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JPH0658476B2 - Method for manufacturing substrate for liquid crystal display device - Google Patents
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JPH0658476B2 - Method for manufacturing substrate for liquid crystal display device - Google Patents

Method for manufacturing substrate for liquid crystal display device

Info

Publication number
JPH0658476B2
JPH0658476B2 JP13182485A JP13182485A JPH0658476B2 JP H0658476 B2 JPH0658476 B2 JP H0658476B2 JP 13182485 A JP13182485 A JP 13182485A JP 13182485 A JP13182485 A JP 13182485A JP H0658476 B2 JPH0658476 B2 JP H0658476B2
Authority
JP
Japan
Prior art keywords
substrate
film
liquid crystal
crystal display
display device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13182485A
Other languages
Japanese (ja)
Other versions
JPS61290421A (en
Inventor
茂 松山
彰 石井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13182485A priority Critical patent/JPH0658476B2/en
Publication of JPS61290421A publication Critical patent/JPS61290421A/en
Publication of JPH0658476B2 publication Critical patent/JPH0658476B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Non-Insulated Conductors (AREA)
  • Manufacturing Of Electric Cables (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はパターン表示電極形成用基板の製造方法、特
に、この基板にプラスチツクフイルムあるいはプラスチ
ツク基板を用いた液晶表示素子の製造方法に関するもの
である。
Description: FIELD OF THE INVENTION The present invention relates to a method for manufacturing a substrate for forming a pattern display electrode, and more particularly to a method for manufacturing a liquid crystal display device using a plastic film or a plastic substrate for this substrate.

〔発明の背景〕 従来、液晶表示素子は、内面に対向電極を形成した上下
2枚のガラス基板間に液晶を介在させ、周辺部をシール
材により封止して構成されていた。近年では、ガラス基
板に代えてプラスチツクフイルム基板を用いたプラスチ
ツク液晶表示素子が例えば特開昭53-68099号公報などに
より提案されている。
BACKGROUND OF THE INVENTION Conventionally, a liquid crystal display element has been constructed by interposing a liquid crystal between upper and lower two glass substrates each having a counter electrode formed on an inner surface thereof and sealing a peripheral portion with a sealing material. In recent years, a plastic liquid crystal display element using a plastic film substrate instead of a glass substrate has been proposed, for example, in Japanese Patent Laid-Open No. 53-68099.

この種のプラスチツクフイルム基板を用いた液晶表示素
子は、このプラスチツクフイルム基板上に電極を形成す
る方法としてフイルム基板の耐熱性が低いことから、E
B(エレクトロンビーム)による蒸着法、抵抗加熱によ
る蒸着法あるいはスパツタリング法が用いられる。特に
スパツタリング法では、輻射熱が少ないので、低温度で
フイルム基板上に透光性かつ導電性の薄膜を形成するこ
とが可能である。そして、この種の薄膜を低温度スパツ
タリング法を用いてフイルム基板上に形成する場合、大
きく分けて2種類の方法がある。その1つはIn2O3,SnO2
等の金属酸化物をターゲツトとして用い、Ar(アルゴ
ン)雰囲気中でスパツタリングを行なつてフイルム基板
上に透明導電膜(以下ITO膜と称する)を成膜する方
法と、他の方法としてIn-Sn合金をArとO2(酸素)との
混合雰囲気中でスパツタリングを行ない、スパツタリン
グ中に金属酸化物を生成してフイルム基板上に付着させ
ITO膜を成膜する方法とがある。このようにして成膜
されたITO膜は後工程で、エツチング等を行なつて所
望のパターン表示電極,電極端子およびその両者間を電
気的に接続するリード電極等の透光性電極を形成する。
A liquid crystal display device using this type of plastic film substrate has a low heat resistance as a method for forming electrodes on the plastic film substrate.
A vapor deposition method using B (electron beam), a vapor deposition method using resistance heating, or a sputtering method is used. Particularly, in the sputtering method, since radiant heat is small, it is possible to form a transparent and conductive thin film on a film substrate at a low temperature. When a thin film of this type is formed on a film substrate by using a low temperature sputtering method, it can be roughly classified into two types. One is I n2 O 3 , S n O 2
A metal oxide etc. as Tagetsuto, a method of forming a A r (hereinafter referred to as ITO film) transparent conductive film in the row of connexion film on a substrate Supatsutaringu in (argon) atmosphere, I n another method the -S n alloy subjected to Supatsutaringu in a mixed atmosphere of a r and O 2 (oxygen), and a method of forming an ITO film is deposited on the film substrate to generate a metal oxide in Supatsutaringu. The ITO film thus formed is subjected to etching or the like in a later step to form a desired pattern display electrode, an electrode terminal, and a translucent electrode such as a lead electrode for electrically connecting the two. .

しかしながら、前述した方法により成膜されたITO膜
は、完全に結晶化されていないが、従来ガラス基板等に
形成した場合には400〜500℃程度の高温度焼成すること
で結晶化が可能であつたが、ITO膜を成膜したフイル
ム基板の場合は、約400℃程度の高温度焼成を行うこと
がポリイミド系の特殊なフイルムを除いて不可能である
ことから、ITO膜が酸およびアルカリのいずれかにお
いても容易に溶解し、耐薬品性が結晶化したITO膜に比
べ非常に低い。換言すれば、プラスチツク基板使用時の
難点は加熱によるITO膜の結晶化は極めて困難である
ことであつた。
However, although the ITO film formed by the method described above is not completely crystallized, it can be crystallized by firing at a high temperature of about 400 to 500 ° C when formed on a conventional glass substrate or the like. However, in the case of a film substrate on which an ITO film is formed, it is impossible to perform high-temperature baking at about 400 ° C except for a special polyimide film, so the ITO film is acid and alkaline. In any of the above cases, it dissolves easily and its chemical resistance is extremely lower than that of the crystallized ITO film. In other words, the difficulty in using the plastic substrate was that it was extremely difficult to crystallize the ITO film by heating.

このような問題を改善したものとしては、特公昭59-412
41号公報に提案されているように、フイルム基板温度を
約170℃程度まで上昇させることによつてITO膜を結
晶化させる方法が提案されている。しかしながら、この
方法においても、フイルム基板が有機質材料から形成さ
れているために、加熱温度約170℃でも充分に高い温度
であり、極端な場合にはフイルム基板自体が大きく変
形,収縮し、あるいは材質によつては融点を越える結果
となり、電極基板としての機能が得られなくなるという
問題があつた。
As an improvement on such a problem, Japanese Patent Publication No. 59-412
As proposed in Japanese Patent No. 41, a method of crystallizing an ITO film by raising the film substrate temperature to about 170 ° C. has been proposed. However, even in this method, since the film substrate is formed of an organic material, the heating temperature is sufficiently high even at about 170 ° C., and in extreme cases, the film substrate itself is largely deformed or shrunk, or the material is Therefore, the melting point is exceeded and the function as an electrode substrate cannot be obtained.

〔発明の目的〕[Object of the Invention]

したがつて本発明は、前述した従来の問題に鑑みてなさ
れたものであり、その目的とするところは、電極基板と
しての機能を損なうことなく、フイルム基板上に結晶化
したITO膜を形成することができる液晶表示素子の製
造方法を提供することにある。本発明の他の目的は、耐
薬品性の優れたITO膜をフイルム基板上に形成するこ
とができる液晶表示素子の製造方法を提供することにあ
る。
Therefore, the present invention has been made in view of the above-mentioned conventional problems, and an object thereof is to form a crystallized ITO film on a film substrate without impairing the function as an electrode substrate. An object of the present invention is to provide a method for manufacturing a liquid crystal display device capable of manufacturing the liquid crystal display device. Another object of the present invention is to provide a method of manufacturing a liquid crystal display device capable of forming an ITO film having excellent chemical resistance on a film substrate.

〔発明の概要〕[Outline of Invention]

このような目的を達成するために本発明は、液晶表示素
子用基板上に低温度スパツタリング法により非結晶性I
TO膜を形成した後に紫外線を照射することにより、I
TO膜を結晶化させるものである。
In order to achieve such an object, the present invention provides an amorphous I film on a substrate for a liquid crystal display device by a low temperature sputtering method.
By irradiating ultraviolet rays after forming the TO film, I
The TO film is crystallized.

〔発明の実施例〕Example of Invention

〈比較例〉 スパツタリングのターゲツトとして10wt%の酸化スズ
(SnO2)を含む酸化インジウム(In2O3)を用い、基板
の温度が40℃以上にならないようにして、Ar(アルゴ
ン)雰囲気中でスパンタリングを行なう。スパツタリン
グ時に外部より充分なO2(酸素)を加え、基板上に形成
されたITO膜のシート抵抗値が少なくとも300Ω/ロ
以下、さらに透過率が85〜90%(ITO膜のみ)の膜を
形成する。この時の膜厚は300〜400Åとする。以上の方
法で形成した基板に対し(1)無処理、(2)170℃、24時
間の加熱、(3)UV光照射40℃,20分(ただし、365nm、3
0mw)の処理を行い、HC水溶液を用いて、耐酸性を
調べた。結果を表1に示す(HC液はHC・・・・
1,H2O・・・・5,HNO3・・・・0.08%混合比のもの
を使用)。
With 10 wt% of tin oxide as Tagetsuto of <Comparative Example> Supatsutaringu indium oxide containing (SnO 2) (I n2 O 3), the temperature of the substrate so as not exceed 40 ℃, A r (argon) atmosphere And perform spantering. A sufficient amount of O 2 (oxygen) is added from the outside during sputtering to form a film with a sheet resistance of the ITO film formed on the substrate of at least 300Ω / b and a transmittance of 85-90% (ITO film only). To do. The film thickness at this time is 300 to 400Å. For the substrate formed by the above method, (1) no treatment, (2) 170 ° C, 24 hours heating, (3) UV light irradiation 40 ° C, 20 minutes (however, 365 nm, 3 nm
(0 mw), and acid resistance was examined using an aqueous HC solution. The results are shown in Table 1 (HC liquid is HC ...
Using those 1, H 2 O ···· 5, HNO 3 ···· 0.08% mixing ratio).

耐酸性は抵抗値が無限大になるまでの時間で評価した。
本比較例における実験では条件(3)において行つた紫外
線照射処理では耐酸性の変化が全くみとめられない。ま
た無処理晶の耐酸性が低いのは、形成されたITO膜が
結晶化していなためである。処理(2)では加熱されたた
めにITO膜の結晶化がおこり、耐酸性が向上したもの
と考えられる。
The acid resistance was evaluated by the time until the resistance value became infinite.
In the experiment of this comparative example, no change in acid resistance was observed by the ultraviolet irradiation treatment performed under the condition (3). The acid resistance of the untreated crystal is low because the formed ITO film is not crystallized. It is considered that in the treatment (2), since the ITO film was crystallized due to the heating, the acid resistance was improved.

〈実施例〉 比較例とし記述したスパツタリング条件と比較すると雰
囲気の酸素の濃度を下げ、形成されたITO膜が低酸化
物になる様な条件を決める。その他の条件は前記比較例
におけると同様である。本明細書におけるインジウムの
低酸化物とは、次の一般式で表わされるものを言う。
<Example> As compared with the sputtering condition described as a comparative example, the oxygen concentration in the atmosphere is lowered, and conditions are set such that the formed ITO film becomes a low oxide. Other conditions are the same as in the comparative example. In the present specification, the low oxide of indium refers to one represented by the following general formula.

InxOY(0<Y/X<1.5) 酸化インジウムの一般式はIn2O3のあり、インジウムと
酸素の比率が、一般式In2O3の2:3よりも、インジウ
ムの方が多い場合、あるいは、酸素の量が少ない場合を
示す。形成されたITO膜の特性は、抵抗値ーで60〜70
KΩ/ロ,透過率40〜50%となつた。
InxOY (0 <Y / X <1.5) Indium oxide has a general formula of In 2 O 3 , and when the ratio of indium to oxygen is more than that of the general formula In 2 O 3 of 2: 3, Alternatively, the case where the amount of oxygen is small is shown. The characteristic of the formed ITO film is 60-70 in resistance value.
KΩ / B, transmittance 40 to 50%.

比較例に示したと同様の処理(1),(2),(3)を行いさら
に同様の評価を行つた結果を表2に示す。
Table 2 shows the results of performing the same treatments (1), (2), and (3) as those shown in the comparative example and further performing the same evaluation.

比較例の場合と違い、UV光を照射したITO膜も加熱
処理したものと同様の傾向を示し耐酸性が向上してい
る。UV光を照射することによつて、基板の温度を上昇
させることなく、ネサの低抵抗化、さらには耐酸性を向
上することができる。UV光の照射強度,時間等の各条件
については不明な点が多いが、基板フイリムの耐熱温度
まで加熱した方がより短時間で何等の効果が得られる。
また、ネサについてはスパツタで形成してもEB(エレ
クトロンビーム)蒸着があつても効果については同等で
ある。さらにスパツタリングの際に用いられるターゲツ
トによる差(金属又は酸化物)はない。
Unlike the case of the comparative example, the ITO film irradiated with UV light also shows the same tendency as the one subjected to the heat treatment, and the acid resistance is improved. By irradiating with UV light, it is possible to reduce the resistance of the nesa and further improve the acid resistance without increasing the temperature of the substrate. Although there are many unclear points regarding each condition such as UV light irradiation intensity and time, heating to the heat-resistant temperature of the substrate film will bring about some effect in a shorter time.
Further, the effect of the nesa is the same whether it is formed by a sputter or by EB (electron beam) vapor deposition. Furthermore, there is no difference (metal or oxide) due to the target used during sputtering.

〔発明の効果〕〔The invention's effect〕

以上説明したように本発明によれば、基板上に低温度ス
パツタリングにより透明導電膜を形成した後に紫外線を
照射したことによつて、基板を変形させることなく、結
晶化した透明導電膜が得られると共に耐薬品性を向上で
き、品質、信頼性の高い液晶表示素子が実現可能となる
などの極めて優れた効果が得られる。
As described above, according to the present invention, a crystallized transparent conductive film can be obtained without deforming the substrate by irradiating ultraviolet rays after forming the transparent conductive film by low temperature sputtering on the substrate. At the same time, the chemical resistance can be improved, and an extremely excellent effect such as the realization of a liquid crystal display device with high quality and reliability can be obtained.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】透明導電膜からなる電極を被着形成した液
晶表示素子用基板の製造方法において、前記透明導電膜
を、前記液晶表示素子用基板上にインジウムの低酸化物
(InxOy,O<Y/X<1.5)をスパッタリングにより形
成した後に紫外線を照射し、該透明導電膜を結晶化させ
ることにより形成したことを特徴とした液晶表示素子用
基板の製造方法。
1. A method of manufacturing a substrate for a liquid crystal display element, which is formed by depositing an electrode made of a transparent conductive film, wherein the transparent conductive film is formed on the substrate for a liquid crystal display element by a low oxide of indium (InxOy, O < A method for manufacturing a substrate for a liquid crystal display element, which is characterized in that Y / X <1.5) is formed by sputtering, and then the transparent conductive film is crystallized by irradiation with ultraviolet rays.
JP13182485A 1985-06-19 1985-06-19 Method for manufacturing substrate for liquid crystal display device Expired - Lifetime JPH0658476B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13182485A JPH0658476B2 (en) 1985-06-19 1985-06-19 Method for manufacturing substrate for liquid crystal display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13182485A JPH0658476B2 (en) 1985-06-19 1985-06-19 Method for manufacturing substrate for liquid crystal display device

Publications (2)

Publication Number Publication Date
JPS61290421A JPS61290421A (en) 1986-12-20
JPH0658476B2 true JPH0658476B2 (en) 1994-08-03

Family

ID=15066955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13182485A Expired - Lifetime JPH0658476B2 (en) 1985-06-19 1985-06-19 Method for manufacturing substrate for liquid crystal display device

Country Status (1)

Country Link
JP (1) JPH0658476B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2589695B2 (en) * 1987-06-18 1997-03-12 松下電器産業株式会社 Method for producing transparent conductive film
KR20220156819A (en) * 2020-03-19 2022-11-28 닛토덴코 가부시키가이샤 transparent conductive film
CN115298760A (en) 2020-03-19 2022-11-04 日东电工株式会社 Light-transmitting conductive film and transparent conductive film

Also Published As

Publication number Publication date
JPS61290421A (en) 1986-12-20

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