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JP3145620B2 - Wiring board and manufacturing method thereof - Google Patents
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JP3145620B2 - Wiring board and manufacturing method thereof - Google Patents

Wiring board and manufacturing method thereof

Info

Publication number
JP3145620B2
JP3145620B2 JP24447095A JP24447095A JP3145620B2 JP 3145620 B2 JP3145620 B2 JP 3145620B2 JP 24447095 A JP24447095 A JP 24447095A JP 24447095 A JP24447095 A JP 24447095A JP 3145620 B2 JP3145620 B2 JP 3145620B2
Authority
JP
Japan
Prior art keywords
precursor
thermosetting resin
powder
metal
metal paste
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP24447095A
Other languages
Japanese (ja)
Other versions
JPH0992948A (en
Inventor
直広 鹿取
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP24447095A priority Critical patent/JP3145620B2/en
Priority to US08/717,119 priority patent/US5837356A/en
Publication of JPH0992948A publication Critical patent/JPH0992948A/en
Application granted granted Critical
Publication of JP3145620B2 publication Critical patent/JP3145620B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/682Shapes or dispositions thereof comprising holes having chips therein
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体素子を収容す
るための半導体素子収納用パッケージや混成集積回路基
板等に用いられる配線基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device housing package for housing a semiconductor device and a wiring board used for a hybrid integrated circuit board.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子収納
用パッケージを収容する半導体素子収納用パッケージに
使用される配線基板として比較的高密度の配線が可能な
積層セラミック配線基板が多用されている。この配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに該半導体素子
の各電極を例えばボンディングワイヤ等の電気的接続手
段を介して配線導体に電気的に接続し、しかる後、前記
絶縁基体の上面に、金属やセラミックス等から成る蓋体
を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロウ
材等の封止材を介して接合させ、絶縁基体の凹部内に半
導体素子を気密に収容することによって製品としての半
導体装置となる。
2. Description of the Related Art Conventionally, a multilayer ceramic wiring board capable of relatively high-density wiring has been widely used as a wiring board used for a wiring board, for example, a semiconductor element housing package for housing a semiconductor element housing package. This wiring board is made of ceramics such as an aluminum oxide sintered body, and has an insulating base having a concave portion for accommodating a semiconductor element in a central portion of an upper surface thereof, and tungsten, molybdenum, etc. led out from the periphery of the concave portion to the lower surface of the insulating base. And a semiconductor element is bonded and fixed to the bottom surface of the concave portion of the insulating base via an adhesive such as glass, resin, or brazing material, and each electrode of the semiconductor element is For example, glass is electrically connected to a wiring conductor via an electrical connection means such as a bonding wire, and thereafter, a cover made of metal, ceramics, or the like is placed on the upper surface of the insulating base so as to cover the concave portion of the insulating base. , A resin, a brazing material, or the like, and a semiconductor device as a product by being hermetically housed in a concave portion of the insulating base. To become.

【0003】またこの従来の配線基板は、一般にセラミ
ックグリーンシート積層法によって製作され、具体的に
は、酸化アルミニウム、酸化珪素、酸化マグネシウム、
酸化カルシウム等のセラミック原料粉末に適当な有機バ
インダー、溶剤等を添加混合して泥漿状となすとともに
これを従来周知のドクターブレード法を採用しシート状
となすことによって複数のセラミックグリーンシートを
得、しかる後、前記セラミックグリーンシートに適当な
打ち抜き加工を施すとともに配線導体となる金属ペース
トを所定パターンに印刷塗布し、最後に前記セラミック
グリーンシートを所定の順に上下に積層してセラミック
生成形体となすとともに該セラミック生成形体を還元雰
囲気中、約1600℃の高温で焼成することによって製
作される。
The conventional wiring board is generally manufactured by a ceramic green sheet laminating method. Specifically, aluminum wiring, silicon oxide, magnesium oxide,
A plurality of ceramic green sheets are obtained by adding a suitable organic binder, a solvent, etc. to a ceramic raw material powder such as calcium oxide to form a slurry by mixing and forming this into a sheet using a conventionally known doctor blade method, Thereafter, the ceramic green sheet is subjected to a suitable punching process and a metal paste to be a wiring conductor is applied by printing in a predetermined pattern, and finally, the ceramic green sheets are stacked up and down in a predetermined order to form a ceramic forming body. It is manufactured by firing the ceramic forming body at a high temperature of about 1600 ° C. in a reducing atmosphere.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、この従
来の配線基板は、絶縁基体を構成する酸化アルミニウム
質焼結体等のセラミックスが硬くて脆い性質を有するた
め、搬送工程や半導体装置製作の自動ライン等において
配線基板同士が、あるいは配線基板と半導体装置製作自
動ラインの一部とが激しく衝突すると絶縁基体に欠けや
割れ、クラック等が発生し、その結果、半導体素子を気
密に収容することができず、半導体素子を長期間わたり
正常、且つ安定に作動させることができなくなるという
欠点を有していた。
However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body constituting the insulating base have a hard and brittle property, the automatic wiring of the transfer process and the semiconductor device manufacturing is difficult. When the wiring boards collide with each other or the wiring board and a part of the semiconductor device manufacturing automatic line violently collide with each other, chips, cracks, cracks, etc. occur in the insulating base, and as a result, the semiconductor element can be housed in an airtight manner. However, the semiconductor device cannot operate normally and stably for a long period of time.

【0005】また前記配線基板の製造方法によれば、セ
ラミック生成形体を焼成する際、各セラミックグリーン
シートにおけるセラミック原料粉末の密度のバラツキに
起因してセラミック生成形体に不均一な焼成収縮が発生
して得られる配線基板に反り等の変形や寸法のバラツキ
が生じ、変形や寸法のバラツキが大きいと配線導体に断
線を招来するという欠点も有していた。
Further, according to the method of manufacturing a wiring substrate, when firing the ceramic formed body, uneven firing shrinkage occurs in the ceramic formed body due to the variation in the density of the ceramic raw material powder in each ceramic green sheet. In addition, the resulting wiring board has a defect such as deformation such as warpage or dimensional variation, and a large deformation or dimensional variation leads to disconnection of the wiring conductor.

【0006】[0006]

【課題を解決するための手段】本発明の配線基板は60
重量%乃至95重量%の無機絶縁物粉末と5重量%乃至
40重量%の熱硬化性樹脂とから成り、前記無機絶縁物
粉末を前記熱硬化性樹脂の前駆体で結合して成る前駆体
シートを半硬化させてその複数枚を積層して熱硬化させ
た、前記無機絶縁物粉末を前記熱硬化性樹脂により結合
した複数枚の絶縁基板を積層して成る絶縁基体の前記絶
縁基板に、ビスフェノールA型エポキシ樹脂と酸無水物
系硬化物とから成る熱硬化性樹脂前駆体を熱硬化させて
形成される樹脂体中に融点が250℃以下の金属粉末が
相互に接合されて形成される金属部材を含有させて成る
配線導体を被着させたことを特徴とするものである。
According to the present invention, there is provided a wiring board comprising:
A precursor sheet comprising inorganic insulating powder in an amount of 5% to 95% by weight and a thermosetting resin in an amount of 5% to 40% by weight, wherein the inorganic insulating powder is bonded with a precursor of the thermosetting resin; Bisphenol is applied to the insulating substrate of the insulating substrate formed by laminating a plurality of insulating substrates obtained by semi-curing, laminating a plurality of the substrates, and thermosetting, and laminating the inorganic insulating powder by the thermosetting resin. A metal formed by bonding metal powders having melting points of 250 ° C. or less to each other in a resin body formed by thermosetting a thermosetting resin precursor composed of an A-type epoxy resin and an acid anhydride-based cured product. A wiring conductor including a member is adhered.

【0007】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合して成る前駆
体シートを準備する工程と、前記前駆体シートにビスフ
ェノールA型エポキシ樹脂と酸無水物系硬化剤とから成
る熱硬化性樹脂前駆体に融点が250℃以下の金属粉末
を添加混合して成る金属ペーストを所定パターンに印刷
する工程と、前記前駆体シート及び金属ペーストを加熱
し、金属ペースト中の金属粉末を相互に接合させつつ前
記前駆体シートの熱硬化性樹脂前駆体及び金属ペースト
の硬化性樹脂前駆体を熱硬化させる工程と、から成るこ
とを特徴とするものである。
Further, according to the method for producing a wiring board of the present invention, there is provided a step of preparing a precursor sheet obtained by mixing a thermosetting resin precursor and an inorganic insulating powder, and adding a bisphenol A type epoxy resin to the precursor sheet. Printing a metal paste formed by adding and mixing a metal powder having a melting point of 250 ° C. or less to a thermosetting resin precursor composed of an acid anhydride-based curing agent and a predetermined pattern; Heating and thermosetting the thermosetting resin precursor of the precursor sheet and the curable resin precursor of the metal paste while bonding the metal powders in the metal paste to each other. It is.

【0008】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作自動ラインの一部とが激し
く衝突しても絶縁基体に欠けや割れ、クラック等が発生
することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device manufacturing automatic line. Even if a portion of the insulating base material collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0009】また本発明の配線基板によればビスフェノ
ールA型エポキシ樹脂と酸無水物系硬化剤とから成る熱
硬化性樹脂前駆体に融点が250℃以下の金属粉末を添
加混合して成る金属ペーストを熱処理して配線導体とな
す際、ビスフェノールA型エポキシ樹脂と酸無水物系硬
化剤とから成る熱硬化性樹脂前駆体は熱硬化が緩やか
で、且つ金属粉末間の溶融接合を促進するフラックスと
しての効果を有することから金属粉末の相互接合が完全
となり、その結果、配線導体の電気抵抗を低抵抗となす
ことができる。
Further, according to the wiring board of the present invention, a metal paste obtained by adding a metal powder having a melting point of 250 ° C. or less to a thermosetting resin precursor composed of a bisphenol A type epoxy resin and an acid anhydride-based curing agent and mixing them. When heat-treated to form a wiring conductor, the thermosetting resin precursor composed of bisphenol A type epoxy resin and acid anhydride-based curing agent has a slow thermosetting and promotes fusion bonding between metal powders. With this effect, the mutual joining of the metal powders is completed, and as a result, the electrical resistance of the wiring conductor can be reduced.

【0010】更に本発明の配線基板は熱硬化性樹脂前駆
体と無機絶縁物粉末とを混合して成る前駆体シートを準
備する工程と、前記前駆体シートにビスフェノールA型
エポキシ樹脂と酸無水物系硬化剤とから成る熱硬化性樹
脂前駆体に融点が250℃以下の金属粉末を添加混合し
て成る金属ペーストを所定パターンに印刷する工程と、
前記前駆体シート及び金属ペーストを加熱し、金属ペー
スト中の金属粉末を相互に接合させつつ前記前駆体シー
トの熱硬化性樹脂前駆体及び金属ペーストの硬化性樹脂
前駆体を熱硬化させる工程とにより配線基板を製作する
ことから焼成に伴う不均一な収縮による変形や寸法のば
らつきが発生することはない。
The wiring board of the present invention further comprises a step of preparing a precursor sheet comprising a mixture of a thermosetting resin precursor and an inorganic insulating powder, wherein the precursor sheet comprises a bisphenol A type epoxy resin and an acid anhydride. A step of printing a metal paste formed by adding and mixing a metal powder having a melting point of 250 ° C. or less to a thermosetting resin precursor composed of a system curing agent and a predetermined pattern,
Heating the precursor sheet and the metal paste, and thermally curing the thermosetting resin precursor of the precursor sheet and the curable resin precursor of the metal paste while bonding the metal powder in the metal paste to each other. Since the wiring substrate is manufactured, deformation and dimensional variation due to uneven shrinkage due to firing do not occur.

【0011】[0011]

【発明の実施の形態】次に本発明を添付図面に基づき詳
細に説明する。図1は本発明の配線基板を半導体素子を
収容する半導体素子収納用パッケージに適用した場合の
一実施例を示し、1は絶縁基体、2は配線導体である。
この配線導体2を絶縁基体1に被着させたものが配線基
板となる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating base, and 2 is a wiring conductor.
The wiring substrate formed by attaching the wiring conductor 2 to the insulating base 1 is a wiring substrate.

【0012】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
剤を介して接着固定される。
The insulating base 1 comprises three insulating substrates 1a, 1
The semiconductor element 3 is formed by laminating b and 1c, and has a concave portion 1d for accommodating a semiconductor element in the center of the upper surface thereof. Adhesively fixed.

【0013】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは例えば、酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム、
チタン酸ストロンチウム、酸化チタン等の無機絶縁物粉
末をエポキシ樹脂、ポリイミド樹脂、ポリフェニレンエ
ーテル樹脂等の熱硬化性樹脂で結合することによって形
成されており、絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cはその各々が無機絶縁物粉末を靱性に優
れる熱硬化性樹脂で結合することによって形成されてい
ることから絶縁基体1に外力が印加されても該外力によ
って絶縁基体1に欠けや割れ、クラック等が発生するこ
とはない。
The three insulating substrates 1a, 1b and 1c constituting the insulating base 1 are made of, for example, silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate,
It is formed by bonding inorganic insulating powders such as strontium titanate and titanium oxide with a thermosetting resin such as an epoxy resin, a polyimide resin, and a polyphenylene ether resin.
Since a, 1b and 1c are each formed by bonding inorganic insulating powder with a thermosetting resin having excellent toughness, even when an external force is applied to the insulating base 1, the insulating base 1 is chipped by the external force. No cracks, cracks, etc. occur.

【0014】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨張係数が半導体素子3の
熱膨張係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に両者の熱膨張係数の相違に起因
する大きな熱応力が発生し、この大きな熱応力によって
半導体素子3が絶縁基体1より剥離したり、半導体素子
3に割れや欠け等が発生してしまう。また95重量%を
越えると無機絶縁物粉末を熱硬化性樹脂で完全に結合さ
せることができず、所定の絶縁基板1a、1b、1cを
得ることができなくなる。従って、前記絶縁基体1を構
成する絶縁基板1a、1b、1cはその各々の内部に含
有される無機絶縁物粉末の量が60乃至95重量%の範
囲に特定される。
Incidentally, three insulating substrates 1 constituting an insulating base 1 formed by bonding the inorganic insulating powder with a thermosetting resin.
a, 1b, and 1c each have a content of the inorganic insulating powder of 60% by weight.
If it is less than 1, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, and the semiconductor element 3 generates heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. As a result, a large thermal stress is generated between the two due to the difference in the coefficient of thermal expansion between the two, and the large thermal stress causes the semiconductor element 3 to be separated from the insulating base 1 and the semiconductor element 3 to be cracked or chipped. Resulting in. If it exceeds 95% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1b, and 1c cannot be obtained. Therefore, the amount of the inorganic insulating powder contained in each of the insulating substrates 1a, 1b, and 1c constituting the insulating base 1 is specified in the range of 60 to 95% by weight.

【0015】また前記絶縁基体1はその凹部1d周辺か
ら下面にかけて配線導体2が被着形成されており、該配
線導体2は錫ー鉛共晶半田等から成る融点が250℃以
下の低融点金属粉末を相互に溶融接合させて形成される
金属部材と熱硬化性樹脂とで構成されている。
A wiring conductor 2 is formed on the insulating base 1 from the periphery of the concave portion 1d to the lower surface. The wiring conductor 2 is made of a tin-lead eutectic solder or the like and has a melting point of 250 ° C. or less. It is composed of a metal member formed by melting and joining powders to each other and a thermosetting resin.

【0016】前記配線導体2は半導体素子3の電極を外
部電気回路に接続する作用を為し、絶縁基体1の凹部1
d周辺部位に位置する配線導体2には半導体素子3の各
電極がボンディングワイヤ4を介して電気的に接続さ
れ、また絶縁基体1の下面に導出される部位は外部電気
回路に電気的に接続される。
The wiring conductor 2 serves to connect the electrodes of the semiconductor element 3 to an external electric circuit, and
d Each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 located at the peripheral portion via a bonding wire 4, and the portion led out to the lower surface of the insulating base 1 is electrically connected to an external electric circuit. Is done.

【0017】前記配線導体2はまた融点が250℃以下
の低融点金属粉末を相互に溶融接合させて形成される金
属部材と熱硬化性樹脂とで構成されており、各低融点金
属粉末はその各々が相互に接合されているため配線導体
2の電気抵抗は低抵抗となる。
The wiring conductor 2 is composed of a metal member formed by melting and joining low-melting metal powders having a melting point of 250 ° C. or less to each other and a thermosetting resin. Since they are joined to each other, the electric resistance of the wiring conductor 2 is low.

【0018】尚、前記配線導体2の内部に含有される低
融点金属粉末はその総量が配線導体2の全重量に対し、
70重量%未満となると低融点金属粉末同士の接合が困
難となって配線導体2の電気抵抗が高くなる傾向にあ
り、また95重量%を越えると配線導体2を絶縁基体1
に強固に被着させることが困難となる傾向にある。従っ
て、前記配線導体2に含有される低融点金属粉末はその
総量が配線導体2の全重量に対し70重量%乃至95重
量%の範囲としておくことが好ましい。
The total amount of the low-melting metal powder contained in the wiring conductor 2 is based on the total weight of the wiring conductor 2.
If the content is less than 70% by weight, it becomes difficult to join the low melting point metal powders, and the electric resistance of the wiring conductor 2 tends to increase.
Tends to be difficult to firmly adhere to the surface. Therefore, it is preferable that the total amount of the low melting point metal powder contained in the wiring conductor 2 is in the range of 70% by weight to 95% by weight based on the total weight of the wiring conductor 2.

【0019】かくして上述の配線基板によれば、絶縁基
体1の凹部1d底面に半導体素子3を樹脂等の接着剤を
介して接着固定するとともに半導体素子3の各電極をボ
ンディングワイヤ4を介して配線導体2に電気的に接続
し、しかる後、絶縁基体1の上面に蓋体5を樹脂等から
成る封止材を介して接合させ、絶縁基体1と蓋体5とか
ら成る容器内部に半導体素子3を気密に収容することに
よって製品としての半導体装置が完成する。
Thus, according to the above-described wiring board, the semiconductor element 3 is bonded and fixed to the bottom surface of the concave portion 1d of the insulating base 1 with an adhesive such as a resin, and the respective electrodes of the semiconductor element 3 are wired via the bonding wires 4. After being electrically connected to the conductor 2, the lid 5 is bonded to the upper surface of the insulating base 1 via a sealing material made of resin or the like, and the semiconductor element is placed inside the container formed of the insulating base 1 and the lid 5. The semiconductor device as a product is completed by housing 3 in an airtight manner.

【0020】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図2に基づき説明
する。
Next, a method of manufacturing a wiring board used in the package for housing a semiconductor element will be described with reference to FIG.

【0021】まず図2(a)に示すように3枚の前駆体
シート11a、11b、11cを準備する。
First, as shown in FIG. 2A, three precursor sheets 11a, 11b and 11c are prepared.

【0022】前記3枚の前駆体シート11a、11b、
11cは無機絶縁物粉末を熱硬化性樹脂前駆体で結合す
ることによって形成されており、例えば粒径が0.1〜
100μmの酸化珪素粉末に、ビスフェノールA型エポ
キシ樹脂、ノボラック型エポキシ樹脂、グリシジルエス
テル型エポキシ樹脂等のエポキシ樹脂及びアミン系硬化
剤、イミダゾール系硬化剤、酸無水物系硬化剤等の硬化
剤を添加混合してペースト状となし、しかる後、このペ
ーストをシート状になすとともに約25〜100℃の温
度で1〜60分間加熱し、半硬化させることによって製
作される。
The three precursor sheets 11a, 11b,
11c is formed by bonding an inorganic insulating powder with a thermosetting resin precursor, for example, having a particle size of 0.1 to
Epoxy resin such as bisphenol A type epoxy resin, novolak type epoxy resin, glycidyl ester type epoxy resin, etc. and curing agent such as amine type curing agent, imidazole type curing agent, acid anhydride type curing agent are added to 100 μm silicon oxide powder. The paste is mixed to form a paste. Thereafter, the paste is formed into a sheet and heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to be semi-cured.

【0023】次に図2(b)に示すように前記3枚の前
駆体シート11a、11b、11cのうち2枚の前駆体
シート11a、11bに半導体素子3を収容する凹部1
dとなる開口A、A’を、2枚の前駆体シート11b、
11cに配線導体2を引き回すための貫通孔B、B’を
各々形成する。
Next, as shown in FIG. 2 (b), two of the three precursor sheets 11a, 11b, 11c have the recess 1 for accommodating the semiconductor element 3 in the two precursor sheets 11a, 11b.
The openings A and A ′ serving as d are formed by two precursor sheets 11b,
11c, through holes B and B 'for routing the wiring conductor 2 are respectively formed.

【0024】前記開口A、A’及び貫通孔B、B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。
The openings A, A 'and the through holes B, B' are formed by subjecting the precursor sheets 11a, 11b, 11c to a conventionally well-known punching method to form the precursor sheets 11a, 11b, 11c.
c is formed by piercing a hole of a predetermined shape in each of c.

【0025】次に図2(c)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法により所定パターンに印刷塗布するとともに
これを約25〜100℃の温度で1〜60分間加熱し半
硬化させることによって製作される。
Next, as shown in FIG. 2C, a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B 'by a conventionally known screen printing method. It is manufactured by printing and applying a predetermined pattern and heating it at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to make it semi-cured.

【0026】前記金属ペースト12としては例えば、平
均粒径が0.1μm〜50μm程度の鉛ー錫の共晶半田
から成る低融点金属粉末に、ビスフェノールA型エポキ
シ樹脂と酸無水物系硬化剤とから成る熱硬化性樹脂前駆
体を添加混合させてペースト状となしたものが使用され
る。
As the metal paste 12, for example, a low melting point metal powder made of a eutectic solder of lead-tin having an average particle size of about 0.1 μm to 50 μm, a bisphenol A type epoxy resin and an acid anhydride hardener are used. A paste obtained by adding and mixing a thermosetting resin precursor consisting of

【0027】尚、前記金属ペースト12に含有される低
融点金属粉末はその平均粒径が0.1μm未満となると
低融点金属粉末が凝集して均一な分散が得られなくな
り、また50μmを越えると配線導体2の幅を一般的に
要求される50μm〜200μmの範囲とするのが困難
になる傾向にある。従って、前記金属ペースト12に含
有される低融点金属粉末はその平均粒径を0.1μm乃
至50μmの範囲としておくことが好ましい。
When the average particle diameter of the low melting point metal powder contained in the metal paste 12 is less than 0.1 μm, the low melting point metal powder is agglomerated and cannot be uniformly dispersed. It tends to be difficult to set the width of the wiring conductor 2 to a generally required range of 50 μm to 200 μm. Therefore, it is preferable that the low melting point metal powder contained in the metal paste 12 has an average particle diameter in a range of 0.1 μm to 50 μm.

【0028】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層するとともにこれを約
300℃の温度で約10秒〜24時間加熱し、前記金属
ペースト12中の低融点金属粉末を相互に接合させつつ
前駆体シート11a、11b、11cの熱硬化性樹脂前
駆体と、前駆体シート11b、11cに所定パターンに
印刷塗布された金属ペースト12の熱硬化性樹脂前駆体
とを完全に熱硬化させることによって図1に示すような
絶縁基体1に配線導体2を被着させた半導体素子収納用
パッケージに使用される配線基板が完成する。この場
合、金属ペースト12のビスフェノールA型エポキシ樹
脂と酸無水物系硬化剤とから成る熱硬化性樹脂前駆体は
熱硬化が緩やかで、且つ金属粉末間の溶融接合を促進す
るフラックスとしての効果を有することから低融点金属
粉末の相互接合が完全となり、その結果、配線導体2の
電気抵抗を低抵抗となすことができる。また同時に前記
前駆体シート11a、11b、11c及び金属ペースト
12は熱硬化時に収縮することは殆どなく、従って、得
られる配線基板に変形や寸法にバラツキが発生せず、配
線導体2に断線が招来するこはなく、配線導体2を介し
て半導体素子3等の電極を外部電気回路に確実に電気的
接続することが可能となる。
Finally, the three precursor sheets 11
a, 11b, and 11c are stacked one on top of the other and heated at a temperature of about 300 ° C. for about 10 seconds to 24 hours to bond the low melting point metal powders in the metal paste 12 to each other while precursor sheets 11a and 11b are bonded together. , 11c, and the thermosetting resin precursor of the metal paste 12 printed and applied in a predetermined pattern on the precursor sheets 11b, 11c as shown in FIG. A wiring substrate used for a semiconductor element storage package in which a wiring conductor 2 is attached to an insulating base 1 is completed. In this case, the thermosetting resin precursor composed of the bisphenol A-type epoxy resin and the acid anhydride-based curing agent of the metal paste 12 has an effect as a flux that slowly cures heat and promotes fusion bonding between metal powders. Due to this, the mutual joining of the low melting point metal powders is completed, and as a result, the electric resistance of the wiring conductor 2 can be reduced. At the same time, the precursor sheets 11a, 11b, 11c and the metal paste 12 hardly shrink during thermosetting, so that the resulting wiring board is not deformed or varied in size, and the wiring conductor 2 is disconnected. Without this, the electrodes of the semiconductor element 3 and the like can be reliably electrically connected to the external electric circuit via the wiring conductor 2.

【0029】尚、本発明は上述の実施例に限定されるも
のではなく、本発明の要旨を逸脱しない範囲であれば種
々の変更は可能であり、例えば上述の実施例では本発明
の配線基板を半導体素子を収容する半導体素子収納用パ
ッケージに適用した場合を例に採って説明したが、これ
を混成集積回路基板に適用してもよい。
It should be noted that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the gist of the present invention. Has been described as an example in which the present invention is applied to a semiconductor element housing package for housing a semiconductor element, but this may be applied to a hybrid integrated circuit board.

【0030】また上述の実施例では3枚の前駆体シート
を積層することによって配線基板を製作したが、1枚や
2枚、あるいは4枚以上の前駆体シートを使用して配線
基板を製作してもよい。
In the above-described embodiment, a wiring board is manufactured by laminating three precursor sheets. However, a wiring board is manufactured using one, two, or four or more precursor sheets. You may.

【0031】[0031]

【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作自動ラインの一部とが激
しく衝突しても絶縁基体に欠けや割れ、クラック等が発
生することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device are manufactured. Even if a part of the automatic line collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0032】また本発明の配線基板によればビスフェノ
ールA型エポキシ樹脂と酸無水物系硬化剤とから成る熱
硬化性樹脂前駆体に融点が250℃以下の金属粉末を添
加混合して成る金属ペーストを熱処理して配線導体とな
す際、ビスフェノールA型エポキシ樹脂と酸無水物系硬
化剤とから成る熱硬化性樹脂前駆体は熱硬化が緩やか
で、且つ金属粉末間の溶融接合を促進するフラックスと
しての効果を有することから金属粉末の相互接合が完全
となり、その結果、配線導体の電気抵抗を低抵抗となす
ことができる。
According to the wiring board of the present invention, a metal paste obtained by adding a metal powder having a melting point of 250 ° C. or less to a thermosetting resin precursor composed of a bisphenol A type epoxy resin and an acid anhydride-based curing agent is mixed. When heat-treated to form a wiring conductor, the thermosetting resin precursor composed of bisphenol A type epoxy resin and acid anhydride-based curing agent has a slow thermosetting and promotes fusion bonding between metal powders. With this effect, the mutual joining of the metal powders is completed, and as a result, the electrical resistance of the wiring conductor can be reduced.

【0033】更に本発明の配線基板は熱硬化性樹脂前駆
体と無機絶縁物粉末とを混合して成る前駆体シートを準
備する工程と、前記前駆体シートにビスフェノールA型
エポキシ樹脂と酸無水物系硬化剤とから成る熱硬化性樹
脂前駆体に融点が250℃以下の金属粉末を添加混合し
て成る金属ペーストを所定パターンに印刷する工程と、
前記前駆体シート及び金属ペーストを加熱し、金属ペー
スト中の金属粉末を相互に接合させつつ前記前駆体シー
トの熱硬化性樹脂前駆体及び金属ペーストの硬化性樹脂
前駆体を熱硬化させる工程とにより配線基板を製作する
ことから焼成に伴う不均一な収縮による変形や寸法のば
らつきが発生することはない。
Further, the wiring board of the present invention comprises a step of preparing a precursor sheet comprising a mixture of a thermosetting resin precursor and an inorganic insulating powder; and a step of forming a bisphenol A type epoxy resin and an acid anhydride on the precursor sheet. A step of printing a metal paste formed by adding and mixing a metal powder having a melting point of 250 ° C. or less to a thermosetting resin precursor composed of a system curing agent and a predetermined pattern,
Heating the precursor sheet and the metal paste, and thermally curing the thermosetting resin precursor of the precursor sheet and the curable resin precursor of the metal paste while bonding the metal powder in the metal paste to each other. Since the wiring substrate is manufactured, deformation and dimensional variation due to uneven shrinkage due to firing do not occur.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a cross-sectional view showing one embodiment in which a wiring board of the present invention is applied to a package for housing a semiconductor element.

【図2】(a)乃至(c)は本発明の配線基板の製造方
法を説明するための各工程毎の断面図である。
FIGS. 2A to 2C are cross-sectional views for explaining steps of a method for manufacturing a wiring board according to the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・・・・・・・・絶縁基体 1a、1b、1c・・・・・・絶縁基板 2・・・・・・・・・・・・・配線導体 11a、11b、11c・・・前駆体シート 12・・・・・・・・・・・・金属ペースト ... Insulating base 1a, 1b, 1c Insulating substrate 2 Wiring conductors 11a, 11b, 11c ... Precursor sheet 12 ... Metal paste

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H05K 1/09 H01L 23/14 H05K 1/03 610 H05K 3/00 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) H05K 1/09 H01L 23/14 H05K 1/03 610 H05K 3/00

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】60重量%乃至95重量%の無機絶縁物粉
末と5重量%乃至40重量%の熱硬化性樹脂とから成
り、前記無機絶縁物粉末を前記熱硬化性樹脂の前駆体で
結合して成る前駆体シートを半硬化させてその複数枚を
積層して熱硬化させた、前記無機絶縁物粉末を前記熱硬
化性樹脂により結合した複数枚の絶縁基板を積層して
る絶縁基体の前記絶縁基板に、ビスフェノールA型エポ
キシ樹脂と酸無水物系硬化剤とから成る熱硬化性樹脂前
駆体を熱硬化させて形成される樹脂体中に融点が250
℃以下の金属粉末が相互に接合されて形成される金属部
材を含有させて成る配線導体を被着させた配線基板。
1. An inorganic insulating powder comprising 60% to 95% by weight of an inorganic insulating powder and 5% to 40% by weight of a thermosetting resin, wherein the inorganic insulating powder is a precursor of the thermosetting resin.
Semi-cured precursor sheets are combined and multiple
Laminated to thermally cured, the insulating substrate of the inorganic insulator powder by stacking a plurality of insulating substrates joined by the thermosetting resin formed <br/> Ru insulating base, a bisphenol A type epoxy resin And a melting point of 250 in a resin body formed by thermosetting a thermosetting resin precursor composed of
A wiring board on which a wiring conductor including a metal member formed by bonding metal powders at a temperature of not more than ° C to each other is adhered.
【請求項2】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合して成る前駆体シートを準備する工程と、前記前駆
体シートにビスフェノールA型エポキシ樹脂と酸無水物
系硬化剤とから成る熱硬化性樹脂前駆体に融点が250
℃以下の金属粉末を添加混合して成る金属ペーストを所
定パターンに印刷する工程と、前記前駆体シート及び金
属ペーストを加熱し、金属ペースト中の金属粉末を相互
に接合させつつ前記前駆体シートの熱硬化性樹脂前駆体
及び金属ペーストの硬化性樹脂前駆体を熱硬化させる工
程と、から成ることを特徴とする配線基板の製造方法。
2. A step of preparing a precursor sheet comprising a mixture of a thermosetting resin precursor and an inorganic insulating powder, wherein the precursor sheet comprises a bisphenol A type epoxy resin and an acid anhydride curing agent. Melting point of the thermosetting resin precursor
Printing a metal paste formed by adding and mixing a metal powder at a temperature of not more than 0 ° C. or less, heating the precursor sheet and the metal paste, and bonding the metal powder in the metal paste to each other while bonding the metal powder in the metal paste. A step of thermally curing the thermosetting resin precursor and the curable resin precursor of the metal paste.
JP24447095A 1995-09-22 1995-09-22 Wiring board and manufacturing method thereof Expired - Fee Related JP3145620B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP24447095A JP3145620B2 (en) 1995-09-22 1995-09-22 Wiring board and manufacturing method thereof
US08/717,119 US5837356A (en) 1995-09-22 1996-09-20 Wiring board and method for manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24447095A JP3145620B2 (en) 1995-09-22 1995-09-22 Wiring board and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPH0992948A JPH0992948A (en) 1997-04-04
JP3145620B2 true JP3145620B2 (en) 2001-03-12

Family

ID=17119140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24447095A Expired - Fee Related JP3145620B2 (en) 1995-09-22 1995-09-22 Wiring board and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JP3145620B2 (en)

Also Published As

Publication number Publication date
JPH0992948A (en) 1997-04-04

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