Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP3145621B2 - Wiring board and manufacturing method thereof - Google Patents
[go: Go Back, main page]

JP3145621B2 - Wiring board and manufacturing method thereof - Google Patents

Wiring board and manufacturing method thereof

Info

Publication number
JP3145621B2
JP3145621B2 JP24582995A JP24582995A JP3145621B2 JP 3145621 B2 JP3145621 B2 JP 3145621B2 JP 24582995 A JP24582995 A JP 24582995A JP 24582995 A JP24582995 A JP 24582995A JP 3145621 B2 JP3145621 B2 JP 3145621B2
Authority
JP
Japan
Prior art keywords
precursor
powder
metal
thermosetting resin
melting point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP24582995A
Other languages
Japanese (ja)
Other versions
JPH0992946A (en
Inventor
清志 冨田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP24582995A priority Critical patent/JP3145621B2/en
Priority to US08/717,119 priority patent/US5837356A/en
Publication of JPH0992946A publication Critical patent/JPH0992946A/en
Application granted granted Critical
Publication of JP3145621B2 publication Critical patent/JP3145621B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/682Shapes or dispositions thereof comprising holes having chips therein
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体素子を収容す
るための半導体素子収納用パッケージや混成集積回路基
板等に用いられる配線基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device housing package for housing a semiconductor device and a wiring board used for a hybrid integrated circuit board.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子収納
用パッケージを収容する半導体素子収納用パッケージに
使用される配線基板として比較的高密度の配線が可能な
積層セラミック配線基板が多用されている。この配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに該半導体素子
の各電極を例えばボンディングワイヤ等の電気的接続手
段を介して配線導体に電気的に接続し、しかる後、前記
絶縁基体の上面に、金属やセラミックス等から成る蓋体
を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロウ
材等の封止材を介して接合させ、絶縁基体の凹部内に半
導体素子を気密に収容することによって製品としての半
導体装置となる。
2. Description of the Related Art Conventionally, a multilayer ceramic wiring board capable of relatively high-density wiring has been widely used as a wiring board used for a wiring board, for example, a semiconductor element housing package for housing a semiconductor element housing package. This wiring board is made of ceramics such as an aluminum oxide sintered body, and has an insulating base having a concave portion for accommodating a semiconductor element in a central portion of an upper surface thereof, and tungsten, molybdenum, etc. led out from the periphery of the concave portion to the lower surface of the insulating base. And a semiconductor element is bonded and fixed to the bottom surface of the concave portion of the insulating base via an adhesive such as glass, resin, or brazing material, and each electrode of the semiconductor element is For example, glass is electrically connected to a wiring conductor via an electrical connection means such as a bonding wire, and thereafter, a cover made of metal, ceramics, or the like is placed on the upper surface of the insulating base so as to cover the concave portion of the insulating base. , A resin, a brazing material, or the like, and a semiconductor device as a product by being hermetically housed in a concave portion of the insulating base. To become.

【0003】またこの従来の配線基板は、一般にセラミ
ックグリーンシート積層法によって製作され、具体的に
は、酸化アルミニウム、酸化珪素、酸化マグネシウム、
酸化カルシウム等のセラミック原料粉末に適当な有機バ
インダー、溶剤等を添加混合して泥漿状となすとともに
これを従来周知のドクターブレード法を採用しシート状
となすことによって複数のセラミックグリーンシートを
得、しかる後、前記セラミックグリーンシートに適当な
打ち抜き加工を施すとともに配線導体となる金属ペース
トを所定パターンに印刷塗布し、最後に前記セラミック
グリーンシートを所定の順に上下に積層してセラミック
生成形体となすとともに該セラミック生成形体を還元雰
囲気中、約1600℃の高温で焼成することによって製
作される。
The conventional wiring board is generally manufactured by a ceramic green sheet laminating method. Specifically, aluminum wiring, silicon oxide, magnesium oxide,
A plurality of ceramic green sheets are obtained by adding a suitable organic binder, a solvent, etc. to a ceramic raw material powder such as calcium oxide to form a slurry by mixing and forming this into a sheet using a conventionally known doctor blade method, Thereafter, the ceramic green sheet is subjected to a suitable punching process and a metal paste to be a wiring conductor is applied by printing in a predetermined pattern, and finally, the ceramic green sheets are stacked up and down in a predetermined order to form a ceramic forming body. It is manufactured by firing the ceramic forming body at a high temperature of about 1600 ° C. in a reducing atmosphere.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、この従
来の配線基板は、絶縁基体を構成する酸化アルミニウム
質焼結体等のセラミックスが硬くて脆い性質を有するた
め、搬送工程や半導体装置製作の自動ライン等において
配線基板同士が、あるいは配線基板と半導体装置製作自
動ラインの一部とが激しく衝突すると絶縁基体に欠けや
割れ、クラック等が発生し、その結果、半導体素子を気
密に収容することができず、半導体素子を長期間わたり
正常、且つ安定に作動させることができなくなるという
欠点を有していた。
However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body constituting the insulating base have a hard and brittle property, the automatic wiring of the transfer process and the semiconductor device manufacturing is difficult. When the wiring boards collide with each other or the wiring board and a part of the semiconductor device manufacturing automatic line violently collide with each other, chips, cracks, cracks, etc. occur in the insulating base, and as a result, the semiconductor element can be housed in an airtight manner. However, the semiconductor device cannot operate normally and stably for a long period of time.

【0005】また前記配線基板の製造方法によれば、セ
ラミック生成形体を焼成する際、各セラミックグリーン
シートにおけるセラミック原料粉末の密度のバラツキに
起因してセラミック生成形体に不均一な焼成収縮が発生
して得られる配線基板に反り等の変形や寸法のバラツキ
が生じ、変形や寸法のバラツキが大きいと配線導体に断
線を招来するという欠点も有していた。
Further, according to the method of manufacturing a wiring substrate, when firing the ceramic formed body, uneven firing shrinkage occurs in the ceramic formed body due to the variation in the density of the ceramic raw material powder in each ceramic green sheet. In addition, the resulting wiring board has a defect such as deformation such as warpage or dimensional variation, and a large deformation or dimensional variation leads to disconnection of the wiring conductor.

【0006】[0006]

【課題を解決するための手段】本発明の配線基板は60
重量%乃至95重量%の無機絶縁物粉末と5重量%乃至
40重量%の熱硬化性樹脂とから成り、前記無機絶縁物
粉末を前記熱硬化性樹脂の前駆体で結合して成る前駆体
シートを半硬化させてその複数枚を積層して熱硬化させ
た、前記無機絶縁物粉末を前記熱硬化性樹脂により結合
した複数枚の絶縁基板を積層して成る絶縁基体の前記絶
縁基板に、金属粉末を融点が300℃以下の低融点金属
で接合した配線導体を熱硬化性樹脂により被着させて成
ることを特徴とするものである。
According to the present invention, there is provided a wiring board comprising:
A precursor sheet comprising inorganic insulating powder in an amount of 5% to 95% by weight and a thermosetting resin in an amount of 5% to 40% by weight, wherein the inorganic insulating powder is bonded with a precursor of the thermosetting resin; Is semi-cured, a plurality of the substrates are laminated and thermally cured, and the insulating substrate of the insulating substrate formed by laminating a plurality of insulating substrates in which the inorganic insulating powder is bonded by the thermosetting resin has metal. It is characterized in that a wiring conductor in which powder is joined with a low melting point metal having a melting point of 300 ° C. or less is applied with a thermosetting resin.

【0007】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合して成る前駆
体シートを準備する工程と、前記前駆体シートに熱硬化
性樹脂前駆体と金属粉末と融点が300℃以下の低融点
金属粉末とを混合して成る金属ペーストを所定パターン
に印刷する工程と、前記所定パターンに印刷塗布した金
属ペーストを誘導加熱により加熱し、金属粉末を低融点
金属で結合する工程と、前記前駆体シート及び金属ペー
ストの熱硬化性樹脂前駆体を熱硬化させる工程と、から
成ることを特徴とするものである。
Further, according to the method for producing a wiring board of the present invention, there is provided a step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder; Printing a metal paste formed by mixing a body, metal powder, and a low-melting metal powder having a melting point of 300 ° C. or less in a predetermined pattern, and heating the metal paste printed and applied on the predetermined pattern by induction heating, And a step of thermosetting the thermosetting resin precursor of the precursor sheet and the metal paste.

【0008】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作自動ラインの一部とが激し
く衝突しても絶縁基体に欠けや割れ、クラック等が発生
することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device manufacturing automatic line. Even if a portion of the insulating base material collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0009】また本発明の配線基板によれば配線導体の
金属粉末を融点が300℃以下の低融点金属で接合させ
たことから金属粉末間の電気的接続が確実となり、配線
導体の電気抵抗を低抵抗となすことができる。
Further, according to the wiring board of the present invention, since the metal powder of the wiring conductor is joined with a low melting point metal having a melting point of 300 ° C. or less, electrical connection between the metal powders is ensured, and the electric resistance of the wiring conductor is reduced. Low resistance can be achieved.

【0010】更に本発明の配線基板は熱硬化性樹脂前駆
体と無機絶縁物粉末とを混合して成る前駆体シートを準
備する工程と、前記前駆体シートに熱硬化性樹脂前駆体
と金属粉末と融点が300℃以下の低融点金属粉末とを
混合して成る金属ペーストを所定パターンに印刷する工
程と、前記所定パターンに印刷塗布した金属ペーストを
誘導加熱により加熱し、金属粉末を低融点金属で結合す
る工程と、前記前駆体シート及び金属ペーストの熱硬化
性樹脂前駆体を熱硬化させる工程とにより配線基板を製
作することから焼成に伴う不均一な収縮による変形や寸
法のばらつきが発生することはない。
The wiring board of the present invention further comprises a step of preparing a precursor sheet comprising a mixture of a thermosetting resin precursor and an inorganic insulating powder; And a low melting point metal powder having a melting point of 300 ° C. or lower. A step of printing the metal paste in a predetermined pattern, and heating the metal paste printed and applied on the predetermined pattern by induction heating to reduce the metal powder to a low melting point metal. And a step of thermally curing the thermosetting resin precursor of the precursor sheet and the metal paste, thereby producing a wiring board, so that deformation and dimensional variation due to uneven shrinkage due to firing occur. Never.

【0011】[0011]

【発明の実施の形態】次に本発明を添付図面に基づき詳
細に説明する。図1は本発明の配線基板を半導体素子を
収容する半導体素子収納用パッケージに適用した場合の
一実施例を示し、1は絶縁基体、2は配線導体である。
この配線導体2を絶縁基体1に被着させたものが配線基
板となる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating base, and 2 is a wiring conductor.
The wiring substrate formed by attaching the wiring conductor 2 to the insulating base 1 is a wiring substrate.

【0012】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
剤を介して接着固定される。
The insulating base 1 comprises three insulating substrates 1a, 1
The semiconductor element 3 is formed by laminating b and 1c, and has a concave portion 1d for accommodating a semiconductor element in the center of the upper surface thereof. Adhesively fixed.

【0013】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは例えば、酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム、
チタン酸ストロンチウム、酸化チタン等の無機絶縁物粉
末をエポキシ樹脂、ポリイミド樹脂、ポリフェニレンエ
ーテル樹脂等の熱硬化性樹脂で結合することによって形
成されており、絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cはその各々が無機絶縁物粉末を靱性に優
れる熱硬化性樹脂で結合することによって形成されてい
ることから絶縁基体1に外力が印加されても該外力によ
って絶縁基体1に欠けや割れ、クラック等が発生するこ
とはない。
The three insulating substrates 1a, 1b and 1c constituting the insulating base 1 are made of, for example, silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate,
It is formed by bonding inorganic insulating powders such as strontium titanate and titanium oxide with a thermosetting resin such as an epoxy resin, a polyimide resin, and a polyphenylene ether resin.
Since a, 1b and 1c are each formed by bonding inorganic insulating powder with a thermosetting resin having excellent toughness, even when an external force is applied to the insulating base 1, the insulating base 1 is chipped by the external force. No cracks, cracks, etc. occur.

【0014】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨張係数が半導体素子3の
熱膨張係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に両者の熱膨張係数の相違に起因
する大きな熱応力が発生し、この大きな熱応力によって
半導体素子3が絶縁基体1より剥離したり、半導体素子
3に割れや欠け等が発生してしまう。また95重量%を
越えると無機絶縁物粉末を熱硬化性樹脂で完全に結合さ
せることができず、所定の絶縁基板1a、1b、1cを
得ることができなくなる。従って、前記絶縁基体1を構
成する絶縁基板1a、1b、1cはその各々の内部に含
有される無機絶縁物粉末の量が60乃至95重量%の範
囲に特定される。
Incidentally, three insulating substrates 1 constituting an insulating base 1 formed by bonding the inorganic insulating powder with a thermosetting resin.
a, 1b, and 1c each have a content of the inorganic insulating powder of 60% by weight.
If it is less than 1, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, and the semiconductor element 3 generates heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. As a result, a large thermal stress is generated between the two due to the difference in the coefficient of thermal expansion between the two, and the large thermal stress causes the semiconductor element 3 to be separated from the insulating base 1 and the semiconductor element 3 to be cracked or chipped. Resulting in. If it exceeds 95% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1b, and 1c cannot be obtained. Therefore, the amount of the inorganic insulating powder contained in each of the insulating substrates 1a, 1b, and 1c constituting the insulating base 1 is specified in the range of 60 to 95% by weight.

【0015】また前記絶縁基体1はその凹部1d周辺か
ら下面にかけて配線導体2が被着形成されており、該配
線導体2は銅、銀、金等の金属粉末を融点が300℃以
下の低融点金属、具体的には半田を介し接合させたもの
を熱硬化性樹脂を介し絶縁基体1に取着させて形成され
ている。
The insulating base 1 is provided with a wiring conductor 2 attached from the periphery of the concave portion 1d to the lower surface. The wiring conductor 2 is made of a metal powder such as copper, silver, or gold having a low melting point of 300 ° C. or less. It is formed by attaching a metal, specifically, a material joined via solder, to the insulating base 1 via a thermosetting resin.

【0016】前記配線導体2は半導体素子3の電極を外
部電気回路に接続する作用を為し、絶縁基体1の凹部1
d周辺部位に位置する配線導体2には半導体素子3の各
電極がボンディングワイヤ4を介して電気的に接続さ
れ、また絶縁基体1の下面に導出される部位は外部電気
回路に電気的に接続される。
The wiring conductor 2 serves to connect the electrodes of the semiconductor element 3 to an external electric circuit, and
d Each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 located at the peripheral portion via a bonding wire 4, and the portion led out to the lower surface of the insulating base 1 is electrically connected to an external electric circuit. Is done.

【0017】前記配線導体2はまた銅、銀、金等の金属
粉末を融点が300℃以下の半田等の低融点金属で接合
することによって形成されており、金属粉末間の電気的
接続を確実として配線導体2の電気抵抗を低抵抗となす
ことができる。
The wiring conductor 2 is formed by joining a metal powder such as copper, silver, and gold with a low-melting metal such as a solder having a melting point of 300 ° C. or less, so that electrical connection between the metal powders is ensured. As a result, the electric resistance of the wiring conductor 2 can be made low.

【0018】尚、前記金属粉末と融点が300℃以下の
低融点金属と熱硬化性樹脂とから成る配線導体2は金属
粉末と融点が300℃以下の低融点金属の合計重量が配
線導体2の全重量に対し、70重量%未満となると銅、
銀、金等の金属粉末と300℃以下の半田等の低融点金
属との接合が不完全となり、また95重量%を越えると
熱硬化性樹脂で配線導体2を絶縁基体1に強固に被着さ
せるのが困難になるとともに配線導体2が脆弱となる傾
向にある。従って、前記配線導体2に含有される金属粉
末と融点が300℃以下の低融点金属はその合計重量が
配線導体2の全重量に対し70重量%乃至95重量%の
範囲としておくことが好ましい。
The wiring conductor 2 composed of the metal powder, the low melting point metal having a melting point of 300 ° C. or less and the thermosetting resin is the total weight of the metal powder and the low melting point metal having a melting point of 300 ° C. or less. When it is less than 70% by weight based on the total weight, copper,
Bonding of a metal powder such as silver or gold to a low melting point metal such as solder at 300 ° C. or less becomes incomplete, and if it exceeds 95% by weight, the wiring conductor 2 is firmly adhered to the insulating base 1 with a thermosetting resin. It is difficult to make the wiring conductor 2 brittle and the wiring conductor 2 tends to be weak. Therefore, the total weight of the metal powder contained in the wiring conductor 2 and the low melting point metal having a melting point of 300 ° C. or less is preferably in the range of 70% by weight to 95% by weight based on the total weight of the wiring conductor 2.

【0019】また前記配線導体2に含有される金属粉末
と融点が300℃以下の低融点金属は金属粉末の量が該
金属粉末と低融点金属の合計重量に対し20重量%未満
となると金属粉末に対して低融点金属が多くなり、低融
点金属同士が溶融し合って金属粉末を取り込んだ一体化
が困難となって配線導体2の電気抵抗値が高く成る傾向
にあり、また80重量%を越えると金属粉末を接合させ
る低融点金属の量が相対的に少なくなり、金属粉末を完
全に接合させることができず配線導体2の電気抵抗値が
高くなってしまう傾向にある。従って、前記配線導体2
に含有される金属粉末は該金属粉末と低融点金属の合計
重量に対し20重量%乃至80重量%の範囲としておく
ことが好ましい。
The metal powder contained in the wiring conductor 2 and the low melting point metal having a melting point of 300 ° C. or less are used when the amount of the metal powder is less than 20% by weight based on the total weight of the metal powder and the low melting point metal. On the other hand, the amount of the low-melting-point metal increases, and the low-melting-point metals fuse with each other, making it difficult to integrate the metal powder into the metal powder and increasing the electric resistance of the wiring conductor 2. If it exceeds, the amount of the low melting point metal to be joined with the metal powder becomes relatively small, so that the metal powder cannot be completely joined and the electric resistance value of the wiring conductor 2 tends to increase. Therefore, the wiring conductor 2
Is preferably in the range of 20% by weight to 80% by weight based on the total weight of the metal powder and the low melting point metal.

【0020】更に前記配線導体2に含有される金属粉末
と融点が300℃以下の低融点金属はその平均粒径が
0.1μm未満となると金属粉末及び低融点金属が凝集
して均一な分散が得られなくなり、また50μmを越え
ると配線導体2の幅を一般的に要求される50μm〜2
00μmの範囲に印刷形成するのが困難となる。従っ
て、前記配線導体2に含有される金属粉末と融点が30
0℃以下の低融点金属はその平均粒径を0.1μm乃至
50μmの範囲としておくことが好ましい。
When the average particle diameter of the metal powder contained in the wiring conductor 2 and the low melting point metal having a melting point of 300 ° C. or less is less than 0.1 μm, the metal powder and the low melting point metal are aggregated and uniformly dispersed. When the width exceeds 50 μm, the width of the wiring conductor 2 is generally required to be 50 μm to 2 μm.
It becomes difficult to print and form in the range of 00 μm. Accordingly, the metal powder contained in the wiring conductor 2 has a melting point of 30%.
It is preferable that the low melting point metal having a temperature of 0 ° C. or lower has an average particle size in a range of 0.1 μm to 50 μm.

【0021】かくして上述の配線基板によれば、絶縁基
体1の凹部1d底面に半導体素子3を樹脂等の接着剤を
介して接着固定するとともに半導体素子3の各電極をボ
ンディングワイヤ4を介して配線導体2に電気的に接続
し、しかる後、絶縁基体1の上面に蓋体5を樹脂等から
成る封止材を介して接合させ、絶縁基体1と蓋体5とか
ら成る容器内部に半導体素子3を気密に収容することに
よって製品としての半導体装置が完成する。
Thus, according to the above-mentioned wiring board, the semiconductor element 3 is bonded and fixed to the bottom surface of the concave portion 1d of the insulating base 1 with an adhesive such as a resin, and each electrode of the semiconductor element 3 is wired via the bonding wire 4. After being electrically connected to the conductor 2, the lid 5 is bonded to the upper surface of the insulating base 1 via a sealing material made of resin or the like, and the semiconductor element is placed inside the container formed of the insulating base 1 and the lid 5. The semiconductor device as a product is completed by housing 3 in an airtight manner.

【0022】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図2に基づき説明
する。
Next, a method of manufacturing a wiring board used in the package for housing a semiconductor element will be described with reference to FIG.

【0023】まず図2(a)に示すように3枚の前駆体
シート11a、11b、11cを準備する。
First, as shown in FIG. 2A, three precursor sheets 11a, 11b and 11c are prepared.

【0024】前記3枚の前駆体シート11a、11b、
11cは無機絶縁物粉末を熱硬化性樹脂前駆体で結合す
ることによって形成されており、例えば粒径が0.1〜
100μmの酸化珪素粉末に、ビスフェノールA型エポ
キシ樹脂、ノボラック型エポキシ樹脂、グリシジルエス
テル型エポキシ樹脂等のエポキシ樹脂及びアミン系硬化
剤、イミダゾール系硬化剤、酸無水物系硬化剤等の硬化
剤を添加混合してペースト状となし、しかる後、このペ
ーストをシート状になすとともに約25〜100℃の温
度で1〜60分間加熱し、半硬化させることによって製
作される。
The three precursor sheets 11a, 11b,
11c is formed by bonding an inorganic insulating powder with a thermosetting resin precursor, for example, having a particle size of 0.1 to
Epoxy resin such as bisphenol A type epoxy resin, novolak type epoxy resin, glycidyl ester type epoxy resin, etc. and curing agent such as amine type curing agent, imidazole type curing agent, acid anhydride type curing agent are added to 100 μm silicon oxide powder. The paste is mixed to form a paste. Thereafter, the paste is formed into a sheet and heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to be semi-cured.

【0025】次に図2(b)に示すように前記3枚の前
駆体シート11a、11b、11cのうち2枚の前駆体
シート11a、11bに半導体素子3を収容する凹部1
dとなる開口A、A’を、2枚の前駆体シート11b、
11cに配線導体2を引き回すための貫通孔B、B’を
各々形成する。
Next, as shown in FIG. 2 (b), two of the three precursor sheets 11a, 11b, 11c have the recess 1 for accommodating the semiconductor element 3 in the two precursor sheets 11a, 11b.
The openings A and A ′ serving as d are formed by two precursor sheets 11b,
11c, through holes B and B 'for routing the wiring conductor 2 are respectively formed.

【0026】前記開口A、A’及び貫通孔B、B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。
The openings A, A 'and the through holes B, B' are formed by subjecting the precursor sheets 11a, 11b, 11c to a conventionally well-known punching method.
c is formed by piercing a hole of a predetermined shape in each of c.

【0027】次に図2(c)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法により所定パターンに印刷塗布し、次に前記
所定パターンに印刷塗布された金属ペースト12を誘導
加熱により加熱して金属粉末を低融点金属で結合すると
ともに約25〜100℃の温度で1〜60分間加熱し熱
硬化性樹脂を半硬化させることによって製作される。
Next, as shown in FIG. 2C, a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B 'by a conventionally known screen printing method. The metal paste 12 printed and applied in a predetermined pattern is then heated by induction heating to bond the metal powder with a low melting point metal and heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes. It is manufactured by semi-curing a thermosetting resin.

【0028】前記金属ペースト12としては例えば、金
属粉末として粒径が0.1μm〜20μm程度の銅粉末
に、粒径が1μm〜50μm程度の半田と、ビスフェノ
ールA型エポキシ樹脂、ノボラック型エポキシ樹脂、グ
リシジルエステル型エポキシ樹脂等のエポキシ樹脂及び
アミン系硬化剤、イミダゾール系硬化剤、酸無水物系硬
化剤等の硬化剤を添加混合しペースト状となしたものが
使用される。
As the metal paste 12, for example, copper powder having a particle size of about 0.1 μm to 20 μm as a metal powder, solder having a particle size of about 1 μm to 50 μm, bisphenol A type epoxy resin, novolak type epoxy resin, An epoxy resin such as a glycidyl ester type epoxy resin and a curing agent such as an amine curing agent, an imidazole curing agent, and an acid anhydride curing agent are added and mixed to form a paste.

【0029】また前記前駆体シート11b、11cの上
下面及び貫通孔B、B’内に所定パターンに印刷塗布さ
れた金属ペースト12の誘導加熱による加熱は、例えば
金属ペースト12が所定パターンに印刷塗布された前駆
体シート11b、11cを高周波ロウ付装置の加熱コイ
ル部に配置させるとともに該加熱コイルに金属ペースト
中の低融点金属に電磁誘導による発熱を起こさせるに必
要な所定の高周波電力を印加することによって行われ
る。
The heating by induction heating of the metal paste 12 printed and applied in a predetermined pattern on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B 'is performed, for example, by printing the metal paste 12 in a predetermined pattern. The obtained precursor sheets 11b and 11c are arranged in a heating coil portion of a high-frequency brazing device, and a predetermined high-frequency power necessary for causing the low-melting-point metal in the metal paste to generate heat by electromagnetic induction is applied to the heating coil. This is done by:

【0030】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層するとともにこれを約
80〜300℃の温度で約10秒〜24時間加熱し、前
記前駆体シート11a、11b、11cと、前駆体シー
ト11b、11cに所定パターンに印刷塗布された金属
ペースト12とを完全に熱硬化させることによって図1
に示すような絶縁基体1に配線導体2を被着させた半導
体素子収納用パッケージに使用される配線基板が完成す
る。この場合、前記前駆体シート11a、11b、11
c及び金属ペースト12は熱硬化時に収縮することは殆
どなく、従って、得られる配線基板に変形や寸法にバラ
ツキが発生せず、配線導体に断線が招来することはな
く、配線導体を介して半導体素子等の電極を外部電気回
路に確実に電気的接続することが可能となる。
Finally, the three precursor sheets 11
a, 11b, and 11c are vertically stacked and heated at a temperature of about 80 to 300 ° C. for about 10 seconds to 24 hours to form a predetermined pattern on the precursor sheets 11a, 11b, and 11c and the precursor sheets 11b and 11c. By completely thermosetting the metal paste 12 printed and applied to
A wiring board used for a semiconductor element storage package in which a wiring conductor 2 is attached to an insulating base 1 as shown in FIG. In this case, the precursor sheets 11a, 11b, 11
c and the metal paste 12 hardly shrink at the time of thermosetting, so that there is no deformation or variation in dimensions of the obtained wiring board, no breakage in the wiring conductors, and no semiconductor via the wiring conductors. Electrodes such as elements can be reliably electrically connected to an external electric circuit.

【0031】尚、本発明は上述の実施例に限定されるも
のではなく、本発明の要旨を逸脱しない範囲であれば種
々の変更は可能であり、例えば上述の実施例では本発明
の配線基板を半導体素子を収容する半導体素子収納用パ
ッケージに適用した場合を例に採って説明したが、これ
を混成集積回路基板に適用してもよい。
It should be noted that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the gist of the present invention. Has been described as an example in which the present invention is applied to a semiconductor element housing package for housing a semiconductor element, but this may be applied to a hybrid integrated circuit board.

【0032】また上述の実施例では3枚の前駆体シート
を積層することによって配線基板を製作したが、1枚や
2枚、あるいは4枚以上の前駆体シートを使用して配線
基板を製作してもよい。
In the above embodiment, a wiring board is manufactured by laminating three precursor sheets. However, a wiring board is manufactured by using one, two, or four or more precursor sheets. You may.

【0033】[0033]

【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作自動ラインの一部とが激
しく衝突しても絶縁基体に欠けや割れ、クラック等が発
生することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device are manufactured. Even if a part of the automatic line collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0034】また本発明の配線基板によれば配線導体の
金属粉末を融点が300℃以下の低融点金属で接合させ
たことから金属粉末間の電気的接続が確実となり、配線
導体の電気抵抗を低抵抗となすことができる。
Further, according to the wiring board of the present invention, since the metal powder of the wiring conductor is joined with a low melting point metal having a melting point of 300 ° C. or less, the electrical connection between the metal powders is ensured, and the electric resistance of the wiring conductor is reduced. Low resistance can be achieved.

【0035】更に本発明の配線基板は熱硬化性樹脂前駆
体と無機絶縁物粉末とを混合して成る前駆体シートを準
備する工程と、前記前駆体シートに熱硬化性樹脂前駆体
と金属粉末と融点が300℃以下の低融点金属粉末とを
混合して成る金属ペーストを所定パターンに印刷する工
程と、前記所定パターンに印刷塗布した金属ペーストを
誘導加熱により加熱し、金属粉末を低融点金属で結合す
る工程と、前記前駆体シート及び金属ペーストの熱硬化
性樹脂前駆体を熱硬化させる工程とにより配線基板を製
作することから焼成に伴う不均一な収縮による変形や寸
法のばらつきが発生することはない。
Further, the wiring board of the present invention comprises a step of preparing a precursor sheet comprising a mixture of a thermosetting resin precursor and an inorganic insulating powder; And a low melting point metal powder having a melting point of 300 ° C. or lower. A step of printing the metal paste in a predetermined pattern, and heating the metal paste printed and applied on the predetermined pattern by induction heating to reduce the metal powder to a low melting point metal. And a step of thermally curing the thermosetting resin precursor of the precursor sheet and the metal paste, thereby producing a wiring board, so that deformation and dimensional variation due to uneven shrinkage due to firing occur. Never.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a cross-sectional view showing one embodiment in which a wiring board of the present invention is applied to a package for housing a semiconductor element.

【図2】(a)乃至(c)は本発明の配線基板の製造方
法を説明するための各工程毎の断面図である。
FIGS. 2A to 2C are cross-sectional views for explaining steps of a method for manufacturing a wiring board according to the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・・・・・・・・絶縁基体 1a、1b、1c・・・・・・絶縁基板 2・・・・・・・・・・・・・配線導体 11a、11b、11c・・・前駆体シート 12・・・・・・・・・・・・金属ペースト ... Insulating base 1a, 1b, 1c Insulating substrate 2 Wiring conductors 11a, 11b, 11c ... Precursor sheet 12 ... Metal paste

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】60重量%乃至95重量%の無機絶縁物粉
末と5重量%乃至40重量%の熱硬化性樹脂とから成
り、前記無機絶縁物粉末を前記熱硬化性樹脂の前駆体で
結合して成る前駆体シートを半硬化させてその複数枚を
積層して熱硬化させた、前記無機絶縁物粉末を前記熱硬
化性樹脂により結合した複数枚の絶縁基板を積層して
る絶縁基体の前記絶縁基板に、金属粉末を融点が300
℃以下の低融点金属で接合した配線導体を熱硬化性樹脂
により被着させて成る配線基板。
1. An inorganic insulating powder comprising 60% to 95% by weight of an inorganic insulating powder and 5% to 40% by weight of a thermosetting resin, wherein the inorganic insulating powder is a precursor of the thermosetting resin.
Semi-cured precursor sheets are combined and multiple
Laminated to thermally cured, the insulating substrate of the inorganic insulator powder by stacking a plurality of insulating substrates joined by the thermosetting resin formed <br/> Ru insulating substrate, melting point metal powder 300
A wiring board formed by applying a wiring conductor bonded with a low melting point metal at a temperature of not more than ° C with a thermosetting resin.
【請求項2】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合して成る前駆体シートを準備する工程と、前記前駆
体シートに熱硬化性樹脂前駆体と金属粉末と融点が30
0℃以下の低融点金属粉末とを混合して成る金属ペース
トを所定パターンに印刷する工程と、前記所定パターン
に印刷塗布した金ペーストを誘導加熱により加熱し、
金属粉末を低融点金属で結合する工程と、前駆前駆体シ
ート及び金属ペーストの熱硬化性樹脂前駆体を熱硬化さ
せる工程と、から成ることを特徴とする配線基板の製造
方法。
2. A step of preparing a precursor sheet comprising a mixture of a thermosetting resin precursor and an inorganic insulating powder; and providing the precursor sheet with a thermosetting resin precursor, a metal powder and a melting point of 30%.
The 0 ℃ following metal paste formed by mixing a low-melting-point metal powder comprising the steps of: printing a predetermined pattern is heated by induction heating the printed coated metallic paste to the predetermined pattern,
A method for manufacturing a wiring board, comprising: a step of bonding metal powder with a low melting metal; and a step of thermally curing a thermosetting resin precursor of a precursor precursor sheet and a metal paste.
JP24582995A 1995-09-22 1995-09-25 Wiring board and manufacturing method thereof Expired - Fee Related JP3145621B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP24582995A JP3145621B2 (en) 1995-09-25 1995-09-25 Wiring board and manufacturing method thereof
US08/717,119 US5837356A (en) 1995-09-22 1996-09-20 Wiring board and method for manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24582995A JP3145621B2 (en) 1995-09-25 1995-09-25 Wiring board and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPH0992946A JPH0992946A (en) 1997-04-04
JP3145621B2 true JP3145621B2 (en) 2001-03-12

Family

ID=17139480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24582995A Expired - Fee Related JP3145621B2 (en) 1995-09-22 1995-09-25 Wiring board and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JP3145621B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007027487A (en) * 2005-07-19 2007-02-01 Dowa Holdings Co Ltd Method for forming conductive film or wiring
JP5113164B2 (en) * 2007-06-01 2013-01-09 ビ−エイイ− システムズ パブリック リミテッド カンパニ− Improvements to Direct Light and additional manufacturing methods

Also Published As

Publication number Publication date
JPH0992946A (en) 1997-04-04

Similar Documents

Publication Publication Date Title
JP3145621B2 (en) Wiring board and manufacturing method thereof
JPH1074858A (en) Wiring board and manufacturing method thereof
JP3152852B2 (en) Wiring board and manufacturing method thereof
JP3301907B2 (en) Manufacturing method of wiring board
JP3297574B2 (en) Wiring board and method of manufacturing the same
JP3292646B2 (en) Wiring board and method of manufacturing the same
JP3292623B2 (en) Wiring board and method of manufacturing the same
JP3292645B2 (en) Wiring board and method of manufacturing the same
JP3305574B2 (en) Wiring board
JP3297572B2 (en) Manufacturing method of wiring board
JP3292624B2 (en) Wiring board and method of manufacturing the same
JP3145620B2 (en) Wiring board and manufacturing method thereof
JP3145619B2 (en) Wiring board and manufacturing method thereof
JP3297573B2 (en) Wiring board and method of manufacturing the same
JP3266508B2 (en) Wiring board and method of manufacturing the same
JP3297576B2 (en) Wiring board and method of manufacturing the same
JP3292620B2 (en) Wiring board and method of manufacturing the same
JP3393747B2 (en) Wiring board and method of manufacturing the same
JP3393768B2 (en) Wiring board and method of manufacturing the same
JP3301908B2 (en) Wiring board and method of manufacturing the same
JP3181019B2 (en) Wiring board manufacturing method
JP3297575B2 (en) Wiring board and method of manufacturing the same
JP3605235B2 (en) Manufacturing method of wiring board
JP3323060B2 (en) Wiring board
JP3301909B2 (en) Wiring board and method of manufacturing the same

Legal Events

Date Code Title Description
FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090105

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100105

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110105

Year of fee payment: 10

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110105

Year of fee payment: 10

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120105

Year of fee payment: 11

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120105

Year of fee payment: 11

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130105

Year of fee payment: 12

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140105

Year of fee payment: 13

LAPS Cancellation because of no payment of annual fees