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JPH0831395B2 - Method for forming solder coating on external electrodes of chip-shaped electronic component - Google Patents
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JPH0831395B2 - Method for forming solder coating on external electrodes of chip-shaped electronic component - Google Patents

Method for forming solder coating on external electrodes of chip-shaped electronic component

Info

Publication number
JPH0831395B2
JPH0831395B2 JP62084273A JP8427387A JPH0831395B2 JP H0831395 B2 JPH0831395 B2 JP H0831395B2 JP 62084273 A JP62084273 A JP 62084273A JP 8427387 A JP8427387 A JP 8427387A JP H0831395 B2 JPH0831395 B2 JP H0831395B2
Authority
JP
Japan
Prior art keywords
chip
shaped electronic
solder coating
electronic component
container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62084273A
Other languages
Japanese (ja)
Other versions
JPS63249321A (en
Inventor
哲寛 塩田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP62084273A priority Critical patent/JPH0831395B2/en
Publication of JPS63249321A publication Critical patent/JPS63249321A/en
Publication of JPH0831395B2 publication Critical patent/JPH0831395B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Details Of Resistors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Description

【発明の詳細な説明】 <産業上の利用分野> 本発明は、積層セラミックコンデンサやチップ抵抗等
のチップ状電子部品の外周面に付与された外部電極上に
半田被膜を形成する方法に関する。
TECHNICAL FIELD The present invention relates to a method for forming a solder coating on an external electrode provided on the outer peripheral surface of a chip-shaped electronic component such as a laminated ceramic capacitor or a chip resistor.

<従来の技術> 積層セラミックコンデンサ等のチップ状電子部品の両
端部には、内部電極等と接続された半田被膜形成用の外
部電極が付与されている。この外部電極は、通常は、銀
やパラジウム等の電極材料、ガラスフリット、および溶
剤からなる電極ペーストをチップ状電子部品の両端部に
塗布し、所定の条件で焼き付けて形成したものである。
このようにして形成した外部電極はその表面にガラスフ
リットが不可避的に析出するために、この外部電極上に
半田被膜を形成しようとする際における半田付け性が極
めて悪いことになってしまう。そのため、従来において
は、所定量のチップ状電子部品を、所定量の1〜6mmφ
程度の大きさの研磨用メディアおよび水とともに容器内
に入れ、その容器をポット架等にのせて回転させること
により、外部電極の表面を研磨してガラスフリットを除
去したうえで外部電極上に半田被膜を形成することが行
なわれている。
<Prior Art> Chip-shaped electronic components such as a monolithic ceramic capacitor are provided at both ends with external electrodes for forming a solder coating, which are connected to internal electrodes and the like. This external electrode is usually formed by applying an electrode paste made of an electrode material such as silver or palladium, glass frit, and a solvent to both ends of the chip-shaped electronic component and baking it under predetermined conditions.
Since the glass frit inevitably deposits on the surface of the external electrode thus formed, the solderability at the time of forming a solder coating on the external electrode becomes extremely poor. Therefore, in the past, a predetermined amount of chip-shaped electronic components was
Put the polishing media and water of a certain size in a container, and place the container on a pot rack and rotate it to polish the surface of the external electrode to remove the glass frit and then solder it on the external electrode. Forming a film is performed.

<発明が解決しようとする問題点> ところが、上記のような手順では、ある程度のガラス
フリットは除去できても半田付け性を十分に改善できる
程の除去はできず、半田付けをさらに改善しようとして
研磨時間を長くすると半田付け性が逆に悪くなるという
問題があった。
<Problems to be Solved by the Invention> However, in the above procedure, even if some glass frit can be removed, it cannot be removed enough to sufficiently improve the solderability, and further attempts are made to further improve the soldering. On the contrary, when the polishing time is extended, the solderability is deteriorated.

本発明は、このような点に鑑みてなされたもので、従
来の研磨方法を改善して良好な半田被膜を形成すること
ができるチップ状電子部品の外部電極への半田被膜形成
方法を提供することを目的としている。
The present invention has been made in view of the above circumstances, and provides a method for forming a solder coating on an external electrode of a chip-shaped electronic component, which is capable of improving a conventional polishing method and forming a good solder coating. Is intended.

<問題点を解決するための手段> 本発明は、このような目的を達成するために、ガラス
フリットを含む電極ペーストを焼きつけた半田被膜形成
用の外部電極が外周面上に付与されてなるチップ状電子
部品の外部電極への半田被膜形成方法であって、外部電
極形成済みのチップ状電子部品を研磨用メディアと所定
量の粉末研磨材と水等の液体とともに容器内に入れたう
えで30分以上にわたって容器を回転させた後、容器から
取り出したチップ状電子部品の外部電極上に半田被膜を
形成することを特徴としている。
<Means for Solving Problems> In order to achieve such an object, the present invention provides a chip in which an external electrode for forming a solder coating, which is baked with an electrode paste containing glass frit, is provided on the outer peripheral surface. A method for forming a solder coating on an external electrode of a particulate electronic component, in which a chip-shaped electronic component on which the external electrode has been formed is put in a container together with a polishing medium, a predetermined amount of powder abrasive and a liquid such as water. After rotating the container for more than a minute, a solder coating is formed on the external electrodes of the chip-shaped electronic component taken out of the container.

<作用> 従来の数mm程度の外径を有する研磨用メディアのみで
は、外部電極の表面が均一に研磨できず、ガラスフリッ
トを十分に除去することができないが、従来の研磨用メ
ディアに加えて粉末研磨材を混在させたことによって外
部電極の表面が均一に研磨できるようになり、ガラスフ
リットを十分に除去して半田付け性を改善することが可
能となり、良好な半田被膜を形成することができること
になる。
<Operation> With the conventional polishing media having an outer diameter of about several mm, the surface of the external electrode cannot be uniformly polished and the glass frit cannot be sufficiently removed. By mixing the powder abrasive, the surface of the external electrode can be uniformly polished, the glass frit can be sufficiently removed to improve the solderability, and a good solder coating can be formed. You can do it.

<実施例> 以下、本発明の一実施例にかかるチップ状電子部品の
外部電極への半田被膜形成方法を従来方法と対比しなが
ら説明する。
<Example> Hereinafter, a method for forming a solder coating on an external electrode of a chip-shaped electronic component according to an example of the present invention will be described in comparison with a conventional method.

まず、予め半田被膜形成用の外部電極が付与されたチ
ップ状電子部品である積層セラミックコンデンサの同じ
製造ロットからランダムに100ケ抜き取って1組を構成
し、このような組を7組つくる。この積層セラミックコ
ンデンサは長さと幅が各3.2mm、厚みが2.5mmの寸法を有
するものである。そして、あらかじめ準備した容積500c
cの6個の容器の中に前記7組のうちの6組の各100ケの
積層セラミックコンデンサをそれぞれ収納する。これら
の6個の容器のうちの3個の容器に、前記積層セラミッ
クコンデンサとともに、外径1〜6mmφの大きさのもの
が混在する研磨用メディアを2500cc分それぞれ収容し、
さらに水面が容器の8分目の位置にくるように所要量の
水を注入する。これら3個の容器をAグループとする。
前記6個の容器のうちの残る3個の容器には、積層セラ
ミックコンデンサとともに、外径1〜6mmφの大きさの
ものが混在する研磨用メディアを250cc分と平均粒径数1
0μのアルミナ等の粉末研磨材200cc分とをそれぞれ収容
し、さらに水面が容器の8分目の位置にくるように所要
量の水を注入する。これら3個の容器をBグループとす
る。つまり、Aグループは従来例のものであり、Bグル
ープは本発明の実施例のものである。ついで、これらの
AグループおよびBグループの各3個の容器をポット架
にのせ、各グループの1個目の容器を30分間回転させ、
2個目の容器を30分間回転させ、残る3個目の容器を18
0分間回転させて、それぞれ積層セラミックコンデンサ
の外部電極を研磨する。すなわち、本実施例において
は、研磨用メディアとアルミナ等の粉末研磨材と水とと
もに容器内に入れられた外部電極形成済みのチップ状電
子部品である積層セラミックコンデンサを30分間以上に
わたる容器の回転に伴って研磨するのである。そして、
各容器の積層セラミックコンデンサを容器から排出した
うえで乾燥させた後、前記残る1組の全く研磨していな
い100個の積層セラミックコンデンサも含む各組の積層
セラミックコンデンサに対してフラックスを付着させた
うえで溶融半田中に浸漬し、各々の外部電極上に半田を
付与することによって半田被膜を形成する。
First, 100 sets are randomly picked from the same manufacturing lot of a monolithic ceramic capacitor, which is a chip-shaped electronic component to which external electrodes for forming a solder coating are provided, and 7 sets of such sets are formed. This monolithic ceramic capacitor has a length and width of 3.2 mm and a thickness of 2.5 mm. And 500c prepared in advance
Each of 100 sets of the monolithic ceramic capacitors of 6 sets among the 7 sets is housed in each of 6 containers of c. 2500cc of polishing media in which ones having an outer diameter of 1 to 6 mmφ are mixed together are housed in three of these six containers together with the monolithic ceramic capacitor,
Further, inject the required amount of water so that the water surface comes to the position of the eighth minute of the container. These three containers are group A.
In the remaining three of the six containers, 250 cc of polishing media in which the ones with an outer diameter of 1 to 6 mmφ are mixed together with the monolithic ceramic capacitor and the average particle size is 1
200 cc of powder abrasive such as 0 μ alumina is housed, and a required amount of water is injected so that the water surface comes to the position of the 8th minute of the container. These three containers are group B. That is, the A group is a conventional example and the B group is an example of the present invention. Then, place each of these three containers of group A and group B on the pot rack, and rotate the first container of each group for 30 minutes,
Rotate the 2nd container for 30 minutes and the remaining 3rd container 18
The outer electrodes of the monolithic ceramic capacitors are polished by rotating for 0 minutes. That is, in the present embodiment, the laminated ceramic capacitor, which is a chip-shaped electronic component with external electrodes formed and is placed in a container together with a polishing medium, a powder abrasive such as alumina, and water, is allowed to rotate the container for 30 minutes or more. It is accompanied by polishing. And
After discharging the monolithic ceramic capacitors of each container and drying the monolithic ceramic capacitors, the flux was adhered to each set of monolithic ceramic capacitors including the remaining set of 100 unpolished monolithic ceramic capacitors. Then, the solder coating is formed by immersing in the molten solder and applying solder on each external electrode.

このようにして半田の付与された各組の積層セラミッ
クコンデンサの半田付け性を半田付着不良面積比率およ
び半田不良個数で表わし、それぞれ第1図および第2図
に示す。ここで、半田付不良面積比率とは、各組100個
の個々の積層セラミックコンデンサの外部電極の半田の
付着していない面積比率を目測で求め、その100個の平
均値で示したものである。また、半田付着不良個数と
は、各組の積層セラミックコンデンサの外部電極の半田
の付着していない面積比率が5%よりも大きなものを不
良品とし、各組100個中の不良個数で示したものであ
る。この第1図および第2図から明らかなように、研磨
用メディアのみしか用いていないAグループにおいては
半田付け性が十分には改善されていないが、研磨用メデ
ィアに所定量の粉末研磨材を加えておいたBグループに
おいては半田付け性が十分に改善されている。
The solderability of each set of laminated ceramic capacitors to which solder has been applied in this way is represented by the area ratio of defective solder attachments and the number of defective solders, which are shown in FIGS. 1 and 2, respectively. Here, the defective area ratio for soldering is the area ratio of the external electrodes of the individual monolithic ceramic capacitors of each set of 100, which are not attached to the solder, and is shown as the average value of 100 of them. . The number of defective solder attachments is defined as the defective product when the area ratio of the external electrodes of the external electrodes of the multilayer ceramic capacitors of each set is greater than 5%, and is shown as the defective number in 100 of each set. It is a thing. As is clear from FIGS. 1 and 2, the solderability is not sufficiently improved in the group A, which uses only the polishing medium, but the polishing medium is provided with a predetermined amount of the powder abrasive. In Group B, which has been added, the solderability is sufficiently improved.

なお、容器に収納する積層セラミックコンデンサのサ
イズおよび個数、研磨用メディアのサイズおよび量、粉
末研磨材の粒径および量等によって回転時間(研磨時
間)との関係による研磨状態に差異が生じるが、粉末研
磨材を用いることによる効果は何ら異なることはない。
また、粉末研磨材はアルミナ以外のものでもよく、容器
に注入する水にかえて積層セラミックコンデンサ等のチ
ップ状電子部品の特性に影響を与えることのない他の液
体を用いてもよい。
The size and number of the monolithic ceramic capacitors housed in the container, the size and amount of the polishing media, the particle size and amount of the powder abrasive, and the like cause a difference in the polishing state depending on the rotation time (polishing time). The effect of using a powder abrasive is no different.
The powder abrasive may be other than alumina, and other liquid that does not affect the characteristics of the chip-shaped electronic component such as a monolithic ceramic capacitor may be used instead of water injected into the container.

<発明の効果> 以上説明したように、本発明によれば、半田被膜形成
用の外部電極が外周面上に付与されたチップ状電子部品
を研磨用メディアと粉末研磨材と水等の液体とともに容
器内に入れたうえで30分間以上にわたって容器を回転さ
せることにより研磨しているので、外部電極の表面上に
析出していたガラスフリットを十分に除去して半田付け
性の改善を図ることが可能となり、良好な半田被膜を形
成することができるという効果が得られる。
<Effects of the Invention> As described above, according to the present invention, a chip-shaped electronic component provided with an external electrode for forming a solder coating on the outer peripheral surface together with a polishing medium, a powder abrasive, and a liquid such as water. Since it is polished by putting it in the container and rotating the container for 30 minutes or more, it is possible to sufficiently remove the glass frit deposited on the surface of the external electrode and improve the solderability. It is possible to obtain an effect that a good solder coating can be formed.

【図面の簡単な説明】[Brief description of drawings]

第1図は半田付着不良面積比率と回転時間(研磨時間)
との関係を示す図、第2図は半田付着不良個数と回転時
間(研磨時間)との関係を示す図である。
Figure 1 shows the defective area of solder adhesion and rotation time (polishing time)
And FIG. 2 is a diagram showing the relationship between the number of defective solder adhesions and the rotation time (polishing time).

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】ガラスフリットを含む電極ペーストを焼き
つけた半田被膜形成用の外部電極が外周面上に付与され
てなるチップ状電子部品の外部電極への半田被膜形成方
法であって、 外部電極形成済みのチップ状電子部品を研磨用メディア
と所定量の粉末研磨材と水等の液体とともに容器内に入
れたうえで30分間以上にわたって容器を回転させた後、 容器から取り出したチップ状電子部品の外部電極上に半
田被膜を形成することを特徴とするチップ状電子部品の
外部電極への半田被膜形成方法。
1. A method of forming a solder coating on an external electrode of a chip-shaped electronic component, wherein an external electrode for forming a solder coating, which is baked with an electrode paste containing glass frit, is provided on the outer peripheral surface. Put the finished chip-shaped electronic parts together with the polishing media, the specified amount of powdered abrasive and liquid such as water into the container, rotate the container for 30 minutes or more, and then remove the chip-shaped electronic parts from the container. A method for forming a solder coating on an external electrode of a chip-shaped electronic component, which comprises forming a solder coating on the external electrode.
JP62084273A 1987-04-06 1987-04-06 Method for forming solder coating on external electrodes of chip-shaped electronic component Expired - Lifetime JPH0831395B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62084273A JPH0831395B2 (en) 1987-04-06 1987-04-06 Method for forming solder coating on external electrodes of chip-shaped electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62084273A JPH0831395B2 (en) 1987-04-06 1987-04-06 Method for forming solder coating on external electrodes of chip-shaped electronic component

Publications (2)

Publication Number Publication Date
JPS63249321A JPS63249321A (en) 1988-10-17
JPH0831395B2 true JPH0831395B2 (en) 1996-03-27

Family

ID=13825843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62084273A Expired - Lifetime JPH0831395B2 (en) 1987-04-06 1987-04-06 Method for forming solder coating on external electrodes of chip-shaped electronic component

Country Status (1)

Country Link
JP (1) JPH0831395B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7243487B2 (en) * 2019-06-27 2023-03-22 株式会社村田製作所 Manufacturing method of multilayer ceramic capacitor

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57154801A (en) * 1981-03-19 1982-09-24 Alps Electric Co Ltd Chip part and method of producing same

Also Published As

Publication number Publication date
JPS63249321A (en) 1988-10-17

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