JPS5812227B2 - Single crystal manufacturing method - Google Patents
Single crystal manufacturing methodInfo
- Publication number
- JPS5812227B2 JPS5812227B2 JP2639280A JP2639280A JPS5812227B2 JP S5812227 B2 JPS5812227 B2 JP S5812227B2 JP 2639280 A JP2639280 A JP 2639280A JP 2639280 A JP2639280 A JP 2639280A JP S5812227 B2 JPS5812227 B2 JP S5812227B2
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- single crystal
- melt
- raw material
- present
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
本発明は単結晶製造方法、詳し《は、引き上げによる単
結晶製造方法であって、工程時間を短縮せんとするもの
である。DETAILED DESCRIPTION OF THE INVENTION The present invention is a method for producing a single crystal, more specifically a method for producing a single crystal by pulling, which aims to shorten the process time.
坩堝中の原料融液に種子結晶を接触させ、回転引上げる
ことにより単結晶を育成するチヨク2ルスキ法による半
導体シリコン等の犬型梢晶の製造に際しては、従来、結
晶成釆の終了時に結節下端を円錐状に絞り、結晶と残留
融液との引きはなし(よる熱ショックを抑制し、結晶下
端より導入される結晶歪による結晶欠陥の発生を防止し
ていた。When producing dog-shaped crystals of semiconductor silicon, etc. using the Czyok-2-Ruski method, in which a seed crystal is brought into contact with a raw material melt in a crucible and grown by rotation and pulling, conventionally, nodules are generated at the end of crystallization. The lower end was squeezed into a conical shape to suppress the thermal shock caused by the pulling of the crystal and the residual melt, and to prevent the generation of crystal defects due to crystal strain introduced from the lower end of the crystal.
このように結晶成長終了に際して、結晶を円錐状として
いたため、円錐状形成工程にかなりの時間を要すると言
う欠点があった。Since the crystal is formed into a conical shape upon completion of crystal growth, there is a drawback that the process of forming the conical shape requires a considerable amount of time.
第1図はこのような従来の方法によって製造された結晶
の模式図であり、図中、1は種子結晶、2は肩部、3は
定径部、4は下端部を示している。FIG. 1 is a schematic diagram of a crystal produced by such a conventional method, and in the figure, 1 indicates a seed crystal, 2 a shoulder portion, 3 a constant diameter portion, and 4 a lower end portion.
第1図より明かなよ5に、種子結晶1により回転引上げ
られた結晶は、まず肩部2を形成し、次いで定径部3を
形成した後、下端を円錐状に整形し、結晶成長を終了せ
しめるわけであるが、この円錐状下端部3の長さを形成
させるだけ、余分の時間を要することになる。As is clear from Fig. 1, the crystal rotated and pulled up by the seed crystal 1 first forms a shoulder portion 2, then forms a constant diameter portion 3, and then shapes the lower end into a conical shape to prevent crystal growth. However, extra time is required to form the length of the conical lower end 3.
本発明はかかる欠点を除去することを目的とする。The present invention aims to eliminate such drawbacks.
詳しくは、従来のように、円錐状下端部を形成せしめる
ことなく、しかも熱ショックによる結晶欠陥の発生しな
い単結晶を製造する方法を提供冫せんとするものである
。Specifically, it is an object of the present invention to provide a method for manufacturing a single crystal without forming a conical lower end as in the conventional method and without generating crystal defects due to thermal shock.
したがって、本発明による単結晶製造方法は、原料融液
より種子結晶を用い単結晶を引上げる単結晶製造方法に
おいて、結晶成長終了時に結晶下端部近傍を加熱しつつ
、該単結晶と原料融液を分離することを特徴とするもの
である。Therefore, in the single crystal manufacturing method according to the present invention, in which a single crystal is pulled from a raw material melt using a seed crystal, the single crystal and the raw material melt are heated while heating the vicinity of the lower end of the crystal at the end of crystal growth. It is characterized by separating.
かかる本発明による単結晶製造方法によれば、結晶下端
部近傍を加熱しつつ、単結晶と融液を分―せしめるため
、熱ショックによる結晶欠陥が生じず、しかも円錐状下
端部を形成せしめる必要がないため、製造時間を短縮せ
しめることが可能となる。According to the method for manufacturing a single crystal according to the present invention, since the single crystal and the melt are separated while heating the vicinity of the lower end of the crystal, crystal defects due to thermal shock do not occur, and it is necessary to form a conical lower end. This makes it possible to shorten manufacturing time.
本発明を更に詳し《説明すると、本発明による単結晶製
造方法は、結晶成長終了時に、結晶下端部、即ち結晶終
端部近傍を加熱しつつ、結晶と融液を分離する。To explain the present invention in more detail, the method for producing a single crystal according to the present invention separates the crystal from the melt while heating the lower end of the crystal, that is, the vicinity of the terminal end of the crystal, at the end of crystal growth.
第2図は、7.62cmφのシリコン結晶の定径聾終了
時の精晶内温度分布(曲線A)と円錐状下端部形成後、
残留融液より単結晶を切り離した直後の結晶内一度分布
(曲線B)を示すグラフであるが、午のグラフより明か
なように、単結晶が残留融液より分離される際、200
〜300℃の温度差にさらされ、これが熱ショックとし
て作用し、結晶歪を誘起し、結晶欠陥をもたらす。Figure 2 shows the temperature distribution within the crystal (curve A) at the end of the constant diameter deafening of a 7.62 cmφ silicon crystal, and after the formation of the conical lower end.
This is a graph showing the intracrystal distribution (curve B) immediately after the single crystal is separated from the residual melt.As is clear from the graph, when the single crystal is separated from the residual melt,
Exposure to temperature differences of ~300°C acts as a thermal shock, inducing crystal distortion and resulting in crystal defects.
そこで、融液と単結晶を分離する際、単結晶下端部近傍
を原料の融点付近に補助加熱すると、単結晶と融液分離
直後の結晶内分布は曲線Cのようになり、単結晶と融液
の分離における熱ショックはなくなるのである。Therefore, when separating the melt from the single crystal, if the vicinity of the lower end of the single crystal is auxiliary heated to around the melting point of the raw material, the intracrystal distribution immediately after separation from the single crystal and the melt becomes like curve C, and the single crystal and melt Thermal shock during liquid separation is eliminated.
具体的には単結晶育成系全体の温度の制御及び坩堝中の
原料を融液としておくための電気炉の発熱量を下げ、単
結晶下端部近傍を補助加熱するのが好ましい。Specifically, it is preferable to control the temperature of the entire single crystal growth system, lower the amount of heat generated by the electric furnace for keeping the raw material in the crucible as a melt, and auxiliary heat the vicinity of the lower end of the single crystal.
電気炉の発熱量を下げない場合、結晶に欠陥を生じるお
それがあるからである。This is because if the calorific value of the electric furnace is not reduced, defects may occur in the crystal.
単結晶下端部を加熱するための補助加熱手段は本発明に
おいて限定されるものではなく、たとえば、絶縁支持体
、導電性支持棒、リング状発熱体より成る補助加熱装置
を用いることができる。The auxiliary heating means for heating the lower end of the single crystal is not limited in the present invention, and for example, an auxiliary heating device consisting of an insulating support, a conductive support rod, or a ring-shaped heating element can be used.
次に実施例を説明する。Next, an example will be described.
実施例 1
第3図は本発明による単結晶製造方法を実施するための
装置の断面概略図であり、図中、31は種子結晶、32
は単結晶、33は坩堝、34は残留融液、35は絶縁支
持体、36は導電性支持棒、37はリング状発熱体、3
日はリード線である。Example 1 FIG. 3 is a schematic cross-sectional view of an apparatus for implementing the single crystal manufacturing method according to the present invention, in which 31 is a seed crystal, 32 is a seed crystal, and 32 is a seed crystal.
3 is a single crystal, 33 is a crucible, 34 is a residual melt, 35 is an insulating support, 36 is a conductive support rod, 37 is a ring-shaped heating element, 3
Sun is the lead line.
第3図より明かなように、種子結晶31先端に育成され
た単結晶32の下端部は坩堝33中の残留融液34と接
触しており、更にこの下端部近傍残留融液34直上に絶
縁支持体35、導電性支持棒36モ支持されたリング状
発熱体37が設けろれている。As is clear from FIG. 3, the lower end of the single crystal 32 grown at the tip of the seed crystal 31 is in contact with the residual melt 34 in the crucible 33, and is further insulated just above the residual melt 34 near this lower end. A ring-shaped heating element 37 supported by a support body 35 and a conductive support rod 36 is provided.
この装置において、種子結晶31としてシリコンを用い
、直径γ62湿りシリコン単結晶32を育成した。In this apparatus, silicon was used as the seed crystal 31, and a wet silicon single crystal 32 with a diameter of γ62 was grown.
残留融液34とシリコン単結晶32を分離するに際し、
リード線38より電力をリング状発熱体37に供給して
発iさせた。When separating the residual melt 34 and the silicon single crystal 32,
Electric power was supplied from the lead wire 38 to the ring-shaped heating element 37 to generate electricity.
この際、第2図の曲線Cの結晶内温度分布となるように
、リング状発熱体37と共に電気炉(図示せず)の発熱
量を調整し、単.結晶32下端部の温度をシリコンの融
点近傍に設定して、単結晶《及び残留融液34を分離し
た。At this time, the calorific value of the electric furnace (not shown) together with the ring-shaped heating element 37 is adjusted so that the temperature distribution within the crystal is as shown by curve C in FIG. The temperature at the lower end of the crystal 32 was set near the melting point of silicon, and the single crystal and the residual melt 34 were separated.
この単結晶32の形状を第4図としに示
す。The shape of this single crystal 32 is shown in FIG.
第4図において、41は種子結晶、42リ肩部、4亭は
定径部である。In FIG. 4, 41 is a seed crystal, 42 is a shoulder portion, and 4 is a constant diameter portion.
この第4図より明かなように、単結晶は肩部42及び定
径部43で構盛され、従来のように、円錐状下端部4(
第1図)を有していない。As is clear from this FIG.
(Fig. 1).
従来の方法により円錐状下端部を形成する場合、分離に
約2.5時間要したが、この実施例の場合、約0.5時
間以内で分離しえた。When forming the conical bottom end by the conventional method, it took about 2.5 hours to separate, but in this example, it was possible to separate within about 0.5 hours.
実施例 2
直径12.7(mのシリコン単結晶32を残留融液34
と分離した。Example 2 A silicon single crystal 32 with a diameter of 12.7 m was placed in a residual melt 34.
separated.
従来のように円錐状下端部を形成せしめた場合、電気炉
本体が大きく、単結晶育成系の温度が容易に上昇せず、
しかも円錐状下端部が長くなるため、下端物理に約5時
間を要したが、本実施例においては補助加熱電力を高く
することにより約0.5〜0.6時間で終了した。If a conical lower end is formed as in the conventional method, the electric furnace body is large and the temperature of the single crystal growth system does not rise easily.
Moreover, since the lower end of the conical shape is longer, it took about 5 hours to physically perform the lower end, but in this example, it was completed in about 0.5 to 0.6 hours by increasing the auxiliary heating power.
以上説明したように、補助加熱が結晶下端と残留融液表
面の局部に限られることから、処理が能率的に進行して
、要する時間を従来の20%以下に短縮することができ
、結晶製造の生産性を高めることに効果がある。As explained above, since the auxiliary heating is limited to the lower end of the crystal and the surface of the residual melt, the process progresses efficiently and the time required can be shortened to less than 20% of the conventional time. It is effective in increasing productivity.
従来の方法は、結晶径が大きくんるに従って処理時間を
長く要するのに対し、本発明による単結晶製造方法は、
補助加熱の電力の増加によって処理時間を短く維持でき
るので、今後の結晶の大型化においては益々有利kなる
と考える。While conventional methods require longer processing time as the crystal size increases, the method for producing single crystals according to the present invention
Since the processing time can be kept short by increasing the power for auxiliary heating, we believe that this will be more and more advantageous in increasing the size of crystals in the future.
以上のように結晶成長率の高いシリコンでも時間短縮が
顕著であるので、さらに成長率が低く、しかも下端を円
錐状に形成する必要のある大型結晶の場合には益々本発
明の方法が有効であることは明らかである。As described above, the time reduction is remarkable even in silicon with a high crystal growth rate, so the method of the present invention is even more effective in the case of large crystals with a low growth rate and whose lower end needs to be formed into a conical shape. It is clear that there is.
第1図は従来の方法により製造した単結晶の模式図、第
2図は結晶育成の成長終了時における単結晶内温度分布
、第3図は本発明による単結晶製造方法を実施するため
の装置の断面模式図、第4図は本発明によ暮箪結晶製造
方法により製造した単結晶の模式図である。
1,31.41一種子結晶、2,42川肩部、3,43
二定径部、4刊下端部、32…単結晶、33晶坩堝、3
4二残留融液、35―絶縁支持体、36二導電性支持棒
、37…リング状発熱体、羽…リード線。Figure 1 is a schematic diagram of a single crystal produced by a conventional method, Figure 2 is the temperature distribution within the single crystal at the end of crystal growth, and Figure 3 is an apparatus for carrying out the single crystal manufacturing method according to the present invention. FIG. 4 is a schematic cross-sectional view of a single crystal produced by the method for producing a crystal in accordance with the present invention. 1, 31. 41 Seed crystal, 2, 42 River shoulder, 3, 43
2 constant diameter parts, 4 lower end parts, 32...single crystal, 33 crystal crucible, 3
42 residual melt, 35-insulating support, 362 conductive support rods, 37...ring-shaped heating element, wings...lead wire.
Claims (1)
単結晶製造方法において、結晶成長終了時に、結晶下端
部近傍を前記原料の融点近傍に加熱しつつ、核単結晶と
原料融液を分離することを特徴とする単結晶製造方法。1 In a single crystal manufacturing method in which a single crystal is pulled from a raw material melt using a seed crystal, at the end of crystal growth, the core single crystal and the raw material melt are heated while heating the vicinity of the lower end of the crystal to near the melting point of the raw material. A single crystal production method characterized by separation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2639280A JPS5812227B2 (en) | 1980-03-03 | 1980-03-03 | Single crystal manufacturing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2639280A JPS5812227B2 (en) | 1980-03-03 | 1980-03-03 | Single crystal manufacturing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56125295A JPS56125295A (en) | 1981-10-01 |
| JPS5812227B2 true JPS5812227B2 (en) | 1983-03-07 |
Family
ID=12192264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2639280A Expired JPS5812227B2 (en) | 1980-03-03 | 1980-03-03 | Single crystal manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5812227B2 (en) |
-
1980
- 1980-03-03 JP JP2639280A patent/JPS5812227B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56125295A (en) | 1981-10-01 |
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