JPS6227530B2 - - Google Patents
Info
- Publication number
- JPS6227530B2 JPS6227530B2 JP54066191A JP6619179A JPS6227530B2 JP S6227530 B2 JPS6227530 B2 JP S6227530B2 JP 54066191 A JP54066191 A JP 54066191A JP 6619179 A JP6619179 A JP 6619179A JP S6227530 B2 JPS6227530 B2 JP S6227530B2
- Authority
- JP
- Japan
- Prior art keywords
- reaction tube
- arm
- wafer
- heat treatment
- support arm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Description
【発明の詳細な説明】
本発明は、半導体工業で用いられる拡散炉、酸
化炉、低圧CVD装置、常圧CVD装置等の熱処理
装置の改良に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to improvements in heat treatment equipment used in the semiconductor industry, such as diffusion furnaces, oxidation furnaces, low pressure CVD equipment, and atmospheric pressure CVD equipment.
従来、この種の熱処理装置において、反応管内
に半導体ウエハの如き被処理品を出し入れする操
作は次のようにして行なわれていた。すなわち、
石英製のウエハホルダーにウエハを装填した後、
該ホルダーをフオークリフトのアームで反応管内
に挿入し、ソフトランデイングさせてからフオー
クリフトのアームを管外に引出し、ウエハに所定
の熱処理を加える。しかる後、再びフオークリフ
トのアームを管内に挿入してウエハホルダーを保
持させ、そのままの状態でフオークリフトのアー
ムを管外に引出すことによりウエハを管外に取出
していた。そして、低圧CVD装置等におけるよ
うに反応管の開口部にドアが設置されている場合
には、ウエハの出し入れのたびにドアの開閉操作
を行なつていた。 Conventionally, in this type of heat treatment apparatus, the operation of loading and unloading objects such as semiconductor wafers into and out of reaction tubes has been carried out as follows. That is,
After loading the wafer into the quartz wafer holder,
The holder is inserted into the reaction tube with the arm of a forklift, and after a soft landing, the arm of the forklift is pulled out of the tube, and the wafer is subjected to a prescribed heat treatment. Thereafter, the arm of the forklift was inserted into the tube again to hold the wafer holder, and the wafer was taken out of the tube by pulling the arm of the forklift out of the tube. When a door is installed at the opening of the reaction tube, such as in a low-pressure CVD apparatus, the door must be opened and closed each time a wafer is taken out or taken out.
しかるに、上記した従来技術によると、ウエハ
と反応管内壁との間のクリアランスが2mm程度と
小さい場合には、ウエハの出し入れに非常な困難
をきたしていた。また、フオークリフトのアーム
の出し入れに伴つて管内に異物が侵入して歩留を
低下させていた。その上、ドアを開閉する場合に
は、その操作が面倒で、フオークリフトによるウ
エハ出し入れ操作と連動させるにしても装置が複
雑になる欠点があつた。 However, according to the above-mentioned conventional technology, when the clearance between the wafer and the inner wall of the reaction tube is as small as about 2 mm, it is extremely difficult to take the wafer in and out. Additionally, as the arm of the forklift was moved in and out, foreign matter entered the pipe, reducing yield. Moreover, when opening and closing the door, the operation is troublesome, and even if it is linked with the wafer loading/unloading operation using a forklift, the device becomes complicated.
本発明の目的は、上記した従来技術の欠点をな
くした改良された熱処理装置を提供することにあ
る。 SUMMARY OF THE INVENTION An object of the present invention is to provide an improved heat treatment apparatus that eliminates the drawbacks of the prior art described above.
本発明の装置の一実施例は、ウエハ等の被処理
品を直接又は間接に支持する支持アームを、固定
ガイドで案内される往復動自在の移動台に取付
け、この移動台を適宜移動させることによりウエ
ハ等の被処理品の出し入れを行なえるようにした
ことを特徴とするものであり、所望により上記支
持アームには反応管の開口部にあてがうべきドア
部材を一体的に取付けることもできるものであ
る。 In one embodiment of the apparatus of the present invention, a support arm that directly or indirectly supports a workpiece such as a wafer is attached to a reciprocating movable table guided by a fixed guide, and the movable table is moved as appropriate. The apparatus is characterized in that it is possible to take in and out objects to be processed such as wafers, and if desired, a door member to be applied to the opening of the reaction tube can be integrally attached to the support arm. It is.
以下、添付図面に示す実施例について本発明を
詳述する。 The invention will now be described in detail with reference to embodiments shown in the accompanying drawings.
第1図は、本発明の一実施例による熱処理装置
をそなえたクリーンベンチ10を示すものであ
る。クリーンベンチ10には石英製反応管11が
設けられ、その周囲には図示しない抵抗加熱式ヒ
ーター等が設けられている。反応管11の開口部
近傍には水平に延長するガイドロツド12A,1
2Bが設置されており、これらのガイドロツドに
は第2図に示す搬送機構20が組合わされる。ガ
イドロツド12Bの近傍に設けられた孔13は、
第2図の駆動アーム26が挿通されるものであ
る。 FIG. 1 shows a clean bench 10 equipped with a heat treatment apparatus according to an embodiment of the present invention. The clean bench 10 is provided with a quartz reaction tube 11, and a resistance heating type heater (not shown) is provided around the reaction tube 11. A horizontally extending guide rod 12A, 1 is provided near the opening of the reaction tube 11.
2B are installed, and a transport mechanism 20 shown in FIG. 2 is combined with these guide rods. The hole 13 provided near the guide rod 12B is
The drive arm 26 shown in FIG. 2 is inserted therethrough.
第2図において、21は前述のガイドロツド1
2A,12Bがそれぞれ可動的に挿通される孔2
2A,22Bを有するステンレススチール製の移
動台、23はウエハを支持して反応管11内に出
し入れされるべく移動台21に取付けられた石英
製の支持アーム、24は反応管11の開口部にあ
てがわれるべく支持アーム23に一体的に取付け
られたステンレススチール製のドア部材、25は
移動台21の突出部である。 In FIG. 2, 21 is the guide rod 1 mentioned above.
Hole 2 through which 2A and 12B are movably inserted
A stainless steel moving stage 2A and 22B, 23 a quartz support arm attached to the moving stage 21 to support the wafer and take it in and out of the reaction tube 11, and 24 a quartz support arm at the opening of the reaction tube 11; A stainless steel door member 25, which is integrally attached to the support arm 23 for application, is a protrusion of the moving platform 21.
移動台21の孔22A,22Bには図示しない
ベアリング機構が設けられており、このため、移
動台21はガイドロツド12A,12Bに接着さ
れるとスムーズに往復動するようになつている。
このような装着状態において、移動台21の突出
部25には、前述の孔13から突出する駆動アー
ム26の一端が取付けられるようになつており、
駆動アーム26の他端は第2図に示すようにして
ねじ26aが切られ、そのねじ26aにはステツ
ピングモータ等の駆動装置27のシヤフト28の
ねじ28aが係合している。このため、駆動アー
ム26は駆動装置27の回転力で往復動し、この
駆動アーム26の往復動作に伴つて移動台21も
ガイドロツド12A,12Bに沿つて往復動す
る。ここで、移動台21に取付けた支持アーム2
3は、第3図に示すようにウエハ30を装填した
ウエハホルダー31を支持した状態で反応管11
内に挿入されたり、引出されたりするが、その往
復動の過程でアーム23自体もあるいはウエハ3
0又はウエハホルダー31も反応管11の内壁に
接触しないようになつているものである。そし
て、支持アーム23に取付けたドア部材24はア
ーム23が管内の所定位置へ挿入されたときは自
動的に反応管11の開口部をとじ、アーム23が
管外へ引出されるときは自動的にその開口部をあ
けるように作用する。なお、熱処理中は、ドア部
材24が反応管11の開口部をとじると共に、支
持アーム23と、ウエハホルダー31と、ウエハ
30とは第3図に示すように管壁に非接触の状態
で反応管11内に保持される。 Bearing mechanisms (not shown) are provided in the holes 22A and 22B of the movable table 21, so that the movable table 21 can smoothly reciprocate when bonded to the guide rods 12A and 12B.
In this mounted state, one end of the drive arm 26 protruding from the aforementioned hole 13 is attached to the protrusion 25 of the moving table 21.
The other end of the drive arm 26 has a thread 26a cut as shown in FIG. 2, and a thread 28a of a shaft 28 of a drive device 27 such as a stepping motor is engaged with the thread 26a. Therefore, the drive arm 26 reciprocates by the rotational force of the drive device 27, and as the drive arm 26 reciprocates, the movable table 21 also reciprocates along the guide rods 12A, 12B. Here, the support arm 2 attached to the moving table 21
3, the reaction tube 11 is supported with a wafer holder 31 loaded with a wafer 30 as shown in FIG.
The arm 23 itself or the wafer 3 is
0 or the wafer holder 31 is also designed not to come into contact with the inner wall of the reaction tube 11. The door member 24 attached to the support arm 23 automatically closes the opening of the reaction tube 11 when the arm 23 is inserted into a predetermined position inside the tube, and automatically closes the opening of the reaction tube 11 when the arm 23 is pulled out of the tube. It acts to open the opening. During the heat treatment, the door member 24 closes the opening of the reaction tube 11, and the support arm 23, wafer holder 31, and wafer 30 react without contacting the tube wall, as shown in FIG. It is held within tube 11.
上記した本発明の装置によれば、(1)支持アーム
23は常にウエハと共に出し入れされるので、そ
の出し入れ回数が従来の半分に減り、管内に異物
が侵入して歩留を低下させる機会が大幅に減るこ
と、(2)反応管11の管壁に接触するものがないの
で、管壁をこすることで生ずる異物発生が全くな
くなること、(3)ドアの開閉がウエハの出し入れに
連動しているので、操作が簡略化されることなど
の優れた作用効果が得られる。 According to the apparatus of the present invention described above, (1) since the support arm 23 is always taken in and taken out together with the wafer, the number of times the support arm 23 is taken in and out is reduced to half of the conventional one, and there is a significant chance that foreign matter will enter the tube and reduce the yield. (2) Since there is nothing that comes into contact with the tube wall of the reaction tube 11, there is no generation of foreign matter caused by rubbing the tube wall; (3) The opening and closing of the door is linked to the loading and unloading of wafers. As a result, excellent effects such as simplified operation can be obtained.
第1図は、本発明の一実施例による熱処理装置
をそなえたクリーンベンチを示す斜視図、第2図
は、第1図の装置に組合わせて用いられる搬送機
構を示す斜視図、第3図は、反応管内へのウエハ
挿入状態を示す断面図である。
10……クリーンベンチ、11……反応管、1
2A,12B……ガイドロツド、20……搬送機
構、21……移動台、23……支持アーム、24
……ドア部材、30……ウエハ、31……ウエハ
ホルダ。
FIG. 1 is a perspective view showing a clean bench equipped with a heat treatment apparatus according to an embodiment of the present invention, FIG. 2 is a perspective view showing a transport mechanism used in combination with the apparatus shown in FIG. 1, and FIG. FIG. 2 is a cross-sectional view showing a state in which a wafer is inserted into a reaction tube. 10...Clean bench, 11...Reaction tube, 1
2A, 12B... Guide rod, 20... Transport mechanism, 21... Moving table, 23... Support arm, 24
...Door member, 30...Wafer, 31...Wafer holder.
Claims (1)
を加えた後前記反応管から前記被処理品を取出す
為の熱処理装置において、前記被処理品を支持し
て前記反応管内に出し入れされる支持アームと、
この支持アームが取付けられた往復動自在の移動
台と、前記移動台の移動を案内するガイド手段と
を有し、前記ガイド手段によつて案内されるよう
に前記移動台を移動させかつ前記支持アーム及び
前記被処理品を前記反応管の内壁に接触しない状
態で前記反応管内に挿入し、前記支持アーム及び
前記被処理品が前記反応管内に挿入された状態で
所定の熱処理を施すことを特徴とする熱処理装
置。1. In a heat treatment apparatus for inserting a processed product into a reaction tube and applying a predetermined heat treatment thereto, and then removing the processed product from the reaction tube, a support that supports the processed product and is moved in and out of the reaction tube. arm and
It has a reciprocating movable base to which the support arm is attached, and a guide means for guiding the movement of the movable base, and the movable base is moved as guided by the guide means and the support arm is movable in a reciprocating manner. The arm and the article to be treated are inserted into the reaction tube without contacting the inner wall of the reaction tube, and a predetermined heat treatment is performed with the support arm and the article to be treated inserted into the reaction tube. Heat treatment equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6619179A JPS55158626A (en) | 1979-05-30 | 1979-05-30 | Heat treating apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6619179A JPS55158626A (en) | 1979-05-30 | 1979-05-30 | Heat treating apparatus |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60215083A Division JPS61184822A (en) | 1985-09-30 | 1985-09-30 | Method for heat treatment |
| JP60215082A Division JPS61184821A (en) | 1985-09-30 | 1985-09-30 | Heat treatment equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55158626A JPS55158626A (en) | 1980-12-10 |
| JPS6227530B2 true JPS6227530B2 (en) | 1987-06-15 |
Family
ID=13308699
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6619179A Granted JPS55158626A (en) | 1979-05-30 | 1979-05-30 | Heat treating apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55158626A (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5636129A (en) * | 1979-08-31 | 1981-04-09 | Hitachi Ltd | Method and device for heat treatment of semiconductor thin plate |
| JPS58212146A (en) * | 1982-04-29 | 1983-12-09 | ヘレウス・クアルツシユメルツエ・ゲゼルシヤフト・ミツト・ベシユレンクタ−・ハフツング | Device for introducing silicon wafer in magazine into furnace |
| JPS58207626A (en) * | 1982-05-28 | 1983-12-03 | Hitachi Ltd | Semiconductor treating device |
| JPS59158953A (en) * | 1983-03-02 | 1984-09-08 | Ushio Inc | Light irradiation heating device |
| JPS59158954A (en) * | 1983-03-02 | 1984-09-08 | Ushio Inc | Light irradiation heating device |
| JPS59200431A (en) * | 1983-04-28 | 1984-11-13 | Toshiba Ceramics Co Ltd | Tool for carrying wafer boat |
| JPS6173324A (en) * | 1984-09-17 | 1986-04-15 | Dainippon Screen Mfg Co Ltd | Heat treating device |
| JPH0797563B2 (en) * | 1985-08-12 | 1995-10-18 | 株式会社日立製作所 | Heat treatment equipment |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3744650A (en) * | 1971-10-26 | 1973-07-10 | Semiconductor Elect Memories | Boat mover for semiconductor fusion process |
| JPS50139778A (en) * | 1974-04-25 | 1975-11-08 | ||
| JPS5729042B2 (en) * | 1974-06-07 | 1982-06-21 |
-
1979
- 1979-05-30 JP JP6619179A patent/JPS55158626A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55158626A (en) | 1980-12-10 |
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