JP3314711B2 - Thin film manufacturing equipment - Google Patents
Thin film manufacturing equipmentInfo
- Publication number
- JP3314711B2 JP3314711B2 JP09129398A JP9129398A JP3314711B2 JP 3314711 B2 JP3314711 B2 JP 3314711B2 JP 09129398 A JP09129398 A JP 09129398A JP 9129398 A JP9129398 A JP 9129398A JP 3314711 B2 JP3314711 B2 JP 3314711B2
- Authority
- JP
- Japan
- Prior art keywords
- exhaust pipe
- film forming
- forming chamber
- chamber
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000010409 thin film Substances 0.000 title claims description 47
- 238000004519 manufacturing process Methods 0.000 title claims description 45
- 239000010408 film Substances 0.000 claims description 104
- 239000000758 substrate Substances 0.000 claims description 34
- 238000005192 partition Methods 0.000 claims description 32
- 230000015572 biosynthetic process Effects 0.000 claims description 18
- 239000012212 insulator Substances 0.000 claims description 7
- 238000007664 blowing Methods 0.000 claims description 3
- 229920005570 flexible polymer Polymers 0.000 claims description 2
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000002994 raw material Substances 0.000 claims description 2
- 238000009434 installation Methods 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 5
- 238000000151 deposition Methods 0.000 description 5
- 230000008021 deposition Effects 0.000 description 5
- 238000005096 rolling process Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000004760 aramid Substances 0.000 description 1
- 229920003235 aromatic polyamide Polymers 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 229920006015 heat resistant resin Polymers 0.000 description 1
- 239000003779 heat-resistant material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Chemical Vapour Deposition (AREA)
- Photovoltaic Devices (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、可撓性基板上に半
導体や金属などの薄膜をステッピングロール方式で成膜
する薄膜製造装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thin film manufacturing apparatus for forming a thin film of a semiconductor or metal on a flexible substrate by a stepping roll method.
【0002】[0002]
【従来の技術】アモルファスシリコン(以下a−Siと
記す)を主材料とした薄膜太陽電池を高分子材料あるい
はステンレス鋼などの金属からなる可撓性基板上に形成
して製造する方法は、生産性の点で優れている。長尺の
可撓性基板上に複数の層を成膜する方式として、各成膜
室内を移動する基板上に成膜するロールツーロール方式
と、成膜室内で停止させた基板上に成膜した後、成膜の
終わった基板部分を成膜室外へ送り出すステッピングロ
ール方式とがある。2. Description of the Related Art A method of manufacturing a thin film solar cell mainly composed of amorphous silicon (hereinafter referred to as a-Si) by forming it on a flexible substrate made of a polymer material or a metal such as stainless steel has been proposed. Excellent in terms of sex. A roll-to-roll method in which a plurality of layers are formed on a long flexible substrate and a film is formed on a substrate moving in each film forming chamber, and a film is formed on a substrate stopped in the film forming chamber Then, there is a stepping roll method in which the substrate portion on which film formation has been completed is sent out of the film formation chamber.
【0003】ステッピングロール方式においてプラズマ
CVDにより成膜する場合は、成膜室開放−基板の1フ
レーム移動−成膜室封止−原料ガス導入−圧力制御−放
電開始−放電終了−原料ガス停止−ガス引き−成膜室開
放の操作が繰り返される。ステッピングロール方式薄膜
製造装置に関する従来技術としては、特開平6−291
349号公報、特開平7−6953号公報、特開平8−
250431号公報がある。When a film is formed by plasma CVD in the stepping roll method, a film forming chamber is opened, a substrate is moved by one frame, a film forming chamber is sealed, a source gas is introduced, a pressure control is started, a discharge is started, a discharge is ended, and a source gas is stopped. The operation of degassing and opening the film forming chamber is repeated. As a prior art relating to a stepping roll type thin film manufacturing apparatus, Japanese Patent Application Laid-Open No. 6-291
349, JP-A-7-6953, JP-A-8-
There is 250431 gazette.
【0004】このステッピングロール方式の薄膜製造装
置は、通常の成膜中も搬送を停止しないロールツーロー
ルの薄膜製造装置に比べ以下の点で優れている。 (1)成膜中は成膜室は閉じられているので、隣接する
成膜室とのガス相互拡散がない。 (2)隣接する成膜室間にガス拡散を防止するガスカー
テン部を設ける必要がなく、薄膜製造装置がコンパクト
である。This thin film manufacturing apparatus of the stepping roll type is superior in the following points to a roll-to-roll thin film manufacturing apparatus in which conveyance is not stopped even during normal film formation. (1) Since the film formation chamber is closed during film formation, there is no gas mutual diffusion with the adjacent film formation chamber. (2) There is no need to provide a gas curtain between adjacent film forming chambers to prevent gas diffusion, and the thin film manufacturing apparatus is compact.
【0005】特に、コンパクト化と生産性の向上を追求
した従来のステッピングロール装置について説明する。
図6は従来のステッピングロール方式の薄膜製造装置内
の成膜室の開放時の基板に垂直で基板搬送方向に沿って
の断面図である。同時に2枚のフィルム状の基板上に成
膜が可能な装置である。離れて対向する2枚の基板1を
それぞれ挟んでヒータを兼用する接地電極2および高周
波電極3が対向して配置されている。高周波電極3の基
板1側の面には多数の小孔が開けられており、ガス導入
管6から導入されたガスは一様に吹き出される。細い矢
印はガスの流通方向を示している。接地電極2と共にそ
の内部に高周波電極3を収めた成膜室の成膜室隔壁4は
平面部4a、その周縁部の側壁部4bおよび接地電極2
と密着するフランジ4fからなっている。側壁部4bの
一部は絶縁枠体4cとされている。フランジ4fにはシ
ール材4sが嵌められている。成膜室の閉時には、接地
電極3は駆動装置8のアーム8aにより太い矢印Vの方
向に駆動されて、基板1をシール部4cに押しつけるこ
とにより、成膜室は閉空間とされる。成膜室は基板1
(または接地電極2)と高周波電極3との間の放電空間
が全体の50%以上を占め、非常にコンパクトである。搬
送方向に同じ位置にある2つの成膜室は1つの排気管7
により連通されている。成膜室は図示してない他の成膜
室や搬送装置と共に共通室壁5により囲まれ、共通室内
に収められて、大気と隔離されている。[0005] In particular, a description will be given of a conventional stepping roll device pursuing compactness and improvement in productivity.
FIG. 6 is a cross-sectional view taken along a direction perpendicular to the substrate and along the substrate transport direction when a film forming chamber in a conventional stepping roll type thin film manufacturing apparatus is opened. This is an apparatus that can simultaneously form films on two film substrates. A ground electrode 2 also serving as a heater and a high-frequency electrode 3 are arranged to face each other with the two substrates 1 opposed to each other interposed therebetween. A number of small holes are formed in the surface of the high-frequency electrode 3 on the substrate 1 side, and the gas introduced from the gas introduction pipe 6 is uniformly blown out. Thin arrows indicate the direction of gas flow. The deposition chamber partition 4 of the deposition chamber in which the high-frequency electrode 3 is housed together with the ground electrode 2 has a flat portion 4a, a side wall portion 4b at the periphery thereof, and the ground electrode 2
4f. A part of the side wall 4b is an insulating frame 4c. A sealing material 4s is fitted to the flange 4f. When the film forming chamber is closed, the ground electrode 3 is driven by the arm 8a of the driving device 8 in the direction of the thick arrow V, and presses the substrate 1 against the seal portion 4c to make the film forming chamber a closed space. The deposition chamber is the substrate 1
The discharge space between (or the ground electrode 2) and the high-frequency electrode 3 occupies 50% or more of the whole, and is very compact. Two film forming chambers located at the same position in the transport direction are connected to one exhaust pipe 7.
Communication. The film forming chamber is surrounded by a common chamber wall 5 together with other film forming chambers and a transfer device (not shown), housed in the common room, and isolated from the atmosphere.
【0006】成膜室隔壁4の平面部4aは高周波電極2
を支持しており同電位であるが、成膜中の共通室の圧力
を0.1Pa 以下に保つことにより平面部4aからの放電を
抑えることができる。しかし、排気管7の内部の圧力
は、成膜時に必要な圧力10〜100Pa に保持されているの
で、放電を避けるために、排気管7は絶縁物とされ、2
つの高周波電極2間の距離を10cm以上としている。The flat portion 4a of the partition 4 of the film forming chamber is
Are maintained at the same potential, but the discharge from the flat portion 4a can be suppressed by keeping the pressure of the common chamber during film formation at 0.1 Pa or less. However, since the pressure inside the exhaust pipe 7 is maintained at a pressure required for film formation at 10 to 100 Pa, the exhaust pipe 7 is made of an insulating material to avoid discharge.
The distance between two high-frequency electrodes 2 is 10 cm or more.
【0007】高周波電極の配置としては1個の高周波電
極を中央に起き、その両面で放電させる構成も考えられ
る。しかし、高周波電極の両面での膜厚を均等にするた
めには両面の放電を独立に制御する必要があるが、1個
の高周波電極ではこれは困難であるので、上記のような
別々の高周波電極でそれぞれ独立に放電を制御する方式
が採用されている。As an arrangement of the high-frequency electrodes, a configuration in which one high-frequency electrode is formed at the center and discharge is performed on both surfaces thereof is also conceivable. However, in order to make the film thickness on both sides of the high-frequency electrode uniform, it is necessary to control the discharge on both sides independently, but this is difficult with one high-frequency electrode. A method in which discharge is independently controlled by electrodes is adopted.
【0008】[0008]
【発明が解決しようとする課題】上記のステッピングロ
ール方式の薄膜製造装置には以下の問題点がある。排気
管内での放電防止のため高周波電極間を10cm以上隔てる
必要があり、共通室すなわち薄膜製造装置全体の横幅が
広くなってしまう。そのため共通室の容積が大きく共通
室を排気する排気装置が大型となる。そのため、クリー
ンルーム内に広い設置面積が必要となり、また装置は高
価となりこれは成膜コストを上げる。The above-described thin film manufacturing apparatus of the stepping roll type has the following problems. In order to prevent discharge in the exhaust pipe, it is necessary to separate the high-frequency electrodes by 10 cm or more, and the width of the common chamber, that is, the entire width of the thin film manufacturing apparatus is increased. Therefore, the volume of the common chamber is large, and the exhaust device that exhausts the common chamber becomes large. Therefore, a large installation area is required in the clean room, and the apparatus becomes expensive, which increases the film formation cost.
【0009】また、ヒータを兼ねた接地電極は、均熱性
を良くするために重いアルミ鋳込みヒータが用いられ
る。このため、接地電極の駆動系も大型化し、また装置
コストは上がり、成膜コストを上げる。本発明の目的
は、従来に較べ軽量で、設置面積の狭いステッピングロ
ール方式の薄膜製造装置を提供することである。A heavy aluminum cast heater is used for the ground electrode also serving as a heater in order to improve heat uniformity. For this reason, the drive system of the ground electrode becomes large, the equipment cost increases, and the film formation cost increases. An object of the present invention is to provide a thin film manufacturing apparatus of a stepping roll type which is lighter than the conventional one and has a small installation area.
【0010】[0010]
【課題を解決するための手段】上記の目的を達成するた
めに、少なくとも、接地電極と、その両面に対向して配
置され、原料ガスを表面から吹き出す2個の高周波電極
と、これらの高周波電極をそれぞれ囲い、成膜時には開
口部が基板を挟んで接地電極に密着して閉じた成膜室を
形成する2つの成膜室隔壁と、この成膜室対を1ないし
複数内蔵し、前記接地電極を固定している共通室とから
なり、接地電極と高周波電極との間の放電を利用して成
膜するステッピングロール方式の薄膜製造装置におい
て、前記成膜室隔壁には原料ガスの排気管が設けられ、
この排気管および前記高周波電極に設けられている原料
ガスの導入管は前記共通室壁の高周波電極に平行な部分
を貫通していることとする。In order to achieve the above object, at least a ground electrode, two high-frequency electrodes disposed opposite to both surfaces thereof and for blowing a raw material gas from the surface, and these high-frequency electrodes And two or more film-forming chamber partitions for forming a closed film-forming chamber whose opening is in close contact with the ground electrode with the substrate interposed therebetween during film formation, and one or more pairs of the film-forming chambers. In a stepping roll type thin film manufacturing apparatus comprising a common chamber in which electrodes are fixed, and using a discharge between a ground electrode and a high-frequency electrode, a film forming chamber partition is provided with an exhaust pipe of a source gas. Is provided,
The exhaust pipe and the feed pipe for the source gas provided in the high-frequency electrode pass through a portion of the common chamber wall parallel to the high-frequency electrode.
【0011】前記排気管および導入管の前記共通室壁を
貫通する部分は絶縁体からなり、これらの管内での放電
が防止されていると良い。前記成膜室隔壁の前記接地電
極に密着する部分にはシールが設けられ、前記共通室内
で放電が起こらないように成膜時には共通室の圧力が0.
1Pa 以下または大気圧に保つことができると良い。It is preferable that portions of the exhaust pipe and the introduction pipe penetrating the common chamber wall are made of an insulator, and discharge in these pipes is prevented. A seal is provided on a portion of the film forming chamber partition wall that is in close contact with the ground electrode, and the pressure of the common chamber is set to 0 during film formation so that discharge does not occur in the common chamber.
It is desirable that the pressure can be maintained at 1 Pa or less or atmospheric pressure.
【0012】前記高周波電極は前記成膜室隔壁に固定さ
れ、前記成膜室隔壁と同時に共通室外に設けられた駆動
装置により開閉されると良い。前記成膜室隔壁は平面部
と側壁部に分割されており、前記高周波電極は成膜室隔
壁の平面部と共に前記共通室壁に固定されており、側壁
部は共通室外に設けられた駆動装置により開閉され、側
壁部に取り付けられた導入管および排出管は共通室壁の
間にはベローズが設けられ共通室の気密が保持されると
良い。Preferably, the high-frequency electrode is fixed to the partition wall of the film forming chamber, and is opened and closed by a driving device provided outside the common chamber simultaneously with the partition wall of the film forming chamber. The film forming chamber partition is divided into a plane portion and a side wall portion, the high-frequency electrode is fixed to the common chamber wall together with the flat portion of the film forming chamber partition, and the side wall portion is provided outside the common chamber. The introduction pipe and the discharge pipe attached to the side wall are preferably provided with a bellows between the walls of the common chamber to keep the airtightness of the common chamber.
【0013】前記成膜室隔壁の平面部と側壁部とはベロ
ーズにより接続されて成膜室の気密が保たれると良い。
前記成膜室隔壁の平面部と側壁部との間にはシール部が
設けられ、シール部を挟んで平面部と側壁部が密着し成
膜室の気密が保たれると良い。前記成膜室隔壁の側壁部
は平面部に一体化された固定部と可動部に分割されてお
り、前記高周波電極はこの固定部と共に前記共通室壁に
固定されており、固定部と可動部の間には絶縁性で可撓
性の高分子フィルムからなるベローズが設けられ成膜室
の気密が保持され、可動部は共通室外に設けられた駆動
装置により開閉されると良い。It is preferable that the flat part and the side wall part of the partition wall of the film forming chamber are connected by bellows to keep the airtightness of the film forming chamber.
It is preferable that a seal portion is provided between the flat portion and the side wall portion of the film forming chamber partition wall, and the flat portion and the side wall portion are in close contact with each other with the seal portion interposed therebetween, so that the airtightness of the film forming chamber is maintained. The side wall portion of the film forming chamber partition is divided into a fixed portion and a movable portion integrated with a plane portion, and the high-frequency electrode is fixed to the common chamber wall together with the fixed portion, and the fixed portion and the movable portion A bellows made of an insulative and flexible polymer film is provided therebetween to keep the airtightness of the film forming chamber, and the movable portion is preferably opened and closed by a driving device provided outside the common chamber.
【0014】前記成膜室隔壁の平面部の前記排気管に接
する端部から排気管の内側表面に至り、さらに前記共通
室の前記排気管に接する端部に至る迄の距離の和は30mm
以上であると良い。また、上記の距離の和を実現するた
めに、前記排気管は肉厚である、または前記排気管が貫
通する前記共通室壁の穴は前記排気管の外形より大き
く、前記排気管は絶縁体よりなる支持部材により支持さ
れている、または前記排気管が貫通する部分の前記共通
室壁面はその外側周縁の共通室壁面より外側に突出して
いると良い。The sum of the distances from the end of the plane part of the film forming chamber partition wall which contacts the exhaust pipe to the inner surface of the exhaust pipe to the end of the common chamber which contacts the exhaust pipe is 30 mm.
It is good if it is above. In order to realize the sum of the above-mentioned distances, the exhaust pipe is thick, or a hole in the common chamber wall through which the exhaust pipe penetrates is larger than the outer shape of the exhaust pipe, and the exhaust pipe is made of an insulator. The wall of the common chamber, which is supported by a supporting member or through which the exhaust pipe penetrates, may protrude outside the wall of the common chamber on the outer periphery.
【0015】[0015]
【発明の実施の形態】実施例1 図1は本発明に係る実施例の薄膜製造装置の成膜室の開
放時の基板搬送方向に沿っての断面図である。ヒータを
兼ねた接地電極2は共通室のほぼ中央に固定されてお
り、高周波電極3はその両側に配置される。高周波電極
3は従来と同じ形状であり、ガス導入管6からガスが導
入され、多数の小孔から成膜領域に一様に吹き出され
る。ガスの流通は細い矢印で示してある。2枚のフィル
ム基板1は接地電極2の両面に搬送される。成膜室壁4
は平面部4a、側壁部部4b、絶縁枠体4cおよびフラ
ンジ4fからなっている。平面部4aには絶縁体のガス
排気管7が取り付けられており、ガス排気管7は共通室
壁5を貫通して共通室の外側に突き出ている。共通室と
大気間の気密を保つために、ガス排気管7の端部に取り
付けたフランジ7fと共通室壁5の間にベローズB1を
接続してある。平面部4aまたは高周波電極2と共通室
壁5との間で内部で放電を起こさないようにガス排気管
7の長さを10cm以上にする必要がある。ガス排気管7
の個数は、単数、複数のどちらでも良いが単数の場合は
各成膜室壁の平面部4aの中央に、複数の場合は中央に
対称形になるように配置する。この排気管の配置によっ
て共通室のほぼ排気管長さと接地電極厚さの和分の薄型
化を図ることができる。ここには図示していないが圧力
コントローラーおよび真空排気系への接続はステンレス
製のベローズを使っている。DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiment 1 FIG. 1 is a cross-sectional view along a substrate transfer direction when a film forming chamber of a thin film manufacturing apparatus according to an embodiment of the present invention is opened. The ground electrode 2 also serving as a heater is fixed substantially at the center of the common chamber, and the high-frequency electrodes 3 are arranged on both sides thereof. The high-frequency electrode 3 has the same shape as the conventional one, and a gas is introduced from a gas introduction pipe 6 and is uniformly blown out from a large number of small holes to a film formation region. Gas flow is indicated by thin arrows. The two film substrates 1 are transported to both sides of the ground electrode 2. Deposition chamber wall 4
Is composed of a plane portion 4a, a side wall portion 4b, an insulating frame 4c, and a flange 4f. An insulating gas exhaust pipe 7 is attached to the flat portion 4a, and the gas exhaust pipe 7 penetrates the common chamber wall 5 and protrudes outside the common chamber. A bellows B1 is connected between the flange 7f attached to the end of the gas exhaust pipe 7 and the common chamber wall 5 to keep the airtightness between the common chamber and the atmosphere. The length of the gas exhaust pipe 7 needs to be 10 cm or more so as not to cause a discharge inside the flat portion 4a or between the high-frequency electrode 2 and the common chamber wall 5. Gas exhaust pipe 7
May be singular or plural, but if singular, they are arranged symmetrically at the center of the plane portion 4a of each film forming chamber wall, and if plural, they are arranged symmetrically at the center. This arrangement of the exhaust pipe makes it possible to reduce the thickness of the common chamber by substantially the sum of the exhaust pipe length and the thickness of the ground electrode. Although not shown here, a stainless steel bellows is used for connection to the pressure controller and the evacuation system.
【0016】平面部4aは金属または絶縁物のどちらで
もよいが、金属の場合は高周波電極と接触させて同電位
に保ち、放電が起こらないようにする必要がある。ま
た、絶縁物の場合は絶縁枠体4bやガス排気管7と一体
化してもよい。ガス排気管7としてセラミックや耐熱性
のあるフッ素樹脂などの絶縁材料を用いることができ
る。The flat portion 4a may be made of either a metal or an insulator. In the case of a metal, it is necessary that the flat portion 4a is brought into contact with a high-frequency electrode to maintain the same potential so that no discharge occurs. In the case of an insulator, it may be integrated with the insulating frame 4b or the gas exhaust pipe 7. For the gas exhaust pipe 7, an insulating material such as ceramic or heat-resistant fluororesin can be used.
【0017】成膜室壁4(高周波電極も一体化されてい
る)の開閉は共通室壁5に設置した駆動装置8のアーム
8によって行われる。成膜時に共通室内で放電は起こら
ないようにするため、共通室の圧力は0.1Pa以下に保持
する必要があり、そのためには成膜室のシール4sとし
ては、通常用いられるフッ素樹脂などのOリングの他に
フィルム基板自身、金属またセラミックやガラスなどを
用いることができる。The opening and closing of the film forming chamber wall 4 (in which the high-frequency electrode is also integrated) is performed by an arm 8 of a driving device 8 installed on the common chamber wall 5. In order to prevent discharge from occurring in the common chamber during film formation, it is necessary to maintain the pressure in the common chamber at 0.1 Pa or less. In addition to the ring, the film substrate itself, metal, ceramic, glass, or the like can be used.
【0018】本実施例により、薄膜製造装置は従来より
も主として接地電極の1個分だけ共通室の幅が狭くコン
パクトとなり、重量のある接地電極が1個となり、駆動
装置も対応して軽くなったので薄膜製造装置全体の重量
は軽くなった。 実施例2 図2は本発明に係る他の実施例の薄膜製造装置の成膜室
の基板搬送方向に沿っての断面図である。実施例1と異
なる点は、高周波電極3および平面部4aがガス排気管
7によって共通室壁5に固定されており、成膜室隔壁の
側壁部4bがベローズB3によって平面部4aに接続さ
れており可動できるようになっている。実施例1に比べ
て可動する部分が少ないため、成膜室の開閉すなわち可
動部の駆動に必要な力はより小さくて済み駆動装置8の
小型化が可能となる。また、高周波電極3が共通室壁5
固定されているため高周波電極3の移動に伴っていたパ
ウダーやフレークの発生はなくなり、これらのフィルム
への付着がより少なく、太陽電池量産時の特性安定性が
良いというメリットが生じた。 実施例3 図3は本発明に係る別の実施例の薄膜製造装置の成膜室
の基板搬送方向に沿っての断面図である。実施例2にお
ける成膜室の平面部4aと成膜室側壁部4bを接続して
いるベローズB3に替わってシール4tとしてあり、フ
ィルム基板1をシールS1でシールすると同時に平面部
4aでシールを行えるようになっている。同時シールを
より確実にするため成膜室側壁4bの一部をベローズに
換えることも有効である。シール4tはシール4sと同
様にフッ素樹脂の他にフィルム基板自身、金属やセラミ
ックやガラスなどを用いることができる。According to this embodiment, the thin-film manufacturing apparatus is smaller in size than the conventional one, mainly because the width of the common chamber is narrower by one ground electrode, so that the weight is reduced to one, and the driving device is correspondingly lighter. As a result, the weight of the entire thin film manufacturing apparatus was reduced. Embodiment 2 FIG. 2 is a cross-sectional view along a substrate transport direction of a film forming chamber of a thin film manufacturing apparatus according to another embodiment of the present invention. The difference from the first embodiment is that the high-frequency electrode 3 and the flat part 4a are fixed to the common chamber wall 5 by the gas exhaust pipe 7, and the side wall part 4b of the film forming chamber partition is connected to the flat part 4a by the bellows B3. It can be moved. Since there are fewer movable parts than in the first embodiment, the force required for opening and closing the film forming chamber, that is, for driving the movable parts is smaller, and the driving device 8 can be made smaller. Also, the high-frequency electrode 3 is connected to the common chamber wall 5.
Since it is fixed, the generation of powder and flakes accompanying the movement of the high-frequency electrode 3 is eliminated, and there is the advantage that the adhesion to these films is smaller and the characteristic stability during mass production of solar cells is good. Third Embodiment FIG. 3 is a cross-sectional view of a film forming chamber of a thin film manufacturing apparatus according to another embodiment of the present invention, taken along a substrate transport direction. A seal 4t is used instead of the bellows B3 connecting the flat part 4a of the film forming chamber and the side wall part 4b of the film forming chamber in the second embodiment, and the film substrate 1 can be sealed with the seal S1 and simultaneously with the flat part 4a. It has become. It is also effective to replace a part of the film forming chamber side wall 4b with a bellows in order to ensure simultaneous sealing. As the seal 4t, similarly to the seal 4s, besides the fluororesin, the film substrate itself, metal, ceramic, glass, or the like can be used.
【0019】実施例2と殆ど同様に軽量化と幅の低減に
よる設置面積の低減ができた。 実施例4 図4は本発明に係る別の実施例の薄膜製造装置の成膜室
の基板搬送方向に沿っての断面図である。成膜室側壁4
bの一部である絶縁体枠4cをガラスやセラミック等の
剛体ではなく、ポリイミドやアラミドなどの耐熱性で且
つ絶縁性の材料からなるフィルム4gとしてある。フィ
ルム4gを接地電極方向に伸ばし、シール4sを基板1
を介して接地電極2に密着させることにより成膜室を閉
じることができる。すなわちフィルム4gに実施例2
(図2)におけるベローズB3と同じ機能を持たせてあ
る。本実施例は他の実施例に比べて可動部の重量が最も
小さい。このため、駆動系のさらなる小型化が可能にな
り、薄膜製造装置の設置面積の低減と、結果として薄膜
製造装置の低コスト化につながる。 実施例5 共通壁と成膜室隔壁との距離をできるだけ小さくして、
薄膜製造装置の厚さを小さくすることもできる。この場
合は、共通壁の排気管に接する端部から排気管内部を通
り成膜室隔壁の排気管に接する端部に至る距離の和が小
さくなるため、排気管の中のこれら端部に近い空間で放
電が生じるおそれがある。この放電により生じた粉体が
薄膜に付着したりすること避けるため、これら端部を遠
ざけておく必要がある。図5は本発明に係る成膜室隔壁
の排気管に接する端部を遠ざけた薄膜製造装置の成膜室
の断面図であり(a)は肉厚排気管を用いたの場合、
(b)は他の絶縁性のガス排気管支持部材の介在の場合
であり(c)は共通室壁の迂回壁を設けた場合である。
図面の簡略化のため片側の成膜室のみを図示した。それ
ぞれ、肉厚の排気管7aを用いる、または排気管が貫通
する共通室壁の穴を排気管の外形より大きくしておき、
排気管をセラミックスや耐熱性の樹脂などの他の絶縁性
のガス排気管支持部材7bにより支持する、または排気
管7が貫通する部分の前記共通室壁面をその外側周縁の
共通室壁面より外側に突出させて、共通室壁の迂回壁5
aを形成する、などである。いずれの場合においても、
共通室壁の排気管に接する端部から排気管内側表面に至
りまた成膜室隔壁の排気管に接する端部に至るまでの距
離の和が大きくなっていることは明らかである。この距
離の和が30mm未満では、排気管7の内部で放電が起こる
場合があった。As in the case of the second embodiment, the installation area can be reduced by reducing the weight and the width. Fourth Embodiment FIG. 4 is a cross-sectional view of a thin film manufacturing apparatus according to another embodiment of the present invention, taken along a substrate transport direction of a film forming chamber. Deposition chamber side wall 4
The insulator frame 4c, which is a part of b, is not a rigid body such as glass or ceramic but a film 4g made of a heat-resistant and insulating material such as polyimide or aramid. The film 4g is stretched in the direction of the ground electrode, and the seal 4s is attached to the substrate 1
The film formation chamber can be closed by bringing the electrode into close contact with the ground electrode 2 through the electrode. That is, Example 2 was applied to film 4g.
It has the same function as the bellows B3 in FIG. In this embodiment, the weight of the movable portion is the smallest as compared with the other embodiments. For this reason, the drive system can be further reduced in size, and the installation area of the thin film manufacturing apparatus can be reduced, and as a result, the cost of the thin film manufacturing apparatus can be reduced. Example 5 The distance between the common wall and the partition of the film forming chamber was reduced as much as possible,
The thickness of the thin film manufacturing apparatus can be reduced. In this case, the sum of the distances from the end of the common wall in contact with the exhaust pipe to the end of the film forming chamber partition wall that contacts the exhaust pipe through the inside of the exhaust pipe is small, so that these ends are close to these ends in the exhaust pipe. Electric discharge may occur in the space. In order to prevent the powder generated by this discharge from adhering to the thin film, it is necessary to keep these ends apart. FIG. 5 is a cross-sectional view of a film forming chamber of a thin film manufacturing apparatus in which an end of a film forming chamber partition wall according to the present invention that is in contact with an exhaust pipe is kept away (a) when a thick exhaust pipe is used.
(B) shows a case where another insulating gas exhaust pipe supporting member is interposed, and (c) shows a case where a detour wall of the common chamber wall is provided.
For simplification of the drawing, only the film forming chamber on one side is shown. In each case, a thick exhaust pipe 7a is used, or a hole in a common chamber wall through which the exhaust pipe penetrates is made larger than the outer shape of the exhaust pipe.
The exhaust pipe is supported by another insulating gas exhaust pipe support member 7b such as ceramics or heat-resistant resin, or the wall of the common chamber where the exhaust pipe 7 penetrates is located outside the common chamber wall of the outer peripheral edge. By projecting, detour wall 5 of the common room wall
a is formed, and so on. In each case,
It is apparent that the sum of the distances from the end of the common chamber wall contacting the exhaust pipe to the inner surface of the exhaust pipe and the end of the film forming chamber partition contacting the exhaust pipe is large. If the sum of the distances is less than 30 mm, discharge may occur inside the exhaust pipe 7.
【0020】実施例1ないし4にさらにこれらの排気管
内での放電防止策を施した厚さの薄い薄膜製造装置は設
置面積が小さくなり、また軽量化されてクリーンルーム
内への設置に適するようになった。The thin-film manufacturing apparatus of the first to fourth embodiments, in which a discharge prevention measure in the exhaust pipe is applied, has a small installation area and is light in weight so that it is suitable for installation in a clean room. became.
【0021】[0021]
【発明の効果】本発明によれば、接地電極と、その両面
に対向して配置され、原料ガスを表面から吹き出す2個
の高周波電極と、これらの高周波電極をそれぞれ囲い、
成膜時には開口部が基板を挟んで接地電極に密着して閉
じた成膜室を形成する2つの成膜室隔壁と、この成膜室
対を1ないし複数内蔵し、前記接地電極を固定している
共通室とからなり、接地電極と高周波電極との間の放電
を利用して成膜するステッピングロール方式の薄膜製造
装置において、前記成膜室隔壁に原料ガスの排気管を設
け、この排気管および前記高周波電極に設けられている
原料ガスの導入管を前記共通室壁の高周波電極に平行な
部分を貫通させたので、薄膜製造装置は従来よりも主と
して接地電極の1個分だけ共通室の幅が狭くコンパクト
となり、重量のある接地電極が1個となり、また可動部
分から接地電極が除かれたので可動部分は軽量化され、
対応して駆動装置も軽くなったので薄膜製造装置全体の
重量軽減された。According to the present invention, a ground electrode, two high-frequency electrodes disposed opposite to both surfaces thereof, and blowing out a source gas from the surface, respectively surround these high-frequency electrodes,
At the time of film formation, two film-forming chamber partition walls forming an open film-forming chamber in which an opening is in close contact with a ground electrode with a substrate interposed therebetween, and one or a plurality of film-forming chamber pairs are incorporated therein, and the ground electrode is fixed. In a stepping roll type thin film manufacturing apparatus comprising a common chamber having a common chamber and using a discharge between a ground electrode and a high-frequency electrode, an exhaust pipe for a source gas is provided in the partition of the film forming chamber. Since the tube and the feed tube for the source gas provided in the high-frequency electrode penetrate through a portion of the common chamber wall parallel to the high-frequency electrode, the thin-film manufacturing apparatus is mainly provided with a common chamber only for one ground electrode. Is narrow and compact, the weight of the ground electrode is reduced to one, and the movable part is lighter because the ground electrode is removed from the movable part.
Correspondingly, the driving device became lighter, so that the weight of the entire thin film manufacturing apparatus was reduced.
【0022】これらの結果として、可撓性基板上に薄膜
太陽電池を高い生産性で製造することが可能になり、低
コスト化に寄与できる。As a result, thin-film solar cells can be manufactured on a flexible substrate with high productivity, which can contribute to cost reduction.
【図1】本発明に係る実施例の薄膜製造装置の成膜室の
基板搬送方向に沿っての断面図である。FIG. 1 is a cross-sectional view of a film forming chamber of a thin film manufacturing apparatus according to an embodiment of the present invention, taken along a substrate transport direction.
【図2】本発明に係る他の実施例の薄膜製造装置の成膜
室の基板搬送方向に沿っての断面図である。FIG. 2 is a cross-sectional view taken along a substrate transport direction of a film forming chamber of a thin film manufacturing apparatus according to another embodiment of the present invention.
【図3】本発明に係る別の実施例の薄膜製造装置の成膜
室の基板搬送方向に沿っての断面図である。FIG. 3 is a cross-sectional view of a film forming chamber of a thin film manufacturing apparatus according to another embodiment of the present invention, taken along a substrate transport direction.
【図4】本発明に係る別の実施例の薄膜製造装置の成膜
室の基板搬送方向に沿っての断面図である。FIG. 4 is a cross-sectional view of a film forming chamber of a thin film manufacturing apparatus according to another embodiment of the present invention, taken along a substrate transport direction.
【図5】本発明に係る成膜室隔壁の排気管に接する端部
を遠ざけた薄膜製造装置の成膜室の断面図であり(a)
は肉厚排気管壁の場合、(b)は他の絶縁部材の介在の
場合であり(c)は共通室壁の迂回場合である。FIG. 5A is a cross-sectional view of a film forming chamber of a thin film manufacturing apparatus in which an end of a film forming chamber partition wall according to the present invention, which is in contact with an exhaust pipe, is kept away (a).
(B) shows the case where another insulating member is interposed, and (c) shows the case where the common chamber wall is bypassed.
【図6】従来のステッピングロール方式の薄膜製造装置
内の成膜室の開放時の基板に垂直で基板搬送方向に沿っ
ての断面図である。FIG. 6 is a cross-sectional view taken along a substrate transport direction perpendicular to a substrate when a film forming chamber in a conventional stepping roll type thin film manufacturing apparatus is opened.
1 フィルム基板 2 接地電極 3 高周波電極 4 成膜室隔壁 4a 平面部 4b 側壁部 4c 絶縁性枠体 4f フランジ 4s シール 4t シール 4g 絶縁性フィルム 5 共通室壁 5a 迂回壁 6 ガス導入管 6f フランジ 7 ガス排気管 7a 肉厚のガス排気管 7b ガス排気管支持部材 7f フランジ 8 駆動装置 8a 駆動装置のアーム B1 ベローズ B2 ベローズ B3 ベローズ V 成膜室の開閉方向 REFERENCE SIGNS LIST 1 film substrate 2 ground electrode 3 high-frequency electrode 4 film forming chamber partition 4 a flat surface 4 b side wall 4 c insulating frame 4 f flange 4 s seal 4 t seal 4 g insulating film 5 common chamber wall 5 a detour wall 6 gas introduction pipe 6 f flange 7 gas Exhaust pipe 7a Thick gas exhaust pipe 7b Gas exhaust pipe support member 7f Flange 8 Drive 8a Drive arm B1 Bellows B2 Bellows B3 Bellows V Opening / closing direction of film forming chamber
Claims (12)
して配置され、原料ガスを表面から吹き出す2個の高周
波電極と、これらの高周波電極をそれぞれ囲い、成膜時
には開口部が基板を挟んで接地電極に密着して閉じた成
膜室を形成する2つの成膜室隔壁と、この成膜室対を1
ないし複数内蔵し、前記接地電極を固定している共通室
とからなり、接地電極と高周波電極との間の放電を利用
して成膜するステッピングロール方式の薄膜製造装置に
おいて、前記成膜室隔壁には原料ガスの排気管が設けら
れ、この排気管および前記高周波電極に設けられている
原料ガスの導入管は前記共通室壁の高周波電極に平行な
部分を貫通していることを特徴とする薄膜製造装置。1. At least a ground electrode, two high-frequency electrodes disposed opposite to both surfaces thereof for blowing a raw material gas from the surface, each surrounding these high-frequency electrodes, and an opening sandwiching the substrate during film formation. And two film forming chamber partitions forming a closed film forming chamber in close contact with the ground electrode,
A stepping roll type thin film manufacturing apparatus comprising a plurality of built-in common chambers to which the ground electrode is fixed, wherein a film is formed by using a discharge between the ground electrode and the high-frequency electrode. Is provided with a source gas exhaust pipe, and the exhaust pipe and the source gas introduction pipe provided in the high-frequency electrode penetrate through a portion of the common chamber wall parallel to the high-frequency electrode. Thin film manufacturing equipment.
貫通する部分は絶縁体からなり、これらの管内での放電
が防止されていることを特徴とする請求項1に記載の薄
膜製造装置。2. A thin film manufacturing apparatus according to claim 1, wherein portions of said exhaust pipe and said inlet pipe penetrating through said common chamber wall are made of an insulator, and discharge in these pipes is prevented. apparatus.
部分にはシールが設けられ、前記共通室内で放電が起こ
らないように成膜時には共通室の圧力が0.1Pa 以下また
は大気圧に保つことができることを特徴とする請求項1
に記載の薄膜製造装置。3. A seal is provided at a portion of the partition wall of the film forming chamber which is in close contact with the ground electrode, and a pressure in the common chamber is set to 0.1 Pa or less or an atmospheric pressure during film formation so that discharge does not occur in the common chamber. 2. The apparatus according to claim 1, wherein
2. The thin film manufacturing apparatus according to claim 1.
れ、前記成膜室隔壁と同時に共通室外に設けられた駆動
装置により開閉されることを特徴とする請求項1ないし
3に記載の薄膜製造装置。4. The apparatus according to claim 1, wherein the high-frequency electrode is fixed to the partition wall of the film forming chamber, and is opened and closed by a driving device provided outside the common chamber at the same time as the partition wall of the film forming chamber. Thin film manufacturing equipment.
れており、前記高周波電極は成膜室隔壁の平面部と共に
前記共通室壁に固定されており、側壁部は共通室外に設
けられた駆動装置により開閉され、側壁部に取り付けら
れた導入管および排出管は共通室壁の間にはベローズが
設けられ共通室の気密が保持されることを特徴とする請
求項1ないし3に記載の薄膜製造装置。5. The film forming chamber partition is divided into a flat portion and a side wall portion, and the high-frequency electrode is fixed to the common chamber wall together with the flat portion of the film forming chamber partition, and the side wall portion is outside the common chamber. 4. A bellows is provided between a common chamber wall of the introduction pipe and the discharge pipe which is opened and closed by a driving device provided and is attached to a side wall part, so that the airtightness of the common chamber is maintained. 2. The thin film manufacturing apparatus according to claim 1.
ーズにより接続されて成膜室の気密が保たれることを特
徴とする請求項5に記載の薄膜製造装置。6. The thin film manufacturing apparatus according to claim 5, wherein the flat part and the side wall part of the film forming chamber partition are connected by a bellows to keep the film forming chamber airtight.
はシール部が設けられ、シール部を挟んで平面部と側壁
部が密着し成膜室の気密が保たれることを特徴とする請
求項5に記載の薄膜製造装置。7. A seal portion is provided between the flat portion and the side wall portion of the film forming chamber partition wall, and the flat portion and the side wall portion are in close contact with each other with the seal portion interposed therebetween, thereby keeping the film forming chamber airtight. The thin film manufacturing apparatus according to claim 5, wherein:
された固定部と可動部に分割されており、前記高周波電
極はこの固定部と共に前記共通室壁に固定されており、
固定部と可動部の間には絶縁性で可撓性の高分子フィル
ムからなるベローズが設けられ成膜室の気密が保持さ
れ、可動部は共通室外に設けられた駆動装置により開閉
されることを特徴とする請求項1ないし3に記載の薄膜
製造装置。8. A side wall of the film forming chamber partition is divided into a fixed portion and a movable portion integrated with a plane portion, and the high-frequency electrode is fixed to the common chamber wall together with the fixed portion.
A bellows made of an insulating and flexible polymer film is provided between the fixed part and the movable part to maintain the airtightness of the film forming chamber, and the movable part is opened and closed by a driving device provided outside the common chamber. The thin film manufacturing apparatus according to claim 1, wherein:
する端部から排気管の内側表面に至り、さらに前記共通
室の前記排気管に接する端部に至る迄の距離の和は30mm
以上であることを特徴とする請求項1ないし8に記載の
薄膜製造装置。9. The sum of the distances from the end of the plane part of the film forming chamber partition wall in contact with the exhaust pipe to the inner surface of the exhaust pipe to the end of the common chamber in contact with the exhaust pipe is: 30mm
9. The apparatus for manufacturing a thin film according to claim 1, wherein:
る請求項9に記載の薄膜製造装置。10. The apparatus according to claim 9, wherein said exhaust pipe is thick.
は前記排気管の外形より大きく、前記排気管は絶縁体よ
りなる支持部材により支持されていることを特徴とする
請求項9に記載の薄膜製造装置。11. The exhaust pipe according to claim 9, wherein a hole in the common chamber wall through which the exhaust pipe penetrates is larger than an outer shape of the exhaust pipe, and the exhaust pipe is supported by a support member made of an insulator. The thin film manufacturing apparatus according to the above.
壁面はその外側周縁の共通室壁面より外側に突出してい
ることを特徴とする請求項9に記載の薄膜製造装置。12. The thin-film manufacturing apparatus according to claim 9, wherein the wall of the common chamber at a portion through which the exhaust pipe penetrates protrudes outward from the wall of the common chamber at an outer peripheral edge thereof.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09129398A JP3314711B2 (en) | 1998-04-03 | 1998-04-03 | Thin film manufacturing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP09129398A JP3314711B2 (en) | 1998-04-03 | 1998-04-03 | Thin film manufacturing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11288890A JPH11288890A (en) | 1999-10-19 |
| JP3314711B2 true JP3314711B2 (en) | 2002-08-12 |
Family
ID=14022433
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP09129398A Expired - Fee Related JP3314711B2 (en) | 1998-04-03 | 1998-04-03 | Thin film manufacturing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3314711B2 (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3980260B2 (en) * | 2000-10-11 | 2007-09-26 | 株式会社神戸製鋼所 | Plasma processing equipment |
| US7845309B2 (en) * | 2004-07-13 | 2010-12-07 | Nordson Corporation | Ultra high speed uniform plasma processing system |
| JP5109301B2 (en) * | 2006-07-27 | 2012-12-26 | 富士電機株式会社 | Film forming apparatus and film forming method |
| JP5445903B2 (en) * | 2009-02-12 | 2014-03-19 | 富士電機株式会社 | Thin film forming equipment |
| US8968473B2 (en) | 2009-09-21 | 2015-03-03 | Silevo, Inc. | Stackable multi-port gas nozzles |
| US9441295B2 (en) | 2010-05-14 | 2016-09-13 | Solarcity Corporation | Multi-channel gas-delivery system |
| US9240513B2 (en) | 2010-05-14 | 2016-01-19 | Solarcity Corporation | Dynamic support system for quartz process chamber |
| JP2017518626A (en) | 2015-02-17 | 2017-07-06 | ソーラーシティ コーポレーション | Method and system for improving manufacturing yield of solar cells |
| US9972740B2 (en) | 2015-06-07 | 2018-05-15 | Tesla, Inc. | Chemical vapor deposition tool and process for fabrication of photovoltaic structures |
| US9748434B1 (en) | 2016-05-24 | 2017-08-29 | Tesla, Inc. | Systems, method and apparatus for curing conductive paste |
| US9954136B2 (en) | 2016-08-03 | 2018-04-24 | Tesla, Inc. | Cassette optimized for an inline annealing system |
| US10115856B2 (en) | 2016-10-31 | 2018-10-30 | Tesla, Inc. | System and method for curing conductive paste using induction heating |
-
1998
- 1998-04-03 JP JP09129398A patent/JP3314711B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH11288890A (en) | 1999-10-19 |
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