JP3301908B2 - Wiring board and method of manufacturing the same - Google Patents
Wiring board and method of manufacturing the sameInfo
- Publication number
- JP3301908B2 JP3301908B2 JP03608196A JP3608196A JP3301908B2 JP 3301908 B2 JP3301908 B2 JP 3301908B2 JP 03608196 A JP03608196 A JP 03608196A JP 3608196 A JP3608196 A JP 3608196A JP 3301908 B2 JP3301908 B2 JP 3301908B2
- Authority
- JP
- Japan
- Prior art keywords
- metal
- precursor
- tin
- thermosetting resin
- powder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/682—Shapes or dispositions thereof comprising holes having chips therein
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Parts Printed On Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体素子を収容
するための半導体素子収納用パッケージや混成集積回路
基板等に用いられる配線基板に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board used for a package for housing a semiconductor element for housing a semiconductor element or a hybrid integrated circuit board.
【0002】[0002]
【従来技術】従来、配線基板、例えば半導体素子を収容
する半導体素子収納用パッケージに使用される配線基板
は、酸化アルミニウム質焼結体等のセラミックスより成
り、その上面中央部に半導体素子を収容するための凹部
を有する絶縁基体と、前記絶縁基体の凹部周辺から下面
にかけて導出されたタングステン、モリブデン等の高融
点金属粉末から成る配線導体とから構成されており、前
記絶縁基体の凹部底面に半導体素子をガラス、樹脂、ロ
ウ材等の接着剤を介して接着固定するとともに該半導体
素子の各電極を例えばボンディングワイヤ等の電気的接
続手段を介して配線導体に電気的に接続し、しかる後、
前記絶縁基体の上面に、金属やセラミックス等から成る
蓋体を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、
ロウ材等の封止材を介して接合させ、絶縁基体の凹部内
に半導体素子を気密に収容することによって製品として
の半導体装置となり、配線導体で絶縁基体下面に導出し
た部位を外部の電気回路基板の配線導体に半田等の電気
的接続手段を介して接続することにより収容する半導体
素子が外部電気回路基板に電気的に接続されることとな
る。2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element is made of ceramics such as an aluminum oxide sintered body, and the semiconductor element is housed in the center of the upper surface thereof. And a wiring conductor made of a refractory metal powder such as tungsten or molybdenum which is led out from the periphery to the lower surface of the concave portion of the insulating substrate, and a semiconductor element is formed on the bottom surface of the concave portion of the insulating substrate. Glass, resin, adhesively fixed via an adhesive such as a brazing material, and electrically connecting each electrode of the semiconductor element to a wiring conductor through an electrical connection means such as a bonding wire, and thereafter,
On the upper surface of the insulating substrate, a cover made of a metal, ceramics, or the like, so as to cover a concave portion of the insulating substrate, glass, resin,
A semiconductor device as a product is obtained by joining the semiconductor element in a concave portion of the insulating base in an airtight manner by joining through a sealing material such as a brazing material. The semiconductor element to be accommodated is electrically connected to the external electric circuit board by connecting to the wiring conductor of the board via an electrical connection means such as solder.
【0003】尚、この従来の配線基板は一般に、セラミ
ックグリーンシート積層法によって製作されており、具
体的には、酸化アルミニウム、酸化珪素、酸化マグネシ
ウム、酸化カルシウム等のセラミック原料粉末に適当な
有機バインダー、溶剤等を添加混合して泥漿状となすと
ともにこれを従来周知のドクターブレード法を採用して
シート状とすることによって複数のセラミックグリーン
シートを得、しかる後、前記セラミックグリーンシート
に適当な打ち抜き加工を施すとともに配線導体となる金
属ペーストを所定パターンに印刷塗布し、最後に前記セ
ラミックグリーンシートを所定の順に上下に積層して生
セラミック成形体となすとともに該生セラミック成形体
を還元雰囲気中約1600℃の高温で焼成することによ
って製作される。Incidentally, this conventional wiring board is generally manufactured by a ceramic green sheet laminating method, and specifically, an organic binder suitable for a ceramic raw material powder such as aluminum oxide, silicon oxide, magnesium oxide and calcium oxide. , A solvent and the like are added and mixed to form a slurry, and this is formed into a sheet by employing a conventionally known doctor blade method to obtain a plurality of ceramic green sheets. After processing, a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally, the ceramic green sheets are stacked up and down in a predetermined order to form a green ceramic molded body. It is manufactured by firing at a high temperature of 1600 ° C.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、この従
来の配線基板は、絶縁基体を構成する酸化アルミニウム
質焼結体等のセラミックスが硬くて脆い性質を有するた
め、搬送工程や半導体装置製作の自動ライン等において
配線基板同士が、あるいは配線基板と半導体装置製作自
動ラインの一部とが激しく衝突すると絶縁基体に欠けや
割れ、クラック等が発生し、その結果、半導体素子を気
密に収容することができず、半導体素子を長期間にわた
り正常、且つ安定に作動させることができなくなるとい
う欠点を有していた。However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body constituting the insulating base have a hard and brittle property, the automatic wiring of the transfer process and the semiconductor device manufacturing is difficult. When the wiring boards collide with each other or the wiring board and a part of the semiconductor device manufacturing automatic line violently collide with each other, chips, cracks, cracks, etc. occur in the insulating base, and as a result, the semiconductor element can be housed in an airtight manner. In addition, the semiconductor device cannot operate normally and stably for a long period of time.
【0005】また、前記配線基板の製造方法によれば、
生セラミック成形体を焼成する際、各セラミックグリー
ンシートにおけるセラミック原料粉末の密度のばらつき
に起因して生セラミック成形体に不均一な焼成収縮が発
生し、得られる配線基板に反り等の変形や寸法のばらつ
きが発生し、その結果、半導体素子と配線導体とを電気
的に正確、且つ確実に接続することが困難となるととも
に変形や寸法のばらつきが大きいと配線導体に断線が招
来してしまうという欠点を有していた。According to the method of manufacturing a wiring board,
When firing the green ceramic molded body, unevenness in firing shrinkage occurs in the green ceramic molded body due to variations in the density of the ceramic raw material powder in each ceramic green sheet, and the resulting wiring board has deformation and dimensions such as warpage. As a result, it is difficult to electrically and accurately connect the semiconductor element and the wiring conductor, and if the deformation or the dimensional variation is large, the wiring conductor will be disconnected. Had disadvantages.
【0006】[0006]
【課題を解決するための手段】本発明の配線基板は、6
0乃至95重量%の無機絶縁物粉末と5乃至40重量%
の熱硬化性樹脂とからなり、前記無機絶縁物粉末を前記
熱硬化性樹脂の前駆体で結合して成る前駆体シートを半
硬化させてその複数枚を積層して熱硬化させた、前記無
機絶縁物粉末を前記熱硬化性樹脂により結合した複数枚
の絶縁基板を積層して成る絶縁基体の前記絶縁基板に、
金属粉末を錫−インジウム合金、錫−ビスマス合金、錫
−亜鉛合金の少なくとも1種から成る接合金属で接合さ
せた金属部材と熱硬化性樹脂とからなる配線導体を被着
させたことを特徴とするものである。According to the present invention, there is provided a wiring board comprising:
0 to 95% by weight of inorganic insulating powder and 5 to 40% by weight
Consisting of a thermosetting resin, wherein the inorganic insulating powder is
Precursor sheet composed of thermosetting resin precursor
Thereof a plurality are stacked and thermally cured by curing, plural linked by the thermosetting resin the inorganic insulator powder
The insulating substrate of the insulating substrate formed by laminating the insulating substrates of
Metal powder is tin - indium alloy, tin - bismuth alloy, tin
- it is characterized in that is applied at least wiring conductor made of a metal member and a thermosetting resin which is bonded with the bonding metal consisting of one zinc alloys.
【0007】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合して成る前駆
体シートを準備する工程と、該前駆体シートを加熱して
半硬化させる工程と、半硬化した前記前駆体シートに、
熱硬化性樹脂前駆体と金属粉末と錫−インジウム合金、
錫−ビスマス合金、錫−亜鉛合金の少なくとも1種から
成る接合金属粉末とを混合して成る金属ペーストを所定
パターンに印刷するとともに加熱して半硬化させる工程
と、半硬化した前記金属ペーストが被着された半硬化の
前記前駆体シートを複数枚上下に積層するとともにこれ
を加熱処理し、前記金属粉末同士を前記接合金属で接合
させて金属部材を形成するとともに前記前駆体シート及
び前記金属ペーストの熱硬化性樹脂前駆体を熱硬化させ
て一体化させる工程、とから成ることを特徴とするもの
である。Further, according to the method for producing a wiring board of the present invention, there is provided a step of preparing a precursor sheet comprising a mixture of a thermosetting resin precursor and an inorganic insulating powder, and heating the precursor sheet.
A step of semi-curing, the semi-cured precursor sheet,
Thermosetting resin precursor, metal powder and tin - indium alloy,
Tin - bismuth alloy, tin - a step of semi-curing by heating with printing a bonding metal powder and a mixture thereof comprising a metal paste comprising at least one zinc alloy in a predetermined pattern, a semi-cured the metal paste to be Dressed semi-cured
The precursor sheet was heated to this <br/> with stacked multiple sheets vertically, of the precursor sheet, and the metal paste together with the metal powder particles are bonded by the bonding metal to form a metal member by heat A step of thermally curing the curable resin precursor to integrate it.
【0008】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作自動ラインの一部とが激し
く衝突しても絶縁基体に欠けや割れ、クラック等が発生
することはない。According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device manufacturing automatic line. Even if a portion of the insulating base material collides violently, the insulating substrate will not be chipped, cracked or cracked.
【0009】また、本発明の配線基板によれば、配線導
体の金属部材が金属粉末を錫−インジウム合金、錫−ビ
スマス合金、錫−亜鉛合金の少なくとも1種から成る接
合金属で接合することによって形成されていることか
ら、金属粉末間の電気的接続が接合金属によって確実と
なり、その結果、配線導体の電気抵抗を低抵抗となすこ
とができる。[0009] According to the wiring board of the present invention, the metal member of the wiring conductor is a metal powder of tin - by bonding the bonding metal consisting of at least one zinc alloy - indium alloy, tin - bismuth alloy, tin or that are formed
In addition, the electrical connection between the metal powders is ensured by the joining metal, and as a result, the electrical resistance of the wiring conductor can be reduced.
【0010】更に、本発明の配線基板の製造方法によれ
ば、配線基板は、熱硬化性樹脂前駆体と無機絶縁物粉末
とを混合して成る前駆体シートを準備する工程と、該前
駆体シートを加熱して半硬化させる工程と、半硬化した
前記前駆体シートに、熱硬化性樹脂前駆体と金属粉末と
錫−インジウム合金、錫−ビスマス合金、錫−亜鉛合金
の少なくとも1種から成る接合金属粉末とを混合して成
る金属ペーストを所定パターンに印刷するとともに加熱
して半硬化させる工程と、半硬化した前記金属ペースト
が被着された半硬化の前記前駆体シートを複数枚上下に
積層するとともにこれを加熱処理し、前記金属粉末同士
を前記接合金属で接合させて金属部材を形成するととも
に前記前駆体シート及び前記金属ペーストの熱硬化性樹
脂前駆体を熱硬化させて一体化させる工程とで製作さ
れ、前駆体シート及び金属ペーストの熱硬化性樹脂前駆
体は熱硬化時に殆ど収縮しないことから不均一な収縮に
よる変形や寸法のばらつきが発生することもない。Further, according to the method for manufacturing a wiring board of the present invention,
In the wiring board includes the steps of preparing a precursor sheet formed by mixing a thermosetting resin precursor and the inorganic insulating powder, front
Heating the precursor sheet to semi-curing; and forming the semi-cured precursor sheet into a thermosetting resin precursor, a metal powder, a tin - indium alloy, a tin - bismuth alloy, and a tin - zinc alloy. heating with printing a metal paste formed by mixing a bonding metal powder consisting of at least one a predetermined pattern of
A step of semi-curing by a semi-cured the metal paste
A plurality of semi-cured precursor sheets to which is applied
This was heated with laminating, to integrate thermosetting resin precursor of the precursor sheet, and the metal paste with said metal powder particles are bonded by the bonding metal to form a metal member by thermally curing Since the precursor sheet and the thermosetting resin precursor of the metal paste hardly shrink at the time of thermosetting, there is no deformation or dimensional variation due to uneven shrinkage.
【0011】尚、前記金属ペースト中に含有されている
錫−インジウム合金、錫−ビスマス合金、錫−亜鉛合金
の少なくとも1種から成る接合金属はその融点が熱硬化
性樹脂の熱分解する温度より低い約250℃程度である
ため、金属ペーストが所定パターンに印刷された前駆体
シートを熱処理して配線基板となす際、前駆体シート及
び金属ペーストの熱硬化性樹脂に熱分解を発生させるこ
となく接合金属を溶融させて金属粉末同士を確実に接合
させることができる。[0011] Incidentally, the tin is contained in the metal paste - indium alloy, tin - bismuth alloy, tin - bonding metal consisting of at least one zinc alloy whose melting point than the thermal decomposition temperature of the thermosetting resin Because of the low temperature of about 250 ° C., when the metal paste is heat-treated on the precursor sheet printed in a predetermined pattern to form a wiring board, the precursor sheet and the thermosetting resin of the metal paste do not undergo thermal decomposition. The metal powder can be reliably bonded by melting the bonding metal.
【0012】[0012]
【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。Next, the present invention will be described in detail with reference to the accompanying drawings.
【0013】図1は、本発明の配線基板を半導体素子を
収容する半導体素子収納用パッケージに適用した場合の
一実施例を示し、1は絶縁基体、2は配線導体である。FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a package for housing a semiconductor element for housing a semiconductor element, wherein 1 is an insulating base, and 2 is a wiring conductor.
【0014】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
剤を介して接着固定される。The insulating substrate 1 comprises three insulating substrates 1a, 1
The semiconductor element 3 is formed by laminating b and 1c, and has a concave portion 1d for accommodating a semiconductor element in the center of the upper surface thereof. Adhesively fixed.
【0015】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは、例えば酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム、
ゼオライト等の無機絶縁物粉末をエポキシ樹脂、ポリイ
ミド樹脂等の熱硬化樹脂で結合することによって形成さ
れており、絶縁基体1を構成する3枚の絶縁基板1a、
1b、1cはその各々が無機絶縁物粉末を靱性に優れる
熱硬化性樹脂で結合することによって形成されているこ
とから絶縁基体1に外力が印加されても、該外力によっ
て絶縁基体1に欠けや割れ、クラック等が発生すること
はない。The three insulating substrates 1a, 1b and 1c constituting the insulating base 1 are made of, for example, silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate,
It is formed by bonding an inorganic insulating powder such as zeolite with a thermosetting resin such as an epoxy resin or a polyimide resin, and includes three insulating substrates 1a constituting the insulating base 1,
1b and 1c are each formed by bonding an inorganic insulating powder with a thermosetting resin having excellent toughness, so that even if an external force is applied to the insulating base 1, the insulating base 1 may be chipped by the external force. There are no cracks or cracks.
【0016】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨脹係数が半導体素子3の
熱膨脹係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に両者の熱膨脹係数の相違に起因
する大きな熱応力が発生し、この大きな熱応力によって
半導体素子3が絶縁基体1より剥離したり、半導体素子
3に割れや欠け等が発生してしまう。また95重量%を
超えると無機絶縁物粉末を熱硬化性樹脂で完全に結合さ
せることができず、所定の絶縁基板1a、1b、1cを
得ることができなくなる。従って、前記絶縁基体1を構
成する絶縁基板1a、1b、1cはその各々の内部に含
有される無機絶縁物粉末の量が60重量%乃至95重量
%の範囲に特定される。Incidentally, three insulating substrates 1 constituting an insulating base 1 formed by bonding the inorganic insulating powder with a thermosetting resin.
a, 1b, and 1c each have a content of the inorganic insulating powder of 60% by weight.
If it is less than 1, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, and the semiconductor element 3 generates heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. A large thermal stress is generated between the semiconductor element 3 and the semiconductor element 3 due to a difference in thermal expansion coefficient between the semiconductor element 3 and the large thermal stress, and the semiconductor element 3 is separated from the insulating base 1 or the semiconductor element 3 is cracked or chipped. . 95% by weight
Ultra El and the inorganic insulating powder can not be completely bound with a thermosetting resin, it becomes impossible to obtain a predetermined insulating substrate 1a, 1b, and 1c. Accordingly, the amount of the inorganic insulating powder contained in each of the insulating substrates 1a, 1b, and 1c constituting the insulating base 1 is specified in the range of 60% by weight to 95% by weight.
【0017】また前記絶縁基体1はその凹部1dの周辺
から下面にかけて配線導体2が被着形成されており、該
配線導体2は銅、銀等の金属粉末を錫−インジウム合
金、錫−ビスマス合金、錫−亜鉛合金の少なくとも1種
から成る接合金属で接合させた金属部材とエポキシ樹
脂、ポリイミド樹脂等の熱硬化性樹脂とから形成されて
おり、金属部材を熱硬化性樹脂で絶縁基体1に被着する
ことによって絶縁基体1に一体的に被着されている。A wiring conductor 2 is formed on the insulating substrate 1 from the periphery of the concave portion 1d to the lower surface. The wiring conductor 2 is made of a metal powder such as copper or silver by using a tin - indium alloy or a tin - bismuth alloy. , A metal member joined with a joining metal made of at least one of tin - zinc alloy and a thermosetting resin such as an epoxy resin or a polyimide resin, and the metal member is formed on the insulating base 1 with the thermosetting resin. By being attached, it is integrally attached to the insulating base 1.
【0018】前記配線導体2は、内部に収容する半導体
素子3を外部電気回路に電気的に接続する作用を為し、
凹部1d周辺部位には半導体素子3の各電極がボンディ
ングワイヤ4を介して電気的に接続され、また絶縁基体
1の下面に導出する部位には外部電気回路基板に電気的
に接続される。The wiring conductor 2 functions to electrically connect the semiconductor element 3 housed therein to an external electric circuit,
Each electrode of the semiconductor element 3 is electrically connected to the peripheral portion of the concave portion 1d via the bonding wire 4, and the portion extending to the lower surface of the insulating base 1 is electrically connected to an external electric circuit board.
【0019】更に、前記配線導体2はそれを構成する金
属部材が銅、銀等の金属粉末を錫−インジウム合金、錫
−ビスマス合金、錫−亜鉛合金の少なくとも1種から成
る接合金属で接合されて形成されているため金属粉末間
の電気的接続が接合金属で確実となり配線導体2の電気
抵抗を低抵抗となすことができる。Furthermore, the wiring conductor 2 is a metal member constituting the copper, the metal powder such as silver-tin - indium alloy, tin
- bismuth alloy, tin - zinc alloy of at least between the metal powder because it is formed are bonded by the bonding metal consisting of one electrical connection and a low-resistance reliable and makes electrical resistance of the wiring conductor 2 by bonding metal Nasukoto Can be.
【0020】尚、前記金属粉末と接合金属と熱硬化性樹
脂とから成る配線導体2は金属粉末と接合金属の合計重
量が配線導体2の全重量に対し70重量%未満となると
金属粉末間の接合金属を介しての接合が不完全となる傾
向にあり、また95重量%を超えると熱硬化性樹脂で配
線導体2を絶縁基体1に強固に被着させるのが困難とな
るとともに配線導体2が脆弱となる傾向にある。従っ
て、前記配線導体2に含有される金属粉末と接合金属は
その合計重量が配線導体2の全重量に対し70重量%乃
至95重量%の範囲としておくことが好ましい。When the total weight of the metal powder and the joining metal is less than 70% by weight with respect to the total weight of the wiring conductor 2, the wiring conductor 2 made of the metal powder, the joining metal and the thermosetting resin is less than the metal powder. with wiring conductors bonded via the bonding metal is tend to be incomplete, the addition wiring conductors 2 of 95% by weight is exceeded and the thermosetting resin becomes difficult to firmly adhered to the insulating base 1 2 tends to be brittle. Therefore, it is preferable that the total weight of the metal powder and the bonding metal contained in the wiring conductor 2 is in the range of 70% by weight to 95% by weight based on the total weight of the wiring conductor 2.
【0021】また前記配線導体2に含有される金属粉末
と接合金属は、金属粉末の量が該金属粉末と接合金属の
合計重量に対し20重量%未満となると金属粉末に対し
て接合金属が多くなり、接合金属同士が溶融し合って金
属粉末を取り込んだ一体化が困難になるとともに配線導
体2の電気抵抗が高くなる傾向にあり、また80重量%
を超えると金属粉末を接合させる接合金属の量が相対的
に少なくなり、金属粉末を良好に接合させることができ
ず配線導体2の電気抵抗が高くなってしまう傾向にあ
る。従って、前記配線導体2に含有される金属粉末は該
金属粉末と接合金属の合計重量に対し20重量%乃至8
0重量%の範囲としておくことが好ましい。When the amount of the metal powder and the joining metal contained in the wiring conductor 2 is less than 20% by weight based on the total weight of the metal powder and the joining metal, the amount of the joining metal is large relative to the metal powder. In this case, the joining metals are fused with each other to make it difficult to integrate the metal powders, and the electrical resistance of the wiring conductor 2 tends to increase.
The amount of bonding metal that joins is exceeded and the metal powder becomes relatively small, there is a tendency that the electric resistance of the wiring conductor 2 can not be satisfactorily bonded to the metal powder is increased. Accordingly, the metal powder contained in the wiring conductor 2 is 20% by weight to 8% by weight based on the total weight of the metal powder and the joining metal.
It is preferable to set the range to 0% by weight.
【0022】更に前記配線導体2に含有される金属粉末
と錫−インジウム合金、錫−ビスマス合金、錫−亜鉛合
金の少なくとも1種から成る接合金属はその平均粒径が
0.1μm未満となると金属粉末及び接合金属が凝集し
て均一な分散が得られなくなり、また50μmを超える
と配線導体2の幅を一般的に要求される50μm〜20
0μmの範囲に印刷形成するのが困難となる。従って、
前記配線導体2に含有される金属粉末と接合金属はその
平均粒径を0.1μm乃至50μmの範囲とすることが
好ましい。The metal powder contained further to the wiring conductor 2 and tin - indium alloy, tin - bismuth alloy, tin - bonding metal consisting of at least one zinc alloy metal when the average particle diameter is less than 0.1μm powder and bonding metal are agglomerated uniform dispersion can not be obtained, also commonly require Exceeding the width of the wiring conductor 2 50 [mu] m 50Myuemu~20
It becomes difficult to print and form in the range of 0 μm. Therefore,
The metal powder and bonding metal contained in the wiring conductor 2 and the average particle diameter you to a range of 0.1μm to 50μm preferred.
【0023】かくして上述の配線基板によれば、絶縁基
体1の凹部1d底面に半導体素子3を接着固定するとと
もに半導体素子3の各電極をボンディングワイヤ4を介
して配線導体2に電気的に接続し、最後に前記絶縁基体
1の上面に蓋体5を封止材を介して接合させ、絶縁基体
1と蓋体5とから成る容器内部に半導体素子3を気密に
収容することによって製品としての半導体装置となる。Thus, according to the above-described wiring board, the semiconductor element 3 is bonded and fixed to the bottom surface of the concave portion 1 d of the insulating base 1, and each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 via the bonding wire 4. Finally, a lid 5 is bonded to the upper surface of the insulating base 1 via a sealing material, and the semiconductor element 3 is hermetically accommodated in a container including the insulating base 1 and the lid 5 to thereby provide a semiconductor product. Device.
【0024】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図2に基づき説明
する。Next, a method of manufacturing a wiring board used in the package for housing a semiconductor element will be described with reference to FIG.
【0025】まず図2(a)に示すように3枚の前駆体
シート11a、11b、11cを準備する。First, as shown in FIG. 2A, three precursor sheets 11a, 11b and 11c are prepared.
【0026】前記3枚の前駆体シート11a、11b、
11cは酸化珪素、酸化アルミニウム、窒化アルミニウ
ム、炭化珪素、チタン酸バリウム、チタン酸ストロンチ
ウム、酸化チタン等の無機絶縁物粉末をエポキシ樹脂、
ポリイミド樹脂、ポリフェニレンエーテル樹脂等の熱硬
化性樹脂前駆体で結合することによって形成されてお
り、例えば粒径が0.1〜100μmの酸化珪素粉末
に、ビスフェールA型エポキシ樹脂、ノボラック型エポ
キシ樹脂、グリシジルエステル型エポキシ樹脂等のエポ
キシ樹脂及びアミン系硬化剤、イミダゾール系硬化剤、
酸無水物系硬化剤等の硬化剤を添加混合してペースト状
となし、しかる後、このペーストをシート状になすとと
もに約25〜100℃の温度で1〜60分間加熱し、半
硬化させることによって製作される。The three precursor sheets 11a, 11b,
11c is an epoxy resin made of an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, strontium titanate, and titanium oxide;
It is formed by bonding with a thermosetting resin precursor such as a polyimide resin and a polyphenylene ether resin. For example, a silicon oxide powder having a particle size of 0.1 to 100 μm is added to a bisphenol A type epoxy resin or a novolak type epoxy resin. , Epoxy resins such as glycidyl ester type epoxy resins and amine-based curing agents, imidazole-based curing agents,
A curing agent such as an acid anhydride curing agent is added and mixed to form a paste, and then the paste is formed into a sheet and heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to be semi-cured. Produced by
【0027】次に図2(b)に示すように前記3枚の前
駆体シート11a、11b、11cのうち2枚の前駆体
シート11a、11bに半導体素子3を収容する凹部1
dとなる開口A,A’を、2枚の前駆体シート11b、
11cに配線導体2を引き回すための貫通孔B,B’を
各々形成する。Next, as shown in FIG. 2 (b), two of the three precursor sheets 11a, 11b, 11c have the recess 1 for accommodating the semiconductor element 3 in the two precursor sheets 11a, 11b.
The openings A and A ′ serving as d are formed by two precursor sheets 11b,
11c, through holes B and B 'for routing the wiring conductor 2 are respectively formed.
【0028】前記開口A,A’及び貫通孔B,B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。The openings A, A 'and the through holes B, B' are formed by subjecting the precursor sheets 11a, 11b, 11c to a conventionally well-known punching method to form the precursor sheets 11a, 11b, 11c.
c is formed by piercing a hole of a predetermined shape in each of c.
【0029】次に図2(c)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B,B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法により所定パターンに印刷塗布するとともに
これを約25〜100℃の温度で1〜60分間加熱し、
半硬化させる。Next, as shown in FIG. 2C, a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B 'by a conventionally known screen printing method. Print and apply in a predetermined pattern and heat it at a temperature of about 25-100 ° C for 1-60 minutes,
Semi-cured.
【0030】前記金属ペースト12としては、例えば、
粒径が0.1μm〜20μm程度の銅粉末や銀粉末等か
ら成る金属粉末に、粒径が1μm〜50μm程度の錫−
インジウム合金、錫−ビスマス合金、錫−亜鉛合金の少
なくとも1種から成る接合金属粉末と、ビスフェノール
A型エポキシ樹脂、ノボラック型エポキシ樹脂、グリシ
ジルエステル型エポキシ樹脂等のエポキシ樹脂及びアミ
ン系硬化剤、イミダゾール系硬化剤、酸無水物系硬化剤
等の硬化剤を添加混合しペースト状となしたものが使用
される。As the metal paste 12, for example,
Grain size in the metal powder of copper powder and silver powder or the like of about 0.1Myuemu~20myuemu, particle size of about 1μm~50μm tin -
Indium alloy, tin - bismuth alloy, tin - and bonding metal powder consisting of at least one zinc alloy, Bisufe Roh Lumpur <br/> A type epoxy resin, novolak type epoxy resins, epoxy resins such as glycidyl ester type epoxy resin A paste obtained by adding and mixing a curing agent such as an amine curing agent, an imidazole curing agent, and an acid anhydride curing agent is used.
【0031】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層するとともにこれを約
300℃の温度で10秒〜24時間加熱し、前記金属ペ
ースト12中の接合金属を溶融させ、該溶融した接合金
属で金属粉末同士を接合させて金属部材となすとともに
前駆体シート11a、11b、11c及び金属ペースト
12の熱硬化性樹脂前駆体を完全に熱硬化させ一体化さ
せることによって図1に示すような絶縁基体1に配線導
体2を被着させた半導体素子収納用パッケージに使用さ
れる配線基板が完成する。この場合、前記前駆体シート
11a、11b、11cは熱硬化時に収縮することは殆
どなく、そのため得られる配線基板に変形や寸法にばら
つきが発生することも有効に防止されて配線導体2に断
線が招来することはなく、配線導体2を介して半導体素
子3等の電極を外部電気回路に確実に電気的接続するこ
とが可能となる。Finally, the three precursor sheets 11
a, 11b, and 11c are vertically stacked and heated at a temperature of about 300 ° C. for 10 seconds to 24 hours to melt the bonding metal in the metal paste 12 and bond the metal powders with the molten bonding metal. In this way, the thermosetting resin precursors of the precursor sheets 11a, 11b, 11c and the metal paste 12 are completely thermoset and integrated, thereby forming the wiring conductor 2 on the insulating base 1 as shown in FIG. The wiring board used for the package for housing the semiconductor element to which is adhered is completed. In this case, the precursor sheets 11a, 11b, and 11c hardly shrink at the time of thermosetting, so that the resulting wiring board is effectively prevented from being deformed or having a variation in dimension, and disconnection of the wiring conductor 2 is prevented. Without inviting, it is possible to reliably electrically connect the electrodes of the semiconductor element 3 and the like to the external electric circuit via the wiring conductor 2.
【0032】また前記金属ペースト12中の錫−インジ
ウム合金、錫−ビスマス合金、錫−亜鉛合金の少なくと
も1種から成る接合金属はその融点が前駆体シート11
a、11b、11c及び金属ペースト12に含まれてい
る熱硬化性樹脂の熱分解する温度より低い約250℃程
度であるため、金属ペースト12が所定パターンに印刷
された前駆体シート11a、11b、11cを熱処理し
て配線基板となす際、前駆体シート11a、11b、1
1c及び金属ペースト12の熱硬化性樹脂に熱分解を発
生させることなく接合金属を溶融させ、該溶融した接合
金属で金属粉末同士を確実に接合させることができる。The bonding metal of the metal paste 12 comprising at least one of a tin - indium alloy, a tin - bismuth alloy and a tin - zinc alloy has a melting point of the precursor sheet 11.
Since the temperature is about 250 ° C. lower than the temperature at which the thermosetting resin contained in the a, 11b, 11c and the metal paste 12 is thermally decomposed, the precursor sheets 11a, 11b, on which the metal paste 12 is printed in a predetermined pattern, When heat-treating 11c to form a wiring board, precursor sheets 11a, 11b, 1
The joining metal can be melted without causing thermal decomposition of the thermosetting resin of the metal paste 1c and the metal paste 12, and the metal powder can be reliably joined together by the melted joining metal.
【0033】尚、本発明は上述の実施例に限定されるも
のではなく、本発明の要旨を逸脱しない範囲であれば、
種々の変更は可能であり、例えば上述の実施例において
は本発明の配線基板を半導体素子を収容する半導体素子
収納用パッケージに適用した場合を例にとって説明した
が、これを混成集積回路基板等に用いられる配線基板に
適用してもよい。It should be noted that the present invention is not limited to the above-described embodiment, and is within the scope of the present invention.
Various modifications are possible. For example, in the above-described embodiment, the case where the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element has been described as an example, but this is applied to a hybrid integrated circuit board or the like. The present invention may be applied to a used wiring board.
【0034】また、上述の実施例では、配線基板は3枚
の絶縁基板を積層することにより形成したが、一枚や二
枚、あるいは四枚以上の絶縁基板を積層することによっ
て形成してもよい。In the above embodiment, the wiring substrate is formed by laminating three insulating substrates. However, the wiring substrate may be formed by laminating one, two, or four or more insulating substrates. Good.
【0035】更に上述の実施例において金属ペースト1
2に使用されるエポキシ樹脂等の熱硬化性樹脂にポリア
セチレン系樹脂やポリフェニレン樹脂等の導電性を有す
る樹脂を含有させておく、或いは導電性ポリピロール樹
脂やポリパラフェニレン樹脂、ポリアニリン樹脂等の熱
硬化性で導電性の樹脂を代替として使用すると、金属ペ
ースト12が所定パターンに印刷された前駆体シート1
1a、11b、11cを加熱処理して配線基板となす
際、接合金属による金属粉末間の接合に一部不完全なと
ころがあったとしてもその不完全な部分は導電性の樹脂
による電気的接続で補充され、その結果、金属粉末間の
電気的接続がより確実となり、配線導体2の電気抵抗を
より低抵抗となすことができる。Further, in the above embodiment, the metal paste 1
2) A thermosetting resin such as an epoxy resin used in (2) contains a conductive resin such as a polyacetylene resin or a polyphenylene resin, or a thermosetting resin such as a conductive polypyrrole resin, a polyparaphenylene resin, or a polyaniline resin. When an electrically conductive resin is used as an alternative, the precursor sheet 1 on which the metal paste 12 is printed in a predetermined pattern is used.
When heat-treating 1a, 11b, and 11c to form a wiring board, even if there is a partial imperfection in the joining between the metal powders by the joining metal, the imperfect part is due to electrical connection by a conductive resin. As a result, the electrical connection between the metal powders becomes more reliable, and the electrical resistance of the wiring conductor 2 can be made lower.
【0036】更に前記金属ペースト12は熱硬化性樹脂
前駆体に金属粉末と接合金属粉末を添加混合して形成し
たが、金属粉末の表面に予め接合金属を被着させたもの
を熱硬化性樹脂前駆体に添加含有させることによって形
成してもよい。この場合、熱硬化性樹脂前駆体に2種類
の金属粉末を添加するのではなく表面に接合金属が被着
された金属粉末の1種類を添加させるだけであるから金
属ペースト12の作成が極めて容易になるとともに金属
粉末の表面に予め接合金属が被着されていることから過
熱処理によって配線導体2を形成する際、接合金属を介
しての金属粉末間の接合がより確実となる。従って、前
記金属ペースト12は熱硬化性樹脂前駆体に金属粉末と
接合金属粉末の2種類の粉末を添加混合させて形成する
よりも熱硬化性樹脂前駆体に表面に接合金属が被着され
た金属粉末の1種類を添加させて形成するのが望まし
い。Further, the metal paste 12 is formed by adding and mixing a metal powder and a bonding metal powder to a thermosetting resin precursor. It may be formed by adding to the precursor. In this case, the formation of the metal paste 12 is extremely easy since only one type of metal powder having a bonding metal adhered to its surface is added instead of adding two types of metal powder to the thermosetting resin precursor. prebonded metal on the surface of the metal powder with ing to the time of forming the wiring conductor 2 by heating process because it is deposited, the bonding between the metal powder through a bonding metal becomes more reliable. Therefore, the bonding metal is adhered to the surface of the thermosetting resin precursor rather than the metal paste 12 formed by adding and mixing two kinds of powders of the metal powder and the bonding metal powder to the thermosetting resin precursor. It is desirable to form by adding one kind of metal powder.
【0037】[0037]
【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作自動ラインの一部とが激
しく衝突しても絶縁基体に欠けや割れ、クラック等が発
生することはない。According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device are manufactured. Even if a part of the automatic line collides violently, the insulating substrate will not be chipped, cracked or cracked.
【0038】また、本発明の配線基板によれば、配線導
体2の金属部材が金属粉末を錫−インジウム合金、錫−
ビスマス合金、錫−亜鉛合金の少なくとも1種から成る
接合金属で接合することによっ形成されていることか
ら、金属粉末間の電気的接続が接合金属によって確実と
なり、その結果、配線導体2の電気抵抗を低抵抗となす
ことができる。Further, according to the wiring board of the present invention, the metal member of the wiring conductor 2 is a metal powder tin - indium alloy, tin -
Whether it is formed by joining with a joining metal consisting of at least one of a bismuth alloy and a tin - zinc alloy
Accordingly, the electrical connection between the metal powders is ensured by the joining metal, and as a result, the electrical resistance of the wiring conductor 2 can be reduced.
【0039】更に、本発明の配線基板の製造方法によれ
ば、配線基板は、熱硬化性樹脂前駆体と無機絶縁物粉末
とを混合して成る前駆体シートを準備する工程と、該前
駆体シートを加熱して半硬化させる工程と、半硬化した
前記前駆体シートに、熱硬化性樹脂前駆体と金属粉末と
錫−インジウム合金、錫−ビスマス合金、錫−亜鉛合金
の少なくとも1種から成る接合金属粉末とを混合して成
る金属ペーストを所定パターンに印刷するとともに加熱
して半硬化させる工程と、半硬化した前記金属ペースト
が被着された半硬化の前記前駆体シートを複数枚上下に
積層するとともにこれを加熱処理し、前記金属粉末同士
を前記接合金属で接合させて金属部材を形成するととも
に前記前駆体シート及び前記金属ペーストの熱硬化性樹
脂前駆体を熱硬化させて一体化させる工程とで製作さ
れ、前駆体シート及び金属ペーストの熱硬化性樹脂前駆
体は熱硬化時に殆ど収縮しないことから不均一な収縮に
よる変形や寸法のばらつきが発生することもない。Further, according to the method for manufacturing a wiring board of the present invention,
In the wiring board includes the steps of preparing a precursor sheet formed by mixing a thermosetting resin precursor and the inorganic insulating powder, front
Heating the precursor sheet to semi-curing; and forming the semi-cured precursor sheet into a thermosetting resin precursor, a metal powder, a tin - indium alloy, a tin - bismuth alloy, and a tin - zinc alloy. heating with printing a metal paste formed by mixing a bonding metal powder consisting of at least one a predetermined pattern of
A step of semi-curing by a semi-cured the metal paste
A plurality of semi-cured precursor sheets to which is applied
This was heated with laminating, to integrate thermosetting resin precursor of the precursor sheet, and the metal paste with said metal powder particles are bonded by the bonding metal to form a metal member by thermally curing Since the precursor sheet and the thermosetting resin precursor of the metal paste hardly shrink at the time of thermosetting, there is no deformation or dimensional variation due to uneven shrinkage.
【0040】尚、前記金属ペースト中に含有されている
錫−インジウム合金、錫−ビスマス合金、錫−亜鉛合金
の少なくとも1種から成る接合金属はその融点が熱硬化
性樹脂の熱分解する温度より低い約250℃程度である
ため、金属ペーストが所定パターンに印刷された前駆体
シートを熱処理して配線基板となす際、前駆体シート及
び金属ペーストの熱硬化性樹脂に熱分解を発生させるこ
となく接合合金を溶融させて金属粉末同士を確実に接合
させることができる。The joining metal of the tin - indium alloy, tin - bismuth alloy, and tin - zinc alloy contained in the metal paste has a melting point lower than the temperature at which the thermosetting resin thermally decomposes. Because of the low temperature of about 250 ° C., when the metal paste is heat-treated on the precursor sheet printed in a predetermined pattern to form a wiring board, the precursor sheet and the thermosetting resin of the metal paste do not undergo thermal decomposition. By melting the bonding alloy, the metal powders can be reliably bonded to each other.
【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment in which a wiring board of the present invention is applied to a package for housing a semiconductor element.
【図2】(a)乃至(c)は本発明の配線基板の製造方
法を説明するための各工程毎の断面図である。FIGS. 2A to 2C are cross-sectional views for explaining steps of a method for manufacturing a wiring board according to the present invention.
1・・・・・・・・・・・・絶縁基体 1a、1b、1c・・・・・絶縁基板 2・・・・・・・・・・・・配線導体 11a、11b、11c・・前駆体シート 12・・・・・・・・・・・金属ペースト DESCRIPTION OF SYMBOLS 1 ... Insulating base 1a, 1b, 1c ... Insulating substrate 2 ... Wiring conductor 11a, 11b, 11c ... Precursor Body sheet 12 Metal paste
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H05K 1/02,1/03,1/09 H05K 3/12,3/46 H01L 23/12 - 23/15 H01B 1/00 - 1/24 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) H05K 1 / 02,1 / 03,1 / 09 H05K 3 / 12,3 / 46 H01L 23/12-23 / 15 H01B 1/00-1/24
Claims (2)
乃至40重量%の熱硬化性樹脂とからなり、前記無機絶
縁物粉末を前記熱硬化性樹脂の前駆体で結合して成る前
駆体シートを半硬化させてその複数枚を積層して熱硬化
させた、前記無機絶縁物粉末を前記熱硬化性樹脂により
結合した複数枚の絶縁基板を積層して成る絶縁基体の前
記絶縁基板に、金属粉末を錫−インジウム合金、錫−ビ
スマス合金、錫−亜鉛合金の少なくとも1種から成る接
合金属で接合させた金属部材と熱硬化性樹脂とから成る
配線導体を被着させて成ることを特徴とする配線基板。An inorganic insulating powder of 60 to 95% by weight and 5
Or consists of a 40 wt% of a thermosetting resin, wherein the inorganic insulation
Before bonding the edge powder with the thermosetting resin precursor
Semi-cured precursor sheets, laminating multiple sheets and heat curing
In front of an insulating substrate formed by laminating a plurality of insulating substrates obtained by bonding the inorganic insulating powder with the thermosetting resin.
The serial insulating substrate, the metal powder of tin - indium alloy, tin - bismuth alloy, tin - is applied to the wiring conductor made of a metallic member is joined by bonding metal consisting of at least one thermosetting resin of the zinc alloy A wiring board, comprising:
混合して成る前駆体シートを準備する工程と、該前駆体
シートを加熱して半硬化させる工程と、半硬化した前記
前駆体シートに、熱硬化性樹脂前駆体と金属粉末と錫−
インジウム合金、錫−ビスマス合金、錫−亜鉛合金の少
なくとも1種から成る接合金属粉末とを混合して成る金
属ペーストを所定パターンに印刷するとともに加熱して
半硬化させる工程と、半硬化した前記金属ペーストが被
着された半硬化の前記前駆体シートを複数枚上下に積層
するとともにこれを加熱処理し、前記金属粉末同士を前
記接合金属で接合させて金属部材を形成するとともに前
記前駆体シート及び前記金属ペーストの熱硬化性樹脂前
駆体を熱硬化させて一体化させる工程、とから成ること
を特徴とする配線基板の製造方法。2. A process for preparing a precursor sheet formed by mixing a thermosetting resin precursor and the inorganic insulating powder, said precursor
A step of semi-cured by heating the sheet, the precursor sheet was semi-cured, the thermosetting resin precursor and a metal powder and tin -
Indium alloy, tin - bismuth alloy, tin - zinc alloy is mixed with a joining metal powder composed of at least one kind, and a metal paste is printed in a predetermined pattern and heated.
A semi-curing step, and applying the semi-cured metal paste
A plurality of the semi-cured precursor sheets attached are laminated one above the other.
Heat treatment so as to, prior to the metal powder particles
Step of integrating the thermosetting resin precursor of the precursor sheet, and the metal paste is thermally cured with serial are joined by bonding metal to form a metal member, be composed of capital
A method for manufacturing a wiring board, comprising:
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP03608196A JP3301908B2 (en) | 1996-02-23 | 1996-02-23 | Wiring board and method of manufacturing the same |
| US08/717,119 US5837356A (en) | 1995-09-22 | 1996-09-20 | Wiring board and method for manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP03608196A JP3301908B2 (en) | 1996-02-23 | 1996-02-23 | Wiring board and method of manufacturing the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09232705A JPH09232705A (en) | 1997-09-05 |
| JP3301908B2 true JP3301908B2 (en) | 2002-07-15 |
Family
ID=12459799
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP03608196A Expired - Fee Related JP3301908B2 (en) | 1995-09-22 | 1996-02-23 | Wiring board and method of manufacturing the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3301908B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005095977A (en) * | 2003-08-26 | 2005-04-14 | Sanyo Electric Co Ltd | Circuit equipment |
-
1996
- 1996-02-23 JP JP03608196A patent/JP3301908B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH09232705A (en) | 1997-09-05 |
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