JPH0830820B2 - Matrix display - Google Patents

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring structure for accelerating a wiring continuity test and a non-conduction test between adjacent wirings of a matrix display device using liquid crystal or the like.

<< Summary of the Invention >> The present invention provides a matrix display device using liquid crystal or the like by providing pads for conducting a continuity test and a non-conductivity test at both ends of each of the X-direction wiring and the Y-direction wiring. And a Y-direction wiring continuity test and a short-circuit test can be performed simultaneously and quickly.

<< Prior Art >> Systems of a matrix display device using liquid crystal or the like include a simple matrix system and an active matrix system. Matrix display devices are used in various applications such as pocket TVs, wall-mounted TVs and displays for word processors and handheld computers, which are required to have high-quality display quality, thinness and light weight. The demand for the market is becoming higher and higher, and the increase of the test time of the continuity test of the wiring of the matrix display device and the non-continuity test between adjacent wirings becomes a problem.

FIG. 2 is a schematic diagram of wiring of a conventional matrix display device. The X-direction wiring 1 and the Y-direction wiring 2 are orthogonal to each other in the display area 3, and display pixels are formed at the intersections thereof. Each of the X-direction wiring 1 and the Y-direction wiring 2 is provided with a pad P at one end and a pad P ′ at the other end.

The continuity test of the X-direction wiring 1 and the Y-direction wiring 2 is to measure the resistance between the pad P and the pad P ′ on the same wiring. Further, the X-direction wiring 1 adjacent to the X-direction wiring 1
The non-continuity test with the Y-direction wiring 2 and the non-conduction test with the Y-direction wiring 2 adjacent to the Y-direction wiring 2 are to measure the resistance between the pad P of the wiring to be measured and the pad P of the wiring adjacent to the wiring. .

<< Problems to be Solved by the Invention >> Therefore, in the continuity test and the non-continuity test of the conventional matrix display device, the total number of the X-direction wiring 1 and the Y-direction wiring 2 is determined while positioning the probe needle. Need to be implemented. As a result, the time required for the continuity test and the non-conduction test was as long as 10 to 20 minutes, which led to an increase in the unit price of the matrix display device.

<< Means for Solving Problems >> In order to solve the above problems, according to the present invention, each of the X-direction wiring and the Y-direction wiring is extended beyond the connecting pad to the inside of the scribe region, and both ends thereof are provided. By providing a continuity test pad, it is possible to conduct a continuity test and a non-conduction test in which the positioning of the probe needle is simplified, and the test time is shortened.

<< Embodiment >> A first embodiment of the present invention will be described below with reference to FIG. The X-direction wiring 1 and the Y-direction wiring 2 have the same structure in the display area 3 as the conventional matrix display device shown in FIG. However, both ends of the X-direction wiring 1 and the Y-direction wiring 2 extend into the scribe region 4 and are provided with continuity test pads P and P ′.

In the continuity test, the probe needles N and N ′ are simultaneously contacted with each other in the longitudinal direction of the scribe region 4 in a state where the probe needles N and N ′ are in contact with each other on the scribe region 4 having a parallel positional relationship with the pads P and P ′. That is, the resistance of the X-direction wiring 1 or the Y-direction wiring 2 is sequentially measured while moving to. On the other hand, in the non-conduction test, when the probe needle N comes into contact with the pad P, the probe needles N'and N come in contact with the pad P'of the X-direction wiring 1 or the Y-direction wiring 2 in front or next. Resistance is measured in the same manner as in the continuity test, based on the positional relationship of '.

In the continuity test and the non-conduction test, the probe needles N and N'are moved while being in contact with the pads P and P ', so that the pads P and P'are damaged or a part of the pads P and P'is peeled off. To do However, this problem is solved because the unnecessary pads P and P ′ are automatically removed after the conduction test and the non-conduction test when the scribe region 4 is cut.

Next, a second embodiment of the present invention will be described with reference to FIG. The only difference from the embodiment of FIG. 1 is the pads P and P'used in the continuity test and the non-conduction test.
Therefore, FIG. 3 shows a pad PL in which the pads P and P'are improved.
And PL 'are shown enlarged.

The continuity test and the non-conduction test can be simultaneously performed by moving the scribe region 4 once in the length direction of the scribe region 4 while bringing the probe needles N and N ′ into contact with each other.
That is, when the probe needle N reaches the position I1 and the probe needle N ′ reaches the position I1 ′, the continuity test becomes possible. After that, the probe needle N is moved to the position I2 and the probe needle N'is moved to the position I2.
When reaching 2 ', the non-conduction test of the adjacent X-direction wiring 1 becomes possible. Also for the Y-direction wiring 2, pads PL and PL '
By adopting a pad having the same shape as, the conduction test and the non-conduction test can be efficiently performed.

<< Effects of the Invention >> As described above, according to the present invention, by providing the conduction test pad and the non-conduction test pad for the X-direction wiring and the Y-direction wiring in the scribe region and improving the shape of the pad,
Conduction test and non-conduction test with tens of minutes required can be performed in tens of seconds, resulting in reduction of cost of continuity test and non-conduction test and reduction of manufacturing unit cost of matrix display device. The effect is that

[Brief description of drawings]

FIG. 1 is a plan view of an embodiment of a matrix display device according to the present invention, FIG. 2 is a plan view of a conventional matrix display device, and FIG. 3 is a matrix display device having an improved pad shape according to the present invention. FIG. 1 …… X direction wiring 2 …… Y direction wiring 4 …… Scribe area N, N ′ …… Probe needle P, P ′, PL, PL ′ …… Pad

Claims (2)

[Claims] 1. A matrix display device comprising a plurality of X-direction wirings and a plurality of Y-direction wirings orthogonal to the X-direction wirings, wherein test pads are provided at both ends of the X-direction wirings and the Y-direction wirings. The matrix display device according to claim 1, wherein the pad has a structure in which the pad extends beyond the connection pad and extends to a region to be scribed after assembly. 2. The pads provided at both ends of each of the X-direction wiring and the Y-direction wiring have one of the pads when assuming the wiring directions of the X-direction wiring and the Y-direction wiring as horizontal coordinates. At the end of, it extends upward, at the other end,
A value obtained by adding the length of the pad that extends downward and the length of the pad that extends upward and the length of the pad that extends downward is greater than the distance between the X-direction wirings or the distance between the Y-direction wirings. The matrix display device according to claim 1, wherein the matrix display device is large.