JPH0798652B2 - Method and apparatus for producing silicon dioxide film - Google Patents
Method and apparatus for producing silicon dioxide filmInfo
- Publication number
- JPH0798652B2 JPH0798652B2 JP1249657A JP24965789A JPH0798652B2 JP H0798652 B2 JPH0798652 B2 JP H0798652B2 JP 1249657 A JP1249657 A JP 1249657A JP 24965789 A JP24965789 A JP 24965789A JP H0798652 B2 JPH0798652 B2 JP H0798652B2
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- silicon dioxide
- treatment liquid
- treatment
- tank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims description 112
- 239000000377 silicon dioxide Substances 0.000 title claims description 54
- 235000012239 silicon dioxide Nutrition 0.000 title claims description 54
- 238000000034 method Methods 0.000 title description 18
- 239000007788 liquid Substances 0.000 claims description 101
- 239000002253 acid Substances 0.000 claims description 14
- 238000004519 manufacturing process Methods 0.000 claims description 14
- 229920006395 saturated elastomer Polymers 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 12
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical class F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims description 10
- 238000002360 preparation method Methods 0.000 claims description 8
- 238000003860 storage Methods 0.000 claims description 8
- 238000001914 filtration Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 4
- 238000007654 immersion Methods 0.000 claims description 4
- 238000001816 cooling Methods 0.000 claims description 3
- 238000007598 dipping method Methods 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- MNTPMEHIQKUBIC-UHFFFAOYSA-N silicon;hydrofluoride Chemical compound F.[Si] MNTPMEHIQKUBIC-UHFFFAOYSA-N 0.000 claims 1
- 239000000243 solution Substances 0.000 description 28
- 230000015572 biosynthetic process Effects 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 7
- 238000000576 coating method Methods 0.000 description 7
- 239000002245 particle Substances 0.000 description 5
- 238000000151 deposition Methods 0.000 description 4
- 230000008021 deposition Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009738 saturating Methods 0.000 description 2
- 229910002027 silica gel Inorganic materials 0.000 description 2
- 239000000741 silica gel Substances 0.000 description 2
- ABTOQLMXBSRXSM-UHFFFAOYSA-N silicon tetrafluoride Chemical compound F[Si](F)(F)F ABTOQLMXBSRXSM-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 239000012047 saturated solution Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Silicon Compounds (AREA)
Description
【発明の詳細な説明】 [産業上の利用分野] 本発明は二酸化珪素被膜の製造方法及び装置に関し、特
に二酸化珪素の珪弗化水素酸溶液への溶解度の温度依存
性を利用した珪弗化水素酸の二酸化珪素過飽和溶液と基
材とを接触させて基材表面に二酸化珪素被膜を製造する
方法及び装置の改良法に関する。Description: TECHNICAL FIELD The present invention relates to a method and an apparatus for producing a silicon dioxide film, and more particularly to silicofluorination utilizing the temperature dependence of the solubility of silicon dioxide in a hydrosilicofluoric acid solution. The present invention relates to an improved method and apparatus for producing a silicon dioxide film on the surface of a substrate by contacting the substrate with a supersaturated solution of hydrogen acid in silicon dioxide.
[従来の技術] 二酸化珪素被膜形成方法として、真空蒸着、スパッタ
ー、CVD、浸漬塗布法(ディッピング法)のほか、装置
が簡便でありかつ大きな基材への二酸化珪素被膜形成が
可能な方法として二酸化珪素が過飽和状態となった珪弗
化水素酸溶液を含む処理液に基材を浸漬して基材表面に
二酸化珪素被膜を析出させる方法(以後析出法と呼ぶ)
が知られている。(例えば特開昭60−33233) また析出法のうち特に廃液処理の必要がなくひいては製
造コストが低いという利点を有する、二酸化珪素の珪弗
化水素酸溶液への溶解度の温度依存性を利用した珪弗化
水素酸の二酸化珪素飽和溶液を含む処理液に基材を浸漬
する方法(特開昭61−281047)およびその方法に適した
二酸化珪素被膜の製造装置(実開昭63−102738)が知ら
れている。[Prior Art] As a method for forming a silicon dioxide film, in addition to vacuum vapor deposition, sputtering, CVD, and dip coating (dipping method), a method for forming a silicon dioxide film on a large substrate with a simple apparatus is available. A method of immersing a substrate in a treatment solution containing a hydrofluoric acid solution in which silicon is supersaturated to deposit a silicon dioxide film on the surface of the substrate (hereinafter referred to as a deposition method)
It has been known. (For example, Japanese Patent Laid-Open No. 60-33233) In addition, among the precipitation methods, the temperature dependence of the solubility of silicon dioxide in a hydrosilicofluoric acid solution, which has the advantage of not requiring waste liquid treatment and thus low manufacturing cost, was used. A method for immersing a substrate in a treatment solution containing a saturated solution of hydrosilicofluoric acid in silicon dioxide (JP-A-61-281047) and an apparatus for producing a silicon dioxide film suitable for the method (Shokai-63-102738) are provided. Are known.
上記の二酸化珪素被膜製造装置は、基材を浸漬する処理
槽と処理液調合槽、処理液予備加熱槽からなり、処理液
はこれら3つの槽の間を循環され、常に二酸化珪素が過
飽和状態となった処理液を処理槽内に導入することによ
り長時間にわたり連続的かつ安定した速度で被膜の製造
を行うことができる。さらにその経路途中に設けられた
フィルターにて粒子を濾過し、析出速度を早めても平滑
な表面を持つ被膜を得ることができる。The above-mentioned silicon dioxide film production apparatus comprises a treatment tank for immersing a base material, a treatment liquid preparation tank, and a treatment liquid preheating tank. The treatment liquid is circulated between these three tanks, and the silicon dioxide is always in a supersaturated state. By introducing the treated liquid into the treatment tank, the coating can be produced continuously and at a stable rate for a long time. Furthermore, the particles having a smooth surface can be obtained by filtering the particles with a filter provided in the middle of the route and increasing the deposition rate.
[発明が解決しようとする問題点] しかし上記の製造装置は、フィルターによる粒子の濾過
と処理液の調合を1つの循環経路で行うため、循環され
る処理液の全量(処理槽内の処理液量に対し3%/min以
上)を一旦冷却し二酸化珪素を飽和溶解してから再度加
熱しなければならず、加熱及び冷却に要する費用が高く
なりひいては被膜の製造コストが高くなるといった欠点
があった。[Problems to be Solved by the Invention] However, in the above-described manufacturing apparatus, since the particles are filtered by the filter and the treatment liquid is mixed in one circulation path, the total amount of the treatment liquid circulated (the treatment liquid in the treatment tank is (3% / min or more with respect to the amount) must be once cooled to saturate and dissolve silicon dioxide, and then heated again, which has the disadvantage that the cost required for heating and cooling increases, which in turn increases the manufacturing cost of the coating. It was
[問題点を解決するための手段] 本発明は上記の問題点を解決するために、二酸化珪素が
略飽和状態となった珪弗化水素酸溶液の溶液温度を上昇
させて得られる二酸化珪素の過飽和状態である珪弗化水
素酸溶液を含む処理液と基材とを接触させて基材表面に
二酸化珪素を析出させる二酸化珪素被膜の製造方法およ
び装置において、溶液温度を上昇させることにより二酸
化珪素が過飽和状態となった処理槽内の処理液に対し、
低温において二酸化珪素が略飽和状態である珪弗化水素
酸溶液を添加し処理槽内の処理液中の二酸化珪素を過飽
和状態に保つことにより、長期に渡り安定した速度で二
酸化珪素被膜を製造する方法およびその方法に適した装
置を提供するものである。[Means for Solving the Problems] In order to solve the above problems, the present invention provides a silicon dioxide obtained by raising the solution temperature of a hydrosilicofluoric acid solution in which silicon dioxide is in a substantially saturated state. In a method and an apparatus for producing a silicon dioxide film in which a treatment solution containing a hydrofluoric acid solution in a supersaturated state is brought into contact with a substrate to deposit silicon dioxide on the surface of the substrate, the temperature of the solution is raised to raise the temperature of the solution. For the processing liquid in the processing tank that became supersaturated,
A silicon dioxide film is produced at a stable rate over a long period of time by adding a hydrosilicofluoric acid solution in which silicon dioxide is almost saturated at low temperature and keeping the silicon dioxide in the treatment liquid in the treatment tank in a supersaturated state. A method and an apparatus suitable for the method are provided.
ここで略飽和状態とは完全な飽和状態及びほぼ飽和に近
い状態を含めた言葉であり、本発明において略飽和状態
としては、完全飽和状態であることが好ましい。Here, the term “substantially saturated state” is a term that includes a completely saturated state and a state almost close to saturation, and in the present invention, the substantially saturated state is preferably a fully saturated state.
この方法において処理槽内の処理液を一定量に保つた
め、添加された処理液と同量を処理槽から排出すること
が必要である。また、平滑な表面を持つ被膜を得るため
上記に示した処理液添加の経路とは別に、処理液濾過用
にメッシュ径が1.5μm以下のフィルターを備えた経路
を設け1分あたりに処理槽内の処理液量の3%以上を循
環する必要がある。In this method, in order to keep the treatment liquid in the treatment tank at a constant amount, it is necessary to discharge the same amount as the added treatment liquid from the treatment tank. In addition to the above-mentioned route for adding the treatment liquid to obtain a coating having a smooth surface, a route provided with a filter having a mesh diameter of 1.5 μm or less for filtering the treatment liquid is provided in the treatment tank per minute. It is necessary to circulate 3% or more of the treatment liquid amount.
ここで、添加される処理液の温度T1は35℃以下であり、
処理槽内の処理液温度T2は70℃以下であり、処理槽内の
処理液温度と添加される処理液温度との差(T2−T1)は
10℃以上であることが処理液からの四弗化珪素蒸気の発
生の抑制による処理液濃度変化の低減や二酸化珪素被膜
形成速度の点から好ましい。Here, the temperature T1 of the treatment liquid added is 35 ° C. or lower,
The treatment liquid temperature T2 in the treatment tank is 70 ° C or less, and the difference (T2-T1) between the treatment liquid temperature in the treatment tank and the temperature of the added treatment liquid is
It is preferable that the temperature is 10 ° C. or higher from the viewpoint of reducing the change in concentration of the processing solution by suppressing the generation of silicon tetrafluoride vapor from the processing solution and the rate of forming a silicon dioxide film.
また処理液の添加速度は速い方が、珪弗化水素酸溶液に
溶解した二酸化珪素を多く処理槽内に供給することにな
るので、より高い成膜速度が得られる。ただし、1分あ
たりに添加される処理液の量が処理槽内の処理液量に対
して1.2%以上となると、成膜速度は上昇せず、製造コ
ストが高くなるだけであるので好ましくない。この理由
に関してはよく分かってないが、処理液の添加量の増加
と共に処理槽内の二酸化珪素が過飽和状態である処理液
の排出量も多くなるためと予想される。Further, the higher the addition rate of the treatment liquid is, the more silicon dioxide dissolved in the hydrosilicofluoric acid solution is supplied into the treatment tank, so that a higher film formation rate can be obtained. However, if the amount of the treatment liquid added per minute is 1.2% or more with respect to the amount of the treatment liquid in the treatment tank, the film formation rate does not increase and the manufacturing cost only increases, which is not preferable. Although the reason for this is not well understood, it is expected that the amount of the treatment liquid in which the silicon dioxide in the treatment tank is in a supersaturated state increases as the amount of the treatment liquid added increases.
また処理液の添加は連続あるいは不連続でもかまわない
が、不連続に添加した場合には処理液中に溶解する二酸
化珪素の濃度分布が起こり、高濃度の部分にて二酸化珪
素の粒子が発生し易くなるので好ましくない。Further, the treatment liquid may be added continuously or discontinuously. However, when the treatment liquid is added discontinuously, a concentration distribution of silicon dioxide dissolved in the treatment liquid occurs, and silicon dioxide particles are generated in a high concentration portion. It is not preferable because it becomes easy.
本発明に用いる珪弗化水素酸の二酸化珪素略飽和溶液
は、例えば珪弗化水素酸溶液に二酸化珪素(例えば工業
用シリカゲル、石英ガラス等)を溶解することで得られ
る。また珪弗化水素酸の濃度は任意のものが使用できる
が、1モル/以上の濃度が工業的に使用できる速さの
析出速度が得られるので好ましい。尚、3モル/より
高濃度の場合には四弗化珪素蒸気の発生が激しくなり被
膜の成膜速度の低下を導くが、気液の界面を制御するこ
とにより解消可能である。The substantially saturated silicon dioxide solution of hydrosilicofluoric acid used in the present invention can be obtained, for example, by dissolving silicon dioxide (for example, industrial silica gel, quartz glass, etc.) in a hydrofluoric acid solution. Any concentration of hydrosilicofluoric acid can be used, but a concentration of 1 mol / mol or more is preferable because a deposition rate that is industrially usable can be obtained. When the concentration is higher than 3 mol / mol, silicon tetrafluoride vapor is generated violently and leads to a decrease in the film forming rate of the coating film, but this can be solved by controlling the gas-liquid interface.
[作用] 本発明は、二酸化珪素の珪弗化水素酸溶液への溶解度の
温度依存性を利用した二酸化珪素被膜の製造方法および
装置において、処理槽内の温度上昇により二酸化珪素の
過飽和状態となった処理液に対して、低温において二酸
化珪素が略飽和状態である処理液を1分あたりに処理槽
内の処理液全量の1.2%以下を添加するだけで工業的に
使用可能な成膜速度を得られることを見いだすことによ
りなされた。[Operation] In the present invention, in a method and an apparatus for producing a silicon dioxide film utilizing the temperature dependence of the solubility of silicon dioxide in a hydrosilicofluoric acid solution, the silicon dioxide becomes supersaturated due to the temperature rise in the treatment tank. To the above processing solution, simply add 1.2% or less of the total amount of the processing solution in the processing tank per minute to a processing solution in which silicon dioxide is almost saturated at low temperature, and a film formation rate that is industrially usable is obtained. It was done by finding out what could be obtained.
この方法により、長期間にわたり連続的にかつ安定した
成膜速度で被膜の製造を安価にて行うことができる。ま
た、処理液の添加の際に同時に排出された処理液を冷却
し二酸化珪素の飽和溶解を行うことにより、再度添加用
の処理液として用いることができ、さらに製造コストを
下げることが可能である。By this method, it is possible to inexpensively produce a coating film continuously and at a stable film formation rate for a long period of time. Further, by cooling the treatment liquid discharged at the same time as the addition of the treatment liquid and saturating dissolution of silicon dioxide, the treatment liquid can be used again as a treatment liquid for addition, and the manufacturing cost can be further reduced. .
[実施例1] 処理液調合槽(1)にて−3℃の温度で2モル/濃度
の珪弗化水素酸に二酸化珪素(工業用シリカゲル)を飽
和溶解して処理液を調合し、得られた処理液全量を送液
ポンプ(12A)にて送液管(11A)を通し処理液保存槽
(2)に送液した。この際濾過フィルター(13A)に
て、処理液を調合した際に溶け残った二酸化珪素粒子を
濾過した。Example 1 A treatment liquid was prepared by saturating and dissolving silicon dioxide (industrial silica gel) in hydrofluoric acid of 2 mol / concentration at a temperature of −3 ° C. in the treatment liquid preparation tank (1). The whole amount of the treated liquid thus obtained was fed to the treated liquid storage tank (2) through the liquid feed pipe (11A) by the liquid feed pump (12A). At this time, the silicon dioxide particles remaining undissolved when the treatment liquid was prepared were filtered with a filtration filter (13A).
次に送液ポンプ(12B)にて送液管(11B)を通し処理液
保存槽内の処理液を、処理槽(3)の整流部(9)へ1.
7送液した。送液後、送液ポンプ(12D)にて送液管
(11D)を通し処理液を処理槽の添加部(10)から処理
槽の整流部へ170ml/minの速度で循環を開始しその経路
途中に設けられたフィルター(13Bまたは13C)にて処理
液を濾過するとともに、ヒーター(6)にて処理槽内の
処理液を加熱し60℃に昇温及びその温度で保持した。Next, the processing liquid in the processing liquid storage tank is passed through the liquid transfer pipe (11B) by the liquid transfer pump (12B) to the rectification section (9) of the processing tank (3) 1.
7 liquids were delivered. After sending the solution, the solution sending pump (12D) passes the solution sending pipe (11D) to start circulating the processing solution from the addition part (10) of the processing tank to the rectification part of the processing tank at a rate of 170 ml / min. The treatment liquid was filtered with a filter (13B or 13C) provided on the way, and the treatment liquid in the treatment tank was heated with a heater (6) to raise the temperature to 60 ° C. and hold it at that temperature.
また、それと同時に送液ポンプ(12B)にて処理液を処
理液保存槽からそれぞれ5,10,20,30ml/min(これらは処
理槽内の処理液量に対しそれぞれ0.3,0.6,1.2,1.8%/mi
nに該当する)の速度で処理槽の添加部(10)に添加
し、同時に送液ポンプ(12C)にてそれぞれ添加と同じ
速度で処理槽の浸漬部のオーバーフロー部より処理液を
送液管(11C)を通し処理液調合槽へ排出した。排出さ
れた処理液を処理液調合槽にて再度冷却し二酸化珪素を
飽和溶解した。処理液調合槽、処理液保存槽そして処理
槽間の処理液の送液は、以後被膜の製造を終了するまで
行った。At the same time, the processing liquid is transferred from the processing liquid storage tank by the liquid feed pump (12B) to 5, 10, 20, 30 ml / min (these are 0.3, 0.6, 1.2, 1.8% of the processing liquid amount in the processing tank, respectively). % / Mi
(corresponding to n) is added to the addition part (10) of the processing tank at the same speed, and at the same time, the processing liquid is sent from the overflow part of the immersion part of the processing tank at the same speed as each addition by the liquid supply pump (12C). It was passed through (11C) and discharged to the treatment liquid preparation tank. The discharged treatment liquid was cooled again in the treatment liquid preparation tank to saturate and dissolve silicon dioxide. The treatment liquid preparation tank, the treatment liquid storage tank, and the feeding of the treatment liquid between the treatment tanks were performed thereafter until the production of the film was completed.
二酸化珪素被膜を成膜させる基材には25mm×25mmのシリ
コンウエハーを用い、処理液の加熱開始から1時間毎に
浸漬し、各々の基材上に成膜した二酸化珪素被膜の膜厚
から成膜速度の経時変化を調べた。A 25 mm x 25 mm silicon wafer is used as the substrate on which the silicon dioxide film is formed, and it is immersed every hour after the heating of the treatment liquid is started. The change with time of the film velocity was examined.
上記の方法によって得られた被膜の24時間の平均成膜速
度の結果を第1表に示す。Table 1 shows the results of the average film formation rate of the coating film obtained by the above method for 24 hours.
この結果より従来のように循環される処理液全量(処理
槽内の処理液量の3%以上)を冷却し二酸化珪素を飽和
溶解しなくても、1分あたりに処理槽内の処理液全量の
1.2%以下の量を添加するだけで、工業用に用いるのに
十分な成膜速度が得られることが分かる。 From this result, it is possible to cool the total amount of the processing liquid (3% or more of the amount of the processing liquid in the processing tank) circulated as in the conventional method and to dissolve the silicon dioxide in a saturated manner, so that the total amount of the processing liquid in the processing tank is reduced per minute. of
It can be seen that a film formation rate sufficient for industrial use can be obtained only by adding an amount of 1.2% or less.
[実施例2] 実施例1と同様の方法にて二酸化珪素被膜の製造を行な
った。尚、処理液の添加は10ml/min(処理槽内の処理液
量に対し0.6%/min)の速さで72時間行なった。Example 2 A silicon dioxide film was manufactured in the same manner as in Example 1. The addition of the treatment liquid was performed at a rate of 10 ml / min (0.6% / min with respect to the treatment liquid amount in the treatment tank) for 72 hours.
上記の方法において、被膜製造開始からの時間に対する
成膜速度の結果を第1図に示す。In the above method, the result of the film forming rate with respect to the time from the start of film production is shown in FIG.
この結果により、処理液を添加する方法にて長期にわた
り成膜速度が劣ることなく被膜の製造が行なうことが可
能であることがわかる。From this result, it is understood that the method of adding the treatment liquid enables the production of the coating film without deteriorating the deposition rate for a long period of time.
[発明の効果] 本発明によれば、処理槽内の高温で過飽和状態の処理液
に対しさらに低温で略飽和状態の処理液を添加するだけ
で長時間にわたり安定した速度で被膜の形成を行うこと
ができる。EFFECTS OF THE INVENTION According to the present invention, a film is formed at a stable rate for a long time only by adding a treatment solution in a supersaturated state at a high temperature in a treatment tank to a treatment solution in a substantially saturated state at a lower temperature. be able to.
さらにその添加量は1分あたりに処理槽内の全処理液量
の1.2%以下であるので非常に製造コストの低い二酸化
珪素被膜を形成することができる。Furthermore, since the added amount is 1.2% or less of the total amount of the processing liquid in the processing tank per minute, it is possible to form a silicon dioxide film having a very low manufacturing cost.
第1図は、本発明の二酸化珪素被膜製造装置を示す概略
系統図である。 第2図は、本発明による二酸化珪素被膜の製造方法にお
ける時間経過と連続成膜状況の結果を示す図である。 1……処理液調合槽,2……処理液保存槽 3……処理槽,4……冷却器 5……スターラー,6……ヒーター 7……浸漬部,8……整流板 9……整流部,10……添加部 11……送液管,12……送液ポンプ 13……濾過フィルター,14……基材 15……コック(3方),16……洗浄液槽FIG. 1 is a schematic system diagram showing a silicon dioxide film manufacturing apparatus of the present invention. FIG. 2 is a diagram showing the results of the time lapse and continuous film formation in the method for producing a silicon dioxide film according to the present invention. 1 …… Treatment liquid mixing tank, 2 …… Treatment liquid storage tank 3 …… Treatment tank, 4 …… Cooler 5 …… Stirrer, 6 …… Heater 7 …… Dip part, 8 …… Rectifier plate 9 …… Rectification Part, 10 …… Addition part 11 …… Liquid supply pipe, 12 …… Liquid supply pump 13 …… Filtration filter, 14 …… Base material 15 …… Cock (3 ways), 16 …… Cleaning liquid tank
Claims (2)
素酸溶液の溶液温度を上昇させて得られる二酸化珪素の
過飽和状態の珪弗化水素酸溶液を含む処理液と基材とを
接触させて基材表面に二酸化珪素を析出させる二酸化珪
素被膜の製造方法において、基材を接触させた後の処理
液温度を高温に維持した状態で該処理液中に、別途低温
において調整した二酸化珪素が略飽和状態である珪弗化
水素酸溶液を添加することにより、該処理液中の二酸化
珪素を過飽和状態に保つことを特徴とする二酸化珪素被
膜の製造方法。1. A treatment solution containing a supersaturated hydrofluoric acid solution of silicon dioxide obtained by raising the solution temperature of a hydrosilicofluoric acid solution in which silicon dioxide is substantially saturated, and a substrate. In the method for producing a silicon dioxide film in which silicon dioxide is deposited on the surface of a base material by contacting, the temperature of the treatment liquid after contacting the base material is maintained at a high temperature, and the temperature of the treatment liquid is adjusted separately at a low temperature. A method for producing a silicon dioxide film, characterized in that a silicon hydrofluoric acid solution in which silicon is substantially saturated is added to maintain silicon dioxide in the treatment liquid in a supersaturated state.
素酸溶液の溶液温度を上昇させて得られる二酸化珪素の
過飽和状態の珪弗化水素酸溶液を含む処理液と基材とを
接触させて基材表面に二酸化珪素を析出させる二酸化珪
素被膜の製造装置において、珪弗化水素酸溶液に二酸化
珪素を溶解し処理液を作製するために撹拌器(5)を有
し珪弗化水素酸溶液を恒温に保つための加熱及び/また
は冷却手段を有する恒温槽内に設けられた処理液調合槽
(1)と、調合された処理液を恒温に保つため同じく恒
温槽内に設けられた処理液保存槽(2)と、基材表面に
二酸化珪素被膜を形成するために基材を浸漬する浸漬部
(7)と、浸漬部に流れ込む処理液を流れを整えるため
に浸漬部に連なって設けられた整流部(9)と、浸漬部
から処理液がオーバーフローにより流れ込みさらに処理
液が添加される添加部(10)からなり、浸漬部と整流部
との境界に設けられた整流板(8)を有し、さらに処理
液温度を所定の温度まで上昇させ恒温に保つための加熱
手段を有する処理槽(3)からなり、さらに処理槽内の
処理液を循環するための送液管(11D)と送液管の途中
に設けられた送液ポンプ(12D)及び処理液濾過フィル
ター(13Bおよび13C)を有し、さらに処理液調合槽内の
処理液を処理液保存槽に送液するための送液管(11A)
と送液管の途中に設けられた送液ポンプ(12A)及び所
液濾過フィルター(13A)を有し、さらに処理液保存槽
内の処理液を処理槽整流部へ、また処理槽浸漬部内の処
理液を処理液調合槽へ送るための送液管(それぞれ11B,
11C)と送液管の途中にそれぞれ設けられた送液ポンプ
(それぞれ12B,12C)を有する二酸化珪素被膜の製造装
置。2. A treatment liquid containing a supersaturated hydrofluoric acid solution of silicon dioxide obtained by raising the solution temperature of a hydrosilicofluoric acid solution in which silicon dioxide is substantially saturated, and a substrate. An apparatus for producing a silicon dioxide film, which is brought into contact with and deposits silicon dioxide on the surface of a substrate, has a stirrer (5) for preparing a treatment liquid by dissolving silicon dioxide in a hydrosilicofluoric acid solution, A treatment liquid preparation tank (1) provided in a constant temperature bath having heating and / or cooling means for keeping the hydrous acid solution at a constant temperature, and a treatment liquid preparation bath (1) also provided in the constant temperature bath for keeping the prepared treatment liquid at a constant temperature. A treatment liquid storage tank (2), an immersion part (7) for immersing the base material to form a silicon dioxide film on the surface of the base material, and a immersion part for arranging the flow of the processing liquid flowing into the immersion part. Processing liquid from the rectifying section (9) provided in the Flow-flowing further comprises the addition part (10) to which the processing liquid is added, and has a straightening plate (8) provided at the boundary between the dipping part and the straightening part, and further raises the processing liquid temperature to a predetermined temperature. It comprises a processing tank (3) having a heating means for keeping it at a constant temperature, and further, a liquid sending pipe (11D) for circulating the processing liquid in the processing tank, and a liquid sending pump (12D) provided in the middle of the liquid sending pipe. ) And a treatment liquid filtration filter (13B and 13C), and a liquid feed pipe (11A) for feeding the treatment liquid in the treatment liquid preparation tank to the treatment liquid storage tank.
And a liquid feed pump (12A) and a liquid filtration filter (13A) provided in the middle of the liquid feed pipe, and further, the treatment liquid in the treatment liquid storage tank to the treatment tank rectification unit and the treatment tank dipping unit. Liquid transfer pipes (11B, 11B,
11C) and a liquid feed pump (12B and 12C, respectively) provided in the middle of the liquid feed pipe, for producing a silicon dioxide film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1249657A JPH0798652B2 (en) | 1989-09-26 | 1989-09-26 | Method and apparatus for producing silicon dioxide film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1249657A JPH0798652B2 (en) | 1989-09-26 | 1989-09-26 | Method and apparatus for producing silicon dioxide film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03112806A JPH03112806A (en) | 1991-05-14 |
| JPH0798652B2 true JPH0798652B2 (en) | 1995-10-25 |
Family
ID=17196281
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1249657A Expired - Fee Related JPH0798652B2 (en) | 1989-09-26 | 1989-09-26 | Method and apparatus for producing silicon dioxide film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0798652B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5042252B2 (en) * | 2009-02-20 | 2012-10-03 | 学校法人 芝浦工業大学 | Glass material recovery method |
-
1989
- 1989-09-26 JP JP1249657A patent/JPH0798652B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03112806A (en) | 1991-05-14 |
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