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JPH0315352B2 - - Google Patents
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JPH0315352B2 - - Google Patents

Info

Publication number
JPH0315352B2
JPH0315352B2 JP56077569A JP7756981A JPH0315352B2 JP H0315352 B2 JPH0315352 B2 JP H0315352B2 JP 56077569 A JP56077569 A JP 56077569A JP 7756981 A JP7756981 A JP 7756981A JP H0315352 B2 JPH0315352 B2 JP H0315352B2
Authority
JP
Japan
Prior art keywords
photodiode
light
carrier
crosstalk
array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56077569A
Other languages
Japanese (ja)
Other versions
JPS57193057A (en
Inventor
Takeshi Ogawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP56077569A priority Critical patent/JPS57193057A/en
Publication of JPS57193057A publication Critical patent/JPS57193057A/en
Publication of JPH0315352B2 publication Critical patent/JPH0315352B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/186Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors having arrangements for blooming suppression

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)

Description

【発明の詳細な説明】 本発明は半導体装置に関し、特にフオトダイオ
ードアレーの特性改善に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to semiconductor devices, and particularly to improving the characteristics of photodiode arrays.

フオトダイオードアレーは、同一チツプに複数
のフオトダイオードを並べたものである。このフ
オトダイオードアレーでは、各単一フオトダイオ
ード間の信号の混入、つまりクロストークが実用
上大きな問題となつている。クロストークは光を
受けていないフオトダイオードに、光を受けたフ
オトダイオードからキヤリアが流れ込み、光を受
けていないフオトダイオードに電流が流れるため
に生じる。
A photodiode array consists of multiple photodiodes arranged on the same chip. In this photodiode array, signal mixing between each single photodiode, that is, crosstalk, is a major problem in practice. Crosstalk occurs because a carrier flows from a photodiode that receives light into a photodiode that does not receive light, and current flows to a photodiode that does not receive light.

従来のフオトダイオードアレーは、上記クロス
トークをなくするためフオトダイオード間に高不
純物層を入れ、その高不純物層でフオトダイオー
ド間に流れるキヤリアを消滅させてフオトダイオ
ード間に流れる電流を防いでいた。しかしこの構
造では高不純物層でキヤリアを消滅させるので受
光感度を悪くする欠点があつた。
In conventional photodiode arrays, in order to eliminate the above-mentioned crosstalk, a highly impurity layer is placed between the photodiodes, and the highly impurity layer eliminates carriers flowing between the photodiodes and prevents current from flowing between the photodiodes. However, this structure has the disadvantage that the highly impurity layer eliminates carriers, resulting in poor light-receiving sensitivity.

本発明の目的はこのような欠点をなくしたフオ
トダイオードアレーを提供することである。
It is an object of the present invention to provide a photodiode array which eliminates these drawbacks.

本発明は各フオトダイオードの動作層を上部と
側面から囲むようにp−n接合を形成することを
特徴とするフオトダイオードアレーである。
The present invention is a photodiode array characterized in that a pn junction is formed so as to surround the active layer of each photodiode from the top and sides.

以下図面を用いて本発明を詳細に説明する。 The present invention will be explained in detail below using the drawings.

第1図にフオトダイオードアレーの1例を示
す。フオトダイオードアレーの中の1つのフオト
ダイオード1は光2を受けフオトダイオード内部
にキヤリア3を発生する。発生したキヤリア3の
1部4は光を受けていないフオトダイオード5に
流れ込み、クロストーク特性が生じる。第2図は
そのクロストークをなくす構造をした従来のフオ
トダイオードアレーの1例を示す。フオトダイオ
ード11は光12を受けフオトダイオード内部に
キヤリア13を発生する。発生したキヤリア13
の1部14は光を受けていないフオトダイオード
15の方に流れるが、フオトダイオード間にある
高不純物層16でキヤリアは消滅し、光を受けて
いないフオトダイオード15に電流は流れず、ク
ロストークはなくなる。しかし消滅したキヤリア
の割合だけ受光感度は悪くなる。
FIG. 1 shows an example of a photodiode array. One photodiode 1 in the photodiode array receives light 2 and generates a carrier 3 inside the photodiode. A portion 4 of the generated carrier 3 flows into the photodiode 5 which does not receive light, resulting in a crosstalk characteristic. FIG. 2 shows an example of a conventional photodiode array having a structure that eliminates crosstalk. Photodiode 11 receives light 12 and generates carrier 13 inside the photodiode. Carrier 13 occurred
A portion of the current 14 flows toward the photodiode 15 that is not receiving light, but the carrier disappears in the highly impurity layer 16 between the photodiodes, and no current flows to the photodiode 15 that is not receiving light, resulting in crosstalk. will disappear. However, the light-receiving sensitivity deteriorates by the proportion of carriers that disappear.

第3図は本発明の一実施例を示す。フオトダイ
オード21は光22を受けフオトダイオード内部
にキヤリア23を発生する。横方向に流れるキヤ
リア24もフオトダイオード21の接合がペレツ
ト内部まであるためそこに流れ込み、受光感度を
良くする。また光を受けていないフオトダイオー
ド25にキヤリアを流さずクロストークをなくし
ている。
FIG. 3 shows an embodiment of the invention. The photodiode 21 receives the light 22 and generates a carrier 23 inside the photodiode. The carrier 24 flowing in the lateral direction also flows into the photodiode 21 since the junction of the photodiode 21 extends inside the pellet, improving the light receiving sensitivity. Also, crosstalk is eliminated by not passing a carrier to the photodiode 25, which is not receiving light.

以上説明したように本発明により、フオトダイ
オードの動作層を上部と側面から囲むようにp−
n接合を形成することにより、クロストークをな
くし、かつ受光感度を良くしたフオトダイオード
アレーが得られる。
As explained above, according to the present invention, a p-
By forming an n-junction, a photodiode array that eliminates crosstalk and improves light receiving sensitivity can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のフオトダイオードアレーの断面
図である。第2図はクロストークをなくした構造
の従来のフオトダイオードアレーの断面図であ
る。第3図は本発明によるフオトダイオードアレ
ーの一実施例の断面図である。 1,11,21……光を受けたフオトダイオー
ド、2,12,22……フオトダイオードに入る
光、3,13,23……フオトダイオード内部で
発生するキヤリア、4……光を受けないフオトダ
イオードに流れるキヤリア、14……高不純物層
で消滅するキヤリア、24……横方向に流れるキ
ヤリア、5,15,25……光を受けないフオト
ダイオード、16……高不純物層、7,17,2
7……動作層。
FIG. 1 is a cross-sectional view of a conventional photodiode array. FIG. 2 is a cross-sectional view of a conventional photodiode array having a structure that eliminates crosstalk. FIG. 3 is a cross-sectional view of one embodiment of a photodiode array according to the present invention. 1, 11, 21... Photodiode receiving light, 2, 12, 22... Light entering the photodiode, 3, 13, 23... Carrier generated inside the photodiode, 4... Photo not receiving light. Carrier flowing in the diode, 14...Carrier disappearing in the high impurity layer, 24...Carrier flowing in the horizontal direction, 5, 15, 25...Photodiode that does not receive light, 16...High impurity layer, 7, 17, 2
7...Operation layer.

Claims (1)

【特許請求の範囲】[Claims] 1 1つのペレツトに2つ以上のフオトダイオー
ドを有するフオトダイオードアレーにおいて、そ
れぞれのフオトダイオードの動作部を上部と側面
から囲むようにp−n接合をキヤリアが発生する
深部まで形成して隣接するフオトダイオードへの
キヤリアの流れ込みを妨げ、かつ受光感度を良く
したことを特徴とするフオトダイオードアレー。
1. In a photodiode array having two or more photodiodes in one pellet, a p-n junction is formed to surround the active part of each photodiode from the top and side to the deep part where carriers are generated, and the adjacent photodiode is A photo diode array that prevents the flow of carriers into the diode and improves light receiving sensitivity.
JP56077569A 1981-05-22 1981-05-22 Photodiode array Granted JPS57193057A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56077569A JPS57193057A (en) 1981-05-22 1981-05-22 Photodiode array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56077569A JPS57193057A (en) 1981-05-22 1981-05-22 Photodiode array

Publications (2)

Publication Number Publication Date
JPS57193057A JPS57193057A (en) 1982-11-27
JPH0315352B2 true JPH0315352B2 (en) 1991-02-28

Family

ID=13637642

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56077569A Granted JPS57193057A (en) 1981-05-22 1981-05-22 Photodiode array

Country Status (1)

Country Link
JP (1) JPS57193057A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59132657A (en) * 1983-01-20 1984-07-30 Matsushita Electric Ind Co Ltd Photoelectric conversion device

Also Published As

Publication number Publication date
JPS57193057A (en) 1982-11-27

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