and the oxide and boron oxide contained in borosilicate glass are silicon or silicon monoxide. Is a resistor containing a small amount of Å-order boride, and has a sheet resistance of 10 kΩ / □ or more, low TCR, and a wide range of sheet resistors can be co-fired, and a paste that can be blended Can be created.
さらにはÅオーダーの微小粒径を有する硼化物が形成さ
れているため、耐サージ特性の優れたグレーズ抵抗器で
ある。Furthermore, since a boride having a fine grain size of Å order is formed, it is a glaze resistor with excellent surge resistance.
作用 本発明は上記したように、硼化物−ガラス系グレーズ抵
抗器において、一般的に硬質金属に属する硼化物の粉体
を機械的粉砕で得た物ではなく、ホウケイ酸ガラス中に
含まれる前記酸化物と酸化ホウ素をシリコンや一酸化シ
リコン、あるいは一酸化シリコンの高次酸化状態前駆体
を用いて、非酸化性雰囲気中焼成工程中で還元して得た
物であり、前記数百Åオーダーの微小な硼化物とガラス
から構成される抵抗器である。Action As described above, the present invention, in the boride-glass-based glaze resistor, is not a product obtained by mechanically pulverizing a boride powder that generally belongs to a hard metal, but is contained in a borosilicate glass. It is a product obtained by reducing oxide and boron oxide using silicon, silicon monoxide, or a higher oxidation state precursor of silicon monoxide in a firing process in a non-oxidizing atmosphere. This is a resistor composed of a minute boride and glass.
上記の工程で得た前記抵抗器は、シート抵抗10kΩ/□
以上で低TCR、ならびに、高範囲のシート抵抗器が同時
に形成でき、また、ブレンド可能なペーストが作成でき
る。The resistor obtained in the above process has a sheet resistance of 10 kΩ / □
With the above, low TCR and high range sheet resistors can be formed at the same time, and a blendable paste can be prepared.
さらには、前記抵抗器は微小粒径を有する硼化物で構成
されているため、負荷特性を改善することができる。Furthermore, since the resistor is made of boride having a minute grain size, the load characteristics can be improved.
実施例 以下本発明の一実施例の抵抗器について、説明する。Example A resistor according to an example of the present invention will be described below.
[実施例1] シリコン粉体は高純度シリコン粉体を粗粉砕したあと、
エタノール中でイットリウム安定化ジルコニウム(YT
Z)ボールを用いて、平均粒径約0.4μmになるまでボー
ル・ミル粉砕した。[Example 1] Silicon powder was obtained by roughly crushing high-purity silicon powder,
Yttrium-stabilized zirconium (YT
Z) Ball milling was performed using balls to an average particle size of about 0.4 μm.
ガラスフリットはBaO(10〜23mol%)、CaO(3〜
6)、MgO(7〜9)、B2O3(40〜55)、SiO2(6〜2
5)、Al2O3(7〜9)からなる酸化物、あるいはこれら
の炭酸塩と、硼化物を形成する前記酸化物として本実施
例では酸化ジルコニウム混合し、この混合粉体を1400℃
で溶解した後、溶解物を冷水中で急冷してガラス化し
て、ボール・ミル粉砕して得た。なお、本[実施例1]
では硼化物生成用酸化物として酸化ジルコニウムを5.8,
7.9,10.9wt%含むA,B,C三つのガラス粉末を用いた。Glass frit is BaO (10-23mol%), CaO (3-
6), MgO (7~9), B 2 O 3 (40~55), SiO 2 (6~2
5), an oxide of Al 2 O 3 (7 to 9), or a carbonate thereof, and zirconium oxide are mixed in the present embodiment as the oxide forming the boride, and the mixed powder is mixed at 1400 ° C.
After being melted in (1), the melt was quenched in cold water to vitrify and ball-milled to obtain. In addition, this [Example 1]
Then, 5.8 zirconium oxide is used as the boride-forming oxide,
Three glass powders of A, B and C containing 7.9 and 10.9 wt% were used.
これら粉体を混合し、グレーズ抵抗粉末とした。このと
きのシリコン/(シリコン+ガラス)比は重量比で0.02
〜0.1であった。このグレーズ抵抗粉末を混練するビヒ
クルはテルピネオール中にイソ−ブチルメタアクリレー
トが10%重量比になるよう秤量し、溶解して得た。この
ビヒクルとグレーズ抵抗粉末の比はグレーズ抵抗粉末1g
あたり0.4ccであった。These powders were mixed to obtain a glaze resistance powder. The silicon / (silicon + glass) ratio at this time is 0.02 by weight.
It was ~ 0.1. A vehicle for kneading the glaze resistance powder was obtained by weighing and dissolving iso-butyl methacrylate in terpineol so that the weight ratio was 10%. The ratio of this vehicle to the glaze resistance powder is 1 g of glaze resistance powder.
It was about 0.4cc.
このグレーズ抵抗体ペーストを325メッシュのステンレ
ススクリーンを用いてCu電極を持つアルミナ基板上にス
クリーンを印刷した。この後、120℃で10分間乾燥して
から、雰囲気制御可能な厚膜焼成炉で焼成した。焼成炉
の条件は釣鐘状の温度プロファイルで920℃10分間保持
のトータル焼成時間60分であった。このときの雰囲気は
窒素雰囲気で行い、酸素濃度は銅電極が酸化しない範囲
の10ppm以下で行なった。This glaze resistor paste was printed on an alumina substrate having a Cu electrode using a 325 mesh stainless screen. After that, it was dried at 120 ° C. for 10 minutes and then fired in a thick film firing furnace capable of controlling the atmosphere. The firing furnace conditions were a bell-shaped temperature profile and a total firing time of 60 minutes at 920 ° C for 10 minutes. At this time, the atmosphere was a nitrogen atmosphere, and the oxygen concentration was 10 ppm or less, which was a range in which the copper electrode was not oxidized.
このようにしてえられたグレーズ抵抗体の抵抗諸特性を
第1表に示す。Table 1 shows various resistance characteristics of the glaze resistor thus obtained.
なお、抵抗温度係数(TCR)は常温(25℃)時の抵抗値
に対する125℃における抵抗値の変化量をppm/℃で表
す。短時間過負荷テストは125mW/mm2の電力に相当する
電圧の2.5倍を印加して、初期値に対する抵抗変化率で
評価し、耐湿テストは、温度60℃,相対湿度95%雰囲気
中に1000時間放置した後の初期値に対する抵抗変化率で
評価した。耐サージテストは2000pFのコンデンサに500V
の電圧を印加充電した後、これを抵抗体に放電し、抵抗
初期値に対する変化率で表した。また、この抵抗体の焼
成前後における抵抗体断面模式図を第1図(a),
(b)に示す。また、X線回析パターンより、硼化物の
粒径を測定したところ140Åであった。 The temperature coefficient of resistance (TCR) represents the amount of change in the resistance value at 125 ° C relative to the resistance value at room temperature (25 ° C) in ppm / ° C. In the short-time overload test, 2.5 times the voltage equivalent to 125 mW / mm 2 of electric power is applied, and the resistance change rate against the initial value is evaluated. Evaluation was made by the rate of change in resistance with respect to the initial value after standing for a time. Anti-surge test is 500V with 2000pF capacitor
After being charged by applying the voltage of, this was discharged into a resistor and expressed by the rate of change with respect to the initial value of resistance. A schematic sectional view of the resistor before and after firing is shown in FIG.
It shows in (b). The particle size of the boride was measured from the X-ray diffraction pattern and found to be 140Å.
以上のように本[実施例1]によれば、本発明の硼化物
−ガラス抵抗器の硼化物を、非酸化性雰囲気中における
焼成工程で、ホウケイ酸ガラス中に含まれる前記酸化物
と酸化ホウ素とをシリコンを用い還元して得ているた
め、微小な数百Åオーダーの硼化物が得られており、耐
サージ特性の優れた高性能なグレーズ抵抗体が構成され
ている。As described above, according to the present [Example 1], the boride of the boride-glass resistor of the present invention is oxidized with the oxide contained in the borosilicate glass in the firing step in a non-oxidizing atmosphere. Since boron and boron are obtained by reduction using silicon, minute borides of the order of several hundred Å are obtained, and high-performance glaze resistors with excellent surge resistance are constructed.
つぎに、一酸化シリコンを用いた本発明の第2の実施例
を説明する。Next, a second embodiment of the present invention using silicon monoxide will be described.
[実施例2] 一酸化シリコン粉体は一酸化シリコン試薬を粗粉砕した
あと、エタノール中でジルコニウムボールを用いて、平
均粒径約0.5μmになるまでボール・ミル粉砕した。[Example 2] Silicon monoxide powder was obtained by roughly crushing a silicon monoxide reagent and then ball-milling it in ethanol using zirconium balls until the average particle size became about 0.5 µm.
ガラスフリットは[実施例1]と同様にして得た。The glass frit was obtained in the same manner as in [Example 1].
これら粉体を混合し、グレーズ抵抗粉末とし、[実施例
1]と同様に混合・混練しグレーズ抵抗ペーストを得
た。These powders were mixed to form a glaze resistance powder, which was mixed and kneaded in the same manner as in [Example 1] to obtain a glaze resistance paste.
このグレーズ抵抗体ペーストを325メッシュのステンレ
ススクリーンを用いてCu電極を持つアルミナ基板上に
[実施例1]と同様にスクリーン印刷し、この後120℃
で10分間乾燥してから、[実施例1]と同様に雰囲気制
御可能な厚膜焼成炉で焼成した。This glaze resistor paste was screen-printed on an alumina substrate having a Cu electrode using a 325 mesh stainless screen in the same manner as in [Example 1], and then 120 ° C.
After being dried for 10 minutes in the same manner, it was baked in a thick film baking furnace whose atmosphere can be controlled in the same manner as in [Example 1].
このようにしてえられたグレーズ抵抗体の抵抗諸特性を
第2表に示す。The resistance characteristics of the glaze resistor thus obtained are shown in Table 2.
以上のように、本[実施例2]においても、[実施例
1]と同様に、本発明の硼化物−ガラス抵抗器の硼化物
を、非酸化性雰囲気中における焼成工程で、ホウケイ酸
ガラス中に含まれる前記酸化物と酸化ホウ素とをシリコ
ンを用い還元して得ているため、微小な硼化物が得られ
ており、耐サージ特性の優れた高性能なグレーズ抵抗体
が構成されている。 As described above, also in the present [Example 2], as in the case of [Example 1], the boride of the boride-glass resistor of the present invention is treated with a borosilicate glass in a firing step in a non-oxidizing atmosphere. Since the oxide and boron oxide contained therein are reduced by using silicon, a fine boride is obtained, and a high-performance glaze resistor having excellent surge resistance is constructed. .
本発明の効果を明らかにするために、以下に[比較例]
を示す。In order to clarify the effect of the present invention, the following [Comparative Example]
Indicates.
[比較例] [実施例1],[実施例2]で用いた硼化物として硼化
ジルコニウムをアルゴンガス中で合成し、この合成粉体
をエタノール中でWCボールを用いて平均粒径約0.5μm
になるまでボール・ミル粉砕して硼化物粉体を得た。[Comparative Example] Zirconium boride as a boride used in [Example 1] and [Example 2] was synthesized in argon gas, and this synthetic powder was used in WC balls in ethanol to have an average particle size of about 0.5. μm
It was pulverized with a ball mill to obtain a boride powder.
ガラスは、公知の非還元性ガラスを[実施例1]と同様
に溶解・粉砕して得た。The glass was obtained by melting and crushing a known non-reducing glass in the same manner as in [Example 1].
これら硼化物粉体とガラス混合したあと、[実施例1]
と同様にビヒクルと混練して抵抗体ペーストを得た。After mixing these boride powders with glass, [Example 1]
In the same manner as the above, kneading was performed with the vehicle to obtain a resistor paste.
この抵抗体ペーストを[実施例1]と同様に印刷・乾燥
・焼成を行い、抵抗体を形成し評価した。This resistor paste was printed, dried and fired in the same manner as in [Example 1] to form a resistor and evaluated.
このときの抵抗諸特性を第3表に示す。Various resistance characteristics at this time are shown in Table 3.
以上[比較例]に示すように、硼化物粉体を事前に合成
し機械的粉砕を行なって形成した硼化物−ガラス系グレ
ーズ抵抗器では、硼化物粒子が大きく、サブμmの粒子
しか得られないし、また、形成したグレーズ抵抗体内部
に不均一な電界分布ができ、サージ電圧による抵抗値変
化が著しい。 As shown in the above [Comparative Example], in the boride-glass type glaze resistor formed by previously synthesizing boride powder and mechanically pulverizing the boride particles, the boride particles are large and only sub-μm particles are obtained. In addition, a non-uniform electric field distribution is formed inside the formed glaze resistor, and the resistance value changes significantly due to the surge voltage.
また、一般に硬質金属に属する硼化物の粉砕は非常に難
しく、[比較例]に示すような粒径1μm以下の硼化物
粉体を得たとしても、不純物の混入を防ぐことが困難で
あり、この不純物により不均一な電界分布が生じ、サー
ジ電圧による抵抗値変化を助長することとなる。Further, it is generally very difficult to pulverize a boride belonging to a hard metal, and even if a boride powder having a particle size of 1 μm or less as shown in [Comparative Example] is obtained, it is difficult to prevent impurities from being mixed in. This impurity causes a non-uniform electric field distribution, which promotes a change in resistance value due to a surge voltage.
なお、本比較例において形成した硼化ジルコン中には、
5wt%のWCが混入していた。In the zircon boride formed in this comparative example,
5 wt% WC was mixed.
一方、シリコン,一酸化シリコンの粉砕に関しては数+
ppmオーダーの汚染しかなかった。On the other hand, for grinding silicon and silicon monoxide,
There was only ppm order of pollution.
なお、本実施例では酸化ジルコニウムをガラス中に含有
させたが、この硼化物形成用の酸化物としては、酸化バ
ナジウム,酸化クロム,酸化タングステン,酸化マンガ
ンが硼化物をそれぞれ形成し同様の結果を示すが、好ま
しくは、酸化ジルコン,酸化タンタル,酸化チタン,酸
化モリブデン,酸化ニオブが耐湿性などを満足する好結
果が得られた。In this example, zirconium oxide was contained in the glass, but as the oxide for forming boride, vanadium oxide, chromium oxide, tungsten oxide, and manganese oxide form boride, and the same results are obtained. Although shown, preferably, zircon oxide, tantalum oxide, titanium oxide, molybdenum oxide, and niobium oxide obtained favorable results satisfying the humidity resistance.
なお、実施例では窒素雰囲気中で焼成したが、非酸化性
雰囲気であれば良く、7%未満の水素を含む還元性雰囲
気中でも焼成可能である。In the examples, firing was performed in a nitrogen atmosphere, but it is sufficient if the firing is a non-oxidizing atmosphere, and firing is also possible in a reducing atmosphere containing less than 7% hydrogen.
また、実施例では、0.5μmのシリコン粉体、一酸化シ
リコン粉体を用いたが、粒径としては平均粒径1μm以
下であれば、抵抗体の諸特性に影響をあたえず微小な硼
化物が得られ、良好な結果が得られる。Further, in the examples, 0.5 μm silicon powder and silicon monoxide powder were used, but if the average particle size is 1 μm or less, the fine boride will not affect the various characteristics of the resistor. Is obtained and good results are obtained.
実施例ではシリコン粉体,一酸化シリコン粉体を用いた
が、これらは還元剤として機能すればよく、一酸化シリ
コンの高次酸化状態前駆体、例えば、Si2O3、Si3O5でも
同様の効果がえられる。また、これらシリコン粉体,一
酸化シリコン粉体,一酸化シリコンの高次酸化状態前駆
体を混合して用いることも可能である。Although silicon powder and silicon monoxide powder were used in the examples, these may be used as long as they function as a reducing agent, and higher-order oxidation state precursors of silicon monoxide, such as Si 2 O 3 and Si 3 O 5, are also used. The same effect can be obtained. It is also possible to mix and use the silicon powder, the silicon monoxide powder, and the higher oxidation state precursor of silicon monoxide.
さらには、これらシリコン粉体,一酸化シリコン粉体,
一酸化シリコンの高次酸化状態前駆体は結晶化している
必要はなく、アモルファス状態であっても同様の効果が
得られる。Furthermore, these silicon powder, silicon monoxide powder,
The higher oxidation state precursor of silicon monoxide does not need to be crystallized, and the same effect can be obtained even in the amorphous state.
なお、実施例において、有機ポリマーとしてポリブチル
メタアクリートを用いたが、低温で解重合をおこし昇華
飛散するものであれば何でもよく例えば、ポリテトラフ
ルオロエチレンや、ポリ−α−メチルスチレン,ポリ−
メチルメタアクリレートを単体,混合、あるいは共重合
して用いてもよい。In the examples, polybutyl metaacrylate was used as the organic polymer, but any substance may be used as long as it can be depolymerized at low temperature and sublimate and scatter, for example, polytetrafluoroethylene, poly-α-methylstyrene, poly-
Methyl methacrylate may be used alone, mixed, or copolymerized.
発明の効果 以上のように本発明は硼化物−ガラス系グレーズ抵抗器
において、抵抗体ペーストに硼化物を含むのではなく、
非酸化性雰囲気中における焼成工程で、ホウケイ酸ガラ
ス中に含まれる前記酸化物と酸化ホウ素とをシリコンや
一酸化シリコンを用いて還元し、微小な硼化物を得るこ
とにより形成したグレーズ抵抗器である。EFFECTS OF THE INVENTION As described above, the present invention is a boride-glass-based glaze resistor, which does not include boride in the resistor paste,
A glaze resistor formed by obtaining a minute boride by reducing the oxide and boron oxide contained in borosilicate glass with silicon or silicon monoxide in a firing step in a non-oxidizing atmosphere. is there.
このため、このグレーズ抵抗器は、シート抵抗10kΩ/
□以上で低TCR、ならびに、高範囲のシート抵抗体が同
時焼成可能であり、また、ブレンド可能なペーストが作
成できる。Therefore, this glaze resistor has a sheet resistance of 10 kΩ /
□ Above, low TCR and high range sheet resistors can be fired at the same time, and a blendable paste can be prepared.
さらには微小粒径を有する硼化物が形成できるので耐サ
ージ特性を向上できる効果が得られる。Furthermore, since a boride having a fine grain size can be formed, an effect of improving surge resistance can be obtained.
さらには粉砕工程を必要な粉体がシリコン,一酸化シリ
コン等の脆性材料であるため、粉砕工程における不純物
の混入を最小限に抑えることができるという効果が生じ
る。Furthermore, since the powder that requires the crushing step is a brittle material such as silicon or silicon monoxide, it is possible to minimize the mixing of impurities in the crushing step.
第1図(a),(b)は本発明の一実施例における抵抗
体の(a)焼成前、(b)焼成後の断面模式図である。 1……基板、2……ガラス粒子、3……シリコン粒子、
4……硼化物粒子。1A and 1B are schematic cross-sectional views of a resistor according to an embodiment of the present invention, before (a) firing and (b) firing. 1 ... Substrate, 2 ... Glass particles, 3 ... Silicon particles,
4 ... boride particles.
Claims (1)
シリコン、一酸化シリコンの高次酸化状態前駆体の内少
なくとも一種と、平均粒径500Å以下の硼化チタン、硼
化タンタル、硼化ニオブの内少なくとも一種と、ガラス
から構成されたことを特徴とする抵抗器。1. At least one of silicon, silicon monoxide, and a higher oxidation state precursor of silicon monoxide having an average particle diameter of 1 μm or less, and titanium boride, tantalum boride, or boride having an average particle diameter of 500 Å or less. A resistor made of at least one of niobium and glass.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63126441A JPH0738324B2 (en) | 1988-05-24 | 1988-05-24 | Resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63126441A JPH0738324B2 (en) | 1988-05-24 | 1988-05-24 | Resistor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01295401A JPH01295401A (en) | 1989-11-29 |
| JPH0738324B2 true JPH0738324B2 (en) | 1995-04-26 |
Family
ID=14935286
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63126441A Expired - Fee Related JPH0738324B2 (en) | 1988-05-24 | 1988-05-24 | Resistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0738324B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111512695A (en) * | 2017-12-19 | 2020-08-07 | 株式会社电装 | Resistor, honeycomb structure, and electrically heated catalyst device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5533565B2 (en) * | 1972-05-16 | 1980-09-01 | ||
| US4585580A (en) * | 1978-08-16 | 1986-04-29 | E. I. Du Pont De Nemours And Company | Thick film copper compatible resistors based on hexaboride conductors and nonreducible glasses |
| JPH073801B2 (en) * | 1986-04-03 | 1995-01-18 | 旭硝子株式会社 | Resistor composition |
-
1988
- 1988-05-24 JP JP63126441A patent/JPH0738324B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111512695A (en) * | 2017-12-19 | 2020-08-07 | 株式会社电装 | Resistor, honeycomb structure, and electrically heated catalyst device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01295401A (en) | 1989-11-29 |
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