JPH0772117B2 - Liquid phase epitaxial growth method and apparatus - Google Patents
Liquid phase epitaxial growth method and apparatusInfo
- Publication number
- JPH0772117B2 JPH0772117B2 JP62273999A JP27399987A JPH0772117B2 JP H0772117 B2 JPH0772117 B2 JP H0772117B2 JP 62273999 A JP62273999 A JP 62273999A JP 27399987 A JP27399987 A JP 27399987A JP H0772117 B2 JPH0772117 B2 JP H0772117B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- solution
- solution tank
- growth
- liquid phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000012010 growth Effects 0.000 title claims description 49
- 238000000034 method Methods 0.000 title claims description 18
- 239000007791 liquid phase Substances 0.000 title claims description 15
- 239000000758 substrate Substances 0.000 claims description 54
- 238000010583 slow cooling Methods 0.000 claims description 5
- 230000004308 accommodation Effects 0.000 claims 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 15
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 15
- 238000010586 diagram Methods 0.000 description 6
- 239000013078 crystal Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 229920006334 epoxy coating Polymers 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、高出力発光ダイオードの製造に適したひ化ガ
リウム、ひ化ガリウムアルミニウム等の混晶エピタキシ
ャル・ウエハーの成長における液相エピタキシャル成長
方法及び装置に関する。The present invention relates to a liquid phase epitaxial growth method for growing a mixed crystal epitaxial wafer of gallium arsenide, gallium aluminum arsenide, etc., which is suitable for manufacturing a high-power light emitting diode. Regarding the device.
GaAlAsを用いた高出力発光ダイオードにおいてはその結
晶成長に於いて、基板としてGaAsが用いられる。ここ
で、従来の液相エピタキシャル成長方法について、GaAs
成長を例にとって説明する。In a high-power light emitting diode using GaAlAs, GaAs is used as a substrate for crystal growth. Here, regarding the conventional liquid phase epitaxial growth method,
Take growth as an example.
第5図はスライドボート法による従来の液相エピタキシ
ャル成長装置を示す図で、1は原料溶液溜め、2はカバ
ー、3はスライダー、4はGaAs基板、5は熱電対であ
る。FIG. 5 is a view showing a conventional liquid phase epitaxial growth apparatus by the slide boat method, in which 1 is a raw material solution reservoir, 2 is a cover, 3 is a slider, 4 is a GaAs substrate, and 5 is a thermocouple.
ボートはスライダーが図のx方向にスライドするように
なっており、ボートの上側にはGa溶液を入れる溶液溜め
1が設けられ、溶液溜めには底がなく、溶液はスライダ
ーの表面に接している。スライダーには、基板のCaAsウ
エハを入れるくぼみが設けられている。溶液溜め1は、
成長させる半導体結晶薄膜の種類だけ作って多層構造を
連続して成長させることができるようになっている。The boat has a slider that slides in the x direction in the figure, and a solution reservoir 1 for containing a Ga solution is provided on the upper side of the boat, the solution reservoir has no bottom, and the solution is in contact with the surface of the slider. . The slider is provided with a recess for receiving the substrate's CaAs wafer. Solution reservoir 1
It has become possible to continuously grow a multi-layer structure by making only the kinds of semiconductor crystal thin films to be grown.
このような構成において、スライダー3を図のx方向に
スライドさせることにより、GaAsを含むGa溶液をGaAs基
板4上に置いて溶液を冷却すると、基板上にはGaAsが析
出されて成長する。In such a configuration, by sliding the slider 3 in the x direction in the figure, a Ga solution containing GaAs is placed on the GaAs substrate 4 and the solution is cooled, whereby GaAs is deposited and grows on the substrate.
ところで、LEDの作業においては、基板をラッピング等
で削り、全厚を200〜250μmに調整しているが、第5図
に示したような従来の除冷法による液相エピタキシャル
成長法つまり、成長溶液に対し基板を下部に置く方法で
は、P/N接合を形成するエピタキシャル層が50〜100μm
程度と薄く、そのため、全厚を200〜250μmに調整しよ
うとすると、GaAs基板を残存させなければならない。し
かしながら、GaAsの禁制帯幅はGaAlAsのそれより小さい
ため、GaAlAs層から発光された光は残存したGaAs基板層
で吸収され、外部発光効率が下がってしまっていた。By the way, in LED work, the substrate is ground by lapping or the like to adjust the total thickness to 200 to 250 μm. However, the liquid phase epitaxial growth method by the conventional cooling method as shown in FIG. On the other hand, in the method of placing the substrate on the lower side, the epitaxial layer forming the P / N junction is 50 to 100 μm.
It is so thin that the GaAs substrate must be left when trying to adjust the total thickness to 200 to 250 μm. However, since the forbidden band width of GaAs is smaller than that of GaAlAs, the light emitted from the GaAlAs layer is absorbed by the remaining GaAs substrate layer, and the external light emission efficiency is reduced.
外部発光効率の低下を防止するために、GaAs基板をラッ
ピングで完全に除去すると、従来技術ではエピタキシャ
ル層の全厚が50〜100μmと薄いため機械的強度が不足
し、チップ化工程の歩留りが非常に低下してしまってい
た。また、複数回のエピタキシャル成長を行うことによ
り200μm前後のエピタキシャル層厚を達成できるが、
成長に要する時間が長くなり生産性に劣る。また、2回
目以降のエピタキシャル成長時にエピ界面の接合不良が
起こり易く、歩留まりが大幅に低下する。When the GaAs substrate is completely removed by lapping in order to prevent the reduction of the external light emission efficiency, the mechanical strength is insufficient because the total thickness of the epitaxial layer is as thin as 50 to 100 μm in the conventional technology, and the yield of the chip formation process is extremely high. Had fallen to. In addition, an epitaxial layer thickness of around 200 μm can be achieved by performing epitaxial growth multiple times.
The time required for growth is long and the productivity is poor. In addition, a defective junction easily occurs at the epitaxial interface during the second and subsequent epitaxial growths, resulting in a significant decrease in yield.
本発明は上記問題点を解決するためのもので、通常の1
回の徐冷法により十分な膜厚のエピタキシャル層が得ら
れ、GaAs基板を残す必要がなく、外部発光効率の低下を
防止することができる液相エピタキシャル成長方法及び
装置を提供することを目的とする。The present invention is for solving the above-mentioned problems.
It is an object of the present invention to provide a liquid phase epitaxial growth method and apparatus capable of obtaining an epitaxial layer having a sufficient film thickness by a single slow cooling method, eliminating the need to leave a GaAs substrate, and preventing a decrease in external light emission efficiency.
本発明は、スライドボート法による液相エピタキシャル
成長法において、溶液槽を上下に2分してスライドし、
溶液槽に位置したとき上側溶液槽から下側溶液槽へ成長
溶液を注入するためのスリットを形成したスライド板の
下面側で、前記スリット位置よりスライド方向手前側に
基板収容部を形成して基板を保持し、前記スライド板を
スライドさせて基板が前記溶液槽直前に達したときにス
リットが溶液槽に位置して上側溶液槽から下側溶液槽へ
成長溶液を注入し、成長溶液に対して基板の位置を上側
にして徐冷法によりエピタキシャル成長させることを特
徴とする。The present invention relates to a liquid phase epitaxial growth method using a slide boat method, in which a solution tank is vertically divided into two parts and slid,
When the substrate is placed in the solution tank, the substrate accommodating portion is formed on the lower surface side of the slide plate in which the slit for injecting the growth solution from the upper solution tank to the lower solution tank is formed, and the substrate accommodating portion is formed in the sliding direction front side from the slit position Holding, and when the substrate is reached just before the solution tank by sliding the slide plate, the slit is located in the solution tank and the growth solution is injected from the upper solution tank to the lower solution tank, with respect to the growth solution. It is characterized in that the substrate is placed on the upper side and epitaxial growth is performed by a slow cooling method.
また本発明は、1またはそれ以上の溶液槽と、各溶液槽
を上下に2分してスライドし、溶液槽に位置したとき上
側溶液槽から下側溶液槽へ成長溶液を注入するためのス
リットが形成されるとともに、前記スリット位置よりス
ライド方向手前側で下面側に基板収容部を有するスライ
ド板とからなり、前記基板収容部に基板を保持して各溶
液槽中を順次スライドさせるようにしたことを特徴とす
る。The present invention also provides one or more solution tanks and a slit for vertically sliding each solution tank into two parts, and a slit for injecting a growth solution from the upper solution tank to the lower solution tank when positioned in the solution tank. And a slide plate having a substrate housing portion on the lower surface side on the front side in the sliding direction from the slit position, the substrate is held in the substrate housing portion and sequentially slid in each solution tank. It is characterized by
本発明では、成長溶液に対して基板の位置を上側に配置
し、溶液の濃度差に伴う比重差により発生する対流を利
用して、徐冷法により成長速度を従来法に比較し2倍以
上にすることが可能となる。その結果、短時間に、エピ
タキシャル層の全厚を200μm以上にすることが可能と
なり、GaAs基板を除去しても、チップ化工程において、
十分機械的強度を有し耐え得るものである。In the present invention, the position of the substrate is arranged above the growth solution, and convection generated due to the difference in specific gravity due to the difference in concentration of the solution is used to increase the growth rate to twice or more as compared with the conventional method by the slow cooling method. It becomes possible. As a result, the total thickness of the epitaxial layer can be increased to 200 μm or more in a short time, and even if the GaAs substrate is removed, the chip formation process is
It has sufficient mechanical strength and can withstand.
以下、実施例を図面に基づき説明する。 Embodiments will be described below with reference to the drawings.
第1図はスライドボートを用いた本発明による液相エピ
タキシャル成長プロセスを説明するための図、第2図は
成長の様子を説明するための図、第3図は基板上の成長
層を示す図であり、図中、10はスライド板、11は基板収
容部、12は基板、13はスリット、14は重し兼用蓋、15は
溝、16、17は溶液層である。本例では溶液槽は2ヶ所で
あるがエピタキシャル層の数に応じて増減できることは
言うまでもない。FIG. 1 is a diagram for explaining a liquid phase epitaxial growth process according to the present invention using a slide boat, FIG. 2 is a diagram for explaining a growth state, and FIG. 3 is a diagram showing a growth layer on a substrate. In the figure, 10 is a slide plate, 11 is a substrate accommodating portion, 12 is a substrate, 13 is a slit, 14 is a lid that also serves as a weight, 15 is a groove, and 16 and 17 are solution layers. In this example, the number of solution tanks is two, but it goes without saying that the number can be increased or decreased depending on the number of epitaxial layers.
スライド板10は、各溶液槽16、17を貫通してスライド
し、それらを上下に2分している。各溶液槽のスライド
板より上側には加温された成長溶液が入れられており、
重し兼用の蓋14がそれぞれ設けられている。スライド板
10には基板収容部11が設けられて基板12が保持され、ま
たスリット13が設けられて、スリット13が位置した溶液
槽では成長溶液が上側溶液槽から下側溶液槽へ落下注入
されるようになっている。The slide plate 10 slides through each of the solution tanks 16 and 17 to divide them vertically into two parts. The heated growth solution is placed above the slide plate of each solution tank,
Each of the lids 14 also serves as a weight. Slide plate
The substrate housing portion 11 is provided in the substrate 10 to hold the substrate 12, and the slit 13 is provided so that the growth solution is dropped and injected from the upper solution tank to the lower solution tank in the solution tank in which the slit 13 is located. It has become.
このような構成において、第1図(イ)では、スリット
13が溶液槽16に位置してP-GaAlAs層成長用溶液が下側溶
液槽に注入される。そしてスライド板10を図の右方へス
ライドした第1図(ロ)では、基板12が注入されたP-Ga
AlAs層成長用溶液の上側に位置し、またスリット13は溶
液槽17に位置してN-GaAlAs層成長用メルトが注入され
る。この状態で徐冷することによりP-GaAlAs層成長用溶
液より溶質が析出してP-GaAlAs層が基板上に成長する。
次に、スライド板10を右方へスライドすると、(第1図
(ハ))基板は、N-GaAlAs層成長用溶液が注入された溶
液層17に位置することになり、同様にしてN-GaAlAs層が
成長形成されて全工程が終了する。In such a configuration, the slit in FIG.
13 is located in the solution tank 16, and the P-GaAlAs layer growth solution is injected into the lower solution tank. Then, in FIG. 1 (b) in which the slide plate 10 is slid to the right side of the figure, the P-Ga into which the substrate 12 is injected is shown.
The slit 13 is located on the upper side of the AlAs layer growth solution, and the slit 13 is located in the solution tank 17, and the N-GaAlAs layer growth melt is injected therein. By gradually cooling in this state, the solute is precipitated from the P-GaAlAs layer growth solution and the P-GaAlAs layer grows on the substrate.
Next, when the slide plate 10 is slid to the right (FIG. 1 (c)), the substrate is positioned in the solution layer 17 into which the N-GaAlAs layer growth solution has been injected, and the N- The GaAlAs layer is grown and formed, and the whole process is completed.
本実施例においては、基板としてZnをドープしたP型Ga
As基板を用い、表面の面方位は(100)面とした。In this embodiment, as the substrate, Zn-doped P-type Ga is used.
An As substrate was used, and the plane orientation of the surface was the (100) plane.
第3図に示す層1の成長用として、Ga100g中にアンドー
プGaAs多結晶6g、A12.5g、及びZn0.1gを溶解した。第3
図に示す層2の成長用としてGa100g中にアンドープGaAs
多結晶1.9g、Al=0.35g、及びTe=0.001gを溶解した。
これらの溶液を第1図のスライドボートの溶液槽に収容
し又、基板を第1図のボートの基板収容部に収容した。To grow the layer 1 shown in FIG. 3, 6 g of undoped GaAs polycrystal, 12.5 g of A, and 0.1 g of Zn were dissolved in 100 g of Ga. Third
Undoped GaAs in 100g Ga for growth of layer 2 shown
Polycrystalline 1.9 g, Al = 0.35 g, and Te = 0.001 g were dissolved.
These solutions were stored in the solution tank of the slide boat of FIG. 1, and the substrates were stored in the substrate storage portion of the boat of FIG.
ボートの温度を900℃に加熱した後、上記各層成長用溶
液を順次接触させた後、760℃まで冷却し、溶液と溶質
の比重差を利用して第2図に示すように溶液から溶質を
析出させて液相エピタキシャル成長を行った。After heating the boat to 900 ° C, the solutions for layer growth above were brought into contact with each other, and then cooled to 760 ° C, and the solute was removed from the solution as shown in Fig. 2 by utilizing the difference in specific gravity between the solution and the solute. Liquid phase epitaxial growth was performed by precipitation.
得られたエピタキシャル層の厚みは下記の通りであっ
た。The thickness of the obtained epitaxial layer was as follows.
層1:170μm 層2: 50μm さらに、GaAs基板を研磨、エッチングで除去し全厚を20
0μmにしLEDチップを作製した。Layer 1: 170 μm Layer 2: 50 μm Furthermore, the GaAs substrate was polished and removed by etching to a total thickness of 20
An LED chip was prepared with a thickness of 0 μm.
チップは一辺0.3mmの正方形状でエポキシコートなし電
流密度8A/cm2の条件で輝度は21mcd、ピーク波長は657n
m、LEDの歩留は97%であった。The chip has a square shape with a side of 0.3 mm and has no epoxy coating. The current density is 8 A / cm 2 , the brightness is 21 mcd, and the peak wavelength is 657 n.
m, LED yield was 97%.
スライドボートを第5図のような従来のボートに替え、
全く同様にしてエピタキシャルウエハーを製造した。Replace the slide boat with a conventional boat as shown in Fig. 5,
An epitaxial wafer was manufactured in exactly the same manner.
厚みは以下の通りであった。The thickness was as follows.
層1:70μm 層2:20μm 実施例と同様にして、全厚を200μmに調整し、基板付
で、LEDを作製した。輝度は6.0mcd、ピーク波長は662nm
で、LED歩留は95%であった。Layer 1: 70 μm Layer 2: 20 μm In the same manner as in the example, the total thickness was adjusted to 200 μm, and an LED was prepared with a substrate. Brightness 6.0 mcd, peak wavelength 662 nm
The LED yield was 95%.
一方基板を完全に除去し、全厚を80μmにしてLEDを作
製したところ輝度は15.0mcdと上昇し、ピーク波長は662
nmであったが、LED歩留は割れの大量発生で15%と低か
った。On the other hand, when the substrate was completely removed and an LED was made with a total thickness of 80 μm, the brightness increased to 15.0 mcd and the peak wavelength was 662 m.
However, the LED yield was as low as 15% due to the large number of cracks.
第4図はスライド板の構造を示す図で、同図(イ)は断
面図、同図(ロ)は平面図である。FIG. 4 is a view showing the structure of the slide plate, in which FIG. 4 (a) is a sectional view and FIG. 4 (b) is a plan view.
スライド板10の基板収容部11は、第4図(ロ)に示すよ
うにウエハ形状に合わせて形成し、またスリット13は、
スライド方向に直交して3本形成しているが、これに限
定する必要がないことは勿論である。The substrate accommodating portion 11 of the slide plate 10 is formed in accordance with the wafer shape as shown in FIG.
Although three pieces are formed orthogonally to the sliding direction, it is needless to say that the number is not limited to this.
以上のように本発明によれば、以下のような顕著な効果
があるので産業上の利用価値は極めて大きい。As described above, according to the present invention, since the following remarkable effects are obtained, the industrial utility value is extremely large.
通常の徐冷法により、比較的短時間に膜厚の大きい
エピタキシャルウエハを得ることが可能となる。An ordinary slow cooling method makes it possible to obtain an epitaxial wafer having a large film thickness in a relatively short time.
製造したエピタキシャルウエハは、基板を除去して
も、チップ化工程における機械的強度に十分耐え得る。The manufactured epitaxial wafer can sufficiently withstand the mechanical strength in the chip forming process even if the substrate is removed.
基板除去したウエハより作製したLEDは、基板付の
ウエハより作製したLEDに比較し出力が極めて大であ
る。The LED produced from the wafer with the substrate removed has a significantly higher output than the LED produced from the wafer with the substrate.
また、エピタキシャル成長開始直前に上側溶液槽か
ら下側溶液槽へ成長溶液が落下注入されるためエピ成長
時に溶液が十分攪拌され、溶液の濃度分布がより均一と
なるため安定した成長を行わせることができる。In addition, since the growth solution is dropped and injected from the upper solution tank to the lower solution tank immediately before the start of epitaxial growth, the solution is sufficiently agitated during epi growth and the concentration distribution of the solution becomes more uniform, so stable growth can be performed. it can.
第1図はスライドボートを用いた本発明による液相エピ
タキシャル成長プロセスを説明するための図、第2図は
成長の様子を説明するための図、第3図は基板上の成長
層を示す図、第4図はスライド板の構造を示す図、第5
図はスライドボート法による従来の液相エピタキシャル
成長装置を示す図である。 10……スライド板、11……基板収容部、12……基板、13
……スリット、14……重し兼用蓋、15……溝、16、17…
…溶液槽。FIG. 1 is a diagram for explaining a liquid phase epitaxial growth process according to the present invention using a slide boat, FIG. 2 is a diagram for explaining a growth state, and FIG. 3 is a diagram showing a growth layer on a substrate, FIG. 4 shows the structure of the slide plate, and FIG.
The figure shows a conventional liquid phase epitaxial growth apparatus using the slide boat method. 10 …… Slide plate, 11 …… Substrate housing, 12 …… Substrate, 13
…… Slits, 14 …… Lids and lids, 15 …… Grooves, 16, 17…
... solution tank.
Claims (4)
ル成長法において、溶液槽を上下に2分してスライド
し、溶液槽に位置したとき上側溶液槽から下側溶液槽へ
成長溶液を注入するためのスリットを形成したスライド
板の下面側で、前記スリット位置よりスライド方向手前
側に基板収容部を形成して基板を保持し、前記スライド
板をスライドさせて基板が前記溶液槽直前に達したとき
にスリットが溶液槽に位置して上側溶液槽から下側溶液
槽へ成長溶液を注入し、成長溶液に対して基板の位置を
上側にして徐冷法によりエピタキシャル成長させること
を特徴とする液相エピタキシャル成長方法。1. A liquid phase epitaxial growth method using a slide boat method, in which a solution tank is vertically slid into two parts and slid, and when positioned in the solution tank, a slit for injecting a growth solution from the upper solution tank to the lower solution tank. On the lower surface side of the slide plate on which the substrate is formed, a substrate accommodation portion is formed on the front side in the sliding direction from the slit position to hold the substrate, and the slide plate is slid to slit when the substrate reaches immediately before the solution tank. Is located in the solution tank, the growth solution is injected from the upper solution tank to the lower solution tank, and the substrate is positioned above the growth solution to perform epitaxial growth by slow cooling.
上下に2分してスライドし、溶液槽に位置したとき上側
溶液槽から下側溶液槽へ成長溶液を注入するためのスリ
ットが形成されるとともに、前記スリット位置よりスラ
イド方向手前側で下面側に基板収容部を有するスライド
板とからなり、前記基板収容部に基板を保持して各溶液
槽中を順次スライドさせるようにしたことを特徴とする
液相エピタキシャル成長装置。2. One or more solution tanks and slits for vertically sliding each solution tank into two parts, and a slit for injecting a growth solution from the upper solution tank to the lower solution tank when positioned in the solution tank. And a slide plate having a substrate housing portion on the lower surface side on the front side in the sliding direction from the slit position, the substrate is held in the substrate housing portion and sequentially slid in each solution tank. A liquid phase epitaxial growth apparatus characterized in that
付着した不要な溶液を除去し、収容する溝が設けられて
いる特許請求の範囲第2項記載の液相エピタキシャル成
長装置。3. The liquid phase epitaxial growth apparatus according to claim 2, wherein a groove for removing and containing an unnecessary solution adhering to the slide plate or the substrate is provided between the solution tanks.
2列以上設けられている特許請求の範囲第2項記載の液
相エピタキシャル成長装置。4. The liquid phase epitaxial growth apparatus according to claim 2, wherein the substrate housing portion is provided in two or more rows in a direction orthogonal to the sliding direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62273999A JPH0772117B2 (en) | 1987-10-28 | 1987-10-28 | Liquid phase epitaxial growth method and apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62273999A JPH0772117B2 (en) | 1987-10-28 | 1987-10-28 | Liquid phase epitaxial growth method and apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01115891A JPH01115891A (en) | 1989-05-09 |
| JPH0772117B2 true JPH0772117B2 (en) | 1995-08-02 |
Family
ID=17535538
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62273999A Expired - Fee Related JPH0772117B2 (en) | 1987-10-28 | 1987-10-28 | Liquid phase epitaxial growth method and apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0772117B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014182411A (en) * | 2013-03-15 | 2014-09-29 | Ricoh Co Ltd | Information processing device, network system, processing execution method, and processing execution program |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1494653A (en) * | 1975-07-23 | 1977-12-07 | Gen Electric Co Ltd | Charge coupled devices |
-
1987
- 1987-10-28 JP JP62273999A patent/JPH0772117B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01115891A (en) | 1989-05-09 |
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