JPH0797048B2 - Digital temperature detector - Google Patents
Digital temperature detectorInfo
- Publication number
- JPH0797048B2 JPH0797048B2 JP8331388A JP8331388A JPH0797048B2 JP H0797048 B2 JPH0797048 B2 JP H0797048B2 JP 8331388 A JP8331388 A JP 8331388A JP 8331388 A JP8331388 A JP 8331388A JP H0797048 B2 JPH0797048 B2 JP H0797048B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- temperature
- value
- digital temperature
- superconducting elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Thermally Actuated Switches (AREA)
- Analogue/Digital Conversion (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は温度値解析や温度による制御装置における温度
検知装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a temperature detection device in a temperature value analysis or temperature control device.
従来の技術 従来の温度検知装置としては、例えば温度センサを用い
たものがある。2. Description of the Related Art As a conventional temperature detecting device, there is one using a temperature sensor, for example.
第２図はこの従来の温度検知装置のブロック図を示すも
のであり、１は温度センサ、２はサンプル・ホールド回
路、３はA/Dコンバータ、４はマイクロ・コンピュータ
である。以下順に動作を説明する。FIG. 2 is a block diagram of this conventional temperature detecting device, in which 1 is a temperature sensor, 2 is a sample and hold circuit, 3 is an A / D converter, and 4 is a microcomputer. The operation will be described below in order.
（１） 温度センサにより、温度値が電圧値に変換され
る。この電圧値は、温度値に比例しているとは限らな
い。(1) The temperature sensor converts a temperature value into a voltage value. This voltage value is not always proportional to the temperature value.
（２） （１）により電圧値とした信号を次段のA/Dコ
ンバータに入力するためにサンプル・ホールドを行な
う。(2) Sample and hold is performed to input the voltage value signal from (1) to the A / D converter at the next stage.
（３） サンプル・ホールドした信号をA/Dコンバータ
によりA/D変換を行なう。(3) The A / D converter performs A / D conversion on the sampled and held signal.
（４） A/D変換を行なった結果をマイクロ・コンピュ
ータに取り込み、種々の処理を行なう。温度センサの非
線型性の補正等もこの処理に含まれる。(4) The results of A / D conversion are loaded into a microcomputer and various processing is performed. Correction of the non-linearity of the temperature sensor is also included in this processing.
以上のように構成された従来の温度検知装置は、温度セ
ンサによって検知された温度値の信号がアナログの電圧
値であるのでこの信号をA/D変換して後の処理に用いる
ものである。In the conventional temperature detecting device configured as described above, since the signal of the temperature value detected by the temperature sensor is an analog voltage value, this signal is A / D converted and used in the subsequent processing.
発明が解決しようとする課題 しかしながら上記のような構成では、後の処理で必要と
なる温度値をディジタル値とするために、サンプル・ホ
ールド回路,A/Dコンバータが必要となる。また、温度セ
ンサが持つ非線型性の補正が後の処理に必要となってし
まう。このように、従来の温度検知装置ではハードの規
模の増大やソフトの負担の増加という問題点を有してい
た。However, in the above-mentioned configuration, the sample and hold circuit and the A / D converter are necessary in order to make the temperature value necessary for the subsequent processing a digital value. Further, the non-linearity correction of the temperature sensor is required for the subsequent processing. As described above, the conventional temperature detection device has a problem that the scale of hardware increases and the load of software increases.
本発明はかかる点に鑑み、小さいハード規模で、非線型
性の補正を必要としないディジタル出力の温度検知装置
を提供することを目的とする。The present invention has been made in view of the above circumstances, and an object thereof is to provide a digital output temperature detection device that does not require correction of nonlinearity with a small hardware scale.
課題を解決するための手段 本発明は、設定された数種類の臨界温度を持つ超伝導素
子を複数個直列に接続し、前記直列に接続された超伝導
素子の組を抵抗素子として用いて電圧を分圧し、前記分
圧した電圧を前記超伝導素子の組み合わせに応じた参照
電圧により比較する手段を複数組組み合わせる構成とし
た温度検知装置である。Means for Solving the Problems The present invention is to connect a plurality of superconducting elements having several kinds of set critical temperatures in series, and use a set of the superconducting elements connected in series as a resistance element to generate a voltage. The temperature detecting device is configured to combine a plurality of means for dividing the voltage and comparing the divided voltage with a reference voltage according to the combination of the superconducting elements.
作用 本発明は前記した構成により、分圧した電圧が温度によ
り上下する働きをし、これを参照電圧により比較するこ
とにより、ディジタル信号とし、臨界温度の異なる分圧
器を用いたもので２進表示の各桁の出力とすることが可
能となる。Function The present invention has the above-described structure, in which the divided voltage works up and down according to the temperature, and by comparing this with the reference voltage, it is converted into a digital signal and is displayed in binary using a voltage divider having a different critical temperature. It is possible to output each digit of.
実施例 以下本発明の一実施例を図面に基づいて説明する。Embodiment An embodiment of the present invention will be described below with reference to the drawings.
第１図に本発明のディジタル温度検知装置の構成図を示
す。FIG. 1 shows a block diagram of a digital temperature detecting device of the present invention.
第１図において臨界温度によって超伝導状態と常伝導状
態に切り換わる超伝導素子を、抵抗と開閉器を並列に接
続したものとして表現しており、臨界温度以下では、開
閉器はオンし抵抗零の状態を示し、臨界温度以上では、
開閉器はオフし抵抗Ｒ［Ω］の状態を示す。101〜114は
超伝導状態のときにはオンし、そうでないときにはオフ
する開閉器、121〜134は常伝導状態のときの抵抗を示
す。135〜137は保護抵抗、141〜143は電圧比較器であ
り、151は直流電圧電源である。In Fig. 1, a superconducting element that switches between a superconducting state and a normal conducting state depending on the critical temperature is represented as a resistor and a switch connected in parallel. Below the critical temperature, the switch turns on and the resistance is zero. Is shown, and above the critical temperature,
The switch is turned off and the resistance R [Ω] is shown. Reference numerals 101 to 114 denote switches that are turned on in the superconducting state and turned off otherwise, and 121 to 134 are resistances in the normal conducting state. 135 to 137 are protection resistors, 141 to 143 are voltage comparators, and 151 is a DC voltage power supply.
101と121の超伝導素子の臨界温度はT0,102と122の超伝
導素子の臨界温度はT2というように、第１図に示したよ
うな臨界温度の異なる超伝導素子を直列に接続し、直流
電圧を分圧する。これらの臨界温度の変え方を T0＜T1＜T2＜T3＜T4＜T5＜T6＜T7ΔＴ＜Tn−Tn-1:一定
抵抗121〜134は一定値Ｒで保護抵抗はＲに比べて小さい
と設定すると、第１図の節点A,節点B,節点Ｃの電圧値
は、温度Ｔに対して第３図のように変化する。これを参
照電圧A,B,Cで比較して高電圧のとき‘1',低電圧のとき
‘0'を出力するようにすると、出力Ａには20,出力Ｂに
は21,出力Ｃには22の重みに対応した信号が出力され、T
0〜（T7＋ΔＴ）の温度範囲をA/D変換した結果が得られ
る。The critical temperature of the superconducting elements 101 and 121 is T 0 , the critical temperature of the superconducting elements 102 and 122 is T 2 , and the superconducting elements with different critical temperatures as shown in Fig. 1 are connected in series. And divide the DC voltage. How to change these critical temperatures is T 0 <T 1 <T 2 <T 3 <T 4 <T 5 <T 6 <T 7 ΔT <T n −T n-1 : constant resistances 121 to 134 are constant values R If the protection resistance is set to be smaller than R, the voltage values at node A, node B, and node C in FIG. 1 change with temperature T as shown in FIG. The reference voltage A to this, B, when compared with C of the high voltage '1', when to output the time of the low voltage '0', the output A 2 0, 2 1, to the output B signal corresponding to the weight of 2 2 is output to the C, T
The result of A / D conversion in the temperature range of 0 to (T 7 + ΔT) is obtained.
ただし、各超伝導素子を流す電流がその素子の臨界電流
を超えないよう保護抵抗等で設定し、参照電圧は各節点
の電圧振幅を比較できるよう設定される。However, the current flowing through each superconducting element is set by a protective resistor or the like so as not to exceed the critical current of the element, and the reference voltage is set so that the voltage amplitudes of the nodes can be compared.
尚、各超伝導素子の臨界温度は外部磁界により調整する
ことができる。The critical temperature of each superconducting element can be adjusted by an external magnetic field.
発明の効果 以上述べたように、本発明によれば、温度の値のディジ
タル表現が必要な場合に、A/Dコンバータは不要となり
回路の簡単化が図ることができ、またアナログの温度値
をディジタル値に変換する前後の直線性は設計段階で確
保でき、作製後に外部磁界によって調整が可能であり、
この実用的価値は大きい。As described above, according to the present invention, when the digital expression of the temperature value is required, the A / D converter is not necessary and the circuit can be simplified, and the analog temperature value can be changed. The linearity before and after conversion to digital values can be secured at the design stage, and it can be adjusted by an external magnetic field after fabrication.
This is of great practical value.
第１図は本発明の温度検知装置の構成図、第２図は従来
の温度検知装置のブロック図、第３図（ａ）〜（ｃ）は
第１図における各々節点Ａ〜Ｃの温度Ｔによる電圧変化
を示した特性図である。 101〜114……開閉器、121〜137……抵抗、141〜143……
比較器、151……直流電圧源。1 is a block diagram of a temperature detecting device of the present invention, FIG. 2 is a block diagram of a conventional temperature detecting device, and FIGS. 3 (a) to 3 (c) are temperatures T of nodes A to C in FIG. It is a characteristic view showing the voltage change by. 101-114 …… Switch, 121-137 …… Resistor, 141-143 ……
Comparator, 151 ... DC voltage source.
Claims (1)
素子を複数個直列に接続し、前記直列に接続された超伝
導素子の組を抵抗素子として用いて電圧を分圧し、前記
分圧した電圧を前記超伝導素子の組み合わせに応じた参
照電圧により比較する手段を複数組組み合わせることに
より、温度値をディジタル出力するディジタル温度検知
装置。1. A plurality of superconducting elements having a plurality of set critical temperatures are connected in series, and a set of the superconducting elements connected in series is used as a resistance element to divide a voltage to divide the voltage. A digital temperature detecting device for digitally outputting a temperature value by combining a plurality of means for comparing the generated voltage with a reference voltage corresponding to the combination of the superconducting elements.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8331388A JPH0797048B2 (en) | 1988-04-05 | 1988-04-05 | Digital temperature detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8331388A JPH0797048B2 (en) | 1988-04-05 | 1988-04-05 | Digital temperature detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01254823A JPH01254823A (en) | 1989-10-11 |
| JPH0797048B2 true JPH0797048B2 (en) | 1995-10-18 |
Family
ID=13798932
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8331388A Expired - Lifetime JPH0797048B2 (en) | 1988-04-05 | 1988-04-05 | Digital temperature detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0797048B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11493388B2 (en) * | 2020-10-15 | 2022-11-08 | Himax Imaging Limited | Temperature sensor using digital double sampling |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111366260B (en) * | 2020-04-26 | 2022-03-15 | 广东虹勤通讯技术有限公司 | A temperature monitoring circuit, system and method |
| CN116222814B (en) * | 2023-05-10 | 2023-07-07 | 中诚华隆计算机技术有限公司 | Quantum computing device with temperature measurement function |
-
1988
- 1988-04-05 JP JP8331388A patent/JPH0797048B2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11493388B2 (en) * | 2020-10-15 | 2022-11-08 | Himax Imaging Limited | Temperature sensor using digital double sampling |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01254823A (en) | 1989-10-11 |
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