JPH06415B2 - Method of equalizing resistance of thermal head - Google Patents
Method of equalizing resistance of thermal headInfo
- Publication number
- JPH06415B2 JPH06415B2 JP20400786A JP20400786A JPH06415B2 JP H06415 B2 JPH06415 B2 JP H06415B2 JP 20400786 A JP20400786 A JP 20400786A JP 20400786 A JP20400786 A JP 20400786A JP H06415 B2 JPH06415 B2 JP H06415B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- output terminal
- probe
- resistance value
- pulse power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/315—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
- B41J2/32—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
- B41J2/345—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads characterised by the arrangement of resistors or conductors
Landscapes
- Electronic Switches (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 この発明は電圧パルスの印加によって発熱抵抗体の抵抗
値を調整するサーマルヘッドの抵抗値均一化方法に関す
るものである。The present invention relates to a method for equalizing the resistance value of a thermal head, which adjusts the resistance value of a heating resistor by applying a voltage pulse.
〔従来の技術〕 第3図は例えば特開昭61−83053号公報に示され
たサーマルヘッドの抵抗値均一化方法を実施する装置を
示す回路図であり、図において、1はサーマルヘッドの
共通電極、2は同じく電極、3はこの共通電1とリード
電極2との間に形成される発熱抵抗体、4はパルス電
源、5は前記共通電極1と接触してこれを前記パルス電
源4の負の出力端子へ接続する共通探針、6は前記各リ
ード電極2と個別に接触する個別探針、7はこの個別探
針6と前記パルス電源4との間に配されて、前記個別探
針6の内の1つを選択し、それが接触しているリード電
極2をパルス電源4の正の出力端子へ接続するスイッチ
ング回路である。[Prior Art] FIG. 3 is a circuit diagram showing an apparatus for carrying out a method of equalizing the resistance value of a thermal head disclosed in, for example, Japanese Patent Laid-Open No. 61-83053, in which 1 is a common thermal head. Electrodes 2, 2 are electrodes, 3 is a heating resistor formed between the common electrode 1 and the lead electrode 2, 4 is a pulse power source, 5 is a contact with the common electrode 1, which is connected to the pulse power source 4. A common probe connected to the negative output terminal, 6 is an individual probe individually contacting each of the lead electrodes 2, and 7 is arranged between the individual probe 6 and the pulse power source 4, and the individual probe is provided. It is a switching circuit that selects one of the needles 6 and connects the lead electrode 2 with which it is in contact to the positive output terminal of the pulse power supply 4.
次に動作について説明する。まず、スイッチング回路7
よって個別探針6中の1つが選択され、当該個別探針6
が接触しているリード電極2がパルス電源4に接続され
る。ここでパルス電源4がその第1の出力端子と第2の
出力端子の間に電圧パルスを発生すると、当該リード電
極2と共通電極1間の発熱抵抗体3にこの電圧パルスが
印加され、その発熱抵抗体3の抵抗値が低下する。以
下、当該発熱抵抗体3の抵抗値が所定の値に低下するま
で、その電圧値を逐次上昇させながら電圧パルスの印加
を繰返す。また、この電圧パルスの印加は、発熱抵抗体
3の初期の抵抗値に基づいて、それを所定の抵抗値まで
低下させるに必要な電圧パルスの印加電圧を求め、当該
電圧の電圧パルスを1回だけ印加するようにしてもよ
い。Next, the operation will be described. First, the switching circuit 7
Therefore, one of the individual probes 6 is selected, and the individual probe 6 is selected.
The lead electrode 2 in contact with is connected to the pulse power source 4. Here, when the pulse power supply 4 generates a voltage pulse between its first output terminal and its second output terminal, this voltage pulse is applied to the heating resistor 3 between the lead electrode 2 and the common electrode 1, The resistance value of the heating resistor 3 decreases. Hereinafter, the application of the voltage pulse is repeated while sequentially increasing the voltage value until the resistance value of the heating resistor 3 decreases to a predetermined value. In addition, the voltage pulse is applied based on the initial resistance value of the heating resistor 3 to obtain an applied voltage of the voltage pulse required to reduce it to a predetermined resistance value, and the voltage pulse of the voltage is applied once. You may make it apply only.
このようにして、1つのリード電極2に対応する発熱抵
抗体3の抵抗値の調整が済むと、スイッチング回路7に
よって隣接する個別探針6を選択し、前述と同様にして
対応する発熱抵抗体3の抵抗値の調整を行ない、以下、
順次これを繰返して、サーマルヘッドの抵抗値を均一化
する。In this way, when the resistance value of the heating resistor 3 corresponding to one lead electrode 2 is adjusted, the adjacent individual probe 6 is selected by the switching circuit 7, and the corresponding heating resistor is selected in the same manner as described above. After adjusting the resistance value of 3,
This is sequentially repeated to make the resistance value of the thermal head uniform.
従来のサーマルヘッドの抵抗値均一化方法は以上のよう
に行なわれているので、電圧パルスが印加されるリード
電極に隣接しているリード電極は電気的にフローティン
グの状態にあり、一方、リード電極相互間の間隙lは高
密度実装、高解像度化等の要求から極めて狭いものとな
るため、1つのリード電極に電圧パルスを印加した場
合、その電圧が高くなると隣接するリード電極に静電誘
導あるいは放電等によって電圧が発生し、せっかく調整
の済んだ抵抗発熱体の抵抗値を乱してしまったり、未調
整のものでも高電圧が印加されることで抵抗値が必要以
上に降下して以後調整が不能となるなど、精度良く抵抗
値の均一化を行なうことが困難であるという問題点があ
った。Since the conventional method of equalizing the resistance value of the thermal head is performed as described above, the lead electrode adjacent to the lead electrode to which the voltage pulse is applied is in an electrically floating state, while the lead electrode is The gap l between them is extremely narrow due to demands for high-density mounting, high resolution, etc. Therefore, when a voltage pulse is applied to one lead electrode, if the voltage becomes high, electrostatic induction or Voltage is generated due to discharge, etc. and disturbs the resistance value of the resistance heating element that has already been adjusted, or even if it is not adjusted the high voltage is applied and the resistance value drops more than necessary However, there is a problem that it is difficult to make the resistance values uniform with high accuracy.
この発明は以上のような問題点を解消するためになされ
たもので、隣接するリード電極力に静電誘導、放電等に
よって電圧が印加されるのを防止し、精度良く抵抗値の
均一化が行なえるサーマルヘッドの抵抗値均一化方法を
得ることを目的とする。The present invention has been made in order to solve the above problems, and prevents a voltage from being applied to the force of an adjacent lead electrode due to electrostatic induction, discharge, or the like, so that the resistance value can be made uniform with high accuracy. It is an object of the present invention to obtain a method for equalizing the resistance value of a thermal head that can be performed.
この発明に係るサーマルヘッドの抵抗値均一化方法は、
スイッチング回路の切換形スイッチ素子の切換電極を前
記各個別探針にそれぞれ接続するとともに、前記各切換
形スイッチの常閉側電極は前記共通探針と同じ極(正,
負)に接続され、常開側電極は前記共通探針と違う極
(正,負)に接続し、スイッチング回路によって選択さ
れた前記個別探針によってパルス電源の第1の出力端子
と接続されたリード電極に隣接したリード電極を、選択
されていない個別探針によって前記共通探針とともに前
記パルス電源の第2の出力端子に接続するようにしたも
のである。The method of equalizing the resistance value of the thermal head according to the present invention is
The switching electrodes of the switching switch elements of the switching circuit are respectively connected to the individual probes, and the normally closed electrodes of the switching switches have the same pole (positive, positive,
Negative side), the normally open side electrode is connected to a pole (positive or negative) different from the common probe, and is connected to the first output terminal of the pulse power source by the individual probe selected by the switching circuit. The lead electrode adjacent to the lead electrode is connected to the second output terminal of the pulse power source together with the common probe by an unselected individual probe.
この発明におけるサーマルヘッドの抵抗値均一化方法
は、選択された個別探針によってそれが接触しているリ
ード電極をパルス電源の第1の出力端子に接続して、パ
ルス電源の第2の出力端子が接続されている共通電極と
の間の発熱抵抗体に所定の電圧パルスを印加するととも
に、前記リード電極に隣接するリード電極を前記選択さ
れていない個別探針によって共通探針とともに前記パル
ス電源の第2の出力端子に接続して前記共通電極と同電
位に保持することにより、前記リード電極への静電誘
導,放電等による電圧の印加を防止し、発熱抵抗体の抵
抗値の均一化を精度良く行なうことができる。In the method of equalizing the resistance value of the thermal head according to the present invention, the lead electrode in contact with the selected individual probe is connected to the first output terminal of the pulse power source, and the second output terminal of the pulse power source is connected. A predetermined voltage pulse is applied to the heating resistor between the common electrode and the common electrode connected thereto, and the lead electrode adjacent to the lead electrode is connected to the common probe by the unselected individual probe and the pulse power source By connecting to the second output terminal and holding the same potential as the common electrode, application of voltage to the lead electrode due to electrostatic induction, discharge, etc. is prevented and the resistance value of the heating resistor is made uniform. It can be done accurately.
以下、この発明の一実施例を図について説明する。第1
図において、1は共通電極、2はリード電極、3は発熱
抵抗体、4はパルス電源、5は共通探針、6は個別探針
であり、第3図に同一符号を付したものと同等なもので
あるため、詳細に説明は省略する。An embodiment of the present invention will be described below with reference to the drawings. First
In the figure, 1 is a common electrode, 2 is a lead electrode, 3 is a heating resistor, 4 is a pulse power source, 5 is a common probe, and 6 is an individual probe, which are equivalent to those shown in FIG. Therefore, detailed description thereof will be omitted.
次に、7は第3図のスイッチング回路7に相当するスイ
ッチング回路で、スイッチ素子は階層構造をなして配列
され、最下層では切換形スイッチ素子8が個別探針6に
対応して設けられている。各切換形スイッチ素子8は、
その切換電極8aが対応付けられた個別探針6に接続さ
れている。また、その常閉側電極8cは共通探針5と同
じ極(正,負)に接続され、常開接点8bは前記共通探
針5と違う極(正,負)に接続されている。Next, 7 is a switching circuit corresponding to the switching circuit 7 in FIG. 3, the switching elements are arranged in a hierarchical structure, and the switching type switching elements 8 are provided corresponding to the individual probes 6 in the lowermost layer. There is. Each switching type switch element 8 is
The switching electrode 8a is connected to the associated individual probe 6. The normally closed electrode 8c is connected to the same pole (positive, negative) as the common probe 5, and the normally open contact 8b is connected to a different pole (positive, negative) from the common probe 5.
これによって、スイッチング回路7の選択によってパル
ス電源4の第1の出力端子と接続された個別探針6に隣
接した個別探針6は、共通探針5とともに常にパルス電
源4の第2の電極に接続されることになる。As a result, the individual probe 6 adjacent to the individual probe 6 connected to the first output terminal of the pulse power source 4 by the selection of the switching circuit 7 is always connected to the second electrode of the pulse power source 4 together with the common probe 5. Will be connected.
次に動作について説明する。まず、スイッチング回路7
で各階層毎のスイッチ素子制御が行なわれて、個別探針
6中の1つが選択されてパルス電源4の第1の出力端子
に接続される。このとき、当該個別探針6に隣接してい
る2つの個別探針6はパルス電源4の第2の出力端子に
接続される。ここでパルス電源4より電圧パルスを発生
すると、前記選択された個別探針6が接触しているリー
ド電極2と共通端子1の間の発熱抵抗体3にこの電圧パ
ルスが印加され、その発熱抵抗体3の抵抗値が低下す
る。この時、当該リード電極2に隣接したリード電極2
はそれに接触している個別探針6によって、ともにパル
ス電源4の第2の出力端子に接続され、共通電極1と同
電位に固定される。従って、これら両リード電極2には
静電誘導、放電等による電圧の印加はなく、それより離
れたリード電極2では距離が遠くなることと前記両リー
ド電極2のシールド作用によって静電誘導,放電等によ
る電圧が印加される心配は全くない。Next, the operation will be described. First, the switching circuit 7
Then, the switch element control for each layer is performed, and one of the individual probes 6 is selected and connected to the first output terminal of the pulse power supply 4. At this time, the two individual probes 6 adjacent to the individual probe 6 are connected to the second output terminal of the pulse power supply 4. Here, when a voltage pulse is generated from the pulse power source 4, this voltage pulse is applied to the heating resistor 3 between the lead electrode 2 and the common terminal 1 with which the selected individual probe 6 is in contact, and the heating resistance is generated. The resistance value of the body 3 decreases. At this time, the lead electrode 2 adjacent to the lead electrode 2
Are both connected to the second output terminal of the pulse power source 4 by the individual probe 6 in contact therewith, and are fixed at the same potential as the common electrode 1. Therefore, no voltage is applied to these lead electrodes 2 due to electrostatic induction, discharge, etc., and the distance between lead electrodes 2 farther from the lead electrode 2 becomes longer and the shield action of both lead electrodes 2 causes electrostatic induction and discharge. There is no concern that voltage will be applied due to the above.
ここで、パルス電源4では第2の出力端子、即ち、負の
出力端子側が接地されており、面積の広い共通電極1が
この接地側の第2の出力端子に接続され、接地側でない
第1の出力端子には面積が極めて狭いリード電極1が1
つずつ接続されることとなるため、接地された作業ステ
ージ上にサーマルヘッドを載置してその抵抗値の均一化
作業を行なうに際しても、作業ステージと電極との間の
静電容量によって印加した電圧パルスの波形が大きくな
まるようなことはなく、精度の高い抵抗値の調整が可能
となる。Here, in the pulse power supply 4, the second output terminal, that is, the negative output terminal side is grounded, the common electrode 1 having a large area is connected to the second output terminal on the ground side, and the first terminal not on the ground side. The output electrode has a lead electrode 1 with an extremely small area.
Since they are connected one by one, even when the thermal head was placed on the grounded work stage and the resistance value was made uniform, the voltage was applied by the capacitance between the work stage and the electrodes. The waveform of the voltage pulse does not become large, and the resistance value can be adjusted with high accuracy.
スイッチング回路7によって個別探針6を逐一選択しな
がら、当該個別探針6が接触しているリード電極2に対
応する発熱抵抗体3の抵抗値を調整し、サーマルヘッド
の抵抗値を均一化する。While individually selecting the individual probe 6 by the switching circuit 7, the resistance value of the heating resistor 3 corresponding to the lead electrode 2 in contact with the individual probe 6 is adjusted to make the resistance value of the thermal head uniform. .
第2図はこの発明によるサーマルヘッドの抵抗値均一化
方法を実施する装置を示す回路図であり、スイッチング
回路7が個別探針6に対応して設けられた切換形スイッ
チ素子8のみで構成されている点で第1図に示す実施例
と異なっている。即ち、各切換形スイッチ素子8の切換
電極8aは対応付けられた個別探針6に接続され、常閉
側電極8cは共通探針5と同じ極(正,負)に接続さ
れ、常開側電極8bは前記共通探針5と違う極(正,
負)に接続されている。FIG. 2 is a circuit diagram showing an apparatus for carrying out the method of equalizing the resistance value of the thermal head according to the present invention. The switching circuit 7 is composed of only the switching type switch element 8 provided corresponding to the individual probe 6. This is different from the embodiment shown in FIG. That is, the switching electrode 8a of each switching type switch element 8 is connected to the associated individual probe 6, the normally closed side electrode 8c is connected to the same pole (positive, negative) as the common probe 5, and the normally open side. The electrode 8b is a pole different from the common probe 5 (positive,
Negative).
この実施例においては、スイッチング回路7の切換形ス
イッチ素子8が1つずつ駆動され、対応する個別探針6
のみパルス電源4の第1の出力端子に接続され、他の個
別探針6は共通探針5とともにパルス電源4の第2の出
力端子に接続される。これによって第1図に示す実施例
と同様に発熱抵抗体3の抵抗値の調整が行なわれ、この
抵抗値調整のために印加した電圧パルスの影響が隣接す
る発熱抵抗体3に及ぶようなこともない。In this embodiment, the switching type switch elements 8 of the switching circuit 7 are driven one by one, and the corresponding individual probe 6
Only the first output terminal of the pulse power source 4 is connected, and the other individual probe 6 is connected to the second output terminal of the pulse power source 4 together with the common probe 5. As a result, the resistance value of the heating resistor 3 is adjusted as in the embodiment shown in FIG. 1, and the influence of the voltage pulse applied for adjusting the resistance value affects the adjacent heating resistor 3. Nor.
なお、上記実施例ではスイッチング回路3のスイッチ素
子として、リレー接点のようなメカニカルなスイッチ素
子を示したが、半導体スイッチのような静止スイッチ素
子を用いてもよい。In addition, although the mechanical switch element such as a relay contact is shown as the switch element of the switching circuit 3 in the above-described embodiment, a static switch element such as a semiconductor switch may be used.
以上のように、この発明によれば、切換形スイッチ素子
の切換電極を個別探針に接続するとともに、その常閉側
電極を共通探針と同じ極(正,負)に接続し、常開側電
極を共通探針と違う極(正,負)に接続し、選択された
個別探針によってパルス電源の第1の出力端子に接続さ
れたリード電極に隣接したリード電極を、選択されてい
ない個別探針によって共通探針とともにパルス電源の第
2の出力端子に接続するように構成したので、抵抗値の
調整を行なう発熱抵抗体に隣接する発熱抵抗体のリード
電極は共通電極の電位と同電位に固定され、抵抗値の調
整を行なう発熱抵抗体のリード電極以外のリード電極で
は、静電誘導、放電等による抵抗調整のための電圧パル
スの影響を完全に除くことができ、発熱抵抗体の抵抗値
の均一化を精度良く行なうことのできるサーマルヘッド
の抵抗値均一化方法が得られる効果がある。As described above, according to the present invention, the switching electrode of the switching-type switching element is connected to the individual probe, and the normally closed side electrode is connected to the same pole (positive or negative) as the common probe so that it is normally opened. The side electrode is connected to a pole (positive or negative) different from the common probe, and the lead electrode adjacent to the lead electrode connected to the first output terminal of the pulse power supply by the selected individual probe is not selected. Since the individual probe is connected to the common probe together with the second output terminal of the pulse power supply, the lead electrode of the heating resistor adjacent to the heating resistor for adjusting the resistance value has the same potential as the common electrode. The lead electrodes other than the lead electrode of the heating resistor that is fixed to the electric potential and whose resistance value is adjusted can completely eliminate the influence of the voltage pulse for resistance adjustment due to electrostatic induction, discharge, etc. Accurately equalizes the resistance value of The effect of the resistance value uniform method for the thermal head is obtained which can be carried out.
第1図はこの発明の一実施例によるサーマルヘッドの抵
抗値均一化方法を実施する装置を示す回路図、第2図は
この発明の他の実施例によるサーマルヘッドの抵抗値均
一化方法を実施する装置を示す回路図、第3図は従来の
サーマルヘッドの抵抗値均一化方法を実施する装置を示
す回路図である。 1は共通電極、2はリード電極、3は発熱抵抗体、4は
パルス電源、5は共通探針、6は個別探針、7はスイッ
チング回路、8は切換形スイッチ素子、8aは切換電
極、8bは常開側電極、8cは常閉側電極。 なお、図中、同一符号は同一、又は相当部分を示す。FIG. 1 is a circuit diagram showing an apparatus for carrying out a thermal head resistance equalizing method according to an embodiment of the present invention, and FIG. 2 is a thermal head resistance equalizing method according to another embodiment of the present invention. FIG. 3 is a circuit diagram showing an apparatus for carrying out the method for equalizing the resistance value of a conventional thermal head. 1 is a common electrode, 2 is a lead electrode, 3 is a heating resistor, 4 is a pulse power source, 5 is a common probe, 6 is an individual probe, 7 is a switching circuit, 8 is a switching type switch element, 8a is a switching electrode, 8b is a normally open side electrode, and 8c is a normally closed side electrode. In the drawings, the same reference numerals indicate the same or corresponding parts.
フロントページの続き (72)発明者 山下 博實 兵庫県尼崎市塚口本町8丁目1番1号 三 菱電機株式会社通信機製作所内 (72)発明者 高瀬 弥平 兵庫県尼崎市塚口本町8丁目1番1号 三 菱電機株式会社通信機製作所内Continued Front Page (72) Inventor Hirozo Yamashita 8-1-1 Tsukaguchi Honcho, Amagasaki City, Hyogo Sanbishi Electric Co., Ltd. Communication Equipment Factory (72) Yahei Takase 8-1-1 Tsukaguchi Honcho, Amagasaki City, Hyogo Prefecture No. 1 Sanryo Electric Co., Ltd. Communication Equipment Factory
Claims (2)
した複数の個別探針をパルス電源の第1の出力端子にス
イッチング回路を介して選択的に接続し、前記サーマル
ヘッドの共通電極に接触した共通探針を前記パルス電源
の第2の出力端子に接続し、前記共通電極と前記スイッ
チング回路によって選択された個別探針が接触している
リード電極との間の発熱抵抗体に前記パルス電源からの
電圧パルスを印加して該発熱抵抗体の抵抗値を調整する
サーマルヘッドの抵抗値均一化方法において、前記スイ
ッチング回路は前記個別探針に対応する切換形スイッチ
素子を有し、前記各切換形スイッチ素子は、その切換電
極を前記個別探針にそれぞれ接続するとともに、その常
閉側電極は前記共通探針と同じ極(正,負)に接続さ
れ、常開側電極は前記共通探針と違う極(正,負)に接
続し、前記スイッチング回路で選択された前記個別探針
によって前記パルス電源の第1の出力端子に接続された
前記リード電極に隣接したリード電極を、選択されてい
ない前記個別探針によって共通探針とともに前記パルス
電源の第2の出力端子へ接続することを特徴とするサー
マルヘッドの抵抗値均一化方法。1. A plurality of individual probes individually contacting the lead electrodes of a thermal head are selectively connected to a first output terminal of a pulse power source through a switching circuit and are in contact with a common electrode of the thermal head. The common probe is connected to the second output terminal of the pulse power supply, and the heating resistor between the common electrode and the lead electrode in contact with the individual probe selected by the switching circuit is connected to the heating source from the pulse power supply. In the method of equalizing the resistance value of the thermal head by adjusting the resistance value of the heating resistor by applying the voltage pulse of, the switching circuit has a switching type switch element corresponding to the individual probe, The switching element has its switching electrode connected to each of the individual probes, its normally closed side electrode is connected to the same pole (positive, negative) as the common probe, and the normally open side electrode is A lead electrode adjacent to the lead electrode connected to a pole (positive or negative) different from the common probe and connected to the first output terminal of the pulse power source by the individual probe selected by the switching circuit, A method for equalizing the resistance value of a thermal head, characterized in that the individual probes that are not selected are connected to a second output terminal of the pulse power source together with a common probe.
の出力端子であることを特徴とする特許請求の範囲第
(1)項に記載のサーマルヘッドの抵抗値均一化方法。2. The method of equalizing the resistance value of a thermal head according to claim 1, wherein the second output terminal of the pulse power supply is an output terminal on the ground side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20400786A JPH06415B2 (en) | 1986-08-29 | 1986-08-29 | Method of equalizing resistance of thermal head |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20400786A JPH06415B2 (en) | 1986-08-29 | 1986-08-29 | Method of equalizing resistance of thermal head |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6359554A JPS6359554A (en) | 1988-03-15 |
| JPH06415B2 true JPH06415B2 (en) | 1994-01-05 |
Family
ID=16483224
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20400786A Expired - Lifetime JPH06415B2 (en) | 1986-08-29 | 1986-08-29 | Method of equalizing resistance of thermal head |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06415B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115050530B (en) * | 2022-04-26 | 2023-12-22 | 华中科技大学 | A round-robin resistance adjustment circuit and resistance adjustment method for a thermally printed thick film resistor array |
-
1986
- 1986-08-29 JP JP20400786A patent/JPH06415B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6359554A (en) | 1988-03-15 |
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| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |