JPH0556012B2 - - Google Patents
Info
- Publication number
- JPH0556012B2 JPH0556012B2 JP62042191A JP4219187A JPH0556012B2 JP H0556012 B2 JPH0556012 B2 JP H0556012B2 JP 62042191 A JP62042191 A JP 62042191A JP 4219187 A JP4219187 A JP 4219187A JP H0556012 B2 JPH0556012 B2 JP H0556012B2
- Authority
- JP
- Japan
- Prior art keywords
- electrolytic capacitor
- leakage current
- measured
- charging station
- leak current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 28
- 238000007689 inspection Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 230000032683 aging Effects 0.000 description 10
- 230000028161 membrane depolarization Effects 0.000 description 9
- 238000005259 measurement Methods 0.000 description 6
- 230000002159 abnormal effect Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002999 depolarising effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【発明の詳細な説明】
発明の目的
（産業上の利用分野）
本発明は電解コンデンサにおけるリーク電流特
性の測定に基づいて電解コンデサの良否を判定す
る方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION Object of the Invention (Field of Industrial Application) The present invention relates to a method for determining the quality of an electrolytic capacitor based on measurement of leakage current characteristics in the electrolytic capacitor.
（従来の技術）
電解コンデンサの特性を安定させるための手段
として高温加熱と共に通電し、誘電体の損傷修復
及び絶縁被膜形成を行なういわゆるエージング処
理があり、電解コンデンサの検査項目の１つであ
るリーク電流レベルの自動測定がエージング処理
の直後に行われている。この従来方法では電解コ
ンデンサ正電圧印加を行なう充電ステーシヨン列
に沿つて移送され、充電ステーシヨン列の適宜位
置で電流測定が行われる。(Prior art) As a means of stabilizing the characteristics of electrolytic capacitors, there is a so-called aging treatment in which high temperature heating and electricity are applied to repair damage to the dielectric and form an insulating film. Automatic measurements of current levels are performed immediately after the aging process. In this conventional method, an electrolytic capacitor is transported along a row of charging stations to which a positive voltage is applied, and current measurements are performed at appropriate positions in the row of charging stations.
（発明が解決しようとする問題点）
ところが、誘電体の損傷修復及び絶縁被膜形成
が不完全であつたにも関わらず、エージング処理
直後には測定されたリーク電流特性が一時的に正
常状態を示すことがある。これは本来の絶縁被膜
形成の代わりに気泡形成が行われてしまうことに
起因するものであり、数時間放置後には気泡とい
う疑似絶縁被膜の消失により測定リーク電流特性
が異常状態に復帰する。このような電解コンデン
サは良品として機能し得ないものであるが、前記
のような理由により良否の誤判定が避けられな
い。(Problem to be Solved by the Invention) However, even though the damage to the dielectric and the formation of the insulating film were incomplete, the measured leakage current characteristics temporarily returned to the normal state immediately after the aging treatment. There is something to show. This is due to the formation of bubbles instead of the original formation of an insulating film, and after several hours of standing, the measured leakage current characteristics return to the abnormal state due to the disappearance of the pseudo insulating film called bubbles. Although such an electrolytic capacitor cannot function as a non-defective product, erroneous determination of pass/fail is unavoidable for the reasons described above.
発明の構成
（問題点を解決するための手段）
そこで本発明では、電解コンデンサに対して負
電圧印加による減極及び放電を予め行なつてお
き、正電圧印加を行なう充電ステーシヨン列に沿
つて前記減極及び放電された電解コンデンサを通
過させると共に、充電ステーシヨン列の中間部で
中間リーク電流を測定し、予め設定された中間リ
ーク電流と測定中間リーク電流との比較に基づい
て電解コンデンサの良否を判定するようにした。Structure of the Invention (Means for Solving Problems) Therefore, in the present invention, the electrolytic capacitor is depolarized and discharged in advance by applying a negative voltage, and then the electrolytic capacitor is depolarized and discharged in advance along the charging station row to which a positive voltage is applied. While passing through the depolarized and discharged electrolytic capacitor, the intermediate leakage current is measured at the middle part of the charging station row, and the quality of the electrolytic capacitor is determined based on the comparison between the preset intermediate leakage current and the measured intermediate leakage current. I decided to judge.
（作用）
即ち、リーク電流測定のための充電に先立つて
負電圧印加による減極及び放電を行なうことによ
り、エージング処理時に形成された疑似絶縁被
膜、すなわち気泡が除去される。これにより疑似
絶縁被膜に起因するリーク電流特性の見掛けの正
常性が表れることはなく、エージング直後におい
ても中間リーク電流の測定結果は検査対象の電解
コンデンサの正確なリーク電流特性を示す。従つ
て、エージング処理直後のリーク電流測定によつ
てもリーク電流特性の正常あるいは異常の判定を
確実に行なうことができ、不良品の選別を確実に
行なうことができる。(Function) That is, by depolarizing and discharging by applying a negative voltage prior to charging for measuring leakage current, the pseudo insulating film, that is, the bubbles formed during the aging treatment is removed. As a result, the apparent normality of leakage current characteristics caused by the pseudo-insulating film does not appear, and even immediately after aging, the intermediate leakage current measurement results show accurate leakage current characteristics of the electrolytic capacitor under test. Therefore, it is possible to reliably determine whether the leak current characteristics are normal or abnormal even by measuring the leak current immediately after the aging process, and it is possible to reliably select defective products.
（実施例）
以下、本発明を具体化した一実施例を図面に基
づいて説明する。(Example) Hereinafter, an example embodying the present invention will be described based on the drawings.
直流電源１を含む回路は正電圧印加を行なう複
数の充電ステーシヨンSp（１），Sp（２）……Sp
（ｎ−１），Sp(n)，Sp（ｎ＋１）、Sp（ｎ＋２）…
…Sp（２ｎ−１）、Sp（２ｎ）を直列構成し、この
うちの充電ステーシヨンSp(n)、Sp（２ｎ）には判
別回路Ｃが接続されている。判別回路Ｃは、充電
ステーシヨンSp(n)、Sp（２ｎ）から取り出される
電流値と、予め設定された電流値とを比較し、測
定電流値と設定電流値との差が許容値以上であれ
ば所定の信号を出力する。 The circuit including the DC power supply 1 includes a plurality of charging stations Sp(1), Sp(2)...Sp that apply positive voltage.
(n-1), Sp(n), Sp(n+1), Sp(n+2)...
...Sp(2n-1) and Sp(2n) are configured in series, and a discriminating circuit C is connected to the charging stations Sp(n) and Sp(2n). Discrimination circuit C compares the current value taken out from charging station Sp(n), Sp(2n) with a preset current value, and determines whether the difference between the measured current value and the set current value is greater than the allowable value. For example, a predetermined signal is output.
充電ステーシヨンSp(1)側には放電回路が隣接
設置されており、一対の放電ステーシヨンSe(1)、
Se(2)が充電ステーシヨンSp(1)〜Sp（２ｎ）列の延
長上に直列構成されている。放電ステーシヨン
Se（１）側には直流電源２を含む減極回路が隣接
位置されており、一対の減極ステーシヨンSm
（１）、Sm(2)が同じく充電ステーシヨンSp（１）
〜Sp（２ｎ）列の延長上に直列構成されている。 A discharge circuit is installed adjacent to the charging station Sp(1) side, and a pair of discharge stations Se(1),
Se(2) is arranged in series on an extension of the charging stations Sp(1) to Sp(2n). discharge station
On the Se(1) side, a depolarization circuit including a DC power source 2 is located adjacent to the depolarization station Sm.
(1), Sm(2) is also the charging station Sp(1)
~Sp(2n) They are arranged in series on an extension of the column.
エージング処理直後の電解コンデンサ３は図示
しない移送機構により減極ステーシヨンSm（１）
側から送り込まれ、減極ステーシヨンSm（１），
Sm（２）にて負電圧印加による減極作用を受けた
後、放電ステーシヨンSe（１）、Se（２）にて放電
する。エージング処理に伴つて疑似絶縁被膜を形
成されている電解コンデンサ３がこの減極及び放
電作用を受けると、疑似絶縁被膜が除去される。
減極及び放電作用を受けた電解コンデンサ３は充
電ステーシヨンSp（１）〜Sp（２ｎ）列へ送りこ
まれ、充電ステーシヨンSp（１）側から順次正電
圧印加を受ける。電解コンデンサ３が中間の充電
ステーシヨンSp(n)から正電圧印加を受ける際、
この充電ステーシヨンSp(n)に流れる電流値Ib(n)
が測定される。そして、電解コンデンサ３が最終
の充電ステーシヨンSp（２ｎ）から正電圧印加を
受ける際にも、この正充電ステーシヨンSp（２
ｎ）に流れる電流値が測定される。 Immediately after the aging treatment, the electrolytic capacitor 3 is transferred to the depolarization station Sm (1) by a transfer mechanism (not shown).
The depolarization station Sm (1) is fed in from the side,
After receiving a depolarization effect by applying a negative voltage at Sm(2), discharge occurs at discharge stations Se(1) and Se(2). When the electrolytic capacitor 3 on which the pseudo-insulating film is formed as a result of the aging process is subjected to this depolarization and discharge action, the pseudo-insulating film is removed.
The electrolytic capacitor 3 that has been depolarized and discharged is sent to the charging stations Sp(1) to Sp(2n), and is sequentially applied with a positive voltage from the charging station Sp(1) side. When the electrolytic capacitor 3 receives a positive voltage from the intermediate charging station Sp(n),
Current value Ib(n) flowing through this charging station Sp(n)
is measured. Also, when the electrolytic capacitor 3 receives a positive voltage from the final charging station Sp (2n), this positive charging station Sp (2n)
The value of the current flowing through n) is measured.
第２図に示す曲線Ｂはリーク電流特性異常の電
解コンデンサ３におけるリーク電流曲線であり、
曲線Ａはリーク電流特性正常の電解コンデンサに
おけるリーク電流曲線である。電流値Ia（2n）は
充電ステーシヨンSp（２ｎ）での測定時期Ｔ（2n）
に完全充電された場合の正常リーク電流であり、
リーク電流特性異常の曲線Ｂにおいても完全充電
された場合のリーク電流値はIa（2n）にほぼ一致
する。判定回路Ｃは充電ステーシヨンSp(n)での
測定時期Ｔ(n)に対応して予め設定された中間リー
ク電流値Ia(n)と測定された中間リーク電流値Ib(n)
とを比較し、設定中間リーク電流値Ia(n)と測定中
間リーク電流値Ib(n)との差が所定値以上の場合に
はリーク電流特性異常と判定し、所定の信号を出
力する。曲線Ｂで示すようなリーク電流特性を持
つ電解コンデンサ３は予め減極及び放電作用を受
けて疑似絶縁被覆を除去されているため、疑似絶
縁被膜に起因するリーク電流特性の見掛けの正常
性が表れることはない。そのため、エージング直
後においても中間リーク電流の測定結果は検査対
象の電解コンデンサ３の正確なリーク電流特性を
示し、不良電解コンデンサの選別が確実に行われ
る。減極及び放電作用を受けない良否いずれの電
解コンデンサにおいてもエージング処理直後に測
定されたリーク電流特性は曲線Ａとなつてしま
い、安定した良否検査を期待することはできな
い。 Curve B shown in FIG. 2 is a leakage current curve in the electrolytic capacitor 3 with abnormal leakage current characteristics.
Curve A is a leakage current curve for an electrolytic capacitor with normal leakage current characteristics. Current value Ia (2n) is measured at charging station Sp (2n) at time T (2n)
This is the normal leakage current when fully charged.
Even in the curve B of leakage current characteristic abnormality, the leakage current value when fully charged almost matches Ia(2n). Judgment circuit C determines intermediate leak current value Ia(n) that is preset corresponding to measurement time T(n) at charging station Sp(n) and measured intermediate leak current value Ib(n).
If the difference between the set intermediate leak current value Ia(n) and the measured intermediate leak current value Ib(n) is greater than or equal to a predetermined value, it is determined that the leak current characteristic is abnormal, and a predetermined signal is output. Since the electrolytic capacitor 3 having the leakage current characteristics as shown by curve B has been previously depolarized and discharged to remove the pseudo-insulating coating, the apparent normality of the leakage current characteristics due to the pseudo-insulating coating appears. Never. Therefore, even immediately after aging, the intermediate leakage current measurement results show accurate leakage current characteristics of the electrolytic capacitor 3 to be inspected, and defective electrolytic capacitors can be reliably selected. In both good and bad electrolytic capacitors that are not subjected to depolarization and discharge effects, the leakage current characteristics measured immediately after the aging treatment become curve A, and stable quality inspection cannot be expected.
発明の効果
以上詳述したように本発明は、電解コンデンサ
のリーク電流測定のための充電に先立つて減極及
び放電を行なうようにしたので、検査対象の電解
コンデンサの正確なリーク電流特性を測定するこ
とができ、安定した良否判定を行い得るという優
れた効果を奏する。Effects of the Invention As detailed above, the present invention performs depolarization and discharging prior to charging for measuring leakage current of an electrolytic capacitor, so accurate leakage current characteristics of the electrolytic capacitor to be inspected can be measured. This has the excellent effect of making stable pass/fail judgments possible.
第１図は本発明を具体化した一実施例を示す回
路図、第２図はリーク電流特性曲線のグラフであ
る。
電解コンデンサ３、減極ステーシヨン……Sm
（１），Sm（２）、放電ステーシヨン……Se（１），
Se（２）、充電ステーシヨン……Sp（１），Sp（２）
……Sp（２ｎ）、判別回路……Ｃ。
FIG. 1 is a circuit diagram showing an embodiment embodying the present invention, and FIG. 2 is a graph of a leakage current characteristic curve. Electrolytic capacitor 3, depolarization station...Sm
(1), Sm (2), discharge station...Se (1),
Se (2), charging station...Sp (1), Sp (2)
...Sp (2n), discrimination circuit...C.
Claims (1)
極及び放電を予め行なつておき、正電圧印加を行
なう充電ステーシヨン列に沿つて前記減極及び放
電された電解コンデンサを通過させると共に、充
電ステーシヨン列の中間部で中間リーク電流を測
定し、予め設定された中間リーク電流と測定中間
リーク電流との比較に基づいて電解コンデンサの
良否を判定する電解コンデンサの検査方法。1 Depolarize and discharge the electrolytic capacitor by applying a negative voltage in advance, and pass the depolarized and discharged electrolytic capacitor along the charging station row to which a positive voltage is applied, and An electrolytic capacitor inspection method that measures an intermediate leak current at an intermediate portion and determines the quality of the electrolytic capacitor based on a comparison between a preset intermediate leak current and the measured intermediate leak current.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62042191A JPS63208770A (en) | 1987-02-25 | 1987-02-25 | Inspecting method for electrolytic capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62042191A JPS63208770A (en) | 1987-02-25 | 1987-02-25 | Inspecting method for electrolytic capacitor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63208770A JPS63208770A (en) | 1988-08-30 |
| JPH0556012B2 true JPH0556012B2 (en) | 1993-08-18 |
Family
ID=12629115
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62042191A Granted JPS63208770A (en) | 1987-02-25 | 1987-02-25 | Inspecting method for electrolytic capacitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63208770A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105372524B (en) * | 2015-11-04 | 2018-03-16 | 南通新三能电子有限公司 | A kind of aging method of large-scale welding needle type capacitor |
-
1987
- 1987-02-25 JP JP62042191A patent/JPS63208770A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63208770A (en) | 1988-08-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |