Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6310779B2 - - Google Patents
[go: Go Back, main page]

JPS6310779B2 - - Google Patents

Info

Publication number
JPS6310779B2
JPS6310779B2 JP55124530A JP12453080A JPS6310779B2 JP S6310779 B2 JPS6310779 B2 JP S6310779B2 JP 55124530 A JP55124530 A JP 55124530A JP 12453080 A JP12453080 A JP 12453080A JP S6310779 B2 JPS6310779 B2 JP S6310779B2
Authority
JP
Japan
Prior art keywords
printed wiring
wiring board
marking
inspection
circuit pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55124530A
Other languages
Japanese (ja)
Other versions
JPS5749844A (en
Inventor
Yukio Uto
Yasuhiko Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55124530A priority Critical patent/JPS5749844A/en
Publication of JPS5749844A publication Critical patent/JPS5749844A/en
Publication of JPS6310779B2 publication Critical patent/JPS6310779B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

【発明の詳細な説明】 本発明は、印刷配線基板の回路パターン欠陥検
査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a circuit pattern defect inspection device for printed wiring boards.

通常回路パターン等の欠陥検査装置にはホトマ
スクのようなミクロパターンを持つものを除きパ
ターンの欠陥個所を明示するために、マーキング
を行う。
Normally, defect inspection devices for circuit patterns, etc., except for devices with micropatterns such as photomasks, use markings to clearly identify defective locations in the pattern.

これらの一般的なマーキング装置として、スプ
レーマーカやレーザーマーキング、インクジエツ
ト等があげられこれらは非接触によりマーキング
が行えるため、ステージを走査しながらパターン
の検査を行う装置においては好都合なものであ
る。
These general marking devices include spray markers, laser markings, ink jets, and the like, and because they can perform marking without contact, they are convenient for devices that inspect patterns while scanning a stage.

これらの装置の中には非常に高価なものや高圧
電源使用のために危険性が伴なうものがある。特
に印刷配線基板のパターン上には、スルホール等
の穴が存在するため、従来のインクジエツトやス
プレーマーカのようにインクを使用するものは、
インクがスルホール内に入つたりステージを汚し
たりする悪影響が存在した。
Some of these devices are very expensive and can be dangerous due to the use of high voltage power supplies. In particular, because there are holes such as through holes on the pattern of printed wiring boards, those that use ink such as conventional ink jets and spray markers
There were negative effects such as ink entering the through holes and staining the stage.

本発明の目的は、上記した従来技術の欠点をな
くし、周囲に悪影響を及ぼすことなく、安価でか
つ安全性を考慮し、しかも欠陥位置に正確にマー
キングができるようにしたマーキング装置を備え
付けた印刷配線基板の回路パターン欠陥検査装置
を提供するにある。
The purpose of the present invention is to eliminate the drawbacks of the above-mentioned prior art, to provide a printing machine equipped with a marking device that is inexpensive, takes safety into account, and can accurately mark defective positions without adversely affecting the surroundings. The present invention provides a circuit pattern defect inspection device for wiring boards.

即ち本発明は、上記目的を達成するために、印
刷配線基板上に形成された回路パターンの欠陥を
検査する装置において、上記回路パターンの像を
結像させる結像光学系と、該結像光学系によつて
結像された像を撮像する撮像装置とを備え付けた
検査ヘツドを印刷配線基板上を走査させて印刷配
線基板上に形成された回路パターンの欠陥を検査
する検査装置を設け、回転自在に支持され、且つ
インクを含み、欠陥か否かを識別できる刻印ゴム
と、該刻印ゴムを刷配線基板上の欠陥部に押し付
ける駆動装置と、該駆動装置を作動させないと
き、上記刻印ゴムを逃すばね部材とを備えた刻印
装置を上記検査装置の検査ヘツドに設置し、上記
検査装置が欠陥と検出された位置を記憶し、上記
検出ヘツドがこの記憶された欠陥位置に隣接した
走査線の位置に到達したとき上記駆動装置を作動
させる制御手段を設けたことを特徴とする印刷配
線板の回路パターン欠陥検査装置である。
That is, in order to achieve the above object, the present invention provides an apparatus for inspecting defects in a circuit pattern formed on a printed wiring board. An inspection device is provided that inspects defects in the circuit pattern formed on the printed wiring board by scanning the printed wiring board with an inspection head equipped with an imaging device that captures an image formed by the system, and A stamping rubber that is freely supported, contains ink, and can identify whether there is a defect; a drive device that presses the stamping rubber against a defective part on a printed circuit board; A marking device equipped with a release spring member is installed in the inspection head of the inspection device, the inspection device memorizes the position where a defect is detected, and the detection head detects a scanning line adjacent to the memorized defect position. A circuit pattern defect inspection apparatus for a printed wiring board is characterized in that it is provided with a control means for activating the drive device when the drive device reaches the position.

以下本発明を図に示す実施例にもとづいて説明
する。
The present invention will be explained below based on embodiments shown in the drawings.

まず第1図乃至第4図にもとづいて本発明の印
刷配線基板の回路パターン欠陥検査装置の一実施
例を具体的に説明する。
First, an embodiment of the circuit pattern defect inspection apparatus for printed wiring boards according to the present invention will be described in detail based on FIGS. 1 to 4.

各図において、1は軸心において刻印駆動機構
7が可動するようにした回転ローラにして、軸受
6によつて、回転出来るようになつている。2は
先端に刻印ゴム3を取り付けた刻印ヘツドにし
て、軸心にはインク溜め14が設けられインク1
3を溜められるようになつており、中空円筒形の
回転ローラー1の円周方向に沿つて、所定間隔で
多数個設置されてある。4は圧縮バネにして、刻
印の時以外に刻印ゴム3が印刷配線基板5に接し
ないよう常に刻印ヘツド2を中空円筒の中心方向
に押さえつけるものである。8は電磁ソレノイド
にして、刻印駆動機構7を押すことによつて、刻
印ゴム3を回転ローラー1の外周に突き出させ回
転ローラー1の回転によつて、印刷配線基板5と
接し、刻印するようにしたものである。9は中空
円筒の回転軸上にあつて、刻印ヘツドと同期して
多数個のスリツトを設けた回転円板である。10
は回転円板9に設けられたスリツトの通過を調べ
るためのリミツトセンサである。11は検出器本
体12の側面に穿設されたエアシリンダにして検
出器本体12により印刷配線基板5に欠陥がある
かどうか撮像装置16を含むパターン認識装置で
構成された検査装置(図示せず)によつて検査さ
れない時(ステージがスラスト方向32に走査す
る時も含む)は回転ローラ1は、印刷配線基板5
より離れるしくみにしてある。
In each figure, reference numeral 1 denotes a rotary roller around which a marking drive mechanism 7 is movable, and is rotatable by a bearing 6. 2 is an engraving head with an engraving rubber 3 attached to its tip, and an ink reservoir 14 is provided at the shaft center to hold the ink 1.
3, and a large number of rollers are installed at predetermined intervals along the circumferential direction of the hollow cylindrical rotating roller 1. Numeral 4 is a compression spring which always presses the stamping head 2 toward the center of the hollow cylinder so that the stamping rubber 3 does not come into contact with the printed wiring board 5 except during stamping. Reference numeral 8 is an electromagnetic solenoid, and by pushing the marking drive mechanism 7, the stamping rubber 3 is projected onto the outer periphery of the rotating roller 1, and as the rotating roller 1 rotates, it comes into contact with the printed wiring board 5 and is stamped. This is what I did. Reference numeral 9 denotes a rotating disk located on the rotating shaft of the hollow cylinder and provided with a large number of slits in synchronization with the marking head. 10
is a limit sensor for checking passage through a slit provided in the rotating disk 9. Reference numeral 11 denotes an air cylinder bored in the side of the detector body 12, and an inspection device (not shown) consisting of a pattern recognition device including an imaging device 16, which detects defects in the printed wiring board 5 using the detector body 12. ) (including when the stage scans in the thrust direction 32), the rotating roller 1 is inspected by the printed wiring board 5.
It is designed to move further away.

次に本実施例の作用を説明する。先ず印刷配線
基板5をステージ15上にセツト後、マーキング
装置本体を、エアーシリンダー11によつて印刷
配線基板5と回転ローラ1が接する様に下げる。
次に光源20、レンズ19、ハーフミラー18、
結像レンズ17及びTVカメラ、リニアイメージ
センサ等から形成される撮像装置16を備え付け
た検出器本体12に対してステージ15を走査す
ると共に上記検出器本体12と同様に構成された
基準検出器本体(図示せず)に対して基準導体パ
ターンを載置したステージ(図示せず)を走査し
上記検出器本体12の結像装置16から得られる
映像信号を2値絵素化してこの2値絵素化信号と
基準検出器本体の撮像装置から得られる映像信号
を2値絵素化してこの2値絵素化信号とを、パタ
ーン認識装置で構成された検査装置(図示せず)
により、位置合せ誤差及び量子化誤差を除いた状
態で比較してパターンマツチングをとり、印刷配
線基板5の導体のパターンに欠陥が存在するか否
か検査される。
Next, the operation of this embodiment will be explained. First, the printed wiring board 5 is set on the stage 15, and then the marking device body is lowered by the air cylinder 11 so that the printed wiring board 5 and the rotating roller 1 come into contact with each other.
Next, the light source 20, the lens 19, the half mirror 18,
The stage 15 is scanned with respect to the detector body 12 equipped with an imaging device 16 formed from an imaging lens 17 and a TV camera, a linear image sensor, etc., and a reference detector body configured similarly to the detector body 12 described above. A stage (not shown) on which a reference conductor pattern is mounted is scanned with respect to a reference conductor pattern (not shown), and a video signal obtained from the imaging device 16 of the detector main body 12 is converted into a binary picture element. An inspection device (not shown) comprising a pattern recognition device converts the image signal and the video signal obtained from the imaging device of the reference detector main body into binary picture elements, and converts the binary picture element signal into an inspection device (not shown).
By doing so, pattern matching is performed by comparing with alignment errors and quantization errors removed, and it is inspected whether or not there is a defect in the conductor pattern of the printed wiring board 5.

ステージ15が回転ローラ1のスラスト方向3
2に走査している時はエアーシリンダ11の作動
によりマーキング装置本体は上方に持ち上げられ
従つて、回転ローラ1と印刷配線基板5は接しな
い。第4図に示すように印刷配線基板5が走査線
方向31に走査されて図中Aにおいて、上記検査
装置によつて欠陥が発見されると、その方向にお
いて、場所を記憶し、検出器本体12が図中Bに
来た時に、少なくとも回転ローラ1は図中A上に
存在するのでこの時マーキングを行う。マーキン
グは、電磁ソレノイド8によつて刻印駆動機構7
を作動させ、これによつて、中空円筒の円周方向
に多数個設けられた刻印ヘツド2は中空円筒の内
側から一斉に外側に押し出され、中空円筒であ
る、回転ローラ1の外周より刻印ゴムが突き出
る。この時たまたま回転して印刷配線基板5に接
した刻印ゴム3によつて欠陥部へマーキングがさ
れる。マーキング解除は刻印ヘツド2と同期して
設けられた回転円板9上のスリツトをリミツトセ
ンサ10で検出すると同時に電磁ソレノイド8は
オフになり刻印駆動機構7による内側からの圧力
が無くなるため、刻印ヘツド2は圧縮バネ4によ
つて、中空円筒の内側に戻され、刻印ゴム3は回
転ローラ1の外周より中に引込むまた、回転円板
9に設けられたスリツトはマーキングが終了して
から、リミツトセンサ10に検出される様に、刻
印ヘツド2よりやや印刷配線基板5上に来るタイ
ミングを遅らしてある。さらにまた、欠陥部が回
転ローラ1を展開した時に等間隔で並んだ刻印ヘ
ツド2のピツチ上にあれば丁度欠陥上にマーキン
グが行なわれることになる。ピツチ上に無い場合
は欠陥の周辺にマーキングされることになるが、
これは刻印ヘツド2の取り付け間隔をせまくする
ことにより欠陥部からマーキング部までの位置誤
差は少なく出来る。
The stage 15 is in the thrust direction 3 of the rotating roller 1.
2, the main body of the marking device is lifted upward by the operation of the air cylinder 11, so that the rotating roller 1 and the printed wiring board 5 do not come into contact with each other. As shown in FIG. 4, when the printed wiring board 5 is scanned in the scanning line direction 31 and a defect is found by the inspection device at point A in the figure, the location is memorized in that direction and the detector body When 12 reaches B in the figure, at least the rotating roller 1 is present at A in the figure, so marking is performed at this time. The marking is performed by the marking drive mechanism 7 by the electromagnetic solenoid 8.
As a result, the stamping heads 2, which are provided in a large number in the circumferential direction of the hollow cylinder, are all pushed out from the inside of the hollow cylinder to the outside, and the stamping rubber is pushed out from the outer periphery of the rotary roller 1, which is a hollow cylinder. sticks out. At this time, the marking rubber 3 that happens to rotate and comes into contact with the printed wiring board 5 marks the defective part. To release the marking, the limit sensor 10 detects the slit on the rotary disk 9 provided in synchronization with the marking head 2. At the same time, the electromagnetic solenoid 8 is turned off and the pressure from the inside by the marking drive mechanism 7 is eliminated, so that the marking head 2 is returned to the inside of the hollow cylinder by the compression spring 4, and the marking rubber 3 is pulled in from the outer periphery of the rotating roller 1. Furthermore, the slit provided in the rotating disk 9 is inserted into the limit sensor 10 after marking is completed. The timing at which the marking head comes onto the printed wiring board 5 is delayed slightly from that of the marking head 2 so that it can be detected. Furthermore, if the defective part is located on the pitch of the marking heads 2 arranged at equal intervals when the rotating roller 1 is unfolded, marking will be performed exactly on the defective part. If it is not on the pitch, it will be marked around the defect.
By narrowing the mounting interval of the marking heads 2, the positional error from the defective part to the marking part can be reduced.

次に本発明の印刷配線基板の回路パターン欠陥
検査装置の他の一実施例を第5図及び第6図にも
とづいて具体的に説明する。
Next, another embodiment of the printed wiring board circuit pattern defect inspection apparatus of the present invention will be described in detail with reference to FIGS. 5 and 6.

25は、刻印ヘツドにして、回転ローラ22を
軸24、軸受23によつて支持してある。回転ロ
ーラ22はインクパツド21、パツドホルダ34
より成る。刻印ヘツド25は、電磁ソレノイド2
8と連結され電磁ソレノイド28を作動すること
により、ガイド27の内面をスライドするように
してある。
25 is a marking head, and the rotary roller 22 is supported by a shaft 24 and a bearing 23. The rotating roller 22 has an ink pad 21 and a pad holder 34.
Consists of. The marking head 25 is an electromagnetic solenoid 2.
8 and operates an electromagnetic solenoid 28 to slide on the inner surface of the guide 27.

更にガイド27には刻印ヘツド25の回転防止
のためのピン26がスライド出来るよう切り欠き
を施してある。また、引張りバネ29は刻印ヘツ
ド25のカウンタバランスであり、調整ネジ30
を回すことによつて、引張りバネ29の強度を調
整出来るようにしてある。
Further, the guide 27 is provided with a notch so that a pin 26 for preventing rotation of the marking head 25 can be slid therein. Further, the tension spring 29 is a counterbalance for the marking head 25, and the adjustment screw 30
By turning , the strength of the tension spring 29 can be adjusted.

次にこの実施例の作用を説明する。先ず印刷配
線基板5をステージ15上にセツト後、電磁ソレ
ノイド28が作動の状態でインクパツド21が印
刷配線基板5に接触するようにし、電磁ソレノイ
ド28が作動してない状態において、刻印ヘツド
25が鉛直上方に戻るように調整ネジ30を回し
て、引張りバネ29の強度を調整する。次にステ
ージ15を走査して検出器本体12の撮像装置1
6により印刷配線基板5の導体パターンを撮像
し、上記撮像装置16から得られる映像信号を2
値絵素化処理してパターン認識装置によつて形成
された検査装置(図示せず)によつて基準導体パ
ターンの2値絵素化信号と比較して上記導体パタ
ーンに欠陥が存在するか否かを検査する。回転ロ
ーラ22に取り付けてあるインクパツド21に
は、インクをしみこませてあるため、通常、ステ
ージ15の走査中はインクパツド21と印刷配線
基板5は非接触の状態にある。第4図に示すよう
に図中Aにおいて欠陥が発見されると、その方向
において、場所を記憶し、検出器本体12が図中
Bに達した時少なくとも回転ローラ22は図中A
上に存在するのこの時マーキングを行う。実際に
は、ステージの走査速度に合わせて、欠陥部にマ
ーキングするようにマーキング指令のタイミング
を合わせる必要がある。マーキングは、電磁ソレ
ノイド28によつて、刻印ヘツド25を作動さ
せ、回転ローラ22に取り付けてあるインクパツ
ド21を印刷配線基板5に接触させて行う。マー
キング中は印刷配線基板5の走査により回転ロー
ラ22も一緒に回転するため印刷配線基板を傷つ
ける心配はない。
Next, the operation of this embodiment will be explained. First, after setting the printed wiring board 5 on the stage 15, the ink pad 21 is brought into contact with the printed wiring board 5 while the electromagnetic solenoid 28 is activated, and the marking head 25 is made vertical when the electromagnetic solenoid 28 is not activated. Adjust the strength of the tension spring 29 by turning the adjustment screw 30 upward. Next, the stage 15 is scanned to capture the image pickup device 1 of the detector body 12.
6 images the conductor pattern of the printed wiring board 5, and the video signal obtained from the imaging device 16 is taken by 2.
An inspection device (not shown) formed by a pattern recognition device performs value pixel processing and compares it with a binary pixelized signal of the reference conductor pattern to determine whether or not there is a defect in the conductive pattern. Inspect whether Since the ink pad 21 attached to the rotating roller 22 is impregnated with ink, the ink pad 21 and the printed wiring board 5 are normally in a non-contact state while the stage 15 is scanning. As shown in FIG. 4, when a defect is found at point A in the figure, the location is memorized in that direction, and when the detector main body 12 reaches point B in the figure, at least the rotating roller 22 is moved to point A in the figure.
Marking is done at this time. In reality, it is necessary to match the timing of the marking command to mark the defective part in accordance with the scanning speed of the stage. Marking is performed by activating the marking head 25 by the electromagnetic solenoid 28 and bringing the ink pad 21 attached to the rotating roller 22 into contact with the printed wiring board 5. During marking, as the printed wiring board 5 is scanned, the rotating roller 22 also rotates, so there is no fear of damaging the printed wiring board.

また、電磁ソレノイド28に与える電流の供給
時間を変えることによりマーキング時間も可変出
来る。
Further, by changing the supply time of the current given to the electromagnetic solenoid 28, the marking time can also be varied.

以上説明したように本発明によれば、スルホー
ル等の穴が多数個設けられた印刷配線基板に対し
て、検査装置により検査された欠陥部の表示、即
ちマーキングを上記穴内にインクが入り込むこと
なく、簡単な機構によつて実現することができる
効果を奏する。
As explained above, according to the present invention, defective parts inspected by an inspection device can be displayed, that is, marked, on a printed circuit board having a large number of holes such as through holes, without ink entering the holes. , the effect can be achieved by a simple mechanism.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の印刷配線基板の回路パターン
欠陥検査装置の一実施例を示す断面図、第2図は
第1図に示すマーキング装置の回転ローラを示す
断面図、第3図は第1図に示すマーキング装置の
刻印ヘツドを示す拡大図、第4図は第1図に示す
検出器本体の走査路を示す図、第5図は本発明の
印刷配線基板の回路パターン欠陥検査装置の他の
一実施例を示す断面図、第6図は第5図に示すマ
ーキング装置の側面断面図である。 符号の説明、1……回転ローラ、2……刻印ヘ
ツド、3……刻印ゴム、4……圧縮バネ、5……
印刷配線基板、6……軸受、7……刻印駆動機
構、8……電磁ソレノイド、9……回転円板、1
0……リミツトセンサ、11……エアシリンダ、
12……検出器本体、13……インク、14……
インク溜め、15……走査ステージ。
FIG. 1 is a cross-sectional view showing an embodiment of the circuit pattern defect inspection device for printed wiring boards of the present invention, FIG. 2 is a cross-sectional view showing a rotating roller of the marking device shown in FIG. 1, and FIG. FIG. 4 is an enlarged view showing the marking head of the marking device shown in the figure, FIG. 4 is a view showing the scanning path of the detector main body shown in FIG. 1, and FIG. FIG. 6 is a side sectional view of the marking device shown in FIG. 5. Explanation of symbols, 1... Rotating roller, 2... Engraving head, 3... Engraving rubber, 4... Compression spring, 5...
Printed wiring board, 6...bearing, 7...engraving drive mechanism, 8...electromagnetic solenoid, 9...rotating disk, 1
0...Limit sensor, 11...Air cylinder,
12...Detector body, 13...Ink, 14...
Ink reservoir, 15...scanning stage.

Claims (1)

【特許請求の範囲】[Claims] 1 印刷配線基板上に形成された回路パターンの
欠陥を検査する装置において、上記回路パターン
の像を結像させる結像光学系と、該結像光学系に
よつて結像された像を撮像する撮像装置とを備え
付けた検査ヘツドを印刷配線基板上を走査させて
印刷配線基板上に形成された回路パターンの欠陥
を検査する検査装置を設け、回転自在に支持さ
れ、且つインクを含み、欠陥か否かを識別できる
刻印ゴムと、該刻印ゴムを刷配線基板上の欠陥部
に押し付ける駆動装置と、該駆動装置を作動させ
ないとき、上記刻印ゴムを逃すばね部材とを備え
た刻印装置を上記検査装置の検査ヘツドに設置
し、上記検査装置が欠陥と検出された位置を記憶
し、上記検出ヘツドがこの記憶された欠陥位置に
隣接した走査線の位置に到達したとき上記駆動装
置を作動させる制御手段を設けたことを特徴とす
る印刷配線板の回路パターン欠陥検査装置。
1. In an apparatus for inspecting defects in a circuit pattern formed on a printed wiring board, an imaging optical system forms an image of the circuit pattern, and an image formed by the imaging optical system is imaged. An inspection device is provided for inspecting defects in a circuit pattern formed on a printed wiring board by scanning an inspection head equipped with an imaging device over a printed wiring board, the inspection device is rotatably supported, contains ink, and detects defects. The above-mentioned inspection of the stamping device includes a stamping rubber that can identify whether or not the stamping rubber is defective, a drive device that presses the stamping rubber against a defective part on a printed wiring board, and a spring member that releases the stamping rubber when the drive device is not operated. A control installed in an inspection head of the device, which stores a position where the inspection device detects a defect, and operates the drive device when the detection head reaches a position on a scanning line adjacent to the memorized defect position. 1. A circuit pattern defect inspection device for a printed wiring board, characterized in that a circuit pattern defect inspection device is provided.
JP55124530A 1980-09-10 1980-09-10 Inspecting device for defect of circuit pattern on printed circuit board Granted JPS5749844A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55124530A JPS5749844A (en) 1980-09-10 1980-09-10 Inspecting device for defect of circuit pattern on printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55124530A JPS5749844A (en) 1980-09-10 1980-09-10 Inspecting device for defect of circuit pattern on printed circuit board

Publications (2)

Publication Number Publication Date
JPS5749844A JPS5749844A (en) 1982-03-24
JPS6310779B2 true JPS6310779B2 (en) 1988-03-09

Family

ID=14887750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55124530A Granted JPS5749844A (en) 1980-09-10 1980-09-10 Inspecting device for defect of circuit pattern on printed circuit board

Country Status (1)

Country Link
JP (1) JPS5749844A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63293064A (en) * 1987-05-27 1988-11-30 Ricoh Co Ltd How to apply droplets to the surface of an object
JPS63296182A (en) * 1987-05-27 1988-12-02 Kiyoei Kk Stamp reader
IT1273339B (en) * 1994-02-24 1997-07-08 Circuit Line Spa MARKING SYSTEM FOR PRINTED CIRCUITS
US6871684B2 (en) * 2002-08-13 2005-03-29 The Boeing Company System for identifying defects in a composite structure

Also Published As

Publication number Publication date
JPS5749844A (en) 1982-03-24

Similar Documents

Publication Publication Date Title
US11559979B2 (en) Method of printing objects in a pad printing machine in two stages
FI78025B (en) FOERFARANDE FOER KVALITETSKONTROLL AV TRYCKNING.
US6286202B1 (en) System for mounting a plurality of circuit components on a circuit substrate
US6552352B2 (en) Aligner
JP2001062995A (en) Screen printing machine
JPH10250042A (en) Method and device for monitoring printing
TWI253887B (en) Method for optically inspecting appearance, and apparatus for optically inspecting appearance
JP2009276522A (en) Image recording device
JPS6310779B2 (en)
KR20190099496A (en) Control device and inspection device
JP4302234B2 (en) Mounting parts inspection device
JPH05501835A (en) Control system for spark discharge recording head
US6792861B2 (en) Image recorder with recording material feed unit
JPH07162200A (en) Method and apparatus for mounting electronic part
JP4449340B2 (en) Screen printing machine
KR200366087Y1 (en) wafer leveling device of align & exposure
JPH072912U (en) Printed circuit board inspection equipment
JP3184339B2 (en) Screen printing device with paste cover
JPS6411404B2 (en)
JPH0345709B2 (en)
US12370816B2 (en) Support unit and printing system
JPH0543416Y2 (en)
JPH02253956A (en) Printing method and printing press
ES2057229T3 (en) OPTOELECTRONIC ADJUSTMENT PROCEDURE AND DEVICE FOR AUTOMATIC POSITIONING, DIRECTED BY A COMPUTER, OF THE PRINTING TEMPLATES OF A ROTARY PRINTING MACHINE FOR SERIGRAPHY.
JPS583298Y2 (en) Substrate holder for electron beam exposure