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JPS605232B2 - Manufacturing method of Josephson device - Google Patents
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JPS605232B2 - Manufacturing method of Josephson device - Google Patents

Manufacturing method of Josephson device

Info

Publication number
JPS605232B2
JPS605232B2 JP55156871A JP15687180A JPS605232B2 JP S605232 B2 JPS605232 B2 JP S605232B2 JP 55156871 A JP55156871 A JP 55156871A JP 15687180 A JP15687180 A JP 15687180A JP S605232 B2 JPS605232 B2 JP S605232B2
Authority
JP
Japan
Prior art keywords
film
microbridge
niobium
view
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55156871A
Other languages
Japanese (ja)
Other versions
JPS5780786A (en
Inventor
忠雄 加藤
高秋 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP55156871A priority Critical patent/JPS605232B2/en
Publication of JPS5780786A publication Critical patent/JPS5780786A/en
Publication of JPS605232B2 publication Critical patent/JPS605232B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • H10N60/01Manufacture or treatment
    • H10N60/0912Manufacture or treatment of Josephson-effect devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)

Description

【発明の詳細な説明】 この発明は、安定化されたニオブ薄膜、ブリッジ部を有
する、いわゆるバリアブル・シックネス型のジョセフソ
ン素子の製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a so-called variable thickness type Josephson device having a stabilized niobium thin film and a bridge portion.

従来のバリアブル・シックネス型のジョセフソン素子は
、第1図a,bにその平面図、およびA−A′線による
断面図を示すごとく、マイクロフリッジ部11と電極部
12を形成した後、エッチング等によりマイクロブリッ
ジ部11のニオブ膜を薄くして、ジョセフソン素子を形
成していた。
In the conventional variable thickness type Josephson element, as shown in a plan view and a cross-sectional view taken along line A-A' in FIGS. The niobium film of the microbridge portion 11 was made thinner by methods such as the above, and a Josephson element was formed.

ジョセフソン素子のマイクロブリッジ部11を通過する
電流を小さくするために、マイクロブリッジ部11は電
極部分より電流が流れる断面積はできるだけ小さい方が
よい。断面積を小さくする方法は、パターン(平面)の
寸法を小さくする方法と縦方向のいわゆる膜厚を薄くす
る方法があるが「パターンを小さくするのに限度(〜l
Am)があるため、膜厚を薄くする方法がよいが、マィ
クロブリッジ部11は薄く、他の電極部12の部分は厚
くする必要があるため、一般に厚い膜で全体を形成し、
その後、マイクロブリッジ部11のみエッチング等で薄
くしている。蒸着膜は一般にグレインよりでき上がって
いるため表面よりエッチングした場合、均一な膜厚の薄
膜は得難く、かつマイクロブリッジ部11のみ保護膜で
おおうことは難しい。
In order to reduce the current passing through the microbridge section 11 of the Josephson element, the cross-sectional area of the microbridge section 11 through which current flows should be as small as possible compared to the electrode section. There are two ways to reduce the cross-sectional area, one is to reduce the dimension of the pattern (plane) and the other is to reduce the film thickness in the vertical direction.
Am), it is better to make the film thinner, but the microbridge part 11 needs to be thinner and the other electrode parts 12 need to be thicker, so generally the whole is formed with a thicker film.
Thereafter, only the microbridge portion 11 is thinned by etching or the like. Since a deposited film is generally made up of grains, if it is etched from the surface, it is difficult to obtain a thin film with a uniform thickness, and it is also difficult to cover only the microbridge portion 11 with a protective film.

そして、従来の製造方法では、マイクロブリッジ部11
のみ膜厚を薄くすることは困難である。
In the conventional manufacturing method, the micro bridge portion 11
However, it is difficult to reduce the film thickness.

さらに、その部分のみ保護膜でおおうことはより困難で
ある。この発明は、上述の点にかんがみなされたもので
、マイク。
Furthermore, it is more difficult to cover only that portion with a protective film. This invention was made in view of the above-mentioned points.

ブリッジ部のみ保護膜でおおわれた薄膜より形成され、
電極部分は厚膜で形成されたジョセフソン素子を製造す
ることを目的とする。以下、この発明について説明する
。この発明の一実施例を第2図〜第4図について説明す
る。
Only the bridge part is formed from a thin film covered with a protective film,
The purpose is to manufacture a Josephson device in which the electrode portion is formed of a thick film. This invention will be explained below. An embodiment of the present invention will be described with reference to FIGS. 2 to 4.

第2図において、第2図aは断面図、第2図bは平面図
である。基板2上に、ニオブ薄膜10と金属酸化膜3、
たとえばニオブの酸化膜よりなる幅約1仏肌で長いパタ
ーン(マイクロブリッジ部)を形成する。パターン形成
は従来のレジストと露光、エッチングにより形成する。
この時のニオブ薄膜10は50Aと非常に薄い膜を形成
する。続いて第3図のようにマイクロブリッジ部の保護
膜である金属酸化膜3の一部31を残して他は除去する
。続いて第4図a,bの断面図と平面図に示すように、
厚いニオブ膜により電極部12を形成する。電極部12
の膜厚は2000A、電極パタ−ン形成時はマイクロブ
リッジ部11上の金属酸化膜31がレジストとなり、マ
イクロブリッジ部11のニオブ薄膜1川まエッチングさ
れない。上述したこの発明の方法によれば、50Aのニ
オブ薄膜のマイクロブリッジ部11が容易に形成され、
しかも金属酸化膜31でおおわれており、しかも素子の
電極部12は厚いニオブ膜(2000A)で形成するこ
とができる。
In FIG. 2, FIG. 2a is a sectional view, and FIG. 2b is a plan view. On the substrate 2, a niobium thin film 10 and a metal oxide film 3,
For example, a long pattern (microbridge portion) made of a niobium oxide film and having a width of approximately 1 inch is formed. The pattern is formed using conventional resist, exposure, and etching.
The niobium thin film 10 at this time forms a very thin film of 50A. Subsequently, as shown in FIG. 3, a portion 31 of the metal oxide film 3 serving as a protective film for the microbridge portion is left and the rest is removed. Subsequently, as shown in the cross-sectional view and plan view of FIGS. 4a and 4b,
The electrode portion 12 is formed of a thick niobium film. Electrode part 12
The film thickness is 2000 Å, and when forming the electrode pattern, the metal oxide film 31 on the microbridge portion 11 serves as a resist, and only one portion of the niobium thin film on the microbridge portion 11 is not etched. According to the method of the present invention described above, the microbridge portion 11 of a 50A niobium thin film is easily formed.
Moreover, it is covered with a metal oxide film 31, and the electrode portion 12 of the element can be formed of a thick niobium film (2000A).

なお、この発明は、膜厚の異なる複数の部分よりなる膜
で形成されるすべてのパターン形成に応用することが可
能である。
Note that the present invention can be applied to all pattern formations formed with a film consisting of a plurality of parts having different film thicknesses.

また、金属酸化膜3はSjのSi02あるいはSi3N
4でもよい。以上詳細に説明したように、この発明によ
れば非常に薄い膜よりなるジョセフソン素子のマイクロ
ブリッジ部を形成することができ、しかもそのマイクロ
ブリッジは保護膜でおおわれているのできわめて安定で
ある等の優れた利点を有する。
Moreover, the metal oxide film 3 is Si02 or Si3N of Sj.
4 is fine. As explained in detail above, according to the present invention, it is possible to form a microbridge portion of a Josephson element made of a very thin film, and since the microbridge is covered with a protective film, it is extremely stable. It has excellent advantages.

【図面の簡単な説明】[Brief explanation of drawings]

第1図a,bは従来のジョセフソン素子のマイクロブリ
ッジ部を示す平面図と断面図、第2図〜第4図はこの発
明の一実施例の製造工程を示すもので、第2図a,bは
断面図および平面図、第3図は断面図、第4図a,bは
断面図および平面図である。 図中、2は基板、3は金属酸化膜、1川まニオブ薄膜、
11はマイクロブリッジ部、12は電極部、31はマイ
クロブリッジ部を保護する金属酸化膜である。 なお、図中の同一符号は同一または相当部分を示す。第
1図 第2図 第3図 第4図
Figures 1a and 1b are a plan view and a sectional view showing the microbridge portion of a conventional Josephson element, and Figures 2 to 4 show the manufacturing process of an embodiment of the present invention. , b are a sectional view and a plan view, FIG. 3 is a sectional view, and FIGS. 4a and 4b are a sectional view and a plan view. In the figure, 2 is a substrate, 3 is a metal oxide film, 1 is a niobium thin film,
Reference numeral 11 denotes a microbridge portion, 12 an electrode portion, and 31 a metal oxide film that protects the microbridge portion. Note that the same reference numerals in the figures indicate the same or corresponding parts. Figure 1 Figure 2 Figure 3 Figure 4

Claims (1)

【特許請求の範囲】[Claims] 1 基板上に形成した細く薄いニオブ薄膜の両端を露出
し中央を金属酸化膜でおおい、前記ニオブ薄膜の露出し
た両端に電気的に接続した前記ニオブ薄膜より厚く、か
つ大面積を有するニオブ膜よりなる電極部を形成するこ
とを特徴とするジヨセフソン素子の製造方法。
1. A thin niobium film formed on a substrate with both ends exposed and the center covered with a metal oxide film, which is thicker than the niobium thin film and has a larger area and is electrically connected to both exposed ends of the niobium thin film. 1. A method for manufacturing a Josephson device, characterized by forming an electrode portion.
JP55156871A 1980-11-06 1980-11-06 Manufacturing method of Josephson device Expired JPS605232B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55156871A JPS605232B2 (en) 1980-11-06 1980-11-06 Manufacturing method of Josephson device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55156871A JPS605232B2 (en) 1980-11-06 1980-11-06 Manufacturing method of Josephson device

Publications (2)

Publication Number Publication Date
JPS5780786A JPS5780786A (en) 1982-05-20
JPS605232B2 true JPS605232B2 (en) 1985-02-08

Family

ID=15637206

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55156871A Expired JPS605232B2 (en) 1980-11-06 1980-11-06 Manufacturing method of Josephson device

Country Status (1)

Country Link
JP (1) JPS605232B2 (en)

Also Published As

Publication number Publication date
JPS5780786A (en) 1982-05-20

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