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JPH0124536B2 - - Google Patents
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JPH0124536B2 - - Google Patents

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Publication number
JPH0124536B2
JPH0124536B2 JP510882A JP510882A JPH0124536B2 JP H0124536 B2 JPH0124536 B2 JP H0124536B2 JP 510882 A JP510882 A JP 510882A JP 510882 A JP510882 A JP 510882A JP H0124536 B2 JPH0124536 B2 JP H0124536B2
Authority
JP
Japan
Prior art keywords
electrode
substrate
film
electrodes
glow discharge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP510882A
Other languages
Japanese (ja)
Other versions
JPS58122038A (en
Inventor
Yoshihiro Hamakawa
Yasunori Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP510882A priority Critical patent/JPS58122038A/en
Publication of JPS58122038A publication Critical patent/JPS58122038A/en
Publication of JPH0124536B2 publication Critical patent/JPH0124536B2/ja
Granted legal-status Critical Current

Links

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  • Chemical Vapour Deposition (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)

Description

【発明の詳細な説明】 この発明は薄膜生成装置、特にグロー放電によ
る薄膜生成装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thin film production device, and particularly to a thin film production device using glow discharge.

周知のようにグロー放電による薄膜の生成は、
低圧力のガス中でグロー放電を行なわせ、これに
よりガス分子を分解し、基板の表面に被着させる
ようにしたものである。従来ではこの種装置とし
て、平行平板型の一対の電極を用い、一方の電極
に基板をとりつけるか、或いは平行平板の電極と
格子状電極を用い、この格子状電極の後方に基板
を配置させ、各電極間でグロー放電を発生するよ
うにしたものが使用されていた。
As is well known, the formation of thin films by glow discharge is
Glow discharge is performed in a low-pressure gas, thereby decomposing gas molecules and depositing them on the surface of the substrate. Conventionally, this type of device uses a pair of parallel plate electrodes and attaches a substrate to one of the electrodes, or uses a parallel plate electrode and a grid electrode, and places the substrate behind the grid electrode. A device that generates a glow discharge between each electrode was used.

しかし前者の構成によると、電極上に基板がと
りつけられているため、電極間に生じたプラズマ
中に基板がさらされるため、高エネルギーの粒子
が衝突し、生成された膜が損傷する恐れがある。
この点後者の構成によれば基板は格子状電極の後
方に位置しているので高エネルギー粒子の衝突に
よる膜の損傷は少ないが、反面膜の基板への付着
量したがつて膜厚を制御することが困難となる。
However, according to the former configuration, since the substrate is attached to the electrodes, the substrate is exposed to the plasma generated between the electrodes, so there is a risk that high-energy particles will collide and damage the produced film. .
In this respect, according to the latter configuration, since the substrate is located behind the grid electrode, there is less damage to the film due to collisions with high-energy particles, but on the other hand, the amount of film attached to the substrate and therefore the film thickness can be controlled. This becomes difficult.

この発明は高エネルギー粒子の入射を避けると
ともに、基板に入射する荷電粒子のエネルギーの
制御を可能にして、膜特性の制御を可能にするこ
とを目的とする。
It is an object of the present invention to avoid the incidence of high-energy particles and to enable control of the energy of charged particles incident on a substrate, thereby enabling control of film characteristics.

この発明の実施例を図によつて説明する。1は
真空槽で、真空バルブ2を介して真空ポンプ等に
より真空化(たとえば10-6Torr程度の真空度)
される。真空槽1内にはガス管3によりガス流量
を調整する調整バルブ4を介して、生成しようと
する膜に対応するガスが供給される。たとえばSi
膜を生成しようとするときはSiH4等のガスが供
給される。5は表面に膜を付着させようとする薄
膜被着体たとえば半導体装置用の基板で、基板支
持台6に支持されてあり、7は基板5を加熱する
ためのヒータである。
Embodiments of the invention will be described with reference to the drawings. 1 is a vacuum chamber, which is evacuated by a vacuum pump or the like via vacuum valve 2 (e.g., vacuum degree of about 10 -6 Torr)
be done. A gas corresponding to the film to be produced is supplied into the vacuum chamber 1 through a gas pipe 3 through an adjustment valve 4 that adjusts the gas flow rate. For example, Si
When a film is to be produced, a gas such as SiH 4 is supplied. Reference numeral 5 designates a thin film adherend, such as a substrate for a semiconductor device, on the surface of which a film is to be adhered, and is supported by a substrate support 6. Reference numeral 7 designates a heater for heating the substrate 5.

8,9はグロー放電用の電極で、両電極間にグ
ロー放電を発生するための電源(図の例では直流
電源であるが高周波電源でもよい。)10が接続
されてある。図の例では、両電極8,9のうちの
一方の電極として平等電界を形成するのに適した
ロゴスキー型(近似ロゴスキー型を含む。以下同
じ。)の電極を使用する。この種の電極は周辺部
の電界集中を避けるために適当な丸味をもたせた
構造とされている。陽極となる電極8についてロ
ゴスキー型の電極を使用している。他方の電極9
は格子状とされている。これはプラズマによつて
イオン化された荷電粒子が基板5に向かつて飛行
しやすいようにするためである。
Reference numerals 8 and 9 denote electrodes for glow discharge, and a power source (in the illustrated example, a DC power source is used, but a high frequency power source may be used) 10 is connected between the two electrodes for generating glow discharge. In the illustrated example, a Rogowski-type (including approximate Rogowski-type; the same applies hereinafter) electrode suitable for forming an equal electric field is used as one of the electrodes 8 and 9. This type of electrode has a structure with an appropriate roundness to avoid electric field concentration in the peripheral area. A Rogowski type electrode is used as the electrode 8 serving as an anode. the other electrode 9
is said to be grid-like. This is to make it easier for charged particles ionized by the plasma to fly toward the substrate 5.

基板5と電極9との間にバイアス用の電極11
が配置されてある。電極11は格子状とされてあ
り、ここに与える電位によつて基板5に向う荷電
粒子を制御する。たとえば多量の荷電粒子(たと
えば正のイオン)を基板5に入射させたい場合は
負の電位を与えればよいし、入射量を減少させた
い場合は零又は正の電位を与えればよい。
A bias electrode 11 is provided between the substrate 5 and the electrode 9.
is placed. The electrode 11 has a grid shape, and the charged particles directed toward the substrate 5 are controlled by the potential applied thereto. For example, if a large amount of charged particles (for example, positive ions) are to be incident on the substrate 5, a negative potential may be applied, and if it is desired to reduce the amount of incident, a zero or positive potential may be applied.

以上の構成において、両電極8,9間に電源1
0の電圧を印加すると、グロー放電を起こしてプ
ラズマが発生する。これによつてガス管3を通し
て供給されるガスが分解されイオン化(たとえば
正のイオン)される。このとき分解されイオン化
されたガスは、負電圧が印加されている電極9の
格子をくぐつてその後方に位置する基板5の表面
に膜としてたい積するようになる。この場合電極
上に基板が存在していないため、生成される膜
は、放電により発生した高エネルギ粒子にさらさ
れることがないため損傷されることがなく、これ
によつて良質な膜が生成されるようになる。又バ
イアス用の電極11を電極9と基板との間に配置
してあるので、膜の形成に重要な役割をもつ荷電
粒子の基板5への入射を制御することができ、所
望の性質の膜を生成することができるようにな
る。
In the above configuration, the power source 1 is connected between both electrodes 8 and 9.
When a voltage of 0 is applied, glow discharge occurs and plasma is generated. As a result, the gas supplied through the gas pipe 3 is decomposed and ionized (for example, into positive ions). At this time, the decomposed and ionized gas passes through the grid of the electrode 9 to which a negative voltage is applied, and is deposited as a film on the surface of the substrate 5 located behind it. In this case, since there is no substrate on the electrode, the produced film is not exposed to high-energy particles generated by the discharge and is therefore not damaged, resulting in a high-quality film. Become so. Furthermore, since the bias electrode 11 is disposed between the electrode 9 and the substrate, it is possible to control the incidence of charged particles, which play an important role in film formation, on the substrate 5, thereby forming a film with desired properties. will be able to generate.

なお、この実施例では、一方の電極としてロゴ
スキー型の電極を用いているので、通常の平行平
板電極を使用した場合に比較して均一な電界が得
られるようになり、したがつて発生するプラズマ
に一様性をもたせることができ、均質な膜が生成
できるようになる。この場合集中電界を生じない
ことから、電極からイオン、電子等の衝突により
電極を形成する物質を放出してこれが膜に入るこ
ともなくなるようになる。
In addition, in this example, a Rogowski-type electrode is used as one electrode, so a more uniform electric field can be obtained compared to the case where a normal parallel plate electrode is used. The plasma can be made uniform and a homogeneous film can be produced. In this case, since a concentrated electric field is not generated, substances forming the electrodes are not ejected from the electrodes due to collisions of ions, electrons, etc., and the substances that form the electrodes do not enter the membrane.

更に、図のように基板5を上部に設けておく
と、電極からの溶解物が落下しても、膜内に入る
ことがなく都合がよい。
Furthermore, if the substrate 5 is provided on top as shown in the figure, even if the melt from the electrode falls, it will not enter the membrane, which is convenient.

以上詳述したようにこの発明によれば、グロー
放電によつてガスを分解して基板上に膜を生成す
るにあたり、高エネルギー粒子の入射を回避でき
るので良質な膜を生成することができるし、バイ
アス用の電極を使用しているので、膜特性の制御
が可能となるといつた効果を奏する。
As detailed above, according to the present invention, when gas is decomposed by glow discharge to form a film on a substrate, it is possible to avoid the incidence of high-energy particles, thereby making it possible to produce a high-quality film. Since a bias electrode is used, it is possible to control the film characteristics, which is advantageous.

【図面の簡単な説明】[Brief explanation of drawings]

図はこの発明の一実施例を示す断面図である。 1……真空槽、3……ガス管、5……薄膜被着
体、8……ロゴスキー型の電極、10……電源、
11……バイアス用の電極。
The figure is a sectional view showing an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Vacuum chamber, 3... Gas pipe, 5... Thin film adherend, 8... Rogowski type electrode, 10... Power supply,
11...Electrode for bias.

Claims (1)

【特許請求の範囲】[Claims] 1 グロー放電によるプラズマを発生させる一対
の電極としてその一方を格子状の電極としてな
り、前記格子状の電極の後方に薄膜被着体を配置
するとともに、前記格子状の電極と前記薄膜被着
体との間にバイアス用の格子状の電極を設置して
なる薄膜生成装置。
1 A pair of electrodes for generating plasma by glow discharge, one of which is a lattice-shaped electrode, a thin film adherend is arranged behind the lattice-shaped electrode, and the lattice-shaped electrode and the thin film adherend A thin film generation device consisting of a bias grid-shaped electrode installed between the
JP510882A 1982-01-16 1982-01-16 Forming device for thin film Granted JPS58122038A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP510882A JPS58122038A (en) 1982-01-16 1982-01-16 Forming device for thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP510882A JPS58122038A (en) 1982-01-16 1982-01-16 Forming device for thin film

Publications (2)

Publication Number Publication Date
JPS58122038A JPS58122038A (en) 1983-07-20
JPH0124536B2 true JPH0124536B2 (en) 1989-05-12

Family

ID=11602157

Family Applications (1)

Application Number Title Priority Date Filing Date
JP510882A Granted JPS58122038A (en) 1982-01-16 1982-01-16 Forming device for thin film

Country Status (1)

Country Link
JP (1) JPS58122038A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH077745B2 (en) * 1984-01-11 1995-01-30 株式会社ダイヘン Photovoltaic device manufacturing equipment
JP5282538B2 (en) * 2008-11-18 2013-09-04 富士電機株式会社 Capacitively coupled plasma CVD equipment

Also Published As

Publication number Publication date
JPS58122038A (en) 1983-07-20

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