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JPH0313703B2 - - Google Patents
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JPH0313703B2 - - Google Patents

Info

Publication number
JPH0313703B2
JPH0313703B2 JP59161545A JP16154584A JPH0313703B2 JP H0313703 B2 JPH0313703 B2 JP H0313703B2 JP 59161545 A JP59161545 A JP 59161545A JP 16154584 A JP16154584 A JP 16154584A JP H0313703 B2 JPH0313703 B2 JP H0313703B2
Authority
JP
Japan
Prior art keywords
substrate
substrate holder
thin wire
heat
cooled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59161545A
Other languages
Japanese (ja)
Other versions
JPS6142843A (en
Inventor
Muneharu Komya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ulvac Inc
Original Assignee
Ulvac Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac Inc filed Critical Ulvac Inc
Priority to JP59161545A priority Critical patent/JPS6142843A/en
Publication of JPS6142843A publication Critical patent/JPS6142843A/en
Publication of JPH0313703B2 publication Critical patent/JPH0313703B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3435Target holders (includes backing plates and endblocks)

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、半導体の製造に使用されるシリコン
ウエハ等の基板を冷却する装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an apparatus for cooling a substrate such as a silicon wafer used in the manufacture of semiconductors.

(従来技術) 一般に、真空室内でこの種の基板にイオン注入
等の処理を施すと発熱して基板が損傷する危険が
あるので、該基板を冷却水を循環させた基板ホル
ダで保持することが行われている。この場合、基
板は熱により変形を生じ基板ホルダとの接触が離
れて冷却性が悪化するので、基板ホルダの表面に
シリコンラバーのクツシヨン部それを覆う弗素系
樹脂の薄膜を設け、これに基板を当接させること
により基板に変形が生じても離れることなく冷却
出来るようにしている。
(Prior art) Generally, when ion implantation or other processing is performed on this type of substrate in a vacuum chamber, there is a risk of heat generation and damage to the substrate, so it is recommended to hold the substrate in a substrate holder with circulating cooling water. It is being done. In this case, the substrate deforms due to heat and loses contact with the substrate holder, deteriorating cooling performance. Therefore, a thin film of fluorine-based resin is provided on the surface of the substrate holder to cover the silicone rubber cushion, and the substrate is placed on this thin film. By bringing them into contact with each other, even if the substrate is deformed, it can be cooled without separating.

(発明が解決しようとする問題点) シリコンラバーは、その弾力性が実際の使用条
件で経時的に損なわれ、基板の変形に追従して当
該し得なくなる欠点があり、また、近時のよう
に、基板の処理のために大電流、高電圧が使用さ
れると基板の発熱が多くなり、その熱流束が
1W/cm2にも達すると接触熱伝達係数、熱伝性、
耐熱性の乏しい弗素系樹脂で覆われたシリコンラ
バーの使用が困難になる。
(Problems to be Solved by the Invention) Silicon rubber has the drawback that its elasticity is lost over time under actual usage conditions, and it becomes unable to follow the deformation of the substrate. In addition, when large currents and high voltages are used to process the substrate, the substrate generates a lot of heat, and the heat flux decreases.
When it reaches 1W/ cm2 , the contact heat transfer coefficient, thermal conductivity,
It becomes difficult to use silicone rubber covered with fluorine-based resin, which has poor heat resistance.

本発明は、主として発熱量の多い状況で処理さ
れた基板の冷却に適した耐久性の良い冷却装置を
提供することを目的とするものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a highly durable cooling device that is suitable for cooling substrates processed under conditions that generate a large amount of heat.

(問題点を解決するための手段) 本発明では、真空室内で処理される基板を冷却
水の循環等により冷却された基板ホルダにより保
持するようにしたものに於て、該基板に当接する
基板ホルダの表面に、弾力性を形状加工により調
節した熱良導性の細線を、見掛けのシヨア硬度が
シリコンラバーと同程度になるよう多数植設する
ことにより、上記の目的を達成するようにした。
(Means for Solving the Problems) In the present invention, in a device in which a substrate to be processed in a vacuum chamber is held by a substrate holder cooled by circulation of cooling water, etc., the substrate in contact with the substrate is The above objective was achieved by planting a large number of thermally conductive fine wires whose elasticity was adjusted through shape processing on the surface of the holder so that the apparent shore hardness was comparable to that of silicone rubber. .

(作用) 基板は基板ホルダの表面に保持され、真空室内
に於てイオン注入等の処理が施されるが、該ホル
ダの表面には、弾力性を形状加工により調節した
熱良導性の細線が、見掛けのシヨア硬度が柔らか
いシリコンラバーと同程度になるように多数植設
されているので、基板の処理に伴う発熱量は該細
線を介して冷却された基板ホルダに伝えられ、基
板が冷却されると共に基板の変形に適合して各細
線が基板に当接し、冷却性が良好になる。
(Function) The substrate is held on the surface of a substrate holder and subjected to treatments such as ion implantation in a vacuum chamber. However, since a large number of wires are planted so that the apparent shore hardness is comparable to that of soft silicone rubber, the amount of heat generated during processing of the substrate is transmitted to the cooled substrate holder via the thin wires, and the substrate is cooled. At the same time, each thin wire comes into contact with the substrate in accordance with the deformation of the substrate, resulting in good cooling performance.

(実施例) 本発明の実施例を図面につき説明するに、第1
図に於て、符号1は真空室2内に配置される基板
ホルダを示し、該基板ホルダ1は例えばCu、Al
等の金属で形成され、その内部には冷却水の循環
路3が設けられる。4は該基板ホルダ1の表面即
ち冷却面に植設した熱伝導率の高いCu、Al、C、
Mo等の金属繊維からなり、弾力性を形状加工に
より調節した細線で、該細線4の材料、寸法、植
設の密度、形状等を調整して細線群4a全体の見
掛けのシヨア硬度が柔らかいシリコンラバーと同
程度になるように植設される。尚、該細線4の弾
力性を調節する形状加工としては、その形状をコ
イル状又は蛇行状に加工することが考えられる。
5は処理されるガリウムヒ素ウエハ、シリコンウ
エハ等の基板を示し、該基板5は直接或いは第2
図のように薄膜6を介して細線群4aと当接さ
れ、処理に伴つて基板5に発生する熱は細線群4
aを介して冷却された基板ホルダ1へと伝わり、
基板5が熱割れしないように冷却される。該薄膜
6としては、熱流束が低い範囲では弗素系樹脂の
膜が使用され、熱流束が高い範囲では良熱伝導性
で真空特性の良い可撓材が使用される。
(Example) To explain the example of the present invention with reference to the drawings, the first example is as follows.
In the figure, reference numeral 1 indicates a substrate holder placed in a vacuum chamber 2, and the substrate holder 1 is made of, for example, Cu, Al, etc.
The cooling water circulation path 3 is provided inside the metal. 4 is Cu, Al, C, with high thermal conductivity implanted on the surface of the substrate holder 1, that is, the cooling surface.
A thin wire made of metal fiber such as Mo, whose elasticity is adjusted by shape processing, and by adjusting the material, dimensions, planting density, shape, etc. of the thin wire 4, the apparent shore hardness of the entire thin wire group 4a is made of soft silicone. It is planted at the same level as the rubber. In addition, as a shape processing for adjusting the elasticity of the thin wire 4, it is possible to process the shape into a coil shape or a meandering shape.
5 indicates a substrate such as a gallium arsenide wafer or a silicon wafer to be processed, and the substrate 5 is directly or secondly processed.
As shown in the figure, the thin wire group 4a is in contact with the thin wire group 4a through the thin film 6, and the heat generated in the substrate 5 during processing is absorbed by the thin wire group 4a.
is transmitted to the cooled substrate holder 1 via a,
The substrate 5 is cooled to prevent thermal cracking. As the thin film 6, a fluororesin film is used in a range where the heat flux is low, and a flexible material with good thermal conductivity and good vacuum properties is used in a range where the heat flux is high.

(発熱の効果) このように本発明によるときは、基板ホルダの
表面に、弾力性を形状加工により調節した熱良導
性の細線を、シヨア硬度がシリコンラバーと同程
度になるように多数植設したので、基板と各細線
を機械的に強い力を与えずに互いに接触させるこ
とが出来、基板から大きな熱流束を基板ホルダに
伝え得て熱変形、熱割れの生じ易い基板の冷却を
効率良く行える効果がある。
(Effect of heat generation) According to the present invention, a large number of thin wires with good thermal conductivity whose elasticity is adjusted by shape processing are implanted on the surface of the substrate holder so that the shore hardness is comparable to that of silicon rubber. This allows the substrate and each thin wire to be brought into contact with each other without applying strong mechanical force, and a large heat flux can be transmitted from the substrate to the substrate holder, making it possible to efficiently cool substrates that are prone to thermal deformation and thermal cracking. It has a good effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例の截断側面図、第2図
はその変形例の要部の截断側面図である。 1…基板ホルダ、2…真空室、4…細線、4a
…細線群、5…基板。
FIG. 1 is a cut-away side view of an embodiment of the present invention, and FIG. 2 is a cut-away side view of a main part of a modification thereof. 1...Substrate holder, 2...Vacuum chamber, 4...Thin wire, 4a
...Thin wire group, 5...Substrate.

Claims (1)

【特許請求の範囲】[Claims] 1 真空室内で処理される基板を冷却水の循環等
により冷却された基板ホルダにより保持するよう
にしたものに於て、該基板に当接する基板ホルダ
の表面に、弾力性を形状加工により調節した熱良
導性の細線を、見掛けのシヨア硬度がシリコンラ
バーと同程度になるよう多数植設したことを特徴
とする基板の冷却装置。
1. In a device in which a substrate to be processed in a vacuum chamber is held by a substrate holder cooled by circulation of cooling water, the elasticity of the surface of the substrate holder that contacts the substrate is adjusted by shape processing. A cooling device for a substrate characterized by having a large number of thin wires with good thermal conductivity planted so that the apparent shore hardness is comparable to that of silicone rubber.
JP59161545A 1984-08-02 1984-08-02 Device for cooling substrate Granted JPS6142843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59161545A JPS6142843A (en) 1984-08-02 1984-08-02 Device for cooling substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59161545A JPS6142843A (en) 1984-08-02 1984-08-02 Device for cooling substrate

Publications (2)

Publication Number Publication Date
JPS6142843A JPS6142843A (en) 1986-03-01
JPH0313703B2 true JPH0313703B2 (en) 1991-02-25

Family

ID=15737138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59161545A Granted JPS6142843A (en) 1984-08-02 1984-08-02 Device for cooling substrate

Country Status (1)

Country Link
JP (1) JPS6142843A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5244820A (en) * 1990-03-09 1993-09-14 Tadashi Kamata Semiconductor integrated circuit device, method for producing the same, and ion implanter for use in the method
DE10344492B4 (en) 2003-09-24 2006-09-07 Carl Zeiss Nts Gmbh Particle beam
US8945749B2 (en) * 2011-12-15 2015-02-03 GM Global Technology Operations LLC Carbon fiber thermal interface for cooling module assembly

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60236223A (en) * 1984-05-10 1985-11-25 Ulvac Corp Cooling device of substrate

Also Published As

Publication number Publication date
JPS6142843A (en) 1986-03-01

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