JPH0534773B2 - - Google Patents
Info
- Publication number
- JPH0534773B2 JPH0534773B2 JP58227872A JP22787283A JPH0534773B2 JP H0534773 B2 JPH0534773 B2 JP H0534773B2 JP 58227872 A JP58227872 A JP 58227872A JP 22787283 A JP22787283 A JP 22787283A JP H0534773 B2 JPH0534773 B2 JP H0534773B2
- Authority
- JP
- Japan
- Prior art keywords
- particle
- electric field
- vacuum container
- potential
- mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 claims description 76
- 230000005684 electric field Effects 0.000 claims description 19
- 238000004458 analytical method Methods 0.000 claims description 7
- 230000007935 neutral effect Effects 0.000 description 17
- 238000004949 mass spectrometry Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、荷電粒子または中性粒子の質量を電
場を使つて分析する粒子分析器に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a particle analyzer that analyzes the mass of charged particles or neutral particles using an electric field.
従来より、荷電粒子や中性粒子の質量またはエ
ネルギを分析する粒子分析器として、粒子ビーム
を電場または磁場中に入射させ、各粒子の偏向量
を検出することによつて、粒子質量または粒子エ
ネルギを測定するようにしたものが知られてい
る。このような粒子分析器、例えば一例として
H、Dなどの中性粒子の質量とエネルギとを分析
する中性粒子質量エネルギ分析器は、第1図およ
び第2図に示す如く構成されている。
Conventionally, particle analyzers analyze the mass or energy of charged particles or neutral particles by injecting a particle beam into an electric or magnetic field and detecting the amount of deflection of each particle. There are known devices that measure . Such a particle analyzer, for example, a neutral particle mass energy analyzer for analyzing the mass and energy of neutral particles such as H and D, is constructed as shown in FIGS. 1 and 2.
すなわち、同図において1は真空容器であり、
この真空容器1の側壁には中性粒子ビーム2の入
射口である入射ポート3が設けられている。真空
容器1の内部には、上記中性粒子の軌道に対応さ
せて荷電交換セル4、磁極5a,5b、電極6
a,6b、粒子検出器7がそれぞれ収容されてい
る。荷電交換セル4は、内部に中性粒子をイオン
化させる荷電交換ガスPを収容するとともに、粒
子ビームの入射端側および出射端側にそれぞれ上
記粒子ビームを絞るとともに平行ビームに整形す
るアパーチヤを兼ねたコリメータ8,9を設けた
ものとなつている。前記磁極5a,5bは、第1
図中上下方向を長手とする長方形の磁極面10
a,10bを所定間隙をあけて対向配置して設け
られ、磁極5a,5bの基端に巻装されたコイル
11a,11bへの通電によつて、第1図中紙面
に直交する方向の磁場を生成する。また、前記電
極6a,6bは、第1図中上方から下方へその幅
が拡大する台形状の板体からなり、前記磁極面1
0a,10b間の所定間隔よりも広い間隔をあけ
て上記磁極面10a,10bと平行に対向配置さ
れている。そして、一方の電極6aは導電性部材
12および真空容器1を介して接地され、他方の
電極6aに対して負電位に保たれている。これに
よつて、上記電極6a,6b間には前記磁場と同
一方向の電場が形成される。なお、図中15は、
真空容器1内のガスQを排気する図示しないポン
プに通じる排気口である。 That is, in the figure, 1 is a vacuum container,
An input port 3, which is an input port for the neutral particle beam 2, is provided on the side wall of the vacuum container 1. Inside the vacuum container 1, there are a charge exchange cell 4, magnetic poles 5a, 5b, and electrodes 6 corresponding to the orbits of the neutral particles.
a, 6b, and a particle detector 7 are housed therein. The charge exchange cell 4 contains therein a charge exchange gas P that ionizes neutral particles, and also serves as an aperture that narrows the particle beam and shapes it into a parallel beam on the incident end side and the exit end side of the particle beam, respectively. Collimators 8 and 9 are provided. The magnetic poles 5a, 5b are
Rectangular magnetic pole face 10 whose length is the vertical direction in the figure
By energizing the coils 11a and 11b, which are arranged to face each other with a predetermined gap between them and are wound around the base ends of the magnetic poles 5a and 5b, a magnetic field in a direction perpendicular to the plane of the paper in FIG. 1 is generated. generate. Further, the electrodes 6a, 6b are made of trapezoidal plates whose width increases from the top to the bottom in FIG.
They are arranged parallel to and opposite to the magnetic pole faces 10a and 10b with an interval wider than a predetermined interval between them. One electrode 6a is grounded via the conductive member 12 and the vacuum container 1, and is maintained at a negative potential with respect to the other electrode 6a. As a result, an electric field in the same direction as the magnetic field is formed between the electrodes 6a and 6b. In addition, 15 in the figure is
This is an exhaust port leading to a pump (not shown) that exhausts the gas Q inside the vacuum container 1.
しかして、このように構成された中性粒子質量
エネルギ分析器において、入射ポート3から真空
容器1内に導入された中性粒子ビーム2は、荷電
交換セル4内を通過することによつて、荷電交換
ガスPと荷電交換されてイオン化され、荷電粒子
ビーム16となる。このとき、荷電粒子ビーム1
6は、荷電交換セル4の両端に設けられたアパー
チヤを兼用するコリメータ8,9によつて、所定
の太さ、形状の平行ビームに整形される。 In the neutral particle mass energy analyzer configured in this way, the neutral particle beam 2 introduced into the vacuum vessel 1 from the entrance port 3 passes through the charge exchange cell 4, thereby The charges are exchanged with the charge exchange gas P and ionized, resulting in a charged particle beam 16. At this time, charged particle beam 1
The beam 6 is shaped into a parallel beam having a predetermined thickness and shape by collimators 8 and 9 provided at both ends of the charge exchange cell 4 and also serving as apertures.
荷電交換セル4を通過した荷電粒子ビーム16
の各粒子は、磁極5a,5bで生成された磁場中
に導入されることによつて、粒子の運動方向およ
び磁場方向と直交する方向の力を受け、円形軌道
を辿つて180°偏向される。このとき各粒子の運動
半径は、各粒子の運動エネルギによつて決定され
る。したがつて、180°偏向された各粒子は、磁場
の端部において、運動エネルギに応じた位置から
次段の電場中に導入される。電場中を移動する各
荷電粒子は、電極6bに向かう方向に吸引され偏
向される。このときの各粒子の偏向量は、各粒子
の質量によつて決定される。 Charged particle beam 16 passing through charge exchange cell 4
By being introduced into the magnetic field generated by the magnetic poles 5a and 5b, each particle receives a force in a direction perpendicular to the direction of movement of the particle and the direction of the magnetic field, and is deflected by 180° following a circular trajectory. . At this time, the radius of motion of each particle is determined by the kinetic energy of each particle. Therefore, each particle deflected by 180° is introduced into the electric field of the next stage at a position corresponding to its kinetic energy at the end of the magnetic field. Each charged particle moving in the electric field is attracted and deflected in the direction toward the electrode 6b. The amount of deflection of each particle at this time is determined by the mass of each particle.
かくして、各粒子は、粒子検出器7における各
粒子の質量とエネルギとによつて決まる二次元的
位置にそれぞれ入射され、各粒子の質量およびエ
ネルギが測定される。 In this way, each particle is incident on the particle detector 7 at a two-dimensional position determined by the mass and energy of each particle, and the mass and energy of each particle are measured.
ところで、この種の粒子分析器では、前述した
如く電極6a,6bの一方の電極を真空容器1を
介して接地するとともに、他方の電極6bを上記
電極6aよりも低電位に保つことによつて、上記
両電極6a,6b間に電位差を持たせ、質量分析
用の電場を形成している。従つて、上記両電極6
a,6b間の荷電粒子入射部Rの電位は、接地電
位よりも低い電位となつている。
By the way, in this type of particle analyzer, as mentioned above, one of the electrodes 6a and 6b is grounded via the vacuum container 1, and the other electrode 6b is kept at a lower potential than the electrode 6a. A potential difference is provided between the two electrodes 6a and 6b to form an electric field for mass spectrometry. Therefore, both the electrodes 6
The potential of the charged particle entrance portion R between a and 6b is lower than the ground potential.
このため、荷電粒子が電場領域へ導入される際
に、入射部Rの電位によつて荷電粒子が加速さ
れ、測定誤差を生じてしまうという問題があつ
た。このような問題は粒子のエネルギが低いほど
顕著に現れるため、結局、低エネルギ粒子の質量
分析は、特に信頼性に欠けるという問題があつ
た。 Therefore, when the charged particles are introduced into the electric field region, the charged particles are accelerated by the potential of the entrance portion R, resulting in a measurement error. These problems become more pronounced as the energy of the particles decreases, and as a result, mass spectrometry of low-energy particles is particularly unreliable.
本発明は、このような問題点に基づきなされた
ものであり、その目的とするところは、質量分析
用の電場へ至る間に被分析粒子が上記電場の影響
を受けるのを抑制でき、もつて粒子エネルギの高
低にかかわりなく信頼性の高い分析が行なえる粒
子分析器を提供することにある。
The present invention has been made based on the above-mentioned problems, and its purpose is to suppress the influence of the electric field on the particles to be analyzed while reaching the electric field for mass spectrometry, and to It is an object of the present invention to provide a particle analyzer that can perform highly reliable analysis regardless of the level of particle energy.
本発明は、真空容器内部に形成された粒子ビー
ム分析用の電場における上記粒子ビームの入射部
の電位を、前記真空容器電位と同電位にするよう
にしたことを特徴としている。
The present invention is characterized in that the potential of the particle beam entrance part in the electric field for particle beam analysis formed inside the vacuum vessel is made to be the same potential as the vacuum vessel potential.
本発明によれば、質量分析用の電場における粒
子の入射部位置の電位を、真空容器の電位と等し
くなるようにしているので、上記電場の粒子入射
部と真空容器内面との間に電位差を生ずることが
ない。したがつて、上記電場に粒子が入射される
までの間に粒子が加速されることがなく、結局、
粒子エネルギの高低にかかわりなく、信頼性の高
い分析が行なえるという効果を奏する。
According to the present invention, the potential at the particle entrance position in the electric field for mass spectrometry is made equal to the potential of the vacuum container, so that a potential difference is created between the particle entrance part of the electric field and the inner surface of the vacuum container. It never occurs. Therefore, the particles are not accelerated until they are introduced into the electric field, and as a result,
The effect is that highly reliable analysis can be performed regardless of the level of particle energy.
以下、本発明の詳細を図示の実施例に基づき説
明する。
Hereinafter, details of the present invention will be explained based on illustrated embodiments.
第3図および第4図は、本発明を中性粒子質量
エネルギ分析器に適用した一実施例を示すもの
で、第1図および第2図と同一部分は同一符号で
示している。したがつて重複する部分の詳しい説
明は省くことにする。 3 and 4 show an embodiment in which the present invention is applied to a neutral particle mass energy analyzer, and the same parts as in FIGS. 1 and 2 are designated by the same reference numerals. Therefore, a detailed explanation of the overlapping parts will be omitted.
この実施例が前述した従来例と異なる点は、電
極6a,6bと真空容器1との電気的な接続関係
にある。すなわち、本実施例に係る電極6a,6
bは、共に絶縁部材21,22を介して真空容器
1に固定されている。真空容器1は接地されてお
り、この真空容器1と上記電極6aとの間には電
源23が接続され、真空容器1と前記電極6bと
の間には、電源24が接続されている。これによ
つて、電極6aは接地電位よりも高い電位に保持
され、電極6bは接地電位よりも低い電位に保持
される。そして、各電源23,24の電圧が荷電
粒子入射部Rと各電極6a,6bとの間の距離に
対応した値に設定され、これによつて荷電粒子入
射部Rの電位が略接地電位と等しくなるように設
定されている。したがつて、上記荷電粒子入射部
Rと真空容器1とは略同電位となつている。 This embodiment differs from the conventional example described above in the electrical connection relationship between the electrodes 6a, 6b and the vacuum vessel 1. That is, the electrodes 6a, 6 according to this embodiment
b are both fixed to the vacuum container 1 via insulating members 21 and 22. The vacuum container 1 is grounded, a power source 23 is connected between the vacuum container 1 and the electrode 6a, and a power source 24 is connected between the vacuum container 1 and the electrode 6b. As a result, the electrode 6a is held at a potential higher than the ground potential, and the electrode 6b is held at a potential lower than the ground potential. Then, the voltage of each power source 23, 24 is set to a value corresponding to the distance between the charged particle entrance part R and each electrode 6a, 6b, and thereby the potential of the charged particle entrance part R becomes approximately ground potential. are set to be equal. Therefore, the charged particle entrance portion R and the vacuum container 1 are at approximately the same potential.
このような構成であると、荷電粒子入射部Rと
真空容器1の内面との間に電位差が生じないの
で、荷電粒子入射部Rにおいて荷電粒子が加速さ
れることがない。したがつて、電場を通過する荷
電粒子の速度は、上記荷電粒子が本来保有する運
動エネルギによつて決定され、正確な質量エネル
ギ分析が可能となる。 With such a configuration, no potential difference is generated between the charged particle entrance portion R and the inner surface of the vacuum container 1, so that the charged particles are not accelerated in the charged particle entrance portion R. Therefore, the speed of a charged particle passing through an electric field is determined by the kinetic energy inherent in the charged particle, allowing accurate mass-energy analysis.
なお、上述した実施例は本発明をエネルギ分析
用磁場と、質量分析用電場とがそれぞれ異なる領
域に形成されたものに適用した例であるが、例え
ば第5図および第6図に示すように、磁極31
a,31bの対向する各面に絶縁部材32,33
を介して電極34a,34b間に電場領域と磁場
領域とを重量形成させた粒子分析器においても、
本発明を適用することが可能である。 The above embodiment is an example in which the present invention is applied to an energy analysis magnetic field and a mass analysis electric field formed in different regions, but for example, as shown in FIGS. 5 and 6, , magnetic pole 31
Insulating members 32, 33 are provided on each opposing surface of a, 31b.
Even in a particle analyzer in which an electric field region and a magnetic field region are formed between the electrodes 34a and 34b via the
It is possible to apply the present invention.
この場合においても、上述と同様に、真空容器
1を接地して、この真空容器1と電極34aとの
間に電源35を、また真空容器1と電極34bと
の間に電源36をそれぞれ接続する。そして、電
極34aが正電位、電極34bが負電位となるよ
うに各電源の極性を合せるとともに粒子入射部R
と各電極34a,34bとの距離に対応させて各
電源35,36の電圧を設定し、これによつて粒
子入射部Rの電位を真空容器1のレベルと等しく
することによつて、前記実施例と同様の効果を発
揮させることができる。 In this case as well, similarly to the above, the vacuum container 1 is grounded, and the power source 35 is connected between the vacuum container 1 and the electrode 34a, and the power source 36 is connected between the vacuum container 1 and the electrode 34b. . Then, the polarity of each power source is matched so that the electrode 34a has a positive potential and the electrode 34b has a negative potential, and the particle entrance portion R
By setting the voltages of the power supplies 35 and 36 in accordance with the distance between the electrodes 34a and 34b, and thereby making the potential of the particle entrance part R equal to the level of the vacuum vessel 1, The same effect as in the example can be achieved.
なお、以上は、主として中性粒子の質量エネル
ギ分析器について本発明を適用した場合を例示し
たが、荷電交換セル4を単にコリメータに置換す
ることにより、荷電粒子分析器にも適用可能であ
る。また、真空容器内に単に電場領域のみを設け
た粒子質量分析器にも適用可能であることは言う
までもない。 Although the present invention has been mainly applied to a mass energy analyzer for neutral particles, it can also be applied to a charged particle analyzer by simply replacing the charge exchange cell 4 with a collimator. It goes without saying that the present invention can also be applied to a particle mass spectrometer in which only an electric field region is provided within a vacuum container.
第1図は従来の中性粒子質量エネルギ分析器を
概略的に示す断面図、第2図は同器を第1図にお
けるA−A線に沿つて切断し矢印方向に見た図、
第3図は本発明の一実施例に係る中性粒子質量エ
ネルギ分析器を概略的に示す断面図、第4図は同
器を第3図におけるB−B線に沿つて切断し矢印
方向に見た図、第5図は本発明の他の実施例に係
る中性粒子質量エネルギ分析器を概略的に示す断
面図、第6図は同器を第5図におけるC−C線に
沿つて切断し矢印方向に見た図である。
1……真空容器、2……中性粒子ビーム、3…
…入射ポート、4……荷電交換セル、5a,5
b,31a,31b……磁極、6a,6b,34
a,34b……電極、7……粒子検出器、8,9
……コリメータ、10a,10b……磁極面、1
1a,11b……コイル、12……導電性部材、
13,21,22,32,33……絶縁部材、1
4,23,24,35,36……電源、15……
排気口、16……荷電粒子ビーム、P……荷電交
換ガス、R……粒子入射部。
FIG. 1 is a cross-sectional view schematically showing a conventional neutral particle mass energy analyzer, and FIG. 2 is a view of the same device cut along the line A-A in FIG. 1 and viewed in the direction of the arrow.
FIG. 3 is a cross-sectional view schematically showing a neutral particle mass energy analyzer according to an embodiment of the present invention, and FIG. 4 is a cross-sectional view of the neutral particle mass energy analyzer according to an embodiment of the present invention. FIG. 5 is a cross-sectional view schematically showing a neutral particle mass energy analyzer according to another embodiment of the present invention, and FIG. 6 is a cross-sectional view of the neutral particle mass energy analyzer according to another embodiment of the present invention. It is a cutaway view seen in the direction of the arrow. 1... Vacuum vessel, 2... Neutral particle beam, 3...
...Injection port, 4...Charge exchange cell, 5a, 5
b, 31a, 31b...magnetic pole, 6a, 6b, 34
a, 34b...electrode, 7...particle detector, 8,9
...Collimator, 10a, 10b...Magnetic pole surface, 1
1a, 11b... Coil, 12... Conductive member,
13, 21, 22, 32, 33...Insulating member, 1
4, 23, 24, 35, 36...power supply, 15...
Exhaust port, 16...Charged particle beam, P...Charge exchange gas, R...Particle incidence part.
Claims (1)
に電場を形成するとともに被分析粒子ビームを上
記電場で偏向させ、その偏向量を検出することに
よつて前記ビームを構成する各粒子の質量を分析
するようにした粒子分析器において、前記真空容
器に対して前記一対の電極をそれぞれ絶縁状態に
保持する手段と、この手段によつて保持された前
記一対の電極間に上記電極間の途中位置が前記真
空容器のレベルと等しい分析用電場を形成する手
段とを具備したことを特徴とする粒子分析器。1. An electric field is formed between a pair of electrodes placed opposite each other inside a vacuum container, and the particle beam to be analyzed is deflected by the electric field. By detecting the amount of deflection, the mass of each particle constituting the beam can be determined. In a particle analyzer adapted for analysis, means for holding the pair of electrodes in an insulated state with respect to the vacuum container, and a position midway between the pair of electrodes held by this means. and means for forming an analytical electric field equal to the level of the vacuum vessel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58227872A JPS60121660A (en) | 1983-12-02 | 1983-12-02 | Particle analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58227872A JPS60121660A (en) | 1983-12-02 | 1983-12-02 | Particle analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60121660A JPS60121660A (en) | 1985-06-29 |
| JPH0534773B2 true JPH0534773B2 (en) | 1993-05-24 |
Family
ID=16867668
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58227872A Granted JPS60121660A (en) | 1983-12-02 | 1983-12-02 | Particle analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60121660A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013130413A (en) * | 2011-12-20 | 2013-07-04 | Hitachi-Ge Nuclear Energy Ltd | Radiation spectrometer |
-
1983
- 1983-12-02 JP JP58227872A patent/JPS60121660A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60121660A (en) | 1985-06-29 |
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