JPH0791156B2 - Method for producing CdTe single crystal - Google Patents
Method for producing CdTe single crystalInfo
- Publication number
- JPH0791156B2 JPH0791156B2 JP2210279A JP21027990A JPH0791156B2 JP H0791156 B2 JPH0791156 B2 JP H0791156B2 JP 2210279 A JP2210279 A JP 2210279A JP 21027990 A JP21027990 A JP 21027990A JP H0791156 B2 JPH0791156 B2 JP H0791156B2
- Authority
- JP
- Japan
- Prior art keywords
- cdte
- single crystal
- crystal
- ampoule
- purity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Measurement Of Radiation (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Description
【発明の詳細な説明】 発明の技術分野 本発明は、放射線検出素子用等として有用なCdTe単結晶
の製造方法に関する。TECHNICAL FIELD OF THE INVENTION The present invention relates to a method for producing a CdTe single crystal useful as a radiation detecting element and the like.
従来技術 CdTe単結晶は放射線検出素子等に有用であり、その特性
向上、特に高エネルギー分解能化をめざして従来からCd
Te単結晶の製造方法が検討されている。Conventional technology CdTe single crystals are useful for radiation detectors, etc.
A method for producing a Te single crystal is being studied.
高エネルギー分解能を達成するための結晶特性として
は、キャリアライフタイムが大きいことが重要である。
キャリアライフタイムは結晶純度によって著しく影響を
受ける事が知られており、そのため、放射線検出素子用
の結晶は高純度化の効果が高いといわれているトラベリ
ングヒーター法等によって行われてきた。A large carrier lifetime is important as a crystal characteristic for achieving high energy resolution.
It is known that the carrier lifetime is significantly affected by the crystal purity, and therefore, crystals for radiation detection elements have been produced by the traveling heater method or the like, which is said to have a high purification effect.
本発明が解決する問題点 しかしながら、トラベリングヒーター法等によって育成
した結晶でも、必ずしも放射線検出素子用として満足で
きるキャリアライフタイムの大きさとならないという問
題点があった。Problems to be Solved by the Present Invention However, there is a problem that even a crystal grown by a traveling heater method or the like does not necessarily have a sufficient carrier lifetime for a radiation detection element.
発明の構成 本発明は、上記の問題点を解決したものであって、放射
線検出素子用のCdTe単結晶の製造方法において、TeとCd
の組成比(Te/Cd)が原子比で1.1以上9以下の融液を片
側から冷却して、CdTeを析出させた後、析出したCdTeを
残りのTe過剰部分より分離して高純度のCdTeを得る第1
の工程と、微量の塩素源が添加されたTeを溶媒とし、こ
れに第1の工程で得られたCdTeを接触させて、前記Te溶
媒を加熱し、この加熱部を徐々に前記CdTe側に移動する
ことによって、その移動方向の反対側にCdTe単結晶を析
出させる第2の工程からなることを特徴とするCdTe単結
晶の製造方法に関するものである。Structure of the Invention The present invention is to solve the above problems, in the method for producing a CdTe single crystal for a radiation detection element, Te and Cd
The composition ratio (Te / Cd) of 1.1 is an atomic ratio of 1.1 to 9 and the melt is cooled from one side to precipitate CdTe, and then the precipitated CdTe is separated from the remaining Te excess portion to obtain high-purity CdTe. First to get
Step and Te with a trace amount of chlorine source added as a solvent, and the CdTe obtained in the first step is brought into contact with this to heat the Te solvent, and this heating part is gradually moved to the CdTe side. The present invention relates to a method for producing a CdTe single crystal, which comprises a second step of depositing a CdTe single crystal on the side opposite to the moving direction by moving the CdTe single crystal.
問題点を解決する手段および作用 本発明者等は、使用する原料CdTe塊として、組成がCdTe
よりTe過剰の状態の融液より析出させた結晶を使用する
ことで、成長した結晶のキャリアライフタイムが大幅に
増加し、このようにして作製した結晶を用いた放射線検
出素子が良好なエネルギー分解能を有する事を新たに見
い出し、本発明に至ったものである。Means and Actions for Solving Problems The present inventors have found that the raw material CdTe mass used has a composition of CdTe.
By using crystals precipitated from the melt in a Te-excessive state, the carrier lifetime of the grown crystals is significantly increased, and the radiation detection element using the crystals thus produced has a good energy resolution. The present invention has been newly found out to have the following, and has led to the present invention.
本発明の第1の工程は、第2の工程で使用する高純度の
CdTe塊を得る工程である。純度99.9999%以上のCd及びT
eを組成比(Te/Cd)が原子比で1.1以上9以下になるよ
うに石英アンプル等の容器に真空、あるいは不活性ガス
雰囲気で封入する。既に純度99.9999%以上のCd及びTe
から合成されたCdTe結晶とTeを上記組成比になるように
混合しても良い。The first step of the present invention is the high purity used in the second step.
This is the process of obtaining CdTe lumps. Cd and T with a purity of 99.9999% or more
e is sealed in a container such as a quartz ampoule in a vacuum or an inert gas atmosphere so that the composition ratio (Te / Cd) is 1.1 or more and 9 or less in atomic ratio. Already Cd and Te with a purity of 99.9999% or more
The CdTe crystal synthesized from and Te may be mixed in the above composition ratio.
これを第1図に示すような温度分布を持つ電気炉の均熱
部にアンプルの全体が入るようにセットし、アンプル内
を均一に溶解した融液とする。このときの均熱部の温度
はTeとCdの組成比によって異なり、Te過剰の度合いが大
きくなるほど下げることが出来る。例えば、(Te/Cd)
=1.1のときは、1050℃で溶解することが可能であり、
(Te/Cd)=9のときは、700℃で溶解することが可能で
ある。This is set so that the entire ampoule enters the soaking section of the electric furnace having the temperature distribution as shown in FIG. 1, and the inside of the ampoule is made into a melted solution. The temperature of the soaking part at this time depends on the composition ratio of Te and Cd, and can be lowered as the degree of excess Te increases. For example, (Te / Cd)
= 1.1, it is possible to melt at 1050 ℃,
When (Te / Cd) = 9, it is possible to melt at 700 ° C.
TeとCdの組成比(Te/Cd)は原子比で1.1以上である必要
がある。1.1未満では融液の融点が1050℃を越えるた
め、CdTeの析出温度が高く、アンプルからの汚染によ
り、精製効果が小さくなり効果がない。また、TeとCdの
組成比(Te/Cd)は原子比で9以下である必要がある。
9を越えると融液中のCdの濃度が低すぎて、CdTeだけで
なく、同時にTeもCdTeの中に析出してしまうので好まし
くないからである。The composition ratio of Te and Cd (Te / Cd) must be 1.1 or more in atomic ratio. If it is less than 1.1, the melting point of the melt exceeds 1050 ° C., the precipitation temperature of CdTe is high, and the purification effect is reduced due to contamination from the ampoule, which is not effective. Further, the composition ratio of Te and Cd (Te / Cd) needs to be 9 or less in atomic ratio.
If it exceeds 9, the concentration of Cd in the melt is too low and not only CdTe but also Te is simultaneously precipitated in CdTe, which is not preferable.
このようにして、アンプルの中を全体を溶解し、融液と
したものを、アンプルを低温側に移動してCdTeを低温側
に析出させる。アンプルに対して温度分布を移動しても
良い。アンプルの移動速度は0.1〜5mm/hrが良い。アン
プルの移動速度が0.1mm/hr以下では第1の工程に1ヶ月
以上時間がかかるため、工業的に生産性が良くないため
好ましくない。5mm/hr以上の速度ではCdTe中にTeが残っ
てしまうため精製の効果が上がらず好ましくない。In this way, the whole of the ampoule is melted, and the melted solution is moved to the low temperature side to deposit CdTe on the low temperature side. The temperature distribution may be moved with respect to the ampoule. A good ampoule moving speed is 0.1-5 mm / hr. When the moving speed of the ampoule is 0.1 mm / hr or less, the first step takes 1 month or more, which is not preferable because the productivity is not good industrially. At a speed of 5 mm / hr or more, Te remains in CdTe, which is not preferable because the purification effect is not improved.
以上の方法によって、高純度のCdTeを析出させることが
出来る。これは、CdTeの融点である1092℃よりも低温で
結晶を析出させることができるため、アンプルからの汚
染が減少するからである。又、Te過剰な組成を持った融
液は、CdTeの融液よりも不純物のゲッタリングの効果が
高いためである。これにより、次の第2の工程で使用す
るに望ましい高純度のCdTeが得られる。例えば、この第
1の工程で得られるCdTe塊のキャリア濃度は2×1014/
cm3以下と極めて低く、純度が高くなる。High-purity CdTe can be deposited by the above method. This is because the crystals can be precipitated at a temperature lower than 1092 ° C., which is the melting point of CdTe, and the contamination from the ampoule is reduced. This is also because the melt having a composition in excess of Te has a higher effect of gettering impurities than the melt of CdTe. This gives the desired high purity CdTe for use in the next second step. For example, the carrier concentration of the CdTe lump obtained in this first step is 2 × 10 14 /
Very low with cm 3 or less and high purity.
このようにして、高純度のCdTe塊を析出した後、析出し
たCdTeを、組成がTe過剰な部分と分離する。これには、
CdTeの析出が終わった後、アンプルを冷却し、内容物を
とりだし、析出したCdTe部分とTe過剰な部分の境界近く
で析出したCdTeを割り、分離することが混入が少なく好
ましい。In this way, after a high-purity CdTe mass is deposited, the deposited CdTe is separated from a portion having a composition excess of Te. This includes
After the deposition of CdTe is completed, it is preferable to cool the ampoule, take out the contents, and split the CdTe deposited near the boundary between the deposited CdTe portion and the Te-excess portion to separate it, because mixing is small.
本発明の第2の工程は、第1の工程で得たCdTe塊を原料
として用いることにより結晶成長を行なう工程である。The second step of the present invention is a step of performing crystal growth by using the CdTe mass obtained in the first step as a raw material.
微量の塩素源が添加されたTeを溶媒とし、これに第1の
工程で得られたCdTeを接触させて、前記Te溶媒を加熱
し、この加熱部を徐々に前記CdTe側に移動することによ
って、その移動方向の反対側にCdTe結晶を析出させる。By using Te to which a trace amount of chlorine source is added as a solvent, and contacting it with the CdTe obtained in the first step, heating the Te solvent, and gradually moving this heating part to the CdTe side. , CdTe crystals are deposited on the opposite side of the moving direction.
塩素源としては、CdCl2、TeCl2、TeCl4、Cl2等である。
これらの塩素源とTe、および第1の工程で得たCdTeを第
2図に示すようにアンプルにいれ真空、あるいは不活性
ガス雰囲気で封入する。第3図に示すように種結晶とな
る単結晶をアンプルの底にいれても良い。前記Teを加熱
することによって、第1の工程で得たCdTeはTeの中に一
部溶解する。ここで、Teはその溶媒となる。Examples of the chlorine source include CdCl 2 , TeCl 2 , TeCl 4 , Cl 2 and the like.
These chlorine source, Te, and CdTe obtained in the first step are put into an ampoule as shown in FIG. 2 and sealed in a vacuum or an inert gas atmosphere. As shown in FIG. 3, a single crystal serving as a seed crystal may be placed at the bottom of the ampoule. By heating the Te, the CdTe obtained in the first step is partially dissolved in Te. Here, Te is the solvent.
加熱温度は650℃〜950℃が適当である。更に好ましくは
700℃〜800℃である。加熱温度が650℃以下では成長す
る結晶が多結晶となるため好ましくなく、950℃以上で
は成長する結晶の純度が低下し、そのためにキャリアラ
イフタイムが減少してしまうためである。A heating temperature of 650 ° C to 950 ° C is suitable. More preferably
It is 700 ℃ -800 ℃. If the heating temperature is 650 ° C. or lower, the growing crystal becomes polycrystal, which is not preferable, and if the heating temperature is 950 ° C. or higher, the purity of the growing crystal is lowered, and the carrier lifetime is reduced.
この加熱部を第1の工程で得たCdTe側へ徐々に移動する
ことによって、CdTeはTe溶媒の中に徐々に溶解すると同
時に、その反対側へ徐々に単結晶が析出する。加熱部は
アンプルに対して相対的に移動していればよく、従っ
て、アンプルを固定して電気炉を移動しても、電気炉を
固定してアンプルを移動しても良い。移動速度は1〜10
mm/日が好ましい。更に好ましくは2〜5mm/日である。
移動速度が1mm/日以下では結晶成長に時間がかかりす
ぎ、工業的でない。移動速度が10mm/日以上では成長す
る結晶が多結晶となるため好ましくない。By gradually moving this heating part to the CdTe side obtained in the first step, CdTe is gradually dissolved in the Te solvent, and at the same time, a single crystal is gradually precipitated on the opposite side. It suffices that the heating unit moves relative to the ampoule. Therefore, the ampoule may be fixed and the electric furnace moved, or the electric furnace may be fixed and the ampoule moved. Movement speed is 1-10
mm / day is preferred. More preferably, it is 2 to 5 mm / day.
If the moving speed is 1 mm / day or less, crystal growth takes too much time, which is not industrial. When the moving speed is 10 mm / day or more, the growing crystal becomes a polycrystal, which is not preferable.
第2の工程で得られるCdTe単結晶は、微量の塩素が含ま
れるため、高抵抗であると同時に、第1、第2の工程に
より極めて高純度であるため、キャリアライフタイムが
大きく、放射線検出素子用の結晶として優れている。The CdTe single crystal obtained in the second step has a high resistance because it contains a trace amount of chlorine and, at the same time, has an extremely high purity due to the first and second steps, and thus has a large carrier lifetime and radiation detection. Excellent as a crystal for devices.
[実施例] 純度99.9999%のCdTe多結晶を460g、純度99.99999%のT
eを220g混合し、アンプル中に真空封入した。(組成(T
e/Cd)=1.9)これを第1図の如く、電気炉中で1000℃
で溶解した後、低温側に1mm/hrの速度で移動して、CdTe
を析出させた。これを冷却後、CdTeをTe過剰部分と分離
して、棒状のCdTe塊を得た。[Example] 460 g of CdTe polycrystal having a purity of 99.9999% and T having a purity of 99.99999%
220 g of e was mixed and vacuum-sealed in an ampoule. (Composition (T
e / Cd) = 1.9) This is 1000 ℃ in an electric furnace as shown in Fig. 1.
After melting with, move to the low temperature side at a speed of 1 mm / hr, and
Was deposited. After cooling this, CdTe was separated from the Te excess portion to obtain a rod-shaped CdTe mass.
次に、別の石英アンプルに100mgのCdCl2、40gのTe、更
に上記のCdTe塊を第2図の如く入れ、Ar300torrで封入
した。これを第4図の如く、800℃でTe溶媒を加熱し、3
mm/日でアンプルを移動し、CdTe単結晶を成長させた。Next, 100 mg of CdCl 2 , 40 g of Te, and the above CdTe lumps were put in another quartz ampoule as shown in FIG. 2 and sealed with Ar300 torr. As shown in Fig. 4, heat the Te solvent at 800 ℃ and
The ampoule was moved at mm / day to grow a CdTe single crystal.
この結晶の塩素濃度は5ppm,キャリアライフタイムは、
ホールが0.5μs,電子が1μsと大きかった。この結晶
から放射線検出素子を作成し、241Amの放射線を測定し
た結果、そのスペクトルの半値幅は、5keVと優れた分離
能であった。The chlorine concentration of this crystal is 5ppm, and the carrier lifetime is
The holes were as large as 0.5 μs and the electrons were as large as 1 μs. A radiation detecting element was prepared from this crystal and the radiation of 241 Am was measured. As a result, the half width of the spectrum was 5 keV, which was an excellent resolution.
[比較例1] 純度99.9999%のCdTe多結晶を、アンプル中に真空封入
し、1100℃で鋳造し、棒状のCdTe塊を得た。Comparative Example 1 A CdTe polycrystal having a purity of 99.9999% was vacuum-encapsulated in an ampoule and cast at 1100 ° C. to obtain a rod-shaped CdTe lump.
これを原料として、実施例と同様に結晶成長を行なっ
た。Using this as a raw material, crystal growth was performed in the same manner as in the example.
この結晶の塩素濃度は5ppmと実施例と同じであったが、
キャリアライフタイムは、ホールが0.2μs,電子が0.5μ
sと実施例に比べ小さかった。この結晶から放射線検出
素子を作成し、241Amの放射線を測定した結果、そのス
ペクトルの半値幅は、10keVと分解能が悪かった。The chlorine concentration of this crystal was 5 ppm and was the same as in the example,
The carrier lifetime is 0.2μs for holes and 0.5μs for electrons.
s, which was smaller than that of the example. As a result of making a radiation detector from this crystal and measuring the radiation of 241 Am, the half width of the spectrum was 10 keV and the resolution was poor.
発明の効果 本発明により、結晶の純度が高く、キャリアライフタイ
ムの大きな結晶が得られるようになり、この結晶を使用
して作成した放射線検出素子は、従来よりもエネルギー
分解能が向上するという効果がある。EFFECTS OF THE INVENTION According to the present invention, a crystal having high crystal purity and a long carrier lifetime can be obtained, and a radiation detection element produced using this crystal has an effect that energy resolution is improved as compared with the conventional one. is there.
第1図は第1の工程の概略を示したものである。 第2図は第2の工程のアンプルの概略を示したものであ
る。 第3図は種結晶を用いた場合の第2の工程のアンプルの
概略を示したものである。 第4図は第2の工程の結晶成長の概略を示したものであ
る。 1……電気炉 2……アンプル 3……析出したCdTe 4……Te過剰融液 5……第1の工程で得たCdTe 6……Te溶媒 7……塩素源 8……種結晶 9……電気炉 10……CdTe単結晶FIG. 1 shows the outline of the first step. FIG. 2 shows an outline of the ampoule in the second step. FIG. 3 shows the outline of an ampoule in the second step when a seed crystal is used. FIG. 4 shows an outline of crystal growth in the second step. 1 ... Electric furnace 2 ... Ampule 3 ... Precipitated CdTe 4 ... Te excess melt 5 ... CdTe 6 obtained in the first step ... Te solvent 7 ... Chlorine source 8 ... Seed crystal 9 ... … Electric furnace 10 …… CdTe single crystal
Claims (1)
において、TeとCdの組成比(Te/Cd)が原子比で1.1以上
9以下の融液を片側から冷却して、CdTeを析出させた
後、析出したCdTeを残りのTe過剰部分より分離して高純
度のCdTeを得る第1の工程と、微量の塩素源が添加され
たTeを溶媒とし、これに第1の工程で得られたCdTeを接
触させて、前記Te溶媒を加熱し、この加熱部を徐々に前
記CdTe側に移動することによって、その移動方向の反対
側にCdTe単結晶を析出させる第2の工程からなることを
特徴とするCdTe単結晶の製造方法。1. A method for producing a CdTe single crystal for a radiation detecting element, wherein a melt having a composition ratio of Te and Cd (Te / Cd) of 1.1 to 9 in atomic ratio is cooled from one side to precipitate CdTe. After that, the precipitated CdTe is separated from the remaining Te excess to obtain a high-purity CdTe, and Te containing a trace amount of chlorine source is used as a solvent. The second step of bringing the CdTe single crystal into contact with the obtained CdTe, heating the Te solvent, and gradually moving the heating part to the CdTe side to precipitate a CdTe single crystal on the opposite side to the moving direction. A method for producing a CdTe single crystal characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2210279A JPH0791156B2 (en) | 1990-08-10 | 1990-08-10 | Method for producing CdTe single crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2210279A JPH0791156B2 (en) | 1990-08-10 | 1990-08-10 | Method for producing CdTe single crystal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0497993A JPH0497993A (en) | 1992-03-30 |
| JPH0791156B2 true JPH0791156B2 (en) | 1995-10-04 |
Family
ID=16586764
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2210279A Expired - Lifetime JPH0791156B2 (en) | 1990-08-10 | 1990-08-10 | Method for producing CdTe single crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0791156B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2828868B2 (en) * | 1993-04-14 | 1998-11-25 | 財団法人神奈川科学技術アカデミー | Liquid phase crystal growth method for II-VI compound semiconductor |
-
1990
- 1990-08-10 JP JP2210279A patent/JPH0791156B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0497993A (en) | 1992-03-30 |
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