JP7718511B2 - Parts sorting device - Google Patents

Description

The present invention relates to a part sorting device.

There are devices that sort out good and bad surface-mount electronic components (also known as chip components) such as multilayer ceramic capacitors. Patent Document 1 discloses an appearance inspection device as such a component sorting device. The appearance inspection device disclosed in Patent Document 1 includes a linear feeder that transports electronic components, a turntable that transports the electronic components transported by the linear feeder, and an imaging device that captures images of the electronic components on the turntable, and performs an appearance inspection of the electronic components while transporting them. This allows good and bad components to be sorted and discarded.

In addition, the visual inspection device disclosed in Patent Document 1 charges electronic components by transporting them using vibrations in a linear feeder, and then transports the electronic components by electrostatically adsorbing them using static electricity on a turntable.

JP 2017-44579 A

Such component sorting devices may inspect and sort different types of electronic components for each production lot. For example, surface-mount electronic components may have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors may have different capacitances even if they are the same size.

Furthermore, with such component sorting devices, electronic components from the previous lot may remain on the linear feeder or turntable. In such cases, if the type of electronic components in the current lot is different from the type of electronic components in the previous lot, there is a possibility that electronic components of a different type from the previous lot may be mixed in with the electronic components in the current lot. If electronic components of the same size but different characteristics are mixed in like this, the accuracy of the sorting will decrease, even if the accuracy of the visual inspection is high.

The present invention aims to provide a part sorting device that improves the accuracy of part sorting.

The parts sorting device of the present invention inspects parts as they are transported, selects non-defective parts, and stores them in cases. It includes a linear feeder that transports the parts, a turntable that transports the parts transported by the linear feeder and rotates at a speed of 10,000 rpm or more, multiple imaging devices that capture images of multiple outer surfaces of the parts on the turntable, a measuring device that measures the characteristics of the parts on the linear feeder or the turntable, and an inspection and sorting controller that performs a visual inspection of the parts based on the imaging results from the imaging devices and selects non-defective parts based on the results of the visual inspection. The linear feeder or the turntable, on which the characteristics are measured by the measuring device, transports the parts while electrostatically adsorbing them, and the inspection and sorting controller inspects the characteristics of the parts based on the measurement results from the measuring device and further selects non-defective parts based on the results of the characteristic inspection.

The present invention makes it possible to improve the accuracy of component sorting in a component sorting device.

1 is a schematic plan view of an example of a component selection device according to an embodiment of the present invention, viewed from above; FIG. 10 is a schematic plan view of another example of the component selection device according to the present embodiment, as viewed from above. FIG. 2 is a schematic plan view showing an enlarged view of a portion II in the part selecting device shown in FIG. 1A or FIG. 1B. 1B is a schematic side view of the part selecting device shown in FIG. 1A as seen from the side, and is a schematic side view in which a portion II is enlarged. FIG. FIG. 2 is a schematic side view of the part selecting device shown in FIG. 1B as seen from the side, and is a schematic side view in which a portion II is enlarged. 4 is a cross-sectional view of the part selecting device shown in FIG. 1A or FIG. 1B along line IV-IV. FIG. 2 is a schematic perspective view of the exterior of the component. FIG. 2 is a schematic perspective view of the exterior of the case.

An example of an embodiment of the present invention will be described below with reference to the accompanying drawings. Note that the same or equivalent parts in each drawing will be designated by the same reference numerals.

Figure 1A is a schematic plan view of an example of a component selection device according to this embodiment, viewed from above, and Figure 1B is a schematic plan view of another example of a component selection device according to this embodiment, viewed from above. Figure 2 is a schematic plan view of an enlarged portion II of the component selection device shown in Figure 1A or Figure 1B. Figure 3A is a schematic side view of the component selection device shown in Figure 1A, viewed from the side, with an enlarged portion II. Figure 3B is a schematic side view of the component selection device shown in Figure 1B, viewed from the side, with an enlarged portion II. Figure 4 is a cross-sectional view of the component selection device shown in Figure 1A or Figure 1B, taken along line IV-IV. Note that an XY Cartesian coordinate system is shown in Figures 1A to 4.

The component selection device 1 shown in Figures 1A, 2, 3A, and 4 is an apparatus that inspects multiple electronic components 3 while transporting them sequentially, selects non-defective components, and stores them in a case 5. The component selection device 1 includes a linear feeder 10, a turntable 20, multiple imaging devices 30, a measuring device 40, a first discharge mechanism 50, a second discharge mechanism 60, a first counter 71, a second counter 72, a third counter 73, a fourth counter 74, and an inspection and selection controller 80.

The electronic component 3 is a surface-mount electronic component (also called a chip component) such as a multilayer ceramic capacitor. As shown in Figure 5, the electronic component 3 comprises a laminate 3a formed by stacking multiple dielectric layers made of ceramic material and one or more conductor layers, and two external electrodes 3b disposed on each of the two end faces of the laminate 3a. The laminate 3a, i.e., the electronic component 3, is rectangular and has two main surfaces TS1 and TS2 that face each other in the stacking direction, two side surfaces WS1 and WS2 that face each other in the width direction that intersects the stacking direction, and two end surfaces LS1 and LS2 that face each other in the length direction that intersects both the stacking direction and the width direction.

As shown in Figure 6, the case 5 is a box-shaped case that houses multiple electronic components 3 inside. The case 5 has only one opening 5a that can be opened to receive and remove the electronic components 3 and can be closed when storing the electronic components 3.

As shown in Figures 1A, 2, and 3A, the linear feeder 10 sequentially conveys a plurality of electronic components 3 in a linear manner. The linear feeder 10 may include a charging portion on the upstream side and an electrostatic attraction portion on the downstream side.

The linear feeder 10 is preferably made of a material such as SUS. It is also preferable that the linear feeder 10 be inclined relative to the horizontal plane. This allows the electronic components 3 to be charged by transporting them using vibrations in the charging section upstream of the linear feeder 10.

As shown in Figures 1A and 3A, it is preferable to provide an electrostatic adsorption mechanism 12 below the electrostatic adsorption portion downstream of the linear feeder 10. This allows electronic components 3 to be electrostatically adsorbed and transported in the electrostatic adsorption portion downstream of the linear feeder 10.

As shown in Figures 1B and 3B, the linear feeder 10 does not have to be provided with an electrostatic adsorption mechanism 12. In other words, the entire linear feeder 10 from the upstream side to the downstream side may be the charged portion described above.

The turntable 20 sequentially rotates and transports the multiple electronic components 3 transported by the linear feeder 10. As shown in Figures 1A and 2, the turntable 20 has a guide mechanism 22 on the upstream side, which guides the electronic components 3 from the linear feeder 10 to a rotary transport trajectory 21. The turntable 20 transports the electronic components 3 along the rotary transport trajectory 21.

As shown in Figure 3A, it is preferable to provide an electrostatic adsorption mechanism 24 below the turntable 20. This allows the electronic components 3 to be electrostatically adsorbed and transported.

The conveying speed of the turntable 20 is faster than the conveying speed of the linear feeder 10. The rotational speed of the turntable 20 is preferably 10,000 rpm or more. This allows the electronic components 3 to be spaced apart, as shown in Figures 2 and 3A, and enables visual inspection of the end face sides of the electronic components 3. Note that the rotational speed does not have to be 10,000 rpm or more, and may be 9,000 rpm or more, or even 8,000 rpm or more. In this case, the size of the electronic components 3 is approximately 0.25 mm ±10% in the length direction and approximately 0.125 mm ±13% in the width direction and thickness direction.

The turntable 20 is made of a transparent material such as glass or resin, which allows for visual inspection of the back side of the electronic component 3.

As shown in FIG. 1A, the imaging device 30 is, for example, a camera. Six imaging devices 30 are provided along the rotational transport path 21 of the turntable 20. The six imaging devices 30 capture images of the six outer surfaces of the electronic component 3 on the turntable 20, namely, the two main surfaces TS1 and TS2, the two side surfaces WS1 and WS2, and the two end surfaces LS1 and LS2.

The measuring device 40 includes, for example, a pair of probes for contacting the external electrodes of the electronic component 3, and measures the electrical characteristics of the electronic component 3. As shown in FIG. 1A, the measuring device 40 may be provided in an electrostatic suction portion downstream of the linear feeder 10. Alternatively, as shown in FIG. 1B, the measuring device 40 may be provided along the rotational transport path 21 of the turntable 20. In this case, as described above and as shown in FIG. 3B, the linear feeder 10 does not need to be provided with an electrostatic suction mechanism 12. The measuring device 40 measures the electrical characteristics of the electronic component 3 on the linear feeder 10 or the turntable 20. For example, if the electronic component 3 is a multilayer ceramic capacitor, the measuring device 40 measures the capacitance of the electronic component 3.

As described above, the electrostatic adsorption section or turntable 20 downstream of the linear feeder 10, where the electrical characteristics are measured by the measuring device 40, transports the electronic components 3 while electrostatically adsorbing them. This makes it possible to improve the accuracy of measuring the electrical characteristics.

1A and 4, the first discharge mechanism 50 discharges non-defective products selected by the inspection and sorting controller 80 (described later) based on the results of the visual inspection and the electrical characteristic inspection from the turntable 20 and stores them in the case 5. The method for discharging non-defective products by the first discharge mechanism 50 is not particularly limited, but examples include air blowing, air suction, physical contact extrusion, etc. For example, when a non-defective product is transported, the first discharge mechanism 50, in accordance with instructions from the inspection and sorting controller 80, blows air onto the non-defective product on the turntable 20, thereby taking the non-defective product from the turntable 20 inside.

The first ejection mechanism 50 has a tubular member 52. The tubular member 52 is a tubular member with a circular or polygonal cross section, and extends from the turntable 20 to the entrance/exit of the case 5. As a result, the tubular member 52 guides the non-defective electronic components 3 ejected from the turntable 20 to the entrance/exit 5a of the case 5.

The second discharge mechanism 60 discharges defective products selected by the inspection and sorting controller 80 (described below) based on the results of the visual inspection or electrical characteristic inspection, from the turntable 20 and collects them in a collection box (not shown). The method for discharging defective products by the second discharge mechanism 60 may be the same as the method for discharging non-defective products by the first discharge mechanism 50. For example, when a defective product is transported, the second discharge mechanism 60, in accordance with instructions from the inspection and sorting controller 80, blows air at the defective product on the turntable 20, thereby removing the defective product from the turntable 20 and into the mechanism.

The second discharge mechanism 60, like the first discharge mechanism 50, has a tubular member that guides defective products discharged from the turntable 20 to a collection box (not shown). It is preferable that the second discharge mechanism 60 be located upstream of the first discharge mechanism 50.

1A and 4, the first counter 71 counts the number of non-defective products discharged from the turntable 20 by the first discharge mechanism 50. The first counter 71 is provided downstream of the first discharge mechanism 50, i.e., immediately before the case 5. This allows the number of non-defective products housed in the case 5 to be accurately counted.
The first counter 71 may also be provided upstream of the first discharge mechanism 50. This makes it possible to confirm that electronic components 3 remain in the first discharge mechanism 50 when the count numbers of the two first counters 71 are different.

The first counter 71 may be, but is not limited to, a camera, optical sensor, eddy current sensor, etc. The eddy current sensor may be a known eddy current sensor or eddy current displacement sensor. For example, a high-frequency signal is supplied from a resonant circuit to a sensor coil, which generates a high-frequency magnetic field. When an electronic component containing metal approaches this magnetic field, an eddy current is generated in the metal of the electronic component, causing the impedance of the sensor coil to change. This changes the voltage of the resonant circuit. By detecting this voltage change using a detection circuit, the passage of electronic components can be counted.

The second counter 72 counts the number of defective products discharged from the turntable 20 by the second discharge mechanism 60 (not shown). The second counter 72 may be similar to the first counter 71.

The third counter 73 counts the remaining products remaining on the linear feeder 10 and the turntable 20 after the first discharge mechanism 50 has discharged the non-defective products and the second discharge mechanism 60 has discharged the defective products. The third counter 73 may be, but is not limited to, a camera or a known line sensor. For example, in the case of a camera, the third counter 73 may be placed at any position on the turntable 20 and count the remaining products collected by the cleaning function on the linear feeder 10 and the turntable 20. The collected remaining products are collected in a collection box (not shown).

The fourth counter 74 is located relatively upstream of the linear feeder 10 and counts the input electronic components 3. The fourth counter 74 may be, but is not limited to, a camera or the like.

The inspection and sorting controller 80 controls the entire component sorting device 1. Specifically, the inspection and sorting controller 80 performs a visual inspection of the electronic components 3 based on the imaging results from the imaging device 30, and sorts out good and defective components based on the results of the visual inspection. The inspection and sorting controller 80 also performs an electrical characteristic inspection (also called verification) of the electronic components 3 based on the measurement results from the measuring device 40, and further sorts out good and defective components based on the results of the electrical characteristic inspection.

The inspection and sorting controller 80 also controls the discharge of non-defective products by the first discharge mechanism 50. For example, the inspection and sorting controller 80 calculates the timing for discharging non-defective products from the first discharge mechanism 50 based on information such as the conveying speed of the linear feeder 10, the conveying speed (or rotation speed, and length or radius of the rotational conveying trajectory) of the turntable 20, the position of the measuring device 40 on the linear feeder 10 or turntable 20, and the position of the imaging device 30 on the turntable 20, and issues a command to the first discharge mechanism 50.

The inspection and sorting controller 80 also controls the discharge of defective products by the second discharge mechanism 60. For example, the inspection and sorting controller 80 calculates the timing for discharging defective products from the second discharge mechanism 60 based on information such as the conveying speed of the linear feeder 10, the conveying speed (or rotation speed, and length or radius of the rotational conveying trajectory) of the turntable 20, the position of the measuring device 40 on the linear feeder 10 or turntable 20, and the position of the imaging device 30 on the turntable 20, and issues a command to the second discharge mechanism 60.

In addition, the inspection and sorting controller 80 confirms whether the part sorting is normal or abnormal based on the number of good products counted by the first counter 71, the number of defective products counted by the second counter 72, and the number of remaining products counted by the third counter 73.
For example, if the total number of counted good products, defective products, and remaining products differs from the number of visual inspections or electrical characteristic inspections, the inspection and sorting controller 80 may determine that there is an abnormality in the device and issue an alarm indicating the abnormality.
Alternatively, if the total number of counted good products, defective products, and remaining products differs from the input number counted by the fourth counter 74, the inspection and sorting controller 80 may determine that there is an abnormality in the device and issue an alarm indicating the abnormality.

The inspection and sorting controller 80 is composed of an arithmetic processor, such as a DSP (Digital Signal Processor) or FPGA (Field-Programmable Gate Array). The various functions of the inspection and sorting controller 80 are realized, for example, by executing predetermined software (programs) stored in a memory unit. The various functions of the inspection and sorting controller 80 may be realized by a combination of hardware and software, or by hardware (electronic circuits) alone.

The memory unit in the inspection and sorting controller 80 is a rewritable memory such as an EEPROM. The memory unit stores predetermined software (programs) for executing the various functions of the sorting controller. The memory unit also stores various setting values input from, for example, an external device. The various setting values include information regarding the conveying speed of the linear feeder 10, the conveying speed (or rotation speed, and the length or radius of the rotational conveying trajectory) of the turntable 20, the position of the imaging device 30, the position of the measuring device 40, the position of the first discharge mechanism 50, and the position of the second discharge mechanism 60, as well as criteria for determining whether a product is good or bad.

As described above, the component selection device 1 of this embodiment includes a linear feeder 10 that transports electronic components 3, a transparent turntable 20 that transports electronic components 3, six imaging devices 30 that capture images of the six outer surfaces of the electronic components 3 on the turntable 20, and an inspection and selection controller 80 that performs a visual inspection of the electronic components 3 based on the imaging results from the imaging devices 30 and selects non-defective components based on the results of the visual inspection. This allows multiple electronic components 3 to be visually inspected while being transported, and non-defective components to be stored in cases 5.

Such component sorting devices may inspect and sort different types of electronic components for each production lot. For example, surface-mount electronic components may have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors may have different capacitances even if they are the same size.

Furthermore, with such component sorting devices, electronic components from the previous lot may remain on the linear feeder or turntable. In such cases, if the type of electronic components in the current lot is different from the type of electronic components in the previous lot, there is a possibility that electronic components of a different type from the previous lot may be mixed in with the electronic components in the current lot. If electronic components of the same size but different characteristics are mixed in like this, the accuracy of the sorting will decrease, even if the accuracy of the visual inspection is high.

In this regard, the component selection device 1 of this embodiment further includes a measuring device 40 that measures the electrical characteristics of the electronic components 3 on the linear feeder 10 or turntable 20, and the inspection and selection controller 80 performs an electrical characteristic inspection of the electronic components 3 based on the measurement results from the measuring device 40, and further selects non-defective components based on the results of the electrical characteristic inspection. As a result, even if different types of electronic components from a previous lot remain on the linear feeder or turntable and are mixed in with the electronic components of the current lot, electronic components of the same size but different characteristics can be selected as defective based on the results of the electrical characteristic inspection, thereby improving the accuracy of component selection.

Note that the selection of good and bad products based on detailed electrical characteristic specifications is carried out separately, for example after manufacturing and before inputting the products into this device.The above-mentioned electrical characteristic test is a simple electrical characteristic test intended to sort out electronic components of the same size but different characteristics from the previous lot that have been mixed in with the electronic components of the current lot when electronic components from the previous lot remain on a linear feeder or turntable, etc.

The measuring device 40 may be provided on the linear feeder 10 side. In this case, even if the rotation speed of the turntable 20 is as high as 10,000 rpm or more in order to shorten the inspection and sorting time, the electrical characteristics inspection becomes easy.
Alternatively, the measuring device 40 may be provided on the turntable 20 side. In this case, it becomes easier to calculate the timing for ejecting a non-defective or defective product.

Furthermore, according to the component selection device 1 of this embodiment, the linear feeder 10 or turntable 20, on which the electrical characteristics are measured by the measuring device 40, transports the electronic components 3 while electrostatically adsorbing them. This improves the accuracy of the electrical characteristics inspection.

The component sorting device 1 of this embodiment further includes a first counter 71 that counts the number of non-defective components discharged by the first discharge mechanism 50, a second counter 72 that counts the number of defective components discharged by the second discharge mechanism 60, and a third counter 73 that counts the number of remaining components on the linear feeder 10 and turntable 20 after the first discharge mechanism 50 and the second discharge mechanism 60 have discharged the non-defective components. The inspection and sorting controller 80 checks whether the component sorting is normal or abnormal based on the number of non-defective components counted by the first counter 71, the number of defective components counted by the second counter 72, and the number of remaining components counted by the third counter 73. This allows for the detection of component sorting abnormalities, such as a mismatch between the number of output and input electronic components, for each processing lot, preventing electronic components from being mixed in with the electronic components of the next processing lot. This further improves the accuracy of component sorting.

The above describes an embodiment of the present invention, but the present invention is not limited to the above embodiment and various modifications and variations are possible. In the above embodiment, an embodiment including a second discharge mechanism 60 that discharges defective products from the turntable 20 was illustrated. However, the present invention is not limited to this and may be implemented in a form that does not include a second discharge mechanism 60. In this case, the component selection device 1 may immediately discharge defective products from the turntable 20 after imaging and visual inspection by the imaging device 30. Furthermore, the component selection device 1 may immediately discharge defective products from the linear feeder 10 or turntable 20 after measurement and electrical characteristic inspection by the measuring device 40. In this case, a defective product collection function may be provided along the entire outer periphery of the turntable 20 and/or along the entire side of the linear feeder 10.

Furthermore, in the above-described embodiment, an example was given of a configuration in which the inspection and sorting controller 80 has the function of performing visual inspection of electronic components based on the imaging results from the imaging device 30. However, the present invention is not limited to this, and each imaging device 30 may have the visual inspection function. Furthermore, each imaging device 30 may have the function of immediately ejecting defective products from the turntable 20 after visual inspection, as in the above-described modified example.

Furthermore, in the above-described embodiment, an example was given of a configuration in which the inspection and sorting controller 80 has the function of performing electrical characteristic inspection of electronic components based on the measurement results from the measuring device 40. However, the present invention is not limited to this, and the measuring device 40 may also have the electrical characteristic inspection function. Furthermore, each measuring device 40 may have the function of immediately ejecting defective products from the linear feeder 10 or turntable 20 after the electrical characteristic inspection, as in the above-described modified example.

Furthermore, in the above-described embodiment, an example was given of a configuration in which the measuring device 40 measures the electrical characteristics of the electronic component 3. However, the present invention is not limited to this, and the measuring device 40 can also be applied to a configuration in which it measures various characteristics other than electrical characteristics. In this case, the inspection and selection controller 80 performs various characteristic inspections of the electronic component 3 based on the measurement results from the measuring device 40, and selects good and bad products based on the results of these characteristic inspections.

REFERENCE SIGNS LIST 1 Component sorting device 3 Electronic component 5 Case 5a Entrance/exit 10 Linear feeder 12 Electrostatic adsorption mechanism 20 Turntable 21 Rotational conveyance trajectory 22 Guide mechanism 24 Electrostatic adsorption mechanism 30 Imaging device 40 Measuring device 50 First discharge mechanism 52 Tubular member 60 Second discharge mechanism 71 First counter 72 Second counter 73 Third counter 74 Fourth counter 80 Inspection and sorting controller

Claims (3)

A parts sorting device that inspects parts while transporting them, selects non-defective parts, and stores them in cases,
a linear feeder for conveying the parts;
a turntable that conveys and rotates the parts conveyed by the linear feeder;
a plurality of imaging devices for respectively capturing images of a plurality of outer surfaces of the component on the turntable;
a measuring device for measuring a characteristic of the part on the linear feeder or on the turntable;
an inspection and sorting controller that performs an appearance inspection of the component based on the imaging result from the imaging device, performs a characteristic inspection of the component based on the measurement result from the measuring device, and sorts out the non-defective component based on the results of the appearance inspection and the characteristic inspection ;
a first ejection mechanism that ejects the non-defective product selected by the inspection/sorting controller based on the results of the appearance inspection and the characteristics inspection from the turntable and stores the non-defective product in the case;
a second discharge mechanism that discharges, from the turntable, defective products that have been selected by the inspection/sorting controller based on the results of the appearance inspection or the characteristics inspection;
a first counter that counts the number of non-defective products discharged by the first discharge mechanism;
a second counter that counts the defective products discharged by the second discharge mechanism;
a third counter that counts the number of remaining products remaining on the linear feeder and the turntable after the first discharge mechanism has discharged the non-defective products and the second discharge mechanism has discharged the defective products;
Equipped with
the linear feeder or the turntable, on which the characteristics are measured by the measuring device, transports the component while electrostatically attracting it;
the inspection and sorting controller confirms whether the parts sorting is normal or abnormal based on the number of non-defective products counted by the first counter, the number of defective products counted by the second counter, and the number of remaining products counted by the third counter.
Parts sorting device. 2. The component sorting device of claim 1 , wherein the first counter includes a camera. 2. The component sorting apparatus of claim 1 , wherein the first counter includes an eddy current sensor.