JPH0156549B2 - - Google Patents
Info
- Publication number
- JPH0156549B2 JPH0156549B2 JP55006686A JP668680A JPH0156549B2 JP H0156549 B2 JPH0156549 B2 JP H0156549B2 JP 55006686 A JP55006686 A JP 55006686A JP 668680 A JP668680 A JP 668680A JP H0156549 B2 JPH0156549 B2 JP H0156549B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- wavelength
- laser element
- photoreceptor
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K15/00—Arrangements for producing a permanent visual presentation of the output data, e.g. computer output printers
- G06K15/02—Arrangements for producing a permanent visual presentation of the output data, e.g. computer output printers using printers
- G06K15/12—Arrangements for producing a permanent visual presentation of the output data, e.g. computer output printers using printers by photographic printing, e.g. by laser printers
- G06K15/1204—Arrangements for producing a permanent visual presentation of the output data, e.g. computer output printers using printers by photographic printing, e.g. by laser printers involving the fast moving of an optical beam in the main scanning direction
- G06K15/1209—Intensity control of the optical beam
- G06K15/1214—Intensity control of the optical beam by feedback
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Optical Head (AREA)
- Semiconductor Lasers (AREA)
Description
【発明の詳細な説明】
本発明は半導体レーザ素子の出射ビーム波長の
温度依存性を、光検出器と感熱素子で補正する半
導体レーザ装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor laser device that corrects the temperature dependence of the wavelength of an emitted beam from a semiconductor laser device using a photodetector and a heat-sensitive element.
半導体レーザ装置を画像記録等に用いる場合
は、装置に使われる感光体の感度の波長依存性が
大きな問題となる。通常のHe−Neレーザのよう
な短い波長のレーザではレーザ波長に対して感光
体の感度はフラツトのものが多く非常に使い易
い。 When a semiconductor laser device is used for image recording or the like, the wavelength dependence of the sensitivity of the photoreceptor used in the device poses a major problem. With a short wavelength laser such as a normal He--Ne laser, the sensitivity of the photoreceptor is often flat with respect to the laser wavelength, making it very easy to use.
一方半導体レーザ素子より出射される半導体レ
ーザは波長が8000Å前後とHe−Neレーザに比べ
ると長い為、通常使われる感光体では感度があま
りない。この半導体レーザをこのような画像記録
装置に用いる場合は感光体を増感して使う事が多
い。しかし増感しても感度は画質の安定性、感光
体の耐久等考慮すると、実用可能な所は8000Åあ
たりで波長に対して勾配をもつようになる。 On the other hand, the wavelength of the semiconductor laser emitted from the semiconductor laser element is around 8000 Å, which is longer than that of the He-Ne laser, so the sensitivity of the photoreceptor normally used is not very high. When this semiconductor laser is used in such an image recording device, the photoreceptor is often sensitized. However, even if sensitized, the sensitivity will have a gradient with respect to the wavelength at around 8000 Å where it is practical, taking into consideration the stability of image quality and the durability of the photoreceptor.
それ故使用する半導体レーザの波長により必要
光量が異なるので動作中波長変動が生ずると
APC(AUTO POWER CONTROL)方式では
良い画像は得られない。 Therefore, the amount of light required varies depending on the wavelength of the semiconductor laser used, so if wavelength fluctuations occur during operation,
Good images cannot be obtained using the APC (AUTO POWER CONTROL) method.
一例を述べると半導体レーザは2.5〜3.0Åの波
長の温度係数があり30℃の温度変化があると
Max.90Åの波長変化が生ずる。この為感光体の
感度の波長依存性が高ければ高い程、得られる画
像は悪くなる。 To give an example, a semiconductor laser has a temperature coefficient at a wavelength of 2.5 to 3.0 Å, and if there is a temperature change of 30°C,
A wavelength change of up to 90 Å occurs. Therefore, the higher the wavelength dependence of the sensitivity of the photoreceptor, the worse the obtained image becomes.
一方冷却素子を用いて半導体レーザ素子を一定
温度で使用する方法もあるが構成素子数が多くコ
ストアツプになつている。 On the other hand, there is a method of using a semiconductor laser element at a constant temperature using a cooling element, but this method requires a large number of components and increases costs.
本発明は上述の如き欠点を取り除くものにし
て、レーザ光量を常に最適値に保つことが出来る
半導体レーザ装置を提供するものである。 The present invention eliminates the above-mentioned drawbacks and provides a semiconductor laser device that can always maintain the amount of laser light at an optimum value.
すなわち光源の温度をより忠実に伝える場所に
サーミスタのような温度により抵抗変化を示す感
熱素子を設置し、光源からの光を受光する光検出
器からの出力をとり出す回路に感熱素子をつなぎ
温度変化により波長変動が生じた時にその波長に
対応する必要光量が得られる様に情報をフイード
バツクする事により常に最適光量を維持できるよ
うにしたものである。 In other words, a heat-sensitive element such as a thermistor whose resistance changes depending on the temperature is installed in a place that more faithfully transmits the temperature of the light source, and the heat-sensitive element is connected to a circuit that extracts the output from a photodetector that receives light from the light source. By feeding back information so that when a wavelength fluctuation occurs due to a wavelength change, the necessary light amount corresponding to that wavelength can be obtained, the optimum light amount can always be maintained.
これにより例え感光体に感度の波長依存性があ
つても、感熱素子の抵抗値の温度係数を適当に選
べば、常に最適光量で画像記録が可能となる。 As a result, even if the sensitivity of the photoreceptor has wavelength dependence, by appropriately selecting the temperature coefficient of the resistance value of the heat-sensitive element, it is possible to always record an image with the optimum amount of light.
第1〜2図は本発明の実施例を示すものであ
る。第1図において1はフロントビームL1、バ
ツクビームL2を出射する半導体レーザ素子、2
は金属から成り半導体レーザ素子を支持するレー
ザマウント(支持部材)、3は半導体レーザ素子
の温度変化に応じて抵抗変化を示す感熱素子、例
えばサーミスターであり、前記支持部材2に設け
た穴に導熱性接着剤4により固着固定されている
が、前記半導体レーザ素子1上に固定してもよい
ものである。5は半導体レーザ素子の記録に使用
しない側のレーザビームすなわちバツクビーム
L2を受けとる光検出器であり、光検出器5の受
光面はバツクビームL2に対して非垂直となる如
く傾けて前記支持部材2上に固定して設けてあ
る。 1 and 2 show embodiments of the present invention. In FIG. 1, 1 is a semiconductor laser element that emits a front beam L 1 and a back beam L 2 ;
3 is a laser mount (support member) made of metal and supports the semiconductor laser element; 3 is a heat-sensitive element, such as a thermistor, which shows a resistance change according to the temperature change of the semiconductor laser element; Although it is firmly fixed with the heat conductive adhesive 4, it may also be fixed on the semiconductor laser element 1. 5 is the laser beam on the side not used for recording of the semiconductor laser element, that is, the back beam
The photodetector 5 is a photodetector for receiving the back beam L2 , and the light receiving surface of the photodetector 5 is fixedly provided on the support member 2 with the light receiving surface tilted so as not to be perpendicular to the back beam L2.
第2図に示す如く、前記光検出器5には直列に
抵抗6(抵抗値Rs)が接続され、この光検出器
5と抵抗6と並列に感熱素子3(抵抗値RTH)が
接続される。 As shown in FIG. 2, a resistor 6 (resistance value Rs) is connected in series to the photodetector 5, and a heat sensitive element 3 (resistance value R TH ) is connected in parallel to the photodetector 5 and the resistor 6. Ru.
この光検出器5の端子T1には誤差アンプの入
力IN1が接続され、誤差アンプIN2と端子T2
の間には基準電位源8が接続されている。 The input IN1 of the error amplifier is connected to the terminal T1 of this photodetector 5, and the input IN1 of the error amplifier IN2 and the terminal T2 are connected to the terminal T1 of the photodetector 5.
A reference potential source 8 is connected between them.
レーザ素子1からのバツクビームL2が光検出
器5にあたると電流I1が流れる。そうするとサ
ーミスタ3間の端子電圧V1はI1RTHとなり基準電
圧V0と比較され、V1がV0になるようレーザ素子
1を発光駆動するレーザ駆動回路9に信号がフイ
ードバツクされレーザ素子1へ供給する電流を制
御する。 When the back beam L2 from the laser element 1 hits the photodetector 5, a current I1 flows. Then, the terminal voltage V 1 across the thermistor 3 becomes I 1 R TH and is compared with the reference voltage V 0 , and a signal is fed back to the laser drive circuit 9 which drives the laser element 1 to emit light so that V 1 becomes V 0 . Controls the current supplied to the
本発明の半導体レーザ装置は半導体レーザ素子
1の温度上昇により波長が変動し必要光量が変つ
ても、感温素子3の温度変化量でレーザ出力が常
に最適値に補正される。 In the semiconductor laser device of the present invention, even if the wavelength changes and the required light amount changes due to an increase in the temperature of the semiconductor laser element 1, the laser output is always corrected to the optimum value based on the amount of temperature change of the temperature sensing element 3.
さらに詳しく述べるならば
まずフロントビームを照射する不図示の感光体
の感度を測定し、レーザ波長λ対必要光量Pを求
める。その一例を第3図に示す。 To explain in more detail, first, the sensitivity of a photoreceptor (not shown) to which the front beam is irradiated is measured, and the laser wavelength λ versus the required light amount P is determined. An example is shown in FIG.
次に半導体レーザの波長の温度係数△λ/△T
を求める。これらの結果により使用温度範囲での
波長の変動量、さらには、必要光量の変化量がわ
かる。それ故波長の変化分だけ必要光量を補正す
ればよい。 Next, the temperature coefficient of the wavelength of the semiconductor laser △λ/△T
seek. From these results, it is possible to determine the amount of change in wavelength within the operating temperature range, as well as the amount of change in the required amount of light. Therefore, it is only necessary to correct the required light amount by the change in wavelength.
この補正は次の通りである。 This correction is as follows.
I1RTH=V0の関係が常に維持されるように回路
は動作するので、第3図の感光体の感度カーブを
補正するようにサーミスタの抵抗値RTHが温度に
より変われば良い。その為にはサーミスタの抵抗
の温度係数(B定数)を装置の使用温度範囲例え
ば10〜40℃で求めれば良い。 Since the circuit operates so that the relationship I 1 R TH =V 0 is always maintained, the resistance value R TH of the thermistor only needs to change depending on the temperature so as to correct the sensitivity curve of the photoreceptor shown in FIG. For this purpose, the temperature coefficient (B constant) of the resistance of the thermistor may be determined within the operating temperature range of the device, for example, 10 to 40°C.
今、RTH10℃/RTH40℃=2.0とすると からBを求めると2000Kとなる。 Now, if R TH 10℃/R TH 40℃=2.0 Find B from 2000K.
すなわち2000KのB定数を有するサーミスター
をレーザマウント内に設置すれば適正光量が得ら
れる事となる。 In other words, if a thermistor with a B constant of 2000K is installed in the laser mount, an appropriate amount of light can be obtained.
尚、サーミスターのB定数は任意の数値を得る
ことはできないがサーミスターと固定抵抗を組合
せれば各種B定数を得る事は可能であるのでレー
ザ素子が2.5〜3.0Å/℃の波長の温度係数をもつ
ていても、かつドラム感度が異なつても十分に対
応できる。又、サーミスターの抵抗の温度変化は
リニアではないが30℃程度の温度変動では実質上
問題はない。 Although it is not possible to obtain an arbitrary value for the B constant of a thermistor, it is possible to obtain various B constants by combining a thermistor and a fixed resistor. Even if the drum has different coefficients and drum sensitivities are different, it can be sufficiently handled. Also, although the temperature change in the thermistor's resistance is not linear, there is virtually no problem with temperature fluctuations of about 30°C.
以上説明したように本発明によるならば半導体
レーザ素子の波長変化に伴い必要光量が変動して
も光検出器と感熱素子により常に適正値にレーザ
出力をシフトさせる事ができる。 As explained above, according to the present invention, even if the required amount of light changes due to changes in the wavelength of the semiconductor laser element, the laser output can always be shifted to an appropriate value using the photodetector and the thermosensitive element.
これにより環境変動あるいは半導体レーザ素子
の自己発熱により半導体レーザ素子の温度変化が
生じても常に良い画像が得られることとなつた。 As a result, good images can always be obtained even if the temperature of the semiconductor laser element changes due to environmental changes or self-heating of the semiconductor laser element.
第1図は半導体レーザ装置の斜視図、第2図は
半導体レーザ装置の回路図、第3図はレーザの出
力対波長特性図である。
ここで1は半導体レーザ素子、2は支持部材、
4は導熱性接着剤、5は光検出器、6は抵抗、で
ある。
FIG. 1 is a perspective view of a semiconductor laser device, FIG. 2 is a circuit diagram of the semiconductor laser device, and FIG. 3 is a diagram of laser output versus wavelength characteristics. Here, 1 is a semiconductor laser element, 2 is a support member,
4 is a heat conductive adhesive, 5 is a photodetector, and 6 is a resistor.
Claims (1)
する半導体レーザ素子と、該半導体レーザ素子の
近傍に設けられ、温度変化による半導体レーザ素
子の出力波長の変動を検知するための感熱素子
と、前記波長変動に伴なう前記感光体の露光に必
要な光量の変化を補償するように、前記感熱素子
の出力によつて前記半導体レーザ素子のビーム出
力を変化させる制御手段とから成る半導体レーザ
装置。1. A semiconductor laser element whose sensitivity is wavelength-dependent for exposing a photoreceptor; a heat-sensitive element provided near the semiconductor laser element for detecting fluctuations in the output wavelength of the semiconductor laser element due to temperature changes; A semiconductor laser device comprising: a control means for changing the beam output of the semiconductor laser element according to the output of the heat-sensitive element so as to compensate for changes in the amount of light necessary for exposing the photoreceptor due to wavelength fluctuations.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP668680A JPS56104486A (en) | 1980-01-23 | 1980-01-23 | Semiconductor laser device |
| US06/147,174 US4375067A (en) | 1979-05-08 | 1980-05-06 | Semiconductor laser device having a stabilized output beam |
| DE3017509A DE3017509C2 (en) | 1979-05-08 | 1980-05-07 | Semiconductor laser device |
| GB8015314A GB2052841B (en) | 1979-05-08 | 1980-05-08 | Semiconductor laser device and an image recording apparatuus the same |
| GB08227459A GB2122022B (en) | 1979-05-08 | 1982-09-27 | A semiconductor laser device and an image recording apparatus using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP668680A JPS56104486A (en) | 1980-01-23 | 1980-01-23 | Semiconductor laser device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS56104486A JPS56104486A (en) | 1981-08-20 |
| JPH0156549B2 true JPH0156549B2 (en) | 1989-11-30 |
Family
ID=11645231
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP668680A Granted JPS56104486A (en) | 1979-05-08 | 1980-01-23 | Semiconductor laser device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56104486A (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4639924A (en) * | 1982-09-03 | 1987-01-27 | Canon Kabushiki Kaisha | Drive system for a semiconductor laser |
| DE3546599C2 (en) * | 1984-11-20 | 1993-06-03 | Olympus Optical Co., Ltd., Tokio/Tokyo, Jp | |
| JPH01307031A (en) * | 1988-06-02 | 1989-12-12 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor laser driving circuit for micro-optical head |
| JP2005064483A (en) * | 2003-07-30 | 2005-03-10 | Sumitomo Electric Ind Ltd | Light emitting module |
| JP4479614B2 (en) * | 2005-07-12 | 2010-06-09 | パナソニック株式会社 | Optical pickup device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5414180A (en) * | 1977-07-05 | 1979-02-02 | Canon Inc | Semiconductor laser unit |
-
1980
- 1980-01-23 JP JP668680A patent/JPS56104486A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS56104486A (en) | 1981-08-20 |
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