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JP3475752B2 - Thin film manufacturing equipment - Google Patents
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JP3475752B2 - Thin film manufacturing equipment - Google Patents

Thin film manufacturing equipment

Info

Publication number
JP3475752B2
JP3475752B2 JP30400897A JP30400897A JP3475752B2 JP 3475752 B2 JP3475752 B2 JP 3475752B2 JP 30400897 A JP30400897 A JP 30400897A JP 30400897 A JP30400897 A JP 30400897A JP 3475752 B2 JP3475752 B2 JP 3475752B2
Authority
JP
Japan
Prior art keywords
film forming
substrate
chamber
thin film
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP30400897A
Other languages
Japanese (ja)
Other versions
JPH11145060A (en
Inventor
勝也 田淵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Holdings Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Holdings Ltd filed Critical Fuji Electric Holdings Ltd
Priority to JP30400897A priority Critical patent/JP3475752B2/en
Publication of JPH11145060A publication Critical patent/JPH11145060A/en
Application granted granted Critical
Publication of JP3475752B2 publication Critical patent/JP3475752B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Photovoltaic Devices (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、薄膜光電変換素子
のような可撓性基板上に複数層を有する薄膜素子の製造
方法に用い、構成層毎にそれぞれ独立に成膜する成膜室
を複数有するステッピングロール方式の薄膜製造装置に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is used in a method of manufacturing a thin film element having a plurality of layers on a flexible substrate such as a thin film photoelectric conversion element, and is provided with a film forming chamber for independently forming each constituent layer. The present invention relates to a stepping roll type thin film manufacturing apparatus having a plurality of steps.

【0002】[0002]

【従来の技術】例えばアモルファスシリコン(以下a−
Siと記す)を主材料とした光電変換層を含む多層薄膜
からなる薄膜光電変換素子などを長尺の高分子材料ある
いはステンレス鋼などの金属からなる可撓性基板上に形
成しておき、後で裁断して個別化する方式は、量産性に
優れている。
2. Description of the Related Art For example, amorphous silicon (hereinafter a-
(Hereinafter referred to as Si) as a main material, a thin film photoelectric conversion element including a multilayer thin film including a photoelectric conversion layer is formed on a flexible substrate made of a long polymer material or a metal such as stainless steel. The method of cutting and individualizing is excellent in mass productivity.

【0003】長尺の可撓性基板上への複数層の成膜方式
として、各成膜室内を連続移動しながら成膜するロール
ツーロール方式と、成膜室毎に停止させて成膜した後、
成膜の終わった基板部分を成膜室外へ送り出すステッピ
ングロール方式とがある。例えば、プラズマ化学気相成
長(以下CVDと記す)により成膜するステッピングロ
ール方式では、成膜室開放−基板1フレーム移動−成膜
室封止−原料ガス導入−圧力制御−放電開始−放電終了
−原料ガス停止−ガス引き−成膜室開放からなる操作が
繰り返される。
As a method for depositing a plurality of layers on a long flexible substrate, a roll-to-roll method in which a film is continuously moved in each deposition chamber, and a method in which the deposition is stopped in each deposition chamber rear,
There is a stepping roll method in which the substrate portion after the film formation is sent out of the film formation chamber. For example, in the stepping roll method of forming a film by plasma enhanced chemical vapor deposition (hereinafter referred to as CVD), the film forming chamber is opened-the substrate is moved by one frame, the film forming chamber is sealed, the raw material gas is introduced, the pressure is controlled, the discharge is started, and the discharge is ended. -The operation of stopping the raw material gas-gassing-opening the film forming chamber is repeated.

【0004】図6は共通真空室内に成膜室を複数有する
ステッピングロール成膜方式の薄膜製造装置の側面断面
図である。基板1はコア82から捲き出されコア83に
まきとられる間に、いくつかの成膜室80で成膜され
る。共通室81は複数の成膜室80を内部に収めてい
る。この装置は薄膜光電変換素子製造に用いることがで
き、成膜室ではスパッタ成膜またはプラズマCVD成膜
が行われる。このステッピングロール方式を採用した成
膜装置は、通常のロールツーロール成膜に比べ以下の点
が優れている。
FIG. 6 is a side sectional view of a stepping roll film forming type thin film manufacturing apparatus having a plurality of film forming chambers in a common vacuum chamber. The substrate 1 is formed in several film forming chambers 80 while being unwound from the core 82 and wound on the core 83. The common chamber 81 accommodates a plurality of film forming chambers 80 inside. This apparatus can be used for manufacturing a thin film photoelectric conversion element, and sputtering film formation or plasma CVD film formation is performed in the film formation chamber. The film forming apparatus adopting the stepping roll method is superior to the ordinary roll-to-roll film forming in the following points.

【0005】(1)隣接する成膜室とのガス相互拡散が
ない。 (2)装置がコンパクトである。ステッピングロール方
式成膜装置に関する従来技術は、特開平6−29134
9号公報、特開平7−6953号公報、特開平7−22
1025号公報、特開平8−250431号公報、特開
平8−293491号公報、特開平9−63970号公
報に開示されている。
(1) There is no interdiffusion of gas with the adjacent film forming chamber. (2) The device is compact. A conventional technique relating to a stepping roll type film forming apparatus is disclosed in Japanese Patent Laid-Open No. 6-29134.
No. 9, JP-A-7-6953, JP-A 7-22
No. 1025, Japanese Patent Application Laid-Open No. 8-250431, Japanese Patent Application Laid-Open No. 8-293491, and Japanese Patent Application Laid-Open No. 9-63970.

【0006】特開平6−291349は、ステッピング
ロール方式成膜装置およびこの装置を用いた薄膜光電変
換素子の製造方法を開示している。帯状可撓性基板の上
に複数の異なる性質の薄膜を積層して光電変換素子を形
成する薄膜光電変換素子の製造方法において、一つの共
通真空室の中に配列された複数の成膜室に可撓性基板を
通し、基板の出入口を基板にシール材を介して壁によっ
て気密に保たれた成膜室内の所定の真空雰囲気内で停止
した状態の基板の表面上に成膜し、ついで成膜室壁から
離した状態の基板を次の成膜位置まで搬送する操作を繰
り返すことを開示している。そして、基板面が鉛直面内
にあることが有効としている。
Japanese Unexamined Patent Publication No. 6-291349 discloses a stepping roll type film forming apparatus and a method of manufacturing a thin film photoelectric conversion element using this apparatus. In a method of manufacturing a thin film photoelectric conversion element in which a plurality of thin films having different properties are laminated on a strip-shaped flexible substrate to form a photoelectric conversion element, a plurality of film formation chambers arranged in one common vacuum chamber are provided. The flexible substrate is passed through, and the film is formed on the surface of the substrate in a stopped state in a predetermined vacuum atmosphere in a film forming chamber where the entrance and exit of the substrate are sealed to the substrate by a wall through a sealing material. It is disclosed that the operation of transporting the substrate separated from the wall of the film chamber to the next film forming position is repeated. And it is effective that the substrate surface is within the vertical plane.

【0007】また、成膜室内で基板に接触する電極と基
板の成膜面に対向する電極との間に電圧を印加して成膜
し、基板搬送時に基板に接触していた電極を基板より離
すことが有効としている。用いられる基板が、一面に導
電膜を被着した樹脂フィルムであるか、金属フィルムで
あるか、あるいは一面に絶縁膜を介して導電膜を被着し
た金属フィルムであることが有効であるとしてる。
Further, a voltage is applied between the electrode contacting the substrate and the electrode facing the film forming surface of the substrate in the film forming chamber to form a film, and the electrode contacting the substrate at the time of transferring the substrate is removed from the substrate. It is effective to separate. It is said that it is effective that the substrate used is a resin film having a conductive film deposited on one surface, a metal film, or a metal film having a conductive film deposited via an insulating film on one surface. .

【0008】さらに、帯状可撓性基板の上に複数の異な
る性質の薄膜を積層して光電変換層を形成する薄膜光電
変換素子の製造装置において、共通真空室の長手方向の
両端近くにそれぞれ配置されたロールを備え、その共通
真空室内を一方のロールから巻きほぐされた方のロール
へ巻き取ることのできる可撓性基板が通る複数の成膜室
を有し、各成膜室は基板の出入口で基板にシール材を介
して密着する壁によって区切られ、その成膜室壁のシー
ル材は基板から離れる位置まで退避可能であり、共通真
空室および各成膜室がそれぞれ別個の排気系に接続され
たものとする。そして、各成膜室に基板に接触し、基板
から離れた位置まで退避可能の電極と、その電極の対向
電極とを備えることが有効としている。また、両ロール
の軸および両電極の電極面が鉛直であることが有効であ
るとしている。
Further, in a thin-film photoelectric conversion element manufacturing apparatus in which a plurality of thin films having different properties are laminated on a strip-shaped flexible substrate to form a photoelectric conversion layer, the common vacuum chamber is arranged near both ends in the longitudinal direction. And a plurality of film formation chambers through which a flexible substrate that can be wound from one roll to the unrolled roll is provided in the common vacuum chamber. The entrance / exit is separated by a wall that adheres to the substrate via a sealing material, and the sealing material on the wall of the film forming chamber can be retracted to a position away from the substrate, and the common vacuum chamber and each film forming chamber are separated into separate exhaust systems. Connected. Then, it is effective to provide each film forming chamber with an electrode that is in contact with the substrate and can be retracted to a position apart from the substrate, and an opposing electrode of the electrode. It is also effective that the shafts of both rolls and the electrode surfaces of both electrodes are vertical.

【0009】特開平7−6953は、互いに平行に対向
する二つの平板電極の一方に高周波電極を印加し、他方
を設置して両電極間の成膜室空間内にプラズマを発生さ
せ、反応ガスを分解して基板上に薄膜を堆積させるプラ
ズマCVD法において、反応空間を平行平板電極と側壁
とによって囲み、高周波電極の共通室空間側を1 ×10-3
Torr以下の真空に接触させる、あるいは、高周波電極の
共通室空間側を大気に接触させるものである。このプラ
ズマCVD法により高周波電極背面での放電を防ぎ、放
電の均一性が得られて膜質を向上させることができる。
また、一つの真空室内に放電を封じ込めた成膜室を複数
置き、真空室内で送り出し、巻き取りの行われる可撓性
基板上に順次成膜すれば、ロールツーロール方式装置の
ようにバッファー真空室を設ける必要がなく、装置全体
のコンパクト化、軽量化を図ることができると共に、大
幅な製造コストの低減が可能となることを開示してい
る。
In Japanese Patent Laid-Open No. 7-6953, a high frequency electrode is applied to one of two flat plate electrodes facing each other in parallel, and the other is installed to generate a plasma in a film forming chamber space between the two electrodes to generate a reaction gas. In a plasma CVD method in which a thin film is decomposed to deposit a thin film on a substrate, the reaction space is surrounded by parallel plate electrodes and side walls, and the common chamber space side of the high frequency electrode is 1 × 10 −3.
The vacuum chamber is placed in a vacuum below Torr, or the space inside the common chamber of the high frequency electrode is brought into contact with the atmosphere. By this plasma CVD method, it is possible to prevent discharge on the back surface of the high frequency electrode, obtain uniform discharge, and improve the film quality.
In addition, if multiple film forming chambers that contain the discharge are placed in one vacuum chamber and sent out in the vacuum chamber to sequentially form films on the flexible substrate that is being wound, a buffer vacuum like a roll-to-roll system is created. It is disclosed that it is not necessary to provide a chamber, the size and weight of the entire apparatus can be reduced, and the manufacturing cost can be significantly reduced.

【0010】特開平7−221025号公報は、搬送さ
れてくる可撓性基板を成膜室のそれぞれ函状の壁体を有
する二つの部分の開口側の間に停止させ、基板を成膜室
の両部分の壁体の開口側端面間にはさみ、成膜室の一方
の部分および基板により囲まれた成膜空間をその空間に
連通する排気口から真空にし、その空間内の電極と成膜
室の他方の部分および基板により囲まれた空間内の電極
との間に電圧を印加して成膜する薄膜光電変換素子の製
造装置において、成膜室の各部分および基板により囲ま
れた両空間に連通する通気路を備えたもので、その通気
路が可撓性配管であること、成膜室の両部分の壁体の開
口側の可撓性基板の通らない箇所に設けられた部分に対
して開けられ成膜時に成膜室外と気密に隔離されて連通
する開口部よりなるものである。
Japanese Unexamined Patent Publication No. 7-221025 discloses that a flexible substrate being conveyed is stopped between the opening sides of two portions of the film forming chamber each having a box-shaped wall, and the substrate is formed in the film forming chamber. The film-forming space sandwiched between the opening-side end faces of the wall bodies of both parts and surrounded by one part of the film-forming chamber and the substrate is evacuated from the exhaust port communicating with the space, and the electrode in the space and the film-forming are formed. In a thin film photoelectric conversion element manufacturing apparatus for applying a voltage between an electrode in a space surrounded by the other part of the chamber and the substrate, a space surrounded by each part of the film formation chamber and the substrate A ventilation pipe that communicates with the pipe, the ventilation passage being a flexible pipe, and the flexible substrate on the opening side of the wall of both portions of the film formation chamber It is opened to the outside of the film formation chamber and airtightly isolated from the outside of the film formation chamber. It is intended.

【0011】この製造装置により、排気口を設けない側
の空間のガス溜まりを防ぐことができ、常に新鮮な原料
ガスが供給されるクリーンな成膜を実現できる。また、
同一成膜室で複数の種類の半導体層を形成しても残ガス
の影響の少ない成膜を実現できることを開示している。
特開平8−250431号公報は、可撓性基板を函状の
成膜室壁体の開口周囲の端面に密着させ、壁体と基板と
により囲まれた成膜空間を真空にし、この空間内に収容
された電極に電圧を印加して基板上に薄膜を形成する薄
膜光電変換素子の製造方法において、基板の成膜面外周
を成膜室壁体の開口周囲の端面状で放射状に摺動させ、
かつ、基板を電極と反対側に位置する押圧体により電極
側に向けて押圧することによって基板のしわを伸ばした
上で成膜するもので、特に押圧体として成膜空間内に収
容された電極の対向電極を用いることが有効であるとし
ている。
With this manufacturing apparatus, it is possible to prevent gas accumulation in the space on the side where the exhaust port is not provided, and to realize a clean film formation in which fresh source gas is always supplied. Also,
It is disclosed that even if a plurality of types of semiconductor layers are formed in the same film formation chamber, film formation with little influence of residual gas can be realized.
In Japanese Patent Laid-Open No. 8-250431, a flexible substrate is brought into close contact with an end surface around an opening of a wall of a box-shaped film forming chamber, and a film forming space surrounded by the wall and the substrate is evacuated. In a method of manufacturing a thin film photoelectric conversion element in which a voltage is applied to an electrode housed in a substrate to form a thin film on a substrate, the outer periphery of the film deposition surface of the substrate is radially slid on the end face around the opening of the film deposition chamber wall. Let
Further, the film is formed after the wrinkles of the substrate are extended by pressing the substrate toward the electrode side by the pressing body located on the side opposite to the electrode, and in particular, the electrode housed in the film forming space as the pressing body. It is said that it is effective to use the counter electrode.

【0012】また、成膜空間を囲み、電圧が印加される
電極が収容された成膜室の函状壁体の開口に対向する開
口を有し、成膜室壁体に方向に駆動可能の第2の函状壁
体の端面に、成膜室の壁体に密着する可撓性基板の面に
対して外方に向けて傾斜した弾性のある唇状体を備え、
第2の壁体内に収容された対向電極が、その表面で基板
を押圧しながら成膜室の壁体の開口面より内側まで駆動
可能であることにより、可撓性基板のしわを伸ばして成
膜すれば、成膜パターンのずれが起きず、膜厚の均一な
成膜が可能であることを開示している。
Further, it has an opening which surrounds the film-forming space and which opposes the opening of the box-shaped wall of the film-forming chamber in which the electrode to which a voltage is applied is accommodated, and can be driven in the direction of the wall of the film-forming chamber. The end face of the second box-shaped wall body is provided with an elastic lip-shaped body which is inclined outward with respect to the surface of the flexible substrate that is in close contact with the wall body of the film forming chamber,
Since the counter electrode housed in the second wall body can be driven to the inside of the opening surface of the wall of the film formation chamber while pressing the substrate with the surface thereof, the wrinkle of the flexible substrate is extended. It is disclosed that if a film is formed, the film formation pattern does not shift and a film having a uniform film thickness can be formed.

【0013】特開平8−293491号公報は、並行し
て搬送される2列の可撓性基板の間に第1電極、この第
1電極に対向して各基板の外側にそれぞれ第2電極を配
置し、第1電極と各基板の間に形成される成膜空間に第
1、第2電極間への電圧印加によって放電を発生させる
ことにより、各基板の一面上に薄膜を形成する薄膜光電
変換素子の製造装置において、それぞれの基板に対して
各1個の第1電極を備え、第1電極が基板面に平行な背
面部が絶縁体によって連結されている。各第1電極の背
面部に開口を有し、両第1電極の背面部を連結する絶縁
体に前記開口に連通する貫通孔が開けられ、この貫通孔
の内面に真空排気口が開口している。第1電極の端面に
は基板と密着可能のシール材が被着している。
Japanese Unexamined Patent Publication No. 8-293491 discloses a first electrode between two rows of flexible substrates which are conveyed in parallel, and a second electrode which faces the first electrode and is outside each substrate. A thin film photoelectric device that is arranged and forms a thin film on one surface of each substrate by generating a discharge by applying a voltage between the first and second electrodes in a film formation space formed between the first electrode and each substrate. In the conversion element manufacturing apparatus, each substrate is provided with one first electrode, and the back surface of the first electrode parallel to the substrate surface is connected by an insulator. Each first electrode has an opening on the back surface thereof, and a through hole communicating with the opening is formed in an insulator connecting the back surfaces of both the first electrodes, and a vacuum exhaust port is opened on the inner surface of the through hole. There is. A sealing material that can be in close contact with the substrate is attached to the end surface of the first electrode.

【0014】また、搬送される可撓性基板の両側に電圧
印加電極および接地電極を配置し、電圧印加電極と基板
間に形成される成膜空間に電圧印加電極への電圧印加に
よって放電を発生させることにより基板の一面上に薄膜
を形成する薄膜光電変換素子の製造装置において、電圧
印加電極は平板状で基板に気密に接触可能の端面をもつ
導電性枠体に絶縁して気密に結合され、電圧印加電極の
背面および側面を囲む導電性シールド体が導電性枠体と
導電的に結合され、かつ接地されている。また、並行し
て搬送される2列の可撓性基板をそれぞれはさんで基板
の内側の電圧印加電極と外側の接地電極とが対向して配
置され、両電圧印加電極がシールド体を貫通する絶縁体
によって連結されている。各電圧印加電極に開口を有
し、両電圧印加電極を連結する絶縁体に前記開口に連通
する貫通孔が開けられ、この貫通孔の内面に真空排気口
が開口している。このような薄膜光電変換素子の製造装
置により、並行して搬送される2列の可撓性基板に対す
る成膜をそれぞれに対して備えた第1、第2電極間への
電圧印加により行うことにより、双方の成膜条件を別個
に制御することが可能になり、基板間の成膜の差異を減
少させることができ、そして、2つの第1電極を絶縁体
を介して連結して両基板の間に配置すると共に、基板の
端面が気密に接触して成膜空間を形成できるようにして
薄膜光電変換素子の製造装置の大型化を防ぐ方法を開示
している。
Further, a voltage applying electrode and a ground electrode are arranged on both sides of the conveyed flexible substrate, and a discharge is generated by applying a voltage to the voltage applying electrode in a film forming space formed between the voltage applying electrode and the substrate. In the apparatus for manufacturing a thin film photoelectric conversion element in which a thin film is formed on one surface of a substrate by performing the above, the voltage application electrode is flat and is hermetically coupled to a conductive frame body having an end face capable of hermetically contacting the substrate. A conductive shield that surrounds the back and side surfaces of the voltage application electrode is conductively coupled to the conductive frame and grounded. Further, the voltage application electrode inside the substrate and the ground electrode outside the substrate are arranged to face each other with two rows of flexible substrates being conveyed in parallel, and both voltage application electrodes penetrate the shield body. It is connected by an insulator. Each voltage applying electrode has an opening, a through hole communicating with the opening is opened in an insulator connecting the both voltage applying electrodes, and a vacuum exhaust port is opened on the inner surface of the through hole. By using such a device for manufacturing a thin film photoelectric conversion element, a film is formed on two rows of flexible substrates that are conveyed in parallel by applying a voltage between the first and second electrodes provided for each. , It becomes possible to control both film forming conditions independently, it is possible to reduce the difference in film forming between the substrates, and the two first electrodes are connected through an insulator to connect the two substrates. Disclosed is a method for preventing an increase in the size of a thin-film photoelectric conversion device manufacturing apparatus, which is disposed between the substrates and allows the end faces of the substrates to hermetically contact each other to form a film-forming space.

【0015】また、高電圧を印加する電極の背後および
側面を囲むシールド体と、その基板側に絶縁して結合さ
れ、基板との間に成膜空間を作る導電性枠体によってシ
ールドすることにより、1列の可撓性基板に順次成膜す
る複数の成膜室の基板搬送方向の配列、複数列の可撓性
基板への並行して成膜する複数の成膜室の基板搬送方向
に対して横方向の配列を、成膜室間隔を狭くして行うこ
とができ、従って、複数の薄膜の積層する必要がある薄
膜光電変換素子の製造装置の小型化が図れることを開示
している。
Further, by shielding the shield body surrounding the back and side surfaces of the electrode to which a high voltage is applied, and a conductive frame body which is insulated and coupled to the substrate side and forms a film formation space between the shield body and the substrate. Arrangement of a plurality of film formation chambers for sequentially forming films on one row of flexible substrates in the substrate conveyance direction, and direction of substrate conveyance of a plurality of film formation chambers for parallel film formation on a plurality of rows of flexible substrates On the other hand, it is disclosed that the arrangement in the lateral direction can be performed by narrowing the distance between the film forming chambers, and therefore, the manufacturing apparatus of the thin film photoelectric conversion element in which a plurality of thin films need to be stacked can be downsized. .

【0016】特開平9−63970号公報は、可撓性基
板の函状の成膜室壁体の開口周囲の端面と弾性をもつシ
ール部材を介して密着させ、壁体と基板とにより囲まれ
た成膜室内を真空にし、この空間内に収容された電極に
電圧を印加して基板上に薄膜を形成するための薄膜素子
の製造装置において、シール部材がフッ素樹脂よりなる
ものを開示している。フッ素樹脂は、高分子材料あるい
は金属よりなる可撓性基板の表面と粘着性がフッ素ゴム
等より少ないため、基板搬送を妨げる粘着が生じない。
In Japanese Unexamined Patent Publication No. 9-63970, an end face around the opening of a box-shaped film forming chamber wall of a flexible substrate is closely attached via a sealing member having elasticity, and is surrounded by the wall and the substrate. Disclosed is a thin film element manufacturing apparatus for forming a thin film on a substrate by applying a voltage to an electrode housed in this space and applying a voltage to the electrode. There is. Since the fluororesin has less adhesiveness to the surface of the flexible substrate made of a polymer material or a metal than fluororubber or the like, the adhesive which prevents the substrate transportation does not occur.

【0017】また、同じく可撓性基板を函状の成膜室壁
体の開口周囲の端面と弾性をもつシール部材を介して密
着させ、壁体と基板とに囲まれた成膜室内を真空にし、
この空間内に収容された電極に電圧を印加して基板上に
薄膜を形成するための薄膜素子の製造装置において、シ
ール部材の可撓性基板と接触面が、弾性のある母材より
も基板に対する粘着力が少ない材料よりなる表面膜によ
って覆われたものについても開示している。
Similarly, the flexible substrate is brought into close contact with the end face around the opening of the wall of the box-shaped film-forming chamber via a sealing member having elasticity, and the film-forming chamber surrounded by the wall and the substrate is vacuumed. West,
In a thin-film element manufacturing apparatus for applying a voltage to an electrode housed in this space to form a thin film on a substrate, the flexible substrate of the seal member is in contact with the substrate more than the elastic base material. It is also disclosed that it is covered with a surface film made of a material having a low adhesive force to.

【0018】さらに、可撓性基板を函状の成膜室壁体の
開口周囲の端面と弾性をもつシール部材を介して密着さ
せ、壁体と基板とにより囲まれた成膜室内を真空にし、
この空間内に収容された電極に電圧を印加して基板上に
薄膜を形成する薄膜素子の製造方法において、薄膜を形
成し、成膜室壁体端面を基板に密着させる圧力を解除し
た後、基板を一面側から他面側に向けて押圧し、これに
より、シール部材に粘着した基板を外すことを開示して
いる。
Furthermore, the flexible substrate is brought into close contact with the end face around the opening of the wall of the box-shaped film-forming chamber through a sealing member having elasticity, and the film-forming chamber surrounded by the wall and the substrate is evacuated. ,
In a method of manufacturing a thin film element in which a voltage is applied to an electrode housed in this space to form a thin film on a substrate, a thin film is formed, and after releasing the pressure for closely adhering the end face of the film forming chamber wall to the substrate, It is disclosed that the substrate is pressed from one surface side to the other surface side, and thereby the substrate adhered to the seal member is removed.

【0019】図7は従来のステッピングロール方式の薄
膜製造装置の成膜室の断面図であり、(a)開放時、
(b)は封止時である。断続的に搬送されてくる可撓性
基板1の上下に函状の下部成膜室壁体21と上部成膜室
壁体22が対向している。下部成膜室には電源4に接続
された高電圧電極31が、上部成膜室にはヒーター33
を内蔵した接地電極32が備えられている。
FIG. 7 is a sectional view of a film forming chamber of a conventional stepping roll type thin film manufacturing apparatus.
(B) is at the time of sealing. A box-shaped lower film forming chamber wall 21 and an upper film forming chamber wall 22 face each other above and below the flexible substrate 1 that is intermittently conveyed. A high voltage electrode 31 connected to the power source 4 is provided in the lower film forming chamber, and a heater 33 is provided in the upper film forming chamber.
A ground electrode 32 having a built-in electrode is provided.

【0020】成膜時(図7(b))には、上部成膜室壁
体22が下降し、接地電極32が基板1を抑えて下部成
膜室壁体21の開口部側端面に取り付けられたシール材
5に接触させる。これにより、下部成膜室壁体21と基
板1によって排気管61に連通する気密に密閉された成
膜空間6が形成され、高電圧電極31への高周波電圧の
印加によりプラズマを成膜空間6に発生させ、図示しな
い導入管から導入された原料ガスを分解して基板1上に
膜を形成する。図において成膜室の外側は共通真空室で
ある。
During film formation (FIG. 7B), the upper film forming chamber wall 22 descends, and the ground electrode 32 holds the substrate 1 and is attached to the end surface of the lower film forming chamber wall 21 on the opening side. The sealing material 5 is contacted. As a result, the lower film forming chamber wall 21 and the substrate 1 form an airtightly sealed film forming space 6 communicating with the exhaust pipe 61, and by applying a high frequency voltage to the high voltage electrode 31, plasma is formed in the film forming space 6 And the raw material gas introduced from an introduction pipe (not shown) is decomposed to form a film on the substrate 1. In the figure, the outside of the film forming chamber is a common vacuum chamber.

【0021】図8は従来の薄膜製造装置の成膜室の下部
および上部成膜室のシール部の断面図である。下部成膜
室壁体21の端面には、二つの帯状端板23、24が、
また上部成膜室壁体22の端面には二つの帯状端板2
5、26がそれぞれねじ止めされ、その間に形成される
あり溝にシール材5を脱落しないように保持している。
成膜時には、基板1を下部成膜室側の端板23、24の
表面およびその間のシール材5と、上部成膜室側の端板
25、26の表面およびその間のシール材5とで挟むこ
とによって上部および下部成膜室内の空間は真空に保た
れる。
FIG. 8 is a cross-sectional view of the seal portion of the lower and upper film forming chambers of the conventional thin film manufacturing apparatus. Two strip-shaped end plates 23, 24 are provided on the end surface of the lower film forming chamber wall 21.
Further, two strip-shaped end plates 2 are provided on the end surface of the upper film forming chamber wall 22.
Nos. 5 and 26 are respectively screwed, and the sealing material 5 is held in the dovetail groove formed therebetween so as not to fall off.
At the time of film formation, the substrate 1 is sandwiched between the surfaces of the end plates 23 and 24 on the lower film forming chamber side and the sealing material 5 therebetween and the surfaces of the end plates 25 and 26 on the upper film forming chamber side and the sealing material 5 therebetween. As a result, the spaces inside the upper and lower film forming chambers are maintained in vacuum.

【0022】また、他の例として、特開平8−2504
31に示されるような手法もある。図9は従来のプラズ
マCVDにより成膜を行う薄膜製造装置の成膜室の開放
時を示す可撓性基板の搬送方向に垂直な断面図である。
可撓性基板1は紙面に垂直方向に搬送される。高電圧電
極31を収容する下部成膜室は壁体21と開口部を有す
るトッププレート27とで構成され、真空排気管61に
接続されている。図示しないヒーターを内蔵する接地電
極32を収容する上部成膜室は、壁体22とハウジング
28とで構成され、ハウジング28に接地電極32の支
持チューブ34が上下に移動可能に嵌合している。ハウ
ジング28の端部に移動プレート29が取り付けられて
いる。移動プレート29は上下駆動ガイド30にガイド
されてアクチュエータ41により矢印51に示すように
上下方向に駆動される。上下駆動ガイド30およびアク
チュエータ41はマウント42に固定され、成膜室チャ
ンバ35上の上部フランジ36上に載置されている。支
持チューブ34は円筒状で、内部空洞は上端は真空排気
管63と連通し、下端で貫通孔37により上部成膜室の
内部空間に連通している。真空排気管61と真空排気管
63は可撓性配管64により接続されている。一方、接
地電極の支持チューブ34は、移動プレート29を介し
てハウジング28内を移動でき、それによって接地電極
32は矢印52に示すように上下方向に駆動される。ま
た、上部成膜室の壁体22の下端と下部成膜室のトップ
プレート27の間には、しわ伸ばし構造が形成されてい
る。
As another example, JP-A-8-2504
There is also a method shown in 31. FIG. 9 is a cross-sectional view perpendicular to the transport direction of the flexible substrate, showing the opening of the film forming chamber of the conventional thin film manufacturing apparatus for forming a film by plasma CVD.
The flexible substrate 1 is conveyed in the direction perpendicular to the paper surface. The lower film forming chamber that houses the high-voltage electrode 31 is composed of the wall body 21 and the top plate 27 having an opening, and is connected to the vacuum exhaust pipe 61. The upper film forming chamber containing the ground electrode 32 containing a heater (not shown) is composed of the wall body 22 and the housing 28, and the support tube 34 of the ground electrode 32 is fitted in the housing 28 so as to be vertically movable. . A moving plate 29 is attached to the end of the housing 28. The moving plate 29 is guided by the vertical drive guide 30 and is vertically driven by the actuator 41 as indicated by an arrow 51. The vertical drive guide 30 and the actuator 41 are fixed to the mount 42 and are mounted on the upper flange 36 on the film forming chamber chamber 35. The support tube 34 has a cylindrical shape, and the inner cavity communicates with the vacuum exhaust pipe 63 at the upper end and communicates with the inner space of the upper film forming chamber through the through hole 37 at the lower end. The vacuum exhaust pipe 61 and the vacuum exhaust pipe 63 are connected by a flexible pipe 64. On the other hand, the support tube 34 of the ground electrode can be moved in the housing 28 via the moving plate 29, whereby the ground electrode 32 is driven in the vertical direction as shown by the arrow 52. A wrinkle-extending structure is formed between the lower end of the wall 22 of the upper film forming chamber and the top plate 27 of the lower film forming chamber.

【0023】図10は従来の薄膜製造装置(図9)の成
膜室のシール部の拡大断面図であり、(a)が成膜室開
放時、(b)が成膜室封止時である。トッププレート2
7の開口部45に近接した部分の上には、図9と同様に
シール材5が端板23、24の間に保持されている。一
方、上部成膜室壁体22の端面には、ゴムよりなるリッ
プ(唇状体)7の基部が角環状のL型パッキン71の凹
部に挿し込まれ、リップ押さえ72との間にはさみこむ
ことにより保持されている。L型パッキン71およびリ
ップ押さえ72は壁体22の端面にネジ止めで固定され
ており、従ってリップ7の着脱が容易である。リップ7
は、方形の壁体22の各辺ごとに4分割されている。
FIG. 10 is an enlarged cross-sectional view of the seal portion of the film forming chamber of the conventional thin film manufacturing apparatus (FIG. 9). (A) shows the film forming chamber opened and (b) shows the film forming chamber closed. is there. Top plate 2
As in FIG. 9, the sealing material 5 is held between the end plates 23 and 24 on the portion of the No. 7 close to the opening 45. On the other hand, on the end face of the upper film forming chamber wall 22, the base of the lip (lips) 7 made of rubber should be inserted into the recess of the square L-shaped packing 71, and should be sandwiched between it and the lip retainer 72. Is held by. The L-shaped packing 71 and the lip retainer 72 are fixed to the end surface of the wall body 22 with screws, so that the lip 7 can be easily attached and detached. Lip 7
Is divided into four for each side of the rectangular wall body 22.

【0024】成膜室開放時にはリップ7は可撓性基板1
の面に外方に向かって45〜60度傾斜しており、L型
パッキン71の下端より約5mm下方へ突出している。リ
ップ押さえ72の縁部は例えば30度の面取りが施され
ている。上部成膜室壁体22が矢印51の方向に下降し
始めると、リップ7の先端が鎖線で示した基板に接触
し、さらに基板1を押し込みトッププレート27上の端
板23、24の表面上に到達する。そのまま上部成膜室
壁体22が矢印53の方向に下降すると、リップ7の先
端は端板23、24の表面に平行に矢印54方向に滑っ
て変形する。リップ押さえ72の縁部が面取りされてい
るので、変形したリップ7の端部はこの面取り部へ逃げ
ることができる。
When the film forming chamber is opened, the lip 7 has the flexible substrate 1
The surface of the L-shaped packing 71 is inclined 45 to 60 degrees outward, and projects downward about 5 mm from the lower end of the L-shaped packing 71. The edge of the lip retainer 72 is chamfered at 30 degrees, for example. When the upper film forming chamber wall 22 begins to descend in the direction of the arrow 51, the tip of the lip 7 contacts the substrate shown by the chain line, and further pushes the substrate 1 onto the surfaces of the end plates 23 and 24 on the top plate 27. To reach. When the upper film forming chamber wall 22 descends in the direction of arrow 53 as it is, the tip of the lip 7 is deformed by sliding in the direction of arrow 54 parallel to the surfaces of the end plates 23 and 24. Since the edge of the lip retainer 72 is chamfered, the deformed end of the lip 7 can escape to this chamfer.

【0025】その際に、リップ7の先端と断面23、2
4上の基板1との間に摩擦が発生し、基板1を矢印54
の方向に外側へ引っ張るので、基板1の外周は端板2
3、24の表面上を、中心から外側に向かう放射状方向
に摺動し、しわが伸びる。そして、下降の継続によりL
型パッキン71は、下方の基板1をシール材5および端
板23、24に対して押しつけることにより、基板1の
下方の成膜空間6および基板1の上方の壁体22によっ
て囲まれた空間を真空封じする。続いて、接地電極32
を矢印55の方向に下降させ、基板1を強制的に矢印5
6の方向に引っ張ることにより、しわをさらに伸ばす。
この際、接地電極32の基板の押し込み深さdは、2.
0〜2.5mmであることが有効である。
At this time, the tip of the lip 7 and the cross sections 23, 2
4 generates friction between the substrate 1 and the substrate 1, and
Since it is pulled outward in the direction of,
Wrinkles extend on the surfaces of Nos. 3 and 24 in a radial direction from the center to the outside. Then, as the descent continues, L
The mold packing 71 presses the lower substrate 1 against the sealing material 5 and the end plates 23 and 24, so that the space surrounded by the film forming space 6 below the substrate 1 and the wall 22 above the substrate 1 is formed. Vacuum seal. Then, the ground electrode 32
Down in the direction of arrow 55 to force the substrate 1 to move to arrow 5
The wrinkle is further extended by pulling in the direction of 6.
At this time, the pushing depth d of the ground electrode 32 into the substrate is 2.
It is effective that it is 0 to 2.5 mm.

【0026】上記の例では、上部成膜室も真空にするこ
とができるが、高電圧電極を収容する下部成膜室のみを
真空にする薄膜光電変換素子の製造装置においても実施
することができる。
In the above example, the upper film forming chamber can also be evacuated, but it can also be implemented in a thin film photoelectric conversion element manufacturing apparatus in which only the lower film forming chamber accommodating the high voltage electrode is evacuated. .

【0027】[0027]

【発明が解決しようとする課題】図9または10の例で
は、接地電極32は、基板加熱ヒーター33を内蔵して
いるため、ヒーター周辺部の壁体22、L型パッキン7
1、リップ7、リップ押さえ72、端板23、24、ト
ッププレート27、シール材5は加熱される。通常、シ
ール材はフッ素ゴムで作製されているため、L型パッキ
ン71、リップ7、リップ押さえ72、シール材5は加
熱されることにより、粘度が増す。このため、成膜終了
後、あるいは、成膜室封止後に上部成膜室を上昇し、可
撓性基板を搬送してコマ送りする際に、図9の例では、
シール材5、図10の例では、シール材5、あるいは、
L型パッキン71のどちらか一方に粘着し、可撓性基板
が搬送できない問題が生ずることがあった。
In the example of FIG. 9 or 10, since the ground electrode 32 has the substrate heater 33 built therein, the wall 22 around the heater and the L-type packing 7 are provided.
1, the lip 7, the lip retainer 72, the end plates 23 and 24, the top plate 27, and the sealing material 5 are heated. Since the sealing material is usually made of fluororubber, the L-type packing 71, the lip 7, the lip retainer 72, and the sealing material 5 are heated to increase the viscosity. Therefore, after the film formation is completed, or when the upper film formation chamber is raised after the film formation chamber is sealed and the flexible substrate is conveyed and frame-fed, in the example of FIG.
The sealing material 5, in the example of FIG. 10, the sealing material 5, or
There was a problem that the flexible substrate could not be transported due to adhesion to either one of the L-type packings 71.

【0028】この問題を解決するために、成膜室空間外
周の可撓性基板と接触して真空を気密するシール部材と
してフッ素系ゴムに替わり粘着性の少ない材料、例え
ば、テフロン(デュポン社の登録商標名)、ダイフロン
(ダイキン工業 (株) の登録商標名)を用いること、あ
るいは、フッ素系ゴムに粘着性を少なくする材料、例え
ば、Ag、Al、Ti、Cu、Cr等の金属膜、あるい
は、ZnO、ITO、SnO2等の金属酸化物、あるい
は、フッ素系化合物のテフロン(デュポン社の登録商標
名)、ダイフロン(ダイキン工業 (株) の登録商標
名)、あるいは、シリコン系化合物、窒化ホウ素などを
表面にコーティングすることが考えられた。また、シー
ル部材の粘着性自体を上げないために、この周囲を冷却
してシール部材を100℃以下、望ましくは50℃以下
に保ち、シール部材の粘着性を高めないことも考えられ
た。
In order to solve this problem, a fluorocarbon rubber is used as a seal member that comes into contact with a flexible substrate on the outer periphery of the film forming chamber to hermetically seal a vacuum, and a material having a low adhesive property, such as Teflon (DuPont). (Registered trademark name), Daiflon (registered trademark name of Daikin Industries, Ltd.), or a material that reduces the adhesiveness to fluororubber, for example, a metal film such as Ag, Al, Ti, Cu, Cr, Alternatively, metal oxides such as ZnO, ITO, and SnO 2 , or fluorine compounds such as Teflon (registered trademark of DuPont), Daiflon (registered trademark of Daikin Industries, Ltd.), silicon compounds, nitriding It has been considered to coat the surface with boron or the like. Further, in order not to increase the tackiness of the seal member itself, it has been considered that the circumference of the seal member is cooled to keep the seal member at 100 ° C. or lower, preferably 50 ° C. or lower, and the stickiness of the seal member is not enhanced.

【0029】しかしながら、シール部を冷却した場合に
は、シール部に近い部分のヒーター温度が下がり、薄膜
を形成する基板温度を成膜領域全体で均一化することが
難しい。また、シール部に各種材料をコーティングした
場合でも、シール材自身の耐熱温度以上に温度が上昇し
た場合には脱ガスにより形成した膜の膜質が低下してし
まう。
However, when the seal portion is cooled, the temperature of the heater near the seal portion is lowered, and it is difficult to make the temperature of the substrate on which the thin film is formed uniform throughout the film formation region. Even when the seal portion is coated with various materials, the film quality of the film formed by degassing deteriorates when the temperature rises above the heat resistant temperature of the seal material itself.

【0030】万が一、シール部材に可撓性基板が粘着し
た場合の、可撓性基板の張り付きを外す方法として、搬
送前に上部成膜室の駆動可能な押圧体を突出させて、シ
ール部材に粘着した可撓性基板をはぎ取る方法がある
が、この方法は、機械的な手段であるため可撓性基板に
傷が生じたり、形成された薄膜、あるいは、薄膜光電変
換素子が損傷する可能性があった。
In the unlikely event that the flexible substrate adheres to the seal member, a method for removing the sticking of the flexible substrate is to project the drivable pressing member in the upper film forming chamber before transporting the seal member to the seal member. There is a method of peeling off the adhered flexible substrate, but this method is a mechanical means, so there is a possibility that the flexible substrate may be scratched or the formed thin film or thin film photoelectric conversion element may be damaged. was there.

【0031】図11は従来の2枚の基板に同時に成膜す
る薄膜製造装置の成膜室の断面図であり、(a)は成膜
室開放時、(b)は成膜室封止時である。高電圧電極2
21とヒーター223を内蔵する接地電極222と同電
位とされる枠体254が絶縁物253で絶縁されている
成膜室構造のものでは、例えば絶縁物253に石英を用
い高電圧電極221と石英、接地電極となる枠体254
と石英の気密を取るためシール材252を用いていた。
あるいは、シール材は絶縁材としての役割を果たすこと
も可能であるため、必要な間隔を取れる厚みのあるシー
ル材を用いることもあった。また、2枚の基板に独立に
成膜できるように、2つの高電圧電極221は絶縁ブロ
ック209で隔離されている。そして、絶縁ブロック2
09は接地電位の排気部材208に連結されている。
FIG. 11 is a cross-sectional view of a film forming chamber of a conventional thin film manufacturing apparatus for simultaneously forming films on two substrates. (A) shows the film forming chamber open, and (b) shows the film forming chamber closed. Is. High voltage electrode 2
21 and the ground electrode 222 containing the heater 223, the frame body 254 having the same potential as that of the ground electrode 222 is insulated by the insulator 253. For example, quartz is used as the insulator 253 and the high voltage electrode 221 and the quartz are used. , A frame 254 serving as a ground electrode
The sealing material 252 is used to keep the quartz airtight.
Alternatively, since the sealing material can also play a role as an insulating material, a sealing material having a thickness that can provide a necessary space has been used. Further, the two high voltage electrodes 221 are isolated by the insulating block 209 so that the two substrates can be independently formed. And the insulating block 2
09 is connected to the exhaust member 208 having a ground potential.

【0032】本構造の薄膜製造装置においては、成膜室
の両面がヒーターを内蔵する接地電極222で囲まれて
おり、側壁は真空で囲まれ、共通室に固定されている下
部、あるいは上部を伝わって熱が逃げるだけであるため
成膜室の内部まで十分に加熱される。例えば、ヒーター
温度が250 ℃の場合、成膜室内部の温度は約150 ℃〜20
0 ℃程度まで上昇した。そのため、成膜室内部の温度が
上がった時や下がった時に、絶縁物に石英を用いた場合
では接地電極となる枠体254、あるいは高電圧電極2
21、その他、成膜室を構成している部材(SUS、ア
ルミ)の熱膨張、熱収縮により石英に力が加わり、石英
が破損する場合があった。この場合、成膜室から共通室
へガスが漏れ、成膜室で安定に放電可能である圧力を維
持できなかったり、あるいは、共通室の圧力が上昇し、
成膜室外の高電圧電極と接地電極の間で放電を起こし、
成膜室内で安定に放電させることができなかった。
In the thin film manufacturing apparatus of this structure, both sides of the film forming chamber are surrounded by the ground electrode 222 having a built-in heater, the side walls are surrounded by a vacuum, and the lower part or the upper part fixed in the common chamber is closed. Since the heat is only released and escapes, the inside of the film forming chamber is sufficiently heated. For example, if the heater temperature is 250 ° C, the temperature inside the deposition chamber will be about 150 ° C to 20 ° C.
It rose to about 0 ℃. Therefore, when the temperature inside the film forming chamber rises or falls, when quartz is used as the insulator, the frame body 254 serving as a ground electrode or the high voltage electrode 2 is used.
21. In addition, due to the thermal expansion and thermal contraction of the members (SUS, aluminum) that constitute the film forming chamber, a force may be applied to the quartz and the quartz may be damaged. In this case, gas leaks from the film forming chamber to the common chamber, and the pressure at which stable discharge is possible cannot be maintained in the film forming chamber, or the pressure in the common chamber increases.
Discharge occurs between the high voltage electrode and the ground electrode outside the deposition chamber,
It was not possible to stably discharge in the film forming chamber.

【0033】また、絶縁物253は、高電圧電極221
と接地電極222と同電位とされる枠体254の間に挟
み込まれた積層構造となっているため、破損した絶縁物
253を交換するためには、高電圧電極221、あるい
は、接地電極となる枠体254を分解しなければなら
ず、多大な労力と時間が必要であった。また、他の問題
として、可撓性基板を搬送するために、基板の搬送方向
に張力をかけている。搬送距離が長くなるので、可撓性
基板を支持するロールの数を増やさなければならず、ロ
ール軸での機械ロスが増え、その結果、可撓性基板にか
かる張力は弱くなり、基板に皺が生じたりしていた。
Further, the insulator 253 is the high voltage electrode 221.
Since the laminated structure is sandwiched between the frame body 254 having the same potential as that of the ground electrode 222 and the ground electrode 222, the high voltage electrode 221 or the ground electrode is used to replace the damaged insulator 253. The frame 254 had to be disassembled, which required a great deal of labor and time. Further, as another problem, in order to convey the flexible substrate, tension is applied in the substrate conveying direction. Since the transport distance becomes long, the number of rolls supporting the flexible substrate must be increased, and the mechanical loss on the roll axis increases, resulting in a weak tension on the flexible substrate and wrinkling of the substrate. Was occurring.

【0034】また シール材からの脱ガスも多く、膜質
が低下した。また、絶縁物に厚みのあるシール材を用い
た場合にはさらに脱ガスが多く膜質はさらに低下した。
本発明の目的は、成膜室が高温時にも基板と粘着し難
く、脱ガスの少ない、成膜室壁の歪みの影響を受けにく
い、また交換が容易なシール部を備えた成膜室を有する
薄膜製造装置を提供することにある。
Further, a large amount of gas was released from the sealing material, and the film quality was deteriorated. Further, when a thick sealing material was used as the insulating material, more degassing occurred and the film quality further deteriorated.
An object of the present invention is to provide a film forming chamber having a seal portion which is less likely to adhere to a substrate even when the film forming chamber is at high temperature, is less likely to be outgassed, is less susceptible to distortion of the film forming chamber wall, and is easy to replace. An object is to provide a thin film manufacturing apparatus having the above.

【0035】[0035]

【課題を解決するための手段】上記の目的を達成するた
めに、一つの共通真空槽の中に、可撓性基板を搬送する
搬送系と、この可撓性基板上に薄膜を成膜する手段を備
えた1ないし複数の成膜室を有し、各成膜室は可撓性基
板を境界とする開口部を有する2つの成膜部室からな
り、各開口部にはシール部が設けられており、各シール
部が基板を挟んで合致して成膜室と共通真空槽との間が
気密となる薄膜製造装置において、前記シール部は金属
またはセラミックの無機材料からなるとともに、前記成
膜部室のうち可動な成膜部室と基板を加熱するヒーター
とが一体構造であることとする。
In order to achieve the above object, a transport system for transporting a flexible substrate and a thin film is formed on the flexible substrate in one common vacuum chamber. And a plurality of film forming chambers each having a means, each film forming chamber including two film forming unit chambers having an opening having a flexible substrate as a boundary, and each opening being provided with a seal portion. In the thin film manufacturing apparatus in which the sealing parts are aligned with each other with the substrate sandwiched and the film forming chamber and the common vacuum chamber are airtight, the sealing part is made of a metal or ceramic inorganic material, and Of the chambers, the movable film forming chamber and the heater for heating the substrate have an integrated structure.

【0036】前記成膜部室のうち可動な成膜部室と基板
を加熱するヒーターとが一体構造であると良い。前記シ
ール部の基板と接触し合う部分の幅は10mm以上である
と良い。前記加熱ヒーターは前記可撓性基板上への成膜
領域よりも大きいと良い。
Of the film forming chambers, the movable film forming chamber and the heater for heating the substrate may have an integrated structure. The width of the portion of the seal portion that contacts the substrate is preferably 10 mm or more. The heater may be larger than the film formation area on the flexible substrate.

【0037】前記シール部の圧力は 1×104Pa 以上 5×
105 Pa以下であると良い。
The pressure of the seal portion is 1 × 10 4 Pa or more 5 ×
It should be 10 5 Pa or less.

【0038】また、一つの共通真空槽の中に、可撓性基
板を搬送する搬送系と、この可撓性基板上に薄膜を成膜
する手段を備えた1ないし複数の成膜室を有し、各成膜
室は可撓性基板を境界とする開口部を有する2つの成膜
部室からなり、各開口部にはシール部が設けられてお
り、各シール部が基板を挟んで合致して成膜室と共通真
空槽との間が気密となる薄膜製造装置であって、一方の
成膜部室が高電圧電極とその周縁のシール部からなる薄
膜製造装置において、前記成膜室の前記高電圧電極と実
効的に接地電位となる部分との間の絶縁物として可撓性
絶縁性シートを用いることとする。
Further, in one common vacuum chamber, there are provided a transfer system for transferring the flexible substrate and one or a plurality of film forming chambers provided with means for forming a thin film on the flexible substrate. However, each film forming chamber is composed of two film forming unit chambers having an opening with a flexible substrate as a boundary, each opening is provided with a seal, and each seal is aligned with the substrate sandwiched therebetween. A thin film manufacturing apparatus in which a film forming chamber and a common vacuum chamber are airtight, and one film forming unit chamber includes a high-voltage electrode and a seal portion around its periphery, A flexible insulating sheet is used as an insulator between the high-voltage electrode and the portion that effectively becomes the ground potential.

【0039】前記実効的に接地電位となる部分は成膜室
の排気部材であると良い。前記実効的に接地電位となる
部分は成膜室の接地電極の周縁部の枠体であると良い。
前記絶縁シートは帯状の固定治具によって固定されてい
ると良い。前記絶縁シートはポリイミド樹脂またはアラ
ミド樹脂からなると良い。
The portion that effectively becomes the ground potential is preferably an exhaust member of the film forming chamber. The portion that is effectively at the ground potential is preferably the frame body at the peripheral portion of the ground electrode in the film forming chamber.
The insulating sheet is preferably fixed by a band-shaped fixing jig. The insulating sheet is preferably made of polyimide resin or aramid resin.

【0040】前記絶縁シート厚さは10μm 〜 500μm で
あると良い。また、前記成膜室間に基板の張力調整装置
が備えられていることとする。本発明によれば、可撓性
基板と成膜室空間外周の基板と接触して真空を気密する
シール部材料を金属、あるいはセラミックの無機物とし
たので、基板に対する粘着性が少なく、シール部と基板
との貼り付きを防ぐことができる。また、シール部に金
属、セラミックの無機物を用いることで、例えばフッ素
系ゴムを用いたり、これにコーティングしたものに比べ
脱ガスが減少する。
The thickness of the insulating sheet is preferably 10 μm to 500 μm. A substrate tension adjusting device is provided between the film forming chambers. According to the present invention, the material of the seal portion, which is in contact with the flexible substrate and the substrate on the outer periphery of the film forming chamber space and hermetically seals the vacuum, is a metal or a ceramic inorganic material, so that the adhesiveness to the substrate is small and the seal portion It is possible to prevent sticking to the substrate. Further, by using an inorganic substance such as metal or ceramic for the seal portion, degassing is reduced as compared with, for example, using a fluorine-based rubber or coating it.

【0041】可撓性基板と接触するシール部の幅を10mm
以上とすれば、気密が良くなり共通室圧力を 3×10-2Pa
以下に保つことができ、成膜室で安定した放電が得られ
る。シール部の基板への圧力を1 ×104Pa 以上5 ×105P
a 以下にすると、弾性の少ない金属、セラミックの無機
物をシール材として用いても可撓性基板が断裂すること
なく、かつ、共通室圧力を 3×10-2Pa以下に保つことが
でき、成膜室で安定した放電が得られる。
The width of the seal portion that contacts the flexible substrate is 10 mm
With the above, the airtightness is improved and the common chamber pressure is 3 × 10 -2 Pa.
It can be kept below, and stable discharge can be obtained in the film forming chamber. The pressure of the seal part on the substrate should be 1 × 10 4 Pa or more 5 × 10 5 P
If it is set to a or less, the flexible substrate will not be broken even if a metal or ceramic inorganic material with low elasticity is used as the sealing material, and the common chamber pressure can be maintained at 3 × 10 -2 Pa or less. A stable discharge can be obtained in the film chamber.

【0042】可撓性基板を挟んで成膜室空間を形成する
際に、稼動する一方の側の成膜室の面がシール面に対し
て可動できることで、的確にシール面と接触でき、共通
室へのガスの漏れを減らすことができる。可撓性基板と
成膜室空間外周の基板と接触して真空を気密するシール
部を金属、あるいはセラミックの無機物としたので、シ
ール部の冷却をなくすことで、シール部に近い部分のヒ
ーター温度の低下を防がれ、薄膜を形成する基板温度を
成膜領域全体で均一化でき、膜質の均一性が向上する。
When the film forming chamber space is formed with the flexible substrate sandwiched, the surface of the film forming chamber on one side which is operated can be moved relative to the seal surface, so that the seal surface can be brought into contact with the seal surface accurately and can be commonly used. Gas leakage to the chamber can be reduced. Since the seal part that makes the vacuum tight by contacting the flexible substrate and the substrate on the outer periphery of the film forming chamber space is made of a metal or ceramic inorganic substance, eliminating the cooling of the seal part, the heater temperature of the part near the seal part The temperature of the substrate for forming the thin film can be made uniform over the entire film formation region, and the uniformity of the film quality can be improved.

【0043】高電圧電極と接地電極が絶縁物で絶縁され
ている成膜室構造のもので、絶縁物に可撓性絶縁性シー
トを用いることで、高電圧電極と接地電極の絶縁が取れ
る。可撓性絶縁性シート基板をポリイミド系、あるい
は、アラミド系の高分子フィルムとすることで脱ガスが
少なく高品質な膜、すなわち、高品質な光電変換素子が
形成できる。
The high-voltage electrode and the ground electrode have a film-forming chamber structure insulated from each other by an insulator. By using a flexible insulating sheet for the insulator, the high-voltage electrode and the ground electrode can be insulated. By using a polyimide-based or aramid-based polymer film as the flexible insulating sheet substrate, a high-quality film with less degassing, that is, a high-quality photoelectric conversion element can be formed.

【0044】絶縁物を高電圧電極と接地電極の間に挟む
のではなくこれらの側面から固定することで、交換が容
易となる。可撓性絶縁性シートのシール面以外が粗面化
されていることにより、膜剥がれをおこしにくくなる。
Replacing the insulator is facilitated by fixing the insulator from the side surfaces of the high voltage electrode and the ground electrode instead of sandwiching them. Since the surface of the flexible insulating sheet other than the sealing surface is roughened, film peeling is less likely to occur.

【0045】[0045]

【発明の実施の形態】実施例1 図1は本発明に係る薄膜製造装置の成膜室のシール部分
の拡大断面図であり、(a)は開放時、(b)は封止時
である。成膜室全体は図1と同じであり、従来のシール
部分図10に対応している。上部成膜室壁体22と下部
成膜室壁体27のそれぞれに備えられたシール部を兼ね
る帯状端板171、123、およびリップ押さえ172
にはAl材を用いている。本実施例では、シール部を兼
ねる帯状端板171、123、およびリップ押さえ17
2には、Alを用いたが、その他、脱ガスの少ない金
属、セラミックの無機物であれば何でも良い。リップ7
はフッ素系ゴムでる。可撓性基板には厚さ50μm のポリ
イミド基板の両面に金属、あるいは金属酸化物を含む多
層膜の電極層が形成されたものを用いた。上部成膜室壁
体22と下部成膜室壁体27に備えられたシール部を兼
ねる帯状リング端板171、123の可撓性基板と接触
する部分の幅Wを10mm以上にした場合、気密(シール
性)を確保できた。
Embodiment 1 FIG. 1 is an enlarged cross-sectional view of a sealing portion of a film forming chamber of a thin film manufacturing apparatus according to the present invention, in which (a) is an open state and (b) is a closed state. . The entire film forming chamber is the same as that shown in FIG. 1 and corresponds to the conventional seal portion FIG. Band-shaped end plates 171 and 123, which also serve as seal portions provided in the upper film forming chamber wall 22 and the lower film forming chamber wall 27, respectively, and a lip retainer 172.
Is made of Al material. In this embodiment, the band-shaped end plates 171 and 123 also serving as the seal portion, and the lip retainer 17
Although Al is used for 2, any other inorganic material such as a metal or a ceramic with less outgassing may be used. Lip 7
Is a fluorinated rubber. As the flexible substrate, a polyimide substrate having a thickness of 50 μm, on which electrode layers of a multilayer film containing metal or metal oxide were formed, was used. When the width W of the portion of the strip-shaped ring end plates 171 and 123, which also functions as the seal portions provided in the upper film forming chamber wall 22 and the lower film forming chamber wall 27, that contacts the flexible substrate is set to 10 mm or more, it is airtight. (Sealability) was secured.

【0046】さらに、可撓性基板を挟んで成膜室空間を
形成する際に、可動な一方の側の成膜室壁が撓んで的確
にシール面と接触できるようにし、成膜室と共通室のシ
ールを確実にした。これらにより成膜室空間に成膜ガス
を封入した際の共通室へのガスの漏れを減少させること
ができた。成膜室の圧力をそれぞれ3 ×10-1〜 5×102P
a の範囲に維持したとき、共通室の圧力を 3×10-2Pa以
下に保つことができ、成膜室で安定して放電させること
ができた。
Further, when the film forming chamber space is formed with the flexible substrate sandwiched, the movable film forming chamber wall on one side is bent so that it can be brought into proper contact with the sealing surface, and is shared with the film forming chamber. Secured the chamber seal. As a result, it was possible to reduce gas leakage to the common chamber when the film forming chamber space was filled with the film forming gas. The pressure in the film forming chamber is 3 × 10 -1 to 5 × 10 2 P, respectively.
When kept in the range of a, the pressure in the common chamber could be kept below 3 × 10 -2 Pa, and stable discharge could be performed in the film forming chamber.

【0047】可撓性基板の厚さを変えたところ、厚さが
25μm 以下では成膜室から共通室へのガスの漏れが多く
共通室圧力を 3×10-2Pa以下に保つことができなかっ
た。また、可撓性金属箔基板を用いた場合には共通室圧
力を 3×10-2Pa以下に保つことができなかった。可撓性
基板を挟む圧力が 5×105Pa 以上の場合には可撓性基板
に傷が付き、断裂することがあった。また、1 ×104Pa
以下の場合には、共通室圧力を 3×10-2Pa以下に保つこ
とができず、成膜室で安定して放電させることができな
かった。
When the thickness of the flexible substrate was changed, the thickness
Below 25 μm, gas leaked from the film formation chamber to the common chamber so much that the pressure in the common chamber could not be kept below 3 × 10 -2 Pa. Moreover, when the flexible metal foil substrate was used, the common chamber pressure could not be kept below 3 × 10 -2 Pa. When the pressure sandwiching the flexible substrate was 5 × 10 5 Pa or more, the flexible substrate was scratched and sometimes ruptured. Also, 1 × 10 4 Pa
In the following cases, the common chamber pressure could not be kept below 3 × 10 -2 Pa and stable discharge could not be performed in the film forming chamber.

【0048】図2は本発明に係る薄膜製造装置により成
膜した光電変換素子の光電変換効率の成膜時のヒーター
温度依存性を示すグラフである。カーブaは本発明に係
る金属製のシール部の成膜室で真性半導体層を成膜した
素子、カーブbは従来のフッ素系ゴムのシール部の成膜
室で真性半導体層を成膜した素子の特性である。フッ素
系ゴムがシール部の場合、ヒーター温度を上げるとシー
ル部の温度が上昇するため不純物の脱ガスが増えるが、
金属製のものを用いた場合にはほとんど脱ガスは増えな
い。このため、シール部が金属製のものではフッ素系ゴ
ムのものに比較して、ヒーター温度を上げて成膜しても
シール部からの脱ガスが少ないため真性半導体層の膜質
が良く、変換効率の低下が少なかった。 実施例2 実施例1(図1)の成膜室において、リップ7の材料と
して金属(ステンレス鋼)箔を用いた。金属箔の場合に
はフッ素系ゴムに比べ基板との接触面積当たりの圧力が
高いが基板との摩擦力が小さいので、リップ7の周縁部
断面を円弧状に曲げて接触する面積を増加させて摩擦力
を増加させ、リップ7によるしわ伸ばしの改善を図っ
た。 実施例3 図3は本発明に係る別の実施例の成膜室のシール部であ
り、(a)は開放時、(b)は封止時である。実施例2
(図1)における上部成膜室壁体22と従来のヒーター
33を有する高圧電極32とを一体構造としたものであ
る。本実施例では、シール材171、123およびリッ
プ押さえ172はAlであり、金属箔のリップ7が取り
付けられている。また、成膜室と共通室のシールを確実
にするために、可撓性基板を挟んで成膜室空間を形成す
る際に、稼動する一方の側の成膜室の面がシール面に対
して可動であるようにし、的確にシール面と接触できる
ようにした。
FIG. 2 is a graph showing the dependence of the photoelectric conversion efficiency of the photoelectric conversion element formed by the thin film manufacturing apparatus according to the present invention on the heater temperature during film formation. Curve a is an element in which the intrinsic semiconductor layer is formed in the film forming chamber of the metallic seal portion according to the present invention, and curve b is an element in which the intrinsic semiconductor layer is formed in the film forming chamber of the conventional fluorine rubber seal portion. Is a characteristic of. When the fluorine rubber is used as the seal, raising the heater temperature raises the temperature of the seal, which increases degassing of impurities.
Degassing hardly increases when a metal product is used. For this reason, when the seal part is made of metal, degassing from the seal part is less even if the heater temperature is increased to form a film, compared to the case of fluorine rubber, so the film quality of the intrinsic semiconductor layer is good and the conversion efficiency is high. There was little decrease. Example 2 In the film forming chamber of Example 1 (FIG. 1), a metal (stainless steel) foil was used as the material of the lip 7. In the case of metal foil, the pressure per contact area with the substrate is higher than that of fluororubber, but the frictional force with the substrate is small, so the peripheral area of the lip 7 should be bent in an arc shape to increase the contact area. The frictional force was increased to improve the wrinkle extension by the lip 7. Example 3 FIG. 3 shows a sealing part of a film forming chamber of another example according to the present invention, in which (a) is an opened state and (b) is a sealed state. Example 2
The upper film forming chamber wall 22 (FIG. 1) and the high-voltage electrode 32 having the conventional heater 33 are integrated. In this embodiment, the seal members 171, 123 and the lip retainer 172 are made of Al, and the lip 7 of the metal foil is attached. Further, in order to ensure the sealing between the film forming chamber and the common chamber, when forming the film forming chamber space with the flexible substrate sandwiched, the surface of the film forming chamber on one side to be operated is opposed to the sealing surface. It is movable so that it can make contact with the sealing surface accurately.

【0049】本構造の場合、シール部は全て金属であり
軟化や脱ガスは起こらないためシール部の冷却機構は必
要がなく、シール部に近い部分のヒーター温度の低下は
せず、薄膜を形成する基板温度を成膜領域全体で均一化
し、成膜室壁に付着した膜の剥離を抑えることができる
ので、剥離フレークによる膜質の低下は生じなくなり、
膜質の均一性も向上することができた。 実施例4 この実施例では、実施例3(図3)における上部成膜室
壁体22と帯状端板171とを同一材質とし、さらに一
体構造とした。そのため、シール部およびその近傍の温
度も基板温度の近くにまで昇温でき、基板の温度均一性
を向上でき、基板内の特性ばらつきが減少した。 実施例5: 図4は2枚の基板に同時に成膜する成膜装置の成膜室の
シール部の拡大断面図であり、(a)は本発明に係る構
造、(b)は従来構造である。本図は図11に示した構
造のシール部を簡明にするため模式化したものである。
従来は絶縁物253として石英、シール材252として
フッ素系ゴムを用いるか、あるいは、シール材と絶縁物
を兼ねた肉厚のフッ素系ゴムを用いていた。しかしなが
ら、温度上昇に伴い、光電変換素子では不純物となるガ
スが脱ガスし、膜質を低下させる原因となっていた。こ
の実施例では、高電圧電極221と接地電極222と同
電位となる枠体254を絶縁する絶縁シート201とし
て厚さ50μm の継ぎ目無し(エンドレス)のポリイミド
シートを用いた。同様に排気部材208と高電圧電極2
21も絶縁シート201により接続した。絶縁シート2
01の高電圧電極221および接地電極となる枠体25
4への固定は、従来のサンドイッチ構造とは異なり、側
面から固定治具260をねじで固定し絶縁シート201
を各々の電極と挟み込む方法とした。このようなシール
方法においても共通室の圧力は 3×10-2Pa以下に保つこ
とができ、安定した放電、均一成膜を行うことができ
た。
In the case of this structure, since the seal portion is made entirely of metal and softening and degassing do not occur, a cooling mechanism for the seal portion is not necessary, the heater temperature in the portion near the seal portion does not decrease, and a thin film is formed. Since the substrate temperature to be applied can be made uniform over the entire film formation region and peeling of the film adhered to the wall of the film forming chamber can be suppressed, deterioration of the film quality due to peeling flakes does not occur,
It was also possible to improve the uniformity of film quality. Example 4 In this example, the upper film forming chamber wall 22 and the band-shaped end plate 171 in Example 3 (FIG. 3) were made of the same material, and were further integrated. Therefore, the temperature of the seal portion and its vicinity can be raised to near the substrate temperature, the temperature uniformity of the substrate can be improved, and the variation in the characteristics within the substrate is reduced. Example 5: FIG. 4 is an enlarged cross-sectional view of a seal portion of a film forming chamber of a film forming apparatus for simultaneously forming films on two substrates. (A) is a structure according to the present invention and (b) is a conventional structure. is there. This drawing is a schematic view of the seal portion having the structure shown in FIG. 11 for the sake of simplicity.
Conventionally, quartz is used as the insulator 253 and fluorine rubber is used as the sealing material 252, or thick fluorine rubber that serves as both the sealing material and the insulator is used. However, as the temperature rises, in the photoelectric conversion element, the gas serving as an impurity is degassed, which causes the deterioration of the film quality. In this embodiment, a 50 μm-thick seamless (endless) polyimide sheet is used as the insulating sheet 201 for insulating the frame body 254 having the same potential as the high-voltage electrode 221 and the ground electrode 222. Similarly, the exhaust member 208 and the high-voltage electrode 2
21 is also connected by the insulating sheet 201. Insulation sheet 2
No. 01 high-voltage electrode 221 and a frame 25 serving as a ground electrode
Unlike the conventional sandwich structure, the fixing to the insulating sheet 201 is performed by fixing the fixing jig 260 from the side with screws.
Was sandwiched between each electrode. Even with such a sealing method, the pressure in the common chamber could be maintained at 3 × 10 -2 Pa or less, and stable discharge and uniform film formation could be performed.

【0050】ポリイミドシートに限らず耐熱性、高周波
絶縁特性に優れた材質であれば、例えばアラミド樹脂な
ども用いることができる。また、各々の電極、ならび
に、シール面形状に隙間無く適合する必要があるため、
これら絶縁シートは厚さは10〜500 μm が良いことが判
った。絶縁シートにも成膜されるので、シール部以外の
部分を例えばサンドブラスト等により粗面化することに
より、膜剥がれを抑えることができ、その結果ピンホー
ルなどの欠陥の少ない膜を成膜することができた。
Not limited to the polyimide sheet, an aramid resin or the like can be used as long as it is a material having excellent heat resistance and high-frequency insulation properties. Also, because it is necessary to fit each electrode and the seal surface shape without gaps,
It was found that these insulating sheets should have a thickness of 10 to 500 μm. Since a film is also formed on the insulating sheet, film peeling can be suppressed by roughening the parts other than the seal part by, for example, sandblasting, and as a result, a film with few defects such as pinholes can be formed. I was able to.

【0051】また、高圧電極221とその背面の排気ブ
ロック209との間のシールについても同様に可撓性絶
縁性シート201を用いることができる。このようなシ
ール方法を採用した装置で作成した膜は真空シール材か
らの脱ガスの影響を受けず高品質な膜質であった。 実施例6 実施例3と実施例5を組み合わせた構造の成膜室では、
成膜雰囲気にさらされる部分にフッ素系ゴムが存在せ
ず、成膜する基板と、共通室と成膜室とのシールをする
可撓性絶縁性シート以外は全て金属である。このような
構造の成膜室では、シール部を冷却する必要はない。そ
のため、成膜室には低温となる部分がなくピンホールの
発生原因となるフレーク状の膜が発生しにくい。
Further, the flexible insulating sheet 201 can be similarly used for the seal between the high voltage electrode 221 and the exhaust block 209 on the back surface thereof. The film produced by the apparatus adopting such a sealing method was of high quality without being affected by degassing from the vacuum sealing material. Example 6 In a film forming chamber having a structure combining Example 3 and Example 5,
Fluorine-based rubber does not exist in the portion exposed to the film forming atmosphere, and is made of metal except for the substrate for film formation and the flexible insulating sheet for sealing the common chamber and the film forming chamber. In the film forming chamber having such a structure, it is not necessary to cool the seal portion. Therefore, there is no low-temperature portion in the film forming chamber, and it is difficult to form a flake-like film that causes pinholes.

【0052】また、高電圧電極と接地電極の間がフレキ
シブルな可撓性絶縁性シートであるため、成膜室の熱膨
張または熱収縮に伴う熱歪みの影響はない。さらに、装
置構造が簡単でコストを低く抑えることができる。 実施例7 図5は本発明に係る張力調整装置を有するステッピング
ロール成膜方式の薄膜製造装置の側面断面図である。可
撓性基板を搬送するために、基板の搬送方向に張力をか
けている。搬送距離が長くなるので、可撓性基板を支持
するロールの数を増やさなければならず、ロール軸での
張力ロスが増え、その結果、可撓性基板にかかる張力は
弱くなり、基板の皺等が生じやすくなる。本実施例で
は、可撓性基板の成膜室間に張力調整装置Tを配置し
た。張力調整装置Tは駆動ロールR1および弛み調整ロ
ールR2が備えられており、駆動ロールR1は基板を引
っ張って搬送し、弛み調整ロールR2は皺の生じない程
度の引っ張り力を付加している。こうして、基板の張力
を約100 N/幅に維持し、皺の発生はなく、また、張力過
多による基板の変形による特性不良は発生しなくなっ
た。
Further, since the flexible insulating sheet is flexible between the high voltage electrode and the ground electrode, there is no influence of thermal strain due to thermal expansion or thermal contraction of the film forming chamber. Further, the device structure is simple and the cost can be kept low. Example 7 FIG. 5 is a side sectional view of a stepping roll film forming type thin film manufacturing apparatus having a tension adjusting device according to the present invention. In order to convey the flexible substrate, tension is applied in the substrate conveying direction. Since the transport distance becomes long, the number of rolls supporting the flexible substrate must be increased, and the tension loss at the roll axis increases, resulting in a weak tension on the flexible substrate and wrinkling of the substrate. Etc. are likely to occur. In this embodiment, the tension adjusting device T is arranged between the film forming chambers of the flexible substrate. The tension adjusting device T includes a driving roll R1 and a slack adjusting roll R2. The driving roll R1 pulls and conveys the substrate, and the slack adjusting roll R2 applies a pulling force to the extent that wrinkles do not occur. In this way, the tension of the substrate was maintained at about 100 N / width, wrinkles did not occur, and characteristic defects due to deformation of the substrate due to excessive tension did not occur.

【0053】この実施例の成膜室を有するにステッピン
グロール方式の薄膜製造装置でpin/pin 2層タンデムア
モルファスシリコン太陽電池を作製したところ、従来構
造の薄膜製造装置で作製したものに比べ、初期光電変換
効率が高く、光劣化率も低かった。また、特にi層を成
膜する成膜室については、実施例6の成膜室構造とする
ことが有効であった。
When a pin / pin two-layer tandem amorphous silicon solar cell having the film forming chamber of this example was manufactured by a stepping roll type thin film manufacturing apparatus, it was found that compared with the one manufactured by the conventional structure thin film manufacturing apparatus, The photoelectric conversion efficiency was high and the photodegradation rate was low. Further, it was particularly effective to use the film forming chamber structure of Example 6 as the film forming chamber for forming the i layer.

【0054】[0054]

【発明の効果】本発明によれば、一つの共通真空槽の中
に、可撓性基板を搬送する搬送系と、この可撓性基板上
に薄膜を成膜する手段を備えた1ないし複数の成膜室を
有し、各成膜室は可撓性基板を境界とする開口部を有す
る2つの成膜部室からなり、各開口部にはシール部が設
けられており、各シール部が基板を挟んで合致して成膜
室と共通真空槽との間が気密となる薄膜製造装置におい
て、前記シール部として金属またはセラミックの無機材
料を用いたため、脱ガスの多いフッ素系ゴムを用いた
り、これにコーティングしたものに比べ脱ガスはなく、
また、各成膜室と共通室との気密も向上し高品質な膜の
形成が可能となり、光電変換素子の光電変換効率は向上
した。また、シール部への可撓性基板の粘着を防止でき
る。これによって、可撓性基板の搬送トラブルが無くな
った。
According to the present invention, one or a plurality of transport systems for transporting a flexible substrate and a means for forming a thin film on the flexible substrate are provided in one common vacuum chamber. Film forming chambers, each film forming chamber is composed of two film forming unit chambers having an opening with a flexible substrate as a boundary, and each opening is provided with a seal unit. In a thin-film manufacturing apparatus in which the substrate is sandwiched and the film forming chamber and the common vacuum chamber are airtight, a metal or ceramic inorganic material is used as the seal portion, so fluorine-based rubber that is often degassed may be used. , There is no degassing compared to the one coated on it,
Further, the airtightness between each film forming chamber and the common chamber is improved, and it becomes possible to form a high quality film, and the photoelectric conversion efficiency of the photoelectric conversion element is improved. Further, it is possible to prevent the flexible substrate from sticking to the seal portion. As a result, the trouble of transporting the flexible substrate was eliminated.

【0055】高電圧電極と接地電極が絶縁物で絶縁され
ている成膜室構造のもので、絶縁物に可撓性絶縁性基板
を用いることで、装置製造コストが低下した。
The high-voltage electrode and the ground electrode have a film-forming chamber structure in which they are insulated by an insulating material. By using a flexible insulating substrate for the insulating material, the manufacturing cost of the device is reduced.

【0056】また、絶縁物を高電圧電極と接地電極の間
に挟むのではなくこれらの側面から固定することで、交
換が容易となった。
Further, replacement is facilitated by fixing the insulator from the side surfaces of the high-voltage electrode and the ground electrode instead of sandwiching them between them.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る薄膜製造装置の成膜室のシール部
分の拡大断面図であり、(a)は開放時、(b)は封止
FIG. 1 is an enlarged cross-sectional view of a seal portion of a film forming chamber of a thin film manufacturing apparatus according to the present invention, where (a) is open and (b) is sealed.

【図2】本発明に係る薄膜製造装置により成膜した光電
変換素子の光電変換効率の成膜時のヒーター温度依存性
を示すグラフ
FIG. 2 is a graph showing the heater temperature dependence of the photoelectric conversion efficiency of the photoelectric conversion element formed by the thin film manufacturing apparatus according to the present invention during film formation.

【図3】本発明に係る別の実施例の成膜室のシール部分
の拡大断面図であり、(a)は開放時、(b)は封止時
FIG. 3 is an enlarged cross-sectional view of a seal portion of a film forming chamber of another embodiment according to the present invention, (a) being opened and (b) being sealed.

【図4】2枚の基板に同時に成膜する成膜装置の成膜室
のシール部の拡大断面図であり、(a)は本発明に係る
構造、(b)は従来構造
4A and 4B are enlarged cross-sectional views of a seal portion of a film forming chamber of a film forming apparatus for forming a film on two substrates at the same time, where FIG. 4A is a structure according to the present invention and FIG.

【図5】本発明に係る張力調整装置を有するステッピン
グロール成膜方式の薄膜製造装置の側面断面図
FIG. 5 is a side sectional view of a stepping roll film forming type thin film manufacturing apparatus having a tension adjusting device according to the present invention.

【図6】共通真空室内に成膜室を複数有するステッピン
グロール成膜方式の薄膜製造装置の側面断面図
FIG. 6 is a side sectional view of a stepping roll film forming type thin film manufacturing apparatus having a plurality of film forming chambers in a common vacuum chamber.

【図7】従来のステッピングロール方式の薄膜製造装置
の成膜室の断面図であり、(a)開放時、(b)は封止
FIG. 7 is a cross-sectional view of a film forming chamber of a conventional stepping roll type thin film manufacturing apparatus, in which (a) is opened and (b) is sealed.

【図8】従来の薄膜製造装置の成膜室の下部および上部
成膜室のシール部の断面図
FIG. 8 is a cross-sectional view of a seal portion of a lower portion and an upper portion of a film forming chamber of a conventional thin film manufacturing apparatus.

【図9】従来のプラズマCVDにより成膜を行う薄膜製
造装置の成膜室の開放時を示す可撓性基板の搬送方向に
垂直な断面図
FIG. 9 is a cross-sectional view perpendicular to the transport direction of the flexible substrate, showing the opening of the film forming chamber of the conventional thin film manufacturing apparatus for forming a film by plasma CVD.

【図10】従来の薄膜製造装置(図9)の成膜室のシー
ル部の拡大断面図であり、(a)が成膜室開放時、
(b)が成膜室封止時
FIG. 10 is an enlarged cross-sectional view of a seal portion of a film forming chamber of a conventional thin film manufacturing apparatus (FIG. 9), in which (a) shows the film forming chamber opened.
(B) When the film forming chamber is sealed

【図11】従来の2枚の基板に同時に成膜する薄膜製造
装置の成膜室の断面図であり、(a)は成膜室開放時、
(b)は成膜室封止時
FIG. 11 is a cross-sectional view of a film forming chamber of a conventional thin film manufacturing apparatus that simultaneously forms a film on two substrates, FIG.
(B) is when the film formation chamber is sealed

【符号の説明】[Explanation of symbols]

1 可撓性基板 21 下部成膜室壁体 22 上部成膜室壁体 27 トッププレート 28 ハウジング 29 移動プレート 43 移動プレート 30 上下駆動ガイド 31 高電圧電極 32 接地電極 36 共通真空室壁体 41 アクチュエータ 44 アクチュエータ 6 成膜空間 61 真空排気管 64 可撓性配管 7 リップ 71 L型パッキン 72 リップ押さえ 80 成膜室 81 共通室 82 コア 83 コア 123 帯状端板 171 帯状端板 173 リップ押さえ 201 絶縁性可撓性基板 205 成膜室 206 プラズマ 208 排気部材 209 排気ブロック 210 共通室 221 高電圧電極 222 接地電極 223 ヒータ 252 シール材 253 絶縁物 254 枠体 255 シール材 258 ネジ 260 固定治具 272 真空排気口 T 張力調整装置 R1 駆動ロール R2 弛み調整ロール 1 Flexible substrate 21 Lower film forming chamber wall 22 Upper film forming chamber wall 27 Top Plate 28 housing 29 Moving plate 43 Moving plate 30 Vertical drive guide 31 High voltage electrode 32 ground electrode 36 Common vacuum chamber wall 41 actuator 44 actuator 6 Film forming space 61 Vacuum exhaust pipe 64 flexible piping 7 lip 71 L type packing 72 Lip holder 80 Film forming chamber 81 common room 82 core 83 core 123 Strip end plate 171 strip end plate 173 Lip holder 201 Insulating flexible substrate 205 film deposition chamber 206 plasma 208 Exhaust member 209 Exhaust block 210 common room 221 High voltage electrode 222 Ground electrode 223 heater 252 sealing material 253 insulator 254 frame 255 sealing material 258 screw 260 fixing jig 272 Vacuum exhaust port T tension adjusting device R1 drive roll R2 slack adjustment roll

フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H01L 21/205 Continuation of front page (58) Fields surveyed (Int.Cl. 7 , DB name) H01L 21/205

Claims (9)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】一つの共通真空槽の中に、可撓性基板を搬
送する搬送系と、この可撓性基板上に薄膜を成膜する手
段を備えた1ないし複数の成膜室を有し、各成膜室は可
撓性基板を境界とする開口部を有する2つの成膜部室か
らなり、各開口部にはシール部が設けられており、各シ
ール部が基板を挟んで合致して成膜室と共通真空槽との
間が気密となる薄膜製造装置において、前記シール部は
金属またはセラミックの無機材料からなるとともに、前
記成膜部室のうち可動な成膜部室と基板を加熱するヒー
ターとが一体構造であることを特徴とする薄膜製造装
置。
1. A common vacuum chamber comprises a transfer system for transferring a flexible substrate and one or a plurality of film forming chambers equipped with means for forming a thin film on the flexible substrate. However, each film forming chamber is composed of two film forming unit chambers having an opening with a flexible substrate as a boundary, each opening is provided with a seal, and each seal is aligned with the substrate sandwiched therebetween. Te in a thin film manufacturing apparatus is airtight between the deposition chamber and the common vacuum chamber, the sealing portion together with made of an inorganic material of metal or ceramic, before
Among the film forming chambers, a movable film forming chamber and a heater for heating the substrate.
The thin film manufacturing apparatus is characterized in that it has an integrated structure .
【請求項2】前記可動な成膜部室とシール部が同一材料
からなり一体であることを特徴とする請求項1に記載の
薄膜製造装置。
2. The thin film manufacturing apparatus according to claim 1, wherein the movable film forming unit chamber and the seal unit are made of the same material and are integrated.
【請求項3】一つの共通真空槽の中に、可撓性基板を搬
送する搬送系と、この可撓性基板上に薄膜を成膜する手
段を備えた1ないし複数の成膜室を有し、各成膜室は可
撓性基板を境界とする開口部を有する2つの成膜部室か
らなり、各開口部にはシール部が設けられており、各シ
ール部が基板を挟んで合致して成膜室と共通真空槽との
間が気密となる薄膜製造装置であって、一方の成膜部室
が高電圧電極とその周縁のシール部からなる薄膜製造装
置において、前記成膜室の前記高電圧電極と実効的に接
地電位となる部分との間の絶縁物として可撓性絶縁性シ
ートを用いることを特徴とする薄膜製造装置。
3. A common vacuum chamber is provided with a transfer system for transferring a flexible substrate and one or a plurality of film forming chambers provided with means for forming a thin film on the flexible substrate. However, each film forming chamber is composed of two film forming unit chambers having an opening with a flexible substrate as a boundary, each opening is provided with a seal, and each seal is aligned with the substrate sandwiched therebetween. In the thin film manufacturing apparatus in which the film forming chamber and the common vacuum chamber are hermetically sealed, and one film forming unit chamber includes a high voltage electrode and a seal part at the periphery thereof, A thin film manufacturing apparatus characterized in that a flexible insulating sheet is used as an insulator between the high voltage electrode of the film chamber and a portion that is effectively at ground potential.
【請求項4】前記実効的に接地電位となる部分は成膜室
の排気部材であることを特徴とする請求項3に記載の薄
膜製造装置。
4. The thin film manufacturing apparatus according to claim 3, wherein the portion that is effectively at the ground potential is an exhaust member of the film forming chamber.
【請求項5】前記実効的に接地電位となる部分は成膜室
の接地電極の周縁部の枠体であることを特徴とする請求
項3に記載の薄膜製造装置。
5. The thin film manufacturing apparatus according to claim 3, wherein the portion that is effectively at the ground potential is a frame body at the peripheral portion of the ground electrode in the film forming chamber.
【請求項6】前記可撓性絶縁シートは帯状の固定治具に
よって固定されていることを特徴とする請求項3ないし
5に記載の薄膜製造装置。
6. The thin film manufacturing apparatus according to claim 3, wherein the flexible insulating sheet is fixed by a belt-shaped fixing jig.
【請求項7】前記絶縁シートはポリイミド樹脂またはア
ラミド樹脂からなることを特徴とする請求項3ないし6
に記載の薄膜製造装置。
7. The insulating sheet is made of a polyimide resin or an aramid resin.
The thin film manufacturing apparatus according to.
【請求項8】前記絶縁シート厚さは10μm 〜 500μm で
あるとこを特徴とする請求項7に記載の薄膜製造装置。
8. The thin film manufacturing apparatus according to claim 7, wherein the insulating sheet has a thickness of 10 μm to 500 μm.
【請求項9】前記成膜室間に基板の張力調整装置が備え
られていることを特徴とする請求項1ないし8に記載の
薄膜製造装置。
9. The thin film manufacturing apparatus according to claim 1, further comprising a substrate tension adjusting device provided between the film forming chambers.
JP30400897A 1997-11-06 1997-11-06 Thin film manufacturing equipment Expired - Lifetime JP3475752B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30400897A JP3475752B2 (en) 1997-11-06 1997-11-06 Thin film manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30400897A JP3475752B2 (en) 1997-11-06 1997-11-06 Thin film manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH11145060A JPH11145060A (en) 1999-05-28
JP3475752B2 true JP3475752B2 (en) 2003-12-08

Family

ID=17927961

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30400897A Expired - Lifetime JP3475752B2 (en) 1997-11-06 1997-11-06 Thin film manufacturing equipment

Country Status (1)

Country Link
JP (1) JP3475752B2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070111367A1 (en) * 2005-10-19 2007-05-17 Basol Bulent M Method and apparatus for converting precursor layers into photovoltaic absorbers
JP5124982B2 (en) * 2006-05-16 2013-01-23 富士電機株式会社 Thin film manufacturing apparatus and thin film manufacturing method
US8323735B2 (en) 2006-10-13 2012-12-04 Solopower, Inc. Method and apparatus to form solar cell absorber layers with planar surface
US9103033B2 (en) 2006-10-13 2015-08-11 Solopower Systems, Inc. Reel-to-reel reaction of precursor film to form solar cell absorber
US8409418B2 (en) 2009-02-06 2013-04-02 Solopower, Inc. Enhanced plating chemistries and methods for preparation of group IBIIIAVIA thin film solar cell absorbers
JP2012043983A (en) 2010-08-19 2012-03-01 Fuji Electric Co Ltd Multilayer film forming method and film forming apparatus using the same
TWI796982B (en) * 2022-03-28 2023-03-21 力哲科技股份有限公司 Fixtures for Low Pressure Chemical Vapor Deposition

Also Published As

Publication number Publication date
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