JP3228733B2 - Superconducting film formation method - Google Patents
Superconducting film formation methodInfo
- Publication number
- JP3228733B2 JP3228733B2 JP01264190A JP1264190A JP3228733B2 JP 3228733 B2 JP3228733 B2 JP 3228733B2 JP 01264190 A JP01264190 A JP 01264190A JP 1264190 A JP1264190 A JP 1264190A JP 3228733 B2 JP3228733 B2 JP 3228733B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- metal
- superconducting
- substrate
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/60—Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment
Landscapes
- Chemically Coating (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Description
【発明の詳細な説明】 〔概 要〕 超伝導膜形成方法に関し、 セラミックスを基板とした高臨界温度の超伝導膜の形
成並びに該基板と該超伝導膜間の化学反応を抑制し所用
の導体性能の確保を目的とし、 セラミックス基板上に所定温度で多層構造の金属膜
(緩衝層)を形成し、更にこの金属膜上に所定温度で超
伝導膜を形成するように構成する。The present invention relates to a method for forming a superconducting film, comprising forming a superconducting film at a high critical temperature on a ceramic substrate and suppressing a chemical reaction between the substrate and the superconducting film. For the purpose of ensuring performance, a metal film (buffer layer) having a multilayer structure is formed on a ceramic substrate at a predetermined temperature, and a superconducting film is formed on the metal film at a predetermined temperature.
本発明は超伝導膜形成方法に関し、更に詳しくはセラ
ミックス基板上に、多層構造の緩衝層を形成し、この緩
衝層の上に酸化物超伝導体の配線を形成する方法に関す
る。The present invention relates to a method for forming a superconducting film, and more particularly, to a method for forming a buffer layer having a multilayer structure on a ceramic substrate and forming an oxide superconductor wiring on the buffer layer.
電子装置等に用いる、電子素子間を相互接続するため
の配線基板として、セラミックス基板に配線を形成する
方法として、基板上に蒸着等を用いて薄膜を形成し、エ
ッチング技術により配線パターンを形成する方法、配線
導体を主成分としたペーストを印刷技術により基板上に
印刷パターンを作製、焼成し厚膜パターンを形成する方
法等が挙げられる。As a method for forming wiring on a ceramic substrate as a wiring substrate for interconnecting electronic elements used in an electronic device or the like, a thin film is formed on a substrate by vapor deposition or the like, and a wiring pattern is formed by an etching technique. And a method of forming a thick film pattern by forming a printed pattern on a substrate by printing a paste containing a wiring conductor as a main component by a printing technique, and the like.
この膜の材料としてCu,Mo等の常伝導体のみならずNb,
Y−Ba−Cu−O系(M.K.Wu,L.R.Ashburn,C.J.Trong,P.H.
Hor,R.L.Meng,L.Gao,Z.J.Huang,Y.Q.Wang、およびC.W.C
hnu:Phy.Rev.Lett.,58,(1987)908参照)およびBi−S
r−Ca−Cu−O系(H.Maeda,Y.Tanaka,M.Fukutomi,and
T.Asano:Jpn.J.Appl.Phys.27(1988)L209参照)並びに
高野等によって報告されたBi−Pb−Sr−Ca−Cu−O系
(M.Takano,J.Takada,K.Oda,H.Kaitaguchi,Y.Miura,Y.I
keda;Y.Tomii,and H.Mazaki:Jpn.Appln.Phys:27(198
8)L1041参照)等の導体物質が挙げられる。しかし、こ
れらの常伝導や超伝導体等の導体物質の膜を基板上に形
成する際、膜と基板間の化学反応等の相互作用により、
目的の物質が均一組成で得られず、特に超伝導体の性能
を発揮できない場合があった。As materials for this film, not only normal conductors such as Cu and Mo, but also Nb,
Y-Ba-Cu-O system (MKWu, LRAshburn, CJTrong, PH
Hor, RLMeng, L. Gao, ZJHuang, YQWang, and CWC
hnu: Phy. Rev. Lett., 58 , (1987) 908) and Bi-S.
r-Ca-Cu-O system (H.Maeda, Y.Tanaka, M.Fukutomi, and
T. Asano: Jpn. J. Appl. Phys. 27 (1988) L209) and the Bi-Pb-Sr-Ca-Cu-O system reported by Takano et al. (M. Takano, J. Takada, K. Oda) , H.Kaitaguchi, Y.Miura, YI
keda; Y.Tomii, and H.Mazaki: Jpn.Appln.Phys: 27 (198
8) Refer to L1041). However, when a film of a conductor material such as a normal conductor or a superconductor is formed on a substrate, due to an interaction such as a chemical reaction between the film and the substrate,
In some cases, the target substance could not be obtained with a uniform composition, and in particular, the performance of the superconductor could not be exhibited.
一方、本発明方法によって得られる超伝導膜と一見近
似した超伝導膜装置が知られている(日本特許公開公報
昭63−279521号)。すなわち、この装置は、セラミック
ス基板上に、両方間の熱膨張係数が10×10-6/Kより大き
い金属膜を形成し、この金属膜上にベロブスカイト型の
金属酸化物超伝導膜体の被膜を形成してなるものであ
る。この従来公知の発明は、本発明方法の目的とその目
的を異にしており、超伝導体自体の被膜に生じるクラッ
ク発生を防止するために所定の熱膨張係数の金属の導体
層をセラミックス基板と超伝導体層との間に介在せしめ
ている。On the other hand, there is known a superconducting film device that is apparently similar to the superconducting film obtained by the method of the present invention (Japanese Patent Publication No. 63-279521). In other words, this apparatus forms a metal film having a thermal expansion coefficient larger than 10 × 10 −6 / K on a ceramic substrate, and forms a bevelskite-type metal oxide superconducting film on the metal film. A film is formed. This conventionally known invention is different from the object of the method of the present invention in that the conductor layer of a metal having a predetermined coefficient of thermal expansion is formed as a ceramic substrate in order to prevent the occurrence of cracks in the coating of the superconductor itself. It is interposed between the superconductor layer.
また特開昭63−305574号公報(昭和63年12月13日公
開)は、支持基板上に超伝導体を形成するための超伝導
体用基板において、前記支持基板と超伝導体との間に化
学的に反応を起こさない安定材を介在させて複合基板と
したことを特徴とする超伝導体用基板を開示する。しか
しこの特開昭63−305574はAl2O3基板上にPf,Pd,Ag,Au膜
を蒸着、スパッタ、溶射、メッキ等により形成し、その
上にY−Ba−Cu−O系超伝導体膜を形成するものであ
り、安定材としての上記金属膜を複数層形成する考えは
示されていない。Japanese Unexamined Patent Publication No. Sho 63-305574 (published on December 13, 1988) discloses a superconductor substrate for forming a superconductor on a support substrate. A superconductor substrate characterized in that a composite material is formed by interposing a stabilizer which does not chemically react with the superconductor. However, JP-A-63-305574 discloses that a Pf, Pd, Ag, Au film is formed on an Al 2 O 3 substrate by vapor deposition, sputtering, thermal spraying, plating, etc., and a Y-Ba-Cu-O-based superconducting film is formed thereon. No idea is given to form a body film and to form a plurality of the above-mentioned metal films as a stabilizer.
従ってこの従来技術は本発明の目的と構成を異にす
る。Accordingly, this prior art differs from the object and configuration of the present invention.
本発明の目的は、セラミックス基板と超伝導体の膜間
の化学反応を抑制又は防止して均一な超伝導体の膜を形
成することにある。An object of the present invention is to form a uniform superconductor film by suppressing or preventing a chemical reaction between a ceramic substrate and a superconductor film.
更に本発明の他の目的はセラミックス基板と超伝導体
膜との間に2以上の金属層を所定方法で形成することに
より金属層のピンホールの発精生等を抑制又は防止する
ことをその目的とする。Still another object of the present invention is to form or prevent two or more metal layers between the ceramic substrate and the superconductor film by a predetermined method to suppress or prevent the occurrence of pinholes in the metal layers. Aim.
本発は、上記課題を解決することを目的とするもので
ある。この目的達成のため、本発明者らは、鋭意研究を
重ねた結果、基板と超伝導体の膜間の化学反応を抑制す
るため、該超伝導体膜の物質と反応しにくい緩衝物質を
基板と該超伝導体膜間に複数層、所定方法にて形成する
ことが有効であることの知見を得て本発明を完成したの
である。The purpose of the present invention is to solve the above problems. To achieve this object, the present inventors have conducted intensive studies, and as a result, in order to suppress a chemical reaction between the substrate and the superconductor film, a buffer material that does not easily react with the substance of the superconductor film was used. The present inventors have found that it is effective to form a plurality of layers between the superconductor films by a predetermined method, thereby completing the present invention.
すなわち、本発明はセラミック基板上にI b族(銅族:
Cu,Ag,Au)又はVIII族(Fe,Co,Ni,Ru,Rh,Pd,Os,Ir,Pt)
の金属膜を形成し、更にこの金属膜上に酸化物超伝導膜
を形成する方法であって、 前記金属膜を同種又は異種の金属層からなる二層以上
の多層構造の金属膜となし、更に該金属膜の形成を、該
超伝導膜の形成よりもより高い温度で原料ペーストの塗
膜を焼成することで行いかつ該超伝導膜の形成を、超伝
導体の結晶を成長させる温度範囲内で原料ペーストの塗
膜を焼成することで行うことを特徴とする。That is, the present invention relates to a method for forming a group Ib (copper group:
Cu, Ag, Au) or Group VIII (Fe, Co, Ni, Ru, Rh, Pd, Os, Ir, Pt)
Forming a metal film of the above, further forming an oxide superconducting film on the metal film, wherein the metal film is a metal film having a multilayer structure of two or more layers of the same or different metal layers, Further, the formation of the metal film is performed by firing a coating film of the raw material paste at a higher temperature than the formation of the superconducting film, and the formation of the superconducting film is performed in a temperature range in which a superconductor crystal is grown. It is characterized in that it is performed by baking the coating film of the raw material paste.
以下、本発明を添付の図面を参照しつつ更に説明す
る。Hereinafter, the present invention will be further described with reference to the accompanying drawings.
本発は上記の記載から明らかなように、例えば、アル
ミナ基板又はY2O3安定化ジルコニア基板の如きセラミッ
クス基板上に2以上の多層の金属膜(緩衝層)を形成す
る工程と、この金属膜上に酸化物超伝導体の膜を形成す
る工程とから成るものであり、以下、各々の工程につい
て説明する。As apparent from the above description, the present invention provides a step of forming two or more multilayer metal films (buffer layers) on a ceramic substrate such as an alumina substrate or a Y 2 O 3 stabilized zirconia substrate, Forming a film of an oxide superconductor on the film. Each of the steps will be described below.
2以上の多層の金属膜を形成する工程において、金属
膜の材料としては以下の材料が用いられる。すなわち、
セラミックス基板上に形成される第1番目の金属膜の材
料としては、IB属金属、又はこのIB属と同じ結晶構造を
有し、原子番号が隣接した元素、例えばVIII族の鉄族
(Fe,Co,Ni)または白金族(例えばPd,Pt)に属する金
属が用いられる。また、第IB属の金属と酸素を介して結
合しうる金属、例えばCr等をも用いることができる。In the step of forming two or more multilayer metal films, the following materials are used as the material of the metal film. That is,
As a material of the first metal film formed on the ceramic substrate, a metal belonging to Group IB or an element having the same crystal structure as that of Group IB and having atomic numbers adjacent to each other, for example, an iron group (Fe, Co, Ni) or metals belonging to the platinum group (for example, Pd, Pt) are used. Further, a metal that can bond to a Group IB metal via oxygen, for example, Cr or the like can also be used.
次に第1番目の金属膜上に形成される第2番目の金属
膜を構成する金属は、第1番目の金属膜の金属と密着し
やすい金属であればよい。具体的には、第2番目の金属
膜の金属は、前記金属の内の一種であればよく、同一金
属でもあるいは異なる金属であってもよい。金属層元素
としては酸化物超伝導体物質に影響を及ぼすことが少な
いもの、或いは多少置換されたとしても、超伝導相発現
に影響を及ぼさないものが用いうる。金属層元素として
Cu,Fe,Co,Ni等を用いる場合、金属層を形成する焼成雰
囲気としては不活性ガス雰囲気でなす。そして、超伝導
体層を形成する焼成雰囲気としては大気中等酸化性雰囲
気で焼成される為、金属層の表面層が酸化されることも
考えられるが、上に形成される超伝導体物質と反応しな
いものであれば良い。Next, the metal constituting the second metal film formed on the first metal film may be any metal that is easily adhered to the metal of the first metal film. Specifically, the metal of the second metal film may be any one of the above-mentioned metals, and may be the same metal or a different metal. As the metal layer element, an element which hardly affects the oxide superconductor substance or an element which does not affect the development of the superconducting phase even if substituted slightly can be used. As metal layer element
When Cu, Fe, Co, Ni, or the like is used, the firing atmosphere for forming the metal layer is an inert gas atmosphere. Since the baking atmosphere for forming the superconductor layer is baking in an oxidizing atmosphere such as the air, the surface layer of the metal layer may be oxidized, but the baking atmosphere reacts with the superconductor material formed thereon. Anything that does not need to be used.
この金属膜は、有機物と金属粉末からのみなるペース
ト(フリットガラスを含まない)を印刷、乾燥、焼成し
てセラミックス基板、例えばアルミナ基板に金属膜を形
成する。焼成後、さらに、同様にして、同種又は異種の
金属ペーストを先に焼成した金属膜の上に印刷、焼成し
て2層以上の金属層を形成したアルミナ基板を作製す
る。この金属層は緩衝層として作用する。This metal film is formed by printing, drying and baking a paste (not including frit glass) consisting of only an organic substance and metal powder on a ceramic substrate, for example, an alumina substrate. After firing, the same or different metal paste is similarly printed and fired on the previously fired metal film to produce an alumina substrate having two or more metal layers. This metal layer acts as a buffer layer.
この緩衝層の上に、酸化物超伝導物質または、その組
成物を堆積し、熱処理することによって、超伝導膜を得
る。An oxide superconducting substance or a composition thereof is deposited on the buffer layer and heat-treated to obtain a superconducting film.
超伝導物質と化学反応しにくい金属膜物質を見出して
も、それだけでは、金属膜の材料組織の状態によって、
超伝導体の形成を妨げることがあることがわかった。Even if you find a metal film substance that does not easily react with a superconducting substance, it alone will
It has been found that the formation of superconductors may be hindered.
すなわち、金属膜形成の際の焼成温度が、酸化物超伝
導体の焼結温度よりも高いことが必須である。これは、
金属膜形成の焼成温度が酸化物超伝導体の焼成温度と同
程度または低いと、金属膜を構成している金属表面付近
のエネルギー状態(これは焼成のために主に用いられ
る)が高温焼成の場合に比べ、高い場合があるためであ
る。この場合、酸化物超伝導体の熱処理中、金属膜中の
金属が物質移動を起こし、超伝導膜の組成がゆらぎ、超
伝導発現が阻害される。また、超伝導膜の形成を超伝導
体の結晶を成長させる温度範囲内で行うことが必要であ
る。That is, it is essential that the firing temperature in forming the metal film is higher than the sintering temperature of the oxide superconductor. this is,
When the sintering temperature for forming the metal film is about the same as or lower than the sintering temperature of the oxide superconductor, the energy state near the surface of the metal constituting the metal film (which is mainly used for sintering) becomes high-temperature sintering This is because it may be higher than in the case of. In this case, during the heat treatment of the oxide superconductor, the metal in the metal film causes mass transfer, the composition of the superconducting film fluctuates, and the superconductivity manifests. Further, it is necessary to form the superconducting film within a temperature range in which a superconductor crystal is grown.
これらの範囲外で焼結すると超伝導物質の結晶成長が
良好でなく所期の臨界温度を有する超伝導現象が得られ
ないからである。If the sintering is performed outside these ranges, the crystal growth of the superconducting material is not good, and a superconducting phenomenon having an intended critical temperature cannot be obtained.
更にまた、良好な超伝導特性の高温超伝導膜を作製す
るには熱処理時に、該超伝導膜が溶融する温度にするこ
とが好ましいことがある。このとき、緩衝層にピンホー
ルがあると、溶融している超伝導を得るための組成物が
一部、セラミックス基板の方に移動して組成がずれ、良
好な超伝導膜が得られなくなる。Furthermore, in order to produce a high-temperature superconducting film having good superconducting properties, it is sometimes preferable to set a temperature at which the superconducting film melts during heat treatment. At this time, if there is a pinhole in the buffer layer, a part of the composition for obtaining the molten superconductivity moves toward the ceramic substrate and the composition shifts, so that a good superconducting film cannot be obtained.
すなわち、本発明方法は金属層(緩衝層)を2層以上
の多層構造に形成しかつ金属層形成のための焼成温度
を、酸化物超伝導体の焼成温度よりも高い温度で行うこ
とにより、超伝導膜の焼成中における緩衝層次いで基板
への超伝導物質の拡散が無く(すなわち、緩衝層および
基板への物質移動が抑制または防止され)、良好な超伝
導層が形成される。これは、緩衝層でのピンホールの発
生が防止され、かつ緩衝層中の粒界ポアが低減するため
と考えられる。なお、基板上に超伝導膜を形成するため
の焼成温度は後記のように超伝導体の結晶を成長させる
温度範囲から選定される。従って、超伝導体を構成する
系によってその温度範囲は異なる。That is, in the method of the present invention, the metal layer (buffer layer) is formed in a multilayer structure of two or more layers, and the firing temperature for forming the metal layer is performed at a temperature higher than the firing temperature of the oxide superconductor. There is no diffusion of superconducting material into the buffer layer and then the substrate during firing of the superconducting film (ie, mass transfer to the buffer layer and the substrate is suppressed or prevented) and a good superconducting layer is formed. It is considered that this is because generation of pinholes in the buffer layer is prevented and grain boundary pores in the buffer layer are reduced. The firing temperature for forming the superconducting film on the substrate is selected from the temperature range in which the superconductor crystal grows as described later. Therefore, the temperature range differs depending on the system constituting the superconductor.
以下、更に実施例により本発明を説明する。 Hereinafter, the present invention will be described with reference to examples.
実施例1 本発明方法の概要の工程を第1図および第2図に示
す。第1図は金属膜付基板の製造工程を示し、第2図は
アルミナ基板上に超伝導膜を形成する工程を示す。Example 1 FIGS. 1 and 2 show the outline steps of the method of the present invention. FIG. 1 shows a manufacturing process of a substrate with a metal film, and FIG. 2 shows a process of forming a superconducting film on an alumina substrate.
以下、更に説明する。 This will be further described below.
純度99.7%のAl2O3基板上に平均粒径1μmの純度99.
9%以上のAg粉末、および有機物(溶剤および有機樹
脂;有機樹脂の重量部はAg粉末100重量部に対し0.8重量
部である)のビヒクルからなるAgペーストを印刷した。
プリント基板を110℃で乾燥した後、大気中で800〜970
℃の温度の種々の条件下で10分間焼成した。焼成したAg
膜の上に同じ領域でAgペーストを印刷、乾燥した後、焼
成し、金属膜付き基板を作成した(第1図)。この場
合、数μmより薄いと形成される金属層にむらが生ずる
ので1回の焼成で形成される金属層の膜厚はピンホール
発生を抑制する為数μm以上、好ましくは10μm以上で
ある。そして複数回の金属層印刷と焼成により得られる
金属層全体の膜厚は20μm以上であった。本実施例では
1回の焼成で形成されるAg層の厚さは10μmであり、2
回のAgペーストの塗布と焼成により、20μmのAg層が形
成された。99. Purity of 99.7% purity on an Al 2 O 3 substrate with an average particle size of 1 μm.
An Ag paste consisting of 9% or more of Ag powder and a vehicle of organic matter (solvent and organic resin; 0.8 parts by weight of the organic resin is 100 parts by weight of the Ag powder) was printed.
After drying the printed circuit board at 110 ° C, 800-970 in air
Calcination was carried out for 10 minutes under various conditions at a temperature of ° C. Ag fired
An Ag paste was printed on the film in the same region, dried, and fired to form a substrate with a metal film (FIG. 1). In this case, if the thickness is smaller than several μm, the formed metal layer becomes uneven. Therefore, the thickness of the metal layer formed by one baking is several μm or more, preferably 10 μm or more in order to suppress the generation of pinholes. The thickness of the entire metal layer obtained by printing and firing the metal layer a plurality of times was 20 μm or more. In this embodiment, the thickness of the Ag layer formed by one firing is 10 μm,
By applying and baking the Ag paste twice, an Ag layer having a thickness of 20 μm was formed.
金属層を焼成するために800℃で焼成した基板を用い
る場合において、以下に述べる超伝導膜の焼成を行うと
超伝導物質の成分がAg膜を通してアルミナ基板に達して
いた。一方、金属層を焼成するために900℃〜955℃で焼
成した基板を用いる場合には、以下に示す焼成では、ア
ルミナ基板への超伝導物質の成分の拡散は検出されなか
った。金属層を焼成するために、約960℃以上で焼成し
た場合にはAgは溶け出し表面張力のため基板上で膜を形
成しない。In the case of using a substrate fired at 800 ° C. to fire the metal layer, when the firing of the superconducting film described below was performed, the component of the superconducting material reached the alumina substrate through the Ag film. On the other hand, when a substrate fired at 900 ° C. to 955 ° C. was used to fire the metal layer, the diffusion of the component of the superconducting material into the alumina substrate was not detected in the firing described below. When the metal layer is baked at about 960 ° C. or more, Ag melts out and does not form a film on the substrate due to surface tension.
第1図に示すように基板上に複数の金属層を形成する
ために高温で2回焼成して得られた基板を次の工程用に
用いた。As shown in FIG. 1, a substrate obtained by firing twice at a high temperature to form a plurality of metal layers on the substrate was used for the next step.
高温超伝導膜は次のようにして形成した。 The high-temperature superconducting film was formed as follows.
Bi−Pb−Sr−Ca−Cu−O系(但し、最終pbの量は微量
であるか、または検出されなかった)では110K級の臨界
温度を持つ高温超伝導体のバルクを作製した。Bi−Pb−
Sr−Ca−Cu−O系の組成の一例としては、Bi0.7Pb0.3Sr
1Ca1Cu1.8O9.15の組成比のものを用いた。このバルク
試料を乳鉢で粗粉砕した後、ボールミルでさらに粉砕
し、平均粒子径が約10μm以下の粉末となるようにし
た。この粉末と有機物からなるビヒクルを調合、混練
し、Bi−Pb−Sr−Ca−Cu−O系粉末を主成分としたペー
ストを作成した。このペーストを、緩衝層無しのアルミ
ナ基板、および金属層を形成するために約900℃で焼成
した金属膜付アルミナ基板上に印刷し次いで乾燥した。
超伝導物質(又は超伝導形成物質)のペーストを用いて
印刷された基板を大気中で焼成し、超伝導膜付基板を作
製した(第2図参照)。In the Bi-Pb-Sr-Ca-Cu-O system (however, the amount of final pb was very small or not detected), a bulk of a high-temperature superconductor having a critical temperature of 110K class was produced. Bi−Pb−
As an example of the composition of the Sr-Ca-Cu-O system, Bi 0.7 Pb 0.3 Sr
A composition ratio of 1 Ca 1 Cu 1.8 O 9.15 was used. This bulk sample was roughly pulverized in a mortar, and further pulverized in a ball mill to obtain a powder having an average particle diameter of about 10 μm or less. This powder and a vehicle composed of an organic substance were mixed and kneaded to prepare a paste containing Bi-Pb-Sr-Ca-Cu-O-based powder as a main component. This paste was printed on an alumina substrate without a buffer layer, and an alumina substrate with a metal film fired at about 900 ° C. to form a metal layer, and then dried.
A substrate printed using a paste of a superconducting substance (or a superconducting forming substance) was fired in the air to produce a substrate with a superconducting film (see FIG. 2).
焼成温度は、超伝導体の結晶を成長させる温度範囲か
ら選定される。The firing temperature is selected from a temperature range in which a superconductor crystal is grown.
形成される超伝導体層の膜厚は、スクリーン印刷のメ
ッシュにもよるが、5〜100μmである。本実施例では
約80μmの超伝導体層が形成された。The thickness of the formed superconductor layer is 5 to 100 μm, though it depends on the screen printing mesh. In this embodiment, a superconductor layer of about 80 μm was formed.
Bi−Pb−Sr−Ca−Cu−O系の場合においては、焼成温
度は、830〜860℃である。従って本実施例では後記の第
1表に示すように870℃(比較例1)および840℃(実施
例1〜4)で焼成した。比較例2は、Ag金属膜の無い例
である。In the case of the Bi-Pb-Sr-Ca-Cu-O system, the firing temperature is 830 to 860C. Therefore, in this example, as shown in Table 1 below, firing was performed at 870 ° C. (Comparative Example 1) and 840 ° C. (Examples 1 to 4). Comparative Example 2 is an example having no Ag metal film.
比較例1の試料は、Cu Kの線を用いたX線回折測定の
結果、膜表面でAg、約10KのTcを有するBi−Sr−Cu−O
超伝導相、CaO,CuOが検出され、Bi−Pb−Sr−Ca−Cu−
O系の80Kないし110K級の臨界温度を持つ超伝導体の高T
c相の結晶のピークは検出されなかった。As a result of X-ray diffraction measurement using a Cu K line, the sample of Comparative Example 1 was found to be Bi—Sr—Cu—O having Ag and Tc of about 10 K on the film surface.
Superconducting phase, CaO, CuO detected, Bi-Pb-Sr-Ca-Cu-
High T of O-based superconductors with a critical temperature of 80K to 110K class
No c-phase crystal peak was detected.
他のBi−Sr−Cu−O超伝導相に関する文献は、次の如
くである: (1)J.Akimitsu,A.Yamazaki,H.Sawa and H.Fujiki;Jp
n.J.Appl.Phys.26(1987)L2080。References regarding other Bi-Sr-Cu-O superconducting phases are as follows: (1) J. Akimitsu, A. Yamazaki, H. Sawa and H. Fujiki;
nJAppl.Phys. 26 (1987) L2080.
(2)C.Michel,M.Hervien,H.M.Borel,A.Grandin,F.Des
landes,J.Provost and B.Raveau:Z.Phys.B68(1987)42
1。(2) C. Michel, M. Hervien, HMBorel, A. Grandin, F. Des
landes, J. Provost and B. Raveau: Z. Phys. B 68 (1987) 42
1.
実施例1〜4の試料についてX線回折のパターンを第
3図に示す。これらいずれの試料も80Kないし110K級の
臨界温度を持つ超伝導体の低Tc相及び高Tc相の結晶のピ
ークが検出された。焼成時間が1,6,50時間では焼成時間
が増すと110K級の臨界温度を有する、対応した超伝導結
晶のピークが大きくなる傾向にあり、90時間の焼成で
は、逆に減る傾向にあった。第4図に実施例2〜4の各
試料の電気抵抗率の温度依存の測定結果の例を示す。実
施例3の試料でTce(TCエンドポイント)が約90Kの超伝
導膜となった。比較例2の試料は基板との反応が観察さ
れ、超伝導への遷移が観測されなかった。FIG. 3 shows X-ray diffraction patterns of the samples of Examples 1 to 4. In each of these samples, peaks of low Tc phase and high Tc phase crystals of a superconductor having a critical temperature of 80K to 110K were detected. When the sintering time was 1,6,50 hours, the peak of the corresponding superconducting crystal having a critical temperature of 110K tended to increase when the sintering time increased, and the tendency tended to decrease when the sintering time was 90 hours. . FIG. 4 shows an example of a temperature-dependent measurement result of the electrical resistivity of each sample of Examples 2 to 4. The sample of Example 3 was a superconducting film having a Tce (TC endpoint) of about 90K. In the sample of Comparative Example 2, a reaction with the substrate was observed, and no transition to superconductivity was observed.
実施例2 セラミックス基板として部分安定化Y2O3−ジルコニア
基板を用いた実施例を説明する。 Example 2 An example using a partially stabilized Y 2 O 3 -zirconia substrate as a ceramic substrate will be described.
ジルコニア基板上に平均粒径1μmの純度99.9%以上
のAg粉末、および有機物のビヒクルからなるAgベースト
を印刷、110℃で乾燥した後、大気中で900〜960℃間の
温度で10分間焼成する。焼成したAg膜の上に同じ要領で
Agペーストを印刷、乾燥した後、焼成し、金属層が2層
付いたジルコニア基板を作製する。一方、Bi−Pb−Sr−
Ca−Cu−O系で110K級の臨界温度を持つ高温超伝導体の
バルクを作製する。このバルク試料を乳鉢で組粉砕した
後、ボールミルでさらに粉砕し、平均粒子径が約10μm
以下の粉末となるようにする。この粉末と有機物からな
るビヒクルを調合、混練し、Bi−Pb−Sr−Ca−Cu−O系
粉末を主成分としたペーストを作製した。このペースト
をジルコニア基板上直に、および金属層が2層付いたジ
ルコニア基板の金属層上に印刷、乾燥した後、大気中で
840〜860℃で焼成する。Printing on a zirconia substrate Ag powder consisting of Ag powder with an average particle diameter of 1 μm and purity of 99.9% or more and an organic vehicle, drying at 110 ° C., and baking in air at a temperature between 900 and 960 ° C. for 10 minutes . On the fired Ag film in the same way
After printing and drying the Ag paste, it is fired to produce a zirconia substrate having two metal layers. On the other hand, Bi-Pb-Sr-
A bulk of a high temperature superconductor having a critical temperature of 110K class in a Ca-Cu-O system is produced. After this bulk sample is assembled and ground in a mortar, it is further ground in a ball mill, and the average particle diameter is about 10 μm.
Make the following powder. This powder and a vehicle composed of an organic substance were mixed and kneaded to prepare a paste containing Bi-Pb-Sr-Ca-Cu-O-based powder as a main component. This paste is printed and dried directly on the zirconia substrate and on the metal layer of the zirconia substrate having two metal layers, and then dried in air.
Bake at 840-860 ° C.
ジルコニア基板上に直に印刷、乾燥、焼成した試料
は、基板との密着がよくなく、Bi−Pb−Sr−Ca−Cu−O
膜が剥離し易い、さらに77K付近で抵抗が残留する。一
方、金属層上に超伝導物質(又は超伝導形成物質)のペ
ーストを印刷し、乾燥、焼成した試料は、Bi−Pb−Sr−
Ca−Cu−O膜が剥離しにくく、Tco約110K、Tce約90Kの
超伝導膜となる。The sample printed, dried, and fired directly on the zirconia substrate has poor adhesion to the substrate, and has a Bi-Pb-Sr-Ca-Cu-O
The film is easily peeled off, and the resistance remains around 77K. On the other hand, a sample obtained by printing a paste of a superconducting substance (or a superconducting forming substance) on a metal layer, drying and firing is Bi-Pb-Sr-
The Ca-Cu-O film is hardly peeled off, and becomes a superconducting film having a Tco of about 110K and a Tce of about 90K.
実施例3 金属層として銀ペーストに代えてAuペーストを用い、
Auペースト印刷基板の焼成を900℃でなした以外は、実
施例1と同様の工程で超伝導体層配線パターンを有する
回路基板を作成し、実施例1と同様の結果を得た。Example 3 An Au paste was used as a metal layer instead of a silver paste,
A circuit board having a superconductor layer wiring pattern was prepared in the same steps as in Example 1 except that the Au paste printed board was fired at 900 ° C., and the same results as in Example 1 were obtained.
以上、金属層として二層の構造からなる例について説
明したが、前記第2の金属膜上に更に該第2の金属と密
着性を有する金属からなる第3の金属膜を形成し、3層
構造の緩衝層とすることも可能である。The example in which the metal layer has a two-layer structure has been described above. However, a third metal film made of a metal having adhesion to the second metal is further formed on the second metal film to form a three-layer structure. It is also possible to use a buffer layer having a structure.
以上説明したように本発明は構成されるものであるか
ら、セラミックスを基板として高臨界温度の超伝導厚膜
を形成できる。また常伝導金属を緩衝層として用いてい
るので、この緩衝層を常伝導体と超伝導膜との良好な接
続を保った媒体として用いることができ、この結果、所
用の導体の性能を発揮させる効果を奏する。Since the present invention is configured as described above, a superconducting thick film having a high critical temperature can be formed using ceramics as a substrate. Also, since the normal metal is used as the buffer layer, this buffer layer can be used as a medium that maintains a good connection between the normal conductor and the superconducting film, and as a result, the performance of the required conductor is exhibited. It works.
第1図は、本発明の一実施例を示す工程図であり、 第2図は、本発明における金属膜付基板製造の一例を示
す工程図であり、 第3図は、本発明方法によって得られた試料のX線回折
パターン図であり、 第4図は、本発明方法によって得られた試料の電気抵抗
率の温度依存を示すグラフである。FIG. 1 is a process diagram showing one embodiment of the present invention, FIG. 2 is a process diagram showing one example of the production of a substrate with a metal film in the present invention, and FIG. 3 is obtained by the method of the present invention. FIG. 4 is an X-ray diffraction pattern diagram of the sample obtained. FIG. 4 is a graph showing the temperature dependence of the electrical resistivity of the sample obtained by the method of the present invention.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 丹羽 紘一 神奈川県川崎市中原区上小田中1015番地 富士通株式会社内 (56)参考文献 特開 平1−248696(JP,A) 特開 平1−286920(JP,A) 特開 昭64−72410(JP,A) 特開 昭64−27294(JP,A) 特開 昭63−305574(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 39/22 - 39/24 H01L 39/00 H01B 12/06 H01B 13/00 H05K 3/24 ────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Koichi Niwa 1015 Kamiodanaka, Nakahara-ku, Kawasaki City, Kanagawa Prefecture Inside Fujitsu Limited (56) References JP-A-1-248696 (JP, A) JP-A-1-286920 (JP, a) JP Akira 64-72410 (JP, a) JP Akira 64-27294 (JP, a) JP Akira 63-305574 (JP, a) (58 ) investigated the field (Int.Cl. 7 H01L 39/22-39/24 H01L 39/00 H01B 12/06 H01B 13/00 H05K 3/24
Claims (1)
なる超伝導膜を形成する方法であって、 セラミックス基板上に、周期律表のI b族(銅族)又はV
III族の金属を含む原料ペーストを塗布し、得られた塗
膜を前記超伝導膜の形成に用いられる焼結温度よりも高
い温度で焼成することを反復して、同種又は異種の前記
金属からなる二層以上の多層構造の金属膜を形成する工
程、及び 前記セラミックス基板上に、前記多層構造の金属膜を介
して、前記超伝導膜の原料ペーストを塗布し、得られた
塗膜を超伝導体の結晶を成長させる温度範囲内で焼結す
る工程 を含んでなることを特徴とする超伝導膜の形成方法。1. A method for forming a superconducting film made of an oxide superconductor on a ceramic substrate, comprising: forming a group Ib (copper group) or V
Applying a raw material paste containing a Group III metal, repeating the firing of the obtained coating film at a temperature higher than the sintering temperature used for forming the superconducting film, from the same or different metals Forming a metal film having a multilayer structure of two or more layers, and applying the raw material paste of the superconducting film on the ceramic substrate via the metal film having the multilayer structure, A method for forming a superconducting film, comprising a step of sintering within a temperature range for growing a conductor crystal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP01264190A JP3228733B2 (en) | 1989-01-24 | 1990-01-24 | Superconducting film formation method |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1311789 | 1989-01-24 | ||
| JP1-13117 | 1989-01-24 | ||
| JP01264190A JP3228733B2 (en) | 1989-01-24 | 1990-01-24 | Superconducting film formation method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02290975A JPH02290975A (en) | 1990-11-30 |
| JP3228733B2 true JP3228733B2 (en) | 2001-11-12 |
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ID=26348276
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|---|---|---|---|
| JP01264190A Expired - Fee Related JP3228733B2 (en) | 1989-01-24 | 1990-01-24 | Superconducting film formation method |
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| Country | Link |
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| JP (1) | JP3228733B2 (en) |
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