defect distributionとは 意味・読み方・使い方

It is a defect data analysis method to analyze the defect distribution status based on defect position coordinates detected by an inspection device to classify into any one of the distribution characteristics categories among iterations defect, high density defect, line distribution defect, ring/massive distribution defect, and random defect.例文帳に追加

検査装置によって検出された欠陥位置座標に基づいて欠陥の分布状態を解析し、繰り返し欠陥、密集欠陥、線状分布欠陥、環・塊状分布欠陥、ランダム欠陥のうちいずれかの分布特徴カテゴリに分類する。 - 特許庁

SYSTEM AND METHOD FOR ANALYZING DEFECT DISTRIBUTION, AND PROGRAM例文帳に追加

欠陥分布解析システム、方法およびプログラム - 特許庁

Distribution state of defects is analyzed based on a defect position coordinate detected by an inspection equipment and classified into one distribution feature category of repetitive defect, aggregated defect, linear distribution defect, annular block distribution defect or random defect.例文帳に追加

検査装置によって検出された欠陥位置座標に基づいて欠陥の分布状態を解析し、繰り返し欠陥、密集欠陥、線状分布欠陥、環・塊状分布欠陥、ランダム欠陥のうちいずれかの分布特徴カテゴリに分類する。 - 特許庁

METHOD FOR SIMULATING DISTRIBUTION OF POINT DEFECT IN SINGLE CRYSTAL例文帳に追加

単結晶の点欠陥分布のシミュレーション方法 - 特許庁

A defect data analytic method analyzes the defect distribution state based on defect location coordinates detected by the inspection apparatus and categorizes the defect distribution state into one of distribution feature categories including repetitive defects, aggregate defects, circular distribution defects, radial distribution defects, linear distribution defects, ring or cluster distribution defects and random defects.例文帳に追加

検査装置によって検出された欠陥位置座標に基づいて欠陥の分布状態を解析し、繰り返し欠陥、密集欠陥、円弧状分布欠陥、放射状分布欠陥、線状分布欠陥、環・塊状分布欠陥、ランダム欠陥のうちいずれかの分布特徴カテゴリに分類する。 - 特許庁

METHOD OF SIMULATING POINT DEFECT AREA AND MINUTE DEFECT DISTRIBUTION OF SILICON SINGLE CRYSTAL例文帳に追加

シリコン単結晶の点欠陥領域と微小欠陥分布のシミュレーション方法 - 特許庁

METHOD AND DEVICE FOR SORTING DEFECT DISTRIBUTION例文帳に追加

欠陥分布分類方法および欠陥分布分類装置 - 特許庁