JPH0220951B2 - - Google Patents
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- Publication number
- JPH0220951B2 JPH0220951B2 JP58159597A JP15959783A JPH0220951B2 JP H0220951 B2 JPH0220951 B2 JP H0220951B2 JP 58159597 A JP58159597 A JP 58159597A JP 15959783 A JP15959783 A JP 15959783A JP H0220951 B2 JPH0220951 B2 JP H0220951B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- bus
- short
- sequence
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
【発明の詳細な説明】
(a) 発明の技術分野
本発明は電気部品等の試験のための自動測定シ
ステムに係り、特に高圧測定と低圧測定を含む一
貫した試験測定において測定シーケンスに測定バ
ス短絡シーケンスを設けた自動測定方式に関す
る。DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to an automatic measurement system for testing electrical components, etc., and in particular to a measurement bus short circuit in a measurement sequence in a consistent test measurement including high pressure measurement and low pressure measurement. This invention relates to an automatic measurement method with a sequence.
(b) 従来技術と問題点
従来、コイル、トランス等の電気部品の測定は
電算機を用いて自動測定を行つている。(b) Conventional technology and problems Conventionally, electrical components such as coils and transformers have been automatically measured using a computer.
以下従来の自動測定の一実施例について説明す
る。第１図は従来の電気部品の自動測定方式の一
実施例構成図である。 An example of conventional automatic measurement will be described below. FIG. 1 is a block diagram of an embodiment of a conventional automatic measurement method for electrical components.
第１図において、１は中央処理装置（以下
CPUと称す）、２は測定バス、３―１〜３―３は
バス、４は被測定試料接続部、５はLCRメータ、
６は変成比・極性試験器を示す。 In Figure 1, 1 is the central processing unit (hereinafter referred to as
(referred to as CPU), 2 is a measurement bus, 3-1 to 3-3 are buses, 4 is a connection part for the sample to be measured, 5 is an LCR meter,
6 indicates a transformation ratio/polarity tester.
第２図は第１図のCPU１に使用するプログラ
ム（）を示す。図中、７はアドレスＡ・１〜
Ａ・６データＤ・１〜Ｄ・６、８―１はLCRメ
ータ、８―２は変成比・極性試験器、９―１〜９
―４は各試験項目、１０は終了信号を示す。 FIG. 2 shows a program () used in the CPU 1 of FIG. In the figure, 7 is address A.1~
A.6 data D.1 to D.6, 8-1 is LCR meter, 8-2 is transformation ratio/polarity tester, 9-1 to 9
-4 indicates each test item, and 10 indicates an end signal.
第１図において、被測定試料接続回路４にトラ
ンスを接続する。次にスタート信号によりCPU
１は第２図のプログラム（）によつて７のアド
レスＡ・１データＤ・１を出力する。該アドレス
及びデータはリレー駆動回路１５により測定バス
内のリレーをONさせてLCRメータ５とトランス
とをバス３―１，測定バス２，バス３―２を介し
て接続する。引続いてアドレスＡ・２データＤ・
２がCPU１より、アドレス・データバス３―Ｄ
を経てLCRメータ８―１に送出され、LCRメー
タのＬのレンジを選びトランスのインダクタンス
Ｌの測定が行われ、その測定値がLCRメータ５
に指示されると共にデータがCPU１に送出され
る。この測定値によりCPU１より終了信号が出
され、トランスのインダクタンスＬの測定が終了
する。 In FIG. 1, a transformer is connected to the sample connection circuit 4 to be measured. Next, the start signal causes the CPU to
1 outputs address A.1 data D.1 of 7 by the program () shown in FIG. The address and data are used by the relay drive circuit 15 to turn on the relay in the measurement bus, thereby connecting the LCR meter 5 and the transformer via the bus 3-1, the measurement bus 2, and the bus 3-2. Subsequently, address A, 2 data D,
2 is from CPU1, address/data bus 3-D
The LCR meter's L range is selected and the inductance L of the transformer is measured, and the measured value is sent to the LCR meter 5.
At the same time, the data is sent to the CPU 1. Based on this measured value, the CPU 1 issues an end signal, and the measurement of the inductance L of the transformer ends.
引続いてCPU１が動作しアドレスＡ・３デー
タＤ・３が送出されLCRメータ８―１のＺのレ
ンジが選ばれ、トランスのインピーダンスの測定
値が指示される。その結果は上記と同様の手法に
よりCPU１より終了信号が出され、順次プログ
ラムに従つて自動測定が行われる。 Subsequently, the CPU 1 operates, sends out address A.3 and data D.3, selects the Z range of the LCR meter 8-1, and instructs the measured value of the impedance of the transformer. As a result, an end signal is issued from the CPU 1 using the same method as described above, and automatic measurements are sequentially performed according to the program.
コイル，トランスには使用目的によつて高耐圧
試験が要求される時、耐圧計１１をこの測定バス
２及びバスに接続すると、前記の測定バスの有す
る静電容量C0に高電圧が充電される。この充
電々圧によつて次期に測定される低電圧使用の測
定器や部品を破損することになる。このため耐圧
試験は別の試験装置で行うことになり、装置を低
圧測定と高圧測定の２系統の自動測定を行うこと
になり、測定装置をコスト高にする欠点を有す
る。 When coils and transformers are required to undergo high withstand voltage tests depending on their purpose of use, when the withstand voltage meter 11 is connected to the measurement bus 2 and the bus, a high voltage is charged to the capacitance C 0 of the measurement bus. Ru. This charging pressure will damage measuring instruments and parts that use low voltage to be measured next time. For this reason, the withstand voltage test must be conducted using a separate test device, and the device is required to carry out two automatic measurements, one for low pressure measurement and one for high pressure measurement, which has the drawback of increasing the cost of the measuring device.
また、デジタル・ボルト・メーター（以下
DVMと略す）の抵抗測定レンジによる抵抗測定
は定電流源に直列接続しや測定試料の電圧降下に
より抵抗値を求めるもので、測定バスに残留電圧
があれば測定誤差を生ずる欠点を有する。 In addition, a digital volt meter (hereinafter referred to as
Resistance measurement using a DVM (abbreviated as DVM) resistance measurement range involves connecting a constant current source in series and determining the resistance value based on the voltage drop of the measurement sample, which has the drawback of causing measurement errors if there is residual voltage on the measurement bus.
(c) 発明の目的
本発明は上記問題点に鑑み、その欠点を解決す
るために、前記測定バスの充電々圧の除去を測定
シーケンスの中に短絡シーケンスを設けることに
より解決した自動測定方式を提供することを目的
とする。(c) Purpose of the Invention In view of the above-mentioned problems, and in order to solve the drawbacks, the present invention provides an automatic measurement method in which the removal of the charging voltage of the measurement bus is solved by providing a short-circuit sequence in the measurement sequence. The purpose is to provide.
(d) 発明の構成
本発明は前記目的を達成するために、耐圧計，
絶縁抵抗計，DVM，LCRメータ等が中央処理装
置により順次制御されて被測定物を自動的に測定
する測定シーケンスを有する自動測定方式におい
て、前記測定シーケンスの中に測定バス短絡シー
ケンスを設け、該短絡シーケンスによつて前記測
定バスを短絡する手段を設けたことを特徴とす
る。(d) Structure of the invention In order to achieve the above object, the present invention provides a pressure gauge,
In an automatic measurement method that has a measurement sequence in which an insulation resistance meter, DVM, LCR meter, etc. are sequentially controlled by a central processing unit to automatically measure the measured object, a measurement bus shorting sequence is provided in the measurement sequence to It is characterized in that means for short-circuiting the measurement bus by a short-circuit sequence is provided.
(e) 発明の実施例
本発明は電気部品，電気機器等の自動測定シス
テムの測定シーケンスにおいてバス短絡シーケン
スを設けたものである。(e) Embodiments of the Invention The present invention provides a bus short circuit sequence in the measurement sequence of an automatic measurement system for electrical parts, electrical equipment, etc.
以下、本発明の自動測定方式を図を用いて説明
する。第３図は本発明の自動測定方式の一実施例
構成図である。図中、第１図と同一符号、同一番
号は同一部材を示す。第３図において、１１は耐
圧計、１２は絶縁計、１３は低圧測定器、１４は
高圧測定器、１５はリレー駆動回路を示す。 The automatic measurement method of the present invention will be explained below with reference to the drawings. FIG. 3 is a configuration diagram of an embodiment of the automatic measurement method of the present invention. In the figure, the same reference numerals and numbers as in FIG. 1 indicate the same members. In FIG. 3, 11 is a pressure meter, 12 is an insulation meter, 13 is a low pressure measuring device, 14 is a high pressure measuring device, and 15 is a relay drive circuit.
第４図は第３図の測定システムにおいてCPU
１に使用するプログラムを示す。このプログラム
は第２図のプログラムに短絡シーケンスに基づく
短絡信号１７を追加したものである。図中、７は
アドレスA5〜A10、８―３は耐圧計、８―４は
絶縁計、９―５，９―６は測定項目を示す。 Figure 4 shows the CPU in the measurement system shown in Figure 3.
1 shows the program used. This program is the program shown in FIG. 2 with the addition of a short circuit signal 17 based on a short circuit sequence. In the figure, 7 indicates addresses A5 to A10, 8-3 indicates a pressure meter, 8-4 indicates an insulation meter, and 9-5 and 9-6 indicate measurement items.
第３図において、被測定試料接続部４に変成器
を接続する。次にCPU１をスタートさせる。こ
れによりCPU１は第４図のプログラムの短絡シ
ーケンスによつて短絡信号１７を出力する。この
短絡信号１７によりリレー駆動回路１５が動作
し、測定バス内のリレーを駆動して測定バス２を
短絡し、測定バス２の線間容量C0に充電されて
いる電荷を放電する。測定バス２の短絡の後測定
バス内のリレーは自動復帰し、測定バス２の短絡
を除く。次にCPU１はプログラム（）によつ
てアドレスＡ・７データＤ・７を出力する。この
アドレスＡ・７データＤ・７はリレー駆動回路に
より測定バス内のリレーをONさせ耐圧計１１と
トランスを接続する。引続いてアドレスＡ・８デ
ータＤ・８がCPU１より出力され、耐圧計１１
をスタートさせ、トランス耐圧試験が行われる。 In FIG. 3, a transformer is connected to the sample connection section 4 to be measured. Next, start CPU1. As a result, the CPU 1 outputs the short circuit signal 17 according to the short circuit sequence of the program shown in FIG. This short-circuit signal 17 activates the relay drive circuit 15, which drives the relay in the measurement bus to short-circuit the measurement bus 2 and discharge the charge stored in the line capacitance C0 of the measurement bus 2. After the measurement bus 2 is short-circuited, the relay in the measurement bus automatically returns to remove the short-circuit of the measurement bus 2. Next, the CPU 1 outputs address A.7 and data D.7 by program (). This address A.7 data D.7 turns on the relay in the measurement bus by the relay drive circuit and connects the pressure gauge 11 and the transformer. Subsequently, address A.8 data D.8 is output from CPU1, and pressure gauge 11
is started, and a transformer withstand voltage test is performed.
耐圧試験データは耐圧計１１に指示されると共
にそのデータはCPU１にて処理される。測定が
終るとプログラム（）によりCPU１より終了
信号１０に引続いて短絡信号１７が送出され、前
記の如く測定バス２の線間容量C0の充電々荷を
放電する。 The pressure test data is instructed to the pressure gauge 11, and the data is processed by the CPU 1. When the measurement is completed, the CPU 1 sends out the short circuit signal 17 following the end signal 10 according to the program (), and the charge in the line capacitance C 0 of the measurement bus 2 is discharged as described above.
第５図は第３図の測定バス２の短絡及び測定器
の接続を示す図である。 FIG. 5 is a diagram showing the short circuit of the measurement bus 2 and the connection of the measuring device in FIG. 3.
第５図において、第４図に示したプログラム
（）に基づいてCPU１より短絡信号１７が送出
されると該短絡信号１７によりリレー駆動回路１
５が動作し、これにより接点回路１６の接点ａ，
ｂ，ｃ，ｄが一瞬のうちに閉じ測定バス２を短絡
して、残留電荷を除去し、接点ａ，ｂ，ｃ，ｄは
元の状態に復帰する。次に測定器アドレス及びデ
ータ７により接点回路１６の接点ｂ，ｃが閉じて
被測定試料接続部４に接続されている試料を測定
バス２に接続すると共に、接点回路１８の接点
ｅ，ｆ或いはｇ，ｈの何れか一方が選ばれて接続
し、測定バス２を介して被測定試料を測定器に接
続する。 In FIG. 5, when a short circuit signal 17 is sent from the CPU 1 based on the program () shown in FIG.
5 operates, and as a result, the contacts a, of the contact circuit 16
b, c, and d close instantaneously to short-circuit the measurement bus 2, removing residual charges, and contacts a, b, c, and d return to their original states. Next, contacts b and c of the contact circuit 16 are closed according to the measuring device address and data 7 to connect the sample connected to the sample connection section 4 to the measurement bus 2, and contacts e, f or the contact circuit 18 are closed. Either g or h is selected and connected, and the sample to be measured is connected to the measuring instrument via the measurement bus 2.
以上の如く、プログラム（）のシーケンスに
従つて、各試験測定項目の前後に短絡シーケンス
による測定バスの短絡が行われるので、測定バス
には耐圧試験等の高電圧印加による充電電荷が残
存しないので、次の試験測定時における低圧試験
測定器や低圧用の被測定電気部品の破損及び測定
時の誤差を防止できる。 As described above, the measurement bus is short-circuited by the short-circuit sequence before and after each test measurement item according to the sequence of the program (), so no charge remains in the measurement bus due to high voltage application such as withstand voltage tests. , it is possible to prevent damage to the low voltage test measuring instrument and low voltage electrical components to be measured and errors during measurement during the next test measurement.
また、低圧試験測定後においても、比較的に微
小な充電電荷が短絡放電されて、測定バスの各構
成要素ライン間の電位はすべて零となるので、次
に行う試験測定において高精度，高確度の測定値
が得られることになる。 In addition, even after a low-voltage test measurement, the relatively small charge is short-circuited and discharged, and the potential between each component line of the measurement bus becomes zero, so the next test measurement can be performed with high precision and accuracy. The measured value will be obtained.
(f) 発明の効果
本発明によれば、測定シーケンスにおいて各試
験測定項目の前後に測定バスを短絡信号により短
絡するので、測定バスに残存する充電電荷が除去
されるため、これにより被測定電気部品及び各種
の試験測定器の破損が防止され、また測定誤差を
取り除くことができ、高精度，高確度の自動測定
方式として、極めて有効なものである。(f) Effects of the Invention According to the present invention, since the measurement bus is short-circuited by a short-circuit signal before and after each test measurement item in the measurement sequence, the charge remaining in the measurement bus is removed, thereby reducing the This method prevents damage to parts and various testing and measuring instruments, and eliminates measurement errors, making it extremely effective as a high-precision, high-accuracy automatic measurement method.
第１図は従来の自動測定方式の一構成例、第２
図は第１図のプログラム（）、第３図は本発明
の自動測定方式の一実施例構成図、第４図は第３
図のプログラム（）、第５図は測定バス短絡及
び測定器の接続を示す図である。
図中、１はCPU、２は測定バス、３―１〜３
―５はバス、アドレスデータバス３―Ｄ、４は被
測定試料接続部、５はLCRメータ、６は変成
比・極性試験器、７はアドレスＡ・１〜Ａ・10及
びデータＤ・１〜Ｄ・10、８―１〜８―４は測定
器のプログラム、９―１〜９―６は測定項目、１
０は終了信号、１１は耐圧計、１２は絶縁抵抗
計、１３は低圧測定器、１４は高圧測定器、１５
はリレー駆動回路、１６，１８は接点回路、１７
は短絡信号を示す。
Figure 1 shows an example of the configuration of a conventional automatic measurement system;
The figure shows the program () shown in Fig. 1, Fig. 3 is a configuration diagram of an embodiment of the automatic measurement method of the present invention, and Fig. 4 shows the program () of Fig. 3.
FIG. 5 is a diagram showing the measurement bus short circuit and the connection of the measuring device. In the figure, 1 is the CPU, 2 is the measurement bus, 3-1 to 3
-5 is a bus, address data bus 3-D, 4 is a connection part for the sample to be measured, 5 is an LCR meter, 6 is a transformation ratio/polarity tester, 7 is an address A.1 to A.10 and data D.1 to D・10, 8-1 to 8-4 are measuring instrument programs, 9-1 to 9-6 are measurement items, 1
0 is an end signal, 11 is a pressure meter, 12 is an insulation resistance meter, 13 is a low pressure measuring device, 14 is a high pressure measuring device, 15
is a relay drive circuit, 16 and 18 are contact circuits, 17
indicates a short circuit signal.
Claims (1)
スを介して順次測定シーケンスに従つて制御さ
れ、被測定電気部品を自動的に試験測定する自動
測定方式において、前記測定シーケンス中の各試
験測定項目の前後に前記測定バスを短絡する短絡
シーケンスと、該短絡シーケンスにより前記測定
バスを短絡する手段とを設け、各試験測定項目の
前後に前記測定バスの残留電荷を零とすることを
特徴とする自動測定方式。1. In an automatic measurement method in which various test and measurement instruments are sequentially controlled by a central processing unit via a measurement bus according to a measurement sequence, and the electrical component to be measured is automatically tested and measured, each test measurement item in the measurement sequence is A short-circuit sequence for short-circuiting the measurement bus before and after each test measurement item, and a means for short-circuiting the measurement bus by the short-circuit sequence are provided, and the residual electric charge on the measurement bus is set to zero before and after each test measurement item. Measurement method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58159597A JPS6050457A (en) | 1983-08-31 | 1983-08-31 | Automatic measuring system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58159597A JPS6050457A (en) | 1983-08-31 | 1983-08-31 | Automatic measuring system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6050457A JPS6050457A (en) | 1985-03-20 |
| JPH0220951B2 true JPH0220951B2 (en) | 1990-05-11 |
Family
ID=15697172
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58159597A Granted JPS6050457A (en) | 1983-08-31 | 1983-08-31 | Automatic measuring system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6050457A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0443823Y2 (en) * | 1986-02-05 | 1992-10-15 | ||
| CN103336210B (en) * | 2013-06-28 | 2015-06-24 | 清华大学 | Method for testing ageing property of monocrystal boundary of zinc oxide voltage-sensitive resistor |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS636697Y2 (en) * | 1980-10-14 | 1988-02-25 |
-
1983
- 1983-08-31 JP JP58159597A patent/JPS6050457A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6050457A (en) | 1985-03-20 |
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