JP3063497B2 - Manufacturing equipment for thin-film photoelectric conversion elements - Google Patents
Manufacturing equipment for thin-film photoelectric conversion elementsInfo
- Publication number
- JP3063497B2 JP3063497B2 JP5292904A JP29290493A JP3063497B2 JP 3063497 B2 JP3063497 B2 JP 3063497B2 JP 5292904 A JP5292904 A JP 5292904A JP 29290493 A JP29290493 A JP 29290493A JP 3063497 B2 JP3063497 B2 JP 3063497B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- film forming
- forming chamber
- substrate
- photoelectric conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Photovoltaic Devices (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、可撓性基板上に各層を
ステッピングロール方式で成膜する薄膜光電変換素子の
製造装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for manufacturing a thin film photoelectric conversion element in which each layer is formed on a flexible substrate by a stepping roll method.
【0002】[0002]
【従来の技術】例えばアモルファスシリコン (以下a−
Siと記す) を主材料とした光電変換層を含む各層を長尺
の高分子材料あるいはステンレス鋼などの金属からなる
可撓性基板上に形成して薄膜光電変換素子を製造する方
法は、生産性の点ですぐれている。長尺の可撓性基板上
に複数の層を成膜する方式として、各成膜室内を移動す
る基板上に成膜するロールツーロール方式と、成膜室内
で停止させた基板上に成膜したのち成膜の終わった基板
部分を成膜室外へ送り出すステッピングロール方式とが
ある。プラズマCVD法を用いて成膜するステッピング
ロール方式では、成膜室開放−基板1フレーム移動−成
膜室封止−原料ガス導入−圧力制御−放電開始−放電終
了−原料ガス停止−ガス引き−成膜室開放の操作がくり
返される。2. Description of the Related Art For example, amorphous silicon (hereinafter a-
A method for manufacturing a thin-film photoelectric conversion element by forming each layer including a photoelectric conversion layer whose main material is Si) on a flexible substrate made of a long polymer material or a metal such as stainless steel is a production method. Excellent in terms of sex. A roll-to-roll method in which a plurality of layers are formed on a long flexible substrate and a film is formed on a substrate moving in each film forming chamber, and a film is formed on a substrate stopped in the film forming chamber Then, there is a stepping roll method in which the substrate portion on which film formation has been completed is sent out of the film formation chamber. In the stepping roll method in which a film is formed by using the plasma CVD method, a film forming chamber is opened, a substrate is moved by one frame, a film forming chamber is sealed, a source gas is introduced, a pressure control is performed, a discharge is started, a discharge is completed, a source gas is stopped, and a gas is drawn. The operation of opening the film formation chamber is repeated.
【0003】このステップロール方式を採用した成膜装
置は、通常のロールツーロール成膜に比べ以下の点で優
れている。 (1) 隣接する成膜室とのガス相互拡散がない。 (2) 装置がコンパクトである。 図2(a) 、(b) はステッピングロール方式の成膜室の開
放時および封止時の断面をそれぞれ示す。断続的に搬送
されてくる可撓性基板1の上下に函状の下部成膜室21と
上部成膜室22が対向している。下部成膜室21には電源4
に接続された高電圧電極31が、上部成膜室22にはヒータ
33内蔵した接地電極32が備えられている。成膜時には、
図2(b) に示すように、上部成膜室22が下降し、接地電
極32が基板1を抑えて下部成膜室21の開口側端面に取付
けられたシール材5に接触させる。これにより下部成膜
室21と基板1により、排気管61に連通する気密に密閉さ
れた成膜空間6が形成され、高電圧電極31への高周波電
圧の印加によりプラズマを成膜空間6に発生させ、図示
しない導入管から導入された原料ガスを分解して基板1
上に膜を形成する。この場合、シール材5は厚さ数十か
ら数百ミクロンの可撓性基板を介してヒータ33で加熱さ
れた上部成膜室22の壁面端部と接触することになり、シ
ール材5の接触部の温度は上部成膜室22の壁面とほぼ等
温になる。成膜時のヒータ温度は200 〜300 ℃、一方、
シール材5として弗素ゴム等を用いる場合、脱ガスを防
ぐためにはシール部を150 ℃以下に保つ必要がある。こ
のため、上部成膜室22の壁面の温度を150 ℃以下に保持
することが重要になり接地電極32と上部成膜室22の壁面
との間に最低2mm、望ましくは5mm以上の間隔を設ける
必要がある。A film forming apparatus employing this step roll method is superior to the usual roll-to-roll film forming in the following points. (1) There is no gas mutual diffusion with the adjacent deposition chamber. (2) The device is compact. 2A and 2B show cross sections of the stepping roll type film forming chamber when the film forming chamber is opened and when it is sealed, respectively. A lower film-forming chamber 21 and an upper film-forming chamber 22 having a box shape face each other above and below the flexible substrate 1 conveyed intermittently. Power supply 4 in lower film formation chamber 21
The high voltage electrode 31 connected to the
A built-in ground electrode 32 is provided. During film formation,
As shown in FIG. 2B, the upper film forming chamber 22 descends, and the ground electrode 32 holds down the substrate 1 and contacts the sealing material 5 attached to the opening-side end face of the lower film forming chamber 21. As a result, an airtightly sealed film-forming space 6 communicating with the exhaust pipe 61 is formed by the lower film-forming chamber 21 and the substrate 1, and a plasma is generated in the film-forming space 6 by applying a high-frequency voltage to the high-voltage electrode 31. To decompose the raw material gas introduced from an introduction pipe (not shown) to
A film is formed thereon. In this case, the sealing material 5 comes into contact with the end of the wall surface of the upper film forming chamber 22 heated by the heater 33 via a flexible substrate having a thickness of several tens to several hundreds of microns. The temperature of the portion is substantially equal to the wall surface of the upper film forming chamber 22. The heater temperature during film formation is 200 to 300 ° C, while
When a fluorine rubber or the like is used as the sealing material 5, the sealing portion needs to be kept at 150 ° C. or lower in order to prevent degassing. For this reason, it is important to keep the temperature of the wall surface of the upper film forming chamber 22 at 150 ° C. or less, and a space of at least 2 mm, preferably 5 mm or more is provided between the ground electrode 32 and the wall surface of the upper film forming chamber 22. There is a need.
【0004】[0004]
【発明が解決しようとする課題】図2(b) に示す成膜時
には、上部成膜室22と基板1によって囲まれた空間62が
生ずる。しかし、本出願人の出願にかかる平成4年特許
願第347394号ほかの明細書に記載されているように、基
板の一面上に形成された薄膜光電変換素子の透明電極層
と他面上に形成された金属電極層とを、基板に明けられ
た貫通孔を通る導体を介して接続することにより、シー
ト抵抗の高い透明電極層を電流の流れる距離を短くする
構造が開発されている。このような光電変換素子の薄膜
の成膜を図2の装置で行う場合、既に基板1に分散して
明けられた貫通孔を介して、基板1の両側の空間6およ
び62が連通することになる。これによって次の問題が生
ずる。 (1) 上部成膜室22内の空間62に貫通孔を通じて原料ガス
が侵入して溜る。この溜まったガス、あるいは空間62が
気密に密閉されていない場合には大気の混入したガスが
成膜空間6に逆拡散して成膜に悪影響を及ぼす。 (2) 一つの成膜室内で2種類以上の膜を形成する場合、
一層目の成膜後に空間62に溜まったガスを引き切らない
うちに二層目を成膜することになる。このため、一層目
がp形あるいはn形のドープ膜のときは、その不純物が
二層目に混入することになり、本来得ようとする膜とは
導電率や光学ギャップなどの特性の異なる膜ができてし
まう。At the time of the film formation shown in FIG. 2B, a space 62 surrounded by the upper film formation chamber 22 and the substrate 1 is generated. However, as described in the specification of Japanese Patent Application No. 347394 and the like of the applicant of the present invention, the transparent electrode layer of the thin film photoelectric conversion element formed on one surface of the substrate and the other surface are formed on the other surface. A structure has been developed in which the formed metal electrode layer is connected to a transparent electrode layer having a high sheet resistance by connecting the formed metal electrode layer via a conductor passing through a through-hole formed in the substrate. When such a thin film of the photoelectric conversion element is formed by the apparatus shown in FIG. 2, the spaces 6 and 62 on both sides of the substrate 1 communicate with each other through the through-holes that have already been formed in the substrate 1. Become. This causes the following problems. (1) The source gas enters and accumulates in the space 62 in the upper film forming chamber 22 through the through hole. If the accumulated gas or the space 62 is not hermetically sealed, the gas mixed with the atmosphere reversely diffuses into the film formation space 6 and adversely affects the film formation. (2) When two or more types of films are formed in one film forming chamber,
The second layer is formed before the gas accumulated in the space 62 is cut off after the first layer is formed. For this reason, when the first layer is a p-type or n-type doped film, the impurity is mixed into the second layer, and a film having different characteristics such as conductivity and optical gap from the film originally intended. Can be done.
【0005】さらに、可撓性基板1の面積が大きくなる
と、成膜室の面積も大きくなるが、成膜室の壁面と大面
積の薄い可撓性基板とをしわがよらないように高真空で
シールすることが困難である。また、成膜室の面積を小
さくしようとして接地電極32と上部成膜室22の壁面との
間隔をできるだけ狭くしようとすると、壁面の温度が25
0 ℃を越えることがある。250 ℃以上の耐熱性をもつシ
ール材としては、アスベスト系あるいは金属系のパッキ
ンが通常用いられている。しかしこれらのシール材は面
の押しつけ圧力を高くしなければならず、開放、密閉を
くり返す構造では採用できない。面の押しつけ圧力の低
いシール材として、弗素ゴムや弗素樹脂などを選定する
と、これらは通常180 ℃以下が長時間使用できる温度で
ある。Further, as the area of the flexible substrate 1 increases, the area of the film forming chamber also increases. However, a high vacuum is applied so that the wall of the film forming chamber and the thin flexible substrate having a large area are not wrinkled. Is difficult to seal. Further, if the space between the ground electrode 32 and the wall surface of the upper film formation chamber 22 is made as small as possible to reduce the area of the film formation chamber, the temperature of the wall surface becomes 25
May exceed 0 ° C. As the sealing material having a heat resistance of 250 ° C. or more, asbestos-based or metal-based packing is generally used. However, these sealing materials have to increase the pressing pressure on the surface, and cannot be adopted in a structure in which the seal is repeatedly opened and closed. When a fluoro rubber or a fluoro resin is selected as a sealing material having a low pressing pressure on the surface, a temperature of 180 ° C. or less is a temperature that can be used for a long time.
【0006】このような問題は、高電圧電極を停止して
いる可撓性基板に対向させてプラズマCVDによる成膜
を行う場合に限らず、ターゲツトを停止している可撓性
基板に対向させてスパッタにより成膜を行う場合にも同
様に存在する。本発明の目的は、上記の問題を解決し、
貫通孔の明けられた可撓性基板に特性良好な薄膜を形成
できる薄膜光電変換素子の製造装置、さらには、大面積
の成膜が可能であり、押しつけ圧力が低いシール材を用
いることができる薄膜光電変換素子の製造装置を提供す
ることにある。[0006] Such a problem is not limited to the case where the film is formed by plasma CVD with the high voltage electrode facing the stopped flexible substrate, but the target is also set to face the stopped flexible substrate. It also exists when a film is formed by sputtering. The object of the present invention is to solve the above problems,
An apparatus for manufacturing a thin film photoelectric conversion element capable of forming a thin film with good characteristics on a flexible substrate having a through hole, and a sealing material capable of forming a large area and having a low pressing pressure can be used. An object of the present invention is to provide an apparatus for manufacturing a thin-film photoelectric conversion element.
【0007】[0007]
【課題を解決するための手段】上記の目的を達成するた
めに、本発明は、搬送されてくる可撓性基板を成膜室の
それぞれ函状の壁体を有する二つの部分の開口側の間に
停止させ、基板を成膜室の両部分の壁体の開口側端面間
にはさみ、成膜室の一方の部分と基板とにより囲まれた
成膜空間を真空にし、その空間内の電極に電圧を印加し
て成膜する薄膜光電変換素子の製造装置において、成膜
室の各部の壁体の開口側端面上にそれぞれシール材が設
けられ、各部の壁体にそれぞれ真空排気管が開口するも
のとする。成膜室各部の壁体の開口側端面上のシール材
が基板をはさんで対向しない位置に設けられたことが有
効であり、シール材が端面上に固定された保持体に形成
されたありみぞ内に保持されたことが良い。その保持体
の縁部の基板に対向する側が丸く面取りされたことも良
い。シール材が角環状のOリングであることが良い。成
膜室の各部の壁体に開口する真空排気管が可撓性配管で
連結されたことが有効である。また、ヒータを内蔵する
対向電極の収容される成膜室部分の壁体の開口側端面近
傍が水冷されたことが良い。そして、成膜が成膜空間に
原料ガスを導入して行うCVD法によることあるいは放
電ガスを導入して行うスパッタ法によることが有効であ
る。SUMMARY OF THE INVENTION In order to achieve the above object, the present invention provides a flexible substrate which is conveyed to two sides of a film forming chamber each having a box-shaped wall. And the substrate is sandwiched between the open end faces of the walls of both parts of the film formation chamber, and a film formation space surrounded by one part of the film formation chamber and the substrate is evacuated, and the electrodes in that space are evacuated. In a manufacturing apparatus for a thin-film photoelectric conversion element that applies a voltage to a film to form a film, a sealing material is provided on an opening-side end surface of a wall of each part of the film forming chamber, and a vacuum exhaust pipe is opened on the wall of each part. It shall be. It is effective that the sealing material on the opening side end surface of the wall body of each part of the film forming chamber is provided at a position not opposed to the substrate, and the sealing material is formed on the holding body fixed on the end surface. Good to be held in the groove. The side of the edge of the holder facing the substrate may be rounded off. It is preferable that the sealing material is a rectangular O-ring. It is effective that the vacuum exhaust pipes opening to the walls of the respective parts of the film forming chamber are connected by flexible piping. Further, it is preferable that the vicinity of the opening side end surface of the wall of the film forming chamber in which the counter electrode containing the heater is housed is water-cooled. It is effective to use a CVD method in which a source gas is introduced into a film forming space or a sputtering method in which a discharge gas is introduced.
【0008】[0008]
【作用】ステッピングロール方式で、可撓性基板を成膜
室の壁体の開口側端面にシール材を有する函状壁体をも
つ二つの部分の間にはさみ、基板両側の空間を真空排気
可能にすることにより、基板に貫通孔が明けられていて
も成膜空間を有する成膜室部分と逆の側の成膜室部分に
原料ガスあるいは放電ガスが侵入した場合、排気されて
しまうため、成膜空間に不純物が戻って膜の特性を害す
ることがない。基板両側のシール材が対向しない位置に
あることにより、成膜室の両部分を基板に押しつけたと
き、シール材同志が押し合って基板をずらすことによる
しわよりなどが起こらず、大面積の成膜空間をもつ成膜
室の気密封止ができる。成膜室を上下の二つの部分にす
るとき、上部の成膜室のシール材が落下すること、ある
いは成膜室を開放するときに基板に下部の成膜室のシー
ル材が付着したまま上がることがシール材を保持体のあ
りみぞ内に保持することにより防止できる。また保持体
の縁部を丸く面取りすることにより、基板に傷が付くの
を防止できる。シール材として角環状のOリングを用
い、成膜室を方形にすることにより、成膜空間の面積を
大きくでき、大面積基板への成膜が可能になる。そし
て、シール材近傍の成膜室壁体を水冷することにより、
シール材の温度上昇が防止でき、押しつけ圧力の低いシ
ール材を用いることができる。The flexible substrate is sandwiched between two parts having a box-like wall having a sealing material on the opening side end surface of the film forming chamber wall by the stepping roll method, and the space on both sides of the substrate can be evacuated. By doing so, even if a through-hole is formed in the substrate, if a raw material gas or a discharge gas enters the film formation chamber portion on the side opposite to the film formation chamber portion having the film formation space, it is exhausted, Impurities do not return to the film formation space to impair the characteristics of the film. Because the sealing materials on both sides of the substrate are not opposed to each other, when both parts of the film forming chamber are pressed against the substrate, the sealing materials do not wrinkle due to the displacement of the substrate due to the pressing of the sealing materials, and a large area is formed. A film-forming chamber having a film space can be hermetically sealed. When the film forming chamber is divided into the upper and lower parts, the sealing material of the upper film forming chamber falls, or when the film forming chamber is opened, the sealing material of the lower film forming chamber adheres to the substrate and rises. This can be prevented by holding the sealing material in the groove of the holder. Further, by rounding the edge of the holder, the substrate can be prevented from being damaged. By using a rectangular O-ring as a sealing material and making the film formation chamber rectangular, the area of the film formation space can be increased, and film formation on a large-area substrate becomes possible. Then, the wall of the film forming chamber near the sealing material is cooled with water,
A rise in the temperature of the sealing material can be prevented, and a sealing material having a low pressing pressure can be used.
【0009】[0009]
【実施例】図1は本発明の一実施例のプラズマCVD法
により成膜を行う薄膜光電変換素子の製造装置を示し、
図2と共通の部分には同一の符号が付されている。図1
は成膜室開放時を示し、可撓性基板1は紙面に垂直方向
に搬送される。高電圧電極31を収容する下部成膜室21は
ベース23と開口部を有するトッププレート24で構成さ
れ、真空排気管61に接続されている。図示しないヒータ
と内蔵する接地電極32を収容する上部成膜室22はケーシ
ング25とハウジング26で構成され、ハウジング26に接地
電極32の支持チューブ34が嵌合により固定されている。
ハウジング26の端部に移動プレート27が取付けられてい
る。移動プレート27は上下駆動ガイド28にガイドされて
アクチュエータ29により矢印30に示すように上下方向に
駆動される。上下駆動ガイド28およびアクチュエータ29
はマウント35に固定され、成膜室チャンバ36上の上部フ
ランジ37上に載置されている。支持チューブ34は円筒状
で、内部の空洞は上端は真空排気管63と連通し、下端で
貫通孔36により上部成膜室22の内部空間に連通してい
る。真空排気管61と真空排気管63は可撓性配管64により
接続されている。FIG. 1 shows an apparatus for manufacturing a thin film photoelectric conversion element for forming a film by a plasma CVD method according to one embodiment of the present invention.
2 are denoted by the same reference numerals. FIG.
Indicates that the film forming chamber is open, and the flexible substrate 1 is transported in a direction perpendicular to the paper surface. The lower film forming chamber 21 that houses the high-voltage electrode 31 includes a base 23 and a top plate 24 having an opening, and is connected to a vacuum exhaust pipe 61. The upper film forming chamber 22 that houses a heater (not shown) and a built-in ground electrode 32 includes a casing 25 and a housing 26, and a support tube 34 for the ground electrode 32 is fixed to the housing 26 by fitting.
A moving plate 27 is attached to an end of the housing 26. The moving plate 27 is guided by an up-down drive guide 28 and is driven up and down by an actuator 29 as shown by an arrow 30. Vertical drive guide 28 and actuator 29
Is fixed to a mount 35 and mounted on an upper flange 37 on a film forming chamber chamber 36. The support tube 34 has a cylindrical shape, and the internal cavity communicates with the vacuum exhaust pipe 63 at the upper end, and communicates with the internal space of the upper film forming chamber 22 through the through hole 36 at the lower end. The vacuum exhaust pipe 61 and the vacuum exhaust pipe 63 are connected by a flexible pipe 64.
【0010】図3はシール部の拡大図である。Oリング
5はトッププレート24上面上およびケーシング25の下端
面上にねじ止めされた金属製の保持板7とトッププレー
ト24あるいはケーシング25とにより形成されるありみぞ
71の中に脱落しないように保持されている。保持板7の
縁部72は、R面取りされており、上部成膜室22が下降し
て基板1を下部成膜室21との間にはさんだときに、基板
を傷付けないように配慮してある。図4はケーシング25
の端面を下から見た平面図、図5はトッププレート24を
上から見た平面図である。Oリング5の位置は上部成膜
室側では保持体7の外縁に近く、下部成膜室側では保持
体7の内縁に近い。従って、成膜時には基板1に表裏の
異なる位置でOリング5が圧接し、基板1にしわがよる
ことがない。 ケーシング25の開口側端面近くには冷却
水通路8が明けられており、冷却水導管81から通水され
る。この通水によりケーシング25の端部が冷却され、O
リング5への弗素ゴムあるいは弗素樹脂の使用を可能に
している。ヒータを内蔵する接地電極32に連結される支
持チューブ34にも水冷ジャケット82が形成され、矢印83
に示す通水により支持チューブ34が冷却される。FIG. 3 is an enlarged view of the seal portion. The O-ring 5 is formed by a metal holding plate 7 screwed on the upper surface of the top plate 24 and the lower end surface of the casing 25 and the top plate 24 or the casing 25.
It is held so that it does not fall into 71. The edge 72 of the holding plate 7 is chamfered so that when the upper film forming chamber 22 is lowered and the substrate 1 is sandwiched between the lower film forming chamber 21 and the substrate 1, care is taken not to damage the substrate. is there. FIG.
FIG. 5 is a plan view of the top plate 24 as viewed from above. The position of the O-ring 5 is near the outer edge of the holder 7 on the upper film forming chamber side, and is closer to the inner edge of the holder 7 on the lower film forming chamber side. Therefore, at the time of film formation, the O-ring 5 is pressed against the substrate 1 at different positions on the front and back, so that the substrate 1 does not wrinkle. A cooling water passage 8 is opened near the end face on the opening side of the casing 25, and water flows through a cooling water conduit 81. By this water flow, the end of the casing 25 is cooled, and O
The use of fluorine rubber or fluorine resin for the ring 5 is enabled. A water cooling jacket 82 is also formed on the support tube 34 connected to the ground electrode 32 containing a heater, and an arrow 83
The support tube 34 is cooled by the water flow shown in FIG.
【0011】図1は基板1を搬送する状態を示し、成膜
時にはアクチュエータ29の動作により移動プレート27に
固定されたハウジング26、ハウジング26に固定されたケ
ーシング25および支持チューブ34、支持チューブ34に支
持された接地電極32が下降して基板を押し下げ、双方の
Oリング5でそれぞれ下部成膜室21および上部成膜室22
を閉鎖し、真空排気管61、63からの真空排気により両室
内に真空空間が形成される。これにより、高電圧電極31
への高周波電圧によりプラズマの発生する成膜空間6が
生ずる。なお、真空排気管61および63の間には可撓性配
管64が介在し、移動プレート27と上部フランジ37の間に
は大気を遮断するベローズ38が介在しているので、上記
の上部成膜室22の下降が円滑に行われる。FIG. 1 shows a state in which the substrate 1 is transported. During film formation, an actuator 29 operates to move a housing 26 fixed to a movable plate 27, a casing 25 fixed to the housing 26, a support tube 34, and a support tube 34. The supported ground electrode 32 descends and pushes down the substrate, and the lower film forming chamber 21 and the upper film forming chamber 22 are respectively held by both O-rings 5.
Is closed, and a vacuum space is formed in both chambers by the vacuum exhaust from the vacuum exhaust pipes 61 and 63. Thereby, the high voltage electrode 31
A high-frequency voltage applied to the film causes a film formation space 6 in which plasma is generated. The flexible pipe 64 is interposed between the vacuum exhaust pipes 61 and 63, and the bellows 38 that blocks the atmosphere is interposed between the moving plate 27 and the upper flange 37. The lowering of the chamber 22 is performed smoothly.
【0012】[0012]
【発明の効果】本発明によれば、ステッピングロール方
式による成膜時に可撓性基板の一面側に接する成膜空間
を含む成膜室部分だけでなく、他面側に接する接地電極
を含む成膜室部分もそれぞれ真空排気可能にすることに
より、貫通孔を有する基板への成膜も支障なくできるよ
うになった。そして基板の両面に異なる位置でシール材
を接触させることにより、基板に対するシール材の押圧
が十分にでき、基板の両面における真空気密が確保さ
れ、大面積の基板への成膜が可能になった。またヒータ
を内蔵する接地電極を含む成膜室部分の壁体の開口側端
面近傍を水冷することにより押しつけ圧力が小さい耐熱
性の低いシール材の使用が可能となり、気密保持をさら
に容易にすることができた。これらの効果は、成膜をC
VD法で行う場合もスパッタ法で行う場合も変わること
がない。According to the present invention, not only a film forming chamber portion including a film forming space in contact with one surface side of a flexible substrate at the time of film forming by a stepping roll method but also a ground electrode including a ground electrode in contact with the other surface side. By enabling vacuum evacuation of each of the film chamber portions, film formation on a substrate having a through hole can be performed without any trouble. By bringing the sealing material into contact with the two surfaces of the substrate at different positions, the sealing material can be sufficiently pressed against the substrate, the vacuum tightness on both surfaces of the substrate is ensured, and a film can be formed on a large-area substrate. . Water-cooling of the vicinity of the opening side end surface of the wall of the film forming chamber portion including the ground electrode including the built-in heater makes it possible to use a sealing material having a small pressing pressure and a low heat resistance, thereby further facilitating airtight maintenance. Was completed. These effects are due to
There is no difference between the case of performing by the VD method and the case of performing by the sputtering method.
【図1】本発明の一実施例の薄膜光電変換素子製造装置
を示す断面図FIG. 1 is a cross-sectional view showing a thin-film photoelectric conversion element manufacturing apparatus according to one embodiment of the present invention.
【図2】従来の薄膜光電変換素子製造装置の成膜室を示
し、(a) は開放時、(b) は封止時の断面図FIGS. 2A and 2B are cross-sectional views showing a film forming chamber of a conventional thin film photoelectric conversion device manufacturing apparatus, wherein FIG.
【図3】図1の装置のシール部近傍の拡大断面図FIG. 3 is an enlarged sectional view showing the vicinity of a seal portion of the apparatus shown in FIG. 1;
【図4】図1の装置の上部成膜室ケーシング開口側端部
の下面図FIG. 4 is a bottom view of the upper film forming chamber casing opening side end of the apparatus of FIG. 1;
【図5】図1の装置の下部成膜室トッププレートの上面
図FIG. 5 is a top view of a top plate of a lower film forming chamber of the apparatus of FIG. 1;
1 可撓性基板 21 下部成膜室 22 上部成膜室 23 ベース 24 トッププレート 25 ケーシング 26 ハウジング 27 移動プレート 29 アクチュエータ 31 高電圧電極 32 接地電極 33 ヒータ 34 支持チューブ 5 Oリング 6 成膜空間 61、63 真空排気管 64 可撓性配管 7 保持板 71 ありみぞ 8 冷却水通路 81 冷却水導管 82 水冷ジャケット DESCRIPTION OF SYMBOLS 1 Flexible substrate 21 Lower film formation room 22 Upper film formation room 23 Base 24 Top plate 25 Casing 26 Housing 27 Moving plate 29 Actuator 31 High voltage electrode 32 Ground electrode 33 Heater 34 Support tube 5 O-ring 6 Film formation space 61, 63 Vacuum exhaust pipe 64 Flexible piping 7 Retaining plate 71 Recessed groove 8 Cooling water passage 81 Cooling water conduit 82 Water cooling jacket
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭60−12735(JP,A) 特開 昭62−13030(JP,A) 特開 平5−251361(JP,A) 特開 昭60−30124(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/205 H01L 21/203 H01L 31/04 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-60-12735 (JP, A) JP-A-62-13030 (JP, A) JP-A-5-251361 (JP, A) JP-A-60-1985 30124 (JP, A) (58) Field surveyed (Int. Cl. 7 , DB name) H01L 21/205 H01L 21/203 H01L 31/04
Claims (9)
ぞれ函状の壁体を有する二つの部分の開口側の間に停止
させ、基板を成膜室の両部分の壁体の開口側端面間には
さみ、成膜室の一方の部分と基板とにより囲まれた成膜
空間を真空にし、空間内の電極に電圧を印加して成膜す
るものにおいて、成膜室の各部の壁体の開口側端面上に
それぞれシール材が設けられ、各部の壁体にそれぞれ真
空排気管が開口することを特徴とする薄膜光電変換素子
の製造装置。A flexible substrate to be transported is stopped between the opening sides of two portions each having a box-shaped wall in a film forming chamber, and the substrate is moved to the opposite side of the wall in both portions of the film forming chamber. A film forming space surrounded by one part of the film forming chamber and the substrate is sandwiched between the end faces on the opening side, and a film is formed by applying a voltage to the electrodes in the space. An apparatus for manufacturing a thin-film photoelectric conversion element, wherein a sealing material is provided on an opening-side end surface of a wall, and a vacuum exhaust pipe is opened on each wall.
材が基板をはさんで対向しない位置に設けられた請求項
1記載の薄膜光電変換素子の製造装置。2. The thin-film photoelectric conversion device manufacturing apparatus according to claim 1, wherein the sealing material on the opening-side end surface of the wall body of each part of the film forming chamber is provided at a position where the sealing material does not face the substrate.
成されたありみぞ内に保持された請求項1あるいは2記
載の薄膜光電変換素子の製造装置。3. The apparatus according to claim 1, wherein the sealing material is held in a groove formed in the holding body fixed on the end face.
取りされた請求項3記載の薄膜光電変換素子の製造装
置。4. The apparatus for manufacturing a thin film photoelectric conversion element according to claim 3, wherein the side of the edge of the holding body facing the substrate is rounded off.
4のいずれかに記載の薄膜光電変換素子の製造装置。5. The apparatus according to claim 1, wherein the sealing material is an O-ring.
が可撓性管で連結された請求項1ないし5のいずれかに
記載の薄膜光電変換素子の製造装置。6. The apparatus for manufacturing a thin-film photoelectric conversion device according to claim 1, wherein vacuum evacuation pipes opening to the walls of each part of the film forming chamber are connected by flexible pipes.
膜室部分の壁体の開口側端面近傍が水冷された請求項1
ないし6のいずれかに記載の薄膜光電変換素子の製造装
置。7. The vicinity of an opening-side end surface of a wall of a film forming chamber in which a counter electrode containing a heater is housed is water-cooled.
7. The apparatus for manufacturing a thin-film photoelectric conversion element according to any one of claims 6 to 6.
CVD法による請求項1ないし7のいずれかに記載の薄
膜光電変換素子の製造装置。8. The apparatus for manufacturing a thin film photoelectric conversion element according to claim 1, wherein the film is formed by a CVD method in which a source gas is introduced into a film forming space.
スパッタ法による請求項1ないし7のいずれかに記載の
薄膜光電変換素子の製造装置。9. The apparatus for manufacturing a thin film photoelectric conversion element according to claim 1, wherein the film is formed by a sputtering method in which a discharge gas is introduced into a film forming space.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5292904A JP3063497B2 (en) | 1993-11-24 | 1993-11-24 | Manufacturing equipment for thin-film photoelectric conversion elements |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5292904A JP3063497B2 (en) | 1993-11-24 | 1993-11-24 | Manufacturing equipment for thin-film photoelectric conversion elements |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH07147242A JPH07147242A (en) | 1995-06-06 |
| JP3063497B2 true JP3063497B2 (en) | 2000-07-12 |
Family
ID=17787905
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5292904A Expired - Fee Related JP3063497B2 (en) | 1993-11-24 | 1993-11-24 | Manufacturing equipment for thin-film photoelectric conversion elements |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3063497B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6311936B1 (en) | 1999-07-30 | 2001-11-06 | Maytag Corporation | Hose retainer |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002208563A (en) * | 2001-01-09 | 2002-07-26 | Ebara Corp | Apparatus and method for processing workpiece |
| JP5124982B2 (en) * | 2006-05-16 | 2013-01-23 | 富士電機株式会社 | Thin film manufacturing apparatus and thin film manufacturing method |
| JP2009144211A (en) * | 2007-12-15 | 2009-07-02 | Tokyo Electron Ltd | Processing device, method of using the same, and storage medium |
| WO2013168195A1 (en) * | 2012-05-09 | 2013-11-14 | 株式会社ニッシン | Pattern forming method |
| CN113432763B (en) * | 2021-06-17 | 2023-07-21 | 中北大学 | Sandwich type PVDF pressure gauge vacuum environment pressing device and method |
-
1993
- 1993-11-24 JP JP5292904A patent/JP3063497B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6311936B1 (en) | 1999-07-30 | 2001-11-06 | Maytag Corporation | Hose retainer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH07147242A (en) | 1995-06-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4646609B2 (en) | Plasma CVD equipment | |
| TWI238856B (en) | Buffer chamber and method for integrating physical and chemical vapor deposition chambers together in a processing system | |
| JP5297376B2 (en) | Load-lock chamber with tube-shaped heater | |
| US5556500A (en) | Plasma etching apparatus | |
| EP0384754B1 (en) | Localized vacuum apparatus and method | |
| KR101323224B1 (en) | Load lock chamber with decoupled slit valve door seal compartment | |
| US20040149214A1 (en) | Vacuum processing apparatus | |
| CN101680090B (en) | Vacuum processing apparatus | |
| JPS6015918A (en) | External isolating module | |
| JP3063497B2 (en) | Manufacturing equipment for thin-film photoelectric conversion elements | |
| JPS6212129A (en) | Plasma-processing apparatus | |
| JP3314711B2 (en) | Thin film manufacturing equipment | |
| JPS60115226A (en) | Substrate temperature control method | |
| JP3475752B2 (en) | Thin film manufacturing equipment | |
| JPH0963970A (en) | Thin film element manufacturing apparatus and manufacturing method | |
| JP3063509B2 (en) | Manufacturing equipment for thin-film photoelectric conversion elements | |
| JP3096698B2 (en) | Method for manufacturing thin film photoelectric conversion element and film forming apparatus used for the method | |
| US6575739B1 (en) | Configurable wafer furnace | |
| JPH0670984B2 (en) | Sample temperature control method and apparatus | |
| JP2003309167A (en) | Substrate holding device | |
| JPH02110925A (en) | Vacuum processing equipment | |
| JP2865271B2 (en) | Manufacturing equipment for thin-film photoelectric conversion elements | |
| JP2636781B2 (en) | Vacuum processing method | |
| JP3021016B2 (en) | Substrate cooling mechanism | |
| JP2000216094A (en) | Thin film manufacturing equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090512 Year of fee payment: 9 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090512 Year of fee payment: 9 |
|
| S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
| S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090512 Year of fee payment: 9 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090512 Year of fee payment: 9 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100512 Year of fee payment: 10 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110512 Year of fee payment: 11 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110512 Year of fee payment: 11 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120512 Year of fee payment: 12 |
|
| S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120512 Year of fee payment: 12 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120512 Year of fee payment: 12 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130512 Year of fee payment: 13 |
|
| LAPS | Cancellation because of no payment of annual fees |