JP3414564B2 - Substrate rotary processing equipment - Google Patents
Substrate rotary processing equipmentInfo
- Publication number
- JP3414564B2 JP3414564B2 JP30206195A JP30206195A JP3414564B2 JP 3414564 B2 JP3414564 B2 JP 3414564B2 JP 30206195 A JP30206195 A JP 30206195A JP 30206195 A JP30206195 A JP 30206195A JP 3414564 B2 JP3414564 B2 JP 3414564B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- liquid
- processing liquid
- supply nozzle
- processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Description
【0001】[0001]
【発明の属する技術分野】この発明は、スピンデベロッ
パ(回転式現像装置)のように、基板を水平姿勢に保持
して鉛直軸回りに回転させながら現像液等の処理液を基
板表面へ供給して処理を行なう基板回転式処理装置に関
し、特に、基板の表面へ処理液を供給する処理液供給部
に係るものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention, like a spin developer (rotary developing device), supplies a processing liquid such as a developing liquid to the surface of a substrate while holding the substrate in a horizontal posture and rotating it about a vertical axis. The present invention relates to a substrate rotary processing apparatus for performing processing by means of a processing liquid supply unit, and more particularly to a processing liquid supply unit for supplying a processing liquid to the surface of a substrate.
【0002】[0002]
【従来の技術】半導体製造装置等として使用される基板
回転式処理装置、例えばスピンデベロッパでは、回転す
る基板の表面全体に出来るだけ均一に現像液が供給され
るようにするために、各種型式の現像液供給ノズルが提
案されている。例えば、特公平5−68092号公報に
開示されている現像液供給ノズルは、図9に示すよう
に、筒体2の先端を閉止して、筒体2内においてその先
端で現像液が反転するようにし、筒体2を鉛直姿勢に保
持し、その筒体2の下端近傍の側壁に複数個の吐出孔3
を円周方向に穿設して構成されている。現像液の供給に
際しては、この現像液供給ノズル1を図示しないノズル
移動手段により、スピンチャック4に水平姿勢に保持さ
れた基板Wの上方へ移動させて筒体2の下端と基板Wの
表面とが接近するように配置する。そして、現像液供給
配管5を通して現像液を筒体2内へ送給すると、現像液
は、筒体2の下端内壁面に当たってその流速を減じ、側
壁に設けられた複数個の吐出孔3から水平方向へ吐出さ
れ、基板Wの中心方向及び周辺方向に放射状に流出して
基板Wの表面へ供給され、基板Wの回転によって基板W
の表面全体に現像液が広げられる。2. Description of the Related Art In a substrate rotary processing apparatus used as a semiconductor manufacturing apparatus or the like, for example, a spin developer, in order to supply a developing solution to the entire surface of a rotating substrate as uniformly as possible, various types are used. A developer supply nozzle has been proposed. For example, in the developing solution supply nozzle disclosed in Japanese Patent Publication No. 5-68092, as shown in FIG. 9 , the tip of the cylindrical body 2 is closed, and the developing solution is reversed at the tip within the cylindrical body 2. In this way, the cylindrical body 2 is held in the vertical posture, and the plurality of discharge holes 3 are formed in the side wall near the lower end of the cylindrical body 2.
Is formed in the circumferential direction. At the time of supplying the developing solution, the developing solution supply nozzle 1 is moved above the substrate W held horizontally by the spin chuck 4 by a nozzle moving means (not shown) so that the lower end of the cylindrical body 2 and the surface of the substrate W. Place them so that they approach each other. Then, when the developing solution is fed into the cylindrical body 2 through the developing solution supply pipe 5, the developing solution collides with the inner wall surface of the lower end of the cylindrical body 2 to reduce its flow velocity, and the developing solution is horizontally discharged from the plurality of discharge holes 3 provided in the side wall. Is discharged to the surface of the substrate W, is radially discharged toward the center and the peripheral direction of the substrate W, and is supplied to the surface of the substrate W.
The developer is spread over the entire surface of.
【0003】[0003]
【発明が解決しようとする課題】図9に示したような現
像液供給ノズル1では、複数個の吐出孔3から現像液が
基板W上にそれぞれスポット的に供給され、基板Wの回
転によって基板Wの表面全体に現像液が広げられるの
で、基板W面に現像液が最初に当たった場所とそれ以外
の場所とで現像むらを生じる恐れがある。また、現像液
供給配管5には屈曲部等があるが、このため、現像液供
給ノズル1に到達するまでに配管内を流れる現像液の流
速が、流路の横断面方向における位置によって異なるこ
とになる。そして、流路の位置による現像液の流速の違
いが、筒体2の円周方向に穿設された各吐出孔3からそ
れぞれ吐出される現像液の流速の違いとなって現れ、現
像液供給ノズル1の複数個の吐出孔3から現像液が吐出
される際の吐出バランスが不安定になり、基板W面内に
おける現像むら等の処理の不均一を招く、といった問題
点がある。さらに、現像液供給ノズル1の吐出孔3から
吐出された現像液が基板Wの表面に着液した際に、現像
液に空気が捕捉されたり、現像液中に溶存していた窒素
が微細な気泡に変化したりして、現像液中にいわゆるマ
イクロバブルを発生させ、基板Wの表面を覆った現像
液、例えば現像液にマイクロバブルが生じることによっ
て現像不良が発生する、といったような不都合がある。In the developing solution supply nozzle 1 as shown in FIG . 9 , the developing solution is spotwise supplied from the plurality of discharge holes 3 onto the substrate W, and the substrate W is rotated to rotate the substrate. Since the developing solution is spread over the entire surface of W, uneven development may occur at the place where the developing solution first hits the surface of the substrate W and at other places. Further, the developer supply pipe 5 has a bent portion and the like. Therefore, the flow velocity of the developer flowing through the pipe before reaching the developer supply nozzle 1 may vary depending on the position of the flow passage in the cross-sectional direction. become. Then, the difference in the flow rate of the developing solution depending on the position of the flow path appears as the difference in the flow rate of the developing solution discharged from the respective discharge holes 3 formed in the circumferential direction of the cylindrical body 2, and the developing solution is supplied. There is a problem that the ejection balance when the developing solution is ejected from the plurality of ejection holes 3 of the nozzle 1 becomes unstable, and uneven processing such as uneven development on the surface of the substrate W is caused. Further, when the developer discharged from the discharge holes 3 of the developer supply nozzle 1 reaches the surface of the substrate W, air is trapped in the developer or nitrogen dissolved in the developer is minute. There is a problem such that a so-called micro bubble is generated in the developing solution by changing into bubbles and the developing solution that covers the surface of the substrate W, for example, a developing solution causes micro-bubbles to cause poor development. is there.
【0004】この発明は、以上のような事情に鑑みてな
されたものであり、処理液供給ノズルの吐出口から吐出
された処理液が基板の表面へ満遍なく供給されて、現像
むらなどの処理むらを生じることがなく、また、処理液
供給ノズルに到達するまでに現像液供給配管内を流れる
処理液の流速が流路の横断面方向における位置によって
異なることがあっても、その流路の位置による処理液の
流速の違いを緩和させて、基板面内における処理の均一
性を向上させ、さらに、基板上に供給され基板表面を覆
った処理液中にはマイクロバブルが生じないようにし
て、マイクロバブルによる不都合を解消することができ
る基板回転式処理装置を提供することを課題とする。The present invention has been made in view of the above circumstances, and the processing liquid discharged from the discharge port of the processing liquid supply nozzle is evenly supplied to the surface of the substrate to cause uneven processing such as uneven development. Even if the flow velocity of the processing liquid flowing in the developing solution supply pipe before reaching the processing liquid supply nozzle may vary depending on the position in the cross-sectional direction of the flow path, the position of the flow path By reducing the difference in the flow rate of the processing liquid due to the, to improve the uniformity of processing in the substrate surface, further, to prevent the generation of microbubbles in the processing liquid supplied on the substrate and covering the substrate surface, An object of the present invention is to provide a substrate rotary processing apparatus that can eliminate the inconvenience caused by microbubbles.
【0005】[0005]
【課題を解決するための手段】請求項1に係る発明は、
基板を水平姿勢に保持して鉛直軸回りに回転させる基板
保持・回転手段と、処理液を吐出する吐出口を有し、前
記基板保持・回転手段に保持された基板の表面に処理液
を供給する処理液供給ノズルとを備えた基板回転式処理
装置において、前記処理液供給ノズルの下端面に複数個
の吐出口を円周上に等配して形設するとともに、平面形
状が対称形をなし、中心部が、前記処理液供給ノズルの
下端面の中心部から下向きに延出した連接部を介してノ
ズル下端面の中心部に連接された液当て部材を、処理液
供給ノズルの吐出口に対向させかつ前記基板保持・回転
手段に保持された基板の表面と処理液供給ノズルの吐出
口との間に介在させて配設し、その液当て部材により、
吐出口から吐出された処理液がそのまま基板上へ流下す
るのを遮り、吐出口から液当て部材の表面へ吐出された
処理液をその表面に沿って流動させ、液当て部材の端縁
から基板上へ処理液を流下させるようにしたことを特徴
とする。The invention according to claim 1 is
It has a substrate holding / rotating means for holding the substrate in a horizontal posture and rotating it about a vertical axis, and a discharge port for discharging the processing liquid, and supplies the processing liquid to the surface of the substrate held by the substrate holding / rotating means. And a plurality of processing liquid supply nozzles on the lower end surface of the processing liquid supply nozzle.
The discharge ports of the
The shape is symmetrical, and the center part is the processing liquid supply nozzle.
Through the connecting part that extends downward from the center of the lower end surface,
The liquid contact member connected to the center of the lower end surface of the nozzle is opposed to the discharge port of the processing liquid supply nozzle and between the surface of the substrate held by the substrate holding / rotating means and the discharge port of the processing liquid supply nozzle. interposed therebetween and arranged by the liquid contact member, the
The processing liquid discharged from the discharge port is blocked from flowing down onto the substrate as it is, and the processing liquid discharged from the discharge port to the surface of the liquid applying member is caused to flow along the surface, and the edge of the liquid applying member is applied to the substrate. It is characterized in that the treatment liquid is made to flow downward.
【0006】[0006]
【0007】請求項2に係る発明は、基板を水平姿勢に
保持して鉛直軸回りに回転させる基板保持・回転手段
と、処理液を吐出する吐出口を有し、前記基板保持・回
転手段に保持された基板の表面に処理液を供給する処理
液供給ノズルとを備えた基板回転式処理装置において、
底面全体が凹面状とされた液当て部材を、前記処理液供
給ノズルの吐出口に対向させ、かつ、前記基板保持・回
転手段に保持された基板の表面と処理液供給ノズルの吐
出口との間に介在させて配設し、その液当て部材によ
り、吐出口から吐出された処理液がそのまま基板上へ流
下するのを遮り処理液を液当て部材の表面に沿って流動
させ端縁から基板上へ流下させるようにしたことを特徴
とする。According to a second aspect of the invention, the substrate is placed in a horizontal posture.
Substrate holding / rotating means for holding and rotating around a vertical axis
And a discharge port for discharging the processing liquid.
Processing for supplying the processing liquid to the surface of the substrate held by the transfer means
In a substrate rotary processing apparatus having a liquid supply nozzle,
A liquid contact member with a concave bottom surface is used to supply the processing liquid.
Face the discharge port of the supply nozzle and hold and rotate the substrate.
The surface of the substrate held by the transfer means and the discharge of the processing liquid supply nozzle
It is placed so as to be interposed between the outlet and the liquid contact member.
The processing liquid discharged from the discharge port directly flows onto the substrate.
Block the falling liquid and flow the treatment liquid along the surface of the liquid application member.
It is characterized in that it is made to flow down from the edge onto the substrate .
【0008】上記した請求項1に係る発明の基板回転式
処理装置では、処理液供給ノズルの吐出口から吐出され
た処理液がそのまま基板上へ流下するのではなく、処理
液供給ノズル下端の、円周上に等配して形設された複数
個の吐出口から液当て部材の表面へ、その円周方向にお
いて均等に処理液が吐出され、液当て部材の表面上に流
下した処理液は、液当て部材の表面に沿って流動した
後、平面形状が対称形をなす液当て部材の全周周縁から
基板の表面に、その全周方向において均等に処理液が流
下する。従って、処理液は、液当て部材の端縁全体から
カーテン状に基板の表面へ満遍なく供給されることとな
る。また、処理液供給ノズルに到達するまでに現像液供
給配管内を流れる処理液の流速が流路の横断面方向にお
ける位置によって異なることがあっても、処理液供給ノ
ズルの吐出口から吐出された処理液は、液当て部材の表
面を経由した後に基板上へ供給されるので、流路の位置
による処理液の流速の違いが緩和されることとなる。さ
らに、処理液供給ノズルの吐出口から吐出された処理液
が液当て部材の表面に着液した際に、処理液中にマイク
ロバブルが発生し、このマイクロバブルは、処理液が液
当て部材の表面上を流れる間に空気中へ拡散して消失す
る。従って、液当て部材から基板の表面へ流下して基板
表面を覆った処理液中には、マイクロバブルが混在しな
いこととなる。In the substrate rotary processing apparatus according to the first aspect of the present invention, the processing liquid discharged from the discharge port of the processing liquid supply nozzle does not flow directly onto the substrate but is processed.
A plurality of liquid supply nozzles that are equidistantly formed on the circumference of the lower end of the liquid supply nozzle
From the individual discharge ports to the surface of the liquid contact member,
The treatment liquid is evenly discharged and flows over the surface of the liquid contact member.
After the treatment liquid has flowed along the surface of the liquid applying member , the processing liquid is applied from the entire peripheral edge of the liquid applying member having a symmetrical planar shape.
The treatment liquid evenly flows down on the surface of the substrate in the entire circumferential direction . Therefore, the processing liquid is evenly supplied to the surface of the substrate in a curtain shape from the entire edge of the liquid application member. Further, even if the flow velocity of the processing liquid flowing in the developing liquid supply pipe before reaching the processing liquid supply nozzle may vary depending on the position in the cross-sectional direction of the flow path, it is discharged from the discharge port of the processing liquid supply nozzle. Since the treatment liquid is supplied onto the substrate after passing through the surface of the liquid contact member, the difference in the flow velocity of the treatment liquid depending on the position of the flow path is alleviated. Furthermore, when the treatment liquid ejected from the ejection port of the treatment liquid supply nozzle reaches the surface of the liquid contact member, microbubbles are generated in the treatment liquid. While flowing over the surface, it diffuses into the air and disappears. Therefore, micro bubbles do not coexist in the processing liquid that has flowed down from the liquid contact member to the surface of the substrate and covered the surface of the substrate.
【0009】[0009]
【0010】請求項2に係る発明の基板回転式処理装置
では、処理液供給ノズルの吐出口から吐出された処理液
は、そのまま基板上へ流下せずに、液当て部材の表面上
に流下し、その表面に沿って流動した後、液当て部材の
端縁から基板上へ流下する。従って、処理液は、液当て
部材の端縁全体からカーテン状に基板の表面へ満遍なく
供給されることとなる。また、処理液供給ノズルに到達
するまでに現像液供給配管内を流れる処理液の流速が流
路の横断面方向における位置によって異なることがあっ
ても、処理液供給ノズルの吐出口から吐出された処理液
は、液当て部材の表面を経由した後に基板上へ供給され
るので、流路の位置による処理液の流速の違いが緩和さ
れることとなる。さらに、処理液供給ノズルの吐出口か
ら吐出された処理液が液当て部材の表面に着液した際
に、処理液中にマイクロバブルが発生し、このマイクロ
バブルは、処理液が液当て部材の表面上を流れる間に空
気中へ拡散して消失する。従って、液当て部材から基板
の表面へ流下して基板表面を覆った処理液中には、マイ
クロバブルが混在しないこととなる。また、液当て部材
の底面全体が凹面状となっていることにより、液当て部
材の端縁での液切れが良好になる。In the substrate rotary processing apparatus according to the second aspect of the present invention, the processing liquid discharged from the discharge port of the processing liquid supply nozzle is used.
On the surface of the liquid contact member without directly flowing down onto the substrate.
After flowing down to the surface and flowing along its surface,
Run down from the edge onto the substrate. Therefore, the treatment liquid
Curtain-like from the entire edge of the member to the surface of the substrate
Will be supplied. Also reaches the processing liquid supply nozzle
The flow rate of the processing liquid flowing in the developer supply pipe
It may vary depending on the position in the cross-sectional direction of the road.
Even the processing liquid discharged from the discharge port of the processing liquid supply nozzle
Is supplied onto the substrate after passing through the surface of the liquid contact member.
Therefore, the difference in the flow rate of the processing liquid due to the position of the flow path is reduced.
Will be done. In addition, whether the discharge port of the processing liquid supply nozzle
When the processing liquid ejected from the liquid reaches the surface of the liquid contact member
In addition, micro bubbles are generated in the treatment liquid.
Bubbles are emptied while the processing liquid flows on the surface of the liquid application member.
Disperses into the air and disappears. Therefore, from the liquid contact member to the substrate
In the processing liquid that has flowed down to the surface of the substrate and covered the substrate surface,
Black bubbles will not be mixed. Further, since the entire bottom surface of the liquid contacting member is concave, liquid drainage at the edge of the liquid contacting member becomes good.
【0011】[0011]
【発明の実施の形態】以下、この発明の最良の実施形態
について図面を参照しながら説明する。BEST MODE FOR CARRYING OUT THE INVENTION The best mode for carrying out the present invention will be described below with reference to the drawings.
【0012】図1及び図2は、この発明の実施の形態の
1例を示し、図1は、スピンデベロッパの一部の構成を
示す斜視図、図2は、その正面図である。スピンデベロ
ッパは、図示されているように、現像液供給ノズル1
0、基板Wを水平姿勢に保持するスピンチャック12、
及び、スピンチャック12を支持する回転軸14を備え
ている他、図示を省略しているが、回転軸14を回転さ
せてスピンチャック12に保持された基板Wを鉛直軸回
りに回転させるスピンモータ、スピンチャック12に保
持された基板Wの側方及び下方を取り囲むように配設さ
れ基板W上から周囲へ飛散する現像液を回収するカッ
プ、現像液供給ノズル10を、スピンチャック12に保
持された基板Wの外周縁より外側の待機位置と基板Wの
直上の現像液供給位置との間で移動させるノズル移動機
構などを備えている。それら図示されていない構成要素
は、従来のスピンデベロッパと同じであり、その説明を
省略し、以下では、スピンチャック12に水平姿勢に保
持された基板Wの表面に現像液を供給する現像液供給部
について、主として説明する。1 and 2 show an example of an embodiment of the present invention. FIG. 1 is a perspective view showing a part of the structure of a spin developer, and FIG. 2 is a front view thereof. The spin developer, as shown, is a developer supply nozzle 1
0, a spin chuck 12 for holding the substrate W in a horizontal posture,
Further, although not shown, the spin motor includes a rotating shaft 14 that supports the spin chuck 12, and rotates the rotating shaft 14 to rotate the substrate W held by the spin chuck 12 around a vertical axis. The spin chuck 12 holds a cup, which is provided so as to surround the side and the lower side of the substrate W held by the spin chuck 12 and collects the developing solution scattered from above the substrate W, and the developing solution supply nozzle 10. In addition, a nozzle moving mechanism for moving between a standby position outside the outer peripheral edge of the substrate W and a developing solution supply position directly above the substrate W is provided. The components not shown are the same as those of the conventional spin developer, and the description thereof will be omitted. In the following, a developer supply that supplies a developer to the surface of the substrate W held in the horizontal position by the spin chuck 12 will be described. The parts will be mainly described.
【0013】現像液供給ノズル10の筒状体16は、図
示しない現像液供給配管に流路接続されており、筒状体
16の先端部に現像液流下エレメント18が一体的に固
着されている。現像液流下エレメント18は、筒状体1
6の先端開口を閉塞するように取り付けられており、こ
のエレメント18には、その縦断面図を図3に、上方か
ら見た平面図を図4にそれぞれ示すように、筒状体16
の先端部に嵌合されてその開口面を閉塞する詰栓部20
と、その中心部から下向きに延出した連接部22と、こ
の連接部22が中心部に連接して平面形状が円形をなす
液当て部材24とから構成され、それらが、例えばフッ
化樹脂によって一体形成されている。詰栓部20には、
複数個の吐出孔26が円周上に等配して形設されてお
り、吐出孔26の下端の吐出口28に対向しスピンチャ
ック12に保持された基板Wの表面と各吐出口28との
間に介在するように液当て部材24が配置されている。
液当て部材24の底面は、その全体が凹面30に形成さ
れている。現像液流下エレメント18は、液当て部材2
4の底面が基板W上の現像液と接触しない程度の距離、
例えば液当て部材24の底面と基板Wの表面との間に4
mm程度の距離を設けるようにして、基板Wの上方に配
置される。The tubular body 16 of the developing solution supply nozzle 10 is connected to a developing solution supply pipe (not shown), and a developing solution flow-down element 18 is integrally fixed to the tip of the tubular body 16. . The developer flow-down element 18 is the cylindrical body 1.
6 is attached so as to close the front end opening of the tubular body 16. As shown in a longitudinal sectional view of FIG. 3 and a plan view from above in FIG.
Plug part 20 that is fitted to the tip of the plug to close the opening surface of the plug
And a connecting portion 22 extending downward from the central portion thereof, and a liquid contacting member 24 that is connected to the central portion and has a circular planar shape, and these are made of, for example, a fluororesin. It is integrally formed. The stopper 20 has
A plurality of ejection holes 26 are formed on the circumference at equal intervals, and face the ejection openings 28 at the lower end of the ejection holes 26 and the surface of the substrate W held by the spin chuck 12 and each ejection opening 28. The liquid contact member 24 is arranged so as to be interposed between the liquid contact member 24 and the liquid contact member 24.
The entire bottom surface of the liquid contact member 24 is formed as a concave surface 30. The developer flow-down element 18 includes the liquid contact member 2
A distance such that the bottom surface of 4 does not come into contact with the developer on the substrate W,
For example, between the bottom surface of the liquid contact member 24 and the surface of the substrate W, 4
It is arranged above the substrate W with a distance of about mm.
【0014】上記したような構成の基板回転式処理装置
では、図2に示すように、現像液供給ノズル10の複数
個の吐出口28から現像液が、例えば0.5 l/mi
n〜1.5 l/minの流量で吐出されると、現像液
は、そのまま基板W上へ流下せずに、液当て部材24上
に流下してその表面に沿って流動した後その周縁から基
板W上へ流下することとなる。そして、現像液供給ノズ
ル10の複数個の吐出口28は円周上に等配されてお
り、また、液当て部材24の平面形状は円形をなしてい
るので、現像液は、現像液供給ノズル10の複数個の吐
出口28から円周方向において均等に吐出され、液当て
部材24の全周周縁から均等に基板Wの表面に流下す
る。このため、現像液は、液当て部材24の周縁全体か
らカーテン状に基板Wの表面へ満遍なく供給されること
となる。尚、現像液供給ノズル10の吐出口28から吐
出された現像液が液当て部材24の表面に着液した際に
現像液中にマイクロバブルが発生するが、このマイクロ
バブルは、現像液が液当て部材24の表面上を流れる間
に空気中へ拡散して消失してしまい、液当て部材24か
ら基板Wの表面へ流下して基板W表面を覆った現像液中
にマイクロバブルが混在することはない。In the substrate rotary processing apparatus having the above-described structure, as shown in FIG. 2, the developing solution is discharged from the plurality of ejection openings 28 of the developing solution supply nozzle 10 at 0.5 l / mi, for example.
When discharged at a flow rate of n to 1.5 l / min, the developing solution does not flow down onto the substrate W as it is, but flows down onto the liquid contact member 24 and flows along the surface thereof, and then from the peripheral edge thereof. It will flow down onto the substrate W. The plurality of discharge ports 28 of the developing solution supply nozzle 10 are evenly arranged on the circumference, and the plan view of the liquid contact member 24 is circular, so that the developing solution is supplied to the developing solution supply nozzle. The liquid is evenly ejected from the plurality of ejection ports 28 in the circumferential direction and evenly flows down from the entire peripheral edge of the liquid contact member 24 onto the surface of the substrate W. For this reason, the developing solution is evenly supplied to the surface of the substrate W in a curtain shape from the entire peripheral edge of the liquid application member 24. Incidentally, when the developer discharged from the discharge port 28 of the developer supply nozzle 10 reaches the surface of the liquid contact member 24, micro bubbles are generated in the developer. Micro bubbles are mixed in the developer that has diffused and disappeared into the air while flowing on the surface of the patch member 24 and flowed down from the liquid patch member 24 to the surface of the substrate W to cover the surface of the substrate W. There is no.
【0015】液当て部材の外形や構造などは、図1ない
し図4に示したものに限定されず、種々のものを使用す
ることができる。 The outer shape and the structure of the liquid contact member are not limited to those shown in FIGS. 1 to 4, and various kinds can be used .
【0016】また、上記した液当て部材24は、その底
面全体を凹面30に形成して、周縁での液切れが良好に
なるようにされているが、図5に示した液当て部材38
のように、底面全体を凸面40に形成して、底面部での
液切れを改善するようにすることもできる。図中の符号
42は、現像液供給ノズル(図示せず)の下端面の中心
部から延出した連接部である。Further, the liquid contacting member 24 described above is formed so that the entire bottom surface thereof is formed into the concave surface 30 so that the liquid is easily drained at the peripheral edge . However, the liquid contacting member 38 shown in FIG.
As described above, it is possible to form the entire bottom surface into the convex surface 40 so as to improve drainage at the bottom surface portion. Reference numeral 42 in the drawing is a connecting portion extending from the center of the lower end surface of the developing solution supply nozzle (not shown).
【0017】図6に示した液当て部材44は、全体の形
状が四角錐状をなした例である。図中の符号46は、現
像液供給ノズル(図示せず)の下端面の中心部から延出
した連接部である。液当て部材の外形としては、この
他、三角錐状、六角錐状等の多角錐状でもよく、また、
半球状でもよく、さらには球状や楕円球状でもよい。The liquid application member 44 shown in FIG . 6 is an example in which the entire shape is a quadrangular pyramid. Reference numeral 46 in the drawing denotes a connecting portion extending from the center of the lower end surface of the developing solution supply nozzle (not shown). In addition to this, the outer shape of the liquid contact member may be a polygonal pyramid such as a triangular pyramid or a hexagonal pyramid .
It may be hemispherical, spherical, or elliptical.
【0018】図7に示した液当て部材48は、その表面
に複数本の溝50を円周方向に等配して放射状に形成し
た構成を有する。この液当て部材48では、図示しない
現像液供給ノズルの吐出口から吐出されて流下した現像
液が、複数本の溝50に案内されて放射方向へ均等に流
れ、液当て部材48の周縁全体から均等に基板の表面へ
供給されることとなる。また、図8に示した液当て部材
54は、その周端縁部の複数個所に切欠き56を円周方
向に等配して形成した構成を有する。このように、液当
て部材54の周端縁部の複数個所に切欠き56を等配し
て形成することにより、図示しない現像液供給ノズルの
吐出口から吐出されて流下した現像液が何れかの方向に
偏って流れるのを防止することができ、液当て部材54
の周縁全体から均等に基板の表面へ現像液を供給するこ
とが可能になる。図中の符号52、58はそれぞれ、現
像液供給ノズル下端面の中心部から延出した連接部であ
る。The liquid contact member 48 shown in FIG . 7 has a structure in which a plurality of grooves 50 are equally arranged in the circumferential direction on the surface thereof and are radially formed. In the liquid contact member 48, the developer discharged from the discharge port of the developer supply nozzle (not shown) and flowing down is uniformly guided in the radial direction by being guided by the plurality of grooves 50, and from the entire periphery of the liquid contact member 48. It is evenly supplied to the surface of the substrate. Further, the liquid contact member 54 shown in FIG. 8 has a configuration in which notches 56 are formed at equal positions in the circumferential direction at a plurality of positions on the peripheral edge portion thereof. As described above, the notches 56 are equally formed at a plurality of positions on the peripheral edge portion of the liquid contact member 54, so that the developer discharged from the discharge port of the developer supply nozzle (not shown) flows down. It is possible to prevent the liquid from flowing in one direction, and the liquid contact member 54
It is possible to uniformly supply the developing solution to the surface of the substrate from the entire periphery of the substrate. Reference numerals 52 and 58 in the figure respectively denote connecting portions extending from the central portion of the lower end surface of the developing solution supply nozzle.
【0019】[0019]
【0020】[0020]
【0021】尚、現像液供給ノズル及び液当て部材は、
基板への現像液の供給時に停止させるようにしてもよい
し、基板の表面に沿って移動させながら基板の表面へ現
像液を供給するようにしてもよい。The developer supply nozzle and the liquid contact member are
It may be stopped when the developing solution is supplied to the substrate, or the developing solution may be supplied to the surface of the substrate while moving along the surface of the substrate.
【0022】[0022]
【発明の効果】請求項1及び請求項2に係る各発明の基
板回転式処理装置を使用すると、処理液供給ノズルの吐
出口から吐出された処理液は、液当て部材の端縁全体か
らカーテン状に基板の表面へ満遍なく供給されるので、
基板表面への処理液の不均一な供給による現像むらなど
の処理むらを生じることがなくなる。また、処理液供給
ノズルに到達するまでに現像液供給配管内を流れる処理
液の流速が流路の横断面方向における位置によって異な
ることがあっても、その流路の位置による処理液の流速
の違いが緩和されるので、従来の装置に比べて基板面内
における処理の均一性が向上する。さらに、液当て部材
から基板の表面へ流下して基板表面を覆った処理液中に
はマイクロバブルが混在することが抑えられるので、マ
イクロバブルによる現像不良等の不都合を解消すること
ができる。When the substrate rotary processing apparatus according to each of the first and second aspects of the present invention is used, the processing liquid discharged from the discharge port of the processing liquid supply nozzle is curtained from the entire edge of the liquid applying member. Since it is evenly supplied to the surface of the substrate,
It is possible to prevent uneven processing such as uneven development due to uneven supply of the processing liquid to the substrate surface. Further, even if the flow velocity of the treatment liquid flowing in the developer supply pipe before reaching the treatment liquid supply nozzle may vary depending on the position in the cross-sectional direction of the flow passage, the flow velocity of the treatment liquid depends on the position of the flow passage. Since the difference is alleviated, the uniformity of processing in the substrate plane is improved as compared with the conventional apparatus. Furthermore, since it is possible to prevent microbubbles from being mixed in the processing liquid that has flowed down from the liquid application member to the surface of the substrate and covered the surface of the substrate, it is possible to eliminate inconveniences such as defective development due to the microbubbles.
【0023】また、請求項1に係る発明の基板回転式処
理装置では、処理液供給ノズルの複数個の吐出口から液
当て部材の表面へその円周方向において均等に処理液が
吐出され、平面形状が対称形をなす液当て部材の全周端
縁から基板の表面にその全周方向において均等に処理液
が流下するので、基板表面への処理液の不均一な供給に
よる処理むらの発生をより確実に防止することができ
る。Further, in the substrate rotary processing apparatus according to the first aspect of the present invention, the processing liquid is evenly discharged in the circumferential direction from the plurality of discharge ports of the processing liquid supply nozzle to the surface of the liquid contact member, and the flat surface is obtained. Since the processing liquid flows down evenly in the entire circumferential direction from the entire peripheral edge of the liquid contact member having a symmetrical shape to the surface of the substrate, uneven processing may occur due to uneven supply of the processing liquid to the substrate surface. It can be prevented more reliably.
【0024】また、請求項2に係る発明の基板回転式処
理装置では、液当て部材の端縁での液切れが良好になる
ので、基板の表面への不要な処理液の滴下が無くなっ
て、処理むらが生じるのを防ぐことができる。Further , in the substrate rotary processing apparatus according to the second aspect of the present invention, since the liquid is well drained at the edge of the liquid contact member, unnecessary dripping of the processing liquid on the surface of the substrate is eliminated, It is possible to prevent uneven processing.
【図1】この発明の実施の形態の1例を示し、スピンデ
ベロッパの一部の構成を示す斜視図である。FIG. 1 is a perspective view showing an example of an embodiment of the present invention and showing a partial configuration of a spin developer.
【図2】図1に示したスピンデベロッパの一部正面図で
ある。FIG. 2 is a partial front view of the spin developer shown in FIG.
【図3】図1に示したスピンデベロッパの現像液供給部
を構成する現像液流下エレメントの縦断面図である。3 is a vertical cross-sectional view of a developer flow-down element that constitutes a developer supply unit of the spin developer shown in FIG.
【図4】図3に示した現像液流下エレメントを上方から
見た平面図である。FIG. 4 is a plan view of the developer flow-down element shown in FIG. 3 viewed from above.
【図5】図1ないし図4に示した液当て部材とは別の構
成例を示す液当て部材の正面図である。5 is a front view of a liquid application member showing a configuration example different from that of the liquid application members shown in FIGS. 1 to 4. FIG .
【図6】同じく別の構成例を示す液当て部材の斜視図で
ある。FIG. 6 is a perspective view of a liquid contact member showing another configuration example.
【図7】同じく別の構成例を示す液当て部材の斜視図で
ある。FIG. 7 is a perspective view of a liquid contacting member similarly showing another configuration example.
【図8】同じく別の構成例を示す液当て部材の斜視図で
ある。FIG. 8 is a perspective view of a liquid contacting member similarly showing another configuration example.
【図9】従来のスピンデベロッパにおける現像液供給ノ
ズルの構成の1例を示す要部斜視図である。FIG. 9 is a developer supply nozzle in a conventional spin developer.
It is a principal part perspective view which shows an example of a structure of a cheat .
10 現像液供給ノズル 12 スピンチャック 14 回転軸 18 現像液流下エレメント 22、42、46、52、58 連接部 24、38、44、48、54 液当て部材 26 吐出孔 28 吐出口 30 凹面1 0 developer supply nozzle 12 spin chuck 14 rotation axis 18 developer flows down element 22,42,46,52,58 articulation 24, 3 8,44,48,5 4 liquid contact member 26 discharge holes 28 discharge opening 30 concave surface
───────────────────────────────────────────────────── フロントページの続き (72)発明者 吉井 弘至 京都市伏見区羽束師古川町322番地 大 日本スクリーン製造株式会社 洛西事業 所内 (56)参考文献 特開 平6−338449(JP,A) 特開 平8−330211(JP,A) 特開 平7−326554(JP,A) 特開 昭62−92441(JP,A) 特開 平5−55133(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/027 G03F 7/30 502 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Hiroshi Yoshii, 322 Hazushishi Furukawa-cho, Fushimi-ku, Kyoto Dai Nippon Screen Mfg. Co., Ltd. Rakusai Plant (56) Reference JP-A-6-338449 (JP, A) Special Kaihei 8-330211 (JP, A) JP 7-326554 (JP, A) JP 62-92441 (JP, A) JP 5-55133 (JP, A) (58) Fields investigated ( Int.Cl. 7 , DB name) H01L 21/027 G03F 7/30 502
Claims (2)
回転させる基板保持・回転手段と、 処理液を吐出する吐出口を有し、前記基板保持・回転手
段に保持された基板の表面に処理液を供給する処理液供
給ノズルとを備えた基板回転式処理装置において、 前記処理液供給ノズルの下端面に複数個の吐出口を円周
上に等配して形設するとともに、 平面形状が対称形をなし、中心部が、前記処理液供給ノ
ズルの下端面の中心部から下向きに延出した連接部を介
してノズル下端面の中心部に連接された液当て部材を、
処理液供給ノズルの吐出口に対向させ、かつ、前記基板
保持・回転手段に保持された基板の表面と処理液供給ノ
ズルの吐出口との間に介在させて配設し、その液当て部
材により、吐出口から吐出された処理液がそのまま基板
上へ流下するのを遮り処理液を液当て部材の表面に沿っ
て流動させ端縁から基板上へ流下させるようにしたこと
を特徴とする基板回転式処理装置。1. A surface of a substrate held by the substrate holding / rotating means, which has a substrate holding / rotating means for holding the substrate in a horizontal posture and rotating it about a vertical axis, and a discharge port for discharging a processing liquid. In a substrate rotary processing apparatus having a processing liquid supply nozzle for supplying a processing liquid to a substrate , a plurality of discharge ports are circumferentially formed on a lower end surface of the processing liquid supply nozzle.
They are evenly distributed on the top and have a symmetrical planar shape, and the central part is the processing liquid supply nozzle.
Through the connecting part that extends downward from the center of the lower surface of the
The liquid contact member connected to the center of the lower end surface of the nozzle,
The liquid contact portion is arranged so as to face the discharge port of the processing liquid supply nozzle and to be interposed between the surface of the substrate held by the substrate holding / rotating means and the discharge port of the processing liquid supply nozzle.
Wood by, characterized in that the process liquid discharged from the discharge ports so as to flow down from the allowed edge flows along the surface of the processing liquid the liquid contact member intercept to flow down onto the substrate as it is on a substrate Substrate rotary processing equipment.
回転させる基板保持・回転手段と、 処理液を吐出する吐出口を有し、前記基板保持・回転手
段に保持された基板の表面に処理液を供給する処理液供
給ノズルとを備えた基板回転式処理装置において、 底面全体が凹面状とされた液当て部材を、前記処理液供
給ノズルの吐出口に対向させ、かつ、前記基板保持・回
転手段に保持された基板の表面と処理液供給ノズルの吐
出口との間に介在させて配設し、その液当て部材によ
り、吐出口から吐出された処理液がそのまま基板上へ流
下するのを遮り処理液を液当て部材の表面に沿って流動
させ端縁から基板上へ流下させるようにしたことを特徴
とする 基板回転式処理装置。2. A substrate is held in a horizontal posture and is rotated about a vertical axis.
The substrate holding / rotating means has a substrate holding / rotating means for rotating and a discharge port for discharging the processing liquid.
Supplying the processing liquid to the surface of the substrate held on the step
In a substrate rotary processing apparatus having a supply nozzle, a liquid application member having a concave bottom surface is used to supply the processing liquid.
Face the discharge port of the supply nozzle and hold and rotate the substrate.
The surface of the substrate held by the transfer means and the discharge of the processing liquid supply nozzle
It is placed so as to be interposed between the outlet and the liquid contact member.
The processing liquid discharged from the discharge port directly flows onto the substrate.
Block the falling liquid and flow the treatment liquid along the surface of the liquid application member.
The feature is that it is made to flow down from the edge onto the substrate.
Substrate rotating apparatus for treating.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP30206195A JP3414564B2 (en) | 1995-10-25 | 1995-10-25 | Substrate rotary processing equipment |
| US08/731,245 US5788773A (en) | 1995-10-25 | 1996-10-11 | Substrate spin treating method and apparatus |
| KR1019960047443A KR100221699B1 (en) | 1995-10-25 | 1996-10-22 | Substrate Rotation Type Processing Method and Substrate Rotation Type Processing Device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP30206195A JP3414564B2 (en) | 1995-10-25 | 1995-10-25 | Substrate rotary processing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09120941A JPH09120941A (en) | 1997-05-06 |
| JP3414564B2 true JP3414564B2 (en) | 2003-06-09 |
Family
ID=17904448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP30206195A Expired - Fee Related JP3414564B2 (en) | 1995-10-25 | 1995-10-25 | Substrate rotary processing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3414564B2 (en) |
-
1995
- 1995-10-25 JP JP30206195A patent/JP3414564B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH09120941A (en) | 1997-05-06 |
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