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JPH0821702B2 - Solid-state imaging device and manufacturing method thereof - Google Patents
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JPH0821702B2 - Solid-state imaging device and manufacturing method thereof - Google Patents

Solid-state imaging device and manufacturing method thereof

Info

Publication number
JPH0821702B2
JPH0821702B2 JP62220770A JP22077087A JPH0821702B2 JP H0821702 B2 JPH0821702 B2 JP H0821702B2 JP 62220770 A JP62220770 A JP 62220770A JP 22077087 A JP22077087 A JP 22077087A JP H0821702 B2 JPH0821702 B2 JP H0821702B2
Authority
JP
Japan
Prior art keywords
solid
envelope
imaging device
state imaging
lead frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62220770A
Other languages
Japanese (ja)
Other versions
JPS6464254A (en
Inventor
滋 佐藤
邦明 鶴島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62220770A priority Critical patent/JPH0821702B2/en
Publication of JPS6464254A publication Critical patent/JPS6464254A/en
Publication of JPH0821702B2 publication Critical patent/JPH0821702B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は電荷結合素子(CCD)を用いた固体撮像装
置、特にこの電荷結合素子を気密封止するようにした固
体撮像装置及びその製造方法に関する。
The present invention relates to a solid-state imaging device using a charge-coupled device (CCD), and more particularly to a solid-state imaging device in which the charge-coupled device is hermetically sealed. The present invention relates to a device and a manufacturing method thereof.

(従来の技術) 従来、上記固体撮像装置は、一般にセラミック積層体
で構成されていたが、このセラミックを使用したものは
かなり高価となってしまうため、低廉化を図るため、例
えば第7図に示すようなプラスチックを使用したものが
開発されている。
(Prior Art) Conventionally, the above-mentioned solid-state image pickup device is generally composed of a ceramic laminated body. However, since the one using this ceramic is considerably expensive, for example, as shown in FIG. Those using plastics as shown have been developed.

即ち、不透明なプラスチック材で成形され上方に開口
した有底筒状の外囲器1の内部には、その側壁からリー
ドフレーム2のリード2aが導入され、この外囲器1の中
央部に位置してリードフレーム2の中央のベッド部2bが
配置されている。
That is, the lead 2a of the lead frame 2 is introduced from the side wall into the inside of the bottomed cylindrical envelope 1 that is formed of an opaque plastic material and opens upward, and is located at the center of the envelope 1. Then, the central bed portion 2b of the lead frame 2 is arranged.

そして、このベッド部2bの中央部には、CCDイメージ
センサの半導体チップ(固体撮像素子)3が、導電性接
着剤層4を介して接着され、この半導体チップ3の内部
表面に形成された複数の電極(図示せず)と、外囲器1
の側壁から導入されたリード2aの先端のインナーリード
とはアルミニウム、金等のボンディングワイヤ5により
夫々接続されている。
A semiconductor chip (solid-state image sensor) 3 of a CCD image sensor is bonded to the center of the bed 2b via a conductive adhesive layer 4, and a plurality of semiconductor chips 3 are formed on the inner surface of the semiconductor chip 3. Electrode (not shown) and envelope 1
The inner lead at the tip of the lead 2a introduced from the side wall of the is connected by a bonding wire 5 of aluminum, gold or the like, respectively.

更に、外囲器1の上面、即ち光を導入する側には透明
基板6がエポキシ樹脂接着剤7等により固着されて固体
撮像装置が構成されている。
Further, the transparent substrate 6 is fixed to the upper surface of the envelope 1, that is, the side on which light is introduced, by an epoxy resin adhesive 7 or the like to form a solid-state imaging device.

また、出願人は先に特願昭60-131371号(特開昭61-28
8670号)として、リードフレームのベッド部にマウント
され、このリードフレームのインナーリードとボンディ
ングワイヤで接続された固体撮像素子と、この固体撮像
素子及び前記インナーリードを封止する透明な樹脂から
なる封止部と、この封止部の外周部分を覆いかつ前記固
体撮像素子への光の入射部となる開口部を備えた不透明
な樹脂からなる被覆部とを備え前記封止部が前記開口部
に突出した突起を有するものを提案した。
In addition, the applicant previously filed Japanese Patent Application No. 60-131371 (Japanese Patent Application Laid-Open No. 61-28
No. 8670), a solid-state image sensor mounted on the bed portion of the lead frame and connected to the inner leads of the lead frame by bonding wires, and a seal made of a transparent resin that seals the solid-state image sensor and the inner leads. A stopper and a cover made of an opaque resin that covers an outer peripheral portion of the sealing portion and has an opening that serves as a light incident portion to the solid-state imaging device. One with a protruding protrusion was proposed.

(発明が解決しようとする問題点) しかしながら、上記第7図に示すものにおいては、リ
ードと外囲器の樹脂界面及び透明基板を接着したエポキ
シ樹脂等の接着剤の界面より外囲器の内部に水が浸入
し、外囲器上面に接着した透明基板の内面に水滴として
付着してしまい、画像の劣化の要因となって歩留り低下
を招くばかりでなく、エポキシ樹脂接着剤等を用いて接
着した部分でリーク不良等が発生し、組立て工程の歩留
り低下の要因の一つとなってしまうといった問題点があ
った。
(Problems to be Solved by the Invention) However, in the structure shown in FIG. 7, the inside of the envelope is closer to the resin interface between the lead and the envelope and the interface of the adhesive such as epoxy resin to which the transparent substrate is attached. Water infiltrates into the inner surface of the transparent substrate and adheres to the inner surface of the transparent substrate as water droplets, causing deterioration of the image and lowering the yield. There is a problem in that a leak failure or the like occurs in the portion where the above occurs, which is one of the factors that reduce the yield of the assembly process.

また、特願昭60-131371号に記載のものは、この樹脂
は一般に金型でモールド成形したモールド製品であるた
め、たとえいくら金型をきれいに清掃しても、多数のご
みや気泡がこの樹脂の内部に混入したり付着してしま
い、ラインセンサとして使用するには最適でも、分解能
を高めるため、一般に画像密度が高いエリアセンサとし
て使用するには歩留りがかなり低くなってしまうことが
分った。
In addition, since the resin described in Japanese Patent Application No. 60-131371 is a molded product that is generally molded with a mold, no matter how much the mold is cleanly cleaned, a large number of dust and air bubbles It was found to be mixed or adhered to the inside of the device, and it is suitable for use as a line sensor, but in order to improve the resolution, the yield is generally considerably low for use as an area sensor with high image density. .

本発明は上記に鑑み、固体撮像素子を気密封止すると
ともに、リードと樹脂界面等から外囲器の内部への水の
浸入によって透明基板の内面等に水滴が発生し、この水
滴によって画質が低下してしまうことを阻止することが
でき、しかもエリヤセンサとしてもかなり高い歩留りで
使用することができるものを提供することを目的とす
る。
In view of the above, the present invention not only hermetically seals a solid-state image sensor, but also causes water droplets to be generated on the inner surface of the transparent substrate due to the intrusion of water from the lead-resin interface or the like into the inside of the envelope, and the water droplets can improve the image quality. It is an object of the present invention to provide an area sensor which can be prevented from being lowered and which can be used as an area sensor with a considerably high yield.

〔発明の構成〕[Structure of Invention]

(問題点を解決するための手段) 本発明は上記目的を達成するために、上、下面が解放
された枠状を有し側壁を貫通したリードフレームにより
内部空間が上下に区画された外囲器を設け、前記リード
フレームのベッド部上にマウントされた固体撮像素子の
電極と前記リードフレームのインナーリードとを電気的
に接続し、前記内部空間透明樹脂を流入させ硬化させて
前記固体撮像素子を樹脂封止したことを特徴とする固体
撮像装置、及び上、下面が開放された枠状を有すし側壁
を貫通したリードフレームにより内部空間が上下に区画
された外囲器の内部に、前記リードフレームのベッド部
上に固体撮像素子をマウントし、前記固体撮像素子の電
極と前記リードフレームとをボンディングワイヤで接続
し、前記ベッド部にマウントされた固体撮像素子の光を
導入する側が下方に向くように前記外囲器を倒立させ
て、平坦に形成した板状の表面に前記外囲器の前記上面
を当接させて載置し、前記外囲器の前記下面の上方から
前記外囲器の内部に液状の透明樹脂を流入させこの透明
樹脂を硬化させることを特徴とする固体撮像装置の製造
方法をその要旨とするものである。
(Means for Solving the Problems) In order to achieve the above-mentioned object, the present invention has an outer circumference in which an inner space is vertically divided by a lead frame having upper and lower surfaces opened and penetrating a side wall. And electrically connecting the electrodes of the solid-state imaging device mounted on the bed portion of the lead frame and the inner leads of the lead frame, and allowing the transparent resin in the internal space to flow in and be cured to thereby solid-state imaging device. A solid-state imaging device characterized by resin-sealing, and the inside and outside of an envelope in which an internal space is vertically divided by a lead frame having a frame shape whose upper and lower surfaces are opened and which penetrates a side wall, The solid-state imaging device is mounted on the bed portion of the lead frame, the electrodes of the solid-state imaging device and the lead frame are connected by bonding wires, and the solid-state imaging device mounted on the bed portion is mounted. The envelope is inverted so that the light-introducing side of the image element faces downward, and the flat plate-shaped surface is placed so that the upper surface of the envelope is in contact with the envelope. A method of manufacturing a solid-state imaging device is characterized in that a liquid transparent resin is caused to flow into the inside of the envelope from above the lower surface of the container and the transparent resin is cured.

(作用) 而して、固体撮像素子を液体の透明樹脂を流入させ硬
化させて樹脂封止することにより、固体撮像素子を気密
的に封止し、しかも、この透明樹脂の内部に水が浸入し
てしまうことを確実に防止することにより、水滴の発生
を防止して良好な画質を得るとともに、エポキシ樹脂接
着剤等の接着剤を不要となして、リーク不良を無くし、
更に多数のごみや気泡がこの透明樹脂の内部に混入した
り付着してしまうことを確実に防止して、エリヤセンサ
として使用したときの歩留りを高めようにしたものであ
る。
(Function) Then, the solid-state image sensor is hermetically sealed by sealing the resin by injecting a liquid transparent resin and hardening the resin, and water penetrates into the transparent resin. By reliably preventing the occurrence of water droplets, it is possible to prevent generation of water droplets and obtain good image quality, eliminate the need for adhesives such as epoxy resin adhesives, and eliminate leak defects.
Further, it is possible to surely prevent a large number of dusts and bubbles from being mixed in or attached to the inside of the transparent resin, and to improve the yield when used as an area sensor.

(実施例) 第1図は本発明に係る固体撮像装置の第1の実施例を
示し、中空厚肉筒状で、不透明な例えば熱可塑性樹脂で
成形されたプラスチックパッケージの外囲器1の内部に
は、その側壁からリードフレーム2のリード2aが導入さ
れ、この外囲器1の中央部に位置してリードフレーム2
の中央のベッド部2bが配置されている。
(Embodiment) FIG. 1 shows a first embodiment of a solid-state image pickup device according to the present invention, which is a hollow thick-walled tubular body and the inside of an envelope 1 of an opaque plastic package formed of, for example, a thermoplastic resin. The lead 2a of the lead frame 2 is introduced from the side wall thereof to the lead frame 2 located at the center of the envelope 1.
The bed portion 2b at the center of is arranged.

そして、このベッド部2bの中央部には、CCDイメージ
センサの半導体チップ(固体撮像素子)3が、導電性接
着剤層4を介して接着され、この半導体チップ3の内部
表面に形成された複数の電極(図示せず)と、外囲器1
の側壁から導入されたリード2aの先端のインナーリード
とはアルミニウム又は金等から構成されたボンディング
ワイヤ5により夫々接続されている。
A semiconductor chip (solid-state image sensor) 3 of a CCD image sensor is bonded to the center of the bed 2b via a conductive adhesive layer 4, and a plurality of semiconductor chips 3 are formed on the inner surface of the semiconductor chip 3. Electrode (not shown) and envelope 1
The inner leads at the ends of the leads 2a introduced from the side wall of the are respectively connected by bonding wires 5 made of aluminum, gold or the like.

上記外囲器1の内部には、液状で注入した後に硬化さ
せた、例えばエポキシ樹脂等の透明樹脂8が充填され、
これにより、上記固体撮像素子3及びリード2aの基端の
インナーリードがこの透明樹脂8により樹脂封止されて
いるとともに、この透明樹脂8の上面8aと上記固体撮像
素子3の表面3aとが平行となるよう構成されている。
The inside of the envelope 1 is filled with a transparent resin 8 such as an epoxy resin, which is injected in a liquid state and then cured.
As a result, the solid-state image sensor 3 and the inner leads at the base ends of the leads 2a are resin-sealed with the transparent resin 8, and the upper surface 8a of the transparent resin 8 and the surface 3a of the solid-state image sensor 3 are parallel to each other. Is configured.

第2図は本発明の第2の実施例を示し、外囲器1の上
面側、即ち光を導入する側の上部内周面に段部1bを設
け、この段部1bに、例えばガラス板やプラスチック板等
の透明基板6を収納するとともに、この透明基板6を透
明樹脂8の上面に付着させ、更に必要に応じて、外囲器
1の裏面に透明樹脂8の下面を閉塞する遮光板11を取付
けて、下方からの光の入射を防止したものである。
FIG. 2 shows a second embodiment of the present invention, in which a step portion 1b is provided on the upper surface side of the envelope 1, that is, on the upper inner peripheral surface on the light introducing side, and the step portion 1b is provided with, for example, a glass plate. A light-shielding plate for accommodating the transparent substrate 6 such as a plastic plate or the like, adhering the transparent substrate 6 to the upper surface of the transparent resin 8 and closing the lower surface of the transparent resin 8 to the rear surface of the envelope 1 as necessary. 11 is attached to prevent light from entering from below.

第5図は本発明に係る固体撮像装置の製造方法の一実
施例で、上記第1図に示す固体撮像装置の製造を示すも
のである。
FIG. 5 is an embodiment of a method for manufacturing a solid-state image pickup device according to the present invention, and shows the manufacture of the solid-state image pickup device shown in FIG.

即ち、先ず、リードフレーム2の所定部分をモールド
してこれを支持し上下に連通した外囲器1を形成してお
く。そして、固体撮像素子3をリードフレーム2のベッ
ド部2bの上面にマウントし、この固体撮像素子3の内部
の電極とリードフレーム2のインナーリードとをボンデ
ィングワイヤ5で接続する。この状態で、表面9aを平坦
にして、平行な面を作れるようにした板材9の表面に、
この外囲器1を倒立した状態でこの上面1a、即ち光を導
入する側の面を当接させて載置し、しかる後、注射器10
等により、外囲器1の内部に液体の透明樹脂8を流し込
んで充填し、この透明樹脂8が硬化した後に板体9を除
去することにより固体撮像装置を製造する。
That is, first, a predetermined portion of the lead frame 2 is molded and supported to form the envelope 1 that communicates with the top and bottom. Then, the solid-state imaging device 3 is mounted on the upper surface of the bed portion 2b of the lead frame 2, and the electrodes inside the solid-state imaging device 3 and the inner leads of the lead frame 2 are connected by the bonding wires 5. In this state, the surface 9a is flattened, and the surface of the plate member 9 that is made to be parallel is
In a state where the envelope 1 is upside down, the upper surface 1a, that is, the surface on the light introducing side is brought into contact with and placed, and then the syringe 10
As described above, the liquid transparent resin 8 is poured and filled into the envelope 1, and the plate body 9 is removed after the transparent resin 8 is cured to manufacture the solid-state imaging device.

このようにして、固体撮像装置を製造することによ
り、この製造の際に生じる気泡や内部に混入したゴミ等
を浮き上がらせて光を導入しない裏面側に集め、透明樹
脂8の表面8aと固体撮像素子3との間にこの気泡やゴミ
等が存在してしまうことを極力防止して、気泡やゴミ等
による画像劣化を無くして良好な画像を得るようにする
ことができる。
In this way, by manufacturing the solid-state imaging device, air bubbles generated during the manufacturing, dust mixed in the inside, and the like are raised and collected on the back surface side where light is not introduced, and the front surface 8a of the transparent resin 8 and the solid-state imaging device. It is possible to prevent the presence of air bubbles, dust, and the like between the element 3 and the device 3 as much as possible, and to eliminate deterioration of the image due to the air bubbles, dust, etc., and obtain a good image.

なお、第2図に示す固体撮像装置の製造は、第3図に
示すのとほぼ同様に、透明基板6及びこれを上部内周面
に収納した外囲器1の上面1aを板体9の表面9a上に載置
し、この状態で液体の透明樹脂8を外囲器1の内部に流
し込み、この透明樹脂8を硬化させることにより行う。
In the manufacture of the solid-state imaging device shown in FIG. 2, the transparent substrate 6 and the upper surface 1a of the envelope 1 accommodating the transparent substrate 6 on the inner peripheral surface of the plate body 9 are almost the same as those shown in FIG. It is carried out by placing it on the surface 9a, pouring the liquid transparent resin 8 into the inside of the envelope 1 in this state, and hardening the transparent resin 8.

第3図は本願発明の第1の参考例を示し、上方に開口
した有底筒状の外囲器1′の側壁には、一方を透明樹脂
8の注入用、他方を空気排出用とした2つの穿孔1′c,
1′cが穿設されている。そして、この内部にリードフ
レーム2のリード2aを導入するとともに、中央のベッド
部2bに半導体チップ3を導電性接着剤4を介してマウン
トし、この半導体チップ3内部表面に形成された複数の
電極と、リード2aの先端とをボンディングワイヤ5より
夫々接続し、外囲器1′の開口部内部を上記穿孔1′c
から注入した液状の透明樹脂8を硬化させて樹脂封止し
たものである。
FIG. 3 shows a first reference example of the present invention, in which one side is used for injecting the transparent resin 8 and the other side is used for air discharge on the side wall of the bottomed cylindrical envelope 1 '. Two perforations 1'c,
1'c is drilled. Then, the leads 2a of the lead frame 2 are introduced into the inside, and the semiconductor chip 3 is mounted on the central bed portion 2b via the conductive adhesive 4, and a plurality of electrodes formed on the inner surface of the semiconductor chip 3 are mounted. And the tip of the lead 2a are connected by a bonding wire 5, and the inside of the opening of the envelope 1'is provided with the hole 1'c.
The liquid transparent resin 8 injected from is cured and resin-sealed.

なお、このように液状の透明樹脂8を注入することに
より、気泡やゴミ等の影響を極力少なくして、上記第1
図及び第2図に示すものより外囲器1′をよりインナー
リード側に近付けてこの小形化を図るようにすることが
できる。
By injecting the liquid transparent resin 8 in this way, the influence of air bubbles, dust, etc. is minimized, and the first
The miniaturization can be achieved by bringing the envelope 1'closer to the inner lead side than that shown in FIGS.

第4図は本願発明の第2の参考例を示し、上記第3図
に示す外囲器1′の上部内周面に段部1′bを設け、こ
の段部1′bに透明基板6を収納するとともに、この透
明基板6を透明樹脂8の上面に付着させたものである。
FIG. 4 shows a second reference example of the present invention. A step portion 1'b is provided on the upper inner peripheral surface of the envelope 1'shown in FIG. 3, and the transparent substrate 6 is provided on the step portion 1'b. And the transparent substrate 6 is attached to the upper surface of the transparent resin 8.

第6図は、上記第3図に示す固体撮像装置の製造を示
す本願発明の第3の参考例である。
FIG. 6 is a third reference example of the present invention showing the manufacture of the solid-state imaging device shown in FIG.

即ち、先ず、リードフレーム2の所定部分をモールド
してこれを支持し上方に開口した外囲器1′を形成して
おく。そして、固体撮像素子3をリードフレーム2のベ
ッド部2bの上面にマウントし、この固体撮像素子3の内
部の電極とリードフレーム2のインナーリードとをボン
ディングワイヤ5で接続するとともに、粘着テープ12に
粘着させた透明基板6で外囲器1′の開口部を塞ぐ。こ
の状態で、外囲器1′をこの側壁に穿設した穿孔1′c,
1′cが上方になるように立て、この一方の穿孔1′c
から、注射器10等により、外囲器1′の開口部の内部に
液体の透明樹脂8を注入し、同時に他方穿孔1′cから
この内部の空気を排出させ、この透明樹脂8を硬化させ
た後、粘着テープ12を剥がして固体撮像装置を製造す
る。
That is, first, a predetermined portion of the lead frame 2 is molded and supported to form an envelope 1'opened upward. Then, the solid-state imaging device 3 is mounted on the upper surface of the bed portion 2b of the lead frame 2, and the electrodes inside the solid-state imaging device 3 and the inner leads of the lead frame 2 are connected by the bonding wires 5 and the adhesive tape 12 is attached. The transparent substrate 6 adhered closes the opening of the envelope 1 '. In this state, the perforation 1'c in which the envelope 1'is perforated on this side wall,
Stand up so that 1'c is on the upper side, and one hole 1'c
Then, the liquid transparent resin 8 is injected into the inside of the opening of the envelope 1'by the syringe 10 or the like, and at the same time, the air inside the liquid is evacuated from the other hole 1'c to cure the transparent resin 8. After that, the adhesive tape 12 is peeled off to manufacture the solid-state imaging device.

この場合、この製造の際に生じる気泡や内部に混入し
たゴミ等を浮き上がらせて穿孔1′cを穿設した側壁部
に集中させることができ、これによってゴミや気泡等に
よる画像劣化を無くして良好な画像を得るようにするこ
とができるばかりでなく、外囲器1′をよりインナーリ
ード側に近付けてこの小形化を図るようにすることがで
きる。
In this case, it is possible to raise bubbles generated during the manufacturing process or dust mixed therein and concentrate them on the side wall portion where the perforations 1'c are formed, thereby eliminating image deterioration due to dust or bubbles. Not only can a good image be obtained, but the envelope 1'can be brought closer to the inner lead side to achieve the miniaturization.

〔発明の効果〕〔The invention's effect〕

本発明は上記のように固体撮像素子を液体の透明樹脂
を硬化させて樹脂封止したので、従来の透明基板を外囲
器に接着した構造における外囲器で発生するリーク不良
は皆無となり、組立ての歩留りを向上させることができ
る。
In the present invention, since the solid-state image sensor is resin-sealed by curing the liquid transparent resin as described above, there is no leak defect occurring in the envelope in the structure in which the conventional transparent substrate is bonded to the envelope, The yield of assembly can be improved.

更に、固体撮像素子は気密封止され、しかも透明樹脂
の内部に水が浸入することが確実に防止されるので、固
体撮像素子の表面上方に水滴が付着してしまうことはな
く、従って水滴の付着による画質の劣化を確実に防止す
ることができる。
Furthermore, since the solid-state image sensor is hermetically sealed and water is surely prevented from entering the inside of the transparent resin, water droplets do not adhere to the upper surface of the solid-state image sensor, and accordingly, water droplets are not adhered. It is possible to reliably prevent deterioration of image quality due to adhesion.

しかも、多数のごみや気泡がこの透明樹脂の内部に混
入したり付着してしまうことがないので、エリヤセンサ
として使用しても高い歩留りを実現することができる。
In addition, since a large amount of dust and air bubbles do not mix or adhere to the inside of this transparent resin, a high yield can be realized even when used as an area sensor.

また、本発明に係る方法によれば、金型を使用するこ
となく、従って安価かつ敏速に、しかもばり取りの困難
さを伴うことなく、上記固体撮像装置を製作することが
できるばかりでなく、この製造の際に生じる気泡や内部
に混入したゴミ等が、透明樹脂の表面と固体撮像素子と
の間に存在してしまうことを極力防止して、気泡やゴミ
等による画像劣化を無くして良好な画像を得るようにす
ることができるといった効果がある。
Further, according to the method of the present invention, it is possible not only to manufacture the solid-state imaging device without using a mold, and thus inexpensively and promptly, and without difficulty of deflashing, It is possible to prevent bubbles, dust, etc. mixed in the product that are produced during this manufacturing from existing between the surface of the transparent resin and the solid-state image sensor as much as possible, and to eliminate image deterioration due to bubbles or dust. There is an effect that it is possible to obtain various images.

【図面の簡単な説明】[Brief description of drawings]

第1図乃至第4図は本発明の固体撮像装置の夫々異なる
実施例を示す縦断面図、第5図は第1図に示す固体撮像
装置の製造例を示す縦断面図、第6図は第3図に示す固
体撮像装置の製造例を工程順に示す縦断面図、第7図は
従来例を示す縦断面図である。 1,1′……外囲器、2……リードフレーム、2a……同リ
ード、2b……同ベッド部、3……固体撮像素子(半導体
チップ)、3a……同表面、4……導電性接着剤層、5…
…ボンディングワイヤ、6……透明基板、7……エポキ
シ接着剤、8……透明樹脂、8a……同上面、9……板
体、11……遮光板。
1 to 4 are vertical cross-sectional views showing different embodiments of the solid-state imaging device of the present invention, FIG. 5 is a vertical cross-sectional view showing a manufacturing example of the solid-state imaging device shown in FIG. 1, and FIG. FIG. 3 is a vertical cross-sectional view showing a manufacturing example of the solid-state imaging device shown in FIG. 3 in the order of steps, and FIG. 1, 1 '... Enclosure, 2 ... Lead frame, 2a ... Lead, 2b ... Bed part, 3 ... Solid-state image sensor (semiconductor chip), 3a ... Same surface, 4 ... Conductivity Adhesive layer, 5 ...
... Bonding wire, 6 ... Transparent substrate, 7 ... Epoxy adhesive, 8 ... Transparent resin, 8a ... Top surface, 9 ... Plate body, 11 ... Shading plate.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】上、下面が開放された枠状を有し側壁を貫
通したリードフレームにより内部空間が上下に区画され
た外囲器を設け、 前記リードフレームのベッド部上にマウントされた固体
撮像素子の電極と前記リードフレームのインナーリード
とを電気的に接続し、前記内部空間に透明樹脂を流入さ
せ硬化させて前記固体撮像素子を樹脂封止したことを特
徴とする固体撮像装置。
1. A solid body mounted on a bed portion of the lead frame, wherein an envelope having a frame shape having an open upper and lower surfaces and having an inner space defined vertically by a lead frame penetrating a side wall is provided. A solid-state image pickup device, characterized in that an electrode of an image pickup element and an inner lead of the lead frame are electrically connected, and a transparent resin is allowed to flow into the internal space and cured to seal the solid-state image pickup element with resin.
【請求項2】前記透明樹脂の上面に透明基板を付着させ
たことを特徴とする特許請求の範囲第1項記載の固体撮
像装置。
2. The solid-state imaging device according to claim 1, wherein a transparent substrate is attached to the upper surface of the transparent resin.
【請求項3】前記透明樹脂の下面に遮光板を取付けたこ
とを特徴とする特許請求の範囲第1項又は第2項記載の
固体撮像装置。
3. The solid-state image pickup device according to claim 1, wherein a light shielding plate is attached to the lower surface of the transparent resin.
【請求項4】上、下面が開放された枠状を有し側壁を貫
通したリードフレームにより内部空間が上下に区画され
た外囲器の内部に、前記リードフレームのベッド部上に
固体撮像素子をマウントし、 前記固体撮像素子の電極と前記リードフレームのインナ
ーリードとをボンディングワイヤで接続し、 前記ベッド部にマウントされた固体撮像素子の光を導入
する側が下方に向くように前記外囲器を倒立させて、平
坦に形成した板体の表面に前記外囲器の前記上面を当接
させて載置し、 前記外囲器の前記下面の上方から前記外囲器の内部に液
状の透明樹脂を流入させこの透明樹脂を硬化させること
を特徴とする固体撮像装置の製造方法。
4. A solid-state image sensor on a bed portion of the lead frame inside an envelope in which an inner space is divided into upper and lower parts by a lead frame which has a frame shape whose upper and lower surfaces are open and which penetrates a side wall. Mounting, the electrodes of the solid-state imaging device and the inner leads of the lead frame are connected by bonding wires, and the envelope of the solid-state imaging device mounted on the bed is oriented so that the light-introducing side faces downward. Upside down, placing the upper surface of the envelope in contact with the upper surface of the flat plate body, and liquid transparent inside the envelope from above the lower surface of the envelope. A method for manufacturing a solid-state imaging device, which comprises injecting a resin to cure the transparent resin.
【請求項5】前記外囲器の前記枠状の内周面に透明基板
を装着し、 この透明基板を前記板体の表面に当接させて載置したこ
とを特徴とする特許請求の範囲第4項記載の固体撮像装
置の製造方法。
5. A transparent substrate is mounted on the frame-shaped inner peripheral surface of the envelope, and the transparent substrate is placed in contact with the surface of the plate body. 4. The method for manufacturing the solid-state imaging device according to item 4.
JP62220770A 1987-09-03 1987-09-03 Solid-state imaging device and manufacturing method thereof Expired - Fee Related JPH0821702B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62220770A JPH0821702B2 (en) 1987-09-03 1987-09-03 Solid-state imaging device and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62220770A JPH0821702B2 (en) 1987-09-03 1987-09-03 Solid-state imaging device and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPS6464254A JPS6464254A (en) 1989-03-10
JPH0821702B2 true JPH0821702B2 (en) 1996-03-04

Family

ID=16756286

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62220770A Expired - Fee Related JPH0821702B2 (en) 1987-09-03 1987-09-03 Solid-state imaging device and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JPH0821702B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0428454U (en) * 1990-06-28 1992-03-06
JPH11340480A (en) * 1998-05-21 1999-12-10 Tokai Rika Co Ltd Plastic package
JP4767699B2 (en) * 2006-01-17 2011-09-07 パナソニック株式会社 Solid-state imaging device and manufacturing method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS551116A (en) * 1978-06-16 1980-01-07 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device
JPS56116649A (en) * 1980-02-19 1981-09-12 Matsushita Electric Ind Co Ltd Manufacturing of semiconductor device
JPS5943526A (en) * 1982-09-03 1984-03-10 Matsushita Electric Works Ltd Manufacture of resin sealed type electronic part
JPS5999405A (en) * 1982-11-29 1984-06-08 Dainippon Printing Co Ltd Manufacture of color separation filter
JPS60136254A (en) * 1983-12-23 1985-07-19 Toshiba Corp Solid-state image pickup device and manufacture thereof

Also Published As

Publication number Publication date
JPS6464254A (en) 1989-03-10

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