JPH0695505B2 - Wafer supply / collection device in a wafer single-wafer inner peripheral blade two-division cutting device - Google Patents
Wafer supply / collection device in a wafer single-wafer inner peripheral blade two-division cutting deviceInfo
- Publication number
- JPH0695505B2 JPH0695505B2 JP1285288A JP28528889A JPH0695505B2 JP H0695505 B2 JPH0695505 B2 JP H0695505B2 JP 1285288 A JP1285288 A JP 1285288A JP 28528889 A JP28528889 A JP 28528889A JP H0695505 B2 JPH0695505 B2 JP H0695505B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- cutting
- supply
- holding
- recovery
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005520 cutting process Methods 0.000 title claims description 104
- 230000002093 peripheral effect Effects 0.000 title claims description 11
- 235000012431 wafers Nutrition 0.000 claims description 136
- 239000004065 semiconductor Substances 0.000 claims description 64
- 238000011084 recovery Methods 0.000 claims description 35
- 239000012535 impurity Substances 0.000 claims description 6
- 230000001965 increasing effect Effects 0.000 claims description 5
- 238000009792 diffusion process Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 238000000034 method Methods 0.000 description 13
- 230000000694 effects Effects 0.000 description 5
- 239000000758 substrate Substances 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000926 separation method Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/028—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with a ring blade having an inside cutting edge
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D1/00—Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
- B28D5/0094—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being of the vacuum type
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mining & Mineral Resources (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Description
【発明の詳細な説明】 [産業上の利用分野] 本発明は、ウエハ枚葉式内周刃2分割切断装置における
ウエハ供給回収装置に関する。TECHNICAL FIELD The present invention relates to a wafer supply / recovery device in a wafer single wafer type inner peripheral blade two-division cutting device.
[従来の技術] 従来、半導体ウエハの切断加工に関しては、例えば、本
出願人がディスクリート素子用基板製造を目的として先
に特願昭平63−162043号を提案している。[Prior Art] Conventionally, regarding cutting of a semiconductor wafer, for example, the present applicant has previously proposed Japanese Patent Application No. 63-162043 for the purpose of manufacturing a substrate for a discrete device.
このような半導体ウエハの枚葉式内周刃切断加工の装置
構成では、一般に、(a)未加工の半導体ウエハの供給
工程,(b)未加工の半導体ウエハの切断工程,(c)
加工済の半導体ウエハの回収工程を充足し得る各機構を
備えることが要求される。In such a device configuration for single-wafer inner peripheral blade cutting of semiconductor wafers, generally, (a) an unprocessed semiconductor wafer supply step, (b) an unprocessed semiconductor wafer cutting step, and (c).
It is required to have each mechanism capable of satisfying the process of collecting processed semiconductor wafers.
[発明が解決しようとする課題] 前述の従来の半導体ウエハの切断加工の装置構成では、
切断加工の直接工程である前記(b)工程以外の
(a),(c)工程にかなりの時間が掛ることから、こ
れ等(a),(c)工程の動作速度を速める等により時
間短縮を指向して切断加工全体の能率性向上を図ること
が試行されているが、(a)、(c)工程の動作速度を
速める等すると脆性な薄性体である半導体ウエハを損傷
等してしまうという問題点を有している。[Problems to be Solved by the Invention] In the above-described conventional semiconductor wafer cutting apparatus configuration,
Since the steps (a) and (c) other than the step (b), which is a direct cutting process, take a considerable amount of time, the time can be shortened by increasing the operating speed of these steps (a) and (c). It has been attempted to improve the efficiency of the whole cutting process by aiming at, but if the operation speed of the steps (a) and (c) is increased, the semiconductor wafer, which is a brittle thin body, may be damaged. There is a problem that it ends up.
本発明はこのような問題点を解決するためになされたも
のであり、その目的は、半導体ウエハを損傷等すること
なく能率的に供給回収することのできる半導体ウエハの
2分割切断装置におけるウエハ供給回収装置を提供する
ことにある。The present invention has been made to solve such a problem, and an object thereof is to supply a wafer in a two-division cutting apparatus for a semiconductor wafer capable of efficiently supplying and recovering the semiconductor wafer without damaging the semiconductor wafer. It is to provide a recovery device.
[課題を解決するための手段] 前述の目的を達成するため、本発明に係る半導体ウエハ
供給回収装置は、次のような手段を採用する。[Means for Solving the Problems] In order to achieve the above object, the semiconductor wafer supply / recovery apparatus according to the present invention employs the following means.
即ち、請求項1では、高速回転して半導体ウエハをその
厚み巾の中心部から切断して2分割する内周型の切断刃
を垂直に装備した切断機構と、供給された未加工の半導
体ウエハを水平に保持し加工済の半導体ウエハとなって
も保持を継続する保持機構と、切断機構,保持機構を近
接、離間するように垂直方向へ相対移動させる位置送り
機構と、切断機構,保持機構を平行逆移動するように水
平方向へ相対移動させる切断送り機構と、を備えたウエ
ハ枚葉式内周刃2分割切断装置において、 ウエハの回収,供給機構と保持機構とのウエハ受け渡し
の連携動作による切断中止の時間的ロスは必要最小限の
ものとし、そのためウエア回収機構及び供給機構の端末
の作用部でウエハに直接作用する回収側ハンド及び供給
側ハンドは保持機構に最も近接した位置で待機し、ウエ
ハ切断終了後2枚となった加工済みウエハを保持して上
昇し、かつその両保持盤間隔を拡大した保持機構より加
工済み2枚のウエハを同時に回収し、直ちに未加工ウエ
ハ1枚を引き渡し、保持機構は所定の設定動作により切
断のための移動を為す手段を採用する。That is, according to claim 1, a cutting mechanism vertically equipped with an inner peripheral cutting blade that rotates at a high speed to cut the semiconductor wafer from the center of its thickness width and divides the wafer into two, and a supplied unprocessed semiconductor wafer. Holding mechanism that holds the wafer horizontally and becomes a processed semiconductor wafer, a position feeding mechanism that relatively moves the cutting mechanism and the holding mechanism in the vertical direction so as to move closer to and away from each other, the cutting mechanism, and the holding mechanism. In a wafer single-wafer inner peripheral blade two-division cutting device equipped with a cutting and feeding mechanism for horizontally moving the wafer in parallel and in reverse, a cooperative operation of wafer delivery between a wafer collecting / supplying mechanism and a holding mechanism. The time loss of the cutting suspension due to is set to the minimum necessary.Therefore, the collection side hand and the supply side hand that directly act on the wafer at the action part of the terminal of the wear collection mechanism and the supply mechanism are closest to the holding mechanism. After the completion of cutting the wafer, the wafer is held and lifted, and the processed two wafers are collected at the same time by the holding mechanism in which the distance between the two holding plates is enlarged. One processing wafer is delivered, and the holding mechanism adopts a means for moving for cutting by a predetermined setting operation.
又、保持機構はウエハ切断のために所定の移動を開始す
ると、並行してウエハ回収機構は加工済みウエハ2枚の
回収部への搬送及び収納動作をし、ウエハ供給機構は供
給部よりの未加工ウエハ1枚の取り出し動作を余裕をも
って(ウエハ供給,回収に伴なう時間よりウエハ切断時
間が圧倒的にかかる)正確に、確実に成し得る手段を採
用する。Further, when the holding mechanism starts a predetermined movement for cutting the wafer, the wafer recovery mechanism carries out a transfer and storage operation of the two processed wafers to the recovery part in parallel, and the wafer supply mechanism does not move the wafer from the supply part. A means that can accurately and surely perform the operation of taking out one processed wafer with a margin (the wafer cutting time is overwhelmingly longer than the time required for supplying and collecting the wafer) is adopted.
また、請求項2では、ウエハ保持機構の機能,構造に係
り、保持機構は切断中ウエハを強固に保持する保持盤
(主)と、切り落される側のウエハを保持する保持盤
(副)を備え、切断終了後2枚となった加工済みウエハ
を確実に保持すると共に、ウエハ供給回収機構の端末作
用部と連携動作するため、その動作平面まで上昇し、か
つその両保持盤間隔を拡大し挿入されるウエハ回収機構
の端末作用部である回収側ハンドに加工済みウエハ2枚
を同じに引き渡し、ウエハ供給機構の端末作用部である
供給側ハンドより未加工ウエハ1枚と引き取り保持盤
(主)に保持してその両保持盤間隔を再び縮小し、位置
決め機構によりウエハ厚み巾の中心を割り出し、切断送
り機構によりウエハ切断のための移動をして、ウエハ供
給回収機構との連携動作を効率的に確実にかつ内周刃を
回避して安全になし得る手段を採用する。According to the second aspect of the present invention, the function and structure of the wafer holding mechanism is such that the holding mechanism holds the wafer firmly during cutting (main) and the holding board (sub) holds the wafer to be cut off. With this function, the processed wafers that have become two pieces after cutting are securely held, and because they work together with the terminal action part of the wafer supply / recovery mechanism, they rise to the operating plane and expand the distance between both holding plates. The two processed wafers are handed over to the collecting side hand, which is the terminal acting part of the wafer collecting mechanism, which is inserted, and one unprocessed wafer and the take-up holding board (from the supplying hand, which is the terminal acting part of the wafer feeding mechanism). (Mainly) to reduce the distance between the two holding plates again, the center of the wafer thickness width is indexed by the positioning mechanism, and the cutting / feeding mechanism is used for wafer cutting, and the operation is linked with the wafer supply / recovery mechanism. To avoid efficiently reliably and inner cutter employing a means be made safely.
また、請求項3では、未加工半導体ウエハは、ディスク
リート素子用基板製造のため特に有用なウエハであっ
て、両面に不純物拡散層を有して厚み巾の中心線に対し
て線対称的材質特性を有するものを使用する。Further, in claim 3, the unprocessed semiconductor wafer is a wafer that is particularly useful for manufacturing a substrate for a discrete device, and has an impurity diffusion layer on both sides thereof and has a line-symmetrical material characteristic with respect to the center line of the thickness width. Use the one with.
[作用] 前述の手段によると、供給回収機構の動作設定等により
切断工程と供給工程,回収工程とを同時進行させるよう
にして時間的削減を図り、保持機構の動作設定等により
切断機構から離間した位置で切断工程と供給工程,回収
工程とを連係して安全で確実に取扱うようにしたため、
半導体ウエハを損傷等することなく能率的に切断加工す
ることのできるウエハ供給回収装置を提供するという目
的が達成される。[Operation] According to the above-mentioned means, the cutting process and the feeding process and the collecting process are simultaneously performed by the operation setting of the supply / recovery mechanism to reduce the time, and the cutting mechanism is separated from the cutting mechanism by the operation setting of the holding mechanism. Since the cutting process, the supplying process, and the collecting process are linked at the specified position to ensure safe and reliable handling,
An object of the present invention is to provide a wafer supply / recovery device capable of efficiently cutting and processing a semiconductor wafer without damaging it.
[実施例] 以下、本発明に係る半導体ウエハの切断加工装置の実施
例を図面に基いて説明する。[Embodiment] An embodiment of a semiconductor wafer cutting apparatus according to the present invention will be described below with reference to the drawings.
この実施例では、内周刃が水平面内で回転する竪型から
なるものを示してある。In this embodiment, the inner peripheral blade is of a vertical type that rotates in a horizontal plane.
この実施例は、第1図〜第3図に示すように、切断工程
に供せられる切断機構1,切断送り機構4と、切断工程,
供給工程,回収工程の各工程に連係する保持機構2,位置
送り機構3と、供給工程,回収工程に供せられる供給回
収機構5と、供給部6及び回収部7とで構成されてい
る。In this embodiment, as shown in FIGS. 1 to 3, a cutting mechanism 1, a cutting feed mechanism 4, and a cutting process, which are provided for the cutting process,
It is composed of a holding mechanism 2, a position feeding mechanism 3 linked to each of the supply process and the recovery process, a supply recovery mechanism 5 used for the supply process and the recovery process, a supply unit 6 and a recovery unit 7.
切断機構1は内周型からなるもので、回転軸に連結して
高速回転する皿形のチャック11と、内周縁にダイアモン
ド層等の刃先を有する円盤形の切断刃12と、切断刃12を
チャック11の円周縁に緊張固定するリング形の取付け部
材13とを備えている。The cutting mechanism 1 is of an inner peripheral type, and includes a dish-shaped chuck 11 that is connected to a rotary shaft and rotates at high speed, a disc-shaped cutting blade 12 having a cutting edge such as a diamond layer on the inner peripheral edge, and a cutting blade 12. The chuck 11 is provided with a ring-shaped mounting member 13 that is fixed to the circumference of the chuck 11 by tension.
この切断機構1は装置全体の中で切断刃12の切断面を水
平にして固定的に設置され、第1図(A)に示すよう
に、固定的な切断面上で切断刃12が高速回転して未加工
の半導体ウエハWをその厚み巾の略中心部から切断して
2分割するようになっている。This cutting mechanism 1 is fixedly installed with the cutting surface of the cutting blade 12 horizontal in the entire apparatus, and the cutting blade 12 rotates at high speed on the fixed cutting surface as shown in FIG. 1 (A). Then, the unprocessed semiconductor wafer W is cut from the substantially central portion of its thickness width and divided into two parts.
保持機構2は、多孔質材等で形成され垂直に相対しバキ
ュームポンプ(図示せず)に接続して吸着構造の保持機
能を奏する保持盤(主)21,保持盤(副)22と、一方の
保持盤21にロッド23を介して連結し両保持盤21,22の間
隔を調整するエアシリンダ,サーボモータ等の間隔調整
駆動部24と、両保持盤21,22を垂直面上で切断機構1へ
の近接,離間を可能にするベース25とを備えている。The holding mechanism 2 includes a holding plate (main) 21 and a holding plate (sub) 22 which are made of a porous material or the like and which vertically face each other and are connected to a vacuum pump (not shown) to perform a holding function of a suction structure. A space adjusting drive unit 24 such as an air cylinder or a servomotor that is connected to the holding plate 21 of the above through a rod 23 to adjust the distance between the holding plates 21 and 22, and a cutting mechanism for cutting the holding plates 21 and 22 on a vertical plane. 1 and a base 25 that enables separation and separation.
この保持機構1は、両保持盤21,22の保持機能の動作,
解除により未加工の半導体ウエハW,加工済の半導体ウエ
ハW′を保持,離脱するものであるが、両保持盤21,22
が切断機構1から離間した位置でのみ未加工ウエハを保
持盤22へ受渡し及び離脱を可能にしており、この受渡し
離脱の際には第1図(B)に示すように両保持盤21,22
の間隔が拡間するようになっている。また、この保持機
構2は、保持盤22の保持機能を動作させ供給された未加
工の半導体ウエハWを吸着保持した状態でウエハを切断
し、遅くとも切り終り直前に保持盤21の保持機能も動作
させ切断機構1に切断された一方の加工済の半導体ウエ
ハW′をも切り飛ばすこと等なく継続して保持するよう
になっている。This holding mechanism 1 operates the holding functions of both holding plates 21 and 22,
When released, the unprocessed semiconductor wafer W and the processed semiconductor wafer W ′ are held and released.
Allows the unprocessed wafers to be transferred to and removed from the holding plate 22 only at a position separated from the cutting mechanism 1. At the time of this transfer and removal, as shown in FIG.
The intervals between are expanded. In addition, the holding mechanism 2 operates the holding function of the holding plate 22 to cut the wafer while sucking and holding the supplied unprocessed semiconductor wafer W, and at the latest, the holding function of the holding plate 21 also operates immediately before the end of cutting. The one processed semiconductor wafer W ′ cut by the cutting mechanism 1 is continuously held without being cut off.
位置送り機構3は、保持機構2の両保持盤21,22をベー
ス25上で垂直方向へ一体的に切断機構1に近接,離間さ
せるサーボモータ等からなる。The position feed mechanism 3 is composed of a servo motor or the like for vertically moving the holding plates 21 and 22 of the holding mechanism 2 integrally with each other on the base 25 in the vertical direction.
この位置送り機構3は、切断機構1に保持機構2を近接
して切断機構1の切断刃12の切断面に未加工の半導体ウ
エハWの厚み巾の略中心部を割出すようになっており、
切断機構1から保持機構2を離間させて切断機構1の切
断刃12を回避して供給回収機構5との連係を可能にして
いる。The position feeding mechanism 3 is arranged so that the holding mechanism 2 is brought close to the cutting mechanism 1 and a substantially central portion of the thickness width of the unprocessed semiconductor wafer W is indexed to the cutting surface of the cutting blade 12 of the cutting mechanism 1. ,
The holding mechanism 2 is separated from the cutting mechanism 1 to avoid the cutting blade 12 of the cutting mechanism 1 and to be able to cooperate with the supply and recovery mechanism 5.
切断送り機構4は、保持機構2(両保持盤21,22等を含
めて)のベース25を位置送り機構3による両保持盤21,2
2の近接,離間方向と直交する方向へ移動させるサーボ
モータ等からなる。The cutting feed mechanism 4 uses the base 25 of the holding mechanism 2 (including both holding plates 21 and 22) to feed both holding plates 21 and 2 by the position feeding mechanism 3.
It consists of a servo motor etc. that moves in the direction orthogonal to the approaching and separating directions of 2.
この切断送り機構4は、位置送り機構3が切断機構1の
切断刃12の切断面に未加工の半導体ウエハWの厚み巾の
略中心部を割出した後に移動を開始するようになってい
る。なお、この切断送り機構4の動作中には、位置送り
機構3は動作しないようになっている。The cutting feed mechanism 4 starts to move after the position feeding mechanism 3 has indexed a substantially central portion of the thickness width of the unprocessed semiconductor wafer W to the cutting surface of the cutting blade 12 of the cutting mechanism 1. . The position feed mechanism 3 does not operate while the cutting feed mechanism 4 is operating.
供給回収機構5は、前記保持機構2の切断機構1から離
間した位置近くと未加工の半導体ウエハWの供給部6,加
工済の半導体ウエハW′の回収部7との間に垂直な動作
平面と水平な動作平面との双方に渡って配設されてお
り、ステッピングモータ,ロータリーアクチュエーター
等に連結して回転と昇降とが可能なロッド51と、ロッド
51の上端に水平に取付けられたアーム52と、アーム52上
にスライド自在に取付けられた吸着機能を有するハンド
53とを備えている。これらロッド51,アーム52,ハンド53
は、未加工の半導体ウエハWの供給系用,加工済の半導
体ウエハW′の回収系用とが切断機構1,保持機構2の配
置線を介して隣接して相対して設けられ全体のコンパク
ト化が図られている。また、ハンド53の回転軸跡は、水
平面内で保持機構2の保持盤21,22間と供給部7,回収部
6の間を回転するようになっている。なお、供給側,回
収側のハンド53には片面又は両面に吸着部53′が設けら
れ、1枚の素材ウエハW及び2枚の加工済の半導体ウエ
ハW′を確実,容易に供給及び同時回収することができ
るようになっている。The supply / recovery mechanism 5 is a vertical operation plane between a position separated from the cutting mechanism 1 of the holding mechanism 2 and the supply part 6 of the unprocessed semiconductor wafer W and the recovery part 7 of the processed semiconductor wafer W ′. And a horizontal movement plane, and a rod 51 that is connected to a stepping motor, a rotary actuator, etc. and can rotate and move up and down.
An arm 52 horizontally attached to the upper end of 51 and a hand with a suction function slidably attached to the arm 52.
It has 53 and. These rod 51, arm 52, hand 53
Is an overall compact structure in which an unprocessed semiconductor wafer W supply system and a processed semiconductor wafer W'recovery system are provided adjacent to each other via the arrangement line of the cutting mechanism 1 and the holding mechanism 2. Is being promoted. The trace of the rotation axis of the hand 53 is designed to rotate between the holding plates 21 and 22 of the holding mechanism 2 and between the supply unit 7 and the recovery unit 6 in a horizontal plane. It should be noted that the supply-side and recovery-side hands 53 are provided with suction portions 53 'on one side or both sides, so that one material wafer W and two processed semiconductor wafers W'are reliably and easily supplied and simultaneously collected. You can do it.
この供給回収機構5は、前記保持機構2が切断機構1か
ら離間した位置において、保持機能を動作,解除する保
持機構2との間で第3図(C)〜(E)に示すようにロ
ッド51の回転,昇降によりアーム52を介してハンド53で
未加工の半導体ウエハW,加工済の半導体ウエハW′の受
渡しを行なうが、保持機構2が切断機構1に近接してウ
エハが切断され離間した位置に復帰するまでの間に、第
3図(F)〜(B)に示すようにロッド51の回転,昇降
により受取った加工済の半導体ウエハW′を回収部6へ
搬送して収納し新な未加工の半導体ウエハWを供給部7
から取出して搬送を完了して待機するようになってい
る。The supply / recovery mechanism 5 is connected to the holding mechanism 2 that operates and releases the holding function at a position where the holding mechanism 2 is separated from the cutting mechanism 1, as shown in FIGS. 3 (C) to 3 (E). Although the unprocessed semiconductor wafer W and the processed semiconductor wafer W ′ are delivered by the hand 53 through the arm 52 by the rotation and elevation of 51, the holding mechanism 2 approaches the cutting mechanism 1 and the wafer is cut and separated. Before returning to the above position, the processed semiconductor wafer W ′ received by the rotation and elevating of the rod 51 is conveyed to the collecting section 6 and stored therein, as shown in FIGS. 3 (F) and (B). Supply unit 7 for new unprocessed semiconductor wafer W
It is designed to be picked up from the container, complete the transportation, and stand by.
なお、未加工の半導体ウエハWの供給部7,加工済の半導
体ウエハW′の回収部6は、未加工の半導体ウエハW,加
工済の半導体ウエハW′を並列可能な仕切,溝等を有す
るカセット構造からなり、切断機構1の近くに固定的に
設置されている。このため、供給回収機構5のロッド51
は未加工の半導体ウエハWの取出し、加工済の半導体ウ
エハW′の収納毎に一定ピッチ分昇降動し、順番に未加
工の半導体ウエハWを取出し加工済の半導体ウエハW′
を収納するようになっている。なお、2枚の加工済の半
導体ウエハW′は180°回転機構部55を利用して1枚づ
つロッド51を昇降させて収納する。The unprocessed semiconductor wafer W supply unit 7 and the processed semiconductor wafer W'collection unit 6 have partitions, grooves, etc. in which the unprocessed semiconductor wafer W and the processed semiconductor wafer W'can be arranged in parallel. It has a cassette structure and is fixedly installed near the cutting mechanism 1. Therefore, the rod 51 of the supply and recovery mechanism 5
Is moved up and down by a constant pitch every time the unprocessed semiconductor wafer W is taken out and the processed semiconductor wafer W'is stored, and the unprocessed semiconductor wafer W is taken out in sequence and processed semiconductor wafer W '
Is designed to be stored. The two processed semiconductor wafers W'are stored by moving the rods 51 one by one using the 180 ° rotation mechanism 55.
このような実施例によると、切断機構1,保持機構2,位置
送り機構3,切断送り機構4の動作による切断工程中に、
供給回収機構5の動作による供給工程,回収工程の殆ど
が同時進行して終了し、切断工程終了と同時に保持機構
2,位置送り機構3,供給回収機構5の動作による未加工の
半導体ウエハW,加工済の半導体ウエハW′の受渡しが行
なわれることになり、時間的削減が図られる。また、保
持機構2の動作設定等により切断機構1から離間した位
置で切断工程と供給工程,回収工程とを連係して加工済
の半導体ウエハW′を安全かつ確実に取扱うため、未加
工の半導体ウエハW,加工済の半導体ウエハW′の損傷等
が防止されている。According to such an embodiment, during the cutting process by the operation of the cutting mechanism 1, the holding mechanism 2, the position feeding mechanism 3, and the cutting feeding mechanism 4,
Most of the supply process and the recovery process by the operation of the supply / recovery mechanism 5 simultaneously proceed and end, and the holding mechanism at the same time when the cutting process ends.
2, the unprocessed semiconductor wafer W and the processed semiconductor wafer W ′ are delivered by the operations of the position feed mechanism 3 and the supply / recovery mechanism 5, and the time can be reduced. Further, in order to safely and reliably handle the processed semiconductor wafer W ′ by coordinating the cutting process, the supplying process, and the collecting process at a position separated from the cutting mechanism 1 due to the operation setting of the holding mechanism 2 or the like, the unprocessed semiconductor wafer W ′ is processed. Damage to the wafer W and the processed semiconductor wafer W ′ are prevented.
なお、この実施例の切断加工対象となる半導体ウエハW
は、ディスクリート素子用基板製造用の両面に不純物が
拡散された不純物拡散層を有し中央に不純物が拡散され
ていない不純物未拡散層を有する構造のように、厚み幅
の中心線に対して対称的材質特性を有するウエハに適用
される。また、第4図に示すように、未加工の半導体ウ
エハWの全周または切断終了端周り所要角度θに前記切
断刃12の刃巾よりも広く約1mm深さ内の溝Waを刻設して
内部に接着剤C等を充填すると、当板等を取付けること
なく切断終了端における割裂等の損傷を有効に防止する
ことができる。なお、前記溝Waの外端縁Wbを曲面形にす
ると接着剤Cの充填が容易になり未加工の半導体ウエハ
Wの周縁角部Wcを曲面形にすると切断前後の工程のハン
ドリングに対して有効である。The semiconductor wafer W to be cut in this embodiment is
Is symmetrical with respect to the center line of the thickness width, as in the structure having an impurity diffusion layer in which impurities are diffused on both sides for manufacturing discrete device substrates and an impurity non-diffusion layer in which no impurities are diffused in the center. It is applied to a wafer having specific material characteristics. Further, as shown in FIG. 4, a groove Wa wider than the width of the cutting blade 12 and within a depth of about 1 mm is engraved at the required angle θ around the entire circumference of the unprocessed semiconductor wafer W or the cutting end edge. By filling the inside with the adhesive C or the like, damage such as splitting at the cutting end can be effectively prevented without attaching a contact plate or the like. When the outer edge Wb of the groove Wa is curved, the filling of the adhesive C is facilitated, and when the peripheral corner Wc of the unprocessed semiconductor wafer W is curved, it is effective for handling before and after cutting. Is.
又、第5図に示す如く、切断終了端周りに接着剤Cを厚
くコーティングすると、ウエハの切断終了端における損
傷防止にさらに有効である。Further, as shown in FIG. 5, when the adhesive C is thickly coated around the end of cutting, it is more effective in preventing damage at the end of cutting of the wafer.
さらに、保持機構2の下側になる一方の保持盤21は保持
盤22のように切断のための強固な吸着機能を具備せず、
単に下側の加工済の半導体ウエハW′の切り飛びを防止
する柔構造の実施例とするのが一般的である。Further, one of the holding plates 21, which is below the holding mechanism 2, does not have a strong suction function for cutting like the holding plate 22,
Generally, the embodiment is of a flexible structure for preventing the cut-out of the processed semiconductor wafer W'on the lower side.
さらに、供給回収機構5の移動部51を含む本体は、スペ
ース的に許容できる市販品のウエハ又はガラス基板用の
搬送ロボットを利用することも可能である。Further, as the main body including the moving part 51 of the supply / recovery mechanism 5, it is possible to use a commercially available transfer robot for wafers or glass substrates, which is commercially available.
[発明の効果] 以上のように本発明に係る半導体ウエハの切断装置にお
けるウエハ供給回収装置は、各請求項共通として、切断
工程と供給工程,回収工程とを同時進行させるようにし
て時間的削減を図り、切断機構から離間した位置で切断
工程と供給工程,回収工程とを連係して半導体ウエハを
効率的に安全かつ確実に取扱うようにしたため、半導体
ウエハを損傷等することなく能率的に切断加工すること
ができる効果がある。また、この効果により、半導体ウ
エハの切断加工コストが低減される効果が生ずる。EFFECTS OF THE INVENTION As described above, the wafer supply / recovery device in the semiconductor wafer cutting device according to the present invention is common to each claim, and the cutting process and the supply process / recovery process are simultaneously advanced to reduce time. In order to handle semiconductor wafers efficiently, safely and reliably by coordinating the cutting process with the feeding process and the collecting process at a position separated from the cutting mechanism, the semiconductor wafer can be cut efficiently without being damaged. It has the effect that it can be processed. Further, due to this effect, the cost of cutting the semiconductor wafer is reduced.
さらに、請求項2として、2枚の加工済の半導体ウエハ
を容易,確実に同時回収して前記効果をさらに向上する
ことができる効果がある。Further, as a second aspect, there is an effect that the two processed semiconductor wafers can be easily and surely simultaneously recovered to further improve the effect.
第1図(A)は本発明に係る半導体ウエハの切断装置の
実施例を示す切断動作中における要部(切断機構,保持
機構等)の正面図、第1図(B)は同切断終了後の同要
部の正面図、第1図(C)は第1図(B)の状態に対す
る他の要部(供給回収機構)の連係を示す側面図、第2
図は第1図の平面図、第3図は(A)〜(H)の順に供
給回収装置の動作連係を示す正面図、第4図(A)は切
断装置の実施例が切断加工対象とする半導体ウエハの一
つの構造例を示す正面図、第4図(B)は第4図(A)
の側面図、第4図(C)はその要部拡大断面図、第5図
は対象とするウエハの他の構造例を示す断面図である。 1…切断機構、12…切断刃 2…保持機構、21,22…保持盤 24…間隔調整駆動部、3…位置送り機構 4…切断送り機構、5…供給回収機構 6…回収部、7…供給部 W…未加工の半導体ウエハ W′…加工済の半導体ウエハFIG. 1 (A) is a front view of essential parts (cutting mechanism, holding mechanism, etc.) during a cutting operation showing an embodiment of a semiconductor wafer cutting apparatus according to the present invention, and FIG. FIG. 1 (C) is a front view of the same main part of FIG. 1, FIG. 1 (C) is a side view showing the connection of another main part (supply / recovery mechanism) with respect to the state of FIG.
The drawing is a plan view of FIG. 1, FIG. 3 is a front view showing the operation cooperation of the supply and recovery device in the order of (A) to (H), and FIG. 4 (A) shows that the embodiment of the cutting device is a cutting target. FIG. 4 (A) is a front view showing an example of the structure of a semiconductor wafer to be manufactured.
Is a side view, FIG. 4 (C) is an enlarged cross-sectional view of the main part, and FIG. 5 is a cross-sectional view showing another structural example of the target wafer. DESCRIPTION OF SYMBOLS 1 ... Cutting mechanism, 12 ... Cutting blade 2 ... Holding mechanism, 21,22 ... Holding board 24 ... Interval adjustment drive part, 3 ... Position feed mechanism 4 ... Cutting feed mechanism, 5 ... Supply collection mechanism 6 ... Collection part, 7 ... Supply unit W ... Unprocessed semiconductor wafer W '... Processed semiconductor wafer
Claims (3)
中心部から切断して2分割する内周型の切断刃を水平に
装備した切断機構と、供給された未加工の半導体ウエハ
を水平に保持し加工済の半導体ウエハ2枚となっても保
持を継続する保持機構と、切断機構,保持機構を近接,
離間するように垂直方向へ相対移動させる位置送り機構
と、切断機構,保持機構を平行逆移動するように水平方
向へ相対移動させる切断送り機構と、を備えたウエハ枚
葉式内周刃2分割切断装置において、 前記保持機構より加工済みウエハ2枚の回収部への回収
及び供給部より未加工ウエハ1枚の保持機構への供給を
するウエハ供給回収機構を有し、 その回収機構を保持機構と回収部との間に、供給機構を
供給部と保持機構との間に夫々配置し、 回収機構の端末の作用部である回収側ハンドはその2個
の吸着部を空にして、供給機構の作用部である供給側ハ
ンドは吸着部に未加工ウエハ1枚を保持して保持機構に
最も近接した位置にてウエハ切断終了を待機し、 前記保持機構がウエハ切断終了後2枚となった加工済み
ウエハを保持して回収側及び供給側ハンドとの連携動作
平面まで上昇し、かつその両保持盤間隔を拡大した時に
回収側ハンドを挿入し2枚のウエハを同時に回収し、供
給側ハンドの保持している未加工ウエハ1枚を引き渡
し、 保持機構がウエハ切断のための移動を開始するのと並行
して回収側ハンドは加工済み2枚のウエハを回収部に搬
送、収納し、それと並行して供給側ハンドは供給部より
次の未加工ウエハ1枚を取り出し、ウエハ保持機構に最
も近接した位置にてウエハ切断終了を待機し、 上記の動作を反復、継続するウエハ供給回収装置。1. A cutting mechanism horizontally equipped with an inner peripheral cutting blade that rotates at a high speed to cut a semiconductor wafer from a center portion of its thickness width and divides the semiconductor wafer into two parts. A holding mechanism that keeps holding even if it becomes two processed semiconductor wafers, a cutting mechanism, and a holding mechanism,
Wafer single-wafer inner peripheral blade divided into two parts: a position feed mechanism for relatively moving in a vertical direction to separate from each other, and a cutting feed mechanism for relatively moving in a horizontal direction to move a cutting mechanism and a holding mechanism in parallel and in reverse. The cutting device has a wafer supply / recovery mechanism for recovering two processed wafers from the retaining mechanism to a recovering unit and supplying an unprocessed wafer to the retaining mechanism from the supplying unit, and the recovering mechanism is a retaining mechanism. The supply mechanism is arranged between the supply unit and the holding mechanism between the supply unit and the recovery unit, and the recovery side hand, which is the action unit of the terminal of the recovery mechanism, empties the two suction units to supply the supply mechanism. The supply-side hand, which is the functioning part of, holds one unprocessed wafer in the suction part and waits for the completion of wafer cutting at a position closest to the holding mechanism, and the holding mechanism has two wafers after completion of wafer cutting. Hold and collect processed wafers The unprocessed wafers held by the supply-side hand are inserted into the recovery-side hand by inserting the recovery-side hand when the distance between the holding side and the holding-side board is increased and the distance between both holding plates is increased. In parallel with the transfer of one wafer and the start of movement of the holding mechanism for cutting the wafer, the collection side hand conveys and stores the processed two wafers to the collection part, and in parallel with this, the supply side hand supplies the wafer. A wafer supply / recovery device that takes out the next unprocessed wafer from the unit, waits for the end of wafer cutting at a position closest to the wafer holding mechanism, and repeats and continues the above operation.
つの保持盤を有して切断終了後2枚となるウエハを保持
すると共にウエハ回収側ハンド及び供給側ハンドとのウ
エハ受け渡しの連携動作のためその水平動作平面まで上
昇し、かつ両保持盤間隔を拡大し、 加工済み2枚のウエハを同時に回収側ハンドに引き渡
し、未加工ウエハ1枚を供給側ハンドより引き取り、再
びその両保持盤間隔を縮小し下降し切断のための移動を
開始する動作設定がなされることを特徴とするウエハ供
給回収装置。2. The holding mechanism according to claim 1,
It holds two wafers after cutting with two holding plates and rises to the horizontal operation plane due to the coordinated operation of wafer transfer between the wafer collecting side hand and the supply side hand, and the distance between both holding plates is increased. Enlarge and transfer two processed wafers to the collection side hand at the same time, pick up one unprocessed wafer from the supply side hand, again reduce the distance between the two holding plates and move down to start movement for cutting A wafer supply / recovery device characterized in that
導体ウエハは、両面に不純物拡散層を有して厚み巾の中
心線に対し線対称的材質特性を有することを特徴とする
ウエハ供給回収装置。3. A wafer supply / recovery system according to claim 1 or 2, wherein the unprocessed semiconductor wafer has impurity diffusion layers on both sides and has a material property which is axisymmetric with respect to a center line of the thickness width. apparatus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1285288A JPH0695505B2 (en) | 1989-10-31 | 1989-10-31 | Wafer supply / collection device in a wafer single-wafer inner peripheral blade two-division cutting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1285288A JPH0695505B2 (en) | 1989-10-31 | 1989-10-31 | Wafer supply / collection device in a wafer single-wafer inner peripheral blade two-division cutting device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03145727A JPH03145727A (en) | 1991-06-20 |
| JPH0695505B2 true JPH0695505B2 (en) | 1994-11-24 |
Family
ID=17689579
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1285288A Expired - Fee Related JPH0695505B2 (en) | 1989-10-31 | 1989-10-31 | Wafer supply / collection device in a wafer single-wafer inner peripheral blade two-division cutting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0695505B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102528948A (en) * | 2012-02-09 | 2012-07-04 | 贵州华龙电子设备有限公司 | Inner circle cutting machine |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2651065B2 (en) * | 1991-10-30 | 1997-09-10 | 直江津電子工業株式会社 | Wafer recovery / supply mechanism in single wafer horizontal cutting machine |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07118473B2 (en) * | 1987-07-14 | 1995-12-18 | 九州電子金属株式会社 | Method for manufacturing semiconductor wafer |
| JP2565961B2 (en) * | 1988-01-07 | 1996-12-18 | 株式会社東京精密 | Wafer recovery device for slicing machine |
-
1989
- 1989-10-31 JP JP1285288A patent/JPH0695505B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102528948A (en) * | 2012-02-09 | 2012-07-04 | 贵州华龙电子设备有限公司 | Inner circle cutting machine |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03145727A (en) | 1991-06-20 |
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