JP7643407B2 - Parts sorting device - Google Patents

Description

The present invention relates to a part sorting device.

There is a device that separates non-defective and defective surface-mount electronic components (also called chip components) such as multilayer ceramic capacitors. Patent Document 1 discloses an appearance inspection device as such a component sorting device. The appearance inspection device disclosed in Patent Document 1 includes a linear feeder that transports electronic components, a turntable that rotates and transports the electronic components transported by the linear feeder, and multiple imaging devices that capture images of the electronic components on the turntable, and performs an appearance inspection of the electronic components while transporting them. This allows non-defective and defective products to be separated and discharged.

The visual inspection device disclosed in Patent Document 1 charges electronic components by transporting them using vibration in a linear feeder, and then electrostatically attracts the electronic components on a turntable, which then rotates and transports them. The transport speed of the turntable is faster than the transport speed of the linear feeder. This allows electronic components to be spaced apart on the turntable, making it possible to visually inspect the end faces of the electronic components in the transport direction.

JP 2017-44579 A

Such component sorting devices may inspect and sort different types of electronic components for each production lot. For example, surface-mount electronic components may have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors may have different capacitances even if they are the same size.

In addition, in such component sorting devices, electronic components from the previous lot may remain on the linear feeder or turntable. In such a case, if the type of electronic components in the current lot is different from the type of electronic components in the previous lot, there is a possibility that the electronic components in the current lot may be mixed with the different types of electronic components from the previous lot. If electronic components of the same size but different characteristics are mixed in this way, the sorting accuracy will decrease even if the accuracy of the appearance inspection is high.

The present invention aims to provide a parts sorting device that improves the accuracy of parts sorting.

(1) The part selection device according to the present invention is a part selection device that inspects parts while transporting them and selects non-defective parts, and includes at least one of a hopper and a ball feeder that supplies the parts, a linear feeder that transports the parts supplied by the ball feeder or the hopper, a turntable that transports the parts transported by the linear feeder, a plurality of inspection imaging devices that respectively capture images of a plurality of outer surfaces of the parts on the turntable, an inspection and selection controller that performs a visual inspection of the parts based on the imaging results from the plurality of inspection imaging devices and selects the non-defective parts based on the results of the visual inspection, a discharge mechanism that discharges the non-defective parts selected by the inspection and selection controller from the turntable, and a confirmation imaging device that captures an image of at least one of the hopper and the ball feeder to check for remaining parts when the visual inspection and selection are completed.

(2) In the part selection device described in (1), the confirmation imaging device may scan at least one of the hopper and the bowl feeder.

(3) In the part selection device described in (2), the scanning of the confirmation imaging device may be a serpentine scan or a spiral scan.

(4) The part sorting device according to any one of (1) to (3) may further include a recovery mechanism that recovers remaining parts on at least one of the hopper and the bowl feeder when the visual inspection and sorting are completed.

(5) In the part sorting device described in (4), the recovery mechanism may scan at least one of the hopper and the bowl feeder.

(6) In the part sorting device described in (5), the scanning of the recovery mechanism may be serpentine scanning or spiral scanning.

The present invention can improve the accuracy of part selection in a part selection device.

1 is a schematic plan view of an example of a part selection device according to an embodiment of the present invention, viewed from above. 2 is a schematic plan view showing an enlarged view of a part II in the part selection device shown in FIG. 1. FIG. 2 is a schematic side view of the part selection device shown in FIG. 1, in which a portion II is enlarged. 4 is a diagram showing an example of confirmation of parts remaining on a hopper by a confirmation imaging device in the part selection device shown in FIG. 1. 4A and 4B are diagrams showing an example of confirmation of remaining parts on a hopper and a bowl feeder by a confirmation imaging device in the part selecting device shown in FIG. 1 . 4 is a diagram showing an example of recovery of remaining parts on a hopper by a recovery mechanism in the part selecting device shown in FIG. 1 . 1. FIG. 4 is a diagram showing an example of confirmation of remaining parts on a hopper and a bowl feeder by a recovery mechanism in the part selecting device shown in FIG. FIG. 2 is a schematic perspective view of the exterior of the component.

An example of an embodiment of the present invention will be described below with reference to the attached drawings. Note that the same or equivalent parts in each drawing will be given the same reference numerals.

Figure 1 is a schematic plan view of an example of a part sorting device according to this embodiment, seen from above; Figure 2 is a schematic plan view of an enlarged portion II of the part sorting device shown in Figure 1; and Figure 3 is a schematic side view of the part sorting device shown in Figure 1, seen from the side, and a schematic side view of an enlarged portion II. Note that an XY orthogonal coordinate system is shown in Figures 1 to 3.

The component selection device 1 shown in Figures 1 to 3 is a device that inspects multiple electronic components 3 while transporting them in sequence and selects non-defective products. The component selection device 1 includes a hopper 5, a bowl feeder 10, a linear feeder 20, a turntable 30, multiple inspection imaging devices 40, a discharge mechanism 50, an inspection and selection controller 70, a confirmation imaging device 80, and a collection mechanism 90.

The electronic component 3 is a surface-mount electronic component (also called a chip component) such as a multilayer ceramic capacitor. As shown in FIG. 8, the electronic component 3 includes a laminate 3a in which multiple dielectric layers and one or multiple conductor layers made of ceramic material are laminated, and two external electrodes 3b arranged on each of the two end faces of the laminate 3a. The laminate 3a, i.e., the electronic component 3, is a rectangular parallelepiped shape, and has two main surfaces TS1 and TS2 that face each other in the lamination direction, two side surfaces WS1 and WS2 that face each other in the width direction that intersects with the lamination direction, and two end surfaces LS1 and LS2 that face each other in the length direction that intersects with the lamination direction and the width direction.

The dimensions of the electronic component 3 are not particularly limited, but may be, for example, a lengthwise dimension of 3.2 mm or more and 0.1 mm or less, a widthwise dimension of 1.6 mm or more and 0.05 mm or less, and a stacking direction dimension of 1.6 mm or more and 0.05 mm or less. These dimensions may vary depending on the intersection.

The electronic component 3 is not limited to the laminated ceramic capacitor using the dielectric ceramic described above, but may be various electronic components such as a piezoelectric component using a piezoelectric ceramic, a thermistor using a semiconductor ceramic, or an inductor using a magnetic ceramic.

As shown in Figures 1 to 3, the hopper 5 supplies a plurality of electronic components 3 to the ball feeder 10. For example, the hopper 5 is funnel-shaped, with a circular inlet and an outlet that is narrower than the inlet. The hopper 5 is a device that detects a shortage of electronic components 3 in the ball feeder 10 and automatically replenishes the ball feeder 10 with electronic components 3, thereby maintaining a constant number of electronic components 3 in the ball feeder 10.

The ball feeder 10 aligns and transports a plurality of electronic components 3 supplied by the hopper 5. The ball feeder 10 is provided with a vibration mechanism 12 that supplies vibration to the ball feeder 10. An example of the vibration mechanism 12 is a piezoelectric element that generates vibrations at a frequency corresponding to the voltage. The outer shape of the ball feeder 10 is circular. The ball feeder 10 aligns and transports the electronic components 3 in a spiral shape while causing them to move in a circular motion from the center of the circle to the outside by vibration.

The linear feeder 20 sequentially and linearly transports the multiple electronic components 3 aligned and transported by the ball feeder 10. The linear feeder 20 is provided with a vibration mechanism 22 that supplies vibration to the linear feeder 20. An example of the vibration mechanism 22 is a piezoelectric element that generates vibrations at a frequency corresponding to the voltage. It is preferable that the linear feeder 20 is inclined with respect to the horizontal plane. The linear feeder 20 transports the electronic components 3 by vibration.

The linear feeder 20 is preferably made of a material such as SUS. This allows the electronic components 3 to be charged when the linear feeder 20 transports the electronic components 3 by vibration.

The turntable 30 sequentially rotates and transports the multiple electronic components 3 transported by the linear feeder 20. As shown in Figures 1 and 2, the turntable 30 has a guide mechanism 32 on the upstream side, which guides the electronic components 3 from the linear feeder 20 to a rotational transport path (rotational transport trajectory) 31. The turntable 30 transports the electronic components 3 along the rotational transport path 31.

As shown in FIG. 3, it is preferable to provide an electrostatic adsorption mechanism 34 below the turntable 30. This allows the charged electronic components 3 to be electrostatically adsorbed and transported by the linear feeder 20.

The conveying speed of the turntable 30 is faster than the conveying speed of the linear feeder 20. This allows the electronic components 3 to be spaced apart, as shown in Figures 2 and 3, making it possible to perform visual inspection of the end faces of the electronic components 3.

The turntable 30 is made of a material such as glass or resin and is transparent. This allows for visual inspection of the back side of the electronic component 3.

As shown in FIG. 1, the inspection imaging device 40 is, for example, a camera or an image sensor. Six inspection imaging devices 40 are provided along the rotational transport path 31 of the turntable 30. The six inspection imaging devices 40 respectively capture images of six outer surfaces of the electronic component 3 on the turntable 30, namely, two main surfaces TS1 and TS2, two side surfaces WS1 and WS2, and two end surfaces LS1 and LS2. Each of the inspection imaging devices 40 may be provided with an illumination device, such as a ring light or a dome light, that illuminates the imaging surface of the electronic component 3.

As shown in FIG. 1, the discharge mechanism 50 discharges non-defective products selected by the inspection and sorting controller 70 (described later) based on the results of the appearance inspection from the turntable 30 and stores them in a case or the like. The method of discharging non-defective products by the discharge mechanism 50 is not particularly limited, but examples include air blowing, air suction, physical contact extrusion, and the like. For example, when a non-defective product is transported, the discharge mechanism 50, in accordance with a command from the inspection and sorting controller 70, blows air onto the non-defective product on the turntable 30, thereby discharging the non-defective product from the turntable 30 and storing it in a case or the like.

When the visual inspection and sorting are completed, the confirmation imaging device 80 captures images of the hopper 5 and bowl feeder 10 to check for remaining parts. Examples of the confirmation imaging device 80 include a camera or an image sensor. It may also be a laser sensor, such as a line sensor.

Figure 4 is a diagram showing an example of confirmation of remaining parts on a hopper by a confirmation imaging device. As shown in Figure 4, the confirmation imaging device 80 scans the hopper 5 to confirm the remaining parts on the hopper 5. Similarly, the confirmation imaging device 80 scans the ball feeder 10 to confirm the remaining parts on the ball feeder 10. There are no particular limitations on the scanning method, but examples include serpentine scanning and spiral scanning. This makes it possible to thoroughly confirm remaining parts on the hopper 5 and the ball feeder 10.

Figure 5 is a diagram showing an example of checking remaining parts on the hopper and ball feeder using a confirmation imaging device. As shown in Figure 5, a linear guide 82 is disposed above the hopper 5, ball feeder 10, and linear feeder 20, and a linear actuator 84 is disposed on the linear guide 82. The confirmation imaging device 80 is disposed on the linear actuator 84, and scans over the hopper 5, ball feeder 10, and linear feeder 20 to check for remaining parts on the hopper 5, ball feeder 10, and linear feeder 20. This makes it possible to check all remaining parts on the hopper 5, ball feeder 10, and linear feeder 20 without missing any.

When the visual inspection and sorting are completed, the recovery mechanism 90 recovers the remaining parts on the hopper 5, the bowl feeder 10, and the linear feeder 20. The recovery mechanism 90 may be, for example, a magnet such as a permanent magnet or an electromagnet, or a suction mechanism such as air suction.

Figure 6 is a diagram showing an example of the recovery of remaining parts on a hopper by the recovery mechanism. As shown in Figure 4, the recovery mechanism 90 scans over the hopper 5 to recover the remaining parts on the hopper 5. Similarly, the recovery mechanism 90 scans over the ball feeder 10 to recover the remaining parts on the ball feeder 10. The recovery mechanism 90 also scans over the linear feeder 20 to recover the remaining parts on the linear feeder 20. There is no particular limitation on the scanning method, but examples include serpentine scanning and spiral scanning. This allows the remaining parts on the hopper 5 and the ball feeder 10 to be recovered without any omissions.

Figure 7 is a diagram showing an example of checking remaining parts on the hopper and ball feeder by the recovery mechanism. As shown in Figure 7, a linear guide 82 is disposed above the hopper 5, ball feeder 10, and linear feeder 20, and a linear actuator 84 is disposed on the linear guide 82. A recovery mechanism 90 is disposed on the linear actuator 84, and scans over the hopper 5, ball feeder 10, and linear feeder 20 to recover remaining parts on the hopper 5, ball feeder 10, and linear feeder 20. This allows all remaining parts on the hopper 5, ball feeder 10, and linear feeder 20 to be recovered without omission.

Here, the electronic components include metals. In particular, laminated ceramic electronic components include ferromagnetic materials such as Ni. Such electronic components can be collected using magnets. Furthermore, even if the hopper 5, the ball feeder 10, and the linear feeder 20 are covered with, for example, a transparent cover, the magnets can attract and collect the electronic components through the cover.

The inspection and selection controller 70 controls the entire component selection device 1. Specifically, the inspection and selection controller 70 performs a visual inspection of the electronic components 3 on the turntable 30 based on the imaging results from the inspection imaging device 40, and selects non-defective and defective components based on the results of the visual inspection.

The inspection and sorting controller 70 also controls the discharge of non-defective products by the discharge mechanism 50. For example, the inspection and sorting controller 70 calculates the timing for discharging non-defective products from the discharge mechanism 50 based on information such as the conveying speed (or rotation speed, and the length or radius of the rotational conveying path) of the turntable 30 and the position of the inspection imaging device 40 on the turntable 30, and issues a command to the discharge mechanism 50.

In addition, when the visual inspection and sorting are completed, the inspection and sorting controller 70 controls the scanning of the confirmation imaging device 80 as shown in FIG. 4 or FIG. 5, and checks for remaining parts on the hopper 5 and bowl feeder 10 based on the imaging results from the confirmation imaging device 80.

If remaining parts are found, the inspection and sorting controller 70 may vibrate the ball feeder 10 and the linear feeder 20, and may also vibrate the hopper 5 using a knocker or the like, to eject the remaining parts on the hopper 5 and the ball feeder 10 onto the turntable 30. The vibration used to eject the remaining parts may be stronger than that used during normal inspection and sorting.

Alternatively, if remaining parts are identified, the inspection and sorting controller 70 may control the scanning of the recovery mechanism 90 over the hopper 5 and the ball feeder 10 to recover the remaining parts on the hopper 5 and the ball feeder 10, as shown in FIG. 6 or FIG. 7.

Alternatively, the inspection and sorting controller 70 may perform both the above-mentioned ejection of remaining parts by vibration and the above-mentioned collection of remaining parts by the collection mechanism 90. An example is shown below.

For example, when the visual inspection and sorting are completed (for example, the end of the visual inspection and sorting is determined when no electronic components 3 are transported to the turntable 30 for a predetermined time), the inspection and sorting controller 70 controls the scanning of the confirmation imaging device 80 on the hopper 5 and the ball feeder 10, and checks for remaining components on the hopper 5 and the ball feeder 10 based on the imaging results from the confirmation imaging device 80.

If remaining parts are found, first, the inspection and sorting controller 70 vibrates the ball feeder 10 and the linear feeder 20, and also vibrates the hopper using a knocker or the like, to eject the remaining parts on the hopper 5 and the ball feeder 10 onto the turntable 30. Next, the inspection and sorting controller 70 controls the scanning of the recovery mechanism 90 over the hopper 5 and the ball feeder 10 to recover the remaining parts on the hopper 5 and the ball feeder 10.

Then, the inspection and sorting controller 70 again controls the scanning of the confirmation imaging device 80 to check for remaining parts. If remaining parts are found again, the inspection and sorting controller 70 repeats the above-mentioned ejection of the remaining parts by vibration, collection of the remaining parts by the collection mechanism 90, and confirmation of the remaining parts by the confirmation imaging device 80 until no remaining parts are found.

The inspection and sorting controller 70 described above is composed of an arithmetic processor such as a programmable logic controller (PLC), a digital signal processor (DSP), or a field-programmable gate array (FPGA). The various functions of the inspection and sorting controller 70 are realized, for example, by executing a predetermined software (program) stored in a memory unit. The various functions of the inspection and sorting controller 70 may be realized by a combination of hardware and software, or may be realized only by hardware (electronic circuits).

The memory unit in the inspection and sorting controller 70 is a rewritable memory such as an EEPROM. The memory unit stores predetermined software (programs) for executing various functions of the sorting controller. The memory unit also stores various setting values input from the outside, for example. The various setting values include information regarding the conveying speed of the linear feeder 20, the conveying speed of the turntable 30 (or the rotation speed, and the length or radius of the rotational conveying path), the position of the inspection imaging device 40, and the position of the discharge mechanism 50, as well as criteria for determining whether a product is good or bad.

As described above, the component selection device 1 of this embodiment includes a hopper 5 that supplies electronic components 3, a ball feeder 10 that aligns the electronic components 3 supplied by the hopper 5, a linear feeder 20 that linearly transports the electronic components 3 aligned by the ball feeder 10, a transparent turntable 30 that rotates and transports the electronic components 3 transported by the linear feeder 20, six inspection imaging devices 40 that respectively capture images of the six outer surfaces of the electronic components 3 on the turntable 30, an inspection and selection controller 70 that performs a visual inspection of the electronic components 3 based on the imaging results from the inspection imaging devices 40 and selects non-defective products based on the results of the visual inspection, and a discharge mechanism 50 that discharges non-defective products selected by the inspection and selection controller 70 from the turntable 30. This allows multiple electronic components 3 to be visually inspected while being transported, and non-defective products to be selected.

Here, such component sorting devices may inspect and sort different types of electronic components for each production lot. For example, surface-mount electronic components may have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors may have different capacitances even if they are the same size.

In addition, in such component sorting devices, electronic components from the previous lot may remain in the hopper or bowl feeder. In such a case, if the type of electronic components in the current lot is different from the type of electronic components in the previous lot, there is a possibility that the electronic components in the current lot may be mixed with the different types of electronic components from the previous lot. If electronic components of the same size but different characteristics are mixed in this way, the sorting accuracy will decrease even if the accuracy of the appearance inspection is high.

In this regard, according to the part selection device 1 of this embodiment, when the visual inspection and selection are completed, the confirmation imaging device 80 captures an image of the hopper 5 and the ball feeder 10. This makes it possible to check the remaining parts on the hopper 5 and the ball feeder 10 based on the image capture results from the confirmation imaging device 80. Furthermore, if remaining parts are confirmed, the remaining parts on the hopper 5 and the ball feeder 10 can be discharged, collected, and removed. This improves the accuracy of part selection.

For example, according to the part selection device 1 of this embodiment, when the visual inspection and selection are completed, the collection mechanism 90 collects the remaining parts on the hopper 5 and the ball feeder 10. This allows the remaining parts on the hopper 5 and the ball feeder 10 to be discharged, collected, and removed. This improves the accuracy of part selection.

Although the embodiment of the present invention has been described above, the present invention is not limited to the above-mentioned embodiment, and various modifications and variations are possible. In the above-mentioned embodiment, a component selection device 1 equipped with both a hopper 5 and a ball feeder 10 has been exemplified. However, the present invention is not limited to this, and the component selection device may be in a form equipped with either a hopper or a ball feeder. If a ball feeder is not provided, the hopper may supply electronic components sequentially to the linear feeder.

In this case, the confirmation imaging device 80 may scan either the hopper 5 or the ball feeder 10 to capture an image of either the hopper 5 or the ball feeder 10. The inspection and selection controller 70 may check for remaining parts on either the hopper 5 or the ball feeder 10 based on the image capture results from the confirmation imaging device 80.

In this case, the recovery mechanism 90 may scan either the hopper 5 or the ball feeder 10 to recover the remaining parts on either the hopper 5 or the ball feeder 10. That is, the inspection and sorting controller 70 may control the scanning of the recovery mechanism 90 to recover the remaining parts on either the hopper 5 or the ball feeder 10.

REFERENCE SIGNS LIST 1 Parts sorting device 3 Electronic parts 5 Hopper 10 Ball feeder 12 Vibration mechanism 20 Linear feeder 22 Vibration mechanism 30 Turntable 31 Rotational conveying path (rotational conveying trajectory)
32 Guide mechanism 34 Electrostatic adsorption mechanism 40 Inspection imaging device 50 Discharge mechanism 70 Inspection and sorting controller 80 Confirmation imaging device 82 Linear guide 84 Linear actuator 90 Collection mechanism

Claims (5)

A parts sorting device that inspects parts while transporting them and selects non-defective parts,
At least one of a hopper and a bowl feeder for supplying the parts;
a linear feeder that conveys the parts fed by the bowl feeder or the hopper;
a turntable that conveys the parts conveyed by the linear feeder;
a plurality of inspection imaging devices for imaging a plurality of outer surfaces of the component on the turntable, respectively;
an inspection and selection controller that performs an appearance inspection of the component based on the imaging results from the plurality of inspection imaging devices and selects the non-defective component based on the result of the appearance inspection;
a discharge mechanism that discharges the non-defective products selected by the inspection and selection controller from the turntable;
an imaging device for confirmation, which images at least one of the hopper and the bowl feeder , and the linear feeder , in order to confirm remaining parts when the visual inspection and sorting are completed;
Equipped with
the verification imaging device scans over at least one of the hopper and the bowl feeder , and the linear feeder ;
Parts sorting device. 2. The component sorting apparatus according to claim 1 , wherein the scanning of the confirmation imaging device is a serpentine scan or a spiral scan. 3. The part sorting device according to claim 1, further comprising a collection mechanism that collects remaining parts on at least one of the hopper and the bowl feeder when the visual inspection and sorting are completed. The part selecting device according to claim 3 , wherein the collection mechanism scans over at least one of the hopper and the bowl feeder. The part selecting device according to claim 4 , wherein the scanning of the collection mechanism is a serpentine scan or a spiral scan.

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