JPH021225B2 - - Google Patents
Info
- Publication number
- JPH021225B2 JPH021225B2 JP5404981A JP5404981A JPH021225B2 JP H021225 B2 JPH021225 B2 JP H021225B2 JP 5404981 A JP5404981 A JP 5404981A JP 5404981 A JP5404981 A JP 5404981A JP H021225 B2 JPH021225 B2 JP H021225B2
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- sample
- shielding plate
- vacuum
- vapor deposition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Description
【発明の詳細な説明】
本発明は水晶振動子の真空蒸着装置、特に、同
時に多数の水晶片に複数層の金属を蒸着できるよ
うにした水晶振動子の真空蒸着装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a vacuum evaporation apparatus for a crystal oscillator, and more particularly, to a vacuum evaporation apparatus for a quartz crystal oscillator that can simultaneously evaporate multiple layers of metal onto a large number of crystal pieces.
一般に水晶振動子1は第1図に示すように所定
の角度に切り出した水晶片2の両面にクロム、
金、銀、アルミニユーム等の金属物質を適当に選
択して、2層、3層等の複数層に蒸着して、励振
電極3,3(一方は図示せず)および端子4,4
を形成し、この水晶片2を基台5に植設した導出
端子6,6と接続された保持部材7,7に挾持さ
せた後、保持部材7,7と端子4,4とを導電性
の接着剤により接着し、水晶片2の振動エネルギ
ーを端子44、保持部材7,7、導出端子6,6
を介して外部へ取出すものである。 Generally, a crystal resonator 1 has a crystal piece 2 cut out at a predetermined angle, and chromium is coated on both sides of the crystal piece 2, as shown in FIG.
A metal material such as gold, silver, or aluminum is suitably selected and deposited in multiple layers such as two or three layers to form excitation electrodes 3, 3 (one not shown) and terminals 4, 4.
After forming the crystal piece 2 between the holding members 7, 7 connected to the lead-out terminals 6, 6 implanted in the base 5, the holding members 7, 7 and the terminals 4, 4 are made conductive. The vibration energy of the crystal piece 2 is transferred to the terminal 44, the holding members 7, 7, and the lead-out terminals 6, 6.
It is taken out to the outside via.
ところで、前記した水晶片2に設ける励振電極
3,3は通常2〜3層等複数層に設けることが一
般であり、しかも、多数の水晶片2を同一の真空
蒸着室内に収納し、同時に励振電極となるべき基
礎メツキを設けるものである。 By the way, the excitation electrodes 3, 3 provided on the crystal piece 2 described above are generally provided in multiple layers, such as 2 to 3 layers, and moreover, a large number of crystal pieces 2 are housed in the same vacuum deposition chamber, and excitation electrodes 3, 3 are provided on the crystal piece 2 at the same time. This is to provide the basic plating that will become the electrode.
このため、従来の基礎蒸着工程、例えば2層の
基礎蒸着の場合、真空蒸着室内に2つの蒸着源、
例えばクロム蒸着源と金蒸着源とを設け、先ず、
クロム蒸着源を蒸発させて、多数の水晶片2の面
にクロム蒸着を、次に、金蒸着源を蒸発させて、
各水晶片2のクロム蒸着上に金蒸着を行うもので
あつた。 For this reason, in the case of a conventional basic vapor deposition process, for example, two-layer basic vapor deposition, two vapor deposition sources are used in the vacuum vapor deposition chamber.
For example, a chromium vapor deposition source and a gold vapor deposition source are provided, and first,
A chromium deposition source is evaporated to deposit chromium on the surfaces of a large number of crystal blanks 2, and then a gold deposition source is evaporated,
Gold vapor deposition was performed on the chromium vapor deposition of each crystal piece 2.
しかし、前記基礎蒸着工程において、複数の蒸
着源を真空蒸着室内に設けることは、各蒸着源か
ら各水晶片2への距離が等位置になることがない
ので、水晶片2に対する基礎蒸着にムラが生じ、
特性の良い水晶振動子を得ることが、困難であつ
た。 However, in the basic evaporation process, when a plurality of evaporation sources are provided in the vacuum evaporation chamber, the distances from each evaporation source to each crystal piece 2 are not equal, so that the basic evaporation on the crystal piece 2 is uneven. occurs,
It has been difficult to obtain a crystal resonator with good characteristics.
また、前記した水晶振動子1の周波数は水晶片
2の形状、大きさあるいは励振電極3,3、端子
4,4の質、量により決定するもであるが、水晶
片2の厚みを正確に切り出すことが困難なことか
ら単に所定形状の水晶片2に、所定の物質(クロ
ム、金、銀、アルミニユーム)を所定量、真空蒸
着装置内で蒸着しただけでは予め定められた正確
な周波数f0にて振動する水晶振動子を得ることは
困難なことであり、そのため、従来の水晶振動子
1は、一旦水晶片2に真空蒸着装置内で励振電極
3,3を2層ないし3層等に蒸着した後、真空蒸
着装置より取出し、前記したように保持部材7,
7に挾持させ、該水晶振動子1を第2図あるいは
第3図に示すように保管の都合上トレー8,8′
にその複数個(10〜15個)を収納し、その後、以
下に説明する方法により、水晶片2の励振電極
3,3上に更に微少量の物質を数回に分けて蒸着
し続け、蒸着により変化していく周波数f1があら
かじめ定められた周波数f0と等しくなる点を求
め、その蒸着を停止し、基準周波数f0を備えた水
晶振動子1を得るものである。 The frequency of the crystal resonator 1 described above is determined by the shape and size of the crystal blank 2 or the quality and quantity of the excitation electrodes 3, 3 and terminals 4, 4, but the thickness of the crystal blank 2 must be determined accurately. Because it is difficult to cut out a crystal piece 2 of a predetermined shape, simply depositing a predetermined amount of a predetermined substance (chromium, gold, silver, aluminum) in a vacuum evaporation device on a crystal piece 2 of a predetermined shape will not produce a predetermined accurate frequency f 0 It is difficult to obtain a crystal oscillator that vibrates at 100°C, and therefore, the conventional crystal oscillator 1 is made by first forming two or three layers of excitation electrodes 3, 3 on the crystal blank 2 in a vacuum evaporation apparatus. After the vapor deposition, the holding member 7,
7, and the crystal resonator 1 is placed in trays 8, 8' for storage as shown in FIG. 2 or 3.
After that, by the method described below, a small amount of the substance is continuously deposited on the excitation electrodes 3 and 3 of the crystal piece 2 in several steps. The point where the changing frequency f 1 becomes equal to the predetermined frequency f 0 is determined, and the vapor deposition is stopped to obtain the crystal resonator 1 having the reference frequency f 0 .
なお、第3図示では水晶振動子1が個々の収納
台9を介してトレー8′に収納されている。 In addition, in the third illustration, the crystal resonators 1 are stored in a tray 8' via individual storage stands 9.
そして、周波数を調整する場合、トレー8,
8′上の水晶振動子1を1つづつ周波数を調整す
るための真空蒸着室(図示せず)内ターンテーブ
ル10,10′に設けた端子挿入部11,11あ
るいは収納台9の収納孔11′に入れ替え、その
後、ターンテーブル10,10′を間欠的に回転
し、蒸発源12,12′よりクロム、金、銀、ア
ルミニユーム等の物質を微少量、対向する水晶振
動子1の励振電極3上に蒸着し、その水晶振動子
1の周波数f1が基準周波数f0になるまで、数回に
分けて蒸着を行うものである。数回に分けて蒸着
を行うのは1度に蒸着を行うと、その途中で基準
周波数f0を越えてしまうのを防止するためで、一
般には2回目の蒸着は前記第1回目よりさらに微
少量で、また、3回目はさらに微少量の蒸着を行
うもので、この3回目の蒸着中に基準周波数f0に
到達するものが多いものである。 When adjusting the frequency, tray 8,
Terminal insertion portions 11, 11 provided on turntables 10, 10' in a vacuum deposition chamber (not shown) for adjusting the frequency of the crystal oscillators 1 on 8' one by one, or storage holes 11 in storage stand 9. ', then the turntables 10, 10' are rotated intermittently, and a minute amount of a substance such as chromium, gold, silver, aluminum, etc. is applied from the evaporation sources 12, 12' to the excitation electrode 3 of the facing crystal resonator 1. Then, the vapor deposition is performed in several steps until the frequency f 1 of the crystal oscillator 1 reaches the reference frequency f 0 . The reason why the evaporation is performed in several steps is to prevent the reference frequency f 0 from being exceeded in the middle of the evaporation if it is performed at one time.Generally, the second evaporation is performed at an even finer frequency than the first one. A small amount is deposited, and an even smaller amount is deposited the third time, and the reference frequency f 0 is often reached during the third deposition.
また、基準周波数f0に到達したか否かは調整し
ようとする水晶振動子1の導出端子6,6を発振
回路(図示せず)に接続して発振させ、該発振回
路からの信号と別に基準周波数f0を発振する発振
器からの信号とのゼロビートを検出させればよい
ものである。 In addition, whether or not the reference frequency f 0 has been reached can be determined by connecting the lead-out terminals 6, 6 of the crystal resonator 1 to be adjusted to an oscillation circuit (not shown) and oscillating it, separately from the signal from the oscillation circuit. It is sufficient to detect the zero beat with respect to the signal from the oscillator that oscillates the reference frequency f 0 .
そして、調整後、真空蒸着室の真空状態を解除
し、水晶振動子1を再びトレー8,8′に収納し、
再び、他のトレー8,8′から他の水晶振動子1
を取出し、同様の作業を行うものである。 After the adjustment, the vacuum state in the vacuum deposition chamber is released, and the crystal resonator 1 is stored in the trays 8 and 8' again.
Again, from other trays 8, 8', other crystal units 1
, and perform the same work.
ところで、前記した従来の水晶振動子は、真空
蒸着室内に先ず、水晶片2に励振電極3,3を蒸
着するため収納および取出し、また、周波数調整
のため再び真空蒸着室(同一もしくは他の真空蒸
着室)内に収納し、取出す必要があるため、その
工程が複雑で、また、トレー8,8′に収納され
た水晶振動子を1つづつ取出し、真空蒸着室内の
ターンテーブル10,10′に装着し、調整後、
再びトレー8,8′に収納するものであるため、
作業能率が悪く、水晶振動子1の出入が多く、そ
の途中で水晶片2が破損してしまう等の欠点があ
つた。 By the way, the above-mentioned conventional crystal resonator is first stored and taken out in a vacuum deposition chamber in order to deposit the excitation electrodes 3, 3 on the crystal piece 2, and then returned to the vacuum deposition chamber (in the same or another vacuum chamber) for frequency adjustment. The process is complicated because the crystal resonators stored in the trays 8, 8' must be taken out one by one, and the turntables 10, 10' inside the vacuum deposition chamber must be taken out one by one. After installation and adjustment,
Since it is to be stored in trays 8 and 8' again,
There were disadvantages such as poor working efficiency, the crystal resonator 1 being moved in and out a lot, and the crystal piece 2 being damaged during the movement.
本発明は叙上の点に鑑み、真空蒸着室内に回転
式テーブルを設け、該回転式テーブル上に複数個
の蒸発源を積置し、該蒸発源の内、使用する蒸発
源は常時各水晶片に対して等位置と成るようにす
ることにより水晶片に対する蒸着ムラを防止し、
高性能の水晶振動子を提供することを目的とす
る。 In view of the above points, the present invention provides a rotary table in a vacuum evaporation chamber, and a plurality of evaporation sources are stacked on the rotary table. By placing it in the same position with respect to the crystal piece, uneven vapor deposition on the crystal piece is prevented,
The purpose is to provide high-performance crystal units.
以下、本発明の1実施例を図面に基づいて詳細
に説明する。第7図は水晶片2を基台5に取付け
た状態を示す正面図である。図から明らかなよう
に、この状態では水晶片2の両面には励振電極
3,3および端子4,4は設けてなく、単に保持
部材7,7に仮止めされた状態である。同図にお
いて20はマスクで、該マスクは基台5に嵌合さ
れており、また、その正面および裏面には蒸着を
許容するための孔21,21が設けてある。な
お、6,6は導出端子である。なお、この状態を
試料と称す。第8図は真空蒸着室22の部分断側
面図である。23は真空蒸着室22の定盤で、該
定盤23上には複数本の支持柱24…が設けてあ
る。支持柱24…には後述する上板および下板の
位置決め用の段部24a…,24b…が設けてあ
る。26は上板で、前記支持柱24…の段部24
b…に位置し、ナツト25…により支持柱24に
取付けられている。27は上板26の中心下部に
保持されたモータ、28はモータ27の回転軸、
29は回転軸28に取付けられた伝達軸で、該伝
達軸29は太径部29aと細径部29bとを備
え、細径部29bの先端はナツト30と噛合でき
るようにジ部が設けてある。31は前記伝達軸2
9の細径部29bに取付けられた第1の蒸着物遮
蔽板で、該蒸着物遮蔽板31は特に第9図示の平
面図から明らかなようにその中心部に取付孔31
aが設けてあり、該取付孔31aから等距離に且
つ、等間隔に蒸着を許容するための孔32a〜3
2fが複数個(実施例では6個)が設けてあり、
さらに、孔32aと孔32fとの中間には周波数
調整用の調整孔33が設けてある。なお、調整孔
33も取付孔31aから等距離の位置に設けてあ
る。34は蒸着物遮蔽板31に設けた係止片であ
る。35は第2の蒸着物遮蔽板で、該蒸着物遮蔽
板35は特に第10図示の平面図から明らかなよ
うに、伝達軸29の細径部29bに強嵌合により
取付けられるべき取付孔35aが設けてあり、前
記第1の蒸着物遮蔽板31に設けた孔32a〜3
2fに対応する位置に孔36a〜36fが設けて
あるも、調整孔33と対応する孔は設けてない。
そして、前記第1の蒸着物遮蔽板31は伝達軸2
9に対し回転可能に、また、第2の蒸着物遮蔽板
35は伝達軸29に対し、回転不能に取付けられ
るものであるが、その取付けについて、第8図で
説明すると、先ず、細径部29bにコイルバネ3
7を挿入し、次に、第1の蒸着物遮蔽板31を挿
入する。この時、取付孔31aは細径部29bよ
り大径としてあるため遊嵌された状態となつてい
る。次に、フエルト等より成る摩擦板38を挿入
し、その後、第2の蒸着物遮蔽板35を細径部2
9bに強嵌合し、ナツト30を噛合すれば、第1
の蒸着物遮蔽板31はコイルバネ37の弾力によ
り摩擦板38を介して適度に第2の蒸着物遮蔽板
35に弾圧されているため、第1の蒸着物遮蔽板
31は一定以上のトルクが加わらない限り空転す
ることなく伝達軸29の回転に伴なつて回転する
ことができるものである。39は上板26の下部
に設けた試料(水晶片2等)取付部材で、該試料
取付部材39は特に第11図示の平面図より明ら
かなように円筒形を成し、前記第2の蒸着物遮蔽
板35に設けた孔36a〜36fと同等数の取付
部40a〜40fが等間隔に且つ先端部が下方に
傾斜して設けてある。そして、取付部40a〜4
0fに前記第7図に示した試料を取付けるもので
ある。その詳細を第12図を用いて説明すると、
同図に示すように取付部40aには導出端子挿入
孔41aが設けてあり、該挿入孔41aに試料の
導出端子6,6を挿入すると、導出端子6,6に
取付部40aに設けた孔42aより挿入孔41a
内に進出する検知片43が導出端子6,6と接触
するものである。44は下板で、該下板44は支
持柱24の段部24a…上に位置決め固定されて
いる。45は定盤23上に設けたモータで、モー
タ45の回転軸45aは前記下板44の孔44a
より上方へ突出し、その先端には回転式テーブル
46が取付けてある。また、回転式テーブル46
の回転中心は前記伝達軸29の回転中心より偏心
した位置になるようにしてある。そして、回転式
テーブル46上には第8図、第13図に示すよう
に蒸発源となるべき複数個の受皿47,48(実
施例では2種類)が積置してあり、回転式テーブ
ル46を回転させ、受皿47あるいは48を所定
位置に定位した時、その定位位置が第8図に示す
ように伝達軸29の真下に定位するようにしてあ
る。従つて、第8図に1点鎖線に示したように各
試料(水晶片2)に対する入射角αは伝達軸より
等角度、すなわち、蒸着すべき金属を収納した受
皿は各試料に対して等位置に定位することになる
ものである。受皿47,48はタングステン、モ
リブデン等より成り、一方の受皿47は金属物質
としてクロム49が、また、他方の受皿48には
金50が収納してある。従つて、本実施例におけ
る水晶片2の表面にはクロム49と金50の2層
蒸着となるようにセツトされている。51は電極
で、該電極51は上下動可能に設けられ、回転式
テーブル46が回転し、所定位置に定位した時、
上昇し、所定の受皿を通電させ、受皿内の金属例
えばクロム49を蒸発させるものである。52は
電極51を上昇あるいは下降するためのソレノイ
ドプランジヤーで、該ソレノイドプランジヤー5
2に設けたプランジヤー53の往復運動により電
極51を上下動させる。すなわち、プランジヤー
53の先端にはカム面53aが設けてあり、該カ
ム面53aが電極51に設けたピン51aを押圧
するためである。54は第1の蒸着物遮蔽板31
に設けた係止片34と係合して第1の蒸着物遮蔽
板31をコイルバネ37の弾力に抗して回転させ
るための可動部材で、該可動部材54は下板44
の下面に設けたソレノイドプランジヤー55によ
り可動するものである。なお、56…は検知片4
3…と接続したリード線である。57は取外しが
可能なカバーである。 Hereinafter, one embodiment of the present invention will be described in detail based on the drawings. FIG. 7 is a front view showing the state in which the crystal piece 2 is attached to the base 5. As shown in FIG. As is clear from the figure, in this state, the excitation electrodes 3, 3 and terminals 4, 4 are not provided on both surfaces of the crystal piece 2, and are merely temporarily fixed to the holding members 7, 7. In the figure, 20 is a mask, which is fitted onto the base 5, and holes 21, 21 are provided on the front and back surfaces of the mask to allow vapor deposition. Note that 6 and 6 are lead-out terminals. Note that this state is referred to as a sample. FIG. 8 is a partially sectional side view of the vacuum deposition chamber 22. 23 is a surface plate of the vacuum deposition chamber 22, and a plurality of support columns 24 are provided on the surface plate 23. The support columns 24 are provided with stepped portions 24a, 24b, for positioning the upper and lower plates, which will be described later. Reference numeral 26 denotes an upper plate, which corresponds to the stepped portion 24 of the support column 24...
b..., and is attached to the support column 24 by nuts 25.... 27 is a motor held at the lower center of the upper plate 26, 28 is a rotating shaft of the motor 27,
Reference numeral 29 denotes a transmission shaft attached to the rotating shaft 28. The transmission shaft 29 has a large diameter portion 29a and a narrow diameter portion 29b, and the tip of the narrow diameter portion 29b is provided with a screw portion so as to be able to engage with the nut 30. be. 31 is the transmission shaft 2
The first deposit shielding plate 31 is attached to the narrow diameter portion 29b of No. 9, and the deposit shielding plate 31 has a mounting hole 31 in the center thereof, as is particularly clear from the plan view shown in FIG.
Holes 32a to 3 for allowing vapor deposition are provided at equal distances from the mounting hole 31a and at equal intervals.
A plurality of 2fs (six in the example) are provided,
Furthermore, an adjustment hole 33 for frequency adjustment is provided between the holes 32a and 32f. Note that the adjustment hole 33 is also provided at a position equidistant from the attachment hole 31a. 34 is a locking piece provided on the deposit shielding plate 31. Reference numeral 35 designates a second deposit shielding plate, and as is particularly clear from the plan view shown in FIG. are provided, and holes 32a to 3 provided in the first vapor deposit shielding plate 31
Although holes 36a to 36f are provided at positions corresponding to 2f, a hole corresponding to adjustment hole 33 is not provided.
The first vapor deposit shielding plate 31 is connected to the transmission shaft 2.
9, and the second vapor deposit shielding plate 35 is attached to the transmission shaft 29 in a non-rotatable manner. Coil spring 3 to 29b
7, and then insert the first deposit shielding plate 31. At this time, since the attachment hole 31a has a larger diameter than the narrow diameter portion 29b, it is loosely fitted. Next, a friction plate 38 made of felt or the like is inserted, and then the second deposit shielding plate 35 is inserted into the narrow diameter portion 2.
9b and engage the nut 30, the first
Since the deposit shielding plate 31 is moderately pressed against the second deposit shielding plate 35 via the friction plate 38 due to the elasticity of the coil spring 37, the first deposit shielding plate 31 is not subjected to torque above a certain level. It can rotate with the rotation of the transmission shaft 29 without idling unless the transmission shaft 29 rotates idly. Reference numeral 39 denotes a sample (crystal piece 2, etc.) mounting member provided at the lower part of the upper plate 26, and the sample mounting member 39 has a cylindrical shape, as is particularly clear from the plan view shown in Figure 11, and is used for the second vapor deposition. Attachment parts 40a to 40f, the number of which is equivalent to the number of holes 36a to 36f provided in the object shielding plate 35, are provided at equal intervals and with their tips inclined downward. And the mounting parts 40a to 4
The sample shown in FIG. 7 above is attached to 0f. The details are explained using Fig. 12.
As shown in the figure, the mounting portion 40a is provided with a lead-out terminal insertion hole 41a, and when the lead-out terminals 6, 6 of the sample are inserted into the insertion hole 41a, the lead-out terminals 6, 6 are inserted into the hole provided in the mounting portion 40a. Insertion hole 41a from 42a
The detection piece 43 extending inward comes into contact with the lead-out terminals 6, 6. Reference numeral 44 denotes a lower plate, and the lower plate 44 is positioned and fixed above the step portion 24a of the support column 24. 45 is a motor provided on the surface plate 23, and the rotating shaft 45a of the motor 45 is connected to the hole 44a of the lower plate 44.
It protrudes further upwards, and a rotary table 46 is attached to its tip. In addition, the rotary table 46
The center of rotation of the transmission shaft 29 is located eccentrically from the center of rotation of the transmission shaft 29. As shown in FIGS. 8 and 13, a plurality of saucers 47 and 48 (two types in the embodiment) are stacked on the rotary table 46 to serve as evaporation sources. When the receiving plate 47 or 48 is positioned at a predetermined position by rotating the receiving plate 47 or 48, the position is positioned directly below the transmission shaft 29 as shown in FIG. Therefore, as shown by the dashed line in FIG. 8, the incident angle α for each sample (crystal piece 2) is at an equal angle from the transmission axis, that is, the saucer containing the metal to be deposited is at an equal angle for each sample. This is something that will be localized to a certain position. The saucers 47 and 48 are made of tungsten, molybdenum, etc., and one saucer 47 contains chromium 49 as a metal material, and the other saucer 48 contains gold 50. Therefore, two layers of chromium 49 and gold 50 are deposited on the surface of the crystal blank 2 in this embodiment. 51 is an electrode, and the electrode 51 is provided to be movable up and down, and when the rotary table 46 rotates and is oriented at a predetermined position,
It rises, energizes a predetermined saucer, and evaporates the metal, such as chromium 49, in the saucer. 52 is a solenoid plunger for raising or lowering the electrode 51;
The electrode 51 is moved up and down by the reciprocating movement of a plunger 53 provided at 2. That is, a cam surface 53a is provided at the tip of the plunger 53, and the cam surface 53a presses the pin 51a provided on the electrode 51. 54 is the first vapor deposit shielding plate 31
A movable member that engages with a locking piece 34 provided on the lower plate 44 to rotate the first deposit shielding plate 31 against the elasticity of the coil spring 37.
It is movable by a solenoid plunger 55 provided on the lower surface. In addition, 56... is the detection piece 4
This is the lead wire connected to 3. 57 is a removable cover.
次に、本発明の動作について説明すると、先
ず、カバー57を取外し、試料取付部材39の取
付部40a〜40fに試料を取付けると共に、回
転式テーブル46上の受皿47,48に蒸着用金
属であるクロム49と金50とをそれぞれの受皿
47,48に収納すると共に可動部材54を可動
させて第1の蒸着物遮蔽板31に設けた孔32a
〜32fが第14図に示すように第2の蒸着物遮
蔽板35に設けた孔36a〜36fと対応するよ
うに操作すると共にモータ27を若干回転させ、
各孔32a〜32fが取付部40a〜40fに取
付けられた試料と対応する位置に定位させる。ま
た、回転式テーブル46も回転させてクロム49
を収納した受皿47が伝達軸29の真下に定位す
るようにセツトし、その後、カバー57を被せ
て、真空蒸着室内部を真空状態にする。そして、
ソレノイドプランジヤー52を操作して、電極5
1を上昇させ、受皿47を通電すると、クロム4
9が蒸発し、孔32a〜32f(36a〜36f)
および各試料に設けたマスク20の孔21より各
試料(各水晶片2)が同時に金属蒸着(クロム蒸
着)される。所定量のクロム蒸着が終了すると、
再びソレノイドプランジヤー52を操作して、電
極51を降下させる。そして、モータ45を回転
させ、テーブル46を半回転し、今度は金50を
収納した受皿48が伝達軸29の真下に定位する
ようにセツトし、再び、電極51を上昇させて、
受皿48を通電すると、受皿48内の金50が蒸
発し、各試料の前記クロム蒸着上にさらに金が蒸
着する。そして、この全蒸着が終了した後、特に
図示してないが取付部40a〜40fを半回転さ
せるか、一旦、真空状態を解除して、カバー57
を取外し、試料を半回転して取付け、再びカバー
57を被せ、真空状態と成し、また、回転式テー
ブル46を再び半回転し、クロム49を収納した
受皿47を再び伝達軸29の真下に定位するよう
にセツトし、前記同様先ずクロム蒸着を、次い
で、回転式テーブル46を半回転して金蒸着を行
うことにより、収納された各試料は同時に励振電
極3,3となるべく基礎蒸着が終了する。蒸着す
べき金属を収納した受皿47,48を常に伝達軸
29の真下に定位するようにセツトしたのは蒸着
源(受皿)と各試料とが等位置になるようにした
もので、これにより複数層に金属を蒸着する際の
蒸着ムラが防止できるものである。 Next, to explain the operation of the present invention, first, the cover 57 is removed, the sample is attached to the attachment parts 40a to 40f of the sample attachment member 39, and the metal for evaporation is placed on the saucers 47 and 48 on the rotary table 46. A hole 32a is formed in the first vapor deposit shielding plate 31 by storing chromium 49 and gold 50 in respective trays 47 and 48 and moving the movable member 54.
32f correspond to the holes 36a to 36f provided in the second vapor deposit shielding plate 35 as shown in FIG. 14, and the motor 27 is slightly rotated.
Each of the holes 32a to 32f is positioned at a position corresponding to the sample attached to the attachment parts 40a to 40f. In addition, the rotary table 46 is also rotated so that the chrome 49
The tray 47 containing the evaporation chamber is set so as to be positioned directly below the transmission shaft 29, and then the cover 57 is placed on the chamber to evacuate the inside of the vacuum evaporation chamber. and,
By operating the solenoid plunger 52, the electrode 5
1 is raised and the saucer 47 is energized, chromium 4
9 evaporates, holes 32a to 32f (36a to 36f)
Each sample (each crystal piece 2) is simultaneously metal-deposited (chromium-deposited) through the hole 21 of the mask 20 provided in each sample. When the specified amount of chromium deposition is completed,
The solenoid plunger 52 is operated again to lower the electrode 51. Then, the motor 45 is rotated, the table 46 is rotated half a turn, this time the saucer 48 containing the gold 50 is set so as to be positioned directly below the transmission shaft 29, and the electrode 51 is raised again.
When the saucer 48 is energized, the gold 50 in the saucer 48 evaporates, and more gold is deposited on the chromium deposit of each sample. After this entire vapor deposition is completed, although not particularly shown, the mounting parts 40a to 40f are rotated by half a turn, or the vacuum state is once released, and the cover 57
Remove the sample, rotate the sample half a turn, attach it, put the cover 57 on again to create a vacuum state, turn the rotary table 46 half a turn again, and place the saucer 47 containing the chromium 49 directly under the transmission shaft 29 again. By setting it in a fixed position and performing chromium vapor deposition as described above, then gold vapor deposition by turning the rotary table 46 half a turn, the basic vapor deposition of each housed sample is simultaneously completed to become the excitation electrodes 3, 3. do. The saucers 47 and 48 containing the metal to be evaporated are always positioned directly below the transmission shaft 29 so that the evaporation source (the saucer) and each sample are at the same position. It is possible to prevent uneven deposition when metal is deposited on a layer.
次に、試料(水晶片2)の両面に基礎蒸着後の
周波数調整について説明する。先ず、基礎メツキ
が終了したら、ソレノイドプランジヤー55によ
り可動部材54を可動させ、第1の蒸着物遮蔽板
31をコイルバネ37の弾力に抗して若干回転さ
せ、第1の蒸着物遮蔽板31に設けた調整孔33
が第15図に示すように第2の蒸着物遮蔽板35
に設けた孔の1つ例えば36fと対応させる。従
つて、第2の蒸着物遮蔽板35に設けた他の孔3
6a〜36eは第1の蒸着物遮蔽板31により閉
鎖状態となり、また、第1の蒸着物遮蔽板31に
設けた孔32a〜32fは第2の蒸着物遮蔽板3
5により閉鎖状態となる。従つて、両蒸着物遮蔽
板31,35には調整孔33,36fの部分のみ
が開孔した状態となり、この調整孔33を順次1
つ1つの試料に対応させ周波数調整を行うもので
ある。 Next, frequency adjustment after basic vapor deposition on both sides of the sample (crystal blank 2) will be explained. First, when the basic plating is completed, the movable member 54 is moved by the solenoid plunger 55, and the first deposit shielding plate 31 is slightly rotated against the elasticity of the coil spring 37. Adjustment hole 33 provided
As shown in FIG.
This corresponds to one of the holes provided in, for example, 36f. Therefore, the other holes 3 provided in the second vapor deposit shielding plate 35
6a to 36e are closed by the first vapor deposit shielding plate 31, and the holes 32a to 32f provided in the first vapor deposit shielding plate 31 are closed by the second vapor deposit shielding plate 3.
5, it becomes a closed state. Therefore, only the adjustment holes 33 and 36f are opened in both the deposit shielding plates 31 and 35, and the adjustment holes 33 are opened one after another.
The frequency is adjusted according to each sample.
すなわち、調整孔33を先ず取付部40fに取
付けられた試料と対応させ、回転式テーブル46
の金50を収納した受皿48を通電させ、金50
を微少量蒸発させると、金は調整孔33、マスク
20の孔21を通過して、前記基礎蒸着層(励振
電極)上に蒸着する。この時、水晶片2の励振電
極は保持部材7,7、導出端子6,6より検知片
43を介してリード線56に導出され、該リード
線56を発振回路(図示せず)に接続して発振さ
せ、該発振回路からの信号と別に基準周波数f0を
発振する発振器からの信号とにより、従来例と同
様、数回の微調整を行い、ゼロビートを検出させ
1つの試料の調整を終了させる。1つの試料の調
整が終了したら、モータ27を所定量回転し、2
つの蒸着物遮蔽板31,35を同時に回転させ、
調整孔33が次の試料と対応するようにし、前記
同様の調整を行う。そして、モータ27を略1回
転させることにより全部の試料の周波数調整が終
了する。終了後、真空状態を解除し、カバー57
を取外し、各試料を取外せば、水晶片2には励振
電極3,3と周波数調整が終了したものが誕生す
ることになる。 That is, first, the adjustment hole 33 is made to correspond to the sample attached to the attachment part 40f, and then the rotary table 46
The saucer 48 containing 50 pieces of gold is energized, and 50 pieces of gold are collected.
When a small amount of gold is evaporated, the gold passes through the adjustment hole 33 and the hole 21 of the mask 20 and is deposited on the base deposition layer (excitation electrode). At this time, the excitation electrode of the crystal piece 2 is led out from the holding members 7, 7 and the lead-out terminals 6, 6 via the detection piece 43 to a lead wire 56, and the lead wire 56 is connected to an oscillation circuit (not shown). Using the signal from the oscillation circuit and a separate signal from an oscillator that oscillates the reference frequency f 0 , fine adjustments are made several times as in the conventional example, and the zero beat is detected to complete the adjustment of one sample. let After completing the adjustment of one sample, rotate the motor 27 by a predetermined amount, and
Rotating the two vapor deposition shielding plates 31 and 35 at the same time,
The adjustment hole 33 is made to correspond to the next sample, and the same adjustment as described above is performed. Then, by rotating the motor 27 approximately once, frequency adjustment for all samples is completed. After finishing, release the vacuum state and close the cover 57.
When the crystal blank 2 is removed and each sample is removed, a crystal piece 2 with excitation electrodes 3 and frequency adjustment completed will be created.
なお、前記両蒸着物遮蔽板31,35には6つ
の孔32a〜32f,36a〜36fを、また、
試料取付部材39には6つの取付部40a〜40
fを設けたが、必ずしも6つに限定されることな
く、個数については設計上の任意のことである。 In addition, six holes 32a to 32f, 36a to 36f are provided in both the deposit shielding plates 31 and 35, and
The sample mounting member 39 has six mounting parts 40a to 40.
f is provided, but the number is not necessarily limited to six, and the number is arbitrary in terms of design.
また、回転式テーブル46上には2つの受皿4
7,48,を積置したが必ずしも2つの限定され
ることなく3,4〜10種類と積置することにより
2〜10層あるいはそれ以上に蒸着することができ
るものである。 In addition, two saucers 4 are placed on the rotary table 46.
Although 7 and 48 layers are stacked, it is not necessarily limited to two, but by stacking 3, 4 to 10 types, it is possible to deposit 2 to 10 layers or more.
さらに、調整孔33は第1の蒸着物遮蔽板31
に設けたが、反対に第2の蒸着物遮蔽板35に設
けてもよいものである。 Further, the adjustment hole 33 is connected to the first vapor deposit shielding plate 31.
However, on the contrary, it may be provided on the second vapor deposit shielding plate 35.
以上、詳細に説明したように、本発明によれ
ば、真空蒸着室22に設けた回転式テーブル46
上に所定の間隔をおいて、複数種類の金属を積置
し、該回転式テーブルを回転させることにより蒸
着すべき金属の蒸着源(受皿47,48)は常時
各水晶片に対し、等位置に定位し得るようにした
ので、水晶片2に蒸着される基礎蒸着は蒸着ムラ
を起すことがなく、特性の良い水晶振動子を得る
ことができる等の効果がある。 As described above in detail, according to the present invention, the rotary table 46 provided in the vacuum deposition chamber 22
Multiple types of metals are stacked on top at predetermined intervals, and by rotating the rotary table, the evaporation sources (saucers 47, 48) of the metals to be evaporated are always placed at the same position with respect to each crystal piece. Since the crystal element 2 can be localized, the basic vapor deposition on the crystal piece 2 does not cause uneven vapor deposition, and a crystal resonator with good characteristics can be obtained.
第1図は水晶振動子1の正面図、第2図〜第6
図は周波数調整の従来例を示し、第2図は第1の
トレー8を示し、イ図は正面図、ロ図は側面図、
第3図は第2のトレー8′を示し、イ図は正面図、
ロ図は側面図、第4図は調整装置の正面図、第5
図は同平面図、第6図は他形状の調整装置の平面
図、第7図〜第15図は本発明の実施例を示し、
第7図は試料の正面図、第8図は真空蒸着室22
の部分断側面図、第9図は第1の蒸着物遮蔽板3
1の平面図、第10図は第2の蒸着物遮蔽板35
の平面図、第11図は試料取付部材39の平面
図、第12図は取付部40aに試料を取付けた状
態を示す部分断側面図、第13図は回転式テーブ
ル46の平面図、第14図は基礎メツキ状態を示
す蒸着物遮蔽板31,35の平面図、第15図は
周波数調整状態を示す蒸着物遮蔽板31,35の
平面図である。
1…水晶振動子、2…水晶片、3,3…励振電
極、22…真空蒸着室、31…蒸着物遮蔽板、3
2a〜32f…孔、33…調整孔、35…蒸着物
遮蔽板、36a〜36f…孔、39…試料取付部
材、40a〜40f…取付部、46…回転式テー
ブル、47,48…受皿(蒸発源)。
Figure 1 is a front view of the crystal resonator 1, Figures 2 to 6
The figure shows a conventional example of frequency adjustment, Figure 2 shows the first tray 8, Figure A is a front view, Figure B is a side view,
Figure 3 shows the second tray 8', Figure A is a front view;
Figure B is a side view, Figure 4 is a front view of the adjustment device, Figure 5 is a front view of the adjustment device,
The figure is a plan view of the same, FIG. 6 is a plan view of an adjusting device of other shapes, and FIGS. 7 to 15 show embodiments of the present invention.
Figure 7 is a front view of the sample, Figure 8 is the vacuum deposition chamber 22.
FIG. 9 is a partially sectional side view of the first vapor deposit shielding plate 3.
1, and FIG. 10 is a plan view of the second vapor deposit shielding plate 35.
11 is a plan view of the sample attachment member 39, FIG. 12 is a partially sectional side view showing a state in which a sample is attached to the attachment part 40a, FIG. 13 is a plan view of the rotary table 46, and FIG. 15 is a plan view of the deposit shielding plates 31, 35 showing the basic plating state, and FIG. 15 is a plan view of the deposit shielding plates 31, 35 showing the frequency adjustment state. DESCRIPTION OF SYMBOLS 1...Crystal resonator, 2...Crystal piece, 3, 3...Excitation electrode, 22...Vacuum deposition chamber, 31...Deposit shielding plate, 3
2a to 32f...hole, 33...adjustment hole, 35...evaporation shielding plate, 36a to 36f...hole, 39...sample mounting member, 40a to 40f...attachment part, 46...rotary table, 47, 48...receptacle (evaporation source).
Claims (1)
属を順次真空蒸着して水晶片の表面に励振電極と
なる基礎蒸着層を形成させるようにした水晶振動
子の真空蒸着装置において、前記複数種類の金属
を回転式テーブル上に所定の間隔をおいて積置
し、該回転式テーブルを回転させることにより蒸
着すべき金属は常時各水晶片に対し等位置に定位
し得るようにしたことを特徴とする水晶振動子の
真空蒸着装置。1. In a vacuum evaporation apparatus for a crystal resonator, in which a plurality of types of metals are sequentially vacuum-deposited on the surface of a plurality of crystal pieces at the same time to form a basic vapor deposition layer that becomes an excitation electrode on the surface of the crystal piece, the plurality of types of metals are metals are piled up at predetermined intervals on a rotary table, and by rotating the rotary table, the metal to be deposited can always be positioned at the same position with respect to each crystal piece. Vacuum deposition equipment for crystal oscillators.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5404981A JPS57169086A (en) | 1981-04-10 | 1981-04-10 | Vacuum vapor-depositing device of crystal resonator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5404981A JPS57169086A (en) | 1981-04-10 | 1981-04-10 | Vacuum vapor-depositing device of crystal resonator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57169086A JPS57169086A (en) | 1982-10-18 |
| JPH021225B2 true JPH021225B2 (en) | 1990-01-10 |
Family
ID=12959746
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5404981A Granted JPS57169086A (en) | 1981-04-10 | 1981-04-10 | Vacuum vapor-depositing device of crystal resonator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57169086A (en) |
-
1981
- 1981-04-10 JP JP5404981A patent/JPS57169086A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57169086A (en) | 1982-10-18 |
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