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JPH0744084B2 - Electrode structure of electronic parts - Google Patents
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JPH0744084B2 - Electrode structure of electronic parts - Google Patents

Electrode structure of electronic parts

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Publication number
JPH0744084B2
JPH0744084B2 JP2270587A JP27058790A JPH0744084B2 JP H0744084 B2 JPH0744084 B2 JP H0744084B2 JP 2270587 A JP2270587 A JP 2270587A JP 27058790 A JP27058790 A JP 27058790A JP H0744084 B2 JPH0744084 B2 JP H0744084B2
Authority
JP
Japan
Prior art keywords
metal
electrode
thin film
electrode structure
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2270587A
Other languages
Japanese (ja)
Other versions
JPH04147601A (en
Inventor
立樹 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kamaya Electric Co Ltd
Mitsubishi Materials Corp
Original Assignee
Kamaya Electric Co Ltd
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kamaya Electric Co Ltd, Mitsubishi Materials Corp filed Critical Kamaya Electric Co Ltd
Priority to JP2270587A priority Critical patent/JPH0744084B2/en
Publication of JPH04147601A publication Critical patent/JPH04147601A/en
Publication of JPH0744084B2 publication Critical patent/JPH0744084B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Details Of Resistors (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Description

【発明の詳細な説明】 <産業上の利用分野> 本発明は、金属有機物ペーストを用いて形成したベース
電極や回路パターンとしての導電性薄膜をベースにした
電子部品の電極構造に関するものである。
Description: TECHNICAL FIELD The present invention relates to an electrode structure of an electronic component based on a base electrode formed using a metal organic paste or a conductive thin film as a circuit pattern.

<従来の技術> 近年、電子部品の小型化、高密度化、低コスト化の要求
が需要者側から益々強くなっている。この要求に応ずる
べく、低コストでしかも電気的信頼性の高いAu、Au/Pt
等の金属有機物ペーストを用いて電子部品の電極部を形
成する技術が本発明者によって既に提案されている(特
願平1−197936,特願平2−117446)。
<Prior Art> In recent years, demands for miniaturization, high density, and low cost of electronic components have been increasing more and more from consumers. To meet this requirement, Au and Au / Pt are low cost and have high electrical reliability.
The present inventors have already proposed a technique for forming an electrode part of an electronic component using such a metal organic paste (Japanese Patent Application No. 1-197936, Japanese Patent Application No. 2-117446).

この電極部には、チップ抵抗器のベース電極部や、或は
ハイブリッドICや抵抗ネットワークを構成する場合、隣
接する回路を互いに接続するための取出し電極部等が上
げられる。これら各電極部の他の導体部と接続する場合
には、 (1)前記金属有機物ペーストを用いて形成した電極部
に、同じ材料による金属有機物ペーストによって導体部
を形成し、前記電極部と導体部とを直接接合する構造。
A base electrode portion of a chip resistor, or a lead-out electrode portion for connecting adjacent circuits to each other when a hybrid IC or a resistance network is formed is raised to this electrode portion. When connecting to other conductors of each of these electrode parts, (1) a conductor part is formed of a metal organic paste of the same material on the electrode part formed of the metal organic paste, and the electrode part and the conductor are formed. Structure that directly joins the parts.

(2)金属有機物ペーストを用いて形成した電極部をAg
/Pdなどの厚膜導体ペーストで覆った後、600℃〜850℃
の高温で焼成して厚膜導体を形成し、この厚膜導体と前
記抵抗器とを接合する構造。
(2) Ag of the electrode part formed using the metal organic paste
After covering with a thick film conductor paste such as / Pd, 600 ℃ -850 ℃
Of high temperature to form a thick film conductor, and the thick film conductor and the resistor are joined together.

等がある。Etc.

<発明が解決しようとする課題> しかし、従来のように前記電極部と導体部とを接合し、
Sn/Pb/Ag系のハンダ槽(250℃)に約10秒間浸漬した場
合、前記(1)の電極構造では、金属有機物ペーストを
焼成し形成した導電性薄膜にハンダが濡れず、しかもハ
ンダくわれを生じて前記導電性薄膜が前記槽中のハンダ
に溶解してしまう。また、前記(2)の電極構造では、
前記厚膜導体上にハンダが濡れるものの、95%以上のハ
ンダ濡れ性を確保できないという問題点があった。
<Problems to be Solved by the Invention> However, as in the conventional case, the electrode portion and the conductor portion are joined,
When immersed in a Sn / Pb / Ag solder bath (250 ° C) for about 10 seconds, in the electrode structure of (1) above, the conductive thin film formed by firing the metal organic paste does not get wet and the solder does not Cracks occur and the conductive thin film dissolves in the solder in the bath. Further, in the electrode structure of (2) above,
Although the solder is wet on the thick film conductor, there is a problem that the solder wettability of 95% or more cannot be secured.

また、電極部を保護するためにその上からNiメッキ膜を
形成し、250℃〜350℃の熱処理を施こすことも考えられ
ているが、Niは耐熱性に弱いために、歪みによる電極部
との接合性が悪いだけでなく、電極部とNiが拡散して電
気特性が悪くなるといった欠点があった。
It is also considered to form a Ni plating film on the electrode part to protect the electrode part and subject it to heat treatment at 250 ° C to 350 ° C. However, Ni is weak in heat resistance, so the electrode part due to strain is Not only is the bondability between the electrode and Ni poor, but there is also the drawback that the electrical properties deteriorate due to the diffusion of Ni from the electrode.

本発明は上記欠点を解決すべくなされたものであり、そ
の目的は金属有機物ペーストを用いて形成した電極が、
回路パターン等を形成する導体部との接合性を良くする
ように、ハンダ濡れ性が良好で、導電性や機械的強度に
優れ、しかも前記金属有機ペーストの電気特性を確保す
る電子部品の電極構造を提供することにある。
The present invention has been made to solve the above drawbacks, and its object is to form an electrode using a metal organic paste.
Electrode structure of electronic parts that has good solder wettability, excellent electrical conductivity and mechanical strength, and ensures the electrical characteristics of the metal organic paste so as to improve the bondability with the conductor portion forming the circuit pattern, etc. To provide.

<課題を解決するための手段> 本発明は、上記目的に鑑みてなされたものであり、その
要旨は、金属有機物ペーストを用いた電子部品の電極構
造であって、前記金属有機物ペーストを焼成し、前記電
子部品の絶縁基板上に形成するベース電極や回路パター
ンとしての導電性薄膜と、該導電性薄膜上に形成し、Cr
又はTiのいずれか或はこれらを組み合わせた合金よりな
る第1の金属膜と、Cu又はCuを主成分とする合金よりな
り、前記電極構造の最上層に形成する第2の金属膜とを
有し、前記第1及び第2の金属膜を100℃未満の低温に
よるスパッタ法又は蒸着法で形成したものであることを
特徴とする電子部品の電極構造にある。
<Means for Solving the Problems> The present invention has been made in view of the above objects, and the gist thereof is an electrode structure of an electronic component using a metal organic paste, which comprises firing the metal organic paste. , A conductive thin film as a base electrode or a circuit pattern formed on the insulating substrate of the electronic component, and Cr formed on the conductive thin film.
Or a first metal film made of any one of Ti or an alloy in which Ti is combined, and a second metal film made of Cu or an alloy containing Cu as a main component and formed on the uppermost layer of the electrode structure. The electrode structure of the electronic component is characterized in that the first and second metal films are formed by a sputtering method or a vapor deposition method at a low temperature of less than 100 ° C.

ここで前記金属有機物ペーストとしては、Au,Pt又はPd
のいずれか或はこれらを組み合わせた合金の有機化合物
をペースト状にしたものが好ましい。
Here, as the metal organic paste, Au, Pt or Pd
It is preferable that the organic compound of any one of the above or a combination thereof is made into a paste.

<作用> 前記第1の金属膜を形成するCr又はTiのいずれか或はこ
れらを組み合わせた合金は、熱に対しても剛性が高く、
しかも前記導電性薄膜やその下の絶縁基板との密着性及
び機械的強度に優れている。また、前記第2の金属膜を
形成するCu又はCuを主成分とする合金は、導電性はもと
よりハンダ濡れ性にも優れる材質である。従って、これ
ら第1、第2の金属膜は、前記金属有機物ペーストを焼
成し形成した導電性薄膜を保護し、機械的強度やハンダ
濡れ性などを高めるように作用する。
<Operation> One of Cr and Ti forming the first metal film or an alloy in which these are combined has high rigidity against heat,
Moreover, it has excellent adhesion and mechanical strength to the conductive thin film and the insulating substrate thereunder. Further, Cu or an alloy containing Cu as a main component for forming the second metal film is a material excellent in solder wettability as well as conductivity. Therefore, the first and second metal films act to protect the conductive thin film formed by firing the metal organic paste and enhance the mechanical strength and solder wettability.

また、前記第1、第2の金属膜を、100℃未満の低温で
形成することにより、最下層の他金属と拡散し易い前記
導電性薄膜との間において、相互の反応拡散はほとんど
生じないように作用する。
Further, by forming the first and second metal films at a low temperature of less than 100 ° C., mutual reaction diffusion hardly occurs between the other metal in the lowermost layer and the conductive thin film which is easily diffused. Acts like.

<実施例> 本発明に係る電子部品の電極構造のうち、ハイブリッド
ICや抵抗ネットワークを構成する際の取出し電極の電極
構造Aについて、第1図に基づいて工程順に説明する。
<Example> Of the electrode structures of the electronic component according to the present invention, a hybrid
The electrode structure A of the extraction electrode when forming an IC or a resistance network will be described in the order of steps based on FIG.

まず、アルミナセラミックス製の絶縁基板10上に、回路
パターンを構成する導電性薄膜12を形成する。この導電
性薄膜12は、金属有機物として金を含有した金レジネー
トペーストをスクリーン印刷法或はフォト・エッチング
法によりパターン化し、850℃程度の高温で焼成し形成
する。
First, a conductive thin film 12 forming a circuit pattern is formed on an insulating substrate 10 made of alumina ceramics. The conductive thin film 12 is formed by patterning a gold resinate paste containing gold as a metal organic substance by a screen printing method or a photo-etching method and baking it at a high temperature of about 850 ° C.

次に導電性薄膜12に、両端部が重なるように所定位置に
厚膜素子としての抵抗体13を形成する。この抵抗体13
は、RuO2系、Pb2Ru2O6.5系等の抵抗ペーストをスクリー
ン印刷法によりパターン印刷し、850℃程度で焼成す
る。さらに、このように形成した抵抗体13の上を覆うよ
うに、ガラスコート14を施して厚膜素子を保護する。
Next, a resistor 13 as a thick film element is formed on the conductive thin film 12 at a predetermined position so that both ends thereof overlap. This resistor 13
The pattern is printed by a resistance printing paste such as RuO 2 series or Pb 2 Ru 2 O 6.5 series by a screen printing method and baked at about 850 ° C. Further, a glass coat 14 is applied so as to cover the resistor 13 thus formed to protect the thick film element.

また、導電性薄膜12の上に、両端部が重なるように薄膜
素子としての薄膜抵抗15を形成する。この薄膜抵抗15
は、蒸着法やスパッタ法等の従来の薄膜作成方法により
形成し、フォトエッチング法等によりパターン化して形
成する。
Further, a thin film resistor 15 as a thin film element is formed on the conductive thin film 12 so that both ends thereof overlap. This thin film resistor 15
Is formed by a conventional thin film forming method such as a vapor deposition method or a sputtering method, and patterned by a photo etching method or the like.

次に、抵抗ネットワーク等を構成する際に、隣接する回
路を互いに接続するための取出し電極を形成する。取出
し電極の形成に当っては、まず、導電性薄膜12の所定箇
所に、該導電性薄膜12及び絶縁基板10との密着性に優
れ、かつ耐熱性及び機械的強度にも優れるCrによる第1
の金属膜16をスパッタ法或は蒸着法によって形成する。
なお、形成時の温度は95℃程度である。さらに、この第
1の金属膜16をエッチング法或はリフト・オフ法により
パターン化する。ついで、パターン化した第1の金属膜
16、そしてその上にハンダ濡れ性に優れるCuによる第2
の金属膜17をスパッタ法或は蒸着法等によって形成す
る。この形成時の温度は、95℃程度である。そして、エ
ッチング法或はリフト・オフ法によりパターン化する。
Next, when forming a resistance network or the like, extraction electrodes for connecting adjacent circuits to each other are formed. In the formation of the extraction electrode, firstly, at a predetermined position of the conductive thin film 12, the first adhesive made of Cr, which has excellent adhesion to the conductive thin film 12 and the insulating substrate 10, and also has excellent heat resistance and mechanical strength.
The metal film 16 is formed by a sputtering method or a vapor deposition method.
The temperature during formation is about 95 ° C. Further, the first metal film 16 is patterned by an etching method or a lift-off method. Then, the patterned first metal film
16, and secondly made of Cu, which has excellent solder wettability
The metal film 17 is formed by a sputtering method or a vapor deposition method. The temperature during this formation is about 95 ° C. Then, patterning is performed by an etching method or a lift-off method.

なお、前記第1の金属膜16は、Crの他にTi或はCrとTiを
組み合せた合金によって形成することができ、また、前
記第2の金属膜17は、Cuの他に又はCuを主成分とする合
金によって形成することもできる。
The first metal film 16 may be formed of Ti or an alloy of a combination of Cr and Ti in addition to Cr, and the second metal film 17 may be formed of Cu or Cu in addition to Cu. It can also be formed of an alloy containing the main component.

また、本発明に係る電子部品の電極構造のうち、チップ
抵抗器におけるベース電極の電極構造Bについて、第2
図を基に工程順に説明する。
Further, in the electrode structure of the electronic component according to the present invention, the electrode structure B of the base electrode in the chip resistor is
The steps will be described with reference to the drawings.

なず、絶縁基板としてのセラミックス製のチップ基板20
上の両端部に、周知のフォト・エッチング法或はスクリ
ーン印刷法等により金属有機物材料として金を含有した
金レジネートペーストをパターン印刷し、850℃程度の
高温で焼成して一対のベース電極21を形成する。次に、
前記一対のベース電極21に、両端部が重なるようにRu系
ペーストをスクリーン印刷法により印刷し、850℃程度
で焼成して抵抗膜22を形成する。
Nazu, a ceramic chip substrate 20 as an insulating substrate
A pattern of gold resinate paste containing gold as a metal organic material is pattern-printed on both upper ends by a well-known photo-etching method or a screen printing method, and the pair of base electrodes 21 is fired at a high temperature of about 850 ° C. Form. next,
A Ru-based paste is printed on the pair of base electrodes 21 by a screen printing method so that both ends thereof overlap with each other, and is baked at about 850 ° C. to form the resistance film 22.

次に、ベース電極21上に、該ベース電極21及びチップ基
板20との密着性に優れ、かつ耐熱性及び機械的強度にも
優れるCrによる第1の金属膜24を蒸着法によって形成す
る。この形成時の温度は、95℃程度である。このよう
に、ベース電極21を第1の金属膜24で被覆することによ
り、トリミングを行う際の測定用プローブとベース電極
21との電気的コンタクトが改善されると共に、金を含有
するベース電極21の摩耗性が弱いという欠点を補うこと
ができる。
Next, on the base electrode 21, a first metal film 24 made of Cr, which is excellent in adhesion to the base electrode 21 and the chip substrate 20, and is also excellent in heat resistance and mechanical strength, is formed by a vapor deposition method. The temperature during this formation is about 95 ° C. Thus, by covering the base electrode 21 with the first metal film 24, the measurement probe and the base electrode for trimming
The electrical contact with 21 can be improved, and the disadvantage that the base electrode 21 containing gold is weakly worn can be compensated.

さらに、周知の方法でトリミングを行い所望の抵抗値に
調節し、この後に行うメッキ処理時における抵抗膜22の
保護及び種々の使用環境に耐え得るためのオーバーコー
ト膜23を公知の方法で形成する。
Further, trimming is performed by a well-known method to adjust to a desired resistance value, and the overcoat film 23 for protecting the resistance film 22 at the time of plating treatment performed thereafter and for withstanding various use environments is formed by a well-known method. .

次に、チップ基板20の両端面に端面電極26及び裏面電極
27を形成した後、前記第1の金属膜24及び各電極26、27
の上に、ハンダ濡れ性に優れるCu合金による第2の金属
膜25を電気メッキ法、無電解メッキ法或は蒸着法等によ
って形成する。この形成時の温度は、電気メッキ法では
20℃〜60℃程度、無電解メッキ法では、60℃〜95℃程
度、蒸着法では90℃〜95℃程度である。
Next, the end surface electrodes 26 and the back surface electrodes are formed on both end surfaces of the chip substrate 20.
After forming 27, the first metal film 24 and the electrodes 26, 27
A second metal film 25 made of a Cu alloy having excellent solder wettability is formed thereon by electroplating, electroless plating, vapor deposition or the like. The temperature during this formation is the same as in electroplating.
The temperature is about 20 to 60 ° C, the electroless plating method is about 60 to 95 ° C, and the vapor deposition method is about 90 to 95 ° C.

なお、前記第1の金属膜24は、前記第1の金属膜16は、
Cr又はTi或はこれらの合金によって形成することがで
き、また、前記第2の金属膜25は、Cu又はCuを主成分と
する合金によって形成することができる。
The first metal film 24, the first metal film 16,
The second metal film 25 may be formed of Cr or Ti or an alloy thereof, and the second metal film 25 may be formed of Cu or an alloy containing Cu as a main component.

また、本実施例では、第1の金属膜と第2の金属膜とを
連続して積層させたが、この第1の金属膜と第第2の金
属膜との間に、他の金属膜を介在させても、本発明と同
様な作用効果を発揮するものである。
Further, in the present embodiment, the first metal film and the second metal film are continuously laminated, but another metal film is interposed between the first metal film and the second metal film. Even with the inclusion of the above, the same operational effect as the present invention is exhibited.

<効果> 本発明に係る電子部品の電極構造によれば、前記導電性
薄膜の上に形成するCr又はTiのいずれか或はこれらを組
み合わせた合金による第1の金属膜は、前記導電性薄膜
やその下の絶縁基板との密着性・耐熱性、及び機械的強
度に優れており、また、Cu又はCuを主成分とする合金に
よる前記第2の金属膜は、導電性はもちろんハンダ濡れ
性に優れた材質である。従って、これら第1、第2の金
属膜は、前記金属有機物ペーストを焼成し形成した導電
性薄膜を保護し、耐熱性や機械的強度、及びハンダ濡れ
性などを高めることができる。また、前記第1、及び第
2の金属膜は、100℃未満の低温によるスパッタ法又は
蒸着法で形成しているのでCr、Ti、Cuなどが熱によって
歪みが生ぜず、そのために最下層の前記導電性薄膜との
間に密着性が保たれて接着性が優れるために相互の反応
拡散はほとんど生じないため、所望の電気的特性を確実
に得ることができ、電気的信頼性の高い電子部品の電極
構造を提供することができる。
<Effect> According to the electrode structure of the electronic component of the present invention, the first metal film formed of either Cr or Ti or an alloy of a combination thereof formed on the conductive thin film is the conductive thin film. The second metal film made of Cu or an alloy containing Cu as a main component has excellent conductivity and solder wettability. Excellent material. Therefore, the first and second metal films can protect the conductive thin film formed by firing the metal organic paste, and can improve heat resistance, mechanical strength, solder wettability, and the like. In addition, since the first and second metal films are formed by a sputtering method or a vapor deposition method at a low temperature of less than 100 ° C., Cr, Ti, Cu, etc. are not distorted by heat, and therefore the lowermost layer is formed. Since the adhesiveness between the conductive thin film and the conductive thin film is excellent and mutual reaction diffusion hardly occurs, desired electrical characteristics can be surely obtained, and an electron having high electrical reliability can be obtained. An electrode structure for the component can be provided.

【図面の簡単な説明】[Brief description of drawings]

第1図は、本発明に係る電極構造を取出し電極に適用し
た例を示す回路基板の断面図、第2図は、本発明に係る
電極構造をチップ抵抗器のベース電極に適用した例を示
すチップ抵抗器の断面図である。 A……取出し電極の電極構造、10……絶縁基板、12……
導電性薄膜、16……第1の金属膜、17……第2の金属
膜、B……ベース電極の電極構造、20……チップ基板
(絶縁基板)、21……ベース電極(導電性薄膜)、24…
…第1の金属膜、25……第2の金属膜。
FIG. 1 is a sectional view of a circuit board showing an example in which the electrode structure according to the present invention is applied to an extraction electrode, and FIG. 2 shows an example in which the electrode structure according to the present invention is applied to a base electrode of a chip resistor. It is sectional drawing of a chip resistor. A: Electrode structure of extraction electrode, 10 ... Insulating substrate, 12 ...
Conductive thin film, 16 ... First metal film, 17 ... Second metal film, B ... Electrode structure of base electrode, 20 ... Chip substrate (insulating substrate), 21 ... Base electrode (conductive thin film) ),twenty four…
… First metal film, 25 …… Second metal film.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】金属有機物ペーストを用いた電子部品の電
極構造であって、 前記金属有機物ペーストを焼成し、前記電子部品の絶縁
基板上に形成するベース電極や回路パターンとしての導
電性薄膜と、 該導電性薄膜上に形成し、Cr,Tiのいずれか或はこれら
を組み合わせた合金よりなる第1の金属膜と、Cu又はCu
を主成分とする合金よりなり、前記電極構造の最上層に
形成する第2の金属膜とを有し、前記第1及び第2の金
属膜を100℃未満の低温によるスパッタ法又は蒸着法で
形成したものであることを特徴とする電子部品の電極構
造。
1. An electrode structure of an electronic component using a metal organic paste, comprising: a base electrode formed on an insulating substrate of the electronic component by firing the metal organic paste; and a conductive thin film as a circuit pattern, A first metal film formed on the conductive thin film, which is made of an alloy of Cr or Ti or a combination thereof, and Cu or Cu
And a second metal film formed on the uppermost layer of the electrode structure, the first and second metal films being formed by a sputtering method or an evaporation method at a low temperature of less than 100 ° C. An electrode structure for an electronic component, which is formed.
JP2270587A 1990-10-11 1990-10-11 Electrode structure of electronic parts Expired - Lifetime JPH0744084B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2270587A JPH0744084B2 (en) 1990-10-11 1990-10-11 Electrode structure of electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2270587A JPH0744084B2 (en) 1990-10-11 1990-10-11 Electrode structure of electronic parts

Publications (2)

Publication Number Publication Date
JPH04147601A JPH04147601A (en) 1992-05-21
JPH0744084B2 true JPH0744084B2 (en) 1995-05-15

Family

ID=17488200

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2270587A Expired - Lifetime JPH0744084B2 (en) 1990-10-11 1990-10-11 Electrode structure of electronic parts

Country Status (1)

Country Link
JP (1) JPH0744084B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180093461A (en) 2017-02-13 2018-08-22 삼성전기주식회사 Resistor element, manufacturing method of the same and resistor element assembly

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0217603A (en) * 1988-07-06 1990-01-22 Matsushita Electric Ind Co Ltd Chip component and manufacture thereof

Also Published As

Publication number Publication date
JPH04147601A (en) 1992-05-21

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