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JPS5942466B2 - turn-off thyristor - Google Patents
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JPS5942466B2 - turn-off thyristor - Google Patents

turn-off thyristor

Info

Publication number
JPS5942466B2
JPS5942466B2 JP53119962A JP11996278A JPS5942466B2 JP S5942466 B2 JPS5942466 B2 JP S5942466B2 JP 53119962 A JP53119962 A JP 53119962A JP 11996278 A JP11996278 A JP 11996278A JP S5942466 B2 JPS5942466 B2 JP S5942466B2
Authority
JP
Japan
Prior art keywords
layer
thyristor
electrode
turn
cathode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53119962A
Other languages
Japanese (ja)
Other versions
JPS5546543A (en
Inventor
徹郎 末岡
聡 石橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Electric Manufacturing Co Ltd
Priority to JP53119962A priority Critical patent/JPS5942466B2/en
Publication of JPS5546543A publication Critical patent/JPS5546543A/en
Publication of JPS5942466B2 publication Critical patent/JPS5942466B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D18/00Thyristors
    • H10D18/60Gate-turn-off devices 

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  • Thyristors (AREA)

Description

【発明の詳細な説明】 本発明はゲート電流で阻止状態(ゲートターンオフサイ
リスタ)あるいは阻止動作を助勢できるターンオフサイ
リスタに係り、ベース層内に低抵抗ゲート層を埋込む構
造のサイリスタの増幅ゲート構造部の改良に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a turn-off thyristor that can assist in blocking state (gate turn-off thyristor) or blocking operation with gate current, and relates to an amplification gate structure of a thyristor having a structure in which a low resistance gate layer is embedded in a base layer. Regarding the improvement of

この種の従来構造を第1図に示す。A conventional structure of this type is shown in FIG.

P1、Ni、P2層の各層は通常の製法通りN形51に
ガリウム拡散してP1及びP21層を形成し、P2”層
片面に選択拡散法によりボロンを高濃度に拡散してPf
1層を所定のパターンに形成する。P゛1層のパターン
はインボリユウト曲線状、櫛歯状等にされる。Pf1層
の上にはエピタキシャル成長法により比較的高抵抗10
〜20Ω一部)のP形Si層P2−を形成し、更に選択
拡散でリンを所定のパターン(環状)に拡散してN2及
びN3層を形成し、かつ埋込P゛1層から電極取出しの
ためにP2−層の一部1をPff層までエッチング除去
し、これらN2、N3、P2、P1、P2゛1層の表面
に通常アルミ電極を合金してアノード電極2、ゲート電
極3、補助サイリスタ電極4、カソード電極5、オフ用
ゲート電極6を設ける。こうした構造のゲートターンオ
フサイリスタの動作は、電極2、5間を順バイアス状態
でゲート3、カソード5間にゲート点弧電流を流すと、
まず、P1・Ni・P2″′、P2−、N3からなる補
助サイリスタが点弧して増幅された電流が電極4からN
2層に流れ、P1、Ni、P2層、P2−、N2から成
る主サイリスタを点弧させる。
Each of the P1, Ni, and P2 layers is formed by diffusing gallium into the N-type 51 according to the usual manufacturing method to form the P1 and P21 layers, and by diffusing boron at a high concentration on one side of the P2'' layer by a selective diffusion method to form Pf.
One layer is formed into a predetermined pattern. The pattern of the P1 layer is formed into an involute curve shape, a comb shape, etc. A relatively high resistance 10 layer is formed on the Pf1 layer by epitaxial growth.
Form a P-type Si layer P2- of ~20Ω (partly), then diffuse phosphorus in a predetermined pattern (ring shape) by selective diffusion to form N2 and N3 layers, and take out the electrode from the buried P1 layer. For this purpose, part 1 of the P2- layer is etched away to the Pff layer, and aluminum electrodes are usually alloyed on the surfaces of these N2, N3, P2, P1, and P2 layers to form anode electrodes 2, gate electrodes 3, and auxiliary electrodes. A thyristor electrode 4, a cathode electrode 5, and an off gate electrode 6 are provided. The gate turn-off thyristor with this structure operates as follows when a gate firing current is passed between the gate 3 and the cathode 5 with forward bias between the electrodes 2 and 5.
First, the auxiliary thyristor consisting of P1・Ni・P2″′, P2−, and N3 is fired, and the amplified current flows from the electrode 4 to the N
It flows through two layers and fires the main thyristor consisting of P1, Ni, P2 layers, P2-, and N2.

次に、点弧したサイリスタを阻止状態にするには、OF
F用制御電源7によりスイッチ素子8を介してN2、P
2−接合−P”1層−電極6の経路で逆電流を流し、N
2P2−接合の逆耐圧を回復させ、P1、Ni、P2”
、P、、N2のサイリスタ部の電流を遮断させる。従つ
て、OFF用制御電源7の電圧はN2P2−接合にのみ
印加されるので、補助サイリスタ部P1、Ni、P2層
3P2−、N3が導通状態にあつた場合にはP3P2一
接合は阻止状態に回復できず、N2P2接合にゲート電
流を流し込むことになり、サイリスタは0FFできない
し、むしろN2P2一接合のN3層側に電流集中を生じ
て熱破壊する。このように、従来構造のゲートターンオ
フサイリスタでは補助サイリスタ部が必ず0FF状態で
スイツチ8を0Nして主サイリスタ部を0FFさせる必
要がある。
Next, to put the fired thyristor into the blocking state, OF
N2, P via the switch element 8 by the control power supply 7 for F
2-Junction-P'' 1 layer-electrode 6 path through which a reverse current flows, N
2P2-restores the reverse breakdown voltage of the junction, P1, Ni, P2''
, P, , the currents in the thyristor sections of N2 are cut off. Therefore, since the voltage of the OFF control power supply 7 is applied only to the N2P2- junction, when the auxiliary thyristor part P1, Ni, and P2 layer 3P2-, N3 are in a conductive state, the P3P2-junction is in a blocking state. It cannot be recovered, and a gate current flows into the N2P2 junction, and the thyristor cannot be turned off. Rather, current concentration occurs on the N3 layer side of the N2P2 junction, resulting in thermal breakdown. As described above, in the gate turn-off thyristor of the conventional structure, it is necessary to turn the switch 8 ON to turn the main thyristor section OFF while the auxiliary thyristor section is always in the OFF state.

補助サイリスタ部の0FFはこの部分の電圧降下を主サ
イリスタ部の電圧降下よりも高くなるように構成するこ
とで達成され、これは主サイリスタ部に比べて補助サイ
リスタ部のライフタイムを大幅に小さくする(金拡散を
強くする)とか、電極4と電極5の間をエツチングして
その部分の抵抗を高める方法がある。しかしながら、通
常のインバータ主回路に上述の手段を施したサイリスタ
を使用し、モータ負荷など負荷からの逆電圧により負荷
電流が断続する場合、この場合にも主サイリスタを点弧
しつづける必要があるため、負荷電流通流幅のゲート電
流を流さなければならない。従つて、このゲート電流を
中断してスイツチ8を0Nさせ、主電流を0FFさせる
という回路動作上複雑な構成が必要である。本発明は上
述の問題点に鑑みてなされたもので、ゲート点弧時には
増幅機能を有し、0FF時には主サイリスタ部と同時に
補助サイリスタ部に逆バイアスを印加してターンオフで
きるようにしたターンオフサイリスタを提供することを
目的とする。
OFF of the auxiliary thyristor section is achieved by configuring the voltage drop in this section to be higher than the voltage drop in the main thyristor section, which significantly reduces the lifetime of the auxiliary thyristor section compared to the main thyristor section. There are methods such as (strengthening gold diffusion) or etching between electrode 4 and electrode 5 to increase the resistance of that part. However, if a thyristor with the above-mentioned measures is used in a normal inverter main circuit, and the load current is intermittent due to reverse voltage from the load such as a motor load, the main thyristor must continue to fire even in this case. , a gate current with the width of the load current must flow. Therefore, a complicated configuration is required for circuit operation, in which the gate current is interrupted, the switch 8 is turned ON, and the main current is turned OFF. The present invention has been made in view of the above-mentioned problems, and includes a turn-off thyristor which has an amplification function when the gate is turned on and which can be turned off by applying a reverse bias to the auxiliary thyristor section at the same time as the main thyristor section when the gate is 0FF. The purpose is to provide.

第2図は本発明の一実施例を示すゲートターンオフサイ
リスタの断面図であり、第1図と同じ内容のものは同一
符号で示す。第2図の構成においては、補助サイリスタ
部を構成するN3層の直下にもP++層の延長領域9を
設け、かつN3層の表面にはP2一層と短絡しないよう
に補助サイリスタ電極10を設け、この電極10とP+
+層の取出電極6を抵抗11で結線し、さらに主サイリ
スタ部のカソード電極5とN3層の電極10との間をN
3層からの電流を阻止する極性にダイオード12を接続
している。こうした構造において、電極2,5間に順バ
イアス電圧を印加した状態でゲート電極3と電極5間に
点弧用ゲート電流を流すと、Pl,Nl,P2+,P2
−,N3からなる補助サイリスタが点弧し、この電流は
抵抗11を通して電極6−P++−P2−一N2一電極
5に流れる。
FIG. 2 is a sectional view of a gate turn-off thyristor showing an embodiment of the present invention, and the same parts as in FIG. 1 are designated by the same symbols. In the configuration shown in FIG. 2, an extension region 9 of the P++ layer is provided directly below the N3 layer constituting the auxiliary thyristor section, and an auxiliary thyristor electrode 10 is provided on the surface of the N3 layer so as not to short-circuit with the P2 layer. This electrode 10 and P+
The extraction electrode 6 of the + layer is connected with a resistor 11, and the N
A diode 12 is connected with a polarity that blocks current from the third layer. In such a structure, when an ignition gate current is passed between the gate electrode 3 and the electrode 5 with a forward bias voltage applied between the electrodes 2 and 5, Pl, Nl, P2+, P2
-, N3 is fired, and this current flows through the resistor 11 to the electrodes 6-P++-P2--N2-electrode 5.

すなわち、N3層を通して流れる電流は外部抵抗(図示
しない)と抵抗11及び補助サイリスタ部の導通内部抵
抗で決る値になる。ここで、N3層の接合面積はN3層
電流密度が2〜10A/i程度になるように、かつ0N
させるべきN2層側へのP++層からの電流密度も1〜
5A/ml程度になるように抵抗11の値を選定する。
この結果、N3層に流れる電流は電極6側に近いN2層
の側面全域を埋込層形状に点弧させ、N3層に流れてい
た電流をN2層に移行し、Pl,Nl,P2+,P2−
,N2の主サイリスタ部を導通させる。次に、サイリス
タを阻止状態に移行させるには、電極3に加えた0Nゲ
ート電流を0FFにした後、スイツチ8を0Nして電源
7からN2−P2−P+8一電極6の経路で逆バイアス
を加え、主サイリスタの導通を阻止させるが、この時ダ
イオード12によりN3−P2−一P++一電極6にも
逆電圧が印加され、補助サイリスタ部も0FFする。
That is, the current flowing through the N3 layer has a value determined by the external resistance (not shown), the conduction internal resistance of the resistor 11, and the auxiliary thyristor section. Here, the junction area of the N3 layer is set so that the N3 layer current density is about 2 to 10A/i, and 0N
The current density from the P++ layer to the N2 layer side that should be
The value of the resistor 11 is selected to be approximately 5 A/ml.
As a result, the current flowing in the N3 layer ignites the entire side surface of the N2 layer near the electrode 6 side in a buried layer shape, and the current flowing in the N3 layer is transferred to the N2 layer, Pl, Nl, P2+, P2 −
, N2 are made conductive. Next, to shift the thyristor to the blocking state, after turning the 0N gate current applied to the electrode 3 to 0FF, turn the switch 8 to 0N to apply a reverse bias from the power supply 7 to the path from N2-P2-P+8 to electrode 6. In addition, conduction of the main thyristor is blocked, but at this time, a reverse voltage is also applied to the N3-P2-1P++ electrode 6 by the diode 12, and the auxiliary thyristor section is also turned off.

本実施例の実験結果を示すと、各接合及び電極は従来の
ものと同一手段で構成した1200耐王、ゲート遮断電
流500Aのサイリスタ20Ωの抵抗11を接続し、6
0Vの電源7,1A容量のダイオード12及び高速スイ
ツチトランジスタにしたスイツチ8を設けて動作させた
結果、N3層に流れた電流が1〜3μs以内でN2層を
充分な面積で点弧させ、かつ500Aの負荷電流に対し
てゲート3の電流の0FFと同時にスイツチ8を0Nし
てターンオフさせた場合でも5μs以内の時間でターン
オフさせた鳴合でも5μs以内の時間でターンオフする
ことを確認した。なお、このターンオフ時間はN3層が
確実に遮断している場合のターンオフ時間と殆んど差が
ないことが判つた。また、N3層直下のP++層の密度
をN2層に比べて密にすることにより0N,0FFタイ
ムが一層早くなることが判つた。これは、P++層を設
けることにより導通時の内部インピーダンスを増す結果
、N2層へのバイアス効果が大きいことからN2層に電
流が流れ易くなりかつ0FF時にはN3層から電極6へ
の掃引抵抗が小さくなるために逆ゲート電流が一層流れ
易くなるためと考えられる。上述の如く、本実施例によ
ればゲートターンオフサイリスタのゲート点弧電流を補
助サイリスタ部により0.1〜0.5A程度に減少させ
ることができ、かつ点弧ゲート信号と0FF信号との時
間遅れを取る必要が全くない。
To show the experimental results of this example, each junction and electrode was connected to a thyristor 11 of 20 ohms with a resistance of 1200 ohms and a gate cut-off current of 500 A, which was constructed using the same means as the conventional one, and
As a result of operating a 0V power supply 7, a diode 12 with a capacity of 1A, and a switch 8 made of a high-speed switch transistor, the current flowing through the N3 layer ignites a sufficient area of the N2 layer within 1 to 3 μs, and It was confirmed that even if the switch 8 was turned ON and turned off at the same time as the current of the gate 3 was turned 0FF for a load current of 500A, the switch 8 was turned off within 5μs even if the switch 8 was turned off within 5μs. It has been found that this turn-off time is almost the same as the turn-off time when the N3 layer is reliably cut off. It has also been found that by making the density of the P++ layer immediately below the N3 layer denser than that of the N2 layer, the 0N and 0FF times can be made even faster. This is because the provision of the P++ layer increases the internal impedance during conduction, which has a large bias effect on the N2 layer, making it easier for current to flow through the N2 layer, and at 0FF, the sweep resistance from the N3 layer to the electrode 6 is small. This is thought to be because the reverse gate current becomes easier to flow. As described above, according to this embodiment, the gate firing current of the gate turn-off thyristor can be reduced to about 0.1 to 0.5 A by the auxiliary thyristor section, and the time delay between the firing gate signal and the 0FF signal can be reduced. There is no need to take it.

このため、点弧信号を加えた直後に負荷側などの短絡で
サイリスタ素子に過電流が流れようとした場合に直ちに
0FF信号を印加して過電流を遮断することが可能にな
り、サイリスタの制御回路構成が非常に簡単になる。ま
た、従来素子では上述の点弧信号と0FF信号との時間
遅れ内での電流上昇を抑えるためにサイリスタと直列に
限流用リアクトルを接続する必要があつたのに対して、
本発明のサイリスタでは限流用リアクトルを必要としな
い。第3図は本発明の他の実施例を示し、第2図と同じ
内容のものは同一符号で示す。
Therefore, if an overcurrent attempts to flow through the thyristor element due to a short circuit on the load side immediately after applying the ignition signal, it is possible to immediately apply a 0FF signal to interrupt the overcurrent, making it possible to control the thyristor. The circuit configuration becomes very simple. In addition, with conventional elements, it was necessary to connect a current-limiting reactor in series with the thyristor in order to suppress the current rise within the time delay between the above-mentioned ignition signal and 0FF signal.
The thyristor of the present invention does not require a current limiting reactor. FIG. 3 shows another embodiment of the present invention, and the same parts as in FIG. 2 are designated by the same reference numerals.

第3図の構造の特徴は、カソードN2層のうちN3層側
一部領域13を所定の形状、深さにエツチング除去し、
この領域13の一部14にアルミ電極15をオーミツク
接着させるためのリンを拡散して高不純物濃度域を形成
し、アルミ電極15は他の電極3,10,5,6の形成
と同時に形成し、電極10と電極15を導線16で結線
するにある。こうした構造において、電極2,5間を順
バイアスし、ゲート電極3に点弧用ゲート電流を流すと
、N3層等から成る補助サイリスタが点弧し、この電流
は電極15から領域13部分の抵抗17N2一電極5に
流れ、抵抗17の電圧降下によりP2−,N2接合を順
バイアスし、N2層からP2層への電子の注入を起させ
、N2層等から成る主サイリスタ部を点弧させる。
The feature of the structure shown in FIG. 3 is that a partial region 13 on the N3 layer side of the cathode N2 layer is removed by etching to a predetermined shape and depth.
A high impurity concentration region is formed by diffusing phosphorus in a part 14 of this region 13 to ohmicly bond the aluminum electrode 15, and the aluminum electrode 15 is formed at the same time as the other electrodes 3, 10, 5, and 6. , the electrode 10 and the electrode 15 are connected by a conductive wire 16. In this structure, when a forward bias is applied between electrodes 2 and 5 and an ignition gate current is passed through gate electrode 3, the auxiliary thyristor made of N3 layer etc. is ignited, and this current flows from electrode 15 to region 13. 17N2 flows through the electrode 5, forward biases the P2-, N2 junction due to the voltage drop across the resistor 17, causes injection of electrons from the N2 layer to the P2 layer, and ignites the main thyristor section consisting of the N2 layer and the like.

従つて、初期点弧領域は抵抗域17と電極5の端部18
から始まる。次に、導通したサイリスタを阻止状態に移
行させるため、スイツチ8を0Nすると、N2P2一接
合が電源7により逆バイアスされ、同時に接合NN3P
2−も抵抗域17を通して並列に逆バイアスが印加され
、N3層等から成る補助サイリスタ部も0FFさせる。
本実施例では抵抗域17を形成するためのエツチング除
去領域13は、N2層面のN3層に近い側に設けたが、
これは実施例の反対側(N3層から遠い側)に設けても
よいことは言うまでもない。
Therefore, the initial ignition region is the resistance region 17 and the end 18 of the electrode 5.
start from. Next, in order to transfer the conductive thyristor to the blocking state, switch 8 is turned ON, the N2P2 junction is reverse biased by the power supply 7, and at the same time the junction NN3P
2- is also applied with a reverse bias in parallel through the resistance region 17, and the auxiliary thyristor section consisting of the N3 layer etc. is also turned off.
In this embodiment, the etching removal region 13 for forming the resistance region 17 was provided on the side of the N2 layer near the N3 layer.
It goes without saying that this may be provided on the opposite side of the embodiment (the side far from the N3 layer).

第4図に第3図の構成の別の実施例を示す。本実施例は
第3図の構成で必要であつたアルミ電極15をオーミツ
ク接着させるための拡散層14を除去し、かつ電極10
と15を接続するための連結線16を不要とする構成で
ある。即ち、N2層の一部領域19を所望の抵抗域17
を形成するようにエツチング除去する。N3層と、N2
層の一部領域22と、これに挟まれたP2一層の一部2
3との表面に絶縁材としての酸化膜20を形成し、これ
を介してN3層及びN2層の一部域22とをアルミ蒸着
法による電極21で連結するものである。第3図及び第
4図の構成の場合の効果も、第2図の場合と同等である
。本発明によるターンオフサイリスタの製法を第2図に
ついて説明する。
FIG. 4 shows another embodiment of the configuration shown in FIG. 3. In this embodiment, the diffusion layer 14 for ohmic bonding of the aluminum electrode 15, which was necessary in the configuration shown in FIG. 3, is removed, and the electrode 10 is
This configuration eliminates the need for the connecting wire 16 for connecting the two. That is, a partial region 19 of the N2 layer is formed into a desired resistance region 17.
Remove by etching to form. N3 layer and N2
A partial region 22 of the layer and a portion 2 of the P2 layer sandwiched therebetween
An oxide film 20 as an insulating material is formed on the surface of the N3 layer and a part of the N2 layer 22 via the oxide film 20, and an electrode 21 formed by aluminum vapor deposition is used to connect the N3 layer and a partial region 22 of the N2 layer. The effects in the configurations of FIGS. 3 and 4 are also the same as in the case of FIG. 2. A method of manufacturing a turn-off thyristor according to the invention will be explained with reference to FIG.

比抵抗50〜60Ω−いのN形シリコンウエハ一(片面
鏡面仕上げ)に閉管法によりガリウムを拡散してPlN
lP2+層を作る。この時の拡散深さ(P1及びP2+
層の厚さ)は概略40μ、表面濃度は1×1018であ
る。このウエハ一の両面に酸化膜を形成し、鏡面仕上面
側P2+表面に所定の拡散パターンを形成するために酸
化膜を部分的に除去し、この部分に1×1020の表面
濃度でかつ表面抵抗が0.5〜1Ω/になるようにボロ
ンを選択拡散する。更にこの表面に10〜20Ω一儂の
比抵抗のP形層(P2−)をエビタキシヤル成長法で形
成する。P2一層の厚さは35〜40μである。更にエ
ビタキシヤル成長面に酸化膜を形成し、これを部分的に
除去してこの部分にリンを選択拡散してN2層及びN3
層を形成する。
Gallium is diffused into an N-type silicon wafer (one side mirror finished) with a specific resistance of 50 to 60 Ω using a closed tube method to form PlN.
Create lP2+ layer. The diffusion depth at this time (P1 and P2+
The layer thickness is approximately 40 μm, and the surface concentration is 1×10 18 . An oxide film is formed on both sides of this wafer, and the oxide film is partially removed to form a predetermined diffusion pattern on the mirror-finished surface side P2+, and a surface concentration of 1 x 1020 and a surface resistance of 1 x 1020 are applied to this part. Boron is selectively diffused so that the resistance is 0.5 to 1 Ω/. Furthermore, a P-type layer (P2-) having a specific resistance of 10 to 20 Ω is formed on this surface by an epitaxial growth method. The thickness of one layer of P2 is 35-40μ. Furthermore, an oxide film is formed on the epitaxial growth surface, this is partially removed, and phosphorus is selectively diffused into this part to form an N2 layer and an N3 layer.
form a layer.

この拡散深さは10〜15μである。更にP1層側から
金拡散を施してN,層内のライフタイムが所定の値にな
るように調整する。電極6をP++層に接着するために
酸化膜あるいはアピエゾンワツクス等を用いて部分1を
P+1層までエツチング除去し、この後カソード側面全
面にアルミニウムを蒸着後電極3,5,6,10を構成
するように不要部分を除去する。
This diffusion depth is 10-15μ. Furthermore, gold is diffused from the P1 layer side to adjust the lifetime within the N layer to a predetermined value. In order to bond the electrode 6 to the P++ layer, the portion 1 is etched away to the P+1 layer using an oxide film or apiezon wax, etc. After that, aluminum is deposited on the entire side surface of the cathode, and then the electrodes 3, 5, 6, and 10 are attached. Remove unnecessary parts to configure.

P1層表面にアルミニウムを用いてタングステン板から
なる熱補償体を合金接着し、ターンオフサイリスタとし
ての順方向及び逆方向耐圧を確保するために周辺部をベ
ベリング加工、エツチング処理及びワニス処理による表
面安定化を施す。抵抗11及びダイオード12の接続は
封入ケースの外部でもよいが、カソード側の電極5に接
着させる銅ポストの内部に溝を堀つて組み込む事が可能
である。
A thermal compensator made of a tungsten plate is bonded to the surface of the P1 layer using aluminum alloy, and the surface is stabilized by beveling, etching, and varnishing on the periphery in order to ensure forward and reverse withstand voltage as a turn-off thyristor. administer. The resistor 11 and the diode 12 may be connected outside the enclosure, but they can be connected by digging a groove inside a copper post that is bonded to the electrode 5 on the cathode side.

また、第2図、第3図、第4図で示した実施例ではセン
ターゲート構造の場合を示したが、これに限定されるも
のでなく、適宜設計変更できる。
Further, although the embodiments shown in FIGS. 2, 3, and 4 have a center gate structure, the structure is not limited to this, and the design can be changed as appropriate.

以上明らかにした通り、本発明によるターンオフサイリ
スタはターンオフ時に主サイリスタ部のゲート電流0F
Fと同時に補助サイリスタ部をターンオフ制御できる効
果がある。
As clarified above, the turn-off thyristor according to the present invention has a gate current of 0F in the main thyristor section during turn-off.
This has the effect of controlling the turn-off of the auxiliary thyristor section at the same time as F.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はターンオフサイリスタの従来構造を示す断面構
造図、第2図は本発明の一実施例を示す断面構造図、第
3図、第4図は夫々本発明の他の実施例を示す図である
。 2・・・・・・アノード電極、2・・・・・・ゲート電
極、4・・・・・・補助サイリスタ電極、5・・・・・
・カソード電極、6・・・・・・オフ用ゲート電極、7
・・・・・・外部電源、8・・・・・・オフ制御用スイ
ツチ、9・・・・・・P++層の延長領域、10・・・
・・・補助サイリスタ電極、11・・・・・・抵抗、1
2・・・・・・ダイオード、13・・・・・・N3層エ
ツチング領域、15・・・・・・電極、16・・・・・
・導線、17・・・・・・領域13部分の等価抵抗。
FIG. 1 is a cross-sectional structural diagram showing a conventional structure of a turn-off thyristor, FIG. 2 is a cross-sectional structural diagram showing one embodiment of the present invention, and FIGS. 3 and 4 are diagrams showing other embodiments of the present invention, respectively. It is. 2...Anode electrode, 2...Gate electrode, 4...Auxiliary thyristor electrode, 5...
・Cathode electrode, 6... Gate electrode for off, 7
...External power supply, 8...Off control switch, 9...Extension area of P++ layer, 10...
... Auxiliary thyristor electrode, 11 ... Resistor, 1
2... Diode, 13... N3 layer etching region, 15... Electrode, 16...
・Conducting wire, 17...Equivalent resistance of area 13 part.

Claims (1)

【特許請求の範囲】 1 P_1N_1P_2N_2の4層と、上記P_2層
中に形成されてターンオフ用電極に接続されたP_2層
に同じ極性の低抵抗埋込層(P^+^+)と、主サイリ
スタ部のカソードN_2層とは分割された補助サイリス
タ部のカソードN_2層(N_3)とを備え、補助サイ
リスタ部を点弧させることにより主サイリスタ部にその
点弧電流が流れるようにしたサイリスタにおいて、上記
埋込層P^+^+を補助サイリスタ部のカソードN_3
層下部にまで設け、補助サイリスタのカソードN_3層
と前記N_2層間に抵抗部を設け、ターンオン時にカソ
ードN_3層から抵抗部を介してN_2層のルートで電
流を流し、且つターンオフ時にカソードN_3層、埋込
層P^+^+電源のルートで電流を流すように構成した
ターンオフサイリスタ。 2 抵抗部は、カソードN_2層の一部をエッチング除
去して形成したことを特徴とする特許請求の範囲第1項
記載のターンオフサイリスタ。 3 抵抗部はカソードN_3と埋込層P^+^+間に接
続した抵抗に構成したことを特徴とする特許請求の範囲
第1項記載のターンオフサイリスタ。
[Claims] 1 Four layers of P_1N_1P_2N_2, a low resistance buried layer (P^+^+) of the same polarity in the P_2 layer formed in the P_2 layer and connected to the turn-off electrode, and a main thyristor. The cathode N_2 layer of the section is provided with the cathode N_2 layer (N_3) of the auxiliary thyristor section which is divided, and the ignition current flows to the main thyristor section by firing the auxiliary thyristor section. The embedded layer P^+^+ is used as the cathode N_3 of the auxiliary thyristor section.
A resistive section is provided between the cathode N_3 layer and the N_2 layer of the auxiliary thyristor, and when turned on, current flows from the cathode N_3 layer through the resistive section to the N_2 layer route, and when turned off, the cathode N_3 layer and the buried A turn-off thyristor configured to allow current to flow through the power supply route. 2. The turn-off thyristor according to claim 1, wherein the resistance portion is formed by etching and removing a part of the cathode N_2 layer. 3. The turn-off thyristor according to claim 1, wherein the resistor portion is configured as a resistor connected between the cathode N_3 and the buried layer P^+^+.
JP53119962A 1978-09-29 1978-09-29 turn-off thyristor Expired JPS5942466B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53119962A JPS5942466B2 (en) 1978-09-29 1978-09-29 turn-off thyristor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53119962A JPS5942466B2 (en) 1978-09-29 1978-09-29 turn-off thyristor

Publications (2)

Publication Number Publication Date
JPS5546543A JPS5546543A (en) 1980-04-01
JPS5942466B2 true JPS5942466B2 (en) 1984-10-15

Family

ID=14774503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53119962A Expired JPS5942466B2 (en) 1978-09-29 1978-09-29 turn-off thyristor

Country Status (1)

Country Link
JP (1) JPS5942466B2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5757561U (en) * 1980-09-22 1982-04-05
JPS5766556U (en) * 1980-10-07 1982-04-21
JPS57128964A (en) * 1981-02-02 1982-08-10 Meidensha Electric Mfg Co Ltd Semiconductor controlling rectifying device
JPS57160161A (en) * 1981-03-27 1982-10-02 Meidensha Electric Mfg Co Ltd Gate turn-off thyristor
JPS5927571A (en) * 1982-08-05 1984-02-14 Meidensha Electric Mfg Co Ltd Gate turn-off thyristor
JPS6432975U (en) * 1987-08-25 1989-03-01

Also Published As

Publication number Publication date
JPS5546543A (en) 1980-04-01

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