JPH0766884B2 - Resistor manufacturing method - Google Patents
Resistor manufacturing methodInfo
- Publication number
- JPH0766884B2 JPH0766884B2 JP62262066A JP26206687A JPH0766884B2 JP H0766884 B2 JPH0766884 B2 JP H0766884B2 JP 62262066 A JP62262066 A JP 62262066A JP 26206687 A JP26206687 A JP 26206687A JP H0766884 B2 JPH0766884 B2 JP H0766884B2
- Authority
- JP
- Japan
- Prior art keywords
- oxide
- silicon
- silicon monoxide
- resistor
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 claims description 52
- 239000012298 atmosphere Substances 0.000 claims description 25
- 238000010304 firing Methods 0.000 claims description 21
- 239000011521 glass Substances 0.000 claims description 20
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 18
- 239000010703 silicon Substances 0.000 claims description 15
- 230000001590 oxidative effect Effects 0.000 claims description 12
- 230000003647 oxidation Effects 0.000 claims description 10
- 238000007254 oxidation reaction Methods 0.000 claims description 10
- 229910052710 silicon Inorganic materials 0.000 claims description 9
- 239000005388 borosilicate glass Substances 0.000 claims description 8
- 239000002243 precursor Substances 0.000 claims description 8
- 229910052810 boron oxide Inorganic materials 0.000 claims description 7
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 4
- 238000004898 kneading Methods 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- AMWRITDGCCNYAT-UHFFFAOYSA-L hydroxy(oxo)manganese;manganese Chemical compound [Mn].O[Mn]=O.O[Mn]=O AMWRITDGCCNYAT-UHFFFAOYSA-L 0.000 claims 2
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 claims 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims 1
- WGLPBDUCMAPZCE-UHFFFAOYSA-N Trioxochromium Chemical compound O=[Cr](=O)=O WGLPBDUCMAPZCE-UHFFFAOYSA-N 0.000 claims 1
- XHCLAFWTIXFWPH-UHFFFAOYSA-N [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[V+5].[V+5] XHCLAFWTIXFWPH-UHFFFAOYSA-N 0.000 claims 1
- 229910052796 boron Inorganic materials 0.000 claims 1
- 229910000423 chromium oxide Inorganic materials 0.000 claims 1
- 238000001035 drying Methods 0.000 claims 1
- 229910010272 inorganic material Inorganic materials 0.000 claims 1
- 239000011147 inorganic material Substances 0.000 claims 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 claims 1
- 229910000484 niobium oxide Inorganic materials 0.000 claims 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 claims 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 claims 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 claims 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 claims 1
- 229920000642 polymer Polymers 0.000 claims 1
- 229910001936 tantalum oxide Inorganic materials 0.000 claims 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims 1
- 229910001930 tungsten oxide Inorganic materials 0.000 claims 1
- 229910001935 vanadium oxide Inorganic materials 0.000 claims 1
- 229910052845 zircon Inorganic materials 0.000 claims 1
- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 claims 1
- 239000000843 powder Substances 0.000 description 20
- 239000000463 material Substances 0.000 description 13
- 239000002245 particle Substances 0.000 description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- 229910052814 silicon oxide Inorganic materials 0.000 description 6
- 239000011863 silicon-based powder Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 238000002156 mixing Methods 0.000 description 4
- 230000007935 neutral effect Effects 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 239000010953 base metal Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- RUMACXVDVNRZJZ-UHFFFAOYSA-N 2-methylpropyl 2-methylprop-2-enoate Chemical compound CC(C)COC(=O)C(C)=C RUMACXVDVNRZJZ-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- -1 Generally Substances 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 2
- 238000000498 ball milling Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- MOWNZPNSYMGTMD-UHFFFAOYSA-N oxidoboron Chemical class O=[B] MOWNZPNSYMGTMD-UHFFFAOYSA-N 0.000 description 2
- 238000010298 pulverizing process Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 235000014121 butter Nutrition 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000011812 mixed powder Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 239000000075 oxide glass Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- SWELZOZIOHGSPA-UHFFFAOYSA-N palladium silver Chemical compound [Pd].[Ag] SWELZOZIOHGSPA-UHFFFAOYSA-N 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011856 silicon-based particle Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229940116411 terpineol Drugs 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Landscapes
- Non-Adjustable Resistors (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明はグレーズ抵抗材料にかかり、中性雰囲気、ある
いは還元雰囲気中の非酸化性雰囲気中で焼成でき、卑金
属電極、特に銅厚膜混成集積回路(HIC)基板上等で、
銅電極とともに構成される抵抗体の製造方法に関するも
のである。TECHNICAL FIELD The present invention relates to a glaze resistance material, which can be fired in a non-oxidizing atmosphere such as a neutral atmosphere or a reducing atmosphere, and a base metal electrode, particularly a copper thick film hybrid integrated circuit ( HIC) on the board,
The present invention relates to a method for manufacturing a resistor configured with a copper electrode.
従来の技術 従来、電極を形成したアルミナ基板上に設ける抵抗材料
として、RuO2−ガラスから構成されるRuO2グレーズ抵抗
体がひろく実用に供されている。 2. Description of the Related Art Conventionally, a RuO 2 glaze resistor composed of RuO 2 -glass has been widely put into practical use as a resistance material provided on an alumina substrate on which electrodes are formed.
このグレーズ抵抗体は、焼結アルミナ基板上の銀あるい
は銀とパラジウムからなる電極を空気中で焼付けたうえ
で、RuO2−ガラスを樹脂バインダと溶剤からなるビヒク
ル中に分散させたペーストをアルミナ基板上の前記電極
に接続するように印刷し、空気中700〜900℃の温度で焼
成して形成される。これら厚膜技術に関しては、プラナ
ー、フィリップス著「シック・フィルム・サーキット」
ロンドン・バターワース社 (Planer、Phillips「Thick Film Circuits」、LONDON
BUTTERWORTHS社)に論じられている。In this glaze resistor, an electrode made of silver or silver and palladium on a sintered alumina substrate is baked in air, and then a paste of RuO 2 -glass dispersed in a vehicle made of a resin binder and a solvent is used as an alumina substrate. It is formed by printing so as to be connected to the above electrode and firing in air at a temperature of 700 to 900 ° C. About these thick film technologies, Planer, Phillips "Sick Film Circuit"
London Butterworth (Planer, Phillips "Thick Film Circuits", LONDON
BUTTER WORTHS).
一方、銀−パラジウム電極等の貴金属以外の卑金属電極
上、例えばW、Mo、Cu上にRuO2−ガラス系グレーズ抵抗
体を空気中で形成することを考えた場合、電極材料の酸
化現象が生じ、電極上へのグレーズ抵抗体の形成は不可
能である。On the other hand, when considering formation of a RuO 2 -glass-based glaze resistor in air on a base metal electrode other than a noble metal such as a silver-palladium electrode, for example, W, Mo, Cu, an oxidation phenomenon of the electrode material occurs. It is impossible to form a glaze resistor on the electrodes.
そのため、卑金属電極を用いてグレーズ抵抗体を形成す
るためにはグレーズ抵抗体を還元雰囲気中、または中性
雰囲気中で焼成する必要がある。Therefore, in order to form the glaze resistor using the base metal electrode, it is necessary to fire the glaze resistor in a reducing atmosphere or a neutral atmosphere.
しかし、RuO2系グレーズ抵抗材料はその性質上還元雰囲
気中で焼成された場合、 RuO2+H2→Ru+H2O の反応が容易に起り、抵抗体としての特性が得られな
い。However, when the RuO 2 -based glaze resistance material is fired in a reducing atmosphere due to its nature, the reaction of RuO 2 + H 2 → Ru + H 2 O easily occurs, and the characteristics as a resistor cannot be obtained.
一方、硼化物−ガラス系グレーズ抵抗材料は硼化物の性
質上、雰囲気が還元雰囲気、中性雰囲気を問わず化学変
化を受けることがない。したがって、硼化物−ガラス系
グレーズ抵抗体は還元雰囲気中や、中性雰囲気中でも焼
成が可能なものである。On the other hand, the boride-glass type glaze resistance material does not undergo a chemical change regardless of the reducing atmosphere or the neutral atmosphere due to the nature of boride. Therefore, the boride-glass type glaze resistor can be fired in a reducing atmosphere or a neutral atmosphere.
この硼化物を用いて抵抗体を形成する技術としては、ド
ナフゥー他著「ナイトロジェン ファイアブル レジス
ター」プロシィーディング オブ1987 ECC(Donahue e
t al「Nitrogen−Fireale Resistor」Proceeding of 19
87 Electronic Conponents Conference)に論じられて
いる。As a technique for forming a resistor using this boride, "Nitogen Fireable Register" Proceeding of 1987 ECC (Donahue e
t al "Nitrogen-Fireale Resistor" Proceeding of 19
87 Electronic Conponents Conference).
発明が解決しようとする問題点 しかしながら硼化物−ガラス系グレーズ抵抗材料におい
てもシート抵抗10kΩ/□以上を作ることは、抵抗温度
係数(TCR)が負の大きな値(−300ppm/℃以下)を示す
ため非常に困難であり、高抵抗、特に100kΩ/□以上を
形成する場合、酸化錫などの導体材料を用いているのが
現状である。そのため、10kΩ/□の抵抗体ペーストと1
00kΩ/□の抵抗体ペーストとのペースト・ブレンドが
不可能であり、また、硼化物−ガラス系の抵抗材料と酸
化錫−ガラス系の抵抗材料との同時焼成が、相互反応の
ため、困難であった。Problems to be Solved by the Invention However, even in the case of boride-glass-based glaze resistance material, making a sheet resistance of 10 kΩ / □ or more shows a large negative temperature coefficient of resistance (TCR) (-300 ppm / ° C or less). Therefore, it is very difficult, and in the case of forming a high resistance, particularly 100 kΩ / □ or more, a conductor material such as tin oxide is currently used. For this reason, 10kΩ / □ resistor paste and 1
Paste blending with a 00kΩ / □ resistor paste is not possible, and simultaneous firing of boride-glass based resistance material and tin oxide-glass based resistance material is difficult due to mutual reaction. there were.
また、抵抗体は回路部品であるから、耐サージ特性が良
くなければならないが、硼化物−ガラス系グレーズ抵抗
材料を構成する硼化物粉体が事前に合成し機械的粉砕を
行なって作成しているため、粒径1μm以下にすること
が難しく、形成したグレーズ抵抗体内部に不均一な電界
分布ができ、サージ電圧による抵抗値変化が著しかっ
た。Also, since the resistor is a circuit component, it must have good surge resistance, but the boride powder that constitutes the boride-glass-based glaze resistance material is synthesized beforehand and mechanically crushed to create it. Therefore, it was difficult to make the particle diameter 1 μm or less, and a nonuniform electric field distribution was formed inside the formed glaze resistor, and the resistance value change due to the surge voltage was remarkable.
本発明は上記問題点に鑑み、硼化物−ガラス系グレーズ
抵抗材料において、抵抗体ペースト中に硼化物を含むの
ではなく、非酸化性雰囲気中における焼成工程で、ホウ
ケイ酸ガラス中に含まれる前記酸化物と酸化ホウ素をシ
リコンや一酸化シリコンを用いて還元し、微小な硼化物
を得ることにより、グレーズ抵抗体形成が可能であり、
シート抵抗10kΩ/□以上で低TCR、ならびに、高範囲の
シート抵抗体が同時に焼成可能な、また、ブレンド可能
なペーストが作成できる。In view of the above problems, the present invention, in the boride-glass-based glaze resistance material, does not include the boride in the resistor paste, in the firing step in a non-oxidizing atmosphere, contained in the borosilicate glass It is possible to form glaze resistors by reducing oxides and boron oxides using silicon or silicon monoxide to obtain minute borides.
A sheet resistance of 10 kΩ / □ or more, low TCR, and a wide range of sheet resistors can be fired at the same time, and a blendable paste can be prepared.
さらには微小粒径を有する硼化物が形成できるので耐サ
ージ特性を向上できる。Furthermore, since a boride having a fine grain size can be formed, surge resistance can be improved.
問題点を解決するための手段 上記問題点を解決するために本発明の抵抗体の製造方法
では、非酸化性雰囲気中における焼成工程で、ホウケイ
酸ガラス中に含まれる前記酸化物と酸化ホウ素をシリコ
ンや一酸化シリコンを用いて還元し、微小な硼化物を得
ることにより、高性能なグレーズ抵抗体形成が可能であ
る。Means for Solving the Problems In order to solve the above problems, in the method for producing a resistor of the present invention, in the firing step in a non-oxidizing atmosphere, the oxide and boron oxide contained in the borosilicate glass are High-performance glaze resistors can be formed by reducing silicon and silicon monoxide to obtain minute boride.
作用 本発明は上記した製造方法に示したように、非酸化性雰
囲気中における焼成工程で、ホウケイ酸ガラス中に含ま
れる前記酸化物と酸化ホウ素をシリコンや一酸化シリコ
ンを用いて還元するため、一般的に硬質金属に属する硼
化物の粉体を機械的粉砕で得るのではなく、粉砕容易な
シリコンや一酸化シリコンを用い還元置換して得るた
め、微小な硼化物を得ることができ、シート抵抗10kΩ
/□以上で低TCR、ならびに、高範囲のシート抵抗体が
同時に焼成可能であり、また、ブレンド可能なペースト
が作成できる。Action The present invention, as shown in the above-described manufacturing method, in the firing step in a non-oxidizing atmosphere, in order to reduce the oxide and boron oxide contained in the borosilicate glass using silicon or silicon monoxide, Generally, powders of borides belonging to hard metals are not obtained by mechanical pulverization, but obtained by reducing and substituting silicon or silicon monoxide, which is easy to pulverize. Resistance 10kΩ
A sheet resistance of low TCR and a high range of / □ or more can be simultaneously fired, and a paste that can be blended can be prepared.
さらには微小粒径を有する硼化物が形成できるので耐サ
ージ特性を向上できる。Furthermore, since a boride having a fine grain size can be formed, surge resistance can be improved.
実施例 以下本発明の一実施例の抵抗組成物について、説明す
る。Example A resistance composition according to an example of the present invention will be described below.
〔実施例1〕 シリコン粉体は高純度シリコン粉体を粗粉砕したあと、
エタノール中でジルコニウムボールを用いて、平均粒径
約0.5μmになるまでボール・ミル粉砕した。[Example 1] Silicon powder was obtained by coarsely crushing high-purity silicon powder,
Zirconium balls were used for ball milling in ethanol until the average particle size was about 0.5 μm.
ガラスフリットはBaO(10〜23mo1%)、CaO(3〜
6)、MgO(7〜9)、B2O3(40〜55)、SiO2(6〜2
5)、Al2O3(7〜9)からなる酸化物、あるいはこれら
の炭酸塩と、硼化物を形成する前記酸化物が1〜10mo1
%になるように秤量して混合し、この混合粉体を1400℃
で溶解した後、溶解物を冷水中で急冷してガラス化し
て、ボール・ミル粉砕して得た。Glass frit is BaO (10-23mo1%), CaO (3-
6), MgO (7~9), B 2 O 3 (40~55), SiO 2 (6~2
5), an oxide of Al 2 O 3 (7 to 9), or a carbonate thereof and the oxide forming boride is 1 to 10 mol 1.
%, Mix and weigh this mixed powder at 1400 ℃
After being melted in (1), the melt was quenched in cold water to vitrify and ball-milled to obtain.
これら粉体を混合し、グレーズ抵抗粉末とした。このと
きのシリコン/(シリコン+ガラス)比は重量比で0.02
〜0.4であった。These powders were mixed to obtain a glaze resistance powder. The silicon / (silicon + glass) ratio at this time is 0.02 by weight.
It was ~ 0.4.
このグレーズ抵抗粉末を混練するビヒクルはテルピネオ
ール中にイソブーチルメタアクリレートが10%重量比に
なるよう秤量し、溶解して得た。このビヒクルとグレー
ズ抵抗粉末の比はグレーズ抵抗粉末1gあたり0.4ccであ
った。A vehicle for kneading the glaze-resistant powder was obtained by weighing and dissolving isobutyl methacrylate in terpineol so that the isobutyl methacrylate would be 10% by weight. The ratio of this vehicle to the glaze resistance powder was 0.4 cc per 1 g of the glaze resistance powder.
このグレーズ抵抗体ペーストを325メッシュのステンレ
ススクリーンを用いてCu電極を持つアルミナ基板上にス
クリーン印刷した。この後120℃で10分間乾燥してか
ら、雰囲気制御可能な厚膜焼成炉で焼成した。焼成炉の
条件は釣鐘状の温度プロファイルで920℃10分間保持の
トータル焼成時間60分であった。このときの雰囲気は窒
素雰囲気で行い、酸素温度は銅電極が酸化しない範囲の
10ppm以下でおこなった。This glaze resistor paste was screen-printed on an alumina substrate having a Cu electrode using a 325 mesh stainless screen. After that, it was dried at 120 ° C. for 10 minutes and then fired in a thick film firing furnace capable of controlling the atmosphere. The firing furnace conditions were a bell-shaped temperature profile and a total firing time of 60 minutes at 920 ° C for 10 minutes. The atmosphere at this time is a nitrogen atmosphere, and the oxygen temperature is within the range where the copper electrode is not oxidized.
It was performed at 10 ppm or less.
このようにしてえられたグレーズ抵抗体の抵抗諸特性を
第1表に示す。Table 1 shows various resistance characteristics of the glaze resistor thus obtained.
なお、抵抗温度係数(TCR)は常温(25℃)時の抵抗値
に対する125℃における抵抗値の変化量をppm/℃で表
す。短時間過負荷テストは125mW/mm2の電力に相当する
電圧の2.5倍を印加して、初期値に対する抵抗変化率で
評価し、耐湿テストは、温度60℃、相対湿度95%雰囲気
中に1000時間放置した後の初期値に対する抵抗変化率で
評価した。耐サージテストは2000pFのコンデンサに500V
の電圧を印加充電した後、これを抵抗体に放電し、抵抗
初期値に対する変化率で表した。また、この抵抗体の焼
成前後における抵抗体の断面模式図を第1図(a)
(b)に示す。 The temperature coefficient of resistance (TCR) represents the amount of change in the resistance value at 125 ° C relative to the resistance value at room temperature (25 ° C) in ppm / ° C. In the short-time overload test, 2.5 times the voltage corresponding to the power of 125 mW / mm 2 was applied, and the resistance change rate against the initial value was used for evaluation. Evaluation was made by the rate of change in resistance with respect to the initial value after standing for a time. Anti-surge test is 500V with 2000pF capacitor
After being charged by applying the voltage of, this was discharged into a resistor and expressed by the rate of change with respect to the initial value of resistance. In addition, FIG. 1 (a) is a schematic sectional view of the resistor before and after firing.
It shows in (b).
以上のように本〔実施例1〕によれば、非酸化性雰囲気
中における焼成工程で、ホウケイ酸ガラス中に含まれる
前記酸化物と酸化ホウ素とをシリコンを用い還元し、微
小な硼化物を得ることにより、シート抵抗10kΩ/□以
上で低TCR、耐サージ特性の優れた高性能なグレーズ抵
抗体形成が可能である。As described above, according to the present [Example 1], the oxide and boron oxide contained in the borosilicate glass are reduced by using silicon in a firing step in a non-oxidizing atmosphere to form a minute boride. By obtaining it, it is possible to form a high-performance glaze resistor with a sheet resistance of 10 kΩ / □ or more, low TCR, and excellent surge resistance.
つぎに、一酸化シリコンを用いた本発明の第2の実施例
を説明する。Next, a second embodiment of the present invention using silicon monoxide will be described.
〔実施例2〕 一酸化シリコン粉体は一酸化シリコン試薬を粗粉砕した
あと、エタノール中でジルコニウムボールを用いて、平
均粒径約0.5μmになるまでボール・ミル粉砕した。Example 2 A silicon monoxide powder was obtained by roughly crushing a silicon monoxide reagent and then ball-milling it in ethanol using zirconium balls until the average particle size became about 0.5 μm.
ガラスフリットは〔実施例1〕と同様にして得た。The glass frit was obtained in the same manner as in [Example 1].
これら粉体を混合し、グレーズ抵抗粉末とし、〔実施例
1〕と同様に混合・混練したグレーズ抵抗ペーストを得
た。These powders were mixed to form a glaze resistance powder, and a glaze resistance paste was obtained by mixing and kneading in the same manner as in [Example 1].
このグレーズ抵抗体ペーストを325メッシュのステンレ
ススクリーンを用いてCu電極を持つアルミナ基板上に
〔実施例1〕と同様にスクリーン印刷し、この後120℃
で10分間乾燥してから、〔実施例1〕と同様に雰囲気制
御可能な厚膜焼成炉で焼成した。This glaze resistor paste was screen-printed on an alumina substrate having Cu electrodes in the same manner as in [Example 1] using a 325 mesh stainless screen, and then 120 ° C.
After being dried for 10 minutes in the same manner, it was baked in a thick film baking furnace whose atmosphere can be controlled in the same manner as in [Example 1].
このようにしてえられたグレーズ抵抗体の抵抗諸特性を
第2表に示す。The resistance characteristics of the glaze resistor thus obtained are shown in Table 2.
以上のように、本〔実施例2〕においても、〔実施例
1〕と同様に、非酸化性雰囲気中における焼成工程で、
ホウケイ酸ガラス中に含まれる前記酸化物と酸化ホウ素
とをシリコンを用いて還元し、微小な硼化物を得ること
により、シート抵抗10kΩ/□以上で低TCR、耐サージ特
性の優れた高性能なグレーズ抵抗体形成が可能である。 As described above, also in the present [Example 2], similar to [Example 1], in the firing step in the non-oxidizing atmosphere,
By reducing the above oxides and boron oxides contained in borosilicate glass with silicon to obtain minute borides, a sheet resistance of 10 kΩ / □ or more, low TCR, and high performance with excellent surge resistance It is possible to form a glaze resistor.
本発明の効果を明らかにするために、以下に〔比較例〕
を示す。In order to clarify the effect of the present invention, the following [Comparative Example]
Indicates.
〔実施例1〕、〔実施例2〕で用いた硼化物をアルゴン
ガス中で合成し、この合成粉体をエタノール中でWCボー
ルを用いて平均粒径約0.5μmになるまでボール・ミル
粉砕して硼化物粉体を得た。The borides used in [Example 1] and [Example 2] were synthesized in an argon gas, and the synthetic powder was ball-milled in ethanol using WC balls until the average particle size became about 0.5 μm. A boride powder was obtained.
ガラスは、公知の非還元性ガラスを〔実施例1〕と同様
に溶解・粉砕して得た。The glass was obtained by melting and pulverizing a known non-reducing glass in the same manner as in [Example 1].
これら硼化物粉体とガラスとを混合したあと、〔実施例
1〕と同様にビヒクルと混練して抵抗体ペーストを得
た。After mixing these boride powders and glass, they were kneaded with a vehicle in the same manner as in [Example 1] to obtain a resistor paste.
この抵抗体ペーストを〔実施例1〕と同様に印刷・焼成
を行い、抵抗体を形成し評価した。This resistor paste was printed and fired in the same manner as in [Example 1] to form a resistor and evaluated.
このときの抵抗諸特性を第3表に示す。Various resistance characteristics at this time are shown in Table 3.
以上〔比較例〕に示すように、硼化物−ガラス系グレー
ズ抵抗材料を構成する硼化物粉体が事前に合成し機械的
粉砕を行なって作成しているため、粒径1μm以下にす
ることが難しく、たとえ〔比較例〕のように粉砕して硼
化物粉体を得たとしても、不純物の混入を防ぐことが困
難である。 As shown in the above [Comparative Example], since the boride powder constituting the boride-glass-based glaze resistance material is prepared in advance and mechanically pulverized, the particle size may be 1 μm or less. It is difficult, and even if the boride powder is obtained by crushing as in [Comparative Example], it is difficult to prevent impurities from entering.
そのため、形成したグレーズ抵抗体内部に不均一な電界
分布ができ、サージ電圧による抵抗値変化が著しい。Therefore, an uneven electric field distribution is formed inside the formed glaze resistor, and the resistance value changes significantly due to the surge voltage.
なお、実施例では窒素雰囲気中で焼成したが、非酸化性
雰囲気であれば良く、7%未満の水素を含む還元性雰囲
気中でも焼成可能である。In the examples, firing was performed in a nitrogen atmosphere, but it is sufficient if the firing is a non-oxidizing atmosphere, and firing is also possible in a reducing atmosphere containing less than 7% hydrogen.
また、実施例では0.5μmのシリコン粉体、一酸化シリ
コン粉体を用いたが、粒径としては平均粒径1μm以下
であれば、抵抗体の諸特性に影響を与えない微小な硼化
物が得られ、良好な結果が得られる。Further, in the examples, 0.5 μm silicon powder and silicon monoxide powder were used, but if the average particle size is 1 μm or less, a minute boride which does not affect the various characteristics of the resistor is generated. Good results are obtained.
実施例ではシリコン粉体、一酸化シリコン粉体を用いた
が、これらは還元剤として機能すればよく、一酸化シリ
コンの高次酸化状態前駆体、例えばSi2O3、Si3O5でも同
様の効果がえられる。また、これらシリコン粉体、一酸
化シリコン粉体、一酸化シリコンの高次酸化状態前駆体
を混合して用いることも可能である。Although silicon powder and silicon monoxide powder were used in the examples, these may be used as long as they function as a reducing agent, and the same applies to higher-order oxidation state precursors of silicon monoxide, such as Si 2 O 3 and Si 3 O 5. The effect of can be obtained. It is also possible to mix and use the silicon powder, the silicon monoxide powder, and the higher oxidation state precursor of silicon monoxide.
さらには、これらシリコン粉体、一酸化シリコン粉体、
一酸化シリコンの高次酸化状態前駆体は結晶化している
必要はなく、アモルファス状態によっても同様の効果が
得られる。Furthermore, these silicon powder, silicon monoxide powder,
The higher oxidation state precursor of silicon monoxide does not need to be crystallized, and the same effect can be obtained even in the amorphous state.
なお、実施例において、有機ポリマーとしてイソ−ブチ
ルメタアクリートを用いたが、低温で解重合をおこし昇
華飛散するものであれば何でもよく、例えば、ポリテト
ラフルオロエチレンや、ポリ−α−メチルスチレン、ポ
リ−メチルメタアクリレートを単体、混合、あるいは共
重合して用いてもよい。In the examples, iso-butyl metaacrylate was used as the organic polymer, but any substance capable of depolymerizing and subliming and scattering at low temperature may be used, for example, polytetrafluoroethylene or poly-α-methylstyrene, Poly-methyl methacrylate may be used as a simple substance, a mixture, or a copolymer.
発明の効果 以上のように本発明は硼化物−ガラス系グレーズ抵抗材
料において、抵抗体ペーストに硼化物を含むのではな
く、非酸化性雰囲気中における焼成工程で、ホウケイ酸
ガラス中に含まれる前記酸化物と酸化ホウ素をシリコン
や一酸化シリコンを用いて還元し、微小な硼化物を得る
ことにより、グレーズ抵抗体形成が可能であり、シート
抵抗10kΩ/□以上で低TCR、ならびに、高範囲のシート
抵抗体が同時に焼成可能な、また、ブレンド可能なペー
ストが作成できる。EFFECTS OF THE INVENTION As described above, the present invention, in the boride-glass-based glaze resistance material, does not include boride in the resistor paste, but is included in the borosilicate glass in the firing step in a non-oxidizing atmosphere. A glaze resistor can be formed by reducing oxides and boron oxide with silicon or silicon monoxide to obtain minute borides, with sheet resistance of 10 kΩ / □ or higher, low TCR, and high range. A sheet resistor can be fired at the same time, and a blendable paste can be prepared.
さらには微小粒径を有する硼化物が形成できるので耐サ
ージ特性を向上できる効果が得られる。Furthermore, since a boride having a fine grain size can be formed, an effect of improving surge resistance can be obtained.
さらには粉砕工程を必要な粉体がシリコン、一酸化シリ
コン等の脆性材料であるため、粉砕工程における不純物
の混入を最小限に抑えることができるという効果が生じ
る。Furthermore, since the powder that needs the crushing step is a brittle material such as silicon or silicon monoxide, it is possible to minimize the mixing of impurities in the crushing step.
第1図は本発明の一実施例における抵抗体の(a)焼成
前、(b)焼成後の断面模式図である。 1……基板、2……ガラス粒子、3……シリコン粒子、
4……硼化物粒子。FIG. 1 is a schematic sectional view of a resistor according to an embodiment of the present invention, before (a) firing and (b) firing. 1 ... Substrate, 2 ... Glass particles, 3 ... Silicon particles,
4 ... boride particles.
Claims (5)
ンの高次酸化状態前駆体により還元性である酸化物を少
なくとも一種含有するガラスと、シリコン、一酸化シリ
コン、一酸化シリコンの高次酸化状態前駆体の内少なく
とも一種と、熱分解性ポリマーを含むビヒクルとを混練
して抵抗ペーストを形成する工程、前記抵抗ペーストを
無機材料上に塗布する工程、前記塗布された抵抗ペース
トを乾燥する工程、前記塗布された抵抗ペーストを非酸
化性雰囲気中で焼成する工程からなる抵抗体の製造方
法。1. A glass containing at least one oxide which is reducible by a precursor of silicon, silicon monoxide, or a higher oxidation state of silicon monoxide, and a higher oxidation state of silicon, silicon monoxide, or silicon monoxide. At least one of the precursors, a step of kneading a vehicle containing a thermally decomposable polymer to form a resistance paste, a step of applying the resistance paste onto an inorganic material, a step of drying the applied resistance paste, A method of manufacturing a resistor, comprising the step of firing the applied resistance paste in a non-oxidizing atmosphere.
ンの高次酸化状態前駆体により還元性である酸化物が、
酸化ジルコン、酸化バナジウム、酸化タンタル、酸化ニ
オブ、酸化クロム、酸化タングステン、酸化モリブデ
ン、酸化マンガン、酸化ランタン、酸化チタンの内少な
くとも一種から構成され、前記酸化物を含有するガラス
が、ホウケイ酸ガラスから構成されることを特徴とする
特許請求の範囲第(1)項記載の抵抗体の製造方法。2. An oxide which is reducible by a higher oxidation state precursor of silicon, silicon monoxide or silicon monoxide,
Zircon oxide, vanadium oxide, tantalum oxide, niobium oxide, chromium oxide, tungsten oxide, molybdenum oxide, manganese oxide, lanthanum oxide, composed of at least one of titanium oxide, the glass containing the oxide, from borosilicate glass The method for producing a resistor according to claim (1), characterized in that the method is constructed.
ウケイ酸ガラス中に含まれるシリコン、一酸化シリコ
ン、一酸化シリコンの高次酸化状態前駆体により還元性
である前記酸化物と酸化ホウ素とをシリコン、一酸化シ
リコンまたは一酸化シリコンの高次酸化状態前駆体で還
元し、前記酸化物を構成する金属とホウ素とで硼化物を
形成することを特徴とする特許請求の範囲第(1)項記
載の抵抗体の製造方法。3. An oxide and boron oxide which are reducible by silicon, silicon monoxide, and a higher oxidation state precursor of silicon monoxide contained in borosilicate glass during a firing step in a non-oxidizing atmosphere. And reducing the metal with silicon, silicon monoxide or a higher oxidation state precursor of silicon monoxide to form a boride with the metal forming the oxide and boron. A method for manufacturing a resistor according to the item.
ける酸化濃度が10ppm以下であることを特徴とする特許
請求の範囲第(1)項記載の抵抗体の製造方法。4. The method for producing a resistor according to claim 1, wherein the oxidation concentration in the high temperature holding portion in the non-oxidizing atmosphere firing step is 10 ppm or less.
度が850〜975℃であることを特徴とする特許請求の範囲
第(1)項記載の抵抗体の製造方法。5. The method for producing a resistor according to claim 1, wherein the temperature of the high temperature holding portion in the non-oxidizing atmosphere firing step is 850 to 975 ° C.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62262066A JPH0766884B2 (en) | 1987-10-16 | 1987-10-16 | Resistor manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62262066A JPH0766884B2 (en) | 1987-10-16 | 1987-10-16 | Resistor manufacturing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01103804A JPH01103804A (en) | 1989-04-20 |
| JPH0766884B2 true JPH0766884B2 (en) | 1995-07-19 |
Family
ID=17370555
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62262066A Expired - Lifetime JPH0766884B2 (en) | 1987-10-16 | 1987-10-16 | Resistor manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0766884B2 (en) |
-
1987
- 1987-10-16 JP JP62262066A patent/JPH0766884B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01103804A (en) | 1989-04-20 |
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