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JPH0680909B2 - Heat sink for semiconductor device - Google Patents
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JPH0680909B2 - Heat sink for semiconductor device - Google Patents

Heat sink for semiconductor device

Info

Publication number
JPH0680909B2
JPH0680909B2 JP14777185A JP14777185A JPH0680909B2 JP H0680909 B2 JPH0680909 B2 JP H0680909B2 JP 14777185 A JP14777185 A JP 14777185A JP 14777185 A JP14777185 A JP 14777185A JP H0680909 B2 JPH0680909 B2 JP H0680909B2
Authority
JP
Japan
Prior art keywords
semiconductor device
heat sink
heat dissipation
heat
dissipation plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14777185A
Other languages
Japanese (ja)
Other versions
JPS628600A (en
Inventor
克人 長野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP14777185A priority Critical patent/JPH0680909B2/en
Publication of JPS628600A publication Critical patent/JPS628600A/en
Publication of JPH0680909B2 publication Critical patent/JPH0680909B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)

Description

【発明の詳細な説明】 [発明の技術的分野] 本発明は半導体装置用放熱板に関するものである。Description: TECHNICAL FIELD OF THE INVENTION The present invention relates to a heat sink for a semiconductor device.

[発明の技術的背景とその問題点] 従来、半導体レーザ,高周波用ダイオード,インパット
ダイオード,ガンダイオード等の発熱性半導体素子は、
ダイヤモンド又は銅製の放熱板を介して基板上に設置さ
れていた。
[Technical background of the invention and its problems] Conventionally, heat-generating semiconductor elements such as semiconductor lasers, high-frequency diodes, impat diodes, and Gunn diodes are
It was installed on the substrate via a heat sink made of diamond or copper.

しかしながら、ダイヤモンドは高価であって、かつ加工
が困難であるという問題を有し、又、銅を用いたものは
放熱効果が低いという問題を有していた。
However, diamond has a problem that it is expensive and difficult to process, and that using copper has a problem that the heat dissipation effect is low.

[発明の目的] 本発明は前記事情に鑑みて成されたものであり、低価で
あってかつ放熱効果の優れた放熱板を提供することを目
的とするものである。
[Object of the Invention] The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a heat dissipation plate having a low price and an excellent heat dissipation effect.

発明の概要 前記目的を達成するために本発明は、発熱性半導体素子
と基板との間に介挿される放熱板であって、燐化硼素を
主成分として構成されていることを特徴とするものであ
る。
SUMMARY OF THE INVENTION In order to achieve the above object, the present invention is a heat sink inserted between a heat-generating semiconductor element and a substrate, characterized in that it is composed mainly of boron phosphide. Is.

[発明の実施例] 以下実施例により本発明を具体的に説明する。[Examples of the Invention] The present invention will be specifically described with reference to the following examples.

第1図は放熱板を用いた半導体装置の斜視図である。同
図において1は金属製(例えば銅(Cu)製)の基板であ
り、3は半導体レーザ等の発熱性半導体素子であり、両
者間には燐化硼素(PB)を主体とする放熱板2が介挿さ
れて設置されている。ここで、基板1の縦横幅は例
えば2mmであり、その高さh1は例えば1mmであり、放熱板
2の短辺幅l2は例えば500μmであり、長辺幅l3は例え
ば1000μmであり、その高さh2は例えば100μmであ
る。又、半導体素子3の短辺幅l4は例えば250μmであ
り、その高さは例えば150μmである。
FIG. 1 is a perspective view of a semiconductor device using a heat sink. In the figure, 1 is a metal (for example, copper (Cu)) substrate, 3 is a heat-generating semiconductor element such as a semiconductor laser, and a heat radiating plate 2 mainly composed of boron phosphide (PB) is provided between the two. Is inserted and installed. Here, the vertical and horizontal width 1 of the substrate 1 is, for example, 2 mm, the height h 1 thereof is, for example, 1 mm, the short side width l 2 of the heat dissipation plate 2 is, for example, 500 μm, and the long side width l 3 thereof is, for example, 1000 μm. And its height h 2 is, for example, 100 μm. The short side width l 4 of the semiconductor element 3 is, for example, 250 μm, and the height thereof is, for example, 150 μm.

次に第2図を参照して前記放熱板2の構造の一例を説明
する。この放熱板2は、例えば990×490μmの縦横幅を
有する燐化硼素(BP)部材2Aの表面に例えば500Å厚の
チタニウム(Ti)部材2Bを被覆し、その上に例えば1000
Å厚の白金(Pt)部材2Cを被覆し、これを1μm厚の銀
(Ag)で被覆して成る。
Next, an example of the structure of the heat dissipation plate 2 will be described with reference to FIG. In this heat dissipation plate 2, the surface of a boron phosphide (BP) member 2A having a vertical and horizontal width of, for example, 990 × 490 μm is coated with a titanium (Ti) member 2B having a thickness of, for example, 500Å, and then, for example, 1000
It is formed by coating a Å-thick platinum (Pt) member 2C and coating it with 1 μm-thick silver (Ag).

このような放熱板を用いれば、低価格化が達成できかつ
放熱効果の向上を図ることができる。
By using such a heat dissipation plate, it is possible to reduce the cost and improve the heat dissipation effect.

[発明の効果] 以上詳述したような本発明によれば、低価格化,放熱効
果の向上に寄与する放熱板を提供することができ、特に
発熱性半導体素子を用いた半導体装置に極めて有効であ
る。
[Effects of the Invention] According to the present invention as described in detail above, it is possible to provide a heat dissipation plate that contributes to cost reduction and improvement of heat dissipation effect, and is particularly effective for a semiconductor device using a heat-generating semiconductor element. Is.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の放熱板を用いた半導体装置の一例を示
す斜視図、第2図は本発明の放熱板の一例を示す横断面
図である。 1…基板、2…放熱板、2A…燐化硼素、3…半導体素
子。
FIG. 1 is a perspective view showing an example of a semiconductor device using a heat dissipation plate of the present invention, and FIG. 2 is a transverse sectional view showing an example of a heat dissipation plate of the present invention. 1 ... Substrate, 2 ... Heat sink, 2A ... Boron phosphide, 3 ... Semiconductor element.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】発熱性半導体素子と基板との間に介挿され
る放熱板であって、燐化硼素を主成分として構成されて
いることを特徴とする半導体装置用放熱板。
1. A heat sink for a semiconductor device, wherein the heat sink is interposed between a heat-generating semiconductor element and a substrate and is composed mainly of boron phosphide.
【請求項2】チタニウム,白金及び銀の被覆部材の積層
によって被覆されていることを特徴とする特許請求の範
囲第1項記載の半導体装置用放熱板。
2. A heat dissipation plate for a semiconductor device according to claim 1, wherein the heat dissipation plate is covered with a stack of titanium, platinum and silver covering members.
JP14777185A 1985-07-04 1985-07-04 Heat sink for semiconductor device Expired - Lifetime JPH0680909B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14777185A JPH0680909B2 (en) 1985-07-04 1985-07-04 Heat sink for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14777185A JPH0680909B2 (en) 1985-07-04 1985-07-04 Heat sink for semiconductor device

Publications (2)

Publication Number Publication Date
JPS628600A JPS628600A (en) 1987-01-16
JPH0680909B2 true JPH0680909B2 (en) 1994-10-12

Family

ID=15437808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14777185A Expired - Lifetime JPH0680909B2 (en) 1985-07-04 1985-07-04 Heat sink for semiconductor device

Country Status (1)

Country Link
JP (1) JPH0680909B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0634402B2 (en) * 1988-03-25 1994-05-02 工業技術院長 Heat dissipating substrate having boron compound semiconductor and its manufacturing method
US7919855B2 (en) * 2006-02-21 2011-04-05 Lockheed Martin Topside thermal management of semiconductor devices using boron phosphide contacting a gate terminal
JP2018060061A (en) * 2016-10-05 2018-04-12 コニカミノルタ株式会社 Electrophotographic photoreceptor and image forming apparatus

Also Published As

Publication number Publication date
JPS628600A (en) 1987-01-16

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