JPS6128449B2 - - Google Patents
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- Publication number
- JPS6128449B2 JPS6128449B2 JP52002806A JP280677A JPS6128449B2 JP S6128449 B2 JPS6128449 B2 JP S6128449B2 JP 52002806 A JP52002806 A JP 52002806A JP 280677 A JP280677 A JP 280677A JP S6128449 B2 JPS6128449 B2 JP S6128449B2
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- machining
- pulses
- inspection
- processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
- B23H1/00—Electrical discharge machining, i.e. removing metal with a series of rapidly recurring electrical discharges between an electrode and a workpiece in the presence of a fluid dielectric
- B23H1/02—Electric circuits specially adapted therefor, e.g. power supply, control, preventing short circuits or other abnormal discharges
- B23H1/024—Detection of, and response to, abnormal gap conditions, e.g. short circuits
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
Description
【発明の詳細な説明】
本発明は電極と被加工体を対向した加工間隙に
加工パルスによる繰返放電を行なつて加工する放
電加工(電蝕加工を含む)に於て、行なわれてい
る放電の状態が良いか悪いか、即ち、加工間隙の
状態変化、その良否を正確に検出し、判別するこ
と、そして更に加工状態を最良に制御することを
目的とする。[Detailed description of the invention] The present invention is carried out in electric discharge machining (including electrolytic erosion machining) in which machining is performed by repeatedly applying electric discharge using machining pulses to the machining gap where an electrode and a workpiece face each other. The purpose of this invention is to accurately detect and determine whether the state of discharge is good or bad, that is, change in the state of the machining gap, and whether it is good or bad, and further to optimally control the machining state.
放電加工に於ては、間隙状態(放電状態)に応
じて加工パルスを制御したり、加工液の流速、電
導度の制御、加工屑が堆積したとき電極振動、電
極引上げによる洗浄作業、間隙長を加工に追従さ
せるためのサーボ制御等を最適に行なうことが必
要である。従来、加工間隙の状態、放電状態、放
電の良否等を検出するのに、加工パルスの印加さ
れている間隙の電圧、電流、インピーダンス等を
検出し判別するようにしていた。信号の検出は平
均的な電圧、電流を検出するものと、繰返し供給
されるパルス、各パルスをこのパルスによる電
圧、電流変化をパルス的に検出するものとがあ
る。前者の平均的信号の検出では迅速な状態判
別、それによる迅速な対応制御ができない。後者
ではパルス的にデジタルに検出し判別するから変
化に対して対応が早くでき、従つて加工効果も高
まるが、加工パルスは通常は間隙状態の変化に対
応してパルス幅等が変更制御され、又、加工パル
スは目的加工に応じて最適な条件に設定制御され
るもので、この加工パルスによる検出、加工パル
スを加えたときの加工間隙の状態、放電状態を電
圧、電流変化を信号として検出し、判別しても適
確な判別ができない。即ち、加わる加工パルスの
変化をも信号に加えてやらなければ実際に正確な
判別ができないことになる。 In electrical discharge machining, machining pulses are controlled according to the gap state (discharge state), flow rate of machining fluid, control of electrical conductivity, electrode vibration when machining debris accumulates, cleaning work by pulling up the electrode, and gap length. It is necessary to optimally perform servo control, etc. to follow the machining. Conventionally, in order to detect the state of the machining gap, the discharge state, the quality of the discharge, etc., the voltage, current, impedance, etc. of the gap to which the machining pulse is applied have been detected and determined. There are two types of signal detection: one detects average voltage and current, and the other detects pulses that are repeatedly supplied and changes in voltage and current caused by each pulse. The former method of detecting average signals does not allow for quick state determination and quick response control. In the latter case, since pulses are digitally detected and discriminated, it is possible to respond quickly to changes, thereby increasing the machining effect. In addition, the machining pulse is set and controlled to the optimal conditions according to the target machining, and detection using this machining pulse, the state of the machining gap when the machining pulse is applied, and the discharge state are detected as voltage and current changes as signals. However, even if it is determined, it cannot be accurately determined. That is, unless changes in the applied machining pulses are also added to the signal, accurate discrimination cannot actually be made.
そこで本発明は、正常加工間隙に放電を発生さ
せるのに、充分な電圧及びパルス幅にし、しかも
検出判別し易いように放電したときの波高値(
p)、パルス幅(τ〜n)、波形等を一定に選択設
定した検査用のパルスを加工パルスの列に組入れ
て加工間隙に供給するようにし、一定に設定した
検査用パルスによつて間隙状態の検査、検出判別
をするようにしたことを特徴とするものである。 Therefore, the present invention aims to set a sufficient voltage and pulse width to generate electric discharge in the normal machining gap, and to set the peak value (
p), pulse width (τ~n), waveform, etc. are selected and set to a constant value, and the inspection pulse is incorporated into the machining pulse train and supplied to the machining gap. The feature is that the state is inspected, detected and determined.
検査用パルスは第1図に示すように、加工パル
スとは異なる設定された波高値(p)、パルス
幅(τon)、又は波形の設定された値を有するも
ので、これを加工パルス列に組込んで加工間隙に
供給する。検査パルスは加工パルス列に少なくと
も検査用パルス数が加工パルス数より少ない比率
で組入れ、加工間隙に供給する。そしてこの検査
用パルスによる放電発生の有無、放電発生したと
きの電圧、電流等の信号を検出判別する。 As shown in Figure 1, the inspection pulse has a set wave height (p), pulse width (τon), or waveform that is different from the processing pulse, and is assembled into the processing pulse train. and feed it into the machining gap. The inspection pulses are incorporated into the machining pulse train at least in such a ratio that the number of inspection pulses is smaller than the number of machining pulses, and is supplied to the machining gap. Then, whether or not a discharge occurs due to this test pulse, and signals such as voltage and current when the discharge occurs are detected and determined.
(イ) 図は矩形波の検査パルスで、加工パルスと比
較して波高値が小さい。(b) The figure shows a rectangular wave inspection pulse, and the wave height value is smaller than that of the processing pulse.
(ロ) 図は検査用パルスのパルス幅が加工パルスよ
り長い、勿論この反対に小さい場合もある。(b) The figure shows that the pulse width of the inspection pulse is longer than the processing pulse; of course, the pulse width of the inspection pulse may be shorter than that of the processing pulse.
(ハ) 図は検査用パルスを1つ、又は2つ、3つ続
けて発生供給し、色々な検査用パルスの供給の
仕方が考えられる。何れも検査用パルス数が加
工パルス数より少ない比率で組入れ供給するよ
うにしている。(c) In the figure, one, two, or three test pulses are generated and supplied in succession, and various ways of supplying the test pulses can be considered. In either case, the number of inspection pulses is incorporated and supplied at a smaller ratio than the number of processing pulses.
このように検査パルスは、加工間隙に放電を発
生させるのに充分な値で且つ一定基準値に電圧及
びパルス幅を設定してあり、イ図のように、加工
パルスの電圧が高い、例えば荒加工の場合、検査
パルスは加工間隙に放電を発生させて検査できれ
ばよいから、図のように加工パルスより電圧を低
く設定し、設定した一定の電圧及びパルス幅をも
つて検査する。又、ロ図のように、加工パルスの
電圧が低い、例えば仕上加工の場合(勿論仕上加
工の場合はパルス幅も短かくなる。ロ図とイ図は
横軸寸法を異にする)、加工パルスの電圧及びパ
ルス幅が小さくなるから、検査パルスのパルス幅
はこの加工パルスより大きく設定され、必ず放電
を発生して検査ミスがなくなるよう設定される。
このように検査パルスは加工パルスに関係なく、
電圧及びパルス幅を一定基準値に設定し、荒加工
から仕上加工までを一定パルスによつて検査する
ことができる。又、一定の設定パルスによつて検
査することによつて、加工パルスが変更制御され
て変化するような加工の場合でも安定した正確な
検査が行なえる。検出信号の判別は検査パルスが
一定であるから、一定基準値で判別して常に正確
な判別検査をすることができる。又ハ図のよう
に、検査パルスの組入れを1つ若しくは複数に制
御御しながら発生するものでは、検査パルスを複
数個続けて発生することにより検査ミスをなく
し、又、加工間隙の変化する傾向等を知ることが
できる。 In this way, the voltage and pulse width of the inspection pulse are set to a constant reference value that is sufficient to generate electric discharge in the machining gap. In the case of machining, the test pulse only needs to generate electric discharge in the machining gap to perform the test, so the voltage is set lower than the machining pulse as shown in the figure, and the test is performed with the set constant voltage and pulse width. Also, as shown in figure 2, when the voltage of the machining pulse is low, for example, for finishing machining (of course, the pulse width will be shorter in the case of finishing machining. The horizontal axis dimensions of figure 2 and figure 2 are different), the machining Since the voltage and pulse width of the pulse are small, the pulse width of the inspection pulse is set to be larger than the machining pulse, and is set to ensure that discharge occurs and inspection errors are eliminated.
In this way, the inspection pulse is independent of the processing pulse.
By setting the voltage and pulse width to constant reference values, it is possible to inspect everything from rough machining to finishing machining using constant pulses. Further, by inspecting using a constant set pulse, stable and accurate inspection can be performed even in the case of machining where the machining pulse is controlled to change. Since the test pulse is constant in determining the detection signal, the determination can be performed using a constant reference value and accurate determination can be performed at all times. In addition, as shown in Figure C, when the inspection pulses are generated while controlling one or more inspection pulses, generating multiple inspection pulses in succession eliminates inspection errors and also reduces the tendency of machining gaps to change. etc. can be known.
尚、検査パルスは、電圧又はパルス幅の一方を
一定基準値に設定し、他方を加工条件に対応させ
て切換えるようにすることができる。例えば、パ
ルス幅の大きい荒加工条件からパルス幅の小さい
仕上条件に加工パルスを切換えるとき、検査パル
スのパルス幅を検査に最適な一定値にし電圧もそ
のままにしたとすると検査パルスにより加工面が
悪化することがあるが、そのときは検査パルスの
電圧を下げて波高値(p)を小さくすることに
より仕上加工面を維持して検査することができ
る。 In addition, for the inspection pulse, one of the voltage and the pulse width can be set to a constant reference value, and the other can be changed according to the processing conditions. For example, when switching the machining pulse from a rough machining condition with a large pulse width to a finishing condition with a small pulse width, if the pulse width of the inspection pulse is set to a constant value that is optimal for inspection and the voltage remains unchanged, the machined surface will deteriorate due to the inspection pulse. In such cases, by lowering the voltage of the inspection pulse and reducing the peak value (p), the finished surface can be maintained and inspected.
又、検査用パルスは何れも加工パルスが無いと
き、休止中に、又は加工パルスを停止して検査用
パルスを加えることが必要である。 Further, it is necessary to apply the inspection pulse when there is no processing pulse, during a pause, or after stopping the processing pulse.
以下図面の一実施例によつて説明する。第2図
に於て、1及び2は電極及び被加工体で、対向し
て加工間隙を形成する。3は加工電力を供給する
電圧源、4はトランジスタ等のスイツチ素子で、
電圧源3と直列に接続され、加工間隙に接続され
て、これのオン、オフスイツチングによつて加工
パルスを発生し供給する。5がスイツチ4にスイ
ツチ制御パルスを発生し加えるパルサで、独立発
振器を用いる場合もあるが、加工間隙の電圧、電
流等検出信号に応答してパルス幅、休止幅、周波
数等が変化する従属発振器が用いられることもあ
る。又、間隙の検出信号をパルス化変換する変換
回路を用いる場合もある。以上の、3,4,5等
により加工用パルス電源を形成している。6は検
査用の電圧源、7はスイツチで、パルサ8の制御
によりオン、オフスイツチングして検査用パルス
を発生する。 An embodiment will be explained below with reference to the drawings. In FIG. 2, reference numerals 1 and 2 represent an electrode and a workpiece, which face each other and form a machining gap. 3 is a voltage source that supplies processing power, 4 is a switch element such as a transistor,
It is connected in series with the voltage source 3 and connected to the machining gap, and generates and supplies machining pulses by switching it on and off. 5 is a pulser that generates and applies switch control pulses to switch 4. Although an independent oscillator may be used in some cases, it is also a dependent oscillator whose pulse width, pause width, frequency, etc. change in response to detection signals such as voltage and current in the machining gap. is sometimes used. Further, a conversion circuit that converts the gap detection signal into a pulse may be used. The above-mentioned components 3, 4, 5, etc. form a processing pulse power source. 6 is a voltage source for testing, and 7 is a switch, which is turned on and off under the control of a pulser 8 to generate testing pulses.
検査用パルスは、正常加工間隙に放電を発生さ
せるのに充分な電圧及びパルス幅で、しかも検出
判別の検査が容易で正確なように放電時の波高値
及びパルス幅等が一定に設定され、即ち、波高値
(p)は電源6の電圧によつて、又、パルス幅
(τon)はパルサ8によつて選択設定される。波
高値(p+は200A以下、好ましくは10A程度、
又はそれ以下で、又パルス幅(τon)5〜20μ
s程度に設定される。検査パルスの電圧及びパル
ス幅は一定基準値に設定されるが、電圧又はパル
ス幅を一定に設定し、他方を切換える場合は、必
要により加工特性がその加工条件とほぼ等しくな
るように制御する。例えば加工面粗さはRa≒K
τpで表わされるので、例えば加工パルスをτ
on3μs.p10Aとするとき、検査用パルスはτ
on10μs.p44〜5Aと設定する如くである。波形
は通常矩形波パルスであるが、パルサ8の制御に
より三角波、その他任意の波形パルスを発生でき
る。9は検査用パルスを加工パルスの列に組込む
アンドゲート回路で、パルサ5の出力パルスと、
パルサ8の出力パルスとをアンド結合することに
よつて組込み、パルサ8の出力パルスをノツトゲ
ート10で反転して結合することにより検査用パ
ルスの加工パルス列への組込みが、加工パルスが
無いとき、即ち、加工パルスの休止中に、或いは
加工パルスを中断して休止するときに、検査用パ
ルスが加工間隙に加わるように組込まれ、加工パ
ルスが加わらない間に加工間隙の状態判別を行な
う。11は間隙の電圧信号を検出する抵抗、12
は検出信号の判別装置で、パルサ8によつて制御
され、検査用パルスが間隙に加わつたときに、同
期して検出信号を判別することによつて正確な検
査を行なうよう作動する。 The inspection pulse has sufficient voltage and pulse width to generate an electric discharge in the normal machining gap, and the peak value and pulse width of the electric discharge are set constant so that the inspection for detection and discrimination is easy and accurate. That is, the peak value (p) is selectively set by the voltage of the power source 6, and the pulse width (τon) is selectively set by the pulser 8. Peak value (p + is less than 200A, preferably around 10A,
or less, and pulse width (τon) 5 to 20μ
It is set to about s. The voltage and pulse width of the inspection pulse are set to constant reference values, but when the voltage or pulse width is set constant and the other is switched, the processing characteristics are controlled to be approximately equal to the processing conditions, if necessary. For example, the machined surface roughness is Ra≒K
For example, the machining pulse is expressed as τp.
When on3μs.p10A, the test pulse is τ
It is like setting on10μs.p44~5A. The waveform is normally a rectangular wave pulse, but by controlling the pulser 8, a triangular wave or other arbitrary waveform pulses can be generated. 9 is an AND gate circuit that incorporates the inspection pulse into the processing pulse train, and the output pulse of the pulser 5 and
The inspection pulse is incorporated into the machining pulse train by AND-combining the output pulse of the pulser 8, and the output pulse of the pulser 8 is inverted and combined with the not gate 10. During the pause of the machining pulse, or when the machining pulse is interrupted and paused, the inspection pulse is incorporated so as to be applied to the machining gap, and the state of the machining gap is determined while the machining pulse is not applied. 11 is a resistor for detecting the gap voltage signal; 12
is a detection signal discriminator which is controlled by the pulser 8 and operates to perform accurate inspection by discriminating the detection signal synchronously when a test pulse is applied to the gap.
加工間隙の状態検査は定められた大きさの検査
用パルスを加えて間隙の電圧を検出し、検出信号
を判別して行なわれるから、加える検査パルスは
常に一定であり、これに対して間隙から放電の有
無、放電発生時の間隙状態変化に対応して変化す
る信号を検出し、判別するから、検出、判別の正
確度は極めて高く、しかも検査用パルスは波高値
(p)、パルス幅(τon)が検査し易く、検査
に最適な値に設定されたものであつて、これによ
つても検査を容易にし、且つ検査正確度を向上す
る。 The state of the machining gap is inspected by applying a test pulse of a predetermined size, detecting the gap voltage, and determining the detection signal, so the applied test pulse is always constant; The accuracy of detection and discrimination is extremely high because it detects and discriminates signals that change in response to the presence or absence of discharge and changes in the gap state when discharge occurs.Moreover, the test pulse has a peak value (p), a pulse width ( τon) is easy to test and is set to an optimal value for the test, which also facilitates the test and improves the test accuracy.
尚、検査用パルスは独立発振パルサ8により所
定の時間間隔で、又加工用のパルサ5と関係的
に、例えばパルサ5の発振出力を分周して、加工
パルスが何個発生する毎に検査用パルスを1つ、
又は複数個発生させるというように発生させ、或
いは間隙の加工状態に応じてパルサ8を制御し、
加工状態に応じた時間間隔で発生させるが、発生
パルスは1パルスに限らず、複数パルスを続けて
発生し供給してもよく、この検査パルスの発生間
隔、パルス数はパルサ8の選択設定により任意に
発生させることができ、常に最適な検査ができる
よう設定制御する。通常の放電加工では検査パル
スの発生は時間的に1秒に1〜10個程度加えて検
査するとよい。尚、パルサ8を加工用パルサ5の
発振周波数より低周波発振とすることにより加工
パルスより少ない比率で検査パルスを発生でき
る。 In addition, the inspection pulse is generated by an independent oscillation pulser 8 at predetermined time intervals, and in relation to the processing pulser 5, for example, the oscillation output of the pulser 5 is frequency-divided, and the inspection is performed every time how many processing pulses are generated. one pulse for
Or, generate a plurality of pulses, or control the pulser 8 according to the machining state of the gap,
The generated pulses are generated at time intervals according to the machining state, but the generated pulse is not limited to one pulse, and multiple pulses may be generated and supplied in succession.The generation interval and number of pulses of this inspection pulse are determined by the selection settings of the pulser 8. It can be generated arbitrarily, and the settings are controlled so that optimal inspection can be performed at all times. In normal electric discharge machining, it is preferable to generate test pulses by adding about 1 to 10 test pulses per second. Note that by setting the pulser 8 to oscillate at a lower frequency than the oscillation frequency of the processing pulser 5, the inspection pulse can be generated at a smaller rate than the processing pulse.
又、この検査パルスを加えて加工間隙から検出
する信号は、電圧、電流、インピーダンス、又は
その時間的変化、又は発生高周波等でもよく、検
査パルスの継続中だけでなく、検査パルスのある
一定時期にチエツクし、又検査パルスが停止した
直後の信号を、例えば電圧、電流、抵抗、インピ
ーダンス、又はこれらの振動状態を、又、変化状
態を検出することもよく、検出回路は適宜に構成
し、利用することができる。そして検出信号の判
別は、その大、小、レベル、又その有無により、
又複合判別により、例えば検出判別した出力をカ
ウンタ、プリセツトカウンタ、アツプダウンカウ
ンタ等によりカウントして複数集合して集団とし
て判別し、プリセツトカウンタ等がプリセツト数
にカウントすると判別演算信号を出力して、放電
状態、加工状態の良否を判別し、又、加工状態の
推移、全体的傾向等を判定は、又、判定結果に対
応した制御等を行なうようにする。このように検
出判別、そして集合、演算処理は、集合して良否
の分布を求め全体を判別するものである。又、10
μs程度のパルス幅の検査用パルスを加え、放電
を行なわせ、放電発生後、3〜5μs程度後の放
電コラム中に含まれている3〜30MHz程度の高周
波成分を検出しこれを含んでいるときは良、含ま
れない、或いは一定以下であるときは不良と判定
する。 In addition, the signal detected from the machining gap by applying this inspection pulse may be voltage, current, impedance, or a temporal change thereof, or a generated high frequency, etc., and can be detected not only during the continuation of the inspection pulse but also at a certain period of the inspection pulse. It is also possible to check the signal immediately after the test pulse stops, such as voltage, current, resistance, impedance, or the vibration state of these, or to detect a change state, and the detection circuit is configured as appropriate, can be used. The detected signal can be determined by its size, smallness, level, or presence or absence.
In addition, by compound discrimination, for example, the detected and discriminated outputs are counted by a counter, preset counter, up-down counter, etc., and a plurality of them are collected and discriminated as a group, and when the preset counter etc. counts to the preset number, a discrimination calculation signal is output. The quality of the discharge state and the machining state are determined, the transition of the machining state, the overall trend, etc. are determined, and control is performed in accordance with the determination results. In this way, the detection/judgment, aggregation, and arithmetic processing are performed to determine the distribution of pass/fail in aggregation and to judge the whole. Also, 10
A test pulse with a pulse width of approximately μs is applied to cause a discharge, and a high frequency component of approximately 3 to 30 MHz contained in the discharge column is detected and contained approximately 3 to 5 μs after the discharge occurs. If the value is not included, it is determined to be good; if it is not included or below a certain level, it is determined to be defective.
又、検出判別は、検査用パルスの入力、即ち、
加工間隙に加えた検査パルスの大きさ、数、波形
等に対して、間隙から検出した信号の大きさ、数
波形等を比較し判別する。これによつて加工間隙
の状態、変化又は良否等を検出し判別する。 In addition, detection judgment is performed by inputting a test pulse, that is,
The magnitude, number, waveform, etc. of the signal detected from the gap are compared with the magnitude, number, waveform, etc. of the inspection pulses applied to the machining gap. This allows the state, change, quality, etc. of the machining gap to be detected and determined.
第3図は検査用パルスの発生を加工用パルス電
源の一部分を兼用させてパルス発生を行なうよう
にした実施例で、第2図と同符号は同一部分を示
す。13はパルサ5の出力を分周するカウンタ、
プリセツトカウンタで、プリセツト数のカウンタ
数が行なわれると信号を出力し、パルサ14を作
動させる。パルサ14は検査用のパルサで、この
出力をオアゲート17を通してスイツチ41に加
え、オン、オフスイツチング制御して検査用パル
スを発生する。 FIG. 3 shows an embodiment in which a part of the processing pulse power source is also used to generate inspection pulses, and the same reference numerals as in FIG. 2 indicate the same parts. 13 is a counter that divides the output of the pulser 5;
When the preset counter counts up to the preset number, it outputs a signal and activates the pulser 14. The pulser 14 is a pulser for testing, and its output is applied to the switch 41 through the OR gate 17 to perform on/off switching control to generate testing pulses.
この検査用パルスの発生時にはパルサ14の出
力をノツトゲート16で反転してアンドゲート1
5に加え、加工パルスのパルサ5出力とアンド結
合することにより加工パルスを中断させる。勿論
加工パルスの休止中に検査パルスが発生するよう
関連作動させるよう回路構成しておけば加工パル
スを中断制御する必要はない。尚、スイツチは複
数、41,42を並列接続し、スイツチの並列個
数によつて波高値(p)が制御されるから、電
圧源3を一定としても、スイツチの作動させる数
の切換によつて任意の波高値パルスが得られ、図
では加工パルスを発生するときはスイツチ41と
42を並列作動させ、検査パルスの発生にはオア
ゲート17からスイツチ41のみを作動して波高
値を設定し、加工パルスよりも小さい波高値パル
スを発生するように構成している。勿論加工パル
スと検査用パルスは波高値が等しくてよいもので
あれば同数のスイツチを利用すればよい。検査用
パルスのパルス幅はパルサ14によつて任意に制
御され、又、加工パルス数と検査用パルス数の比
率関係はカウンタ13のプリセツトによつて任意
に設定される。又、加工間隙の状態と関連制御し
て検査パルスを発生させる場合はカウンタ13の
プリセツトを自動制御するように構成すればよ
い。 When this test pulse is generated, the output of the pulser 14 is inverted by the NOT gate 16, and the AND gate 1
5, the machining pulse is interrupted by AND-combining with the pulser 5 output of the machining pulse. Of course, there is no need to control the interruption of the machining pulse if the circuit is configured so that the relevant operation is performed so that the inspection pulse is generated during the pause of the machining pulse. Note that a plurality of switches 41 and 42 are connected in parallel, and the peak value (p) is controlled by the number of switches in parallel. A pulse with an arbitrary peak value can be obtained, and in the figure, when generating a processing pulse, switches 41 and 42 are operated in parallel, and when generating an inspection pulse, only switch 41 is operated from the OR gate 17 to set the peak value, and the processing It is configured to generate a pulse with a smaller peak value than the pulse. Of course, the same number of switches may be used for the processing pulse and the inspection pulse as long as they have the same peak value. The pulse width of the inspection pulse is arbitrarily controlled by the pulser 14, and the ratio relationship between the number of processing pulses and the number of inspection pulses is arbitrarily set by the preset of the counter 13. Further, in the case where the inspection pulse is generated by controlling in relation to the state of the machining gap, the preset of the counter 13 may be automatically controlled.
又、この回路構成のパルサ14はパルサ5に関
連制御されない独立パルサであつてもよい。又、
加工間隙の状態によつて制御されるものであつて
もよい。出力パルス波形は矩形波、三角波、半円
形波等任意である。 Further, the pulser 14 having this circuit configuration may be an independent pulser that is not controlled in relation to the pulser 5. or,
It may be controlled by the state of the machining gap. The output pulse waveform is arbitrary, such as a rectangular wave, a triangular wave, or a semicircular wave.
以上のようにして本発明によれば、加工パルス
とは別の正常間隙に放電を発生させるのに充分な
値で、且つ一定基準値に電圧及びパルス幅を設定
した検査パルスを用い、これを加工間隙に供給し
放電を発生して加工間隙の状態を検査するから、
従来の正常間隙では放電を発生しないようなパル
スによる加工間隙の導通テストに比較して加工間
隙の状態変化を検出判別パラメータの増加によつ
て極めて正確に検査できる。 As described above, according to the present invention, an inspection pulse whose voltage and pulse width are set to a constant reference value and which is sufficient to generate an electric discharge in a normal gap different from the machining pulse is used; The condition of the machining gap is inspected by supplying it to the machining gap and generating electrical discharge.
Compared to conventional machining gap continuity tests using pulses that do not generate electric discharge in a normal gap, changes in the machining gap state can be tested extremely accurately by increasing the detection and discrimination parameter.
又、検査パルスは加工パルスとは別に独立して
発生するものであるから、従来の加工パルスを利
用するものに比べて、検出判別がし易いように、
且つ正確な判別ができるように、電圧及びパルス
幅を任意に一定に設定することができ、加工条件
の切換、加工パルスの変化によつて信号検出、判
別が変化したり、誤差が多くなり正確な検査がで
きなくなつたりすることなく、一定基準値で常に
正確な判別ができる。 In addition, since the inspection pulse is generated independently from the machining pulse, it is easier to detect and discriminate compared to the conventional method that uses machining pulses.
In addition, the voltage and pulse width can be arbitrarily set constant to enable accurate discrimination, and signal detection and discrimination may change due to changes in processing conditions or changes in processing pulses, and errors may increase, resulting in inaccurate It is possible to always make accurate judgments using a fixed reference value without becoming unable to carry out a thorough inspection.
又、検査パルスを、正常間隙に放電を発生させ
るのに充分な値で歛つ一定基準値に電圧又はパル
ス幅を設定した場合は、何れか一方のパルス幅又
は電圧を加工条件に対応させて切換えることによ
り、検査パルスによつて加工面粗さを悪化させた
り、加工精度、電極消耗を悪化させたりすること
なく、正確な検査ができる。 In addition, if the voltage or pulse width of the inspection pulse is set to a constant reference value that is sufficient to generate electric discharge in the normal gap, one of the pulse widths or voltages should be adjusted to match the machining conditions. By switching, accurate inspection can be performed without deteriorating machined surface roughness, machining accuracy, or electrode wear due to inspection pulses.
又、検査用パルスは加工パルス列に加工パルス
数よりも少ない比率で組任れて加工間隙に供給す
るようにしたので検査のために放電加工を犠性に
することがなく、高速で高性能の加工が続けら
れ、間隙の良、不良、推移、傾向等の検出検査が
できる。そしてこの検出判別出力を信号として、
この信号によつて、又、カウンタ等でカウントし
た集団信号によつて、例えば間隙のサーボ、追従
制御、レシプロ制御による間隙洗浄、加工パルス
のパルス幅、休止幅、デユーテイフアクタ等の制
御、又寄せ加工送り、傾斜加工送り制御等を行な
えば、それらの制御は常に最適に行なわれ、例え
ば、加工間隙のサーボを行なうとき、正常間隙で
は静止させ、放電が発生しないとき間隙を狭め、
間隙が狭くて異常放電では間隙を広げるように制
御することができる如く、常に最適状態で安定し
た加工ができ、加工スピード、加工能率、加工精
度等加工効果は極めて向上する効果が得られる。 In addition, the inspection pulses are assigned to the machining pulse train at a smaller ratio than the number of machining pulses and are supplied to the machining gap, so electrical discharge machining is not sacrificed for inspection, and high-speed, high-performance processing is possible. Machining can be continued, and inspections can be performed to detect gaps, whether they are good or bad, trends, trends, etc. Then, this detection discrimination output is used as a signal,
By this signal and by the collective signal counted by a counter etc., for example, gap servo control, follow-up control, gap cleaning by reciprocating control, processing pulse width, pause width, duty factor control, etc. In addition, if you control the feed for approaching machining, the feed for inclined machining, etc., these controls will always be performed optimally. For example, when performing servo machining gap, the machining gap will be stopped at a normal gap, and when no electrical discharge occurs, the gap will be narrowed.
If the gap is narrow and abnormal discharge occurs, the gap can be controlled to be widened, so that stable machining can always be performed under optimal conditions, and machining effects such as machining speed, machining efficiency, and machining accuracy can be greatly improved.
図面の第1図は本発明の一実施例説明図パルス
列波形図、第2図は本発明の一実施例回路構成
図、第3図は他の実施例の回路構成図である。
1……電極、2……被加工体、3……加工用電
極、4……スイツチ、5……パルサ、6……検査
電源、7……スイツチ、8……パルサ、9……ア
ンドゲート、10……ノツトゲート、11……電
圧検出抵抗、12……判別装置、13……プリセ
ツトカウンタ、14……パルサ、15……アンド
ゲート、16……ノツトゲート、41,42……
スイツチ。
FIG. 1 is a pulse train waveform diagram for explaining one embodiment of the present invention, FIG. 2 is a circuit configuration diagram of one embodiment of the invention, and FIG. 3 is a circuit diagram of another embodiment. 1... Electrode, 2... Workpiece, 3... Processing electrode, 4... Switch, 5... Pulser, 6... Inspection power supply, 7... Switch, 8... Pulser, 9... AND gate , 10... Not gate, 11... Voltage detection resistor, 12... Discrimination device, 13... Preset counter, 14... Pulser, 15... AND gate, 16... Not gate, 41, 42...
Switch.
Claims (1)
スによつて繰返しパルス放電を行なつて加工する
放電加工に於て、前記加工用パルスとは別の正常
加工間隙に放電を発生させるのに充分な値で且つ
一定基準値に電圧及びパルス幅を設定した検査用
パルスを発生せしめ、該検査用パルスを前記加工
用パルスの列に検査用パルス数が加工用パルス数
よりも少ない比率で組入れて加工間隙に供給し、
該検査用パルスによつて加工間隙の状態を検出す
ることを特徴とする放電加工方法。 2 電極と被加工体を対向した間隙に加工再パル
スによつて繰返しパルス放電を行なつて加工する
放電加工に於て、前記加工用パルスとは別の正常
加工間隙に放電を発生させるのに充分な値で且つ
一定基準値に電圧又はパルス幅を設定した検査用
パルスを発生せしめ、該検査用パルスを前記加工
用パルスの列に検査用パルス数が加工用パルス数
よりも少ない比率で組入れて加工間隙に供給し、
該検査用パルスによつて加工間隙の状態を検出す
ることを特徴とする放電加工方法。 3 電極と被加工体を対向した加工間隙と、該加
工間隙に加工用パルスを供給する加工用パルス電
源と、正常加工間隙に放電を発生させるのに充分
な値で且つ一定基準値に電圧及びパルス幅又はそ
の何れかを設定した検査用パルスを発生する前記
加工用パルス電源の一部分を兼用した、又はこれ
とは別のパルス発生電源と、前記検査用パルスを
前記加工用パルス列に検査用パルス数が加工用パ
ルス数より少ない比率で組入れたパルス列を加工
間隙に供給する回路と、前記検査用パルスによつ
て加工間隙の状態を検出判別する判別装置とを設
けたことを特徴とする放電加工装置。 4 検査用パルスを発生する前記加工用パルス電
源の一部分を兼用した、又はこれとは別のパルス
発生電源は、加工用パルスに独立したパルス数で
検査用パルスを発生することを特徴とする特許請
求の範囲第3項に記載の放電加工装置。 5 検査用パルスを発生する前記加工用パルス電
源の一部分を兼用した、又はこれとは別のパルス
発生電源は、加工用パルスに従属したパルス数で
検査用パルスを発生することを特徴とする特許請
求の範囲第3項に記載の放電加工装置。 6 検査用パルスを発生する前記加工用パルス電
源の一部分を兼用した、又はこれとは別のパルス
発生電源は、加工間隙の加工状態に対応したパル
ス数で検査用パルスを発生することを特徴とする
特許請求の範囲第3項に記載の放電加工装置。 7 検査用パルスを発生する前記加工用パルス電
源の一部分を兼用した、又はこれとは別のパルス
発生電源は、検査用パルス発生時に続けて複数パ
ルスを発生することを特徴とする特許請求の範囲
第3項に記載の放電加工装置。[Scope of Claims] 1. In electric discharge machining in which a machining pulse is repeatedly applied to a gap between an electrode and a workpiece facing each other to produce a pulse discharge, a normal machining gap different from the machining pulse is used. Generate an inspection pulse whose voltage and pulse width are set to a constant reference value with a value sufficient to generate an electric discharge, and add the inspection pulse to a train of the processing pulses so that the number of inspection pulses is the number of processing pulses. Incorporate at a ratio smaller than that and supply it to the machining gap,
An electric discharge machining method characterized in that the state of a machining gap is detected by the inspection pulse. 2. In electric discharge machining, in which a machining re-pulse is used to repeatedly generate pulsed discharge in the gap between an electrode and a workpiece facing each other, the electric discharge is generated in a normal machining gap different from the machining pulse. Generate an inspection pulse with a voltage or pulse width set to a sufficient value and a constant reference value, and incorporate the inspection pulse into the processing pulse train at a ratio where the number of inspection pulses is smaller than the number of processing pulses. and supply it to the machining gap,
An electric discharge machining method characterized in that the state of a machining gap is detected by the inspection pulse. 3. A machining gap in which the electrode and the workpiece face each other, a machining pulse power source that supplies machining pulses to the machining gap, and a voltage and a constant reference value sufficient to generate electric discharge in the normal machining gap. A pulse generation power source which also serves as a part of the processing pulse power source or which generates an inspection pulse having a set pulse width or any of the pulse widths, and a pulse generation power source which is separate from the processing pulse power source and which generates an inspection pulse with a set pulse width or one of the pulse widths; Electrical discharge machining, characterized in that it is provided with a circuit that supplies a pulse train into the machining gap, the number of which is incorporated at a ratio smaller than the number of machining pulses, and a discriminator that detects and determines the state of the machining gap using the inspection pulses. Device. 4. A patent characterized in that a pulse generating power source that also serves as a part of the processing pulse power source that generates inspection pulses, or is separate from the processing pulse power source, generates inspection pulses at a number of pulses independent of the processing pulses. An electric discharge machining apparatus according to claim 3. 5. A patent characterized in that a pulse generating power source that also serves as a part of the processing pulse power source that generates inspection pulses, or is separate from the processing pulse power source, generates inspection pulses with a number of pulses dependent on the processing pulses. An electric discharge machining apparatus according to claim 3. 6. A pulse generating power source that also serves as a part of the processing pulse power source that generates inspection pulses, or is separate from this, is characterized in that it generates inspection pulses with a number of pulses corresponding to the machining state of the machining gap. An electric discharge machining apparatus according to claim 3. 7. Claims characterized in that a pulse generating power source that also serves as a part of the processing pulse power source that generates inspection pulses, or that is separate from this, generates a plurality of pulses successively when generating inspection pulses. The electric discharge machining apparatus according to item 3.
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP280677A JPS5388295A (en) | 1977-01-12 | 1977-01-12 | Discharge working method and device therefor |
| US05/860,164 US4236057A (en) | 1976-12-14 | 1977-12-13 | Apparatus for detecting gap conditions in EDM processes with monitoring pulses |
| DE2755772A DE2755772C2 (en) | 1976-12-14 | 1977-12-14 | Method and device for controlling workpiece machining by means of electrical discharge machining |
| FR7737723A FR2374130A1 (en) | 1976-12-14 | 1977-12-14 | METHOD AND APPARATUS FOR DETECTING INTERVAL CONDITIONS OF MACHINING BY ELECTRIC SHOCK |
| IT5243577A IT1091758B (en) | 1977-01-12 | 1977-12-30 | Automatic control of electro-discharge machining - using both machining pulses and monitoring pulses with electronic logic circuit |
| US06/112,460 US4376880A (en) | 1976-12-14 | 1980-01-16 | Method of and apparatus for detecting gap conditions in EDM process with monitoring pulses |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP280677A JPS5388295A (en) | 1977-01-12 | 1977-01-12 | Discharge working method and device therefor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5388295A JPS5388295A (en) | 1978-08-03 |
| JPS6128449B2 true JPS6128449B2 (en) | 1986-06-30 |
Family
ID=11539616
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP280677A Granted JPS5388295A (en) | 1976-12-14 | 1977-01-12 | Discharge working method and device therefor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5388295A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57138531A (en) * | 1981-02-13 | 1982-08-26 | Mitsubishi Electric Corp | Electric source apparatus for machining by electrical discharge |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51104695A (en) * | 1975-03-11 | 1976-09-16 | Inoue Japax Res | HODENKAKO SOCHI |
-
1977
- 1977-01-12 JP JP280677A patent/JPS5388295A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5388295A (en) | 1978-08-03 |
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