JP3534894B2 - Inter-pitch control method and apparatus in continuous inspection refinement line - Google Patents
Inter-pitch control method and apparatus in continuous inspection refinement lineInfo
- Publication number
- JP3534894B2 JP3534894B2 JP12178495A JP12178495A JP3534894B2 JP 3534894 B2 JP3534894 B2 JP 3534894B2 JP 12178495 A JP12178495 A JP 12178495A JP 12178495 A JP12178495 A JP 12178495A JP 3534894 B2 JP3534894 B2 JP 3534894B2
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- pitch
- conditioning
- line
- sequencer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Control Of Conveyors (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、各種材料について検査
あるいは精整の複数工程を連続して行う連続検査精整ラ
インにおいて、材料供給の間ピッチを制御する方法およ
び装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for controlling a pitch during material supply in a continuous inspection and conditioning line in which a plurality of inspection or conditioning steps for various materials are continuously performed.
【0002】[0002]
【従来の技術】各種材料の製造工程において、材質検査
や欠陥検出等の検査工程、および研磨や切断等を行う精
整工程には、多くの種類があり、材料に応じて、各種検
査や精整工程を組合わせた作業が行われる。このような
作業の効率化のため、各検査装置あるいは精整装置の前
後に給材装置および払出装置を設けて検査精整設備を構
成し、材料に応じて、必要な検査精整設備を通すことが
行われる。2. Description of the Related Art In the manufacturing process of various materials, there are many types of inspection processes such as material inspection and defect detection, and polishing processes such as polishing and cutting. Work that combines the adjustment process is performed. In order to improve the efficiency of such work, supply equipment and payout equipment are installed before and after each inspection device or adjustment device to configure inspection adjustment equipment, and pass the required inspection adjustment equipment according to the material. Is done.
【0003】検査装置や精整装置には単一のもののほ
か、複数の検査装置、複数の精整装置、あるいは検査装
置と精整装置を組合わせて連続的に配置したものもあ
り、本明細書では、これらを総称して検査精整装置とい
う。そして、その前後に給材装置および払出装置を設け
たものを、検査精整設備という。また、これら検査精整
設備を複数連続して配置したものを、連続検査精整ライ
ンという。In addition to the single inspection device and the adjusting device, there are a plurality of inspection devices, a plurality of adjusting devices, or a combination of the inspection device and the adjusting device which are continuously arranged. In the book, these are collectively referred to as the inspection and conditioning device. And what provided the material supply apparatus and the payout apparatus before and behind that is called inspection and adjustment equipment. In addition, a line in which a plurality of these inspection and adjustment facilities are arranged in succession is called a continuous inspection and adjustment line.
【0004】このような連続検査精整ラインの例を図2
に示す。材料は、まず検査精整設備Aの給材装置1に供
給され、検査精整装置2および払出装置3を順に搬送さ
れて処理される。ついで検査精整設備Bの給材装置1、
検査精整装置2および払出装置3を搬送され、さらに検
査精整設備Cの給材装置1、検査精整装置2および払出
装置3を搬送されて、それぞれの処理が行われる。図2
において、検査精整設備Bには、検査精整装置2が2種
あり、払出装置3の下流側にリジェクト材搬出装置4が
設けてある。An example of such a continuous inspection and conditioning line is shown in FIG.
Shown in. The material is first supplied to the material supplying device 1 of the inspection and conditioning equipment A, and then conveyed through the inspection and conditioning device 2 and the dispensing device 3 in that order for processing. Then, the material supply device 1 of the inspection and conditioning equipment B,
The inspection and conditioning device 2 and the dispensing device 3 are conveyed, and further, the material supplying device 1, the inspection and conditioning device 2 and the dispensing device 3 of the inspection and conditioning facility C are conveyed, and the respective processes are performed. Figure 2
In the inspection and conditioning equipment B, there are two types of inspection and conditioning devices 2, and a reject material unloading device 4 is provided on the downstream side of the dispensing device 3.
【0005】ところで、各検査精整装置2の処理能力は
異なり、また、つぎつぎに供給され順番に搬送される材
料の種類やサイズが変動することもあるため、ライン全
体の処理能力を最も効率的に発揮させることを目的とし
て、シーケンサにより最適な間ピッチの設定制御が行わ
れる。すなわち、各検査精整設備A,B,Cにおいて、
先行材と次行材が干渉することなく、給材、検査精整お
よび払出の作業が行えるための、材料供給時間間隔の最
短時間を設定し、その制御が行われる。By the way, the processing capacities of the respective inspection and conditioning devices 2 are different, and the type and size of the materials that are successively supplied and sequentially conveyed may vary, so that the processing capacity of the entire line is the most efficient. The optimum sequence pitch setting control is performed by the sequencer for the purpose of demonstrating the above. That is, in each inspection and adjustment equipment A, B, C,
The minimum time of the material supply time interval is set and controlled so that the material supply, inspection and adjustment, and delivery work can be performed without the preceding material and the following material interfering with each other.
【0006】連続検査精整ラインの各検査精整設備A,
B,Cにおいて、例えば材料の長さ方向に検査あるいは
精整が行われる場合の間ピッチ制御は、つぎのようにし
て行われる。給材所要時間Ts 、検査精整所要時間Tk
、および払出所要時間Te を、材料の長さLと、材料
のサイズ情報より決定される各設備の搬送速度Vからそ
れぞれ演算し、各設備A,B,Cについて、
Ts =(L/α1 V)+K1 (1)
Tk =(L/V)+K2 (2)
Te =(L/α2 V)+K3 (3)
を求める。ここで、
Ts :給材所要時間;給材装置から搬送装置に切出し移
載開始されてから、次行材が切出し移載開始可能となる
までの時間
Tk :検査精整所要時間;先行材が検査精整装置に進入
開始してから次行材が進入開始可能となるまでの時間
Te :払出所要時間;先行材が払出し位置に進入開始し
てから、払出しの移載動作が終了し、次行材が進入可能
となるまでの時間
K1 :給材装置から搬送装置(キッカー、トランスファ
ー、ウォーキングビーム等)に切出し移載する所要時間
K2 :検査精整装置の機長分搬送する所要時間
K3 :搬送装置から払出装置に切出し移載する所要時間
L :材料長さ
V :検査精整装置通過時の材料搬送速度
α1 :先行材と次行材の材料間隔を詰めるための搬送速
度のリード率
α2 :払出移載時間K3 を確保するための搬送速度のリ
ード率
である。Each inspection and adjustment equipment A of the continuous inspection and adjustment line,
In B and C, pitch control is performed as follows, for example, when inspection or refinement is performed in the length direction of the material. Supply time Ts, inspection and refining time Tk
, And the payout required time Te are calculated from the material length L and the transport speed V of each equipment determined from the size information of the material, and for each equipment A, B, C, Ts = (L / α1 V ) + K1 (1) Tk = (L / V) + K2 (2) Te = (L / α2 V) + K3 (3) Here, Ts: time required for material supply; time from the start of cutting and transferring from the material supplying device to the conveying device until the time when cutting and transferring of the next material can be started Tk: time required for inspection and finishing; Time from the start of entering the inspection and conditioning device until the next material can start entering Te: time required for delivery: after the preceding material has entered the delivery position, the transfer operation of delivery is completed, Time until line material can enter K1: Time required for cutting and transferring from the material feeding device to the transportation device (kicker, transfer, walking beam, etc.) K2: Time required for transportation by the length of the inspection and conditioning device K3: Transport Time required to cut and transfer from the device to the dispensing device L: Material length V: Material transport speed when passing through the inspection and conditioning device α1: Lead rate α2 of transport speed for closing the material gap between the preceding material and the next material: To secure the transfer transfer time K3 It is the lead rate of the transport speed.
【0007】つぎに、この3つの値を比較して最も大き
な値Tm を求める。得られたTm が、その検査精整設備
の最短間ピッチとして登録される。そして、図2のよう
な連続検査精整ラインにおける各検査精整設備A,B,
Cの最短間ピッチTma,Tmb,Tmcのうち、最大の値
が、先行材と次行材がライン内で干渉しないための、最
初の検査精整設備Aへの給材の最短間ピッチPとして設
定される。Next, the maximum value Tm is obtained by comparing these three values. The obtained Tm is registered as the shortest pitch of the inspection and conditioning equipment. Then, the respective inspection and adjustment equipments A, B, in the continuous inspection and adjustment line as shown in FIG.
Among the shortest pitches Tma, Tmb, and Tmc of C, the maximum value is the shortest pitch P of the material to be fed to the first inspection and conditioning equipment A so that the preceding material and the following material do not interfere in the line. Is set.
【0008】従来の間ピッチ制御においては、以上の演
算処理を、シーケンサにおいて行っており、各検査精整
設備A,B,Cそれぞれに個別の演算プログラムを使用
していた。そのフローの例を示すと、図4のように、検
査精整設備AについてはプログラムAにより、給材所要
時間Tsa、検査精整所要時間Tka、払出所要時間Tea
を、それぞれ演算してその最大時間Tmaを決定し、検査
精整設備BおよびCについても、それぞれプログラムB
およびCにより演算して、最大時間TmbおよびTmcを決
定する。そして、Tma,Tmb,Tmcを比較して、最大の
値Tm を最短間ピッチとし、これを最初の検査精整設備
Aへの間ピッチPとして設定していた。In the conventional pitch control, the above-described arithmetic processing is performed in the sequencer, and a separate arithmetic program is used for each of the inspection and conditioning equipment A, B, C. As an example of the flow, as shown in FIG. 4, for the inspection and conditioning equipment A, the supply time Tsa, the inspection and conditioning time Tka, and the delivery time Tea are controlled by the program A.
Is calculated to determine the maximum time Tma, and the inspection and conditioning equipment B and C are also programmed B
And C to determine the maximum times Tmb and Tmc. Then, Tma, Tmb, and Tmc were compared, and the maximum value Tm was set as the shortest pitch, and this was set as the pitch P for the first inspection and conditioning equipment A.
【0009】[0009]
【発明が解決しようとする課題】連続検査精整ラインに
おけるこのような従来の間ピッチ制御では、シーケンス
プログラムの設計に際して、複数の検査精整設備それぞ
れに対して最短間ピッチの演算プログラムを組込む必要
があり、連続して行う検査精整設備が多くなるにつれ
て、シーケンサに対するプログラムのボリュームが大き
くなり、コストおよび演算処理時間が増大するという問
題があった。In such a conventional inter-pitch control in a continuous inspection adjusting line, it is necessary to incorporate a calculation program of the shortest pitch in each of a plurality of inspection adjusting facilities when designing a sequence program. However, there has been a problem that the volume of programs for the sequencer becomes large as the number of inspection and adjustment facilities to be continuously performed increases, resulting in an increase in cost and calculation processing time.
【0010】本発明は、給材と検査精整と払出が順に行
われる検査精整設備が複数連続して配置された連続検査
精整ラインにおいて、各設備の最短間ピッチを演算し、
切り出しタイミングを制御するにあたり、プログラムの
ボリュームを増大することなく、制御を行うための方法
および装置を提供することを目的とする。The present invention calculates the shortest pitch of each equipment in a continuous inspection and adjustment line in which a plurality of inspection and adjustment equipments in which supply, inspection and adjustment and delivery are performed in sequence are arranged.
An object of the present invention is to provide a method and apparatus for controlling the cutout timing without increasing the volume of the program.
【0011】[0011]
【課題を解決するための手段】上記目的を達成するため
の本発明方法は、給材と検査精整と払出が順に行われる
検査精整設備が複数連続して配置された連続検査精整ラ
インの制御方法であって、ライン全体の材料の動作を制
御するシーケンサを設けるとともに、間ピッチ用コンピ
ュータを設け、該コンピュータにおいて、前記各検査精
整設備に共通の最短間ピッチ演算プログラムにより、前
記シーケンサの内部データを使用して、前記各検査精整
設備の最短間ピッチを求め、得られた各最短間ピッチの
うち最大の値を、最初の検査精整設備における給材の間
ピッチとして、前記シーケンサに設定することを特徴と
する、連続検査精整ラインにおける間ピッチ制御方法で
ある。SUMMARY OF THE INVENTION A method of the present invention for achieving the above object is a continuous inspection adjusting line in which a plurality of inspection adjusting devices for sequentially supplying materials, inspecting and adjusting and delivering are arranged in series. A sequencer for controlling the operation of the material of the entire line is provided, and a computer for inter-pitch is provided, and in the computer, the sequencer is operated by a shortest inter-pitch calculation program common to the inspection and conditioning equipment. Using the internal data of, the shortest pitch of each inspection and conditioning equipment is obtained, and the maximum value among the obtained minimum pitches is set as the pitch between the feeding materials in the first inspection and conditioning equipment. It is a method for controlling the pitch between continuous inspection and conditioning lines, which is characterized by setting in a sequencer.
【0012】また、上記目的を達成するための本発明装
置は、給材と検査精整と払出が順に行われる検査精整設
備が複数連続して配置された連続検査精整ラインの制御
装置であって、ライン全体の材料の動作を制御するシー
ケンサを設けるとともに、前記各検査精整設備に共通の
最短間ピッチ演算プログラムを有し、前記シーケンサの
内部データを使用して、前記各検査精整設備の最短間ピ
ッチを求める間ピッチ用コンピュータを設けたことを特
徴とする、連続検査精整ラインにおける間ピッチ制御装
置である。Further, the apparatus of the present invention for achieving the above object is a control apparatus for a continuous inspection and adjustment line in which a plurality of inspection and adjustment equipments for sequentially supplying materials, inspecting and adjusting and delivering are sequentially arranged. Therefore, in addition to providing a sequencer to control the operation of the material of the whole line, it has a shortest-pitch calculation program common to each inspection and adjustment facility, and uses the internal data of the sequencer to adjust each inspection and adjustment. An inter-pitch control device in a continuous inspection and refining line, characterized by being provided with a inter-pitch computer for determining a minimum inter-pitch pitch of equipment.
【0013】[0013]
【作用】本発明の対象とする各検査精整設備において、
給材装置の方式やアクチュエータの種類、検査精整装置
の種類や方式、払出装置の方式やアクチュエータの種類
が、それぞれ多種多様であっても、また、処理する材料
の種類やサイズが多くても、個々の組合せについて、材
料処理の所要時間を定量的に定めるにあたり、本発明で
は、定型化した共通のプログラムを使用する。In each of the inspection and conditioning equipments of the present invention,
Even if there are various types of material supply device types and actuators, inspection and conditioning device types and systems, and dispensing device types and actuators, and even if there are many types and sizes of materials to be processed. In the present invention, a standardized common program is used to quantitatively determine the time required for material processing for each combination.
【0014】本発明法は、図1に示すように、連続検査
精整ライン11全体の材料の動作を制御するシーケンサ
12を設けるとともに、間ピッチ用コンピュータ14を
設け、該コンピュータ14において、連続検査精整ライ
ン11を構成する各検査精整設備A,B,C・・・Xに
共通の最短間ピッチ演算プログラムにより、シーケンサ
12の内部データを使用して、各検査精整設備A,B,
C・・・Xの最短間ピッチを求める。シーケンサ12の
内部データは、リンクユニット13を介してコンピュー
タ14のCPU15に入力され、キーボード16から材
料情報等の条件設定登録を行う。As shown in FIG. 1, the method of the present invention is provided with a sequencer 12 for controlling the operation of the material of the entire continuous inspection and refining line 11, and an inter-pitch computer 14, in which the continuous inspection is performed. By using the internal data of the sequencer 12 by the shortest-pitch calculation program common to each inspection and adjustment equipment A, B, C, ... X which constitutes the adjustment line 11, each inspection and adjustment equipment A, B,
C ... Find the shortest pitch of X. The internal data of the sequencer 12 is input to the CPU 15 of the computer 14 via the link unit 13, and the condition setting registration of material information and the like is performed from the keyboard 16.
【0015】たとえば、図2のような連続検査精整ライ
ンで、長さLの材料を、長さ方向に検査精整する場合、
前記(1),(2),(3)式を使用した、図3に示す
ような共通のプログラムにより、各検査精整設備A,
B,Cについて、給材所要時間Ts 、検査精整所要時間
Tk および払出所要時間Te を求める。そして、これら
の時間から、一つの検査精整設備の最短間ピッチを求め
る。図2の例のような連続検査精整ラインの、たとえば
検査精整設備Aの給材装置1に、次行材を供給できる可
能なタイミングは、先行材が給材動作範囲に存在しなく
なった時点、すなわち給材所要時間Tsa経過後である。
また、次行材が検査精整装置2に進入可能なタイミング
は、先行材の検査精整所要時間Tka経過後である。さら
に、先行材が払出された後、すなわち払出所要時間Tea
経過後でなければ、次行材は払出装置3に進入できな
い。したがって、検査精整設備Aに材料を供給できる最
短間ピッチは、該設備Aにおける給材所要時間Tsaと、
検査精整所要時間Tkaと、払出所要時間Teaの内の最大
の時間Tmaである。つまり、該設備Aに、Tmaの間隔で
材料を供給すれば、先行材と次行材が衝突することな
く、最も処理能力の高い操業を行うことになる。For example, in the case of inspecting and refining a material having a length L in a length direction in a continuous inspection and refining line as shown in FIG.
Each inspection and refinement facility A, according to the common program as shown in FIG. 3, which uses the equations (1), (2) and (3),
For B and C, the required material supply time Ts, the inspection required time Tk, and the required delivery time Te are calculated. Then, from these times, the shortest pitch of one inspection and conditioning facility is obtained. As for the possible timing at which the next material can be supplied to the material supplying device 1 of the continuous inspection and conditioning line as shown in the example of FIG. 2, for example, the inspection and conditioning equipment A, the preceding material does not exist in the material supply operation range. This is at the time, that is, after the elapse of the material supply required time Tsa.
Further, the timing at which the next material can enter the inspection and conditioning device 2 is after the inspection and conditioning required time Tka of the preceding material has elapsed. Furthermore, after the preceding material has been dispensed, that is, the dispensing required time Tea
Only after the elapse, the next material cannot enter the dispensing device 3. Therefore, the shortest pitch that can supply the material to the inspection and conditioning equipment A is the material supply required time Tsa in the equipment A,
It is the maximum time Tma of the inspection and adjustment required time Tka and the payout required time Tea. That is, if the material is supplied to the facility A at the interval of Tma, the preceding material and the following material do not collide with each other, and the operation with the highest processing capacity is performed.
【0016】つぎに、このような検査精整設備が複数連
続して配置された連続検査精整ラインに材料を供給でき
る最短の間ピッチは、各検査精整設備に材料を供給でき
る最短間ピッチTm の内の最大時間である。図2の例で
は、設備Aの最短間ピッチTma、設備Bの最短間ピッチ
Tmb、設備Cの最短間ピッチTmcの最大値がこのライン
の最短間ピッチPとなる。したがって、ラインを構成す
る各装置の情報および処理材料の情報に基づき、演算に
よりラインの最短間ピッチPを求め、該ピッチPを、ラ
イン構成の最初の検査精整設備Aにおける給材の間ピッ
チとする制御を行うことで、最も効率的な操業を行うこ
とができる。Next, the shortest interval pitch at which the material can be supplied to the continuous inspection and refinement line in which a plurality of such inspection and adjustment facilities are continuously arranged is the shortest interval pitch at which the material can be supplied to each inspection and refinement equipment. It is the maximum time of Tm. In the example of FIG. 2, the maximum value of the shortest pitch Tma of the equipment A, the shortest pitch Tmb of the equipment B, and the shortest pitch Tmc of the equipment C is the shortest pitch P of this line. Therefore, the shortest pitch P of the line is calculated by the calculation based on the information of each device constituting the line and the information of the processing material, and the pitch P is determined as the pitch between the feeding materials in the first inspection and conditioning facility A of the line configuration. By carrying out such control, the most efficient operation can be performed.
【0017】本発明法において、間ピッチ用コンピュー
タ14により最短間ピッチを求めるにあたり、シーケン
サ12から吸い上げるデータとしては、検査精整装置の
搬送速度V、搬送リード率α1 およびα2 、材料長さL
等がある。また、コンピュータ14に入力するデータと
しては、給材切出時間K1 、検査精整固定時間K2 、払
出し時間K3 、材料長さ補正値等がある。なお、図1に
おいて17は、入力データ表を示すとともに、各検査精
整設備の最短間ピッチの演算結果を表示するためのCR
Tである。In the method of the present invention, when the shortest pitch is obtained by the inter-pitch computer 14, the data collected from the sequencer 12 include the conveying speed V of the inspection and conditioning device, the conveying lead rates α1 and α2, and the material length L.
Etc. Further, the data input to the computer 14 includes the material cutting time K1, the inspection and fixing fixed time K2, the payout time K3, the material length correction value and the like. In addition, reference numeral 17 in FIG. 1 indicates an input data table and a CR for displaying the calculation result of the shortest pitch of each inspection and conditioning equipment.
T.
【0018】本発明装置は、図1に示すように、連続検
査精整ライン11全体の材料の動作を制御するシーケン
サ12を設けるとともに、各検査精整設備A,B,C・
・・Xに共通の最短間ピッチ演算プログラムを有し、シ
ーケンサ12の内部データを使用して、各検査精整設備
A,B,C・・・Xの最短間ピッチを求める間ピッチ用
コンピュータ14を設けたことを特徴とする。その作用
は、上記本発明法で説明したとおりである。As shown in FIG. 1, the apparatus of the present invention is provided with a sequencer 12 for controlling the operation of the material of the entire continuous inspection and adjustment line 11, and each inspection and adjustment equipment A, B, C.
.. X has a common shortest pitch calculation program, and uses the internal data of the sequencer 12 to obtain the shortest pitch of each inspection and refinement facility A, B, C ... X. Is provided. The operation is as described in the method of the present invention.
【0019】[0019]
【実施例】図2に示すような連続検査精整ラインにおい
て、本発明例として、図1のような構成の本発明装置に
より、図3のフローで間ピッチの演算制御を行った。間
ピッチ用コンピュータ14では、シーケンサ12の内部
データに基づき、共通のプログラムで演算を実行させる
ため、キーボード16から表1に示すような入力フォー
マットのデータを入力した。なお、給材所要時間Ts 、
検査精整所要時間Tk 、払出所要時間Te は(1),
(2),(3)式により演算し、材料の軌跡は図5の実
線に示すとおりである。EXAMPLE As an example of the present invention, in the continuous inspection and conditioning line as shown in FIG. 2, the apparatus of the present invention having the configuration as shown in FIG. 1 performed arithmetic control of the inter-pitch according to the flow of FIG. In the inter-pitch computer 14, data of the input format as shown in Table 1 was input from the keyboard 16 in order to execute the operation by the common program based on the internal data of the sequencer 12. The material supply time Ts,
The inspection and finishing time Tk and the payout time Te are (1),
The locus of the material is calculated by the equations (2) and (3), and is shown by the solid line in FIG.
【0020】従来例として、図4のフローで行った場合
には、間ピッチ演算処理のみで約8Kステップのプログ
ラムが必要であり、処理速度も50ms/スキャン以上で
あったが、上記本発明例では、間ピッチ制御はインター
フェイスのプログラムだけとなり、全体の負荷が軽減
し、処理速度も30ms/スキャンを維持することが可能
となった。また、シーケンサ負荷率は、従来例では90
〜95%であったのに対し、本発明例では68〜75%
に軽減された。As a conventional example, when the flow of FIG. 4 is carried out, a program of about 8K steps is required only for the inter-pitch calculation processing, and the processing speed is 50 ms / scan or more. Now, the inter-pitch control is only the interface program, the overall load is reduced, and the processing speed can be maintained at 30 ms / scan. The sequencer load factor is 90 in the conventional example.
˜95%, whereas in the present invention example 68-75%
Was reduced to.
【0021】[0021]
【表1】 [Table 1]
【0022】[0022]
【発明の効果】本発明は、給材と検査精整と払出が順に
行われる検査精整設備が複数連続して配置された連続検
査精整ラインにおいて、ライン全体の材料の動作を制御
するシーケンサとは別に、間ピッチ用コンピュータを設
け、各検査精整設備に共通のプログラムにより、シーケ
ンサの内部データを使用して、各検査精整設備の最短間
ピッチの演算を行うので、検査精整設備が多数連続した
場合でも、プログラムのボリュームが増大せず、演算処
理時間の短縮、それに伴う高速制御が達成され、さらに
ソフト面でのコスト低減が可能である。INDUSTRIAL APPLICABILITY The present invention is a sequencer for controlling the operation of the material of the entire line in a continuous inspection and adjustment line in which a plurality of inspection and adjustment facilities for sequentially supplying materials, inspecting and adjusting, and delivering are sequentially arranged. Separately from the above, a computer for pitch adjustment is installed, and the program common to each inspection and adjustment equipment is used to calculate the shortest interval pitch of each inspection and adjustment equipment using the internal data of the sequencer. Even when a large number of programs are consecutive, the volume of the program does not increase, the calculation processing time is shortened, high speed control is achieved, and the cost can be reduced in terms of software.
【図1】本発明装置の構成例を示す説明図である。FIG. 1 is an explanatory diagram showing a configuration example of a device of the present invention.
【図2】本発明の対象とする連続検査精整設備の例を示
す説明図である。FIG. 2 is an explanatory diagram showing an example of a continuous inspection and conditioning facility which is a target of the present invention.
【図3】本発明法の例を示すフロー図である。FIG. 3 is a flow chart showing an example of the method of the present invention.
【図4】従来法の例を示すフロー図である。FIG. 4 is a flowchart showing an example of a conventional method.
【図5】本発明法および従来法における材料の軌跡を示
す説明図である。FIG. 5 is an explanatory diagram showing material trajectories in the method of the present invention and the conventional method.
1…給材装置 2…検査精整装置 3…払出装置 4…リジェクト材搬出装置 11…連続検査精整ライン 12…シーケンサ 13…リンクユニット 14…間ピッチ用コンピュータ 15…CPU 16…キーボード 17…CRT A,B,C,X…検査精整設備 1 ... Feeding device 2. Inspection and adjustment device 3 ... Dispensing device 4 Rejected material unloading device 11 ... Continuous inspection adjustment line 12 ... Sequencer 13 ... Link unit 14 ... Computer for pitch 15 ... CPU 16 ... Keyboard 17 ... CRT A, B, C, X ... Inspection and adjustment equipment
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) B65G 43/00 - 43/10 B65G 47/52 - 47/62 ─────────────────────────────────────────────────── ─── Continuation of front page (58) Fields surveyed (Int.Cl. 7 , DB name) B65G 43/00-43/10 B65G 47/52-47/62
Claims (2)
査精整設備が複数連続して配置された連続検査精整ライ
ンの制御方法であって、ライン全体の材料の動作を制御
するシーケンサを設けるとともに、間ピッチ用コンピュ
ータを設け、該コンピュータにおいて、前記各検査精整
設備に共通の最短間ピッチ演算プログラムにより、前記
シーケンサの内部データを使用して、前記各検査精整設
備の最短間ピッチを求め、得られた各最短間ピッチのう
ち最大の値を、最初の検査精整設備における給材の間ピ
ッチとして、前記シーケンサに設定することを特徴とす
る、連続検査精整ラインにおける間ピッチ制御方法。1. A method for controlling a continuous inspection and refining line in which a plurality of inspection and refining facilities for sequentially supplying materials, inspecting and refining and delivering are arranged, and controlling the operation of materials in the entire line. In addition to providing a sequencer, an inter-pitch computer is provided, and in the computer, the shortest-interval pitch calculation program common to the inspection and conditioning equipment is used to use the internal data of the sequencer to determine the shortest of the inspection and conditioning equipment. In the continuous inspection finishing line, the maximum value of the obtained shortest pitches is set in the sequencer as the feeding interval in the first inspection finishing equipment. Pitch control method.
査精整設備が複数連続して配置された連続検査精整ライ
ンの制御装置であって、ライン全体の材料の動作を制御
するシーケンサを設けるとともに、前記各検査精整設備
に共通の最短間ピッチ演算プログラムを有し、前記シー
ケンサの内部データを使用して、前記各検査精整設備の
最短間ピッチを求める間ピッチ用コンピュータを設けた
ことを特徴とする、連続検査精整ラインにおける間ピッ
チ制御装置。2. A control device for a continuous inspection and conditioning line in which a plurality of inspection and conditioning facilities for sequentially supplying materials, inspecting and conditioning, and delivering are arranged, and controlling the operation of the material in the entire line. While providing a sequencer, it has a shortest-pitch calculation program common to each of the inspection and conditioning equipment, and uses an internal data of the sequencer to find a minimum-pitch computer for each of the inspection and conditioning equipment. An inter-pitch control device for a continuous inspection and conditioning line, which is provided.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12178495A JP3534894B2 (en) | 1995-05-19 | 1995-05-19 | Inter-pitch control method and apparatus in continuous inspection refinement line |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12178495A JP3534894B2 (en) | 1995-05-19 | 1995-05-19 | Inter-pitch control method and apparatus in continuous inspection refinement line |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08310639A JPH08310639A (en) | 1996-11-26 |
| JP3534894B2 true JP3534894B2 (en) | 2004-06-07 |
Family
ID=14819814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12178495A Expired - Fee Related JP3534894B2 (en) | 1995-05-19 | 1995-05-19 | Inter-pitch control method and apparatus in continuous inspection refinement line |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3534894B2 (en) |
-
1995
- 1995-05-19 JP JP12178495A patent/JP3534894B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH08310639A (en) | 1996-11-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| GB2296818A (en) | Producing semiconductor wafers | |
| JP3534894B2 (en) | Inter-pitch control method and apparatus in continuous inspection refinement line | |
| JPS61152354A (en) | Manufacturing system | |
| JPH0573574A (en) | Production controller | |
| JPH06328112A (en) | Transfer device operation scheduling device | |
| JPH11145021A (en) | Production management apparatus and method | |
| CN115924492A (en) | Parcel Separation Method and Apparatus | |
| JP2003225702A (en) | Mill pacing method for hot rolling line | |
| JPH04341413A (en) | Blast furnace raw material charging control device | |
| JP3246461B2 (en) | Reticle transfer control method | |
| JP5391882B2 (en) | Conveying apparatus and conveying apparatus control method | |
| EP3758860B1 (en) | Powered, angled-roller array delamination equipment | |
| JP2019065360A (en) | Heat treatment line for steel pipe and conveyance controlling method for steel pipe | |
| JP3058356B2 (en) | FMS process control device | |
| CN105728468A (en) | Method of strip metal out in finishing mill | |
| JP2889798B2 (en) | Raw material transport control system | |
| JPH07291423A (en) | Logistics control method | |
| JP2753119B2 (en) | Semiconductor device assembly process management system | |
| JP4137422B2 (en) | Semiconductor production simulation method | |
| JP2733043B2 (en) | Method and apparatus for operating section steel refining equipment | |
| JPS60207749A (en) | Supply-order determining apparatus | |
| JPH03236213A (en) | Method and apparatus for inputting batch | |
| JP2005145653A (en) | Constant-quantity feeder for dry food | |
| JPH06102212B2 (en) | Central speed control method for continuous processing line | |
| JPH0922306A (en) | Production control device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20040120 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20040224 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20040310 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090319 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090319 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100319 Year of fee payment: 6 |
|
| LAPS | Cancellation because of no payment of annual fees |