JPS596383B2 - Diagnostic method for surface inspection equipment - Google Patents
Diagnostic method for surface inspection equipmentInfo
- Publication number
- JPS596383B2 JPS596383B2 JP15260777A JP15260777A JPS596383B2 JP S596383 B2 JPS596383 B2 JP S596383B2 JP 15260777 A JP15260777 A JP 15260777A JP 15260777 A JP15260777 A JP 15260777A JP S596383 B2 JPS596383 B2 JP S596383B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- edge
- circuit
- inspected
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【発明の詳細な説明】
本発明は、表面検査装置の正常、異常を検査する自己診
断方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a self-diagnosis method for testing whether a surface inspection device is normal or abnormal.
圧延鋼板などの被検査体の表面疵は勿論好ましからざる
ものであり、程度によつては製品を不良にしてしまう。Surface flaws on an object to be inspected, such as a rolled steel plate, are of course undesirable, and depending on the degree, they can make the product defective.
そして疵はそれぞれ特定の原因によつて発生し、早期発
見してその疵の原因を除去してしまわないと同種の疵を
持つ製品が多量に発生し、それらがすべて不良品となつ
て大きな経済的損失を与えることがある。そこで種々の
表面疵検査装置が開発され、実施されている。本出願人
が特願昭51−86387号、特公昭57一35788
号および特願昭51−86387号等で提案した検査装
置もその1つである。ところでかゝる表面検査装置はス
トリップミルなど帯材製造現場に配設され、高温、多湿
、粉塵等の悪環境で稼動する場合が多いので、装置が正
常に動作しているか否か常に監視することが望ましい。Each flaw is caused by a specific cause, and unless it is discovered early and the cause of the flaw is removed, a large number of products with the same type of flaw will occur, all of which will become defective, resulting in a large economic loss. This may result in financial loss. Therefore, various surface flaw inspection devices have been developed and put into practice. The applicant is Japanese Patent Application No. 51-86387, Japanese Patent Publication No. 57-35788.
One such example is the inspection device proposed in Japanese Patent Application No. 51-86387. By the way, such surface inspection equipment is installed at strip manufacturing sites such as strip mills, and is often operated in adverse environments such as high temperature, high humidity, and dust, so it is necessary to constantly monitor whether the equipment is operating normally. This is desirable.
装置故障の原因は種々あるが、比較的多いのは撮像系で
ある。即ち疵検出に、被検査体表面をテレビカメラで撮
像し、該カメラからの画像信号を信号処理するという方
法をとる場合、被検査体が圧延中の鋼板などの場合は大
輝度のストロボで鋼板を照射する必要があるが、大輝度
のストロボは比較的寿命が短い。ストロボに寿命がきて
輝度が低下すれば、勿論所望の疵検出は不可能になる。
テレビカメラに感度低下、または故障が生じた場合も同
様である。また画像信号を信号処理する際、該画像信号
には同期信号、および鋼板周囲の物体の画像信号なども
含まれているので、これらを除いて誤検出を防ぐため、
鋼板側縁(エッジ)を検出し、両側縁内の表面部分を検
出範囲とする検査範囲設定信号を用いるが、圧延鋼板は
中延び、耳波などの形状不良を生じていることがあり、
耳波が生じていると光の反射が異常となり、周囲との区
別がつかなくなつてエツジ検出が不能となることがある
。か\る事態に対処すべく、既提案の装置では前回のエ
ツジ検出で得た検査範囲信号を記憶しておき、エツジ検
出不能の場合はこれを用いるようにしているが、エツジ
検出不能が連続して発生すると検査範囲信号が古いもの
になつて現状に合わず、検査範囲内に鋼板のエツジが入
つて、該エツジが疵として誤検出される事態が生じる。
本発明はか\る事態を速やかに検知して表面検査が正常
になされていないことを警告しようとするものであり、
その特徴とする所は移動中の被検査体の表面を瞬間照明
する光源、該被検査体表面の静止像を撮像するテレビカ
メラ、該カメラの出力画像信号から被検査体のエツジを
求め該エツジから検査範囲設定信号を出力する回路、該
画像信号の急激な振幅変化を検出して変化点信号を出力
する回路、前記検査範囲設定信号と変化点信号とから被
検査体表面の疵を検出する回路とを備える表面検査装置
の診断方法において、被検査体の工ツジが検出されない
撮像回数が一定数を越えるとき表面検査装置異常を警報
する点にある。次に図面を参照しながらこれを詳細に説
明する。第1図は本出願人が既に提案した表面検査装置
の概要を示す。Although there are various causes of device failure, the imaging system is relatively common. In other words, when detecting flaws, a method is used in which the surface of the object to be inspected is imaged with a television camera and the image signal from the camera is processed.If the object to be inspected is a steel plate being rolled, etc., a high-brightness strobe is used to detect the steel plate. However, high-brightness strobes have a relatively short lifespan. If the strobe reaches the end of its life and its brightness decreases, the desired flaw detection will, of course, become impossible.
The same applies if the sensitivity of the television camera decreases or malfunctions. In addition, when processing the image signal, the image signal includes a synchronization signal and an image signal of objects around the steel plate, so in order to prevent false detection by excluding these,
The side edges of the steel plate are detected, and an inspection range setting signal is used that sets the detection range to the surface area within both edges.
When ear waves occur, the reflection of light becomes abnormal, making it difficult to distinguish from the surroundings and making it impossible to detect edges. In order to deal with such a situation, the previously proposed device stores the inspection range signal obtained from the previous edge detection and uses this when the edge cannot be detected, but if the edge cannot be detected continuously. When this occurs, the inspection range signal becomes old and does not match the current situation, and an edge of the steel plate falls within the inspection range, resulting in a situation where the edge is erroneously detected as a flaw.
The present invention aims to promptly detect such a situation and issue a warning that the surface inspection is not being performed normally.
Its features include a light source that instantaneously illuminates the surface of a moving object to be inspected, a television camera that captures a still image of the surface of the object to be inspected, and a camera that determines the edges of the object from the output image signal of the camera. A circuit that outputs an inspection range setting signal from the image signal, a circuit that detects a sudden amplitude change in the image signal and outputs a change point signal, and a circuit that detects flaws on the surface of the object to be inspected from the inspection range setting signal and the change point signal. In the method for diagnosing a surface inspection apparatus comprising a circuit, an alarm is issued for an abnormality in the surface inspection apparatus when the number of times of imaging in which no abrasions on an object to be inspected are detected exceeds a certain number. Next, this will be explained in detail with reference to the drawings. FIG. 1 shows an outline of a surface inspection device already proposed by the applicant.
1は高解像度テレビカメラで、ストロボ6bが高速移動
中の被検査体、本例では圧延中の鋼板6aを照射すると
き、該鋼板を静止像として撮像する。Reference numeral 1 denotes a high-resolution television camera, which captures a still image of the steel plate 6a when a strobe 6b illuminates the object to be inspected, which is moving at high speed, in this example, a steel plate 6a being rolled.
2は変化点信号出力回路、3は検査範囲設定信号出力回
路、4はアンドゲート、5は疵信号出力回路であり、こ
れらがカメラ1からの画像信号Sgを信号処理して疵検
出を行なう。2 is a change point signal output circuit, 3 is an inspection range setting signal output circuit, 4 is an AND gate, and 5 is a flaw signal output circuit, which process the image signal Sg from the camera 1 to detect flaws.
第2図の波形図を参照しながら疵検出の概要を説明する
と、テレビカメラ1からの画像信夛S8!t第2図Sg
に示す如く、水平同期信号Synと、被検査体表面の画
像信号S1と、その周囲の画像信号S2と、場合により
含まれる疵信号Nからなる。求めるのは疵信号Nである
から、先ず回路2で信号Sgを微分し、次いで全波整流
して第2図bに示す変化点信号bを得る。この信号には
同期信号Synl被検査体のエツジで立土りまた立下る
信号S3、疵信号Nなど、画像信号の急激な振巾変化を
する点すべてを示す信号が含まれる。そこで疵信号を他
の信号から識別するため、回路3で画像信号Sgからエ
ツジ信号を取出し、左、右両側のエツジ信号間の間隔よ
りや\狭い第2図cに示すパルス巾Tの検査範囲設定信
号を作り、これをアンドゲート4に加える。回路2の出
力信号bをこのゲート4に通せば、該ゲートからは第2
図Nに示す如く疵検出信号Nを得ることができる。勿論
鋼板表面の画像信号は種々の原因により微細な変化をし
ており、従つて変化点信号出力回路2の出力信号にも図
示しないが多数の微小なパルスが含まれる。従つて疵信
号のみを出力するにはシユミツト回路などの閾別手段か
らなる疵信号出力回路5を用い、あるスレシヨルドレベ
ルTH以上のものとして疵信号Nを得る。検査範囲設定
に必要なエツジ検出は第2図Sgに示した如く、被検査
体表面部ではその周囲より画像信号のレベルが顕著に異
なり、これは疵や同期信号によるレベル変化より大であ
るという点を利用して行なうことができ、巾Wより狭い
期間Tは巾検出(エツジ検出)信号および画像信号を若
干遅らせる等の信号処理により求めることができる。An overview of flaw detection will be explained with reference to the waveform diagram in FIG. 2. Image information from the television camera 1 S8! tFigure 2 Sg
As shown in FIG. 2, it consists of a horizontal synchronizing signal Syn, an image signal S1 of the surface of the object to be inspected, an image signal S2 of its surroundings, and a flaw signal N included as the case may be. Since it is the flaw signal N that is desired, the signal Sg is first differentiated by the circuit 2, and then full-wave rectified to obtain the change point signal b shown in FIG. 2b. This signal includes signals indicating all points where the amplitude of the image signal suddenly changes, such as the synchronization signal Synl, the signal S3 which rises and falls at the edge of the object to be inspected, and the flaw signal N. Therefore, in order to distinguish the flaw signal from other signals, the edge signal is extracted from the image signal Sg in the circuit 3, and the inspection range of the pulse width T shown in Fig. 2c is narrower than the interval between the edge signals on both the left and right sides. Create a setting signal and add it to AND gate 4. If the output signal b of the circuit 2 is passed through this gate 4, the second
A flaw detection signal N can be obtained as shown in FIG. Of course, the image signal on the surface of the steel plate undergoes minute changes due to various causes, and therefore the output signal of the changing point signal output circuit 2 also includes a large number of minute pulses (not shown). Therefore, in order to output only the flaw signal, a flaw signal output circuit 5 consisting of a threshold determining means such as a Schmitt circuit is used, and a flaw signal N is obtained when the flaw signal is above a certain threshold level TH. As shown in Figure 2 Sg, the edge detection necessary for setting the inspection range is performed by using a method that shows that the level of the image signal on the surface of the object to be inspected is significantly different from the surrounding area, and this is larger than the level change due to flaws or synchronization signals. The period T, which is narrower than the width W, can be determined by signal processing such as slightly delaying the width detection (edge detection) signal and the image signal.
第3図はその一例を示し、3aは分配器、3b,3cは
同じ遅延時間τを持つ遅延回路、3dは差動増幅器、3
eはシユミツト回路、3fはフリツプフロツプである。
テレビカメラ1からの画像信号Sgは分配器3aにより
一方では遅延回路3bを介して差動増幅器3dの一方の
入力端に、他方では該差動増幅器3dの他方の入力端に
直接加えられる。第4図Sgは該画像信号Sgを示し、
第4図E,fは増幅器3dに加わる信号Sgの遅延され
た信号eおよび直接信号fの各波形を示す。信号eは信
号Sgを単に一定時間τだけ遅延した信号であるが、信
号fはこの信号入力回路には一端開放の遅延線3cが接
続されているので2τ後に反射波の影響が現われ、図示
の如く立上り立下り部が2段になる。増幅器3dでこれ
らの信号e(5fの差をとるとその結果は第・4図gに
示す波形の信号gとなり、これをシユミツト回路3eに
おいてスレシヨルドレベルを図示Thのレベルにして閾
別すると該シユミツト回路からは第4図hに示す信号H
l,h2が得られる。この信号Hl,h2は図示の如く
ほマ被検査体の両エツジに対応するが左端の信号h1は
遅延時間τだけ左エツジから遅れており、従つて両エツ
ジを示す信号Hl,h2のパルス間隔は被検香体の巾W
よりτだけ狭い。この信号Hl,h2でフリツプフロツ
プ3fをセツト、りセツトすれば該回路3fからは第4
図cに示す検査範囲Tを示す信号cが得られる。このよ
うに検査範囲設定信号は被検査体のエツジを検出してそ
のエツジから求めるが、前述のように被検査鋼板のエツ
ジ部が波を打つていると検出できないことがあり、また
圧延鋼板がこれを案内するサイドガイド等に密接した場
合もエツジ検出不可能になる。FIG. 3 shows an example, in which 3a is a distributor, 3b and 3c are delay circuits with the same delay time τ, 3d is a differential amplifier, and 3
e is a Schmitt circuit, and 3f is a flip-flop.
The image signal Sg from the television camera 1 is directly applied by the distributor 3a to one input terminal of the differential amplifier 3d via the delay circuit 3b, and to the other input terminal of the differential amplifier 3d on the other hand. FIG. 4 Sg shows the image signal Sg,
FIGS. 4E and 4F show the waveforms of the delayed signal e and the direct signal f of the signal Sg applied to the amplifier 3d. The signal e is a signal obtained by simply delaying the signal Sg by a fixed time τ, but since the signal input circuit is connected to the delay line 3c with one end open, the influence of the reflected wave appears after 2τ, and the signal f is as shown in the figure. As shown in the figure, there are two stages of rising and falling parts. When the amplifier 3d takes the difference between these signals e (5f), the result is a signal g with the waveform shown in Figure 4g.If this is thresholded in the Schmidt circuit 3e by setting the threshold level to the level Th shown in the figure, The signal H shown in FIG. 4h is output from the Schmitt circuit.
l, h2 are obtained. These signals Hl and h2 correspond to both edges of the object to be inspected as shown in the figure, but the leftmost signal h1 is delayed from the left edge by a delay time τ, and therefore the pulse interval of the signals Hl and h2 indicating both edges is is the width W of the incense body to be tested
narrower by τ. If the flip-flop 3f is set or reset using these signals Hl and h2, the fourth
A signal c indicating the inspection range T shown in FIG. c is obtained. In this way, the inspection range setting signal is obtained by detecting the edges of the object to be inspected, but as mentioned above, if the edges of the steel plate to be inspected are wavy, detection may not be possible. Edges cannot be detected if they come in close contact with side guides or the like that guide them.
この様な場合に対処すべく、検査範囲設定にはメモリを
利用してエツジ検出不能な場合は該メモリから読出した
前回の検査範囲を用いる様にする。か\る機能を持つ回
路が第5図である。第5図で14は検出ライン設定回路
であり、一画面中の所定の高さの横線部分を検査範囲設
定信号の導出に利用すべく垂直同期信号VDから所定数
後の水平同期信号から始まつて次の水平同期信号まで続
く1水平同期信号巾の信号Suを出力する。To cope with such a case, a memory is used to set the inspection range, and when an edge cannot be detected, the previous inspection range read from the memory is used. A circuit with such a function is shown in Figure 5. In FIG. 5, 14 is a detection line setting circuit, which starts from the horizontal synchronization signal a predetermined number of times after the vertical synchronization signal VD in order to use the horizontal line portion of a predetermined height in one screen for deriving the inspection range setting signal. A signal Su having a width of one horizontal synchronizing signal is output, which continues until the next horizontal synchronizing signal.
6はフリツプフロツプ、7はクロツク発生器、8a,8
bはメモリ、9a,9bはアツプダウンカウンタ、10
a〜10fはアンドゲート、11a〜11cはナンドゲ
ート、12はオアゲート、13は第3図の3a〜3eか
らなるエツジ検出回路である。6 is a flip-flop, 7 is a clock generator, 8a, 8
b is memory, 9a, 9b are up/down counters, 10
Reference numerals a to 10f are AND gates, 11a to 11c are NAND gates, 12 is an OR gate, and 13 is an edge detection circuit consisting of 3a to 3e in FIG.
第6図の波形図を参照しながら動作を説明すると、検出
ライン設定回路14から上記水平同期信号巾の信号Su
が出力され、アンドゲート10aはこの信号Suにより
開かれてエツジ検出回路13からの前記信号Hl,h2
を通し、フリツプフロツプ6をセツトおよびりセツトす
る。The operation will be explained with reference to the waveform diagram in FIG.
is output, and the AND gate 10a is opened by this signal Su, and the signals H1 and h2 from the edge detection circuit 13 are output.
The flip-flop 6 is set and reset through the .
第6図のSu,h等の欄は信号Su,h等の波形を示す
。他の信号についても同様である。従つてこのフリツプ
フロツプのQ出力は検出ライン上の左右両エツジの間(
実際にはこれよりτだけ短い)オンとなり、これがオア
ゲート12および、垂直プランキング信号BLを加えら
れて垂直プランキング期間以外では開くアンドゲート1
0eを通つて、検査範囲設定信号cとして出力される。
この部分は第3図の回路に相当し、フリツプフロツプ6
は第3図のフリツプフロツプ3fに相当する。検出ライ
ン設定回路14の出力信号Suはまたカウンタ9a,9
bに入力して、クロツク発生器7からのクロツクCLK
を計数する該カウンタをアツプカウンタとし、更にナン
ドゲー口1aを介してメモリ8a,8bに入力する。The columns Su, h, etc. in FIG. 6 show the waveforms of the signals Su, h, etc. The same applies to other signals. Therefore, the Q output of this flip-flop is between the left and right edges on the detection line (
Actually, it is turned on (shorter than this by τ), and this turns on the OR gate 12 and the AND gate 1, which is opened except during the vertical blanking period when the vertical blanking signal BL is applied.
It is output as an inspection range setting signal c through 0e.
This part corresponds to the circuit shown in Figure 3, and the flip-flop 6
corresponds to flip-flop 3f in FIG. The output signal Su of the detection line setting circuit 14 is also sent to the counters 9a and 9.
clock CLK from clock generator 7.
The counter for counting is used as an up counter, and is further input to memories 8a and 8b via the NAND game opening 1a.
ナンドゲー口1aは他方の入力端に水平同期信号HDが
加わるので、該水平同期信号が現われるとき、つまり信
号Suの始端で0となる信号nを生じてメモリ8a,8
bをクリアする。フリツプフロツプ6のQ出力およびQ
出力はアンドゲート10b,10cの一方の入力端に加
わり、これらのアンドゲートの他方の入力端にはアンド
ゲート10aの出力が加わるから、結局アンドゲート1
0bは被検査体の一方のエツジ信号1を、またアンドゲ
ート10cは他方のエツジ信号jを出力する。こ\で一
方および他方のエツジとは、テレビカメラの走査が左か
ら右へ行なわれるとすれば、一方とは最初に現われる左
エツジであり、他方とはその後現われる右エツジであり
、そしてこれらの信号は正しいエツジとは第4図に示し
た時間差τを持つているが、簡単化のためこ\では時間
差は無視する。これらの信号1,jはメモリ8a,8b
に入力してカウンタ9a,9bの内容をメモリ8a,8
bにセツトする。メモリ8a,8bの内容はまたカウン
タ9a,9bのロード端子に水平同期信号が入力すると
き該カウンタ9a,9bへセツトされる。そこで、今検
出ライン土での動作を考えると、先ず水平同期信号HD
が現われると、信号Suが発生し、ナンドゲート11a
の出力でメモリ8a,8bのクリア、カウンタ9a,9
bのアツプカウンタ設定、メモリ8a,8bの内容(今
はO)のカウンタ9a,9bへのローデイングが行なわ
れる。Since the horizontal synchronizing signal HD is applied to the other input terminal of the Nando game port 1a, when the horizontal synchronizing signal appears, that is, at the starting edge of the signal Su, a signal n is generated which becomes 0, and the memory 8a, 8
Clear b. Q output and Q of flip-flop 6
The output is applied to one input terminal of AND gates 10b and 10c, and the output of AND gate 10a is applied to the other input terminal of these AND gates.
0b outputs one edge signal 1 of the object to be inspected, and the AND gate 10c outputs the other edge signal j. Here, one and the other edges are, if the television camera scans from left to right, one is the left edge that appears first, the other is the right edge that appears later, and these Although the signal has a time difference τ from the correct edge as shown in FIG. 4, the time difference is ignored here for simplicity. These signals 1 and j are stored in memories 8a and 8b.
and store the contents of counters 9a and 9b in memories 8a and 8.
Set to b. The contents of the memories 8a, 8b are also set to the counters 9a, 9b when a horizontal synchronizing signal is input to the load terminals of the counters 9a, 9b. Therefore, when considering the operation at the current detection line, first, the horizontal synchronization signal HD
appears, a signal Su is generated and the NAND gate 11a
The output clears memories 8a and 8b and counters 9a and 9.
The up counter setting of b is performed, and the contents of memories 8a and 8b (currently O) are loaded into counters 9a and 9b.
水平同期信号HDの立下りで該ローデイングは終了し、
カウンタ9a,9bはクロツクCLKの計数を開始する
。その後一方の(本例では左の)エツジ信号h1が入力
すると、アンドゲー口0aは該信号h1を通してフリツ
プフロツプ6をセツトし、アンドゲート10bを開いて
信号1を生じさせ、この信号がカウンタ9aの内容をメ
モリ8aへセツトさせる。カウンタ9aの内容は水平同
期信号からつまり水平走査の始端から被検査体の左エツ
ジが現われる迄の時間又は長さを示している。その後エ
ツジ検出回路13から右エツジ信号H2が出力され、こ
れはアンドゲート10aを通つてフリツプフロツプ6を
りセツトし、このとき開くアンドゲート10cを通して
信号jとなつて、カウンタ9bの内容をメモリ8bへセ
ツトする。このカウンタ9bの内容は水平同期信号から
、つまり水平走査の始りから右エツジ信号が現われる迄
の時間または長さである。従つてメモリ8a,8bの内
容の差が左、右エツジ間距離つまり巾を示すことになる
。このようにして一画面の所定高さにおける水平検出ラ
イン上で巾検出がなされ、それがメモリに記憶される。
次の水平走査線以降では検出ライン設定回路の出力信号
SuはOであり、この結果カウンタ9a,9bはダウン
カウンタにセツトされる。The loading ends at the fall of the horizontal synchronization signal HD,
Counters 9a and 9b start counting the clock CLK. Then, when one edge signal h1 (the left one in this example) is input, the AND gate 0a sets the flip-flop 6 through the signal h1, opens the AND gate 10b, and generates the signal 1, which is the content of the counter 9a. is set in the memory 8a. The contents of the counter 9a indicate the time or length from the horizontal synchronizing signal, that is, from the start of horizontal scanning until the left edge of the object to be inspected appears. Thereafter, a right edge signal H2 is output from the edge detection circuit 13, which passes through an AND gate 10a to reset the flip-flop 6, and becomes a signal j through an AND gate 10c, which is opened at this time, to transfer the contents of the counter 9b to the memory 8b. Set. The content of this counter 9b is the time or length from the horizontal synchronizing signal, that is, from the start of horizontal scanning until the right edge signal appears. Therefore, the difference between the contents of the memories 8a and 8b indicates the distance between the left and right edges, that is, the width. In this way, width detection is performed on the horizontal detection line at a predetermined height of one screen, and the detected width is stored in the memory.
From the next horizontal scanning line onward, the output signal Su of the detection line setting circuit is O, and as a result, the counters 9a and 9b are set to down counters.
そして水平同期信号HJ)が現われるとき、メモリ8a
,8bの内容がカウンタ9a,9bへローデイングされ
、該信号HDの立下りでクロツク計数(減算)が開始さ
れる。本例ではメモリ8aの内容はメモリ8bの内容よ
り小さいから、先ずカウンタ9aの内容が零になり、フ
オロ一端子Fより信号(この信号をフオロ一信号という
)kが生じ、該信号がアンドゲート10dの一方の入力
端に加わると共に、インバータ11bで反転されてカウ
ンタイネーブル端子Eに加わり、クロツク計数を停止さ
Zせる。一方のカウンタ9bではまた計数(減算)が
続いているからフオロ一端子Fの信号lはOであり、こ
れはインバータ11cで反転されて1になり、アンドゲ
ート10dの他の入力端子に加わる。従つて該ゲート1
0dは1出力を生じ、これ 二はオアゲート12および
アンドゲート10eを通つて信号cとなつて出力される
。その後カウンタ9bも減算が進んで内容がOになり、
フオロ一端子Fの信号lが1になり、これはインバータ
で反転されてイネーブル端子Eに加わつて計数停止さ
5せると共にアンドゲート10dを閉じ、上記信号cを
オフにする。従つてこれらのカウンタ9a,9b等によ
り出力される信号cは前記の検査範囲設定信号であり、
回路13,10a,6のエツジ実測系からの検査範囲設
定信号と併用され、該実 3測系からの信号がないとき
でも検査範囲設定を可能にする。この記憶系からの検査
範囲設定信号の出力動作は水平同期信号HDが入力する
度に繰り返され、そして検出ライン設定回路14が出力
を生じると 4qき記憶内容の更新が行なわれる。Then, when the horizontal synchronizing signal HJ) appears, the memory 8a
, 8b are loaded into the counters 9a, 9b, and clock counting (subtraction) is started at the falling edge of the signal HD. In this example, since the contents of the memory 8a are smaller than the contents of the memory 8b, the contents of the counter 9a first become zero, and a signal k (this signal is referred to as the follower signal) is generated from the follower terminal F, and this signal is sent to the AND gate. The signal is applied to one input terminal of the clock signal 10d, and is inverted by the inverter 11b and applied to the counter enable terminal E, thereby stopping clock counting. Since one counter 9b continues counting (subtraction) again, the signal l at the follower terminal F is O, which is inverted by the inverter 11c to become 1, and is applied to the other input terminal of the AND gate 10d. Therefore, the gate 1
0d produces 1 output, and this 2 is output as signal c through OR gate 12 and AND gate 10e. After that, the counter 9b also continues to subtract and the content becomes O.
The signal l at the follower terminal F becomes 1, which is inverted by the inverter and applied to the enable terminal E to stop counting.
At the same time, the AND gate 10d is closed and the signal c is turned off. Therefore, the signal c output by these counters 9a, 9b, etc. is the above-mentioned inspection range setting signal,
It is used together with the inspection range setting signals from the edge measurement systems of circuits 13, 10a, and 6, and enables inspection range setting even when there is no signal from the three actual measurement systems. This operation of outputting the inspection range setting signal from the storage system is repeated every time the horizontal synchronizing signal HD is input, and when the detection line setting circuit 14 generates an output, the stored contents are updated every 4q.
ところでか\る表面検査装置では、前述のように鋼板側
縁が波打つたりすると該側縁部がテレビカメラからは暗
く見え、周囲と区別がつかなくなつてエツジ検出が可能
になることがあり、か\る場合の対策として第5図のエ
ツジを記憶させておく方法がとられるが、エツジ検出不
能が各画面で連続すると、メモリ8a,8bの内容は更
新されなくて非常に古いものになつてしまう。By the way, with surface inspection equipment, if the side edges of the steel plate are wavy as mentioned above, the side edges may appear dark from the television camera and become indistinguishable from the surroundings, making it possible to detect edges. As a countermeasure in such a case, the method shown in Fig. 5 is to memorize the edges, but if the edge cannot be detected continuously on each screen, the contents of memories 8a and 8b will not be updated and will become very old. I end up.
そして遂には検査範囲が左右エツジ内鋼板表面から外れ
てエツジが検査範囲内に入り、疵として誤認される等の
事態を惹きおこす。本発明はこれを防止するもので、エ
ツジ検出がなされない回数を数え、それが一定数例えば
4を越えると警報を発するようにした。また、エツジ検
出がなされなくても検査範囲が鋼板表面所定範囲からず
れなければ検査装置としては異常ない訳であり、この点
を考慮するとエツジ検出がなされず、かつ疵検出回路5
(第1図)が出力を生じる回数が所定数を越えるとき、
異常とみなして警報を発するようにすればよく、本発明
の実施態様ではそのようにした。疵検出回路5のスレシ
ヨルドレベルは、疵信号は例えば200〜500mvの
エツジ信号に対して1桁程度レベルが低いので、それに
対応させてかなり低いレベルにしてあり、従つて検査範
囲がずれてエツジ信号が疵検出回路5に入力すると確実
に疵として検出されてしまう。従つてか\る場合は疵検
出回路5は連続出力するので、それを計数して所定数以
上になるとき警報を発するようにすれば検査範囲のずれ
を検出することが可能である。第7図はか\る操作を行
なう回路例を示す。20はエツジ検出回路で第5図の回
路13に相当し、左、右エツジ信号Hl,h2を出力す
る。Eventually, the inspection range deviates from the inner steel plate surface of the left and right edges, and the edges enter the inspection range, causing a situation such as being mistakenly recognized as a flaw. The present invention prevents this by counting the number of times that edge detection is not performed, and when the number exceeds a certain number, for example 4, an alarm is issued. Furthermore, even if edges are not detected, there is no abnormality in the inspection device as long as the inspection range does not deviate from the predetermined range on the surface of the steel plate. Considering this point, if edges are not detected and the flaw detection circuit
When the number of times that (Fig. 1) produces an output exceeds a predetermined number,
It suffices to treat this as an abnormality and issue an alarm, which is done in the embodiment of the present invention. The threshold level of the flaw detection circuit 5 is set to a fairly low level in response to the fact that the flaw signal is about an order of magnitude lower than the edge signal of 200 to 500 mV, and therefore the inspection range is shifted. If the edge signal is input to the flaw detection circuit 5, it will definitely be detected as a flaw. Therefore, since the flaw detection circuit 5 continuously outputs an output in such a case, it is possible to detect a shift in the inspection range by counting the number of outputs and issuing an alarm when the number exceeds a predetermined value. FIG. 7 shows an example of a circuit for performing such an operation. Reference numeral 20 denotes an edge detection circuit, which corresponds to the circuit 13 in FIG. 5 and outputs left and right edge signals H1 and h2.
21は左エツジ信号h1に対する位置剖狽1回路、22
はメモリ、23はパルス発生回路、24,25,26は
左エツジ信号H2に対する位置計測回路、メモリ、およ
びパルス発生回路である。21 is a position analysis circuit 1 for the left edge signal h1; 22
23 is a memory, 23 is a pulse generation circuit, and 24, 25, 26 are position measurement circuits for the left edge signal H2, a memory, and a pulse generation circuit.
また27,28は垂直同期信号VDでりセツトされ、左
、右エツジ信号Hl,h2でセツトされるフリツプフロ
ツプ、29,30は該フリツプフロツプの出力と1フイ
ールドの間オンとなるタイミング信号Sfと前述の検査
ライン信号を出力開始させる水平同期信号HPnが入力
されるアンドゲートであり、これらは第5図のカウンタ
9a,9b1メモリ8a,8b1およびその制御用のゲ
ートに相当し、パルス発生器23からはカウンタ9aの
フオロ一端子信号kが、またパルス発生器26からはカ
ウンタ9bのフオロ一端子信号lが得られ、第5図のア
ンドゲート10dに相当するインヒビツトゲート31か
らは検出範囲設定信号cが出力される。この回路は画像
の検出ライン土でエツジが検出されれば前記の信号1,
jがメモリの更新を行なう。そこでこのメモリの更新を
オアゲート32で取出し、垂直同期信号VDでセツトさ
れるフリツプフロツプ33をりセツトする。従つてエツ
ジが検出されてメモリ更新が行なわれ\ばフリツプフロ
ツプ33のQ出力はOになるが、その逆ならば該Q出力
は1のま\である。一方第1図の疵検出系2〜5に相当
する異常検出回路34が出力を生じると、垂直同期信号
Dでりセツトされるフリツプフロツプ35をセツトする
。これらのフリツプフロツプ33,35の出力はアンド
ゲート36へ導き、該アンドゲート36の出力をカウン
タ37で計数する。従つてこのカウンタ37の計数値は
エツジが検出されなくてかつ異常検出回路34が出力を
生じた画面数を示している。このカウンタは計数値が所
定値になればキヤリ一信号を出し、これによりオペレー
タに警報ALMが発せられる。以上詳細に説明したよう
に本発明によれば表面検査装置の自己診断、特にその検
査範囲を設定するエツジ信号が正常に検出されているか
否か、また検査範囲が正常か否かをチエツクすることが
でき、表面検査結果の信頼性を高めることができる。Further, 27 and 28 are flip-flops which are set by the vertical synchronizing signal VD and left and right edge signals H1 and h2, and 29 and 30 are the timing signal Sf which is turned on between the output of the flip-flop and one field; This is an AND gate to which the horizontal synchronizing signal HPn for starting output of the inspection line signal is input. A follower one-terminal signal k of the counter 9a is obtained, a follower one-terminal signal l of the counter 9b is obtained from the pulse generator 26, and a detection range setting signal c is obtained from the inhibit gate 31 corresponding to the AND gate 10d in FIG. is output. This circuit generates the signal 1 when an edge is detected on the image detection line.
j updates the memory. Therefore, the update of this memory is taken out by the OR gate 32, and the flip-flop 33, which is set by the vertical synchronizing signal VD, is reset. Therefore, if an edge is detected and the memory is updated, the Q output of the flip-flop 33 becomes O, but if the opposite is true, the Q output remains 1. On the other hand, when the abnormality detection circuit 34 corresponding to the flaw detection systems 2 to 5 in FIG. 1 produces an output, the flip-flop 35, which is reset by the vertical synchronizing signal D, is set. The outputs of these flip-flops 33 and 35 are led to an AND gate 36, and the output of the AND gate 36 is counted by a counter 37. Therefore, the count value of the counter 37 indicates the number of screens in which no edge is detected and the abnormality detection circuit 34 produces an output. This counter outputs a carry signal when the counted value reaches a predetermined value, thereby issuing an alarm ALM to the operator. As explained in detail above, according to the present invention, the self-diagnosis of the surface inspection device, especially checking whether the edge signal for setting the inspection range is detected normally or not, and whether the inspection range is normal or not. The reliability of surface inspection results can be increased.
第1図、第3図、第5図は既提案の表面検査装置の構成
を示すプロツク図、第2図、第4図、第6図はその動作
説明用波形図、第7図は本発明の実施例を示すプロツク
図である。
図面で6aは被検査体、6bは光源、1はテレビカメラ
、3は検査範囲設定信号出力回路、2は変化点信号出力
回路、5は疵検出回路である。Figures 1, 3, and 5 are block diagrams showing the configuration of the previously proposed surface inspection device, Figures 2, 4, and 6 are waveform diagrams for explaining its operation, and Figure 7 is the invention of the present invention. FIG. In the drawing, 6a is an object to be inspected, 6b is a light source, 1 is a television camera, 3 is an inspection range setting signal output circuit, 2 is a change point signal output circuit, and 5 is a flaw detection circuit.
Claims (1)
検査体表面の静止像を撮像するテレビカメラ、該カメラ
の出力画像信号から被検査体のエッジを求め該エッジか
ら検査範囲設定信号を出力する回路、該画像信号の急激
な振幅変化を検出して変化点信号を出力する回路、前記
検査範囲設定信号と変化点信号とから被検査体表面の疵
を検出する回路とを備える表面検査装置の診断方法にお
いて、被検査体のエッジが検出されない撮像回数が一定
数を越えるとき表面検査装置異常を警報することを特徴
とする表面検査装置の診断方法。 2 被検査体のエッジが検出されず、かつ疵検出回路の
出力がある、撮像回数が一定値を越えるとき表面検査装
置異常を警報することを特徴とする特許請求の範囲第1
項記載の表面検査装置の診断方法。[Claims] 1. A light source that momentarily illuminates the surface of a moving object to be inspected, a television camera that captures a still image of the surface of the object to be inspected, and an edge of the object to be inspected that is determined from the output image signal of the camera. A circuit that outputs an inspection range setting signal from the edge, a circuit that detects a sudden amplitude change in the image signal and outputs a change point signal, and detects flaws on the surface of the object to be inspected from the inspection range setting signal and the change point signal. A diagnosing method for a surface inspection apparatus comprising a circuit for diagnosing a surface inspection apparatus, the method comprising the step of: warning that the surface inspection apparatus is abnormal when the number of times of imaging in which an edge of an object to be inspected is not detected exceeds a certain number. 2. Claim 1, characterized in that when the edge of the object to be inspected is not detected and there is an output from the flaw detection circuit, and the number of times of imaging exceeds a certain value, an abnormality of the surface inspection device is alerted.
Diagnosis method of surface inspection device described in section.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15260777A JPS596383B2 (en) | 1977-12-19 | 1977-12-19 | Diagnostic method for surface inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15260777A JPS596383B2 (en) | 1977-12-19 | 1977-12-19 | Diagnostic method for surface inspection equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5484789A JPS5484789A (en) | 1979-07-05 |
| JPS596383B2 true JPS596383B2 (en) | 1984-02-10 |
Family
ID=15544088
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15260777A Expired JPS596383B2 (en) | 1977-12-19 | 1977-12-19 | Diagnostic method for surface inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS596383B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5828653A (en) * | 1981-08-13 | 1983-02-19 | Nec Corp | Detector for defect on surface of material |
-
1977
- 1977-12-19 JP JP15260777A patent/JPS596383B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5484789A (en) | 1979-07-05 |
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